IDT7416827ETEB - Integrated Device Technology, Inc.

IDT54/74FCT16827AT/BT/CT/ET

FAST CMOS 20-BIT BUFFER MILITARY AND COMMERCIAL TEMPERATURE RANGES

AUGUST 1999

1999 Integrated Device Technology, Inc. DSC-5439/-c

IDT54/74FCT16827AT/BT/CT/ET

MILITARY AND COMMERCIAL TEMPERATURE RANGES

FAST CMOS

20-BIT BUFFER

DESCRIPTION:

The FCT16827AT/BT/CT/ET 20-bit buffers are built using advanced

dual metal CMOS technology. These 20-bit bus drivers provide high-

performance bus interface buffering for wide data/address paths or buses

carrying parity. Two pair of NAND-ed output enable controls offer maximum

control flexibility and are organized to operate the device as two 10-bit

buffers or one 20-bit buffer. Flow-through organization of signal pins

simplifies layout. All inputs are designed with hysteresis for improved noise

margin.

The FCT16827AT/BT/CT/ET are ideally suited for driving high capaci-

tance loads and low impedance backplanes. The output buffers are

designed with power off disable capability to allow "live insertion" of boards

when used as backplane drivers.

FUNCTIONAL BLOCK DIAGRAM

2Y1

TO NINE OTHER CHANNELS

2OE1

2OE2

2A1

1Y1

TO NINE OTHER CHANNELS

1OE1

1OE2

1A1

422 15

FEATURES:

− 0.5 MICRON CMOS Technology

− High-speed, low-power CMOS replacement for ABT functions

− Typical tSK(o) (Output Skew) < 250ps

− Low input and output leakage ≤1µA (max.)

− ESD > 2000V per MIL-STD-883, Method 3015; > 200V using

machine model (C = 200pF, R = 0)

− 25 mil pitch SSOP, 19.6 mil pitch TSSOP, 15.7 mil pitch TVSOP

and 25 mil pitch CERPACK packages

− Extended commercial range of -40°C to +85°C

− VCC = 5V ±10%

− High drive outputs (-32mA IOH, 64mA IOL)

− Power off disable outputs permit “live insertion”

− Typical VOLP (Output Ground Bounce) < 1.0V at VCC = 5V, TA =

25°C

MILITARY AND COMMERCIAL TEMPERATURE RANGES

IDT54/74FCT16827AT/BT/CT/ET

FAST CMOS 20-BIT BUFFER

SSOP/ TSSOP/ TVSOP/ CERPACK

TOP VIEW

PIN CONFIGURATION ABSOLUTE MAXIMUM RATINGS(1)

Symbol Description Max Unit

VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7 V

VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V

TSTG Storage Temperature –65 to +150 °C

IOUT DC Output Current –60 to +120 mA

5v16-link

NOTES:

1. Stresses greater than those listed under ABSOLUTE MAXIMUM

RATINGS may cause permanent damage to the device. This is a

stress rating only and functional operation of the device at these or

any other c onditions above t hose indicated in the operational s ections

of this specification is not implied. Exposure to absolute maximum

rating condit i ons for extended periods may affect reliability.

2. All dev i ce terminals exc ept FCT162XXXT Output and I/O t erminals.

3. Output and I/ O t erminals for FCT162XXXT.

CAPACITANCE (TA = +25OC, f = 1.0MHz)

Symbol Parameter(1) Conditions Typ. Max. Unit

CIN Input Capacitance VIN = 0V 3.5 6 pF

COUT Output Capacitance VOUT = 0V 3.5 8 pF

5v16-link

NOTE:

1. This paramet er i s measured at characterization but not test ed.

1Y1

GND

1Y3

VCC

1OE1

GND

1Y10

GND

1Y2

1Y4

1Y5

1Y6

1Y7

1Y8

1Y9

2Y3

VCC

GND

2Y4

2Y5

2Y7

2Y8

2Y6

2OE1

1OE2

1A1

1A2

GND

1A3

1A4

VCC

1A5

1A6

1A7

1A8

1A9

1A10

GND

SO56-1

SO56-2

SO56-3

E56-1

2Y1

2Y2

2Y10

2Y9

2A3

2A4

VCC

2A5

2A7

2A8

2A6

GND

2A9

2A10

2OE2

3225

2A1

2A2

PIN DESCRIPTION

Pin Names Description

xOEx Output Enable Inputs (Active LOW)

xAx Data Inputs

xYx 3-State Outputs

FUNCTION TABLE(1)

Inputs Outputs

xOE1xOE2xAxxYx

LLL L

LLH H

HXX Z

XHX Z

NOTE:

1. H = HIGH Voltage Level

L = LOW Voltage Level

X = Don’t Care

Z = High-Impedance

IDT54/74FCT16827AT/BT/CT/ET

FAST CMOS 20-BIT BUFFER MILITARY AND COMMERCIAL TEMPERATURE RANGES

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified:

Commercial: TA = -40°C to +85°C, VCC = 5.0V ±10%; Military: TA = -55°C to +125°C, VCC = 5.0V ±10%

Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit

VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V

VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V

IIH Input HIGH Current (Input pins)(5) VCC = Max. VI = VCC ——±1µA

Input HIGH Current (I/O pins)(5) ——±1

IL Input LOW Current (Input pins)(5) VI = GND — — ±1

Input LOW Current (I/O pins)(5) ——±1

OZH High Impedance Output Current VCC = Max. VO = 2.7V — — ±1µA

OZL (3-State Output pins)(5) VO = 0.5V — — ±1

VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V

IOS Short Circuit Current VCC = Max., VO = GND(3) –80 –140 –250 mA

VHInput Hysteresis — — 100 — mV

ICCL

ICCH

ICCZ

Quiescent Power Supply Current VCC = Max.

VIN = GND or VCC — 5 500 µA

5v16-link

NOTES:

1. For conditi ons shown as Max. or M i n. , use appropri ate value specified under Electrical Charac teristi cs for the applic abl e device t ype.

2. Typical values a re at V CC = 5.0V, +25°C ambient.

3. Not more than one output should be shorted at one ti m e. Duration of t he test should not exceed one sec ond.

4. Duration of the condi tion can not exceed one second.

5. The test l i m i t for t hi s parameter is ±5µA at TA = -55°C.

OUTPUT DRIVE CHARACTERISTICS

Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit

IOOutput Drive Current VCC = Max., VO = 2.5V(3) –50 — –180 mA

VOH Output HIGH Voltage V CC = Min. IOH = –3mA 2.5 3.5 — V

VIN = VIH or VIL IOH = –12mA MIL. 2.4 3.5 — V

IOH = –15mA COM’L.

IOH = –24mA MIL. 2 3 — V

IOH = –32mA COM’L.(4)

VOL Output LOW Voltage V CC = Min. IOH = 48mA MIL. — 0.2 0.55 V

VIN = VIH or VIL IOH = 64mA COM’L

IOFF Input/Output Power Off Leakage(5) V CC = 0V, VIN or VO ≤ 4.5V — — ±1 µA

MILITARY AND COMMERCIAL TEMPERATURE RANGES

IDT54/74FCT16827AT/BT/CT/ET

FAST CMOS 20-BIT BUFFER

POWER SUPPLY CHARACTERISTICS

Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit

∆ICC Quiescent Power Supply Current

TTL Inputs HIGH VCC = Max.

VIN = 3.4V(3) —0.51.5mA

CCD Dynamic Power Supply Current(4) VCC = Max.

Outputs Open

xOE1 = xOE2 = GND

One Input Toggling

50% Duty Cycle

VIN = VCC

VIN = GND — 60 100 µA/

MHz

ICTotal Power Supply Current(6) VCC = Max.

Outputs Open

fi = 10MHz

VIN = VCC

VIN = GND —0.61.5mA

50% Duty Cycle

xOE1 = xOE2 = GND

One Bit Toggling

VIN = 3.4V

VIN = GND —0.92.3

CC = Max.

Outputs Open

fi = 2.5MHz

VIN = VCC

VIN = GND —35.5

(5)

50% Duty Cycle

xOE1 = xOE2 = GND

Twenty Bits Toggling

VIN = 3.4V

VIN = GND — 8 20.5(5)

NOTES:

1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25°C ambient.

3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.

4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.

5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.

6. IC = IQUIESCENT + IINPUTS + IDYNAMIC

IC = ICC + ∆ICC DHNT + ICCD (fCPNCP/2 + fiNi)

ICC = Quiescent Current (ICCL, ICCH and ICCZ)

∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)

DH = Duty Cycle for TTL Inputs High

NT = Number of TTL Inputs at DH

ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)

fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)

NCP = Number of Clock Inputs at fCP

fi = Input Frequency

Ni = Number of Inputs at fi

IDT54/74FCT16827AT/BT/CT/ET

FAST CMOS 20-BIT BUFFER MILITARY AND COMMERCIAL TEMPERATURE RANGES

SWITCHING CHARACTERISTICS OVER OPERATING RANGE

FCT16827AT FCT16827BT

Com'l. Mil. Com'l. Mil.

Symbol

Parameter Condition(1) Min.(2) Max.Min.(2) Max.Min.(2) Max.Min.(2) Max.Unit

tPLH

tPHL Propagation Delay

xAx to xYx CL = 50pF

RL = 500Ω1.5 8 1.5 9 1.5 5 1.5 6.5 ns

CL = 300pF(4)

RL = 500Ω1.5 15 1.5 17 1.5 13 1.5 14

tPZH

tPZL Output Enable Time

xOEx to xYx CL = 50pF

RL = 500Ω1.5 12 1.5 13 1.5 8 1.5 9 ns

CL = 300pF(4)

RL = 500Ω1.5 23 1.5 25 1.5 15 1.5 16

tPHZ

tPLZ Output Disable Time

xOEx to xYx CL = 5pF(4)

RL = 500Ω1.5 9 1.5 9 1.5 6 1.5 7 ns

CL = 50pF

RL = 500Ω1.5 10 1.5 10 1.5 7 1.5 8

tSK(o) Output Skew(3) — 0.5 — 0.5 — 0.5 — 0.5 ns

FCT16827CT FCT16827ET

Com'l. Mil. Com'l. Mil.

Symbol

Parameter Condition(1) Min.(2) Max.Min.(2) Max.Min.(2) Max.Min.(2) Max.Unit

tPLH

tPHL Propagation Delay

xAx to xYx CL = 50pF

RL = 500Ω1.5 4.4 1.5 5 1.5 3.2 — — ns

CL = 300pF(4)

RL = 500Ω1.5 10 1.5 11 1.5 7 — —

tPZH

tPZL Output Enable Time

xOEx to xYx CL = 50pF

RL = 500Ω1.5 7 1.5 8 1.5 4.8 — — ns

CL = 300pF(4)

RL = 500Ω1.5 14 1.5 15 1.5 9 — —

tPHZ

tPLZ Output Disable Time

xOEx to xYx CL = 5pF(4)

RL = 500Ω1.5 5.7 1.5 6.7 1.5 4 — — ns

CL = 50pF

RL = 500Ω1.5 6 1.5 7 1.5 4 — —

tSK(o) Output Skew(3) — 0.5 — 0.5 — 0.5 — — ns

NOTES:

1. See test circuit and waveforms.

2. Minimum limits are guaranteed but not tested on Propagation Delays.

3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.

4. This condition is guaranteed but not tested.

MILITARY AND COMMERCIAL TEMPERATURE RANGES

IDT54/74FCT16827AT/BT/CT/ET

FAST CMOS 20-BIT BUFFER

Pulse

Generator

D.U.T.

VCC

VIN

VOUT

50pF 500Ω

500Ω

7.0V

1.5V

DATA

INPUT

TIMI NG

INPUT

ASYNCHRONO US CONTROL

PRESET

CLEAR

ETC.

SYNCHRONOU S CONTROL

tSU tH

tREM

tSU tH

PRESET

CLEAR

CLOCK ENABLE

ETC.

HIGH-LOW-HIGH

PULSE

LOW-HIGH-LOW

PULSE

1.5V

SAME PHASE

INPUT TRANSITION

1.5V

VOH

tPLH

OUTPUT

OPPOSITE PHASE

INPUT TRANSITION

1.5V

tPLH tPHL

tPHL

VOL

CONTROL

INPUT

1.5V

3.5V

OUTPUT

NORMALLY

LOW

OUTPUT

NORMALLY

HIGH

SWITCH

CLOSED

SWITCH

OPEN

VOL

0.3V

tPLZ

tPZL

tPZH tPHZ

3.5V

1.5V

ENABLE DISABLE

VOH

TEST CIRCUITS AND WAVEFORMS

PROPAGATION DELAY

TEST CIRCUITS FOR ALL OUTPUTS

ENABLE AND DISABLE TIMES

SET-UP, HOLD, AND RELEASE TIMES PULSE WIDTH

SWITCH POSITION

Test Switch

Open Drain

Disable Low Closed

Enable Low

All Other Tests Open

5v16-link

DEFINITIONS:

CL = Load capacit ance: i ncludes jig and probe capaci tance.

RT = Termination resistance: shoul d be equal t o ZOUT of the Pulse

Generator.

NOTES:

1. Diagram s hown for input Cont rol Enable-LOW and input Control

Disable-HIGH.

2. Puls e Generator for A l l Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.

IDT54/74FCT16827AT/BT/CT/ET

FAST CMOS 20-BIT BUFFER MILITARY AND COMMERCIAL TEMPERATURE RANGES

CORPORATE HEADQUARTERS for SALES:

2975 Stender Way 800-345-7015 or 408-727-6116

Santa Clara, CA 95054 fax: 408-492-8674

www.idt.com*

*To search for sales office near you, please click the sales button found on our home page or dial the 800# above and press 2.

The IDT logo is a registered trademark of Integrated Device Technology, Inc.

ORDERING INFORMATION

ID T XX

Temp. Range XXXX

D evice Typ e X

Package X

Process

74 – 55 °C to +125°C

– 40 °C to +85°C

Blank

827AT

827BT

827CT

827ET

Commercial

MIL-STD -883, Class B

Shrink Sm all Outline Package (SO5 6-1)

Thin Shrink Sm all O utline Pa ckage (SO56-2)

Thin Very Sm all Outline P ackage (SO 56-3)

CERPACK (E56-1)

20-Bit Buffer

FCT XX

Family

16 Doub le-Density 5 Volt High Drive