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IDT74FCT162373AT/CT/ET
FAST CMOS 16-BIT TRANSPARENT LATCH INDUSTRIAL TEMPERATURE RANGE
JUNE 2002
IDT74FCT162373AT/CT/ET
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS 16-BIT
TRANSPARENT
LATCH
DESCRIPTION:
The FCT162373T 16-bit transparent D-type latch is built using advanced
dual metal CMOS technology. This high-speed, low-power latch is ideal for
temporary storage of data. It can be used for implementing memory address
latches, I/O ports, and bus drivers. The Output Enable and Latch Enable controls
are organized to operate each device as two 8-bit latches, or one 16-bit latch.
Flow-through organization of signal pins simplifies layout. All inputs are designed
with hysteresis for improved noise margin.
The FCT162373T has balanced output drive with current limiting resistors.
This offers low ground bounce, minimal undershoot, and controlled output fall
times–reducing the need for external series terminating resistors. The
FCT162373T is a plug-in replacement for the FCT16373T and ABT16373 for
on-board interface applications.
2O1
2OE
2LE
2D1
TO SEVEN OTHER CHANNELS
C
D
1OE
1LE
1O1
1D1
TO SEVEN OTHE R CHA NNE LS
C
D
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
© 2002 Integrated Device Technology, Inc. DSC-5455/3
FEATURES:
0.5 MICRON CMOS Technology
High-speed, low-power CMOS replacement for ABT functions
Typical tSK(o) (Output Skew) < 250ps
Low input and output leakage
1µA (max.)
•VCC = 5V ±10%
Balanced Output Drivers: ±24mA
Reduced system switching noise
Typical VOLP (Output Ground Bounce) < 0.6V at VCC = 5V,
TA = 25°C
Available in SSOP and TSSOP packages
FUNCTIONAL BLOCK DIAGRAM
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INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162373AT/CT/ET
FAST CMOS 16-BIT TRANSPARENT LATCH
SSOP/ TSSOP
TOP VIEW
PIN CONFIGURATION
1O1
GND
1O3
VCC
1OE
GND
2O2
GND
VCC
GND
1O2
1O4
1O5
1O6
1O7
1O8
2O1
2O3
2O4
2O5
2O7
2O8
2O6
2OE
1LE
1D1
1D2
GND
1D3
1D4
VCC
1D5
1D6
1D7
1D8
2D1
2D2
2D3
2D4
VCC
2D5
2D7
2D8
2D6
2LE
GND
GND
GND
39
29
30
31
32
33
34
35
36
37
38
25
26
27
28
48
47
41
42
43
44
45
46
40
1
2
3
4
5
6
7
8
9
10
12
13
14
15
16
17
18
19
20
11
21
22
23
24
Symbol Description Max Unit
VTERM(2) Terminal Voltage with Respect to GND –0.5 to +7 V
VTERM(3) Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V
TSTG Storage Temperature –65 to +150 °C
IOUT DC Output Current –6 0 t o +120 mA
ABSOLUTE MAXIMUM RA TINGS(1)(1)
(1)(1)
(1)
NOTES:
1 . Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXX Output and I/O terminals.
3. Output and I/O terminals terminals for FCT162XXX.
Symbol Parameter(1) Conditions Typ. Max. Unit
CIN Input Capacitance VIN = 0V 3.5 6 pF
COUT Output Capacitance VOUT = 0V 3.5 8 pF
CAPA CITANCE (TA = +25°C, F = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
Pin Names Description
xDx Data Inputs
xLE Latch Enable Input (Active HIGH)
xOE Outputs Enable Input (Active LOW)
xOx 3-State Outputs
PIN DESCRIPTION
NOTE:
1 . H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High-Impedance
Inputs Outputs
xDx xLE xOE xOx
HHLH
LHLL
XXHZ
FUNCTION TABLE(1)
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IDT74FCT162373AT/CT/ET
FAST CMOS 16-BIT TRANSPARENT LATCH INDUSTRIAL TEMPERATURE RANGE
Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit
VIH Input HIGH Level Guaranteed Logic HIGH Level 2 V
VIL Input LOW Level Guaranteed Logic LOW Level 0.8 V
IIH Input HIGH Current (Input pins)(5) VCC = Max. VI = VCC ——±A
Input HIGH Current (I/O pins)(5) ——±1
IIL Input LOW Current (Input pins)(5) VCC = Max. VI = GND ±A
Input LOW Current (I/O pins)(5) ——±1
IOZH High Impedance Output Current VCC = Max. VO = 2.7V ±A
IOZL (3-State Output pins)(5) VO = 0.5V ±1
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA –0.7 –1.2 V
IOS Short Circuit Current VCC = Max., VO = GND(3) –80 –140 –250 mA
VHInput Hysteresis 100 m V
ICCL Quiescent Power Supply Current VCC = Max. 5 500 µA
ICCH VIN = GND or VCC
ICCZ
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±10%
Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit
IODL Output LOW Current VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3) 60 115 200 mA
IODH Output HIGH Current VCC = 5V, VIN = VIH or VIL, VO = 1.5V(3) –60 –115 –200 mA
VOH Output HIGH Voltage VCC = Min IOH = –24mA 2 . 4 3 .3 V
VIN = VIH or VIL
VOL Output LOW Voltage VCC = Min IOL = 24mA 0.3 0.55 V
VIN = VIH or VIL
OUTPUT DRIVE CHARACTERISTICS
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5 . The test limit for this parameter is ±5µA at TA = –55°C.
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INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162373AT/CT/ET
FAST CMOS 16-BIT TRANSPARENT LATCH
Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit
ICC Quiescent Power Supply Current VCC = Max. 0.5 1.5 mA
TTL Inputs HIGH VIN = 3.4V(3)
ICCD Dynamic Power Supply VCC = Max. VIN = VCC 60 100 µA/
Current(4) Outputs Open VIN = GND M Hz
xOE = GND
One Input Togging
50% Duty Cycle
ICTotal Power Supply Current(6) VCC = Max. VIN = VCC 0.6 1.5 mA
Outputs Open VIN = GND
fi = 10MHz
50% Duty Cycle VIN = 3.4V 0.9 2.3
xOE = GND VIN = GND
xLE = VCC
One Bit Togging
VCC = Max. VIN = VCC 2.4 4.5(5)
Outputs Open VIN = GND
fi = 2.5MHz
50% Duty Cycle
xOE = GND VIN = 3.4V 6.4 16.5(5)
xLE = VCC VIN = GND
Sixteen Bits Togging
POWER SUPPLY CHARACTERISTICS
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
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IDT74FCT162373AT/CT/ET
FAST CMOS 16-BIT TRANSPARENT LATCH INDUSTRIAL TEMPERATURE RANGE
74FCT162373AT 74FCT162373CT 74FCT162373ET
Symbol Parameter Condition(1) Min.(2) Max. Min.(2) Max. Min.(2) Max. Unit
tPLH Propagation Delay CL = 50pF 1.5 5.2 1.5 4.2 1.5 3.4 ns
tPHL xDx to xOx RL = 500
tPLH Propagation Delay 2 8.5 2 5.5 1.5 3.7 ns
tPHL xLE to xOx
tPZL Output Enable Time 1.5 6.5 1.5 5.5 1.5 4.4 ns
tPZH
tPHZ Output Disable Time 1.5 5.5 1.5 5 1.5 3.6 ns
tPLZ
tSU Set-up Time HIGH or LOW, xDx to xLE 2 2 1 ns
tHHold Time HIGH or LOW, xDx to xLE 1.5 1.5 1 ns
tWxLE Pulse Width HIGH 5 5 3(4) —ns
tSK(o) Output Skew(3) 0.5 0.5 0.5 ns
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
4. This limit is guaranteed but not tested.
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INDUSTRIAL TEMPERATURE RANGE
IDT74FCT162373AT/CT/ET
FAST CMOS 16-BIT TRANSPARENT LATCH
Pulse
Generator
RT
D.U.T.
VCC
VIN
CL
VOUT
50pF 500
500
7.0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
tSU tH
tREM
tSU tH
PRESET
CLEAR
CLOC K ENABLE
ETC.
HIGH-LOW-HIGH
PULSE
LOW-HIGH-LOW
PULSE
tW
1.5V
1.5V
SAM E PHASE
INPU T TRANSITIO N
3V
1.5V
0V
1.5V
VOH
tPLH
OUTPUT
OPPO SITE PHASE
INPU T TRANSITIO N
3V
1.5V
0V
tPLH tPHL
tPHL
VOL
CONTROL
INPUT
3V
1.5V
0V
3.5V
0V
OUTPUT
NORMALLY
LOW
OUTPUT
NORMALLY
HIGH
SWITCH
CLOSED
SWITCH
OPEN
VOL
0.3V
0.3V
tPLZtPZL
tPZH tPHZ
3.5V
0V
1.5V
1.5V
ENABLE DISABLE
VOH
TEST CIRCUITS AND WAVEFORMS
Propagation Delay
Test Circuits for All Outputs
Enable and Disable Times
Set-up, Hold, and Release Times
Pulse Width
Test Switch
Open Drain
Disable Low Closed
Enable Low
All Other Tests Open
SWITCH POSITION
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns.
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IDT74FCT162373AT/CT/ET
FAST CMOS 16-BIT TRANSPARENT LATCH INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT XX
Temp. Range XXXX
Device Type XX
Package
PV
PA Shrink Small Outline Package
Thin Shrink Small Outline Package
16-Bit T rans parent Latch
74 40°C to +85°C
162 Double-Density, 5 Vo lt, B a lan ced Dr ive
FCT XXX
Family
373AT
373CT
373ET
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2975 Stender Way 800-345-7015 or 408-727-6116 logichelp@idt.com
Santa Clara, CA 95054 fax: 408-492-8674 (408) 654-6459
www.idt.com
3/26/2002 Removed standard speed grade
4/18/2002 Switching Cha. table
6/20/2002 Updated as per PDNs Logic-00-07 and Logic-01-04
DATA SHEET DOCUMENT HISTORY