DATA SH EET
Product specification December 1997
DISCRETE SEMICONDUCTORS
BFT46
N-channel silicon FET
December 1997 2
NXP Semiconductors Product specification
N-channel silicon FET BFT46
DESCRIPTION
Symmetrical n-channel silicon
epitaxial planar junction field-effect
transistor in a microminiature plastic
envelope. The transistor is intended
for low level general purpose
amplifiers in thick and thin-film
circuits.
PINNING
Note : Drain and source are
interchangeable.
1 = drain
2 = source
3=gate
Marking code
BFT46 = M3p
Fig.1 Simplified outline and symbol, SOT23.
handbook, halfpage
12
gd
s
3
Top view
MAM385
QUICK REFERENCE DATA
Drain-source voltage VDS max. 25 V
Gate-sourc e voltage (open drain) VGSO max. 25 V
Total powe r dis sipation up to Tamb =40CP
tot max. 250 mW
Drain curr en t
VDS =10V; V
GS =0 IDSS 0,2 mA
1,5 mA
Transfer admittance (common source)
ID= 0,2 mA; VDS = 10 V; f = 1 kHz yfs 0,5 mS
Equivalent noise voltage
VDS =10 V; I
D=200 A; B = 0,6 to 100 Hz Vn0,5 V
December 1997 3
NXP Semiconductors Product specification
N-channel silicon FET BFT46
RATINGS
Limiting values in accordance with the Abs olu te Maximum System (IEC 134)
THERMAL RESIST ANCE
Note
1. Mounted on a ceramic substrate of 8 mm 10 mm 0,7 mm.
CHARACTERISTICS
Tj=25 C unless otherwise specified
Drain-source voltage VDS max. 25 V
Drain-gate voltage (open source) VDGO max. 25 V
Gate-sourc e voltage (open drain) VGSO max. 25 V
Drain curr en t IDmax. 10 mA
Gate current IGmax. 5 mA
Total powe r dis sipation up to Tamb =40C(1) Ptot max. 250 mW
Storage temperature range Tstg 65 to 150 C
Junction temperature Tjmax. 150 C
From junction to ambient(1) Rth j-a =430K/W
Gate cut- off current
VGS =10V; V
DS =0 IGSS 0,2 nA
Drain curr en t
VDS =10V; V
GS =0 IDSS 0,2 mA
1,5 mA
Gate-source voltage
ID=50 A; VDS =10 V VGS 0,1 V
1,0 V
Gate-sourc e cut-off voltage
ID= 0,5 nA; VDS =10V V(P)GS 1,2 V
y-parameters at f = 1 kHz;
VDS =10 V; V
GS =0; T
amb =25C
Transfer admittance yfs 1,0 mS
Output admittance yos 10 S
VDS =10V; I
D=200 A; Tamb =25C
Transfer admittance yfs 0,5 mS
Output admittance yos 5S
Input capacitance at f = 1 MHz;
VDS =10V; V
GS =0; T
amb =25CC
is 5pF
Feedback capacitance at f = 1 MHz;
VDS =10V; V
GS =0; T
amb =25CC
rs 1,5 pF
Equivalent noise voltage
VDS =10V; I
D=200 A; Tamb =25C
B = 0,6 to 100 Hz Vn0,5 V
December 1997 4
NXP Semiconductors Product specification
N-channel silicon FET BFT46
Fig.2 Power derating curve.
handbook, halfpage
0Tamb (°C)
Ptot
(mW)
300
200
100
040 200
80 120 160
MDA245
Fig.3 Typical values. VDS =10 V; T
j=25C.
handbook, full pagewidth
20
1.5
0.75
1
1.25
0.5
0.25
0
1.25 1 1510500.25
0.50.75
MDA272
VDS (V)
VGS (V)
ID
(mA)
0.1 V
0.2 V
0.3 V
0.4 V
VGS = 0 V
max
typ
min
December 1997 5
NXP Semiconductors Product specification
N-channel silicon FET BFT46
Fig.4 Typical values. VDS =10V.
handbook, halfpage
0
0.3 V
50
ID
(mA)
100 150
1
0.75
0.25
0
0.5
MDA273
Tj (°C)
VGS = 0 V
0.1 V
0.2 V
Fig.5 Correlation between V(P)GS and IDSS.
VDS =10 V; T
j=25C.
handbook, halfpage
0
typ
0.5
V(P)GS
(V) at
ID = 0.5 nA
1 1.5
1.25
1
0.5
0.25
0.75
MDA274
IDSS (mA) at VGS = 0
Fig.6 yfs versus ID. VDS = 10 V; f = 1 kHz;
Tamb = 25 C.
0
typ
ID (mA)
|yfs|
(mS)
3
2
1
00.25 0.5 0.75
MDA269
Fig.7 yos versus ID. VDS =10 V; f=1 kHz;
Tamb = 25 C.
handbook, halfpage
0
typ
0.25
|yos|
(mS)
ID (mA)
0.5 0.75
5
0
4
3
2
1
MDA270
December 1997 6
NXP Semiconductors Product specification
N-channel silicon FET BFT46
Fig.8 yos versus VDS. ID= 0,4 mA; f = 1 kHz;
Tamb = 25 C.
handbook, halfpage
3001020
VDS (V)
103
102
10
1
MDA271
|yos|
(μA/V)
typ
Fig.9 Typical values. VDS =10 V; T
amb =25 C.
handbook, halfpage
0VGS (V)
Cis
(pF)
6
4
2
0124
3
MDA266
Fig.10 Typical values. VDS =10 V, T
amb = 25 C.
handbook, halfpage
0VGS (V)
Crs
(pF)
1.5
1
0.5
0124
3
MDA267
Fig.11 IGSS versus Tj. VGSS =10V; V
DS =0.
handbook, halfpage
15010050
IGSS
(nA)
0
typ
10
1
101
102
103
MDA268
Tj (°C)
December 1997 7
NXP Semiconductors Product specification
N-channel silicon FET BFT46
Fig.12 VDS =10V; I
D= 0,2 mA; Tamb =25C.
handbook, full pagewidth
10
4
10
3
10
2
10
1
10
typ
10
2
10
3
10
4
f (Hz)
10
5
10
6
MDA264
e
n
(nV/ Hz)
Fig.13 VDS =10V; I
D= 0,2 mA; Tamb =25C.
handbook, full pagewidth
10
4
10
3
10
2
10
1
10 10
2
10
3
10
4
f (Hz)
10
5
10
6
MDA265
typ
i
n
(fA/ Hz)
December 1997 8
NXP Semiconductors Product specification
N-channel silicon FET BFT46
PACKAGE OUTLINE
UNIT A1
max. bpcDE e1HELpQwv
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
04-11-04
06-03-16
IEC JEDEC JEITA
mm 0.1 0.48
0.38 0.15
0.09 3.0
2.8 1.4
1.2 0.95
e
1.9 2.5
2.1 0.55
0.45 0.1
0.2
DIMENSIONS (mm are the original dimensions)
0.45
0.15
SOT23 TO-236AB
bp
D
e1
e
A
A1
Lp
Q
detail X
HE
E
wM
vMA
B
AB
0 1 2 mm
scale
A
1.1
0.9
c
X
12
3
Plastic surface-mounted package; 3 leads SOT23
December 1997 9
NXP Semiconductors Product specification
N-channel silicon FET BFT46
DATA SHEET STATUS
Notes
1. Please consult the most rec ently issued document before initiating or completing a design.
2. The product s tatus of device (s) described in this document may have changed since this document was published
and may differ in case of multiple devices. The latest product status information is available on the Internet at
URL http://www.nxp.com.
DOCUMENT
STATUS(1) PRODUCT
STATUS(2) DEFINITION
Objective data sheet Development This document contains data from the objective specification for product
development.
Preliminary data sheet Qualification This document contains data from the preliminary specification.
Product data sheet Production This document contains the pr oduct specification.
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December 1997 10
NXP Semiconductors Product specification
N-channel silicon FET BFT46
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Limiting values Stress above one or more limiting
values (as defined in the Absolute Maximum Ratings
System of IEC 60134) will cause permanent damage to
the device. Limiting values are stress ra tings only and
(proper) operat ion of the device at these or any othe r
conditions above those given in the Recommended
operating conditions section (if present) or the
Characteristics sections of this document is not warranted.
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Printed in The Netherlands R77/02/pp11 Date of release: December 1997