Qualification Test
Report 501-99
18Oct06 Rev B
AMPLIMITE* HDP-20 Subminiature D Connector With F Crimp
Contacts
©2006 Tyco Electronics Corporation
Harrisburg, PA
All International Rights Reserved
* Trademark
| Indicates change 1 of 9
LOC B
1. INTRODUCTION
1.1. Purpose
Testi ng was performed on the AMPLIMIT E * HDP-20 Subminiature D Connectors With F Crimp
Contacts to deter mine their c onfor manc e to the requirement s of Pr oduc t Specifi c ati on 108- 40005
Revision B.
1.2. Scope
This report covers the el ectri c al, mechani cal, and envir onment al performance of the AMPLI M ITE
HDP-20 Submini ature D Connectors Wit h F Cri mp Contacts. Testi ng was perf or med at the
Engi neer ing Assurance Produc t Test Laboratory between 28Aug89 and 06Oct 89. The t est fil e number
for t his testi ng is CTL 5091-152- 012. This docum entation i s on file at and available from the
Engi neer ing Assurance Produc t Test Laboratory.
1.3. Conclusion
The AMPLI M I TE HDP-20 Subminiature D Connectors Wi t h F Crimp Cont acts li sted in paragraph 1.5. ,
conformed t o the el ec trical , mechani c al, and envir onmental per formanc e r equirement s of Pr oduc t
Specifi c ati on 108- 40005 Revisi on B .
1.4. Product Descri ption
AMPLIMITE HDP-20 Subminiat ure D Connectors Wi th F Cri mp Cont acts are designed for discrete
wire ter mination and are available in 9, 15, 25, 37 and 50 position. The shells are available in both zinc
and tin pl ating with the ti n plated shel l also avai labl e with grounding indents. The HDP - 20 met al shell
connect or s accept size 20 DF (precision formed) c ontact s.
1.5. Test Spec imens
Test speci mens were representative of nor mal production lot s. S pec imens ident ified with the fol lowing
part number s were used for t est:
Test G r oup Quant it y Part Number Descripti on
145 66507-3 30
:
in gold pin with 24 AWG wir e
45 66505-3 30
:
in gold socket with 24 AWG wire
10 205817-1 Female screwlocks
1,3 15 each 205204-1 9 position zinc plug housing
15 each 205203-1 9 positi on z inc rec eptacle housing
40 each 206478-1 Cable clamp
1,3,5 815 each 66507-4 Gold fl ash pi n with 24 AWG wire
815 each 66505-4 Gold flash socket with 24 AWG wire
2 36 747960-1 50 position t in pl ug housi ng with shield
Figure 1 (c ontinued)
501-99
Test G r oup Quant it y Part Number Descripti on
Rev B 2 of 9
2
36 747959-1 50 position t in receptacle housing wit h shi eld
600 205310-4 Gold fl ash pi n with 28 AWG wire
600 205310-4 Gold fl ash pi n with 24 AWG wire
600 205311-4 Gold fl ash socket with 28 AWG wire
600 205311-4 Gold fl ash socket with 24 AWG wire
30 206478-5 Cable c lamp
2,4 630 each 745229-5 Gold fl ash pi n with 18 AWG wire
630 each 745230-5 Gold flash socket wit h 18 A WG wir e
4
30 66507-4 Gold fl ash pi n with 28 AWG wire
30 66507-4 Gold fl ash pi n with 26 AWG wire
30 66507-4 Gold fl ash pi n with 24 AWG wire
30 66505-4 Gold fl ash socket with 28 AWG wire
30 66505-4 Gold fl ash socket with 26 AWG wire
30 66505-4 Gold fl ash socket with 24 AWG wire
30 745229-5 Gold fl ash pi n with 20 AWG wire
30 745229-5 Gold fl ash pi n with 22 AWG wire
30 745230-5 Gold fl ash socket with 20 AWG wire
30 745230-5 Gold fl ash socket with 22 AWG wire
5
5 205204-4 9 position t in pl ug housi ng with i ndent
5 205203-3 9 position t in receptacle housing
5 205206-3 15 position t in pl ug housi ng with i ndent
5 205205-2 15 position t in receptacle housing
5 207464-2 25 position t in pl ug housi ng with i ndent
5 207463-1 25 position t in receptacle housing
5 205210-3 37 position t in pl ug housi ng with i ndent
5 205209-2 37 position t in receptacle housing
5 205212-3 50 position t in pl ug housi ng with i ndent
5 205211-2 50 position t in receptacle housing
Figure 1 (end)
1.6. Environment al Conditions
Unless otherwise stated, the fol lowing environmental c ondit ions prevailed duri ng testi ng:
!
Temperature: 15 to 35
/
C
!
Relati ve Hum idity: 25 to 75%
501-99
Rev B 3 of 9
1.7. Quali ficati on Test Sequence
Test or E xamination Test G r oup ( a)
12345
Test Sequenc e ( b)
Initial examination of produc t 11111
Low level cont ac t resistanc e 3,7 2,8
Contact resistanc e, specified cur r ent 8
I nsulation r esistan ce 3,7
Wit hstanding volt age 4,8
Temperature rise vs current 3,9
Vi br ati on, random 5 7(c)
Mechanical shock
Durability 4 4 4
Mating f orce 2 2,5
Unm ati ng for c e 9 3,6
Contact i nsert ion forc e 2
Contact ret ention force 9
Contact engagi ng for c e 2
Contact separating force 3
Cri mp tensil e 4
Thermal shock 5
Hum idity- temperat ur e c y c li ng 6
Temperature l ife 6
Mi xed flowing gas 5
Final examination of produc t 10 10 10 5 1,7
(a) See paragraph 1.5.
NOTE
(b) Numbers indic ate sequence in which tests ar e per formed.
(c) Discont inuities shall not be measur ed. Energize at 18
/
C level for 100% loadings
per Specificat ion 102- 950.
Figure 2
2. SUMMARY OF T ESTI NG
2.1. Initial E xamination of Pr oduc t - All Test Gr oups
Al l speci mens submitted for t esting were representat ive of nor mal produc tion lot s. A Cer tificat e of
Conformance was issued by Produc t Assurance. Spec imens were visually exami ned and no evidenc e
of physic al damage detr imental t o pr oduc t performance was observed.
501-99
Rev B 4 of 9
2.2. Low Lev el Cont ac t Resistance - Test Gr oups 1 and 2
Al l low level contact r esi stanc e measurements, taken at 100 milliamperes maximum and 20 millivolts
m aximum open circuit voltage were less than 15 milliohms.
Test
Group Number of
Data Point s Wire Size
(AWG) Condition Contact Resi stanc e
Min Max Mean
190 24Initial 3.20 4.27 3.91
Final 3.57 4.63 4.10
2
500 28 Initial 4.10 9.13 6.87
Final 4.54 13.85 8.29
500 24 Initial 3.35 4.45 4.00
Final 4.19 9.98 5.38
500 18 Initial 2.46 3.53 2.94
Final 2.85 9.99 4.89
All values in m illiohm s .
NOTE
Figure 3
2.3. Contact Resistance, Specified Current - Test Gr oup 1
Al l contact r esi stanc e measurement s, taken at specifi ed c ur r ent of 1.6 amper es, were l ess than 15
milliohms.
Quantity Test Curr ent
(amperes) Contact Resistance
Min Max Mean
45 1.6 3.97 5.53 4.32
3.88 4.73 4.24
Figure 4
2.4. Insulati on Resi stanc e - Test Group 3
Al l insulation resi stanc e measurements were greater than 5000 megohm s i nit ial ly and 500 megohms
after testing.
2.5. Wit hstanding Voltage - Test Group 3
No dielectri c br eak down or flashover occ ur r ed.
501-99
Rev B 5 of 9
2.6 Temperat ur e Rise vs Current - Test Gr oup 2
Al l speci mens had a temperature rise of less than 30
/
C above ambient when tested using a specifi ed
current with all c ontact s i n a 50 posi ti on housi ng ener gized.
Contact
Plating Wire Si ze
(AWG) Speci fied Curr ent
(amperes) Contact
Quantity Temperature Rise (
/
C)
Initial Final
Gold flash 28 1.2 500 25.4 26.5
24 1.6 500 21.0 19.0
18 3.1 500 18.1 23.4
Values calc ulated fr om test data.
NOTE
Figure 5
2.7. Vi br ati on - Test Groups 1 and 2
No discont inuities wer e detected dur ing vibrati on testing. Foll owing vi br ation testi ng, no crack s,
breaks, or loose parts on the specim ens were visible.
2.8. Mechanical Shock - Test Gr oup 1
No discont inuities wer e detected dur ing mechanical shock testing. Fol lowing mechanical shock testi ng,
no crack s, br eak s, or loose parts on the specim ens were visible.
2.9. Durability - Test Groups 1, 2 and 5
No physical damage occur r ed as a result of mating and unmating gold fl ash specimens 100 times and
30
:
in gold plated speci mens 500 times.
2.10. Mating F or c e - Test Groups 1 and 5
Al l mating for c e measurements were less than the speci fied requirement s.
Size Positions N [lbf] M aximum
With
Ground Indents Without
Ground Indents
1 9 12.5 [ 2.8] 133.4 [ 30]
2 15 20.9 [ 4.7] 146.8 [ 33]
3 25 34.7 [ 7.8] 164.6 [ 37]
4 37 51.6 [ 11.6] 177.9 [ 40]
5 50 69.4 [ 15.6] 195.7 [ 44]
Figure 6
2.11. Unm ati ng Force - Test Gr oup 1
Al l unmating for c e measurements were less than the requirement s specified in Figure 6.
501-99
Rev B 6 of 9
2.12. Contact Insert ion For c e - Test Gr oup 3
The for c e r equired t o insert eac h c ontact into it s housing was less than 13.3 N [ 3 lbf] .
2.13. Contact Retention Force - Test Gr oup 3
No contac ts wer e dislodged fr om t he housi ng when subject to a l oad of 44.5 N [10 lbf] .
2.14. Contact Engaging Forc e - Test Gr oup 4
Al l contact engaging for c e measurements were less than 2.2 N [ 8 oz f] max imum per contact.
2.15. Contact Separating Force - Test Gr oup 4
Al l contact separat ing for c e measurements were greater than 0.208 N [ .75 ozf] mini mum per c ontact .|
2.16. Cri mp Tensil e - Test Gr oup 4
Al l cr imp tensi le measurem ents were gr eater t han the specified requirement s.
2.17. Thermal Shock - Test Gr oup 3
No evidence of phy si c al damage was visi ble as a result of exposure t o thermal shock.
2.18. Hum idity- temperat ur e Cy c li ng - Test Gr oup 3
No evidence of physical dam age was visibl e as a result of exposure to humi dity-tem perature cycling.
2.19. Temperature Li fe - Test G r oup 2
No evidence of phy si c al damage was visi ble as a result of exposure t o tem per ature life.
2.20. Mi xed Flowing Gas - Test G r oup 2
No evidence of phy si c al damage was visi ble as a result of exposure t o the pollut ants of mixed flowi ng
gas.
2.21. Final E xamination of Pr oduc t - All Test Groups
Specimens were vi sual ly exami ned and no evi denc e of phy si c al damage detr imental t o pr oduc t
performance was obser ved.
3. T EST METHODS
3.1. Initial E xamination of Pr oduc t
A Cert ificat e of Confor manc e was issued stating that all speci mens i n this test pac k age were
produced, inspected, and accept ed as confor ming to pr oduc t drawing requirement s, and were
m anufactured usi ng the same cor e manufac turing processes and technologies as production parts.
3.2. Low Lev el Cont ac t Resistance
Low level cont ac t resistanc e measurements were made usi ng a 4 termi nal measuring technique
(Figure 7) . The t est c ur r ent was maintained at 100 milliamperes maximum with a 20 millivolt
m aximum open circuit voltage.
501-99
Rev B 7 of 9
Figure 7
Low Lev el Cont ac t Resistance Measurement P oint s
3.3. Contact Resistance, Specified Current
Contact resistanc e measurements tak en at specified cur r ent were made using a 4 t er minal measuring
technique (Figur e 7) .
3.4. Insulati on Resi stanc e
Insulati on r esi stanc e was measured between adjac ent contac ts of mated/unmat ed specim ens. A test
voltage of 500 vol ts DC was appl ied for 1 minute befor e the resistanc e was measured.
3.5. Wit hstanding Voltage
A test potential of 1000 vol ts AC was appli ed between adjacent c ontacts. Thi s potenti al was appli ed for
1 m inut e and then retur ned to zero.
3.6. Temperature Ri se vs Current
Temperature rise curves were produced by measuring individual cont ac t temperatures at specified
current l evels. Thermocouples wer e attached to i ndividual contac ts to measure thei r temperatur es.
The ambient t emper ature was then subtracted from t his measured t emper ature to find the temperat ur e
ri se. When t he tem per ature rise of 3 c onsecut ive readings tak en at 5 minute i ntervals did not differ by
m or e than 1
/
C, t he temperatur e measurement was recorded.
3.7. Vi br ati on, Random
Mated specimens were subj ec ted to a r andom vibr ation test, specifi ed by a r andom vibr ation
spectrum, with ex c it ati on fr equenc y bounds of 50 and 2000 Hz. The power spectral densit y at 50 Hz
was 0. 075 G2/Hz. The spect r um sl oped up at 6 dB per octave to a PSD of 0.04 G2/Hz at 100 Hz. The
spectrum was fl at at 0.04 G2/Hz from 100 to 1000 Hz. The spectrum sloped down at 6 dB per oc tave to
the upper bound frequency of 2000 Hz at which t he P S D was 0075 G2/Hz. The root- mean square
am plitude of the exci tation was 20.71 GRM S . This was performed for 15 minutes i n eac h of 3 mut ually
perpendi c ular planes f or a total vibration ti me of 45 minutes. S pec imens wer e monitor ed for
discont inuities of 1 microsecond or gr eater using a c ur r ent of 100 milliamperes in the monitoring
circuit.
501-99
Rev B 8 of 9
3.8. Mechanical Shock, Hal f-si ne
Mated specimens were subj ec ted to a mechanical shock test havi ng a half-si ne wavefor m of 50 gr avity
units (g peak) and a duration of 11 milliseconds. T hr ee shocks i n eac h direc tion were appl ied along the
3 m utual ly perpendicular planes f or a total of 18 shocks. Spec imens wer e monitor ed for discontinui ti es
of 1 mic r osecond or gr eater using a c ur r ent of 100 m illiamperes DC.
3.9. Durability
Gold fl ash specimens were mated and unmated 100 t imes, whil e 30
:
in gold plated speci mens were
m ated and unm ated 500 times, at a maxi mum rate of 200 cycles per hour.
3.10. Mating F or c e
The for c e r equired t o mate i ndividual specimens was m easured using a tensile/compr ession device
with a fr ee float ing fixture and a r ate of tr avel of 25.4 mm [1 i n] per mi nute.
3.11. Unm ati ng Force
The for c e r equired t o unmate i ndividual specimens was m easured using a tensile/compr ession device
with a fr ee float ing fixture and a r ate of tr avel of 25.4 mm [1 i n] per mi nute.
3.12. Contact Insert ion For c e
The for c e r equired t o seat eac h c ontact int o the housing was measured.
3.13. Contact Retention Force
An axi al l oad of 44.5 N [10 lbf] was appli ed to each cont ac t i n a directi on to cause removal from t he
housing and hel d for 6 seconds.
3.14. Contact Engaging Forc e
Contact engagi ng for c es were measured by inserting a 1. 04 mm [ .041 in] steel gage into the socket to
a depth of 5.6 m m [.220 in].
3.15. Contact Separating Force
Contact separating forces were measured by withdrawing a 0. 99 mm [ .039 in] steel gage fr om a depth
of 5.6 mm [ .220 i n].
3.16. Cri mp Tensil e
An axi al l oad was appli ed at a rat e of 25.4 m m [1 in] per mi nute.
3.17. Thermal Shock
Mated specimens were subjected to 5 cycles of thermal shock wit h each cycle consi sting of 30 m inute
dwells at - 55 and 105
/
C. T he transition between tem per atures was l ess than 1 mi nute.
3.18. Hum idity- temperat ur e Cy c li ng
Mated specimens were exposed to 10 cycles of hum idity-t emperature cycling. Each cycle lasted 24
hours and consisted of cycl ing t he tem perature between 25 and 65
/
C twice while mai ntai ning high
humidity.
501-99
Rev B 9 of 9
3.19. Temperature Li fe
Mated specimens were exposed to a tem per ature of 105
/
C for 500 hours.
3.20. Mixed Flowing Gas, Class IIIA
Mated specimens were exposed for 20 days to a mix ed flowi ng gas Class IIIA exposure. Class IIIA
ex posure is def ined as a temperat ur e of 30
/
C and a rel ati ve hum idity of 75% with the pol lutants of Cl 2
at 20 ppb, NO2 at 200 ppb, H2S at 100 ppb and SO2 at 200 ppb.
3.21. Final E xamination of Pr oduc t
Specimens were vi sual ly exami ned for evidence of physi c al damage detr imental t o pr oduc t
performance.
