LMP7701
,
LMP7702
,
LMP7704
SNOSAI9I –SEPTEMBER 2005–REVISED NOVEMBER 2015
www.ti.com
7.3 Recommended Operating Conditions MIN NOM MAX UNIT
Temperature range (1) −40 125 °C
Supply voltage (VS= V+– V−) 2.7 12 V
(1) The maximum power dissipation is a function of TJ(MAX),θJA. The maximum allowable power dissipation at any ambient temperature is
PD= (TJ(MAX) – TA)/ θJA. All numbers apply for packages soldered directly onto a PC Board.
7.4 Thermal Information LMP7701,
LMP7701 LMP7702 LMP7704
LMP7702
DBV D DGK D PW
THERMAL METRIC(1) UNIT
(SOT-23) (SOIC) (VSSOP) (SOIC) (TSSOP)
5 PINS 8 PINS 8 PINS 14 PINS 14 PINS
RθJA Junction-to-ambient thermal resistance (2) 122.9 114.3 167.5 79.9 107.5 °C/W
RθJC(top) Junction-to-case (top) thermal resistance 69.3 59.5 58.7 36.9 33.0 °C/W
RθJB Junction-to-board thermal resistance 63.3 54.8 87.5 34.7 50.4 °C/W
ψJT Junction-to-top characterization parameter 19.4 12.1 6.6 5.5 1.8 °C/W
Junction-to-board characterization
ψJB 62.8 54.2 86.1 34.4 49.7 °C/W
parameter
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report (SPRA953).
(2) The maximum power dissipation is a function of TJ(MAX),θJA. The maximum allowable power dissipation at any ambient temperature is
PD= (TJ(MAX) – TA)/ θJA. All numbers apply for packages soldered directly onto a PC Board.
7.5 Electrical Characteristics 3-V
Unless otherwise specified, all limits are ensured for TA= 25°C, V+= 3 V, V−= 0 V, VCM = V+/2, and RL> 10 kΩto V+/2.(1)
PARAMETER TEST CONDITIONS MIN (2) TYP (3) MAX (2) UNIT
±37 ±200
LMP7701 at the temperature ±500
extremes
VOS Input Offset Voltage μV
±56 ±220
LMP7702/LMP7704 at the temperature ±520
extremes ±1
Input Offset Voltage Temperature
TCVOS See (4) μV/°C
at the temperature
Drift ±5
extremes ±0.2 ±1
See (4) (5) at the temperature
−40°C ≤TA≤85°C ±50
extremes
IBInput Bias Current pA
±0.2 ±1
See (4) (5) at the temperature
−40°C ≤TA≤125°C ±400
extremes
IOS Input Offset Current 40 fA
(1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very
limited self-heating of the device such that TJ= TA. No specification of parametric performance is indicated in the electrical tables under
conditions of internal self-heating where TJ> TA.
(2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
Statistical Quality Control (SQC) method.
(3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(4) This parameter is specified by design and/or characterization and is not tested in production.
(5) Positive current corresponds to current flowing into the device.
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