ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Features and Benefits Description Industry-leading total output accuracy achieved with new piecewise linear digital temperature compensation of offset and sensitivity Industry-leading noise performance through proprietary amplifier and filter design techniques 120 kHz typical bandwidth 4.1 s output rise time in response to step input current Integrated shield greatly reduces capacitive coupling from current conductor to die due to high dV/dt signals, and prevents offset drift in high-side, high voltage applications Greatly improved total output error through digitally programmed and compensated gain and offset over the full operating temperature range Small package size, with easy mounting capability Monolithic Hall IC for high reliability Ultra-low power loss: 100 internal conductor resistance Galvanic isolation allows use in economical, high-side current sensing in high voltage systems 4.5 to 5.5 V, single supply operation Output voltage proportional to AC or DC currents Factory-trimmed for accuracy Extremely stable output offset voltage Undervoltage lockout for VCC below specification AEC Q-100 automotive qualified UL certified, File No. E316429 The AllegroTM ACS770 family of current sensor ICs provides economical and precise solutions for AC or DC current sensing. Typical applications include motor control, load detection and management, power supply and DC-to-DC converter control, inverter control, and overcurrent fault detection. Package: 5-pin p package ckage (suffix CB) pe d Ty ste te The device consists of a precision, low-offset linear Hall circuit with a copper conduction path located near the die. Applied current flowing through this copper conduction path generates a magnetic field that is concentrated by a low magnetic hysteresis core, then converted by the Hall IC into a proportional voltage. Device accuracy is optimized through the close proximity of the magnetic signal to the Hall transducer. A precise, proportional output voltage is provided by the low-offset, chopper-stabilized BiCMOS Hall IC, which is programmed for accuracy at the factory. Proprietary digital temperature compensation technology greatly improves the IC accuracy and temperature stability without influencing the high bandwidth operation of the analog output. High level immunity to current conductor dV/dt and stray electric fields is offered by Allegro proprietary integrated shield technology for low output voltage ripple and low offset drift in high-side, high voltage applications. The output of the device has a positive slope (>VCC/2 for bidirectional devices) when an increasing current flows through the primary copper conduction path (from terminal 4 to terminal 5), which is the path used for current sampling. The internal resistance of this conductive path is 100 typical, providing low power loss. The thickness of the copper conductor allows survival of the device at high overcurrent conditions. The terminals of the PFF Leadform PSF Leadform L TUV America Certificate Number: U8V 13 08 54214 027 Continued on the next page... Additional leadforms available for qualifying volumes Typical Application 5V 4 Application 1. The ACS770 outputs an analog signal, VOUT , that varies linearly with the bidirectional AC or DC primary sampled current, IP , within the range specified. RF and CF are for optimal noise management, with values that depend on the application. VCC IP+ ACS770 IP GND 5 1 CBYP 0.1 F 2 CF IP- VIOUT 3 RF ACS770-DS VOUT ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Description (continued) conductive path are electrically isolated from the signal leads (pins 1 through 3). This allows the ACS770 family of sensor ICs to be used in applications requiring electrical isolation without the use of opto-isolators or other costly isolation techniques. The device is fully calibrated prior to shipment from the factory. The ACS770 family is lead (Pb) free. All leads are plated with 100% matte tin, and there is no Pb inside the package. The heavy gauge leadframe is made of oxygen-free copper. Selection Guide Package Part Number1 Terminals Signal Pins Primary Sampled Current , IP (A) Sensitivity Sens (Typ.) (mV/A) Current Directionality ACS770LCB-050B-PFF-T Formed Formed 50 40. Bidirectional ACS770LCB-050U-PFF-T Formed Formed 50 80. Unidirectional ACS770LCB-100B-PFF-T Formed Formed 100 20. Bidirectional ACS770LCB-100U-PFF-T Formed Formed 100 40. Unidirectional ACS770KCB-150B-PFF-T Formed Formed 150 13.3 Bidirectional ACS770KCB-150B-PSF-T Straight Formed 150 13.3 Bidirectional ACS770KCB-150U-PFF-T Formed Formed 150 26.7 Unidirectional ACS770ECB-200B-PFF-T Formed Formed 200 10. Bidirectional ACS770ECB-200B-PSF-T Straight Formed 200 10. Bidirectional ACS770ECB-200U-PFF-T Formed Formed 200 20. Unidirectional 1Additional TOP (C) Packing2 -40 to 150 -40 to 125 34 pieces per tube -40 to 85 leadform options available for qualified volumes. for additional packing options. 2Contact Allegro Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 2 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Absolute Maximum Ratings Characteristic Rating Unit VCC 6 V Reverse Supply Voltage VRCC -0.1 V Forward Output Voltage VIOUT 25 V Forward Supply Voltage Symbol Reverse Output Voltage VRIOUT Output Source Current IOUT(Source) Output Sink Current Nominal Operating Ambient Temperature Maximum Junction Storage Temperature IOUT(Sink) Notes -0.1 V VIOUT to GND 2.8 mA Minimum pull-up resistor of 500 , from VCC to VIOUT 10 mA Range E -40 to 85 C Range K -40 to 125 C Range L -40 to 150 C TJ(max) 165 C Tstg -65 to 165 C Rating Unit 4800 VAC TOP Isolation Characteristics Characteristic Symbol Notes Dielectric Strength Test Voltage* VISO Agency type-tested for 60 seconds per UL standard 60950-1, 2nd Edition Working Voltage for Basic Isolation VWFSI For basic (single) isolation per UL standard 60950-1, 2nd Edition 990 VDC or Vpk 700 Vrms Working Voltage for Reinforced Isolation VWFRI For reinforced (double) isolation per UL standard 60950-1, 2nd Edition 636 VDC or Vpk 450 Vrms *60-second testing is only done during the UL certification process. In production, Allegro conducts 1-second isolation testing according to UL 60950-1, 2nd Edition. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 3 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Thermal Characteristics may require derating at maximum conditions Characteristic Package Thermal Resistance Symbol RJA Test Conditions* Value Unit Mounted on the Allegro evaluation board with 2800 mm2 (1400 mm2 on component side and 1400 mm2 on opposite side) of 4 oz. copper connected to the primary leadframe and with thermal vias connecting the copper layers. Performance is based on current flowing through the primary leadframe and includes the power consumed by the PCB. 7 C/W Rating Unit TA = 25C, 1s duration, 1% duty cycle 1200 A TA = 85C, 1s duration, 1% duty cycle 900 A TA = 150C, 1s duration, 1% duty cycle 600 A *Additional thermal information available on the Allegro website Typical Overcurrent Capabilities1,2 Characteristic Overcurrent Symbol IPOC Notes 1Test was done with Allegro evaluation board. The maximum allowed current is limited by TJ(max) only. 2For more overcurrent profiles, please see FAQ on the Allegro website, www.allegromicro.com. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 4 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Functional Block Diagram IP+ V+ VCC To all subcircuits Programming Control Temperature Sensor C BYP EEPROM and Control Logic Dynamic Offset Cancellation Sensitivity Control Offset Control Signal Recovery VIOUT CL IP- GND Pin-out Diagram IP+ IP- 4 3 VIOUT 2 GND 1 VCC 5 Terminal List Table Number Name 1 VCC Device power supply terminal Description 2 GND Signal ground terminal 3 VIOUT 4 IP+ Terminal for current being sampled 5 IP- Terminal for current being sampled Analog output signal Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 5 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor COMMON OPERATING CHARACTERISTICS valid at TOP = -40C to 150C, CBYP = 0.1 F, and VCC = 5 V, unless otherwise specified Characteristic Symbol Test Conditions Min. Typ. Max. Unit 4.5 5.0 5.5 V - 10 15 mA 6.5 7.5 - V - 90 - s TA = 25C, CBYP = open - 90 - s VUVLOH TA = 25C, VCC rising - 3.8 - V VUVLOL TA = 25C, VCC falling - 3 - V tUVLOE TA = 25C, CBYP = open, VCC Fall Time (5 V to 3 V) = 1 s - 75 - s tUVLOD TA = 25C, CBYP = Open, VCC Recover Time (3 V to 5 V) = 1 s - 14 - s VPORH TA = 25C, VCC rising - 4 - V VPORL TA = 25C, VCC falling - 2.7 - V - 4.1 - s - 2.4 - s IP step = 60% of IP+, 80% input to 80% output, TA = 25C, COUT = 0.47 nF - 4.6 - s -3 dB; TA = 25C, CL = 0.47 nF - 120 - kHz k Supply Voltage VCC Supply Current ICC Output open Supply Zener Voltage VZ TA = 25C, ICC = 30 mA tPOD TA = 25C, CBYP = open tTC Power-On Delay1,2 Temperature Compensation Power-On Time1 Undervoltage Lockout (UVLO) Threshold1 UVLO Enable/Disable Delay Time1,2 Power-On Reset Voltage1 Rise Time1,2 Propagation Delay Time1,2 tr tPROP Response Time1,2 tRESPONSE Internal Bandwidth BWi IP step = 60% of IP+, 10% to 90% rise time, TA = 25C, CL = 0.47 nF IP step = 60% of IP+, 20% input to 20% output, TA = 25C, CL = 0.47 nF Output Load Resistance RL VIOUT to GND 4.7 - - Output Load Capacitance CL VIOUT to GND - - 10 nF RPRIMARY TA = 25C - 100 - VIOUT(QBI) Bidirectional variant, IP = 0 A, TA = 25C - VCC/2 - V VIOUT(QUNI) VRAT Unidirectional variant, IP = 0 A, TA = 25C VCC = 4.5 to 5.5 V - - 0.5 100 - - V % Primary Conductor Resistance Quiescent Output Voltage1 Ratiometry1 1See 2See Characteristic Definitions section of this datasheet. Timing Data Section of this data sheet Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 6 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor X050B PERFORMANCE CHARACTERISTICS1: Characteristic Primary Sampled Current Test Conditions IP SensTA Sensitivity2 TOP = -40C to 150C, CBYP = 0.1 F, VCC = 5 V, unless otherwise specified Symbol Measured using full scale IP , TA = 25C Sens(TOP)HT Measured using full scale IP , TOP = 25C to 150C Sens(TOP)LT Measured using full scale IP , TOP = -40C to 25C Sensitivity Drift Over Lifetime3 Noise4 Nonlinearity Electrical Offset Voltage Drift Over Lifetime3 Magnetic Offset Error Total Output Error7 Total Output Error Drift Over Lifetime3 Typ. Max. Unit -50 - 50 A mV/A 39.04 40 40.96 39.04 40 40.96 mV/A 38.6 40 41.4 mV/A -0.72 0.24 0.72 mV/A TA= 25C, 10 nF on VIOUT pin to GND - 10 - mV Measured using full scale and half scale IP, -1 - 1 % IP = 0 A, TA = 25C -10 4 10 mV VOE(TOP)HT IP = 0 A, TOP = 25C to 150C -10 6 10 mV VOE(TOP)LT IP = 0 A, TOP = -40C to 25C -20 6 20 mV -5 2 5 mV mA SensLIFE VNOISE ELIN VOE(TA) Electrical Offset Voltage5,6 Min. VOE(LIFE) TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing IP = 0 A, TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing IERROM IP = 0 A, TA = 25C, after excursion of 50 A - 120 300 ETOT(TA) Measured using full scale IP , TA = 25C -2.4 0.5 2.4 % ETOT(HT) Measured using full scale IP , TOP = 25C to 150C -2.4 1.5 2.4 % ETOT(LT) Measured using full scale IP , TOP = -40C to 25C -3.5 2 3.5 % TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing -1.9 0.6 1.9 % ETOT(LIFE) 1See Characteristic Performance Data page for parameter distributions over temperature range. parameter may drift a maximum of SensLIFE over lifetime. 3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 43 sigma noise voltage. 5Drift is referred to ideal V IOUT(QBI) = 2.5 V. 6This parameter may drift a maximum of V OE(LIFE) over lifetime. 7This parameter may drift a maximum of E TOT(LIFE) over lifetime. 2This Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 7 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor X050U PERFORMANCE CHARACTERISTICS1: Characteristic Primary Sampled Current Test Conditions IP SensTA Sensitivity2 TOP = -40C to 150C, CBYP = 0.1 F, VCC = 5 V, unless otherwise specified Symbol Measured using full scale IP , TA = 25C Sens(TOP)HT Measured using full scale IP , TOP = 25C to 150C Sens(TOP)LT Measured using full scale IP , TOP = -40C to 25C Sensitivity Drift Over Lifetime3 Noise4 Nonlinearity Electrical Offset Voltage Drift Over Lifetime3 Magnetic Offset Error Total Output Error7 Total Output Error Drift Over Lifetime3 Typ. Max. Unit 0 - 50 A mV/A 78.08 80 81.92 78.08 80 81.92 mV/A 77.2 80 82.8 mV/A -1.44 0.48 1.44 mV/A TA= 25C, 10 nF on VIOUT pin to GND - 20 - mV Measured using full scale and half scale IP -1 - 1 % IP = 0 A, TA = 25C -10 4 10 mV VOE(TOP)HT IP = 0 A, TOP = 25C to 150C -10 6 10 mV VOE(TOP)LT IP = 0 A, TOP = -40C to 25C -20 6 20 mV -5 2 5 mV mA SensLIFE VNOISE ELIN VOE(TA) Electrical Offset Voltage5,6 Min. VOE(LIFE) TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing IP = 0 A, TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing IERROM IP = 0 A, TA = 25C, after excursion of 50 A - 120 300 ETOT(TA) Measured using full scale IP , TA = 25C -2.4 0.5 2.4 % ETOT(HT) Measured using full scale IP , TOP = 25C to 150C -2.4 1.5 2.4 % ETOT(LT) Measured using full scale IP , TOP = -40C to 25C -3.5 2 3.5 % TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing -1.9 0.6 1.9 % ETOT(LIFE) 1See Characteristic Performance Data page for parameter distributions over temperature range. parameter may drift a maximum of SensLIFE over lifetime. 3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 43 sigma noise voltage. 5Drift is referred to ideal V IOUT(QBI) = 0.5 V. 6This parameter may drift a maximum of V OE(LIFE) over lifetime. 7This parameter may drift a maximum of E TOT(LIFE) over lifetime. 2This Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 8 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor X100B PERFORMANCE CHARACTERISTICS1: Characteristic Primary Sampled Current Test Conditions IP SensTA Sensitivity2 TOP = -40C to 150C, CBYP = 0.1 F, VCC = 5 V, unless otherwise specified Symbol Measured using full scale IP , TA = 25C Sens(TOP)HT Measured using full scale IP , TOP = 25C to 150C Sens(TOP)LT Measured using full scale IP , TOP = -40C to 25C Sensitivity Drift Over Lifetime3 Noise4 Nonlinearity SensLIFE VNOISE Electrical Offset Voltage Drift Over Lifetime3 Magnetic Offset Error Total Output Error7 Total Output Error Drift Over Lifetime3 Typ. Max. Unit -100 - 100 A mV/A 19.52 20 20.48 19.52 20 20.48 mV/A 19.3 20 20.7 mV/A -0.36 0.12 0.36 mV/A mV TA= 25C, 10 nF on VIOUT pin to GND - 6 - Measured using full scale and half scale IP -1 - 1 % IP = 0 A, TA = 25C -10 4 10 mV VOE(TOP)HT IP = 0 A, TOP = 25C to 150C -10 6 10 mV VOE(TOP)LT IP = 0 A, TOP = -40C to 25C -20 6 20 mV -5 2 5 mV mA ELIN VOE(TA) Electrical Offset Voltage5,6 TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing Min. VOE(LIFE) IP = 0 A, TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing IERROM IP = 0 A, TA = 25C, after excursion of 100 A - 170 425 ETOT(TA) Measured using full scale IP , TA = 25C -2.4 0.5 2.4 % ETOT(HT) Measured using full scale IP , TOP = 25C to 150C -2.4 1.5 2.4 % ETOT(LT) Measured using full scale IP , TOP = -40C to 25C -3.5 2 3.5 % TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing -1.9 0.6 1.9 % ETOT(LIFE) 1See Characteristic Performance Data page for parameter distributions over temperature range. parameter may drift a maximum of SensLIFE over lifetime. 3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 43 sigma noise voltage. 5Drift is referred to ideal V IOUT(QBI) = 2.5 V. 6This parameter may drift a maximum of V OE(LIFE) over lifetime. 7This parameter may drift a maximum of E TOT(LIFE) over lifetime. 2This Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 9 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor X100U PERFORMANCE CHARACTERISTICS1: Characteristic Primary Sampled Current Test Conditions IP SensTA Sensitivity2 TOP = -40C to 150C, CBYP = 0.1 F, VCC = 5 V, unless otherwise specified Symbol Measured using full scale IP , TA = 25C Sens(TOP)HT Measured using full scale IP , TOP = 25C to 150C Sens(TOP)LT Measured using full scale IP , TOP = -40C to 25C Sensitivity Drift Over Lifetime3 Noise4 Nonlinearity Electrical Offset Voltage Drift Over Lifetime3 Magnetic Offset Error Total Output Error7 Total Output Error Drift Over Lifetime3 Typ. Max. Unit 0 - 100 A mV/A 39.04 40 40.96 39.04 40 40.96 mV/A 38.6 40 41.4 mV/A -0.72 0.24 0.72 mV/A TA= 25C, 10 nF on VIOUT pin to GND - 12 - mV Measured using full scale and half scale IP -1 - 1 % IP = 0 A, TA = 25C -10 4 10 mV VOE(TOP)HT IP = 0 A, TOP = 25C to 150C -10 6 10 mV VOE(TOP)LT IP = 0 A, TOP = -40C to 25C -20 6 20 mV -5 2 5 mV mA SensLIFE VNOISE ELIN VOE(TA) Electrical Offset Voltage5,6 Min. VOE(LIFE) TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing IP = 0 A, TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing IERROM IP = 0 A, TA = 25C, after excursion of 100 A - 170 425 ETOT(TA) Measured using full scale IP , TA = 25C -2.4 0.5 2.4 % ETOT(HT) Measured using full scale IP , TOP = 25C to 150C -2.4 1.5 2.4 % ETOT(LT) Measured using full scale IP , TOP = -40C to 25C -3.5 2 3.5 % TOP = -40C to 150C, shift after AEC Q100 grade 0 qualification testing -1.9 0.6 1.9 % ETOT(LIFE) 1See Characteristic Performance Data page for parameter distributions over temperature range. parameter may drift a maximum of SensLIFE over lifetime. 3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 43 sigma noise voltage. 5Drift is referred to ideal V IOUT(QBI) = 0.5 V. 6This parameter may drift a maximum of V OE(LIFE) over lifetime. 7This parameter may drift a maximum of E TOT(LIFE) over lifetime. 2This Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 10 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor X150B PERFORMANCE CHARACTERISTICS1: Characteristic Primary Sampled Current Test Conditions IP SensTA Sensitivity2 TOP = -40C to 125C, CBYP = 0.1 F, VCC = 5 V, unless otherwise specified Symbol Measured using full scale IP , TA = 25C Sens(TOP)HT Measured using full scale IP , TOP = 25C to 150C Sens(TOP)LT Measured using full scale IP , TOP = -40C to 25C Sensitivity Drift Over Lifetime3 Noise4 Nonlinearity SensLIFE VNOISE Electrical Offset Voltage Drift Over Lifetime3 Magnetic Offset Error Total Output Error7 Total Output Error Drift Over Lifetime3 Typ. Max. Unit -150 - 150 A mV/A 13.01 13.33 13.65 13.01 13.33 13.65 mV/A 12.86 13.33 13.8 mV/A -0.24 0.08 0.24 mV/A mV TA= 25C, 10 nF on VIOUT pin to GND - 4 - Measured using full scale and half scale IP -1 - 1 % IP = 0 A, TA = 25C -10 4 10 mV VOE(TOP)HT IP = 0 A, TOP = 25C to 125C -10 6 10 mV VOE(TOP)LT IP = 0 A, TOP = -40C to 25C -20 6 20 mV -5 2 5 mV mA ELIN VOE(TA) Electrical Offset Voltage5,6 TOP = -40C to 125C, shift after AEC Q100 grade 0 qualification testing Min. VOE(LIFE) IP = 0 A, TOP = -40C to 125C, shift after AEC Q100 grade 0 qualification testing IERROM IP = 0 A, TA = 25C, after excursion of 150 A - 225 500 ETOT(TA) Measured using full scale IP , TA = 25C -2.4 0.5 2.4 % ETOT(HT) Measured using full scale IP , TOP = 25C to 150C -2.4 1.5 2.4 % ETOT(LT) Measured using full scale IP , TOP = -40C to 25C -3.5 2 3.5 % TOP = -40C to 125C, shift after AEC Q100 grade 0 qualification testing -1.9 0.6 1.9 % ETOT(LIFE) 1See Characteristic Performance Data page for parameter distributions over temperature range. parameter may drift a maximum of SensLIFE over lifetime. 3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 43 sigma noise voltage. 5Drift is referred to ideal V IOUT(QBI) = 2.5 V. 6This parameter may drift a maximum of V OE(LIFE) over lifetime. 7This parameter may drift a maximum of E TOT(LIFE) over lifetime. 2This Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 11 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor X150U PERFORMANCE CHARACTERISTICS1: Characteristic Primary Sampled Current Test Conditions IP SensTA Sensitivity2 TOP = -40C to 125C, CBYP = 0.1 F, VCC = 5 V, unless otherwise specified Symbol Measured using full scale IP , TA = 25C Sens(TOP)HT Measured using full scale IP , TOP = 25C to 150C Sens(TOP)LT Measured using full scale IP , TOP = -40C to 25C Sensitivity Drift Over Lifetime3 Noise4 Nonlinearity SensLIFE VNOISE Electrical Offset Voltage Drift Over Lifetime3 Magnetic Offset Error Total Output Error7 Total Output Error Drift Over Lifetime3 Typ. Max. Unit 0 - 150 A mV/A 26.02 26.66 27.30 26.02 26.66 27.30 mV/A 25.73 26.66 27.59 mV/A -0.48 0.16 0.48 mV/A mV TA= 25C, 10 nF on VIOUT pin to GND - 6 - Measured using full scale and half scale IP -1 - 1 % IP = 0 A, TA = 25C -10 4 10 mV VOE(TOP)HT IP = 0 A, TOP = 25C to 125C -10 6 10 mV VOE(TOP)LT IP = 0 A, TOP = -40C to 25C -20 6 20 mV -5 2 5 mV mA ELIN VOE(TA) Electrical Offset Voltage5,6 TOP = -40C to 125C, shift after AEC Q100 grade 0 qualification testing Min. VOE(LIFE) IP = 0 A, TOP = -40C to 125C, shift after AEC Q100 grade 0 qualification testing IERROM IP = 0 A, TA = 25C, after excursion of 150 A - 225 500 ETOT(TA) Measured using full scale IP , TA = 25C -2.4 0.5 2.4 % ETOT(HT) Measured using full scale IP , TOP = 25C to 150C -2.4 1.5 2.4 % ETOT(LT) Measured using full scale IP , TOP = -40C to 25C -3.5 2 3.5 % TOP = -40C to 125C, shift after AEC Q100 grade 0 qualification testing -1.9 0.6 1.9 % ETOT(LIFE) 1See Characteristic Performance Data page for parameter distributions over temperature range. parameter may drift a maximum of SensLIFE over lifetime. 3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 43 sigma noise voltage. 5Drift is referred to ideal V IOUT(QBI) = 0.5 V. 6This parameter may drift a maximum of V OE(LIFE) over lifetime. 7This parameter may drift a maximum of E TOT(LIFE) over lifetime. 2This Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 12 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor X200B PERFORMANCE CHARACTERISTICS1: Characteristic Primary Sampled Current Test Conditions IP SensTA Sensitivity2 TOP = -40C to 85C, CBYP = 0.1 F, VCC = 5 V, unless otherwise specified Symbol Measured using full scale IP , TA = 25C Sens(TOP)HT Measured using full scale IP , TOP = 25C to 150C Sens(TOP)LT Measured using full scale IP , TOP = -40C to 25C Sensitivity Drift Over Lifetime3 Noise4 Nonlinearity SensLIFE VNOISE Electrical Offset Voltage Drift Over Lifetime3 Magnetic Offset Error Total Output Error7 Total Output Error Drift Over Lifetime3 Typ. Max. Unit -200 - 200 A mV/A 9.76 10 10.24 9.76 10 10.24 mV/A 9.65 10 10.35 mV/A -0.18 0.06 0.18 mV/A mV TA= 25C, 10 nF on VIOUT pin to GND - 3 - Measured using full scale and half scale IP -1 - 1 % IP = 0 A, TA = 25C -10 4 10 mV VOE(TOP)HT IP = 0 A, TOP = 25C to 85C -10 6 10 mV VOE(TOP)LT IP = 0 A, TOP = -40C to 25C -20 6 20 mV -5 2 5 mV mA ELIN VOE(TA) Electrical Offset Voltage5,6 TOP = -40C to 85C, shift after AEC Q100 grade 0 qualification testing Min. VOE(LIFE) IP = 0 A, TOP = -40C to 85C, shift after AEC Q100 grade 0 qualification testing IERROM IP = 0 A, TA = 25C, after excursion of 200 A - 250 575 ETOT(TA) Measured using full scale IP , TA = 25C -2.4 0.5 2.4 % ETOT(HT) Measured using full scale IP , TOP = 25C to 150C -2.4 1.5 2.4 % ETOT(LT) Measured using full scale IP , TOP = -40C to 25C -3.5 2 3.5 % TOP = -40C to 85C, shift after AEC Q100 grade 0 qualification testing -1.9 0.6 1.9 % ETOT(LIFE) 1See Characteristic Performance Data page for parameter distributions over temperature range. parameter may drift a maximum of SensLIFE over lifetime. 3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 43 sigma noise voltage. 5Drift is referred to ideal V IOUT(QBI) = 2.5 V. 6This parameter may drift a maximum of V OE(LIFE) over lifetime. 7This parameter may drift a maximum of E TOT(LIFE) over lifetime. 2This Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 13 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor X200U PERFORMANCE CHARACTERISTICS1: Characteristic Primary Sampled Current Test Conditions IP SensTA Sensitivity2 TOP = -40C to 85C, CBYP = 0.1 F, VCC = 5 V, unless otherwise specified Symbol Measured using full scale IP , TA = 25C Sens(TOP)HT Measured using full scale IP , TOP = 25C to 150C Sens(TOP)LT Measured using full scale IP , TOP = -40C to 25C Sensitivity Drift Over Lifetime3 Noise4 Nonlinearity SensLIFE VNOISE Electrical Offset Voltage Drift Over Lifetime3 Magnetic Offset Error Total Output Error7 Total Output Error Drift Over Lifetime3 Typ. Max. Unit 0 - 200 A mV/A 19.52 20 20.48 19.52 20 20.48 mV/A 19.3 20 20.7 mV/A -0.36 0.12 0.36 mV/A mV TA= 25C, 10 nF on VIOUT pin to GND - 6 - Measured using full scale and half scale IP -1 - 1 % IP = 0 A, TA = 25C -10 4 10 mV VOE(TOP)HT IP = 0 A, TOP = 25C to 85C -10 6 10 mV VOE(TOP)LT IP = 0 A, TOP = -40C to 25C -20 6 20 mV -5 2 5 mV mA ELIN VOE(TA) Electrical Offset Voltage5,6 TOP = -40C to 85C, shift after AEC Q100 grade 0 qualification testing Min. VOE(LIFE) IP = 0 A, TOP = -40C to 85C, shift after AEC Q100 grade 0 qualification testing IERROM IP = 0 A, TA = 25C, after excursion of 200 A - 250 575 ETOT(TA) Measured using full scale IP , TA = 25C -2.4 0.5 2.4 % ETOT(HT) Measured using full scale IP , TOP = 25C to 150C -2.4 1.5 2.4 % ETOT(LT) Measured using full scale IP , TOP = -40C to 25C -3.5 2 3.5 % TOP = -40C to 85C, shift after AEC Q100 grade 0 qualification testing -1.9 0.6 1.9 % ETOT(LIFE) 1See Characteristic Performance Data page for parameter distributions over temperature range. parameter may drift a maximum of SensLIFE over lifetime. 3Based on characterization data obtained during standardized stress test for Qualification of Integrated Circuits, including Package Hysteresis. Cannot be guaranteed. Drift is a function of customer application conditions. Please contact Allegro MicroSystems for further information. 43 sigma noise voltage. 5Drift is referred to ideal V IOUT(QBI) = 0.5 V. 6This parameter may drift a maximum of V OE(LIFE) over lifetime. 7This parameter may drift a maximum of E TOT(LIFE) over lifetime. 2This Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 14 Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor ACS770xCB Characteristic Performance Data Data taken using the ACS770LCB-50B Accuracy Data Sensitivity versus Ambient Temperature 6 41.0 4 40.8 2 40.6 Sens (mV/A) VOE (mV) Electrical Offset Voltage versus Ambient Temperature 0 -2 40.4 40.2 40.0 -4 39.8 -6 39.6 -8 -50 39.4 -25 0 25 50 75 100 125 150 -50 -25 0 25 TA (C) 50 75 100 125 150 TA (C) Nonlinearity versus Ambient Temperature Magnetic Offset Error versus Ambient Temperature 0 250 -0.1 200 -0.3 IERROM (mA) ELIN (%) -0.2 -0.4 -0.5 -0.6 -0.7 150 100 50 -0.8 -0.9 -50 -25 0 25 50 75 100 125 0 -50 150 -25 0 25 TA (C) 50 75 100 125 150 TA (C) Total Output Error versus Ambient Temperature 2.5 2.0 1.5 ETOT (%) 1.0 0.5 0 -0.5 -1.0 -1.5 -50 -25 0 25 50 75 100 125 150 TA (C) Mean + 3 sigma Mean Mean - 3 sigma Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 15 Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor ACS770xCB Characteristic Performance Data Data taken using the ACS770LCB-100B Accuracy Data Sensitivity versus Ambient Temperature 8 20.4 6 20.3 4 20.2 Sens (mV/A) VOE (mV) Electrical Offset Voltage versus Ambient Temperature 2 0 -2 20.1 20.0 19.9 -4 19.8 -6 19.7 19.6 -8 -50 -25 0 25 50 75 100 125 150 -50 -25 0 25 TA (C) Nonlinearity versus Ambient Temperature 400 -0.1 350 100 125 150 300 IERROM (mA) -0.2 ELIN (%) 75 Magnetic Offset Error versus Ambient Temperature 0 -0.3 -0.4 -0.5 -0.6 -0.7 -50 50 TA (C) 250 200 150 100 50 -25 0 25 50 75 100 125 0 -50 150 -25 0 TA (C) 25 50 75 100 125 150 TA (C) Total Output Error versus Ambient Temperature 2.5 2.0 1.5 ETOT (%) 1.0 0.5 0 -0.5 -1.0 -1.5 -2.0 -50 -25 0 25 50 75 100 125 150 TA (C) Mean + 3 sigma Mean Mean - 3 sigma Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 16 Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor ACS770xCB Characteristic Performance Data Data taken using the ACS770KCB-150B Accuracy Data Electrical Offset Voltage versus Ambient Temperature 13.60 6 13.55 Sens (mV/A) 8 4 VOE (mV) Sensitivity versus Ambient Temperature 2 0 13.45 13.40 13.35 13.30 13.25 -2 13.20 -4 -6 -50 13.50 13.15 -25 0 25 50 75 100 125 13.10 -50 150 -25 0 25 TA (C) 75 100 125 150 Magnetic Offset Error versus Ambient Temperature 450 -0.1 400 -0.2 350 -0.3 IERROM (mA) ELIN (%) Nonlinearity versus Ambient Temperature 0 -0.4 -0.5 -0.6 300 250 200 150 100 -0.7 -0.8 -50 50 TA (C) 50 -25 0 25 50 75 100 125 0 -50 150 -25 0 25 TA (C) 50 75 100 125 150 TA (C) Total Output Error versus Ambient Temperature 2.0 1.5 1.0 ETOT (%) 0.5 0 -0.5 -1.0 -1.5 -2.0 -50 -25 0 25 50 75 100 125 150 TA (C) Mean + 3 sigma Mean Mean - 3 sigma Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 17 Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor ACS770xCB Characteristic Performance Data Data taken using the ACS770ECB-200B Accuracy Data Sensitivity versus Ambient Temperature 6 10.15 4 10.10 Sens (mV/A) VOE (mV) Electrical Offset Voltage versus Ambient Temperature 2 0 -2 10.00 9.95 9.90 -4 9.85 9.80 -6 -50 10.05 -25 0 25 50 75 100 125 150 -50 -25 0 25 TA (C) 75 100 125 150 Magnetic Offset Error versus Ambient Temperature 0 600 -0.1 500 -0.2 400 IERROM (mA) ELIN (%) Nonlinearity versus Ambient Temperature -0.3 -0.4 -0.5 -0.6 -50 50 TA (C) 300 200 100 -25 0 25 50 75 100 125 0 -50 150 -25 0 25 TA (C) 50 75 100 125 150 TA (C) Total Output Error versus Ambient Temperature 1.5 1.0 ETOT (%) 0.5 0 -0.5 -1.0 -1.5 -2.0 -50 -25 0 25 50 75 100 125 150 TA (C) Mean + 3 sigma Mean Mean - 3 sigma Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 18 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Characteristic Performance Data Data taken using the ACS770LCB-100B Timing Data Response Time IP = 60 A , 10% to 90% rise time = 1 s, CBYPASS = 0.1 F, CL = 0.47 nF IP = 60 A VIOUT 80% of input 80% of output tRESPONSE = 4.56 s Rise Time IP = 60 A , 10% to 90% rise time = 1 s, CBYPASS = 0.1 F, CL = 0.47 nF IP = 60 A VIOUT 90% of output tr = 4.1 s 10% of output Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 19 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Propagation Time IP = 60 A , 10% to 90% rise time = 1 s, CBYPASS = 0.1 F, CL = 0.47 nF IP = 60 A VIOUT tPROP = 2.4 s 20% of input 20% of output Power-On Delay IP = 60 A DC, CBYPASS = Open, CL = 0.47 nF VCC VCC (min) tPOD = 88 s 90% of output VIOUT Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 20 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor UVLO Enable Time ( tUVLOE ) IP = 0 A , CBYPASS = Open, CL = Open, VCC 5 V to 3 V fall time = 1 s tUVLOE = 75.3 s VCC VUVLOL VIOUT VIOUT = 0 V UVLO Disable Time ( tUVLOD ) IP = 0 A , CBYPASS = Open, CL = Open, VCC 3 V to 5 V recovery time = 1 s tUVLOD = 13.9 s VCC VCC (min) VIOUT 90% of output Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 21 Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor ACS770xCB Characteristic Definitions Definitions of Accuracy Characteristics Sensitivity (Sens). The change in device output in response to a 1 A change through the primary conductor. The sensitivity is the product of the magnetic circuit sensitivity (G / A) and the linear IC amplifier gain (mV/G). The linear IC amplifier gain is programmed at the factory to optimize the sensitivity (mV/A) for the half-scale current of the device. Noise (VNOISE). The noise floor is derived from the thermal and shot noise observed in Hall elements. Dividing the noise (mV) by the sensitivity (mV/A) provides the smallest current that the device is able to resolve. Nonlinearity (ELIN). The ACS770 is designed to provide a linear output in response to a ramping current. Consider two current levels, I1 and I2. Ideally, the sensitivity of a device is the same for both currents, for a given supply voltage and temperature. Nonlinearity is present when there is a difference between the sensitivities measured at I1 and I2. Nonlinearity is calculated separately for the positive (ELINpos ) and negative (ELINneg ) applied currents as follows: ELINpos = 100 (%) x {1 - (SensIPOS2 / SensIPOS1 ) } ELINneg = 100 (%) x {1 - (SensINEG2 / SensINEG1 )} where: SensIx = (VIOUT(Ix) - VIOUT(Q))/ Ix and IPOSx and INEGx are positive and negative currents. Then: ELIN = max( ELINpos , ELINneg ) Ratiometry. The device features a ratiometric output. This means that the quiescent voltage output, VIOUTQ, and the magnetic sensitivity, Sens, are proportional to the supply voltage, VCC. The ratiometric change (%) in the quiescent voltage output is defined as: $VIOUTQ($V) = VIOUTQ(VCC) VIOUTQ(5V) VCC 5V s %) and the ratiometric change (%) in sensitivity is defined as: $Sens($V = Sens(VCC VCC Sens(V 5V s %) Quiescent output voltage (VIOUT(Q)). The output of the device when the primary current is zero. For bidirectional current flow, it nominally remains at VCC 2. Thus, VCC = 5 V translates into VIOUT(QBI) = 2.5 V. For unidirectional devices, when VCC = 5 V, VIOUT(QUNI) = 0.5 V. Variation in VIOUT(Q) can be attributed to the resolution of the Allegro linear IC quiescent voltage trim, magnetic hysteresis, and thermal drift. Electrical offset voltage (VOE). The deviation of the device output from its ideal quiescent value of VCC 2 for bidirectional sensor ICs and 0.5 V for unidirectional sensor ICs, due to nonmagnetic causes. Magnetic offset error (IERROM). The magnetic offset is due to the residual magnetism (remnant field) of the core material. The magnetic offset error is highest when the magnetic circuit has been saturated, usually when the device has been subjected to a full-scale or high-current overload condition. The magnetic offset is largely dependent on the material used as a flux concentrator. Total Output Error (ETOT). The maximum deviation of the actual output from its ideal value, also referred to as accuracy, illustrated graphically in the output voltage versus current chart on the following page. ETOT is divided into four areas: 0 A at 25C. Accuracy at the zero current flow at 25C, without the effects of temperature. 0 A over temperature. Accuracy at the zero current flow including temperature effects. Full-scale current at 25C. Accuracy at the full-scale current at 25C, without the effects of temperature. Full-scale current over temperature. Accuracy at the fullscale current flow including temperature effects. ETOT(IP) = VIOUT(IP) - VIOUT_IDEAL(IP) SensIDEAL s IP s %) where VIOUT_IDEAL(IP) = VIOUT(Q) + (SensIDEAL x IP ) Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 22 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Definitions of Dynamic Response Characteristics Power-On Delay (tPOD). When the supply is ramped to its operating voltage, the device requires a finite time to power its internal components before responding to an input magnetic field. Power-On Delay, tPOD , is defined as the time it takes for the output voltage to settle within 10% of its steady state value under an applied magnetic field, after the power supply has reached its minimum specified operating voltage, VCC(min), as shown in the chart at right. Temperature Compensation Power-On Time (tTC ). After Power-On Delay, tPOD , elapses, tTC also is required before a valid temperature compensated output. Rise Time (tr). The time interval between a) when the device reaches 10% of its full scale value, and b) when it reaches 90% of its full scale value. Both tr and tRESPONSE are detrimentally affected by eddy current losses observed in the conductive IC ground plane. Output Voltage versus Sampled Current Total Output Error at 0 A and at Full-Scale Current Response Time (tRESPONSE) The time interval between a) when the applied current reaches 80% of its final value, and b) when the sensor reaches 80% of its output corresponding to the applied current. Accuracy Over $Temp erature Increasing VIOUT(V) Accuracy 25C Only Propagation Delay (tPROP). The time interval between a) when the input current reaches 20% of its final value, and b) when the output reaches 20% of its final value. Average VIOUT Accuracy Over $Temp erature Accuracy 25C Only IP(min) (%) Applied Magnetic Field -IP (A) +IP (A) Half Scale 90 Transducer Output IP(max) 0A Decreasing VIOUT(V) Rise Time, tr Accuracy 25C Only 20 10 0 Propagation Delay, tPROP t Accuracy Over $Temp erature Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 23 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Power-On Reset Voltage (VPOR ) At power-up, to initialize to a known state and avoid current spikes, the ACS770 is held in Reset state. The Reset signal is disabled when VCC reaches VUVLOH and time tPORR has elapsed, allowing output voltage to go from a high impedance state into normal operation. During power-down, the Reset signal is enabled when VCC reaches VPORL , causing output voltage to go into a high impedance state. (Note that a detailed description of POR and UVLO operation can be found in the Functional Description section.) Undervoltage Lockout Threshold (VUVLO ) If VCC drops below VUVLOL , output voltage will be locked to GND. If VCC starts rising, the ACS770 will come out of the locked state when VCC reaches VUVLOH . UVLO Enable/Disable Delay Time (tUVLO ) When a falling VCC reaches VUVLOL , time tUVLOE is required to engage Undervoltage Lockout state. When VCC rises above VUVLOH , time tUVLOD is required to disable UVLO and have a valid output voltage. Power-On Reset Release Time (tPORR) When VCC rises to VPORH , the Power-On Reset Counter starts. The ACS770 output voltage will transition from a high impedance state to normal operation only when the Power-On Reset Counter has reached tPORR and VCC has exceeded VUVLOH . Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 24 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Functional Description Power-On Reset (POR) and Undervoltage Lock-Out (UVLO) Operation The descriptions in this section assume: Temperature = 25C, VCC = 5 V, no output load, and no significant current flow through the sensor IC. Voltage levels shown are specific to a bidirectional ACS770, however the POR and UVLO functionality described also applies to unidirectional sensors. The reference numbers section refer to figures 1 and 2. * Power-Up At power-up, as VCC ramps up, the output is in a high impedance state. When VCC crosses VPORH (location [1] in figure 1 and [ 1 ] in figure 2), the POR Release counter starts counting for tPORR . At this point, if VCC exceeds VUVLOH [ 2 ], the output will go to VCC / 2 after tUVLOD [ 3 ] . If VCC does not exceed VUVLOH [2], the output will stay in the high impedance state until VCC reaches VUVLOH [3] and then will go to VCC / 2 after tUVLOD [ 4 ]. * VCC drops below VCC(min) = 4.5 V If VCC drops below VUVLOL [ 4, 5 ] , the UVLO Enable Counter starts counting. If VCC is still below VUVLOL when the counter reaches tUVLOE , the UVLO function will be enabled and the ouput will be pulled near GND [ 6 ] . If VCC exceeds VUVLOL before the UVLO Enable Counter reaches tUVLOE [ 5 ] , the output will continue to be VCC / 2. * Coming Out of UVLO While UVLO is enabled [ 6 ] , if VCC exceeds VUVLOH [ 7 ] , UVLO will be disabled after tUVLOD , and the output will be VCC / 2 [ 8 ] . * Power-Down As VCC ramps down below VUVLOL [ 6, 9 ] , the UVLO Enable Counter will start counting. If VCC is higher than VPORL when the counter reaches tUVLOE , the UVLO function will be enabled and the output will be pulled near GND [ 10 ] . The output will enter a high impedance state as VCC goes below VPORL [ 11 ] . If VCC falls below VPORL before the UVLO Enable Counter reaches tUVLOE , the output will transition directly into a high impedance state [ 7 ]. Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 25 Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor ACS770xCB VCC 1 2 3 5.0 5 4 VUVLOH VUVLOL VPORH VPORL 6 7 9 8 tUVLOE 10 11 tUVLOE GND VOUT Time Slope = VCC / 2 2.5 tPORR GND tUVLOD tUVLOD High Impedance High Impedance Time Figure 1. POR and UVLO Operation: Slow Rise Time case VCC 5.0 VUVLOH VUVLOL VPORH VPORL 1' 2' 3' 4' 5' 6' 7' < tUVLOE GND VOUT Time tPORR Slope = VCC / 2 < tUVLOE Slope = VCC / 2 2.5 tUVLOD GND High Impedance High Impedance Time Figure 2. POR and UVLO Operation: Fast Rise Time case Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 26 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Chopper Stabilization Technique When using Hall-effect technology, a limiting factor for switchpoint accuracy is the small signal voltage developed across the Hall element. This voltage is disproportionally small relative to the offset that can be produced at the output of the Hall sensor IC. This makes it difficult to process the signal while maintaining an accurate, reliable output over the specified operating temperature and voltage ranges. Chopper stabilization is a unique approach used to minimize Hall offset on the chip. Allegro employs a patented technique to remove key sources of the output drift induced by thermal and mechanical stresses. This offset reduction technique is based on a signal modulation-demodulation process. The undesired offset signal is separated from the magnetic field-induced signal in the frequency domain, through modulation. The subsequent demodulation acts as a modulation process for the offset, causing the magnetic field-induced signal to recover its original spectrum at baseband, while the DC offset becomes a high-frequency signal. The magnetic- sourced signal then can pass through a low-pass filter, while the modulated DC offset is suppressed. In addition to the removal of the thermal and stress related offset, this novel technique also reduces the amount of thermal noise in the Hall sensor IC while completely removing the modulated residue resulting from the chopper operation. The chopper stabilization technique uses a high-frequency sampling clock. For demodulation process, a sample-and-hold technique is used. This high-frequency operation allows a greater sampling rate, which results in higher accuracy and faster signal-processing capability. This approach desensitizes the chip to the effects of thermal and mechanical stresses, and produces devices that have extremely stable quiescent Hall output voltages and precise recoverability after temperature cycling. This technique is made possible through the use of a BiCMOS process, which allows the use of low-offset, low-noise amplifiers in combination with high-density logic integration and sample-and-hold circuits. Regulator Clock/Logic Hall Element Amp Anti-Aliasing LP Filter Tuned Filter Concept of Chopper Stabilization Technique Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 27 Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor ACS770xCB Package CB, 5-pin package, leadform PFF 0.5 R1 R3 0.5 B 14.00.2 3.00.2 1.500.10 4.00.2 5 4 4 R2 21.4 3 12 A 3.50.2 0.8 17.50.2 1.5 13.000.10 1.91 B Branded Face 4.400.10 PCB Layout Reference View 2.90.2 NNNNNNN TTT - AAA 55 1 2 +0.060 0.381 -0.030 3 10.000.10 3.50.2 LLLLLLL YYWW 1 7.000.10 C Standard Branding Reference View 0.510.10 1.90.2 N = Device part number T = Temperature code A = Amperage range L = Lot number Y = Last two digits of year of manufacture W = Week of manufacture = Supplier emblem For Reference Only; not for tooling use (reference DWG-9111, DWG-9110) Dimensions in millimeters Dimensions exclusive of mold flash, gate burrs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown A Dambar removal intrusion B Perimeter through-holes recommended C Branding scale and appearance at supplier discretion Creepage distance, current terminals to signal pins: 7.25 mm Clearance distance, current terminals to signal pins: 7.25 mm Package mass: 4.63 g typical Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 28 Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor ACS770xCB Package CB, 5-pin package, leadform PSF 14.00.2 0.8 .031 3.00.2 4.00.2 1.5 .059 1.500.10 4 5 1.91 .075 Recommended PCB Layout View A 2.750.10 NNNNNNN TTT - AAA 23.500.5 13.000.10 LLLLLLL 4.400.10 YYWW Branded Face 1 2.90.2 55 1 2 +0.060 0.381 -0.030 3 10.000.10 3.50.2 7.000.10 B Standard Branding Reference View N = Device part number T = Temperature code A = Amperage range L = Lot number Y = Last two digits of year of manufacture W = Week of manufacture = Supplier emblem For Reference Only; not for tooling use (reference DWG-9111, DWG-9110) Dimensions in millimeters Dimensions exclusive of mold flash, gate burrs, and dambar protrusions Exact case and lead configuration at supplier discretion within limits shown A Dambar removal intrusion B Branding scale and appearance at supplier discretion 0.510.10 1.90.2 Creepage distance, current terminals to signal pins: 7.25 mm Clearance distance, current terminals to signal pins: 7.25 mm Package mass: 4.63 g typical Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 29 ACS770xCB Thermally Enhanced, Fully Integrated, Hall Effect-Based High Precision Linear Current Sensor IC with 100 Current Conductor Copyright (c)2011-2013, Allegro MicroSystems, LLC Allegro MicroSystems, LLC reserves the right to make, from time to time, such departures from the detail specifications as may be required to permit improvements in the performance, reliability, or manufacturability of its products. Before placing an order, the user is cautioned to verify that the information being relied upon is current. Allegro's products are not to be used in any devices or systems, including but not limited to life support devices or systems, in which a failure of Allegro's product can reasonably be expected to cause bodily harm. The information included herein is believed to be accurate and reliable. However, Allegro MicroSystems, LLC assumes no responsibility for its use; nor for any infringement of patents or other rights of third parties which may result from its use. For the latest version of this document, visit our website: www.allegromicro.com Allegro MicroSystems, LLC 115 Northeast Cutoff Worcester, Massachusetts 01615-0036 U.S.A. 1.508.853.5000; www.allegromicro.com 30