2007-10-01 1
Unit in mm
Weight0.26 g (typ.)
4.58±0.25
4.0 +0.25
0.20
9.7±0.3
6.8±0.25
0.4±0.1
1.27±0.2 1.25±0.25
7.62±0.25
3.65 +0.15
0.25
0.25±
1 2 3
6 5 4
11-5J1
TOSHIBA 115J1
0.05
+0.10
TOSHIBA Photocoupler GaAAs IRED & PhotoIC
TLP716
Plasma display panel.
High Speed Interface.
Factory Automation .
The TOSHIBA TLP716 consists of a GaAAs light emitting diode
and a high speed photodetector. This unit is 6-lead SDIP. TLP716 is 50%
smaller than 8PIN DIP and has suited the safety standard reinforced
insulation class. So, mounting area in safety standard required equipment can
be reduced.
z Inverter Logic (totempole output)
z Package Type : SDIP6
z Guaranteed Performance Over Temperature : 40~100°C
z Power Supply Voltage : 4.5~5.5 V
z Input Thresholds Current : IFHL=6.5 mA(max.)
z Propagation delay Time (tpHL/ tpLH) : 75 ns(max.)
z Switching speed : 15 MBd(typ.) (NRZ)
z Common mode transient immunity : 10 kV/us(min.)
z Isolation voltage : 5000 Vrms(min.)
z UL Recognized :UL1577, File No.E67349
z Option (D4)
TÜV Approved : EN6074752
Maximum Operating Insulation Voltage : 890 VPK
Highest Permissible Over Voltage : 8000 VPK
(Note):When a EN6074752 approved type is needed,
Please designate “Option(D4)”
z Construction Mechanical Rating
7.62 mm pitch
standard type
10.16 mm pitch
TLPXXXF type
Creepage Distance
Clearance
Insulation Thickness
7.0 mm (min)
7.0 mm (min)
0.4 mm (min)
8.0 mm (min)
8.0 mm (min)
0.4 mm (min)
Truth Table
Input LED Tr1 Tr2 Output
H ON OFF ON L
L OFF ON OFF H
VCC
GND
SHIELD
1
34
5
6
2
1:ANODE
2:N.C.
3:CATHODE
4:GND
5:Vo
6:Vcc
Pin Configuration (Top View)
0.1
μ
F bypass capacitor must be
connected between pins 6 and 4. (Note 4)
VCC
VO
GND
ICC
IO
6
5
4
SHIELD
3
1
IF
VF
Tr1
Tr2
Schematic
2007-10-01 2
Absolute Maximum Ratings (Ta=25°C
CHARACTERISTIC SYMBOL RATING UNIT
Forward Current (Ta 85°C) IF 20 mA
Forward Current Derating (Ta > 85°C) ΔIF/ΔTa 0.5 mA/°C
Peak Transient Forward Current (Note1) IFPT 1 A
Reverse Voltage VR 5 V
LED
Junction Temperature Tj 125 °C
Output Current (Ta 85°C) IO 10 mA
Output Current Derating (Ta > 85°C) Δ IO /ΔTa 0.25 mA/°C
Output Voltage(Vo Vcc) VO 0.5~6 V
Supply Voltage VCC 0.5~6 V
Power Dissipation (Ta 85°C) PD 40 mW
Power Dissipation Derating (Ta > 85°C) ΔPo/ΔTa -1 mW/ °C
DETECTOR
Junction Temperature Tj 125 °C
Operating Temperature Range Topr 40~100 °C
Storage Temperature Range Tstg 55~125 °C
Lead Solder Temperature(10s) Tsol 260 °C
Isolation Voltage
(AC,1min.,R.H.60%,Ta=25°C) (Note2) BVs 5000 Vrms
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Recommended Operating Conditions
CHARACTERISTIC SYMBOL MIN. TYP. MAX. UNIT
Input Current , ON IF(ON) 8 12 18 mA
Input Voltage , OFF VF(OFF) 0 0.8 V
Supply Voltage (*) (Note3, Note4) VCC 4.5 5 5.5 V
Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the
device. Additionally, each item is an independent guideline respectively. In developing designs using this
product, please confirm specified characteristics shown in this document.
(*) This item denotes operating ranges, not meaning of recommended operating conditions.
2007-10-01 3
The correlation between input current and switching speed and drive circuit
(reference information).
Input Current
(IF) TEST CIRCUIT Typical Switching Speed
12mA 1
(Page 4) 14 – 16 MBd
8mA 1
(Page 4) 11 – 13 MBd
8mA 2
(Page 4,with Speed up capacitor) 16 – 20 MBd
Note 1: Pulse width PW1us,300pps.
Note 2: Device Considered a two terminal device : pins 1,2 and 3 shorted together and pins 4,5 and 6 shorted
together.
Note 3: The detector of this product requires a power supply voltage (VCC) of 4.5 V or higher for stable operation. If
the VCC is lower than this value, an Icc may increase, or an output may be unstable. Be sure to use the
product after checking the supply current, and the operation of a poweron/off.
Note 4: A ceramic capacitor(0.1 μF) should be connected from pin 6 to pin 4 to stabilize the operation of the high
gain linear amplifier. Failure to provide the bypassing may impair the switching property. The total lead
length between capacitor and coupler should not exceed 1 cm.
Electrical Characteristics
(Unless otherwise specified, Ta=40 to 100°C,VCC=4.5~5.5V)
CHARACTERISTIC SYMBOL CONDITION MIN. TYP. * MAX. UNIT
Input Forward Voltage VF IF=10mA ,Ta=25°C — 1.65 1.8 V
Temperature Coefficient
of Forward Voltage ΔVF/ΔTa IF=10mA 2.0 — mV/°C
Input Reverse Current IR VR=5V,Ta=25°C — — 10 μA
Input Capacitance CT V=0V,f=1MHz,Ta=25°C — 45 — pF
Logic Low Output Voltage VOL IOL=1.6mA, IF=12mA,VCC=5V — —
0.4 V
Logic High Output Voltage VOH IOH=0.02mA, VF=1.05V, VCC=5V 4.0 — — V
Logic Low Supply Current ICCL IF=12mA — —
5.0 mA
Logic High Supply Current ICCH VF=0V — —
5.0 mA
Input Current Logic Low
Output IFHL IO=1.6mA,VO<0.4V — 6.5 mA
Input Voltage Logic High
Output VFLH IO=0.02mA,VO>4.0V 0.8
— — V
*All typical values are at Ta=25°C,VCC=5V , IF(ON)=12mA unless otherwise specified
Isolation Characteristics (Ta = 25°C)
CHARACTERISTIC SYMBOL TEST CONDITION MIN. TYP. MAX. UNIT
Capacitance input to output CS VS = 0V , f = 1MHz (Note 2) 0.8 pF
Isolation resistance RS R.H. 60%,VS = 500V
(Note 2) 1×1012 1014
AC,1 minute 5000 V
rms
AC,1 second,in oil 10000
Isolation voltage BVS
DC,1 minute,in oil 10000 Vdc
2007-10-01 4
Switching Characteristics
(Unless otherwise specified, Ta= 40 to 100°C, VCC=4.5~5.5V)
CHARACTERISTIC SYMBOL
TEST
-CIRCUIT CONDITION MIN. TYP. MAX. UNIT
propagation Delay Time
to Logic Low output tpHL IF=012mA — — 75 ns
propagation Delay Time
to Logic High output tpLH
1
IF=120mA
RIN=100
CL=15pF
(Note 5) — — 75 ns
propagation Delay Time
to Logic Low output tpHL VIN=05V
(IF=08mA) — — 65 ns
propagation Delay Time
to Logic High output tpLH
2 VIN=50V
(IF=80mA)
RIN=430
CIN=33pF
CL=15pF
(Note 5) — — 65 ns
Switching Time Dispersion
between ON and OFF
| tpLH-
tpHL |
IF=12mA
RIN=100, CL=15pF (Note 5) 45 ns
Output Fall Time (90 ~ 10%) tf IF=012mA 15 ns
Output Rise Time (10 ~ 90%) tr
1
IF=120mA
RIN=100
CL=15pF
(Note 5) 15 ns
Common Mode transient
Immunity at High Level
Output
CMH VCM=1000Vp-p,IF=0mA,
VO(Min)=4V,Ta=25°C 10000 — —
V/us
Common Mode transient
Immunity at Low Level
Output
CML
3
VCM=1000Vp-p,IF=12mA,
VO(Max)=0.4V,Ta=25°C 10000 — —
V/us
*All typical values are at Ta=25°C
Note 5: CL is approximately 15pF which includes probe and Jig/stray wiring capacitance.
TEST CIRCUIT 1 : tpLH , tpHL
TEST CIRCUIT 2 : tpLH , tpHL
IF=12mA(P.G) 0.1uF
VCC
RIN=100Ω
INPUT
MONITORING NODE
CL=15pF
CL=15pF
V
O
MONITORING NODE
VCC
GND
SHIELD
VCC
VIN=5V(P.G)
0.1uF
RIN=430Ω
CIN=33pF
CL=15pF
The PROBE and JIG capacitances are included in CL.
V
o
MONITORING NODE
INPUT MONITORING NODE
(P.G) : Pulse Generatior
VCC
GND
CL=15pF
SHIELD
tpHL
IF
Vo
50%
VOL
VOH
tpLH
t
f tr
90%
10%
1.5V 1.5V
10%
90%
50%
VIN
tpHL
Vo
50%
VOL
VOH
tpLH
1.5V 1.5V
50%
2007-10-01 5
TEST CIRCUIT 3 : Common-Mode Transient Immunity Test Circuit
CML (CMH) is the maximum rate of fall (rise) of the common mode voltage that can be sustained with the output
voltage in the low (high) state.
800(V)
tr(μs)
800(V)
tf(μs)
CMH= CML=
VCM
10%
90% 1000V
SW B :IF=0mA
SW A : IF=12mA
4V 0.4V
Vo
CMH
t
r
t
f
CML
10%
90%
0.1uF
Vo
Vcc
3
6
5
4
VCM
B
Vcc
GND
SHIELD
2
SW
A
IF
2007-10-01 6
RESTRICTIONS ON PRODUCT USE
Toshiba Corporation, and its subsidiaries and affiliates (collectively “TOSHIBA”), reserve the right to make changes to the information
in this document, and related hardware, software and systems (collectively “Product”) without notice.
This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with
TOSHIBA’s written permission, reproduction is permissible only if reproduction is without alteration/omission.
Though TOSHIBA works continually to improve Product’s quality and reliability, Product can malfunction or fail. Customers are
responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and
systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily
injury or damage to property, including data loss or corruption. Before creating and producing designs and using, customers must
also refer to and comply with (a) the latest versions of all relevant TOSHIBA information, including without limitation, this document,
the specifications, the data sheets and application notes for Product and the precautions and conditions set forth in the “TOSHIBA
Semiconductor Reliability Handbook” and (b) the instructions for the application that Product will be used with or for. Customers are
solely responsible for all aspects of their own product design or applications, including but not limited to (a) determining the
appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the applicability of any
information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any other
referenced documents; and (c) validating all operating parameters for such designs and applications. TOSHIBA ASSUMES NO
LIABILITY FOR CUSTOMERS’ PRODUCT DESIGN OR APPLICATIONS.
Product is intended for use in general electronics applications (e.g., computers, personal equipment, office equipment, measuring
equipment, industrial robots and home electronics appliances) or for specific applications as expressly stated in this document.
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