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©2015 Fairchild Semiconductor Corporation
FDB0170N607L Rev.C
FDB0170N607L N-Channel PowerTrench® MOSFET
Electrical Characteristics TJ = 25 °C unless otherwise noted.
Off Characteristics
On Characteristics (Note 2)
Dynamic Characteristics
Switching Characteristics
Drain-Source Diode Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
BVDSS Drain to Source Breakdown Voltage ID = 250 μA, VGS = 0 V 60 V
ΔBVDSS
ΔTJ
Breakdown Voltage Temperature
Coefficient ID = 250 μA, referenced to 25 °C 13 mV/°C
IDSS Zero Gate Voltage Drain Current VDS = 48 V, VGS = 0 V 1 μA
IGSS Gate to Source Leakage Current VGS = ±20 V, VDS = 0 V ±100 nA
VGS(th) Gate to Source Threshold Voltage VGS = VDS, ID = 250 μA234V
ΔVGS(th)
ΔTJ
Gate to Source Threshold Voltage
Temperature Coefficient ID = 250 μA, referenced to 25 °C -13 mV/°C
rDS(on) Static Drain to Source On Resistance VGS = 10 V, ID = 39 A 1.1 1.4 mΩ
VGS = 10 V, ID = 39 A, TJ= 150°C 1.9 3.5
gFS Forward Transconductance VDS = 10 V, ID = 39 A 159 S
Ciss Input Capacitance VDS = 30 V, VGS = 0 V,
f = 1 MHz
13750 19250 pF
Coss Output Capacitance 3235 4530 pF
Crss Reverse Transfer Capacitance 240 340 pF
RgGate Resistance 2.5 Ω
td(on) Turn-On Delay Time
VDD = 30 V, ID = 39 A,
VGS = 10 V, RGEN = 6 Ω
61 97 ns
trRise Time 64 103 ns
td(off) Turn-Off Delay Time 83 133 ns
tfFall Time 37 60 ns
QgTotal Gate Charge VGS = 0 V to 10 V
VDD = 30 V,
ID = 39 A
173 243 nC
QgTotal Gate Charge VGS = 0 V to 5 V 89 125
Qgs Gate to Source Gate Charge 61 nC
Qgd Gate to Drain “Miller” Charge 26 nC
ISMaximum Continuous Drain to Source Diode Forward Current 300 A
ISM Maximum Pulsed Drain to Source Diode Forward Current 1620 A
VSD Source to Drain Diode Forward Voltage VGS = 0 V, IS = 39 A (Note 2) 0.8 1.2 V
trr Reverse Recovery Time IF = 39 A, di/dt = 100 A/μs 90 144 ns
Qrr Reverse Recovery Charge 95 152 nC
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.
RθJC is guaranteed by design while RθCA is determined by the user's board design.
a) 40 °C/W when mounted on a 1 in2 pad of 2 oz copper.
b) 62.5 °C/W when mounted on a minimum pad of 2 oz copper.
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.
3. EAS of 1109 is based on starting TJ = 25 °C, L = 0.3 mH, IAS = 86 A, VDD = 10V, VGS = 54 V. 100% test at L =0.1 mH, IAS = 124 A.
4. Pulsed Id please refer to Figure “Forward Bias Safe Operating Area” for more details.
5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design.