SCANPSC110FDM - National Semiconductor

SCANPSC110F

SCAN Bridge Hierarchical and Multidrop Addressable

JTAG Port (IEEE1149.1 System Test Support)

General Description

The SCANPSC110F Bridge extends the IEEE Std. 1149.1

test bus into a multidrop test bus environment. The advan-

tage of a hierarchical approach over a single serial scan

chain is improved test throughput and the ability to remove a

board from the system and retain test access to the remain-

ing modules. Each SCANPSC110F Bridge supports up to 3

local scan rings which can be accessed individually or com-

bined serially. Addressing is accomplished by loading the in-

struction register with a value matching that of the Slot in-

puts. Backplane and inter-board testing can easily be

accomplished by parking the local TAP Controllers in one of

the stable TAP Controller states via a Park instruction. The

32-bit TCK counter enables built in self test operations to be

performed on one port while other scan chains are simulta-

neously tested.

Features

nTrue IEEE1149.1 hierarchical and multidrop addressable

capability

nThe 6 slot inputs support up to 59 unique addresses, a

Broadcast Address, and 4 Multi-cast Group Addresses

n3 IEEE 1149.1-compatible configurable local scan ports

nMode Register allows local TAPs to be bypassed,

selected for insertion into the scan chain individually, or

serially in groups of two or three

n32-bit TCK counter

n16-bit LFSR Signature Compactor

nLocal TAPs can be tri-stated via the OE input to allow

an alternate test master to take control of the local TAPs

nThe IP version of this device supports features not

described in this datasheet such as 8 slot inputs for

enhanced address capability and additional instructions.

For a completed description of the additional instructions

supported, refer to the SCANPSC110 supplemental

datasheet.

Connection Diagrams

TRI-STATE®is a registered trademark of National Semiconductor Corporation.

28-Pin

CDIP and Flatpak

DS100327-1

Pin Assignment for LCC

DS100327-2

October 1999

SCANPSC110F SCAN Bridge

Connection Diagrams (Continued)

Order Number Description

SCANPSC110FFMQB Military Flatpak

SCANPSC110FDMQB Military DIP

SCANPSC110FLMQB Military Leadless Chip Carrier

Names Description

TCK

Backplane Test Clock Input

TMS

Backplane Test Mode Select Input

TDI

Backplane Test Data Input

TDO

Backplane Test Data Output

TRST Asynchronous Test Reset Input (Active low)

(0,5)

Address Select Port

OE Local Scan Port Output Enable (Active low)

TCK

L(1–3)

Local Port Test Clock Output

TMS

L(1–3)

Local Port Test Mode Select Output

TDI

L(1–3)

Local Port Test Data Input

TDO

L(1–3)

Local Port Test Data Output

Table of Contents

1. GLOSSARY OF TERMS: 2

2. DETAILED PIN DESCRIPTION TABLE: 3

3. OVERVIEW OF SCAN BRIDGE FUNCTIONS: 4

A. SCANPSC110F Bridge Architecture: 4

B. SCANPSC110F Bridge State Machines: 4

4. TESTER/SCANPSC110F BRIDGE INTERFACE: 8

5. REGISTER SET: 8

6. ADDRESSING SCHEME: 8

7. HIERARCHICAL TEST SUPPORT: 9

8. LEVEL 1 PROTOCOL: 9

A. Addressing Modes: 9

B. Direct Addressing: 10

C. Broadcast Addressing: 10

D. Multi-Cast Addressing: 10

9. LEVEL 2 PROTOCOL: 11

A. Level 2 Instruction Types: 11

B. Level 2 Instruction Descriptions: 12

10. REGISTER DESCRIPTIONS: 14

11. SPECIAL FEATURES: 16

A. BIST Support: 16

B. RESET: 16

C. Port Synchronization: 16

12. ABSOLUTE MAXIMUM RATINGS: 18

13. RECOMMENDED OPERATING CONDITIONS: 18

14. DC ELECTRICAL CHARACTERISTICS: 18

15. AC ELECTRICAL CHARACTERISTICS: 20

16. AC WAVEFORMS: 22

17. APPENDIX: 24

A. State Diagram for Boundary-Scan TAP Control-

ler: 24

18. APPLICATIONS EXAMPLE: 24

TABLE 1. Glossary of Terms

LFSR Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial

test data.

LSP Local Scan Port. A four signal port that drives a “local” (i.e. non-backplane) scan chain. (e.g.,

TCK

, TMS

, TDO

, TDI

)

Local Local is used to describe IEEE Std. 1149.1 compliant scan rings and the SCANPSC110F Bridge

Test Access Port that drives them. The term “local” was adopted from the system test architecture

that the ’PSC110F Bridge will most commonly be used in; namely, a system test backplane with a

’PSC110F Bridge on each card driving up to 3 “local” scan rings per card. (Each card can contain

multiple ’PSC110Fs, with 3 local scan ports per ’PSC110F.)

Park/Unpark Park, parked, unpark, and unparked, are used to describe the state of the LSP controller and the

state of the local TAP controllers (the “local TAP controllers” refers to the TAP controllers of the

scan components that make up a local scan ring). Park is also used to describe the action of

parking a LSP (transitioning into one of the Parked LSP controller states). It is important to

understand that when a LSP controller is in one of the parked states, TMS

is held constant,

thereby holding or “parking” the local TAP controllers in a given state.

TAP Test Access Port as defined by IEEE Std. 1149.1

Selected/Unselected Selected and Unselected refers to the state of the ’PSC110F Bridge Selection Controller. A

selected ’PSC110F has been properly addressed and is ready to receive Level 2 protocol.

Unselected ’PSC110Fs monitor the system test backplane, but do not accept Level 2 protocol

(except for the

GOTOWAIT

instruction). The data registers and LSPs of unselected ’PSC110Fs are

not accessible from the system test master.

SCANPSC110F

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Table of Contents (Continued)

TABLE 1. Glossary of Terms (Continued)

Active Scan Chain The Active Scan Chain refers to the scan chain configuration as seen by the test master at a given

moment. When a ’PSC110F is selected with all of its LSPs parked, the active scan chain is the

current scan bridge register only. When a LSP is unparked, the active scan chain becomes: TDI

→the current ’PSC110F register →the local scan ring registers →a PAD bit →TDO

. Refer to

Table 4

for Unparked configurations of the LSP network.

Level 1 Protocol Level 1 is the protocol used to address a ’PSC110F.

Level 2 Protocol Level 2 is the protocol that is used once a ’PSC110F is selected. Level 2 protocol is IEEE Std.

1149.1 compliant when an individual ’PSC110F is selected.

PAD A one bit register that is placed at the end of each local scan port scan-chain. The PAD bit

eliminates the prop delay that would be added by the ’PSC110F LSPN logic between TDI

and

TDO

L(n+1)

or TDO

by buffering and synchronizing the TDI

inputs to the falling edge of TCK

thus allowing data to be scanned at higher frequencies without violating set-up and hold times.

LSB Least Significant Bit, the right-most position in a register (bit 0)

MSB Most Significant Bit, the left-most position in a register

TABLE 2. Detailed Pin Description Table

Pin #

Name I/O (Note 1) (SOIC Description

& LCC)

TMS

TTL Input w/Pull-Up

Resistor 10 BACKPLANE TEST MODE SELECT: Controls sequencing through the TAP

Controller of the SCANPSC110F Bridge. Also controls sequencing of the TAPs

which are on the three (3) local scan chains.

TDI

TTL Input w/Pull-Up

Resistor 12 BACKPLANE TEST DATA INPUT: All backplane scan data is supplied to the

’PSC110F through this input pin.

TDO

TRI-STATEable, 13 BACKPLANE TEST DATA OUTPUT: This output drives test data from the

’PSC110F and the local TAPs, back toward the scan master controller.

32 mA/64 mA Drive,

Reduced-Swing,

Output

TCK

TTL Schmitt Trigger

Input 11 TEST CLOCK INPUT FROM THE BACKPLANE: This is the master clock

signal that controls all scan operations of the ’PSC110F and of the three (3)

local scan ports.

TRST TTL Input w/Pull-Up 9 TEST RESET: An asynchronous reset signal (active low) which initializes the

’PSC110F logic.

Resistor

(0–5)

TTL Inputs 2, 3, 4, SLOT IDENTIFICATION: The configuration of these six (6) pins is used to

identify (assign a unique address to) each ’PSC110F on the system backplane.

5, 6, 7

OE TTL Input 1 OUTPUT ENABLE for the Local Scan Ports, active low. When high, this

active-low control signal TRI-STATEs all three local scan ports on the

’PSC110F, to enable an alternate resource to access one or more of the three

(3) local scan chains.

TDO

L(1–3)

TRI-STATEable, 15,19, TEST DATA OUTPUTS: Individual output for each of the three (3) local scan

ports.

24 mA/24 mA 24

Drive Outputs

TDI

L(1–3)

TTL Inputs w/Pull-Up 18, 23, TEST DATA INPUTS: Individual scan data input for each of the three (3) local

scan ports.

Resistors 27

TMS

L(1–3)

TRI-STATEable, 16, 20, TEST MODE SELECT OUTPUTS: Individual output for each of the three (3)

local scan ports. TMS

does not provide a pull-up resistor (which is assumed

to be present on a connected TMS input, per the IEEE 1149.1 requirement)

24 mA/24 mA 25

Drive Outputs

TCK

L(1–3)

TRI-STATEable, 17, 22, LOCAL TEST CLOCK OUTPUTS: Individual output for each of the three (3)

local scan ports. These are buffered versions of TCK

24 mA/24 mA 26

Drive Output

Power Supply Voltage 8, 28 Power supply pins, 5.0V ±10%.

SCANPSC110F

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Table of Contents (Continued)

TABLE 2. Detailed Pin Description Table (Continued)

Pin #

Name I/O (Note 1) (SOIC Description

& LCC)

GND Ground potential 14, 21 Power supply pins 0V.

Note 1: All pins are active HIGH unless otherwise noted.

Overview of SCANPSC110F Bridge Functions

SCANPSC110F BRIDGE ARCHITECTURE

Figure 1

shows the basic architecture of the ’PSC110F. The

device’s major functional blocks are illustrated here. The

TAP Controller, a 16-state state machine, is the central con-

trol for the device. The instruction register and various test

data registers can be scanned to exercise the various func-

tions of the ’PSC110F (these registers behave as defined in

IEEE Std. 1149.1).

The ’PSC110F selection controller provides the functionality

that allows the 1149.1 protocol to be used in a multi-drop en-

vironment. It primarily compares the address input to the slot

identification and enables the ’PSC110F for subsequent

scan operations.

The Local Scan Port Network (LSPN) contains multiplexing

logic used to select different port configurations. The LSPN

control block contains the Local Scan Port Controllers

(LSPC) for each Local Scan Port (LSP

, LSP

, and LSP

This control block receives input from the ’PSC110F instruc-

tion register, mode register, and the TAP controller. Each lo-

cal port contains all four (4) boundary scan signals needed to

interface with the local TAPs.

SCANPSC110F BRIDGE STATE MACHINES

The ’PSC110F is IEEE 1149.1-compatible, in that it supports

all required 1149.1 operations. In addition, it supports a

higher level of protocol, (Level 1), that extends the IEEE

1149.1 Std. to a multi-drop environment.

DS100327-3

FIGURE 1. SCANPSC110F Bridge Architecture

SCANPSC110F

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Overview of SCANPSC110F Bridge

Functions (Continued)

In multi-drop scan systems, a scan tester can select indi-

vidual ’PSC110Fs for participation in upcoming scan opera-

tions. ’PSC110F “selection” is accomplished by simulta-

neously scanning a device address out to multiple

’PSC110Fs. Through an on-chip address matching process,

only those ’PSC110Fs whose statically-assigned address

matches the scanned-out address become selected to re-

ceive further instructions from the scan tester. ’PSC110F se-

lection is done using a “Level-1” protocol, while follow-on in-

structions are sent to selected ’PSC110Fs by using a

“Level-2” protocol.

The ’PSC110F contains three distinct but coupled

state-machines (see

Figure 2

). The first of these is the

TAP-control state-machine, which is used to drive the

’PSC110Fs scan ports in conformance with the 1149.1 Stan-

dard (see

Figure 17

of appendix). The second is the

’PSC110F-selection state-machine (

Figure 3

). The third

state-machine actually consists of three identical but inde-

pendent state-machines (see

Figure 4

), one per ’PSC110F

local scan port. Each of these scan port-selection

state-machines allows individual local ports to be inserted

into and removed from the ’PSC110Fs overall scan chain.

The ’PSC110F selection state-machine performs the ad-

dress matching which gives the ’PSC110F its multi-drop ca-

pability. That logic supports single-’PSC110F access,

multi-cast, and broadcast. The ’PSC110F-selection

state-machine implements the chip’s Level-1 protocol.

DS100327-4

FIGURE 2. SCANPSC110F Bridge State Machines

SCANPSC110F

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Overview of SCANPSC110F Bridge Functions (Continued)

The ’PSC110F’s scan port-configuration state-machine is

used to control the insertion of local scan ports into the over-

all scan chain, or the isolation of local ports from the chain.

From the perspective of a system’s (single) scan controller,

each ’PSC110F presents only one scan chain to the master.

The ’PSC110F architecture allows one or more of the

’PSC110F’s local ports to be included in the active scan

chain.

Each local port can be “parked” in one of four stable states

(Parked-TLR, Parked-RTI, Parked-Pause-DR or

Parked-Pause-IR)

, either individually or simultaneously with

other local ports. Parking a chain removes that local chain

from the active scan chain. Conversely, a parked chain can

be “unparked”, causing the corresponding local port to be in-

serted into the active scan chain.

As shown in

Figure 4

, the ’PSC110F’s three scan

port-configuration state-machines allow each of the part’s lo-

cal ports to occupy a different state at any given time. For ex-

ample, some ports may be parked, perhaps in different

states, while other ports participate in scan operations. The

state-diagram shows that some state transitions depend on

the current state of the TAP-control state-machine. As an ex-

DS100327-5

KEY

+=OR

&=AND

ADDR =6-bit address in the Instruction Register

SLOT =Static address in the ’PSC110F Selection Controller

FIGURE 3. State Machine for SCANPSC110F Bridge Selection Controller

DS100327-12

FIGURE 4. Local SCANPSC110F Bridge Port Configuration State Machine

SCANPSC110F

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Overview of SCANPSC110F Bridge

Functions (Continued)

ample, a local port which is presently in the

Parked-RTI

state

does not become unparked (i.e., enter the

Unparked

state)

until the ’PSC110F receives an

UNPARK

instruction and the

’PSC110F’s TAP state-machine enters the

Run-Test/Idle

state.

Similarly, certain transitions of the scan port-configuration

state-machine can force the ’PSC110F’s TAP-control

state-machine into specific states. For example, when a lo-

cal port is in the

Unparked

state and the ’PSC110F receives

a PARKRTI instruction, the Local Port controller enters the

Parked-RTI

state in which TMS

will be held low until the

port is later unparked. While TMS

is held low, all devices

on that local scan chain remain in their current TAP State

(the

RTI

TAP controller state in this example).

The ’PSC110F’s scan port-configuration state-machine

implements part of the ’PSC110F’s Level-2 protocol. In addi-

tion, the ’PSC110F provides a number of Level-2 instructions

for functions other than local scan port confguration. These

instructions provide access to and control of various regis-

ters within the ’PSC110F. This set instructions includes:

BYPASS CNTRSEL

EXTEST LFSRON

SAMPLE/PRELOAD LFSROFF

IDCODE CNTRON

MODESEL CNTROFF

MCGRSEL GOTOWAIT

LFSRSEL

Figure 5

illustrates how the ’PSC110F’s state-machines in-

teract. The ’PSC110F-selection state-machine enables or

disables operation of the chip’s three port-selection

state-machines. In ’PSC110Fs which are selected via

Level-1 protocol (either as individual ’PSC110Fs or as mem-

bers of broadcast or multi-cast groups), Level-2 protocol

commands can be used to park or unpark local scan ports.

Note that most transitions of the port-configuration

state-machines are gated by particular states of the

’PSC110F’s TAP-control state-machine, as shown in

Figures

4, 5

DS100327-6

FIGURE 5. Relationship Between SCANPSC110F Bridge State Machines

SCANPSC110F

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Overview of SCANPSC110F Bridge

Functions (Continued)

Following a hardware reset, the TAP controller

state-machine is in the

Test-Logic-Reset (TLR)

state; the

’PSC110F-selection state-machine is in the

Wait-For-Address

state; and each of the three port-selection

state-machines is in the

Parked-TLR

state. The ’PSC110F is

then ready to receive Level-1 protocol, followed by Level-2

protocol.

Tester/SCANPSC110F Bridge

Interface

An IEEE 1149.1 system tester sends instructions to a

’PSC110F via that ’PSC110F’s backplane scan-port. Follow-

ing test logic reset, the ’PSC110F’s selection state-machine

is in the

Wait-For-Address

state. When the ’PSC110F’s TAP

controller is sequenced to the Shift-IR state, data shifted in

through the TDI

input is shifted into the ’PSC110F’s instruc-

tion register. Note that prior to successful selection of a

’PSC110F, data is not shifted out of the instruction register

and out through the ’PSC110F’s TDO

output, as it is during

normal scan operations. Instead, as each new bit enters the

instruction register’s most-significant bit, data shifted out

from the least-significant bit is discarded.

When the instruction register is updated with the address

data, the ’PSC110F’s address-recognition logic compares

the six least-significant bits of the instruction register with the

6-bit assigned address which is statically present on the

(0–5)

inputs. Simultaneously, the scanned-in address is

compared with the reserved Broadcast and Multi-cast ad-

dresses. If an address match is detected, the

’PSC110F-selection state-machine enters one of the two se-

lected states. If the scanned address does not match a valid

single-slot address or one of the reserved broadcast/

multi-cast addresses, the ’PSC110F-selection state-machine

enters the

Unselected

state.

Note that the SLOT inputs

should not be set

to a value cor-

responding to

a multi-cast group

,ortothe

broadcast ad-

dress

. Also note that the single-’PSC110F selection process

must be performed for all ’PSC110Fs which are subse-

quently to be addressed in multi-cast mode. This is required

because each such device’s Multi-cast Group Register

(MCGR) must be programmed with a multi-cast group num-

ber, and the MCGR is not accessible to the test controller un-

til that ’PSC110F has first entered the

Selected-Single-’PSC110F

state.

Once a ’PSC110F has been selected, Level-2 protocol is

used to issue commands and to access the chip’s various

registers.

The SCANPSC110F Bridge includes a number of registers

which are used for ’PSC110F selection and configuration,

scan data manipulation, and scan-support operations. These

registers can be grouped as shown in

Table 3

The specific fields and functions of each of these registers

are detailed in the section of this document titled “Data Reg-

ister Descriptions”.

Note that when any of these registers is selected for inser-

tion into the ’PSC110F’s scan-chain, scan data enters

through that register’s most-significant bit. Similarly, data

that is shifted out of the register is fed to the scan input of the

next-downstream device in the scan-chain.

TABLE 3. Registers

Instruction Register INSTRUCTION ’PSC110F addressing and instruction-decode

IEEE Std. 1149.1 required register

Boundary-Scan Register BOUNDARY IEEE Std. 1149.1 required register

Bypass Register BYPASS IEEE Std. 1149.1 required register

Device Identification Register IDCODE IEEE Std. 1149.1 optional register

Multi-Cast Group Register MCGR ’PSC110F-group address assignment

Mode Register MODE ’PSC110F local-port configuration and control bits

Linear-Feedback Shift Register LFSR ’PSC110F scan-data compaction (signature generation)

TCK Counter Register CNTR Local-port TCK clock-gating (for BIST)

Addressing Scheme

The SCANPSC110F Bridge architecture extends the func-

tionality of the IEEE 1149.1 Standard by supplementing that

protocol with an addressing scheme which allows a test con-

troller to communicate with specific ’PSC110Fs within a net-

work of ’PSC110Fs. That network can include both

multi-drop and hierarchical connectivity. In effect, the

’PSC110F architecture allows a test controller to dynamically

select specific portions of such a network for participation in

scan operations. This allows a complex system to be parti-

tioned into smaller blocks for testing purposes.

The ’PSC110F provides two levels of test-network partition-

ing capability. First, a test controller can select entire indi-

vidual ’PSC110Fs, specific sets of ’PSC110Fs (multi-cast

groups), or all ’PSC110Fs (broadcast). This

’PSC110F-selection process is supported by a “Level-1”

communication protocol. Second, within each selected

’PSC110F, a test controller can select one or more of the

chip’s three local scan-ports. That is, individual local ports

can be selected for inclusion in the (single) scan-chain which

a ’PSC110F presents to the test controller. This mechanism

allows a controller to select specific terminal scan-chains

within the overall scan network. The port-selection process is

supported by a “Level-2” protocol.

SCANPSC110F

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Hierarchical Test Support

Multiple SCANPSC110F Bridges can be used to assemble a

hierarchical boundary-scan tree. In such a configuration, the

system tester can configure the local ports of a set of

’PSC110Fs so as to connect a specific set of local

scan-chains to the active scan chain. Using this capability,

the tester can selectively communicate with specific portions

of a target system.

The tester’s scan port is connected to the backplane scan

port of a “root” layer of ’PSC110Fs, each of which can be se-

lected using multi-drop addressing. A second tier of

’PSC110Fs can be connected to this root layer, by connect-

ing a local port (LSP) of a root-layer ’PSC110F to the back-

plane port of a second-tier ’PSC110F. This process can be

continued to construct a multi-level scan hierarchy.

’PSC110F local ports which are not cascaded into

higher-level ’PSC110Fs can be thought of as the terminal

“leaves” of a scan “tree”. The test master can select one or

more target leaves by selecting and configuring the local

ports of an appropriate set of ’PSC110Fs in the test tree.

Level 1 Protocol

ADDRESSING MODES

The SCANPSC110F Bridge supports “single” and “multiple”

modes of addressing a ’PSC110F. The “single” mode will se-

lect one ’PSC110F and is called Direct Addressing. More

than one ’PSC110F device can be selected via the Broad-

cast and Multi-Cast Addressing modes.

SCANPSC110F

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Level 1 Protocol (Continued)

TABLE 4. SCANPSC110F Bridge Address Modes

Address Types Hex Address

(Note 2) Binary Address

(Note 3) TDO

State

Direct Address 00 to 3A XX000000 to XX111010 Normal IEEE Std. 1149.1

Broadcast Address 3B XX111011 Always TRI-STATED

Multi-Cast Group 0 3C XX111100 Always TRI-STATED

Multi-Cast Group 1 3D XX111101 Always TRI-STATED

Multi-Cast Group 2 3E XX111110 Always TRI-STATED

Multi-Cast Group 3 3F XX111111 Always TRI-STATED

Note 2: Hex address ’7X’, ’BX’, or ’FX’ may be used instead of ’3X’.

Note 3: Only the six (6) LSB’s of the address is compared to the S(0–5) inputs. The two (2) MSB’s are “don’t cares”.

DIRECT ADDRESSING

The ’PSC110F enters the

Wait-For-Address

state when:

1. its TAP Controller enters the

Test-Logic-Reset

state, or

2. its instruction register is updated with the GOTOWAIT in-

struction (while either selected or unselected).

Each ’PSC110F within a scan network must be statically

configured with a unique address via its S

(0–5)

inputs. While

the ’PSC110F controller is in the

Wait-For-Address

state,

data shifted into bits 5 through 0 of the instruction register is

compared with the address present on the S

(0–5)

inputs in

the

Update-IR

state. If the six (6) LSBs of the instruction reg-

ister match the address on the S

(0–5)

inputs, (see

Figure 6

)

the ’PSC110F becomes selected, and is ready to receive

Level 2 Protocol (i.e., further instructions). When the

’PSC110F is selected, its device identification register is in-

serted into the active scan chain.

All ’PSC110Fs whose S

(0–5)

address does not match the in-

struction register address become unselected. They will re-

main unselected until either their TAP Controller enters the

Test-Logic-Reset

state, or their instruction register is up-

dated with the

GOTOWAIT

instruction.

BROADCAST ADDRESSING

The BroadcastAddress allows a tester to simultaneously se-

lect all ’PSC110Fs in a test network. This mode is useful in

testing systems which contain multiple identical boards. To

avoid bus contention between scan-path output drivers on

different boards, each ’PSC110F’s TDO

buffer is always

tri-stated while in Broadcast mode. In this configuration, the

on-chip Linear Feedback Shift Register (LFSR) can be used

to accumulate a test result signature for each board that can

be read back later by direct-addressing each board’s

’PSC110F.

MULTI-CAST ADDRESSING

As a way to make the broadcast mechanism more selective,

the ’PSC110F provides a “Multi-cast” addressing mode. A

’PSC110F’s multi-cast group register (MCGR) can be pro-

grammed to assign that ’PSC110F to one of four (4)

Multi-Cast groups. When ’PSC110Fs in the

Wait-For-Address

state are updated with a Multi-Cast ad-

dress, all ’PSC110Fs whose MCGR matches the Multi-Cast

group will become selected. As in Broadcast mode, TDO

always tri-stated while in Multi-cast mode.

DS100327-7

FIGURE 6. Direct Addressing: Device Address Loaded into Instruction Register

SCANPSC110F

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Level 1 Protocol (Continued)

Level 2 Protocol

Once the SCANPSC110F Bridge has been successfully ad-

dressed and selected, its internal registers may be accessed

via Level-2 Protocol. Level-2 Protocol is compliant to IEEE

Std. 1149.1 TAP protocol with one exception: if the

’PSC110F is selected via the Broadcast or Multi-Cast ad-

dress, TDO

will always be TRI-STATED. (The TDO

buffer

must be implemented this way to prevent bus contention.)

Upon being selected, (i.e., the ’PSC110F Selection controller

transitions from the

Wait-For-Address

state to one of the

Se-

lected

states), each of the local scan ports (LSP

, LSP

LSP

) remains parked in one of the following four TAP Con-

troller states:

Test-Logic-Reset, Run-Test/Idle, Pause-DR

,or

Pause-IR

and the active scan chain will consist of: TDI

through the instruction register (or the IDCODE register) and

out through TDO

TDI

→Instruction Register→TDO

The

UNPARK

instruction (described later) is used to insert

one or more local scan ports into the active scan chain.

Table 4

describes which local ports are inserted into the

chain, and in what order.

LEVEL 2 INSTRUCTION TYPES

There are two types of instructions (reference

Table 5

DS100327-8

FIGURE 7. Broadcast Addressing: Address Loaded into Instruction Register

DS100327-9

FIGURE 8. Multi-Cast Addressing: Address Loaded into Instruction Register

SCANPSC110F

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Level 2 Protocol (Continued)

1. Instructions that insert a ’PSC110F register into the ac-

tive scan chain so that the register can be captured or

updated

(BYPASS, SAMPLE/PRELOAD, EXTEST, ID-

CODE, MODESEL, MCGRSEL, LFSRSEL, CNTRSEL).

2. Instructions that configure local ports or control the op-

eration of the linear feedback shift register and counter

registers

(UNPARK, PARKTRL, PARKRTI, PARK-

PAUSE, GOTOWAIT, SOFTRESET, LFSRON, LFS-

ROFF, CNTRON, CNTROFF).

These instructions, along

with any other yet undefined Op-Codes, will cause the

device identification register to be inserted into the ac-

tive scan chain.

LEVEL 2 INSTRUCTION DESCRIPTIONS

BYPASS:

The

BYPASS

instruction selects the bypass regis-

ter for insertion into the active scan chain when the

’PSC110F is selected.

EXTEST:

The

EXTEST

instruction selects the

boundary-scan register for insertion into the active scan

chain. The boundary-scan register consists of seven

“sample only” shift cells connected to the S

(0–5)

and OE in-

puts. On the ’PSC110F, the

EXTEST

instruction performs the

same function as the

SAMPLE/PRELOAD

instruction, since

there aren’t any scannable outputs on the device.

SAMPLE/PRELOAD:

The

SAMPLE/PRELOAD

instruction

selects the boundary-scan register for insertion into the ac-

tive scan chain. The boundary-scan register consists of

seven “sample only” shift cells connected to the S

(0–5)

and

OE inputs.

IDCODE:

The

IDCODE

instruction selects the device identi-

fication register for insertion into the active scan chain. When

IDCODE

is the current active instruction the device identifi-

cation “0FC0E01F” Hex is captured upon exiting the

Capture-DR

state.

TABLE 5. Level 2 Protocol and Op-Codes

Instructions Hex Op-Code Binary Op-Code Data Register

BYPASS

FF 11111111 Bypass Register

EXTEST

00 00000000 Boundary-Scan Register

SAMPLE/PRELOAD

81 10000001 Boundary-Scan Register

IDCODE

AA 10101010 Device Identification Register

UNPARK

E7 11100111 Device Identification Register

PARKTLR

C5 11000101 Device Identification Register

PARKRTI

84 10000100 Device Identification Register

PARKPAUSE

C6 11000110 Device Identification Register

GOTOWAIT

*C3 11000011 Device Identification Register

MODESEL

8E 10001110 Mode Register

MCGRSEL

03 00000011 Multi-Cast Group Register

SOFTRESET

88 10001000 Device Identification Register

LFSRSEL

C9 11001001 Linear Feedback Shift Register

LFSRON

0C 00001100 Device Identification Register

LFSROFF

8D 10001101 Device Identification Register

CNTRSEL

CE 11001110 32-Bit TCK Counter Register

CNTRON

0F 00001111 Device Identification Register

CNTROFF

90 10010000 Device Identification Register

Other Undefined TBD TBD Device Identification Register

Note 4: All other instructions act on selected ’PSC110Fs only.

UNPARK:

This instruction unparks the Local Scan Port Net-

work and inserts it into the active scan chain as configured

by the Mode register (see

Table 4

). Unparked LSPs are se-

quenced synchronously with the ’PSC110F’s TAP controller.

When a LSP has been parked in the

Test-Logic-Reset

Run-Test/Idle

state, it will not become unparked until the

’PSC110F’s TAP Controller enters the

Run-Test/Idle

state

following the

UNPARK

instruction. If an LSP has been

parked in one of the stable pause states (

Pause-DR

Pause-IR

), it will not become unparked until the ’PSC110F’s

TAP Controller enters the respective pause state. (See

Fig-

ures 9, 10, 11, 12

PARKTLR:

This instruction causes all unparked LSPs to be

parked in the

Test-Logic-Reset

TAP controller state and re-

moves the LSP network from the active scan chain. The LSP

controllers keep the LSPs parked in the

Test-Logic-Reset

state by forcing their respective TMS

output with a constant

logic “1” while the LSP controller is in the

Parked-TLR

state

(see

Figure 4

PARKRTI:

This instruction causes all unparked LSPs to be

parked in the

Run-Test/Idle

state. When a LSP

is active (un-

parked), its TMS

signals follow TMS

and the LSP

control-

ler state transitions are synchronized with the TAP Controller

state transitions of the ’PSC110F. When the instruction reg-

ister is updated with the

PARKRTI

instruction, TMS

will be

forced to a constant logic “0”, causing the unparked local

TAP Controllers to be parked in the

Run-Test/Idle

state.

When an LSP

is parked, it is removed from the active scan

chain.

PARKPAUSE:

The

PARKPAUSE

instruction has dual func-

tionality. It can be used to park unparked LSPs or to unpark

parked LSPs. The instruction places all unparked LSPs in

SCANPSC110F

www.national.com 12

Level 2 Protocol (Continued)

one of the TAP Controller pause states. Alocal port does not

become parked until the ’PSC110F’s TAP Controller is se-

quenced through

Exit1-DR/IR

into the

Update-DR/IR

state.

When the ’PSC110F TAP Controller is in the

Exit1-DR

Exit1-IR

state and TMS

is high, the LSP controller forces a

constant logic “0” onto TMS

thereby parking the port in the

Pause-DR

Pause-IR

state respectively (see

Figure 4

Another instruction can then be loaded to reconfigure the lo-

cal ports or to deselect the ’PSC110F (i.e.,

MODESEL, GO-

TOWAIT,

etc.).

If the

PARKPAUSE

instruction is given to a bridge whose

LSPs are parked in

Pause-IR

Pause-DR

, the parked LSPs

will become unparked when the ’PSC110F’s TAP controller

is sequenced into the respective Pause state.

The

PARKPAUSE

instruction was implemented with this

dual functionality to enable backplane testing (interconnect

testing between boards) with simultaneous Updates and

Captures.

Simultaneous Update and Capture of several boards can be

performed by parking LSPs of the different boards in the

Pause-DR

TAP controller state, after shifting the data to be

updated into the boundary registers of the components on

each board. The broadcast address is used to select all

’PSC110Fs connected to the backplane. The

PARKPAUSE

instruction is scanned into the selected ’PSC110Fs and the

’PSC110F TAP controllers are sequenced to the

Pause-DR

state where the LSPs of all ’PSC110Fs become unparked.

The local TAP controllers are then sequenced through the

Update-DR, Select-DR, Capture-DR, Exit1-DR, and parked

in the Pause-DR state, as the ’PSC110F TAP controller is se-

quenced into the Update-DR state. When a LSP is parked, it

is removed from the active scan chain.

GOTOWAIT:

This instruction is used to return all ’PSC110Fs

to the

Wait-For-Address

state. All unparked LSPs will be

parked in the

Test-Logic-Reset

TAP controller state (see

Fig-

ure 5

MODESEL:

The

MODESEL

instruction inserts the mode

mines the LSPN configuration. Bit 7 of the mode register is a

read-only counter status flag.

MCGRSEL:

This instruction inserts the multi-cast group reg-

ister (MCGR) into the active scan chain. The MCGR is used

to group ’PSC110Fs into multi-cast groups for parallel TAP

sequencing (i.e., to simultaneously perform identical scan

operations).

SOFTRESET:

This instruction causes all 3 Port configura-

tion controllers (

Figure 4

) to enter the

Parked-TLR

state,

which forces TMS

high; this parks each local port in the

Test-Logic-Reset

state within 5 TCK

cycles.

LFSRSEL:

This instruction inserts the linear feedback shift

pacted signature to be shifted out of the LFSR during the

Shift-DR

state. (The signature is assumed to have been

computed during earlier

LFSRON

shift operations.) This in-

struction disables the LFSR register’s feedback circuitry,

turning the LFSR into a standard 16-bit shift register. This al-

lows a signature to be shifted out of the register, or a seed

value to be shifted into it.

LFSRON:

Once this instruction is executed, the linear feed-

back shift register samples data from the active scan path

(including all unparked TDI

) during the

Shift-DR

state.

Data from the scan path is shifted into the linear feedback

shift register and compacted. This allows a serial stream of

data to be compressed into a 16-bit signature that can sub-

sequently be shifted out using the

LFSRSEL

instruction. The

linear feedback shift register is not placed in the scan chain

during this mode. Instead, the register samples the active

scan-chain data as it flows from the LSPN to TDO

LFSROFF:

This instruction terminates linear feedback shift

ceiving this instruction.

CNTRSEL:

This instruction inserts the 32-bit TCK counter

shift register into the active scan chain. This allows the user

to program the number of “n” TCK cycles to send to the

parked local ports once the

CNTRON

instruction is issued

(e.g., for BIST operations). Note that to ensure completion of

count-down, the ’PSC110F should receive at least “n” TCK

pulses.

CNTRON:

This instruction enables the TCK counter. The

counter begins counting down on the first rising edge of

TCK

following the

Update-IR

TAP controller state and is

decremented on each rising edge of TCK

thereafter. When

the TCK counter reaches terminal count, “00000000” Hex,

TCK

of all parked LSP’s is held low.

The CNTROFF in-

struction must be issued before unparking the LSPs of a

’PSC110F whose counter has reached terminal count.

This function over-rides the mode register TCK control bit

(bit-3).

CNTROFF:

This instruction disables the TCK counter, and

TCK

control is returned to the mode register (bit-3).

DS100327-10

FIGURE 9. Local Scan Port Synchronization from

Parked-TLR

Instruction

SCANPSC110F

www.national.com13

Level 2 Protocol (Continued)

Instruction Register

The instruction shift register is an 8-bit register that is in se-

ries with the scan chain whenever the TAP Controller of the

SCANPSC110F Bridge is in the

Shift-IR

state. Upon exiting

the

Capture-IR

state, the value “XXXXXX01” is captured into

the instruction register, where “XXXXXX” represents the

value on the S

(0–5)

inputs.

When the ’PSC110F controller is in the

Wait-For-Address

state, the instruction register is used for ’PSC110F selection

via address matching. In addressing individual ’PSC110Fs,

the chip’s addressing logic performs a comparison between

a statically-configured (hard-wired) value on that ’PSC110F’s

slot inputs, and an address which is scanned into the chip”s

instruction register. Binary address codes “000000” through

“111010” (“00” through “3A” Hex) are reserved for address-

ing individual ’PSC110Fs. Address “3B” Hex is for Broadcast

mode.

In doing multi-cast (group) addressing, a scanned-in address

is compared against the (previously scanned-in) contents of

a ’PSC110F’s Multi-Cast Group register. Binary address

codes “111110” through “111111” (“3A” through “3F” Hex) are

reserved for multi-cast addressing, and should not be as-

signed as ’PSC110F slot-input values.

Boundary-Scan Register

The boundary-scan register is a “sample only” shift register

containing cells from the S

(0–5)

and OE inputs. The register

allows testing of circuitry external to the ’PSC110F. It permits

the signals flowing between the system pins to be sampled

and examined without interfering with the operation of the

on-chip system logic.

The scan chain is arranged as follows:

TDI

→OE →S

→S

→

→S

→LSPN→TDO

Bypass Register

The bypass register is a 1-bit register that operates as speci-

fied in IEEE Std. 1149.1 once the ’PSC110F has been se-

lected. The register provides a minimum length serial path

for the movement of test data between TDI

and the LSPN.

This path can be selected when no other test data register

needs to be accessed during a board-level test operation.

Use of the bypass register shortens the serial access-path to

test data registers located in other components on a

board-level test data path.

Multi-Cast Group Register

“Multi-cast” is a method of simultaneously communicating

with more than one selected ’PSC110F.

The multi-cast group register (MCGR) is a 2-bit register used

to determine which multi-cast group a particular ’PSC110F is

assigned to. Four addresses are reserved for multi-cast ad-

dressing. When a ’PSC110F is in the

Wait-For-Address

state

and receives a multi-cast address, and if that ’PSC110F’s

MCGR contains a matching value for that multi-cast ad-

dress, the ’PSC110F becomes selected and is ready to re-

ceive Level 2 Protocol (i.e., further instructions).

The MCGR is initialized to “00” upon entering the

Test-Logic-Reset

state.

The following actions are used to perform multi-cast ad-

dressing:

1. Assign all target ’PSC110Fs to a multi-cast group by

writing each individual target ’PSC110F’s MCGR with

the same multi-cast group code (see

Table 6

). This con-

figuration step must be done by individually addressing

each target ’PSC110F, using that chip’s assigned slot

value.

2. Scan out the multi-cast group address through the TDI

input of

all

’PSC110Fs. Note that this occurs in parallel,

resulting in the selection of only those ’PSC110Fs whose

MCGR was previously programmed with the matching

multi-cast group code.

TABLE 6. Multi-Cast Group Register Addressing

MCGR Hex Address Binary Address

Bits 1, 0

00 3C XX111100

01 3D XX111101

10 3E XX111110

11 3F XX111111

DS100327-11

FIGURE 10. Local Scan Port Synchronization from

Parked-RTI

State

SCANPSC110F

www.national.com 14

TABLE 7. Mode Register Control of LSPN

Mode Register Scan Chain Configuration (If unparked)

XXX0X000 TDI

→Register→TDO

XXX0X001 TDI

→Register→LSP

→PAD→TDO

XXX0X010 TDI

→Register→LSP

→PAD→TDO

XXX0X011 TDI

→Register→LSP

→PAD→LSP

→PAD→TDO

XXX0X100 TDI

→Register→LSP

→PAD→TDO

XXX0X101 TDI

→Register→LSP

→PAD→LSP

→PAD→TDO

XXX0X110 TDI

→Register→LSP

→PAD→LSP

→PAD→TDO

XXX0X111 TDI

→Register→LSP

→PAD→LSP

→PAD→TDO

XXX1XXXX TDI

→Register→TDO

(Loopback)

X=don’t care

PAD =insertion of a 1-bit register for synchronization

Mode Register

The mode register is an 8-bit data register used primarily to

configure the Local Scan Port Network. The mode register is

initialized to “00000001” binary upon entering the

Test-Logic-Reset

state.

Bits 0, 1, 2, and 4 are used for scan chain configuration as

described in

Table 7

. When the

UNPARK

instruction is ex-

ecuted, the scan chain configuration will be as shown in

Table 7

above. When all LSPs are parked, the scan chain

configuration will be TDI

→’PSC110F-register→TDO

. Bit 3

is used for TCK

configuration, see

Table 8

TABLE 8. Test Clock Configuration

Bit 3 LSP

TCK

1 Parked Stop

0 Parked Run

1 Unparked Run

0 Unparked Run

Bit 3 is normally set to logic “0” so that TCK

is free-running

when the local scan ports are parked. When the local ports

are parked, bit 3 can be programmed with logic “1”, forcing

all of the LSP TCK

’s to stop. This feature can be used in

power sensitive applications to reduce the power consumed

by the test circuitry in parts of the system that are not under

test.

Bit 3 of the mode register must be reset to logic “0”

before the UNPARK instruction is executed.

Bit 7 is a status bit for the TCK counter. When the counter is

on and has reached terminal count (Zero) Bit 7 of the mode

low in all other conditions.

Bits 5 and 6 are reserved for future use.

Device Identification Register

The device identification register (IDREG) is a 32-bit register

compliant with IEEE Std. 1149.1. When the

IDCODE

instruc-

tion is active, the identification register is loaded with the

value “0FC0E01F” Hex upon leaving the

Capture-DR

state

(on the rising edge of the TCK

TABLE 9. Detailed Device Identification (Binary)

Bits

31–28 Bits 27–12 Bits 11–1 Bit

Version Part Number Manufacturer 1

Identity

0000 1111 1100 0000

1110 0000 0001 111 1

Linear Feedback Shift Register

The ’PSC110F contains a “signature compactor” which sup-

ports test result evaluation in a multi-chain environment. The

signature compactor consists of a 16-bit linear-feedback shift

is shifted “upstream” from the ’PSC110F’s local-port net-

work. Once the LFSR is enabled, the LFSR’s state changes

in a reproducible way as each local-port data bit is shifted in

from the local-port network. When all local-port data has

been scanned in, the LFSR contains a 16-bit signature value

which can be compared against a signature computed for

the expected results vector.

The LFSR uses the following feedback polynomial:

F(x) =X

+X+1

This signature compactor is used to compress serial data

shifted in from the local scan chain, into a 16-bit signature.

This signature can then be shifted out for comparison with an

expected value. This allows users to test long scan chains in

parallel, via Broadcast or Multi-Cast addressing modes, and

check only the 16-bit signatures from each module.

The LFSR is initialized with a value of “0000” Hex upon re-

set.

32-Bit TCK Counter Register:

The 32-bit TCK counter register enables BISTtesting that re-

quires “n” TCK cycles, to be run on a parked LSP while an-

other ’PSC110F port is being tested. The

CNTRSEL

instruc-

tion can be used to load a count-down value into the counter

abled (via the

CNTRON

instruction), and the LSP is parked,

the local TCKs will stop and be held low when terminal count

is reached.

The TCK counter is initialized with a value of “00000000”

Hex upon reset.

SCANPSC110F

www.national.com15

Special Features

BIST SUPPORT

The sequence of instructions to run BIST testing on a parked

SCANPSC110F Bridge port is as follows:

1. Pre-load the Boundary register of the device under test if

needed.

2. Initialize the TCK counter to 00000000 Hex. Note that

the TCK counter is initialized to 00000000 Hex upon

Test-Logic-Reset

, so this step may not be necessary.

3. Issue the

CNTRON

instruction to the ’PSC110F, to en-

able the TCK counter.

4. Shift the

PARKRTI

instruction into the ’PSC110F instruc-

tion register and

BIST

instruction into the instruction reg-

ister of the device under test.

5. Issue the

CNTRSEL

instruction to the ’PSC110F.

6. Load the TCK counter (Shift the 32-bit value represent-

ing the number of TCK

cycles needed to execute the

BIST operation into the TCK counter register).

7. Bit 7 of the Mode register can be scanned to check the

status of the TCK counter, (

MODESEL

instruction fol-

lowed by a

Shift-DR

). Bit 7 logic “0” means the counter

has not reached terminal count, logic “1” means that the

counter has reached terminal count and the BIST opera-

tion has completed.

8. Execute the

CNTROFF

instruction.

9. Unpark the LSP and scan out the result of the BIST op-

eration (the

CNTROFF

instruction must be executed be-

fore unparking the LSP).

The Self test will begin on the rising edge of TCK

following

the

Update-DR

TAP controller state.

RESET

Reset operations can be performed at three levels. The high-

est level resets all ’PSC110F registers and all of the local

scan chains of selected and unselected ’PSC110Fs. This

“Level 1” reset is performed whenever the ’PSC110F TAP

Controller enters the

Test-Logic-Reset

state.

Test-Logic-Reset

can be entered synchronously by forcing

TMS

high for at least five (5) TCK

pulses, or asynchro-

nously by asserting the TRST pin.A“Level 1” reset forces all

’PSC110Fs into the

Wait-For-Address

state, parks all local

scan chains in the

Test-Logic-Reset

state, and initializes all

’PSC110F registers.

TABLE 10. Reset Configurations for Registers

MCGR 2 0

Instruction 8 AA (

IDCODE

Instruction)

Mode 8 01

LFSR 16 0000

32-Bit Counter 32 00000000

The

SOFTRESET

instruction is provided to perform a “Level

2” reset of all LSP’s of selected ’PSC110Fs.

SOFTRESET

forces all TMS

signals high, placing the corresponding local

TAP Controllers in the

Test-Logic-Reset

state within five (5)

TCK

cycles.

The third level of reset is the resetting of individual local

ports. An individual LSP can be reset by parking the port in

the

Test-Logic-Reset

state via the

PARKTLR

instruction. To

reset an individual LSP that is parked in one of the other

parked states, the LSP must first be unparked via the

UN-

PARK

instruction.

PORT SYNCHRONIZATION

When a LSP is not being accessed, it is placed in one of the

four TAP Controller states:

Test-Logic-Reset, Run-Test/Idle,

Pause-DR,

Pause-IR.

The ’PSC110F is able to park a lo-

cal chain by controlling the local Test Mode Select outputs

(TMS

L(1–3)

) (see

Figure 4

). TMS

is forced high for parking

in the

Test-Logic-Reset

state, and forced low for parking in

Run-Test/Idle, Pause-IR,

Pause-DR

states. Local chain

access is achieved by issuing the

UNPARK

instruction. The

LSPs do not become unparked until the ’PSC110F TAP Con-

troller is sequenced through a specified synchronization

state. Synchronization occurs in the

Run-Test/Idle

state for

LSPs parked in

Test-Logic-Reset

Run-Test/Idle;

and in the

Pause-DR

Pause-IR

state for ports parked in

Pause-DR

Pause-IR,

respectively.

Figures 11, 12

show the waveforms for synchronization of a

local chain that was parked in the

Test-Logic-Reset

state.

Once the

UNPARK

instruction is received in the instruction

low on the falling edge of

TCK

This moves the local chain TAP Controllers to the synchroni-

zation state

(Run-Test/Idle)

, where they stay until synchroni-

zation occurs. If the next state of the ’PSC110F TAP Control-

ler is

Run-Test/Idle

, TMS

is connected to TMS

and the

local TAP Controllers are synchronized to the ’PSC110F TAP

Controller as shown in

Figure 12

. If the next state after

DS100327-15

FIGURE 11. Local Scan Port Synchronization on Second Pass

SCANPSC110F

www.national.com 16

Special Features (Continued)

Update-IR

were

Select-DR

, TMS

would remain low and

synchronization would not occur until the ’PSC110F TAP

Controller entered the

Run-Test/Idle

state, as shown in

Fig-

ure 11

Each local port has its own Local Scan Port Controller. This

is necessary because the LSPN can be configured in any

one of eight (8) possible combinations. Either one, some, or

all of the local ports can be accessed simultaneously. Con-

figuring the LSPN is accomplished with the mode register, in

conjunction with the

UNPARK

instruction.

The LSPN can be unparked in one of seven different con-

figurations, as specified by bits 0-2 of the mode register. Us-

ing multiple ports presents not only the task of synchronizing

the ’PSC110F TAP Controller with the TAP Controllers of an

individual local port, but also of synchronizing the individual

local ports to one another.

When multiple local ports are selected for access, it is pos-

sible that two ports are parked in different states. This could

occur when previous operations accessed the two ports

separately and parked them in the two different states. The

LSP Controllers handle this situation gracefully.

Figure 12

shows the

UNPARK

instruction being used to access LSP

LSP

, and LSP

in series (mode register =“XXX0X111” bi-

nary). LSP

and LSP

become active as the ’PSC110F con-

troller is sequenced through the

Run-Test/Idle

state. LSP

remains parked in the

Pause-DR

state until the ’PSC110F

TAP Controller is sequenced through the

Pause-DR

state.At

that point, all three local ports are synchronized for access

via the active scan chain.

DS100327-14

FIGURE 12. Synchronization of the Three Local Scan Ports (LSP

, LSP

, and LSP

)

SCANPSC110F

www.national.com17

Absolute Maximum Ratings (Note 5)

If Military/Aerospace specified devices are required,

please contact the National Semiconductor Sales Office/

Distributors for availability and specifications.

Supply Voltage (V

) −0.5V to +7.0V

DC Input Diode Current (I

)

=−0.5V −20 mA

+0.5V +20 mA

DC Input Voltage (V

) −0.5V to V

+0.5V

DC Output Diode Current (I

)

=−0.5V −20 mA

+0.5V +20 mA

DC Output Voltage (V

) −0.5V to V

+0.5V

DC Output Source/Sink Current (I

)±50 mA

DC V

or Ground Current ±50 mA

per Output Pin

DC Latchup Source or Sink Current ±300 mA

Junction Temperature

Ceramic +175˚C

Storage Temperature −65˚C to +150˚C

ESD Last Passing Voltage (Min) 4000V

Recommended Operating

Conditions

Supply Voltage (V

)

SCANPSC110F 4.5V to 5.5V

Input Voltage (V

) 0VtoV

Output Voltage (V

) 0VtoV

Operating Temperature (T

)

Military −55˚C to +125˚C

Minimum Input Edge Rate dV/dt

SCAN “F” Series Devices 125 mV/ns

from 0.8V to 2.0V

@4.5V, 5.5V

Note 5: Absolute maximum ratings are those values beyond which damage

to the device may occur. The databook specifications should be met, without

exception, to ensure that the system design is reliable over its power supply

temperature, and output/input loading variables. National does not recom-

mended operation of SCAN outside of recommended operation conditions.

DC Electrical Characteristics

Symbol Parameter V

(V) Military Units Conditions

−55˚C to +125˚C

Guaranteed

Limits

Minimum High 4.5 2.0 V V

OUT

=0.1V or

Input Voltage 5.5 2.0 V

−0.1V

Maximum Low 4.5 0.8 V V

OUT

=0.1V or

Input Voltage 5.5 0.8 V

−0.1V

Minimum High 4.5 4.4 I

OUT

=−50 µA

(TCK

, TMS

, Output Voltage 5.5 5.4 V V

(TDI

, TMS

TDO

) TCK

)=V

Minimum High 4.5 3.7 I

OUT

=−24 mA

(TCK

, TMS

, Output Voltage 5.5 4.7 V V

on S

(0-5)

and

TDO

) TDl

(1–3)

All Outputs Loaded

Minimum High 4.5 3.15 V I

OUT

=−50 µA

(TDO

) Output Voltage 5.5 4.15

Minimum High 4.5 2.4 V I

OUT

=−24 mA

(TDO

) Output Voltage 5.5 2.4 All Outputs Loaded

Maximum Low 4.5 0.1 I

OUT

=+50 µA

(TCK

,TMS

, Output Voltage 5.5 0.1 V V

(TDI

, TMS

TDO

) TCK

)=V

Maximum Low 4.5 0.50 I

OUT

=+24 mA

(TCK

,TMS

, Output Voltage 5.5 0.50 V V

on S

(0–5)

and

TDO

) TDI

(1–3)

All Outputs Loaded

Maximum Low 4.5 0.1 VI

OUT

=+50 µA

(TDO

) Output Voltage 5.5 0.1

Maximum Low 4.5 0.55 V I

OUT

=+48 mA

(TDO

) Output Voltage 5.5 0.55 All Outputs Loaded

SCANPSC110F

www.national.com 18

DC Electrical Characteristics (Continued)

Symbol Parameter V

(V) Military Units Conditions

−55˚C to +125˚C

Guaranteed

Limits

(OE, Maximum Input 5.5 ±1.0 µA V

TCK

(0–5)

) Leakage Current V

=GND

IN, MAX

Maximum Input V

(TRST, TDI

, Leakage Current 5.5 3.7 µA

TDI

, TMS

)

IN, MAX

Maximum Input V

=GND

(TRST, TDI

, Leakage Current 5.5 −385 µA

TDI

, TMS

)

IN, MIN

Minimum Input V

=GND

(TDI

, TMS

, Leakage Current 5.5 −160 µA

TRST, TDI

)

CCT

Maximum

/Input 5.5 1.6 mA V

−2.1V

CCT

Maximum V

−2.1V

(TDI

, TMS

/Input 5.5 1.75 mA Test one at a time

TRST, TDI

) with others floating

Maximum

Quiescent 5.5 168 µA TDI

, TMS

, TRST,

Supply Current TDI

CC, MAX

Maximum

Quiescent 5.5 2.5 mA TDI

, TMS

, TRST,

Supply Current TDI

=GND

OLD

Minimum V

OLD

=1.65V max

(TCK

, TMS

, Dynamic 5.5 50 mA V

(OE) =V

TDO

) Output Current (Note 6)

OLD

Minimum V

OLD

=0.8V

(TDO

) Dynamic 5.5 63 mA V

(TRST) =V

Output Current (Note 6)

OHD

Minimum V

OHD

=3.85V max

(TCK

, TMS

, Dynamic 5.5 −50 mA (Note 6)

TDO

) Output Current

OHD

Minimum Dynamic V

OHD

=2.0V max

(TDO

) Output Current 5.5 −27 mA (Note 6)

Maximum V

(OE) =V

TRI-STATE®5.5 ±10.0 µA V

(TRST) =V

Leakage Current V

, GND

Output Short 5.5 −100 mA V

=0.0V

(TDO

) Circuit Current min (Note 7)

Note 6: Maximum test duration of 2 ms. One output loaded at a time.

Note 7: Maximum test duration not to exceed 1 second.

SCANPSC110F

www.national.com19

AC Electrical Characteristics

Symbol Parameter V

(V) Military Units Fig.

No.

=−55˚C

to +125˚C

=50 pF

Min Max

PHL

, Propagation Delay

PLH

TCK

↓to TCK

5.0 3.0 15.0 ns

Figure 13

TCK

↑to TCK

2.5 15.0

PHL

, Propagation Delay

PLH

TCK

↓to TDO

5.0 3.0 16.5 ns

Figure 13

TCK

↓to TDO

3.0 17.0

PHL

, Propagation Delay

PLH

TCK

↓to TMS

5.0 3.5 26.5 ns

Figure 13

TCK

↓to TMS

4.5 24.5

PHL

, Propagation Delay

PLH

TCK

↓to TDO

5.0 3.0 17.0 ns

Figure 13

TCK

↓to TDO

2.5 16.5

PHL

, Propagation Delay 5.0 2.5 14.5 ns

Figure 13

PLH

TMS

to TMS

1.5 14.5

PLH

Propagation Delay 5.0 4.5 30.0 ns

Figure 15

TRST to TMS

PZL

, Enable Time 5.0

PZH

TCK

↓to TDO

4.0 22.5 ns

TCK

↓to TDO

3.0 19.0

PLZ

, Disable Time

PHZ

TCK

↓to TDO

5.0 1.5 15.5 ns

TCK

↓to TDO

2.0 17.0

PZL

, Enable Time

PZH

TCK

↓to TDO

5.0 4.0 20.5 ns

TCK

↓to TDO

2.5 16.5

PLZ

, Disable Time

PHZ

TCK

↓to TDO

5.0 2.0 16.5 ns

TCK

↓to TDO

2.0 17.5

PZL

, Enable Time 5.0 3.0 19.5 ns

Figure 16

PZH

OE to TDO

3.0 17.5

PLZ

, Disable Time 5.0 1.0 14.0 ns

Figure 16

PHZ

OE to TDO

1.0 15.5

PZL

, Enable Time 5.0 2.0 14.5 ns

Figure 16

PZH

OE to TMS

1.5 13.0

PLZ

, Disable Time 5.0 1.0 12.0 ns

Figure 16

PHZ

OE to TMS

1.0 12.5

PZL

, Enable Time 5.0 2.0 14.5 ns

Figure 16

PZH

OE to TCK

1.5 13.0

PLZ

, Disable Time 5.0 1.0 12.0 ns

Figure 16

PHZ

OE to TCK

1.0 12.5

PLZ

, Disable Time 5.0 2.5 20.0 ns

Figure 15

PHZ

TRST to TDO

3.0 20.0

PLZ

, Disable Time 5.0 2.5 21.0 ns

Figure 15

PHZ

TRST to TDO

1.5 21.0

SCANPSC110F

www.national.com 20

AC Electrical Characteristics

Symbol Parameter V

(V)

Military

Units Fig.

No.

=−55˚C

to +125˚C

=50 pF

Guaranteed

Minimum

Setup Time 5.0 8.0

TMS

to TCK

↑

Hold Time 5.0 4.0 ns

Figure 13

TMS

to TCK

↑

Setup Time 5.0 6.0 ns

Figure 13

TDI

to TCK

↑

Hold Time 5.0 4.0 ns

Figure 13

TdI

to TCK

↑

Setup Time

to TCK

↓5.0 12.5 ns

(in

Update-DR

state)

Hold Time

to TCK

↓5.0 0.0 ns

(in

Update-DR

state)

Setup Time

to TCK

↑5.0 4.0 ns

(in

Capture-DR

Capture-IR

state)

Hold Time

to TCK

↑5.0 6.0 ns

(in

Capture-DR

Capture-IR

state)

Setup Time 5.0 2.0 ns

Figure 13

TDI

to TCK

↑

Hold Time 5.0 6.0 ns

Figure 13

TDI

to TCK

↑

Setup Time

OE to TCK

↑5.0 4.0 ns

(in

Capture-DR

state)

Hold Time

OE to TCK

↑5.0 4.0 ns

(in

Capture-DR

State)

Clock Pulse Width 5.0 24.0 ns

Figure 13

TCK

(H or L)

Clock Pulse Width 5.0 10.0 ns

Figure 15

TRST (L)

REC

Recover Time 5.0 2.0 ns

Figure 15

TCK

↑from TRST

OSHL

, Output-to-Output Skew 5.0 1.0 ns (Note 8)

OSLH

TCK

OSHL

, Output-to-Output Skew 5.0 2.0 ns (Note 8)

OSLH

TMS

(unparked)

MAX

Maximum Clock Frequency 5.0 MHz

Note 8: Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device. The speci-

fication applies to any outputs switching HIGH to LOW (tOSHL ), or LOW to HIGH (tOSLH). The specification is guaranteed but not tested.

SCANPSC110F

www.national.com21

Capacitance

Symbol Parameter Typ Units Conditions

Input Pin Capacitance 5.0 pF V

is Open

OUT

Output Pin Capacitance 6.5 pF V

is Open

Power Dissipation Capacitance 50 pF V

=5.0V

AC Waveforms

DS100327-16

FIGURE 13. Waveforms for an Unparked SCANPSC110F Bridge in the SHIFT-DR (IR) TAP Controller State

DS100327-13

Note A: VOHV and VOLP are measured with respect to ground reference.

Note B: Input pulses have the following characteristics: f =1 MHz, tr=3 ns, tf=3 ns, skew ≤150 ps.

FIGURE 14. Quiet Output Noise Voltage Waveform

SCANPSC110F

www.national.com 22

AC Waveforms (Continued)

DS100327-18

FIGURE 15. Reset Waveforms

DS100327-19

FIGURE 16. Output Enable Waveforms

SCANPSC110F

www.national.com23

Appendix

Applications Example

The following sequence gives an example of how one might

use the SCANPSC110F Bridge to perform 1149.1 operations via a multi-drop scan backplane. The system involved has

10 card slots, 8 of which are filled with modules, and 2 slots

are empty. (See

Figure 18

DS100327-17

Note: The value of the TMS during the rising edge of TCK is located next to each transition.

FIGURE 17. IEEE 1149.1 TAP Controller State Diagram

DS100327-20

FIGURE 18. Boundary Scan Backplane with 10 Card Slots, 8 Slots Are Filled with Boards

SCANPSC110F

www.national.com 24

Applications Example (Continued)

More Information can be found in Application Notes:

AN-1023 Structural System Test via IEEE Std. 1149.1 with

SCANPSC110F Hierarchical and Multidrop Ad-

dressable JTAG Port

AN-1022 Boundary Scan, An Enabling Technology for

System Level Embedded Test

1. After the system is powered up a level-1 reset is per-

formed via the TRST input. All TAP Controllers (both

’PSC110F and local) are asynchronously forced into the

Test-Logic-Reset

state. All LSP Controllers are in the

parked

Test-Logic-Reset

state; this forces the TMS

out-

puts of each port to a logic “1”, keeping all board TAPs in

the

Test-Logic-Reset

state.

2. The first task of the tester is to find out which slots are

occupied on the backplane. This is accomplished by per-

forming a serial poll of each slot address in the system,

as assigned by the S

0–5

value of each ’PSC110F in the

system.

Each target slot address is addressed by first sequenc-

ing all ’PSC110Fs on the backplane to the

Shift-IR

state,

and then by shifting in the address of the target slot. The

’PSC110F TAP controller is then sequenced through the

Update-IR state. If a ’PSC110F with the matching slot

identification is present, it is selected. All other

’PSC110Fs are unselected. To determine whether that

slot contains a selected ’PSC110F, the tester must read

back the ’PSC110Fs S

0–5

value (if present).

The tester moves the selected ’PSC110F from the

Update-IR

state back to the

Shift-IR

state, and the in-

struction register is then scanned while loading the next

instruction

(GOTOWAIT)

. During the

Capture-IR

state of

the TAP Controller, a “01” pattern is loaded into the two

least significant bits of the ’PSC110F’s instruction regis-

ter, and the most significant six bits capture the value on

the S

0–5

pins. The captured data is shifted out while the

GOTOWAIT command is shifted in. If an “all ones” pat-

tern is returned, a board does not exist at that location.

(The “all ones” pattern is caused by the pull-up resistor

on the TDI input of the controller, as required for 1149.1

compliance.)

At the end of instruction register scan, the

GOTOWAIT

command is issued and all ’PSC110F selection control-

lers enter the

Wait-For-Address

state. This allows the

next ’PSC110F in the polling sequence to be addressed.

The polling process is repeated for every possible board

address in the system. In this example, the tester finds

that boards #1 through #8 are present, and boards #9

and #10 are missing. Therefore, it will report back its

findings and will not attempt to test the missing boards.

3. Infrastructure testing of the populated boards may now

proceed. The tester addresses the ’PSC110F on Board

#1 for test operations. ’PSC110F #1 is now selected,

while all others are unselected.

Board #1 is wired such that all LSP

’s are connected to

individual scan chains. The first objective is to test the

scan chain integrity of the board. For this task, it is more

efficient to configure the LSPN such that all three chains

are placed in series. To accomplish this, the

MODESEL

instruction is issued to place the mode register into the

active scan chain, and the binary value “00000111” is

shifted into the mode register. The

UNPARK

instruction

is then issued to access all three local chains.

Once the

UNPARK

instruction has been updated and

the ’PSC110F TAP controller is synchronized with the lo-

cal TAP’s, the scan chain integrity test can be performed

on the local scan chains. This test is done by performing

Capture-IR

and then shifting the scan chain checking

the 2 least significant bits of each components instruc-

tion register for “01”. If the LSB’s of any component in

the scan chain are not “01”, the test fails. Diagnostic

software can be used to narrow down the cause of the

failure. Next the device identification of each component

in the scan chain is checked. This is done by issuing the

IDCODE

instruction to each component in the scan

chain. Components that do not support

IDCODE

will in-

sert their bypass register into the active scan chain.

After the IDCODE register scan, the

GOTOWAIT

in-

struction is issued to reset the local scan ports and re-

turn the ’PSC110F Selection controller to the

Wait-For-Address state. A sequence similar to step 3 is

repeated for each board in the system.

4. Next, the tester addresses Board #1 to perform intercon-

nect testing. For this task, it is efficient to configure the

LSPN such that all three chains are placed in series.

Therefore, the Mode register should be programmed

with the binary value “00000111” (this was done in step

3 above and need not be repeated unless a

Test-Logic-Reset

was performed since then). The

UN-

PARK

instruction is issued to access all three local

chains.

Once the

UNPARK

instruction has been loaded and the

’PSC110F is synchronized with the local TAPs, normal

1149.1 scan operations may commence. To test the in-

terconnect on Board #1, an instruction register scan se-

quence is performed and the

SAMPLE/PRELOAD

in-

struction is loaded into the instruction register of all

target devices. The

BYPASS

instruction is loaded into

the instruction register of ’PSC110F #1. A data register

scan is now performed to preload the first test vector to

be applied to the interconnect.

5. After the preload operation is performed, an instruction

EXTEST

instruction into

all TAPs (

BYPASS

loaded into ’PSC110F #1). The ap-

propriate sequencing is now performed to apply patterns

in order to test the interconnect on Board #1.

6. Upon completion of the interconnect test on Board #1,

the local chains must be parked. The

PARKTLR

com-

mand is loaded into the instruction register, and the

TMS

outputs of the three local chains are forced high,

sending the three local TAPs into the

Test-Logic-Reset

state.

7. Now that the Board #1 interconnect has been tested, the

interconnect on the other boards in the system must be

checked. All ’PSC110F are returned to the

Wait-For-Address

state by issuing the

GOTOWAlT

in-

struction. Board #2 is addressed next, followed by the

rest of the boards in the system. A sequence similar to

steps 4 through 6 is used for each board.

SCANPSC110F

www.national.com25

Applications Example (Continued)

8. Assume that boards #6, #7 and #8 are identical, so that

it is possible to test them simultaneously. The tester first

addresses Board #6. Next the

MCGRSEL

instruction is

issued to place the Multi-Cast Group register into the ac-

tive scan chain, and the binary value “01” is shifted into

the MCGR. The

GOTOWAIT

instruction is then issued

returning all ’PSC110F’s to the

Wait-For-Address

state.

The MCGR for ’PSC110F #7 and ’PSC110F #8 are pro-

grammed the same as Board #6. Next the Multi-Cast ad-

dress “00111101” is issued by the tester, which causes

the ’PSC110F Selection controller of ’PSC110F #6–#8

to enter the

Selected-Multi-Cast

state. The

LFSRON

in-

struction is then issued to enable the signature compac-

tion circuitry on the selected ’PSC110Fs. The

SAMPLE/

PRELOAD

and

EXTEST

instructions are then used to

test the interconnects, similar to steps 4 and 5 above.

When the test sequence is complete, the

GOTOWAIT

instruction is issued returning all ’PSC110Fs to the

Wait-For-Address state

. ’PSC110Fs #6, #7, and #8 are

then addressed one at a time to read back the test sig-

nature from the LFSR (the LFSR is read by selecting it

with the

LFSRSEL

instruction, then scanning out its con-

tents.

9. After testing the interconnect on the individual boards,

the next step is to test the backplane interconnect. This

is a pair-wise test between Board #1 and each of the

other boards. Board #1 drives test patterns onto th back-

plane wiring, and the currently addressed slave board

senses the written data via its backplane scan interface.

In this example, the interconnect between Board #1 and

Board #2 is tested first. To test this interconnect, the

1149.1-compliant backplane transceivers,

SCAN182245A, SCAN ABT Test Access Logic, on each

board must be accessed for scan operations (see

Figure

). For more information on SCAN ABT live insertion

capabilities, refer to the SCAN182245A datasheet.

First, the system master (Board #1) is addressed and

selected. The 1149.1-compliant SCAN ABT transceivers

reside on the chain connected to LSP

on Board #1. The

mode register is re-configured so that only port LSP

in the chain, and the

UNPARK

instruction is then used to

access this chain. The appropriate instruction register

and data register scan sequencing is then performed to

apply a pattern to the backplane using the SCAN ABT

bus transceiver.

10. To test the backplane interconnect, LSP

of Board #1

must be parked in the

Run-Test/Idle

TAP controller

state, so that the EXTEST command will stay active

when Board #1 is de-selected (the

PARKRTI

instruction

is issued). The

GOTOWAIT

instruction is then issued to

return all boards to the

Wait-For-Address

state. Each

one of the slave boards is then addressed, one at a

time, to sample the backplane signals being driven by

Board #1. For example, Board #2 is addressed. The

mode register is reconfigured, (if needed), to select the

scan chain (LSP

) that includes the SCAN ABT back-

plane transceivers for Board #2. The

UNPARK

instruc-

tion is issued to unpark LSP

and insert it into the active

scan chain. The

SAMPLE/PRELOAD

instruction is is-

sued to the SCAN ABT backplane transceivers, (

BY-

PASS

to other components in the scan chain). The

backplane is sampled by sequencing the TAP controller

through the

Capture-DR

state and the data is shifted out

and checked by the tester. The

PARKRTI

instruction is

then given to park LSP

of Board #2inthe

Run-Test/Idle

state, and the

GOTOWAIT

instruction is issued to return

all ’PSC110Fs to the

Wait-For-Address

state so that the

next board, (Board #3), can be sampled. This procedure

is repeated for boards #3–#8, then Board #1 is selected

again, a new pattern is shifted out and driven by the

EX-

TEST

command, and the slave boards are again

sampled.

11. Step 10 is repeated until the backplane interconnect has

been sufficiently tested.

12. When testing is complete, the controller sends out the

SOFTRESET

instruction to all ’PSC110Fs. This is ac-

complished by first using the broadcast address, “3B”

Hex, to select all ’PSC110Fs. The

SOFTRESET

com-

mand is then loaded, causing TMS

L(1–3)

signals to go

high; this drives all local TAPs into the

Test-Logic-Reset

state within five TCK cycles.

SCANPSC110F

www.national.com 26

Applications Example (Continued)

DS100327-21

FIGURE 19. Testing the Backplane Interconnections

SCANPSC110F

www.national.com27

Physical Dimensions inches (millimeters) unless otherwise noted

28-Pin Leadless Chip Carrier (LCC)

NS Package Number E28A

28-Pin Ceramic DIP

NS Package Number J28A

SCANPSC110F

www.national.com 28

Physical Dimensions inches (millimeters) unless otherwise noted (Continued)

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NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT

DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL

COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices or

systems which, (a) are intended for surgical implant

into the body, or (b) support or sustain life, and

whose failure to perform when properly used in

accordance with instructions for use provided in the

labeling, can be reasonably expected to result in a

significant injury to the user.

2. A critical component is any component of a life

support device or system whose failure to perform

can be reasonably expected to cause the failure of

the life support device or system, or to affect its

safety or effectiveness.

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Fax: 81-3-5639-7507

www.national.com

28-Pin Flatpak

NS Package Number WA28D

SCANPSC110F SCAN Bridge

National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.