ZXMN10A11G
SEMICONDUCTORS
ISSUE 5 - DECEMBER 2004
4
PARAMETER SYMBOL MIN. TYP. MAX. UNIT CONDITIONS
STATIC
Drain-source breakdown voltage V(BR)DSS 100 V ID=250A, VGS=0V
Zero gate voltage drain current IDSS 1AV
DS=100V, VGS=0V
Gate-body leakage IGSS 100 nA VGS=±20V, VDS=0V
Gate-source threshold voltage VGS(th) 2.0 4.0 V ID=250A, VDS=V
GS
Static drain-source On-State resistance (1) RDS(on) 0.35
0.45 ⍀
⍀
VGS=10V, ID=2.6A
VGS=6V, ID=1.3A
Forward transconductance (3) gfs 4SV
DS=15V,ID=2.6A
DYNAMIC (3)
Input capacitance Ciss 274 pF VDS=50V,V
GS=0V,
f=1MHz
Output capacitance Coss 21 pF
Reverse transfer capacitance Crss 11 pF
SWITCHING(2) (3)
Turn-on delay time td(on) 2.7 ns
VDD =50V, ID=1A
RG≅6.0⍀,V
GS=10V
Rise time tr1.7 ns
Turn-off delay time td(off) 7.4 ns
Fall time tf3.5 ns
Gate charge Qg3nCV
DS=50V, VGS=5V,
ID=2.5A
Total gate charge Qg5.4 nC VDS=50V,VGS=10V,
ID=2.5A
Gate-source charge Qgs 1.4 nC
Gate-drain charge Qgd 1.5 nC
SOURCE-DRAIN DIODE
Diode forward voltage (1) VSD 0.85 0.95 V TJ=25°C, IS=1.85A,
VGS=0V
Reverse recovery time (3) trr 26 ns TJ=25°C, IF=1.0A,
di/dt= 100A/μs
Reverse recovery charge (3) Qrr 30 nC
ELECTRICAL CHARACTERISTICS (at TA = 25°C unless otherwise stated)
NOTES:
(1) Measured under pulsed conditions. Width ≤300μs. Duty cycle ≤2% .
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.