1. Product profile
1.1 General description
The X3G-OH047, X3G-OH048, X3T-OH047 and X3T-OH048 ar e sensitive magnetic field
sensors, employing the magneto-resistive effect of thin film permalloy. The sensors
contain two parallel supplied Wheatstone bridges at a relative angle of 45 to each other.
A rotating magnetic field in the surface parallel to the chip (x-y plane) will deliver two
independent sinusoidal output signals, one following a cos(2) and the other following
asin(2) function, being the angle between sensor and field direction (see Figure 5 and
Figure 6).
The X3G-OH047, X3G-OH048, X3 T-OH047 and X3T-OH048 are suited for high precision
angle measurement applications under low field conditions (saturation field strength
25 kA/m).
The sensors can be operated at any frequency between DC and 1 MHz.
All type numbers shown in this data sheet are valid for a single-die (single sensor).
The double-die has two magnetic field sensors with electrical and magnetic parameters
which fulfill the specified single-die values and do not correlate to each other.
X3G-OH047; X3T-OH047;
X3G-OH048; X3T-OH048
Magnetic field sensor
Rev. 1 — 4 April 2011 Product specification
Table 1. Product overview
Type number Sensor Packing
X3G-OH047 double-die sawn wafer; on foil
X3G-OH048 single-die sawn wafer; on foil
X3T-OH047 double-die taped on reel
X3T-OH048 single-die taped on reel
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 2 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
1.2 Features and benefits
Accurate and reliable angle measurement
Mechanical robustness, contactless principle
Wear-free opera tion
Accuracy independent of mechanical tolerances
Extended temperature range
1.3 Applications
KMZ44 is an internal name which is visible on the die
Fig 1. Sensor die
001aan663
Steering angle and torsion Window wipers
Headlight adjustment Fuel level
Motor positioning Mirror position ing
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 3 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
1.4 Quick reference data
[1] Applicable for bridge 1 and bridge 2.
[2] VM=VO(max) Voffset. Periodicity of VM: sin (2) and cos(2), respectively.
[3]
[4] Bridge resistance between pad 5 to pad 1 and pad 4 to pad 2.
2. Pinning information
Table 2. Quick reference data
Tamb =25
C; Hext =25kA/m; V
CC = 5 V; unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
VCC supply voltage - 5 9 V
VMpeak voltage see Figure 3 [1][2] 60 67 75 mV
Voffset offset voltage per supply voltage;
see Figure 3 [1] 2- +2mV/V
TCV(offset) offset voltage
temperature
coefficient
per supply voltage;
Tamb =40 C to +150 C;
see Figure 3
[1][3] 2- +2(V/V)/K
Rbridge bridge resistance [1][4] 2.7 3.2 3.7 k
TCV offset
Voffset at 150 CVoffset at 40C
150 C40C
--------------------------------------------------------------------------------------------------
=
Table 3. Pinning
Pad Symbol Description Simplified outline
1 ON1 output voltage bridge 1
2 ON2 output voltage bridge 2
3 GND common ground
4 OP2 output voltage bridge 2
5 OP1 output voltage bridge 1
6V
CC common bridge supply voltage
1
23
6
5
4
001aan662
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 4 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
3. Ordering information
4. Circuit diagram
5. Limiting values
[1] Minimum stimulating magnetic field parallel to the chip surface (x-y plane) to achieve specified angular
accuracy.
Table 4. Orderin g information
Type number Package
Name Description Version
X3G-OH047 bare die double-die; sawn wafer; on foil OL-X3G-OH047
X3G-OH048 bare die single-die; sawn wafer; on foil OL-X3G-OH048
X3T-OH047 bare die double-die; taped on reel OL-X3T-OH047
X3T-OH048 bare die single-die; taped on reel OL-X3T-OH048
Fig 2. Device and test circu i t dia gram
008aaa264
V
CC
V
CC
V
OP1
V
O1
V
ON1
V
OP2
V
O2
V
ON2
OP1 GND ON1
cos
R12
R14R13
R11
bridge 1
X3G-OH047/8; X3T-OH047/8
OP2 ON2
sin
R22
R24R23
R21
bridge 2
V V V V
V V
Table 5. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
VCC supply voltage - 9 V
Hext external magnetic field strength [1] 25 - kA/m
Tamb ambient temperature 40 +150 C
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 5 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
6. Characteristics
[1] Minimum stimulating magnetic field parallel to the chip surface (x-y plane) to achieve angular inaccuracy.
[2] Applicable for bridge 1 and bridge 2.
[3] VM=VO(max) Voffset. Periodicity of VM: sin(2) and cos(2), respectively.
[4]
[5] Bridge resistance between pad 5 to pad 1 and pad 4 to pad 2.
[6]
[7]
[8]
[9]
[10]
[11] ; Voffset = 0 V; inaccuracy of angular measurement due to deviations from ideal sinusoidal characteristics,
calculated from the third and fifth harmonics of the spectrum VO.
Table 6. Characteristics
Tamb =25
C; Hext =25kA/m
[1]; VCC = 5 V; unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
VCC supply voltage - 5 9 V
VMpeak voltage see Figure 3 [2][3] 60 67 75 mV
TCVM peak voltage temperature
coefficient Tamb =40 C to +150 C[2][4] 0.30 0.36 0.42 %/K
Rbridge bridge resistance [2][5] 2.7 3.2 3.7 k
TCR(bridge) bridge resistance
temperature coefficient Tamb =40 C to +150 C[2][6] 0.24 0.27 0.29 %/K
Voffset offset voltage per supply voltage;
see Figure 3 [2] 2- +2mV/V
TCV(offset) offset voltage temperature
coefficient per supply voltage;
Tamb =40 C to +150 C;
see Figure 3
[2][7] 2- +2(V/V)/K
Vo(hys) hyster esi s ou tp u t vol tage see Figure 4 [2][8] 0 0.050.18%FS
angular velocity 0 - 1 MHz
k amplitude synchronism [9] 98.9 100 101.1 %
TCkamplitude synchronism
temperature coefficient Tamb =40 C to +150 C[10] 0.01 0 +0.01 %/K
 angular inaccuracy [11] 0 0.05 0.1 deg
TCVM VMat 150 CVMat 40C
VMat 25 C150 C40C
---------------------------------------------------------------------------------------------
=
TCRbridge
Rbridge at 150 CRbridge at 40C
Rbridge at 25 C150 C40C
-------------------------------------------------------------------------------------------------------
=
TCV offset
Voffset at 150 CVoffset at 40C
150 C40C
--------------------------------------------------------------------------------------------------
=
Vohys1VO1 67.513545VO1 67.545135
2V
M1
---------------------------------------------------------------------------------------------------------------------------
=
Vohys2VO2 22.5900 VO2 22.5090
2V
M2
---------------------------------------------------------------------------------------------------------------
=
TCkkat 150 Ckat 40C
kat 25 C150 C40C
----------------------------------------------------------------------------------------
=
 real meas
=
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 6 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
Fig 3. Output signals rela ted to the direction of the magnetic field
Fig 4. Definition of hysteresis
008aaa265
0
VO
(mV)
Voffset2 0
90 180 360
270
α (deg)
VO2
VM2
VO1
008aaa266
α (deg)
0 1359045
0
VO
(mV) Vo(hys)2
VO1 VO2
Vo(hys)1
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 7 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
7. Bare die outline
Fig 5. Bare die outline (singl e die)
Table 7. Mechanical dime nsions for Figure 5
Symbol Parameter x y Radius/diameter Unit
LD die size 1150 1150 - m
LS sawing lane width 60 60 - m
RP reading point position 575 642 - m
RS sensitive area radius - - 480 m
PD pad diameter - - 110 m
1 position pad 1 108 230 - m
2 position pad 2 243 125 - m
3 position pad 3 489 95 - m
4 position pad 4 632 95 - m
5 position pad 5 900 125 - m
6 position pad 6 1032 200 - m
001aan691
1
2
345
6
α
x = 0,
y = 0
RPy
LSy
LDy
PD
RPx
LDx
Hext
x
y
R13
R12
R11
R14
R22 R21
R24 R23
LSx
bridge 1 (cos)
RS
bridge 2 (sin)
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 8 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
Fig 6. Bare die outline (double die)
001aan692
x = 0,
y = 0
RPy
LSy
LDy
PD
RP1x
RP2x
LDx
bridge 1 (cos)
bridge 2 (sin)
LSx
Hext
x
y
α
1
2
345
67
8
910 11
12
R13
R12
R11
R14
R22 R21
R24 R23
RS
Table 8. Mechanical dimensions for Figure 6
Symbol Parameter xyRadius/diameter Unit
LD die size 2360 1150 m
LS sawing lane width 60 60 m
RP1 reading point po sition 1 575 642 m
RP2 reading point po sition 2 1785 642 m
RS sensitive area radius - - 480 m
PD pad diameter - - 110 m
1 position pad 1 108 230 m
2 position pad 2 243 125 m
3 position pad 3 489 95 m
4 position pad 4 632 95 m
5 position pad 5 900 125 m
6 position pad 6 1032 200 m
7 position pad 7 1318 230 m
8 position pad 8 1453 125 m
9 position pad 9 1699 95 m
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 9 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
8. Packing information
8.1 Tape construction for X3G-OH047 and X3G-OH048
10 position pad 10 1842 95 m
11 position pad 11 2110 125 m
12 position pad 12 2242 200 m
Table 8. Mechanical dimensions for Figure 6 …continued
Symbol Parameter xyRadius/diameter Unit
Table 9. Wafer dimensions
Symbol Parameter Value Unit
WD wafer diameter 150 mm
WT wafer thickness 380 15 m
Fig 7. Tape cons truc tion
019aab732
liner (PET)
adhesive (acrylic)
base film (PE)
(38 μm)
(10 μm)
(65 μm)
Table 10. Material composition
Parameter Content Typical value Unit
Tot al thickness - 75 m
Adhesion - 55 / 20 g/mm
Ionic impurity Na+0.027 g/ml
K+<0.004 g/ml
Cl 0.045 g/ml
xxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxx x x x xxxxxxxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxx xx xx xxxxx
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xxxxxxxxxxxxxxxxxxxxxxxxx xxxxxxxxxxxxxxxxxxxx xxx
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 10 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
Fig 8. Geometrical dimensions of frame
019aab727
B
Ø195
Ø3.175 h6 (2×) R (2×)
Ø227 -0.5
0
216
B01
ejector marks and sprue marks on this side
below the surface min 0.05 max 0.2
79.42
4 ±0.3
71.5 ±0.3
148
2
216
1B
R1 max
0.8
A
60°
20 +2
02.5 +0.05
0
30°
30°
A
1
B
0.2
0.2
B0.2
B2
B0.2
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 11 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
Fig 9. Film Frame Carrie r (FFC) with barcode label
019aab728
for example 69594.030
The barcode label consists of several numbers which are
explained below:
The first digits of the barcode show the batch number
The last three digits of the barcode show the wafer number
for example 69594.030
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 12 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
Fig 10. Wafer position to frame and double die position to wafer
019aab731
Wafer position to frame
double die parallel to flat
flat
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 13 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
8.2 Carrier tape for X3T-OH047 and X3T-OH048
Fig 11. Tape outline, carrier tape X3T-OH048
Table 11. Dimensions for Figure 11Tape outline, carrier tape X3T-OH048
Item Symbol Specification
Dimension [mm] Tolerance
Overall dimensions
Tape width W 8 0.1
Thickness K 1.2 -
Distance G 0.75 -
Sprocket holes
Diameter D01.5 0.1
Distance E 1.75 0.1
Pitch[1] P040.1
Distance between center lines
Length direction P220.05
Width direction F 3.5 0.05
Compartments
Length A01.4 0.05
Width B01.4 0.05
Depth K00.8 0.05
Hole diameter D10.5 0.1
Pitch P 4 0.1
Device
Outline X3T-OH048
Rotation 20-
Carrier tape antistatic
Film thickness[2] T0.25 0.07
019aab730
W1
B
feed direction
position of pad 1
W
FB
E A-A
K
B-B
AA0D1
P
Θ
AD
0
P0
P2
K0
T1
T
G
B0
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 14 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
[1] Cumulate pitch error 0.2 over 10 pitch.
[2] Carbon loaded polystyrene 100 % recyclable.
Cover tape
Width W15.75 -
Film thickness T10.1 -
Bending radius
In winding direction R 30 -
Fig 12. Tape outline, carrier tape X3T-OH047
Table 12. Dimen sions for Figure 12 “Tape outline, carrier tape X3T-OH047
Item Symbol Specification
Dimension [mm] Tolerance
Overall dimensions
Tape width W 8 0.1
Distance G 0.75 -
Sprocket holes
Diameter D01.5 0.1
Distance E 1.75 0.1
Pitch[1] P040.1
Table 11. Dimensions for Figure 11Tape outline, carrier tape X3T-OH048 …continued
Item Symbol Specification
Dimension [mm] Tolerance
T
T1
K0
W1
A
P1
P2/P3
D1
B
W
AD
0
P0
δ
δ
detail Z
50:1
section
B-B
measurement method of
compartment dimensions
section
A-A
pad 1
feed direction 019aab729
B
G
F0/F2
B0
A0
Z
E
D
Θ
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 15 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
[1] Cumulate pitch error 0.2 over 10 pitch.
[2] Carbon loaded polystyrene 100 % recyclable.
Distance between center lines
Sprocket hole / cavity center P220.05
Sprocket hole / cavity hole P320.05
Sprocket hole / cavity center F03.5 0.05
Sprocket hole / cavity hole F23.5 0.05
Compartments
Length A01.4 0.05
Width overall B02.7 0.05
Depth K00.5 0.05
Hole diameter D10.5 0.1
Pitch P140.1
Device
Outline X3T-OH047
Rotation 15-
Carrier tape antistatic
Film thickness[2] T0.25 0.07
Bend 0.3 -
Cover tape
Width W15.3 0.1
Film thickness T10.05 0.01
Bending radius
In winding direction R 30 -
Table 12. Dimen sions for Figure 12 “Tape outline, carrier tape X3T-OH047 …continued
Item Symbol Specification
Dimension [mm] Tolerance
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 16 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
9. Revision history
Fig 13. Chip position and pad 1 location for X3T-OH048
Fig 14. Chip position and pad 1 location for X3T-OH047
019aab734
pad 1
W
B
0
P
1
diagonale
A
0
D
0
P
10
K
0
P
0
T
camber P
2
/P
3
D
1
E
1
F
0
/F
2
019aab733
pad 1
Table 13. Revision history
Document ID Release date Data sheet status Change notice Supersedes
X3G_T_OH047_048 v.1 20110404 Product specification - -
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 17 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
10. Legal information
10.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of de vice(s) descr ibed in th is docume nt may have cha nged since this docume nt was publis hed and ma y dif fer in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
10.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not be rel ied u pon to cont ain det ailed and
full information. For detailed and full informatio n see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall pre vail.
Product specificat io nThe information and data provided in a Product
data sheet shall define the specification of the product as agr eed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to off er functions and qualities beyond those described in the
Product data sheet.
10.3 Disclaimers
Limited warr a nty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequ ential damages (including - wit hout limitatio n - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ ag gregate and cumulative l iability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all informa tion supplied prior
to the publication hereof .
Suitability for use in automotive applications — This NXP
Semiconductors product has been qualified for use in automotive
applications. The product is not designed, authorized or warranted to be
suitable for use in medical, military, aircraft, space or life support equipment,
nor in applications where failure or malf unction of an NXP Semiconductors
product can reasonably be expected to result in personal injury, death or
severe property or environment a l damage. NXP Semiconductors accepts no
liability for inclusion and/or use of NXP Semiconductors products in such
equipment or applications and therefore such inclusion and/or use is at the
customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty tha t such application s will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and ope ration of their applications
and products using NXP Semiconductors product s, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suit able and fit for the custome r’s applications and
products planned, as well as fo r the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with t heir
applications and products.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessa ry
testing for th e customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by cust omer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanent ly and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individua l agreement. In case an individual
agreement is concluded only the ter ms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
No offer to sell or license — Nothing i n this document may be interpreted or
construed as an of fer t o sell product s that is open for accept ance or t he grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property right s.
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contains data from the objective specification for product development.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.
Product [short] dat a sheet Production This document contains the product specification.
X3G_T_OH047_048 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product specification Rev. 1 — 4 April 2011 18 of 19
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization fro m national authorities.
Quick reference data The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
10.4 Trademarks
Notice: All referenced b rands, produc t names, service names and trademarks
are the property of their respect i ve ow ners.
11. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
NXP Semiconductors X3G-OH047/8; X3T-OH047/8
Magnetic field sensor
© NXP B.V. 2011. All rights reserv ed.
For more information, please visit: http://www.nxp.co m
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 4 April 2011
Document identifier: X3G_T_OH047_048
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
12. Contents
1 Product profile. . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1 General description . . . . . . . . . . . . . . . . . . . . . 1
1.2 Features and benefits. . . . . . . . . . . . . . . . . . . . 2
1.3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
1.4 Quick reference data . . . . . . . . . . . . . . . . . . . . 3
2 Pinning information. . . . . . . . . . . . . . . . . . . . . . 3
3 Ordering information. . . . . . . . . . . . . . . . . . . . . 4
4 Circuit diagram . . . . . . . . . . . . . . . . . . . . . . . . . 4
5 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4
6 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 5
7 Bare die outline . . . . . . . . . . . . . . . . . . . . . . . . . 7
8 Packing information . . . . . . . . . . . . . . . . . . . . . 9
8.1 Tape construction for X3G-OH047 and
X3G-OH048 . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
8.2 Carrier tape for X3T-OH047 and X3T-OH048. 13
9 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 16
10 Legal information. . . . . . . . . . . . . . . . . . . . . . . 17
10.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 17
10.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
10.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 17
10.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 18
11 Contact information. . . . . . . . . . . . . . . . . . . . . 18
12 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19