November 2006 Rev 5 1/35
1
M29F010B
1 Mbit (128Kb x8, unifor m block) single supply Flash memory
Feature summary
Single 5V±10% supply voltage for Program,
Erase and Read operations
Access tim e: 45 ns
Programming time
8 µs per byte typical
8 uniform 16 Kbytes m emo ry blo cks
Program/Erase controller
Embedded byte Program algorithm
Embedded multi-b lock/Chip Erase
algorithm
Status Register Polling and Toggle bits
Erase Susp end and Resume modes
Read and Program another block during
Erase Suspend
Unlock Bypass Program command
Faster Production/Batch programming
Low power consumption
Standby and Automatic Standby
100,000 Program/Erase cycles per block
20 years data retention
Defectivity below 1 ppm/year
Electronic signature
Manufac turer code: 20h
Device code: 20h
ECOPACK® packages available
TSOP32 (N)
8 x 20mm
PLCC32 (K)
www.st.com
Contents M29F010B
2/35
Contents
1 Summary description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2 Signal descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.1 Address Inputs (A0-A16) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.2 Data Inputs/Outputs (DQ0-DQ7) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.3 Chip Enable (E) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.4 Output Enable (G) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.5 Write Enable (W) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.6 VCC supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.7 Vss Ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3 Bus operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.1 Bus Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.2 Bus Write . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.3 Output Disable . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3.4 Standby . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.5 Automatic Standby . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.6 Special bus operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.7 Electronic Signature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
3.8 Block Protection and Blocks Unprotection . . . . . . . . . . . . . . . . . . . . . . . . 12
4 Command interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
4.1 Read/Reset command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
4.2 Auto Select command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
4.3 Program command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.4 Unlock Bypass command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.5 Unlock Bypass Program command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.6 Unlock Bypass Reset command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
4.7 Chip Erase command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.8 Block Erase command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
4.9 Erase Suspend command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
4.10 Erase Resume command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
M29F010B Contents
3/35
5 Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
5.1 Data Polling bit (DQ7) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
5.2 Toggle bit (DQ6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
5.3 Error bit (DQ5) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
5.4 Erase Timer bit (DQ3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
5.5 Alternative Toggle bit (DQ2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
6 Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
7 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
8 Package mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
9 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
10 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
List of tables M29F010B
4/35
List of tables
Table 1. Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Table 2. Uniform block addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Table 3. Bus operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Table 4. Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Table 5. Program Erase times and Program Erase Endurance cycles. . . . . . . . . . . . . . . . . . . . . . . 19
Table 6. Status Register bits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Table 7. Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Table 8. AC measurement conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Table 9. Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Table 10. DC characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Table 11. Read AC characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Table 12. Write AC characteristics, Write Enable controlled . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Table 13. Write AC characteristics, Chip Enable controlled . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Table 14. PLCC32 – 32 lead Plastic Leaded Chip Carrier, package mechanical data. . . . . . . . . . . . 31
Table 15. TSOP32 – 32 lead Plastic Thin Small Outline, 8 x 20mm, package mechanical data . . . . 32
Table 16. Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Table 17. Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
M29F010B List of figures
5/35
List of figures
Figure 1. Logic diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Figure 2. PLCC connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Figure 3. TSOP connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Figure 4. Data Polling flowchart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Figure 5. Data Toggle flowchart. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Figure 6. AC testing Input/Output waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Figure 7. AC testing load circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Figure 8. Read Mode AC waveforms. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Figure 9. Write AC waveforms, Write Enable controlled . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Figure 10. Write AC waveforms, Chip Enable controlled. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Figure 11. PLCC32 – 32 lead Plastic Leaded Chip Carrier, package outline . . . . . . . . . . . . . . . . . . . 31
Figure 12. TSOP32 – 32 lead Plastic Thin Small Outline, 8 x 20mm, package outline . . . . . . . . . . . . 32
Summary description M29F010B
6/35
1 Summary description
The M29F010B is a 1 Mbit (128Kb x8) non-volatile memory that can be read, erased and
reprogrammed. These op erations can be performed using a sing le 5V supply. On powe r-up
the memory defaults to its Read mode where it can be read in the same way as a ROM or
EPROM.
The memory is divided into blocks that can be erased independently so it is possible to
preserve valid data while old data is erased. Each block can be protected independently to
prev ent accidental Prog ram or Erase commands from modifying the memory. Program and
Erase commands are written to the Command Interface of the memory. An on-chip
Program/Erase Controller simplifies the process of programming or erasing the memory by
taking care of all o f the sp ecial operations that are required to upd ate the memory contents.
The end of a program or erase operation can be detected and an y error conditions
identified. The command set required to control the memory is consistent with JEDEC
standards.
Chip Enable, Output Enable and Write Enable signals control the bus operation of the
memory. They allow simple conne ction to most microprocessors, often without additiona l
logic.
The memory is off ered in PLCC32, TSOP32 ( 8 x 20mm) p ac kag es and it is supplied wit h all
the bits erased (set to ’1’).
In order to meet environment al requirements , ST offers the M29F010B in ECOPACK®
packages. ECOPACK packages are Lead-free. The category of second Level Inter connect
is marked on the package and on the inner box label, in compliance with JEDEC Standard
JESD97.
The maximum r atings related to soldering conditions ar e also marked on the inner bo x label.
ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com.
M29F010B Summary description
7/35
Figure 1. Logic diagram
Table 1. Signal names
A0-A16 Address Inputs
DQ0-DQ7 Data Inputs/Outputs
EChip Enable
GOutput Enable
WWrite Enable
VCC Supply voltage
VSS Ground
NCI Not Connected Internally
AI02735
17
A0-A16
W
DQ0-DQ7
VCC
M29F010B
E
VSS
8
G
Summary description M29F010B
8/35
Figure 2. PLCC connections
Figure 3. TSOP connections
AI02737
NC
A13
A10
DQ5
17
A1
A0
DQ0
DQ1
DQ2
DQ3
DQ4
A7
A4
A3
A2
A6
A5
9
W
A8
1
A16
A9
DQ7
A12
A14
32
NC
VCC
M29F010B
A15
A11
DQ6
G
E
25
VSS
A1
A0
DQ0
A7
A4 A3
A2
A6
A5
A13
A10
A8
A9
DQ7
A14
A11 G
E
DQ5
DQ1
DQ2
DQ3
DQ4
DQ6
NC
W
A16
A12
NC
VCC
A15
AI02738
M29F010B
8
1
9
16 17
24
25
32
VSS
M29F010B Summary description
9/35
M
Table 2. Uniform block addresses
# Size (Kbytes) Address range
7 16 1C000h-1FFFFh
6 16 18000h-1BFFFh
5 16 14000h-17FFFh
4 16 10000h-13FFFh
3 16 0C000h-0FFFFh
2 16 08000h-0BFFFh
1 16 04000h-07FFFh
0 16 00000h-03FFFh
Signal descriptions M29F010B
10/35
2 Signal descriptions
See Figure 1: Logic diagram and Table 1: Signal names, for a brief overview of the signals
connected to this device.
2.1 Address Inputs (A0-A16)
The Address Inputs select the cells in the me mory array to access during Bus Read
operations. During Bus Write operations they control the commands sent to the Command
Interface of the internal state machine .
2.2 Data Inputs/Outputs (DQ0-DQ7)
The Data Inputs/Outputs output the data stored at the selected address during a Bus Read
operat ion. During Bus Write operations t hey r epresent the command s sent to the Command
Interface of the internal state machine .
2.3 Chip Enable (E)
The Chip Enable, E, activates the memory, allowing Bus Read and Bus Write operations to
be performed. When Chip Enable is High, VIH, all other pins are ignored.
2.4 Output Enable (G)
The Output Enable, G, controls the Bus Read operation of the memo ry.
2.5 Write Enable (W)
The Write Enab le , W, controls the Bus Write operation of the me mory’s Command Inte rface .
2.6 VCC supply voltage
The VCC Supply Voltage supplies the power for all operations (Read, Program, Erase etc.).
The Command Interface is disabled when the VCC Supply Voltage is less than the Lockout
Voltage , VLKO. This prevents Bus Write operations from accidentally damaging the data
during pow er up, power down and power surges. If the Prog ram/Erase Cont roller is
progr amming or erasin g during this time then th e operation abo rts and the memory contents
being altered will be invalid.
A 0.1µF capacitor should be connected between the VCC Supply Voltage pin and the VSS
Ground pin to decouple the current surges from the power supply. The PCB trac k widths
must be sufficient to carry the currents required during program and erase operations, ICC4.
M29F010B Bus operations
11/35
2.7 Vss Ground
The VSS Ground is the reference for all voltage measurements .
3 Bus operations
There are five standard bus operations that control the device. These are Bus Read, Bus
Write, Output Disable, Standby and Automatic Standby. See Table 3: Bus operations, for a
summary. Typically glitches of less than 5ns on Chip Enable or Write Enable are ignored b y
the memory and do not affect bus operations.
3.1 Bus Read
Bus Read operations read from the memory cells, or specific registers in the Command
Interface . A valid Bus Read operation involves setting the desired address on the Address
Inputs , applying a Low signal, VIL, to Chip Enable and Output Enable and k eeping Write
Enable High, VIH. The Data Inputs/Outputs will output the value, see Figure 8: Read Mode
AC waveforms and Table 11: Read AC characteristics, for details of when the output
becomes valid.
3.2 Bus Write
Bus Write operations write to the Command I nterf ace. A v alid Bus Write operat ion begins b y
setting the desire d address on the Address Inp uts. The Address In puts are latched by the
Command Interface on the falling edge of Chip Enable or Write Enable, whichever occurs
last. The Data Inputs/Outputs are latche d by the Command Interface on the rising edge of
Chip Enable or Write Enable, whichever occurs first. Output Enable must remain High, VIH,
durin g the who le Bu s Write operation. See Figure 9: Write AC waveforms, Write Enable
controlled, Figure 10: Write AC waveforms, Chip Enable controlled, Table 12: Write AC
characteristics, Write Enable controlled and Table 13: Write A C characteristics, Chip Enable
controlled, for details of the t iming requirements.
3.3 Output Disable
The Data Inputs/Outputs are in the high impeda nce state when Output Enable is High, VIH.
Bus operations M29F010B
12/35
3.4 Standby
When Chip Enable is High, VIH, the Data Inputs/Outputs pins are placed in the high-
impedance state and the Supply Current is reduced to the Standby level.
When Chip Enable is at VIH the Supply Current is reduced to the TTL Standby Supply
Current ICC2. To further reduce the Supply Current to the CMOS Standby Supply Current,
ICC3, Chip Enable should be held within VCC ± 0.2V. For Standby current levels see
Table 10: DC characteristics.
During program or erase operations the memory will continue to use the Program/Erase
Supply Current, ICC4, for Program or Erase operations until the operation completes.
3.5 Automatic Standby
If CMOS levels (VCC ± 0.2V) are used to drive the bus and the bus is inactive for 150ns or
more the memory enters A utomatic Standb y where the inte rnal Supply Current is reduced to
the CMOS Standby Supply Curren t, ICC3. The Data Inputs/Outputs will still output data if a
Bus Read operation is in progress.
3.6 Special bus operations
Additional bus operations can be performed to read the Electronic Signature and also to
apply and remov e Block Protection. These bus operations are intended for use by
programming equipment and are not usually used in applications. They require VID to b e
applied to some pins.
3.7 Electronic Signature
The memory has two codes, the manufacturer code and the device co de, that can be read
to identify the memory. These codes can be read by applying the signals listed in Table 3:
Bus operations.
3.8 Block Protection and Blocks Unprotection
Each block can be separately protected against accidental Program or Erase. Protected
blocks can be unprotect ed to allow data to be changed. Block Protection and Blocks
Unprotection operations must only be performed on programming equipment. For further
information refe r to Applicat ion No te AN1122, Applying Pr ot ecti on and Unp rot ect ion to M29
Series Flash memory.
M29F010B Bus operations
13/35
Table 3. Bus operations(1)
1. X = VIL or VIH.
Operation E G W Address Inputs Data
Inputs/Outputs
Bus Read VIL VIL VIH Cell address Data Output
Bus Write VIL VIH VIL Command address Data Input
Output Disable X VIH VIH XHi-Z
Standby VIH XXX Hi-Z
Read Manufacturer code VIL VIL VIH A0 = VIL, A1 = VIL,
A9 = VID, others VIL or VIH 20h
Read Device code VIL VIL VIH A0 = VIH, A1 = VIL,
A9 = VID, others VIL or VIH 20h
Command interface M29F010B
14/35
4 Command interface
All Bus Write operations to the memory are interpreted by the Command Interface.
Commands consist of one or more sequential Bus Write operations. Failur e to obse rve a
v alid sequence of Bus Write operations will result in the memory returning to Read mode.
The long command sequences are imposed to maximize data security.
The commands are summariz ed in Table 4: Commands. Ref er to Table 4 in conjunction with
the text descriptions below.
4.1 Read/Reset command
The Read/Reset command returns the memory to its Read mode where it behaves like a
RO M or EPROM. It also resets the errors in the Status Register. Either one or three Bus
Write operations can be used to issue the Read/Reset command.
If the Read/Reset command is issued during a Block Erase operation or following a
Programming or Erase error then the memory will take upto 10µs to abort. During the abort
period no v alid data can be read f rom the memory. Issuing a Read/Rese t command during a
Block Erase operation will leave invalid data in the memory.
4.2 Auto Select command
The Auto Select command is used to read the Manufacturer code, the Device code and the
Block Protection status. Three consecutive Bus Write operations are required to issue the
Auto Select command. Once the Auto Select command is issued the memory remains in
Auto Select mode until another command is issued.
F ro m the A uto Select mode the Ma nuf acture r code can be read using a Bus Read oper ation
with A0 = VIL and A1 = VIL. The other address bits may be set to either VIL or VIH. The
Manufacturer code for STMicroelectronics is 20h.
The Device code can be read using a Bus Read op eration with A0 = VIH and A1 = VIL. The
other address bits may be set to either VIL or VIH. The Device code for the M29F010B is
20h.
The Block Protection status of each block can be read using a Bus Read operation with A0
= VIL, A1 = VIH, and A14-A16 specifying the address of the block. The other address bits
ma y be set to either VIL or VIH. If the ad dressed b lo c k is pr otected t hen 01h is ou tput on the
Data Inputs/Outputs, otherwise 00h is output.
M29F010B Command interface
15/35
4.3 Program command
The Prog ram command can be used to prog ram a v alue to one address in the memory arra y
at a time. The command requir es f our Bus Write operat ions, the final write oper ation latches
the address and data in the internal state machine and starts the Program/Erase Controller.
If the address falls in a protected block then the Program command is ignored, the data
remains unchanged. The Status Register is never read and no error condition is given.
During the program operation the memory will ignore all commands. It is not possible to
issue any command to abort or pause the operation. Typical program times are given in
Table 5: Program Erase times and Program Erase Endurance cycles. Bus Read operations
during the program operation will output the Status Register on the Data Inputs/Outputs.
See the section on the Status Register for more details.
After the progr am operation has completed the memory will return to the Read mode , unless
an error has occurred. When an error occurs the memory will continue to output the Status
Register. A Read/Reset command must be issued to reset the error condition and return to
Read mode.
Note that the Prog r am command ca nnot cha nge a bit set at ’0’ bac k to ’1’. One of the Er ase
Commands must be used to set all the bits in a block or in the whole memory from ’0’ to ’1’.
4.4 Unlock Bypass command
The Unloc k Bypass command is used in conjunction with the Unlock Bypass Program
command to program the memory. When the access time to the device is long (as with
some EPROM programmers) considerable time saving can b e made by using these
commands. Thr ee Bus Write oper at ions ar e requir ed to issue t he Unlock Bypass command.
Once the Unlock Bypass command has been issued the memory will only accept the Unlock
Bypass Program command and th e Unlo ck Bypass Reset comm a nd . The mem o ry can be
read as if in Read mode.
4.5 Unlock Bypass Program command
The Unlock Bypass Program command can be used to prog ram one address in memory at
a time. The command requires two Bus Write opera tions, the final write operation latches
the address and data in the internal state machine and starts the Program/Erase Controller.
The Program operation u sing the Unlock Bypass Program comma nd behaves identically to
the Program operati on using the Program command. A protected block cannot be
programmed; the operation cannot be aborted and the Status Register is read. Errors must
be reset using the Read/Reset command, which leaves the device in Unlock Bypass Mode.
See the Program command for details on the behavior.
4.6 Unlock Bypass Reset command
The Unlock Bypass Reset command can be used to return to Read/Reset mode from
Unloc k Bypass Mode. Two Bus Write operations are required to issue the Unlock Bypass
Reset command.
Command interface M29F010B
16/35
4.7 Chip Erase command
The Chip Erase comman d can be used to erase the entire chip. Six Bus Write operations
are required to issue the Chip Erase Command and start the Program/Erase Controller.
If any blocks are protected th en these are ignored and all the ot he r blocks are erased. If all
of the blocks are protected the Chip Erase operation appears to start but will terminate
within about 100µs , leaving the dat a unchanged. No error cond ition is giv en when pro tected
blocks are ignored.
During the erase operation the memory will ignore all commands. It is not possible to issue
any command to abort the operation. Typical chip erase times are giv en in Table 5: Program
Erase times and Program Erase Endurance cycles. All Bus Read operations during the Chip
Erase operation will output the Status Register on the Data Inputs/Outputs. See the section
on the Status Register for more details.
After the Chip Erase operation has completed the memory will return to the Read Mode,
unless an error has occurred. When an error occurs the memory will continue to output the
Status Register. A Read/Reset command must be issued to reset the error condition and
return to Read Mode.
The Chip Erase Comm and set s all of th e bits in unpr ot ected blocks of the memory to ’1’. All
previous data is lost.
4.8 Block Erase command
The Block Erase command can be used t o erase a list of one or m ore blocks. Six Bus Write
operat ions are required to select the first b loc k in the list. Each additional bl ock in the list can
be selected by repeating the sixth Bus Write operation using the address of the additional
bl ock. The Block Erase operation starts the Program/Era se Controller about 50µs after the
last Bus Write operation. Once the Program/Erase Controller starts it is not possible to
select any more blocks. Each additional block must therefore be selected within 50µs of the
last b loc k. The 50µs timer rest arts when an additio nal bl ock is select ed. The Status Regist er
can be read after the sixth Bus Write operation. See the Status Register for details on how
to identify if the Program/Erase Controller has started the Block Erase op eration.
If an y selected b l oc ks are prote cted then t hese are ignored and all the other selected b locks
are erased. If all of the selected blocks are protected the Block Erase operation appears to
start but will terminate within about 100µs, lea ving the data unchanged. No error condition is
given when protected blocks are ignored.
During the Block Erase oper ation the memory will ignore all commands except the Erase
Suspend and Read/Reset commands. Typical block erase times are given in Table 5:
Program Erase times and Program Er ase Endurance cycles. All Bus Read operations
during the Block Erase operation will output the Status Register on the Data Inputs/Outputs.
See the section on the Status Register for more details.
After the Block Erase operation has completed the memory will return to the Read Mode,
unless an error has occurred. When an error occurs the memory will continue to output the
Status Register. A Read/Reset command must be issued to reset the error condition and
return to Read mode.
The Block Erase Command sets all of the bits in the unprotected selected blocks to ’1’. All
previous data in the selected blocks is lost.
M29F010B Command interface
17/35
4.9 Erase Suspend command
The Erase Suspend Command may be used to temporarily suspend a Block Erase
operation and return the memory to Read mode. The command requir es one Bus Write
operation.
The Program/Erase Controller will suspend within 15µs of the Erase Suspend Command
being issued. Once the Program/Erase Controller has stopped the memory will be set to
Read mode and the Erase will be suspended. If the Erase Suspend command is issued
during the period when the memory is waiting for an additional block (before the
Program/Erase Controller starts) then the Erase is suspended immediately and will start
immediately when the Erase Resume Command is issued. It will not be possible to select
any further blocks for erasure after the Erase Resume.
During Erase Suspend it is possible to Read and Program cells in blocks that are not being
erased; both Read and Program operations beha ve as normal on these blocks. Reading
from blocks that are being erased will output the Status Register. It is also possible to enter
the A uto Select mode: the memory will behave as in the A uto Select mode on all bloc ks until
a Read/Reset command returns the memory to Erase Suspend mode.
4.10 Erase Resume command
The Erase Resume command must be used to restart the Program/Erase Controller from
Erase Suspend. An erase can be suspended and resumed more than once.
Command interface M29F010B
18/35
Table 4. Commands(1)
1. All values in the table are in hexadecimal. X Don’t Care, PA Program Address, PD Program Data, BA Any
address in the Block. The Command Interface only uses address bits A0-A10 to verify the commands, the
upper address bits are Don’t Care.
Command
Length
Bus Writ e op er a t ions
1st 2nd 3rd 4th 5th 6th
Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Read/Reset(2)
2. After a Read/Reset command, read the memory as normal until another command is issued.
1X F0
3555AA2AA55 X F0
Auto Select(3)
3. After an Auto Select command, read Manufacturer ID, Device ID or Block Protection Status.
3 555 AA 2AA 55 555 90
Program(4)
4. After Program, Unlock Bypass Program, Chip Erase, and Block Erase commands read the Status Register until the
Program/Erase Controller completes and the memory returns to Read Mode. Add additional Blocks during
Block Erase Command with additional Bus Write Operations until the Timeout bit is set.
4 555 AA 2AA 55 555 A0 PA PD
Unlock
Bypass(5)
5. After the Unlock Bypass command issue Unlock Bypass Program or Unlock Bypass Reset commands.
3 555 AA 2AA 55 555 20
Unlock Bypass
Program(4) 2 X A0 PA PD
Unlock Bypass
Reset(6)
6. After the Unlock Bypass Reset command read the memory as normal until another command is issued.
2X 90 X 00
Chip Erase(4) 6 555 AA 2AA 55 555 80 555 AA 2AA 55 555 10
Block Erase(4) 6
+555 AA 2AA 55 555 80 555 AA 2AA 55 BA 30
Erase
Suspend(7)
7. After the Erase Suspend command read non-erasing memory blocks as normal, issue Auto Select and
Program commands on non-erasing blocks as normal.
1X B0
Erase
Resume(8)
8. After the Erase Resume command the suspended Erase operation resumes, read the Status Register until
the Erase Controller completes and the memory returns to Read Mode.
1X 30
M29F010B Command interface
19/35
)
Table 5. Program Erase times and Program Erase Endurance cycles(1)
1. TA = 0 to 70°C, –40 to 85°C.
Parameter Min Typ(2)
2. TA = 25°C, VCC = 5V.
T ypical after 100k
W/E cycles(2) Max Unit
Chip Erase (all bits in the memory set to ‘0’) 0.6 0.6 sec
Chip Erase 1.3 1.3 6 sec
Block Erase (16 Kbytes) 0.3 0.3 2 sec
Program 8 8 150 µs
Chip Program 1.2 1.2 4.5 sec
Program/Erase cycles (per block) 100,000 cycles
Status Register M29F010B
20/35
5 Status Register
Bus Read oper ations from any a ddress alwa ys read the Stat us Register during Program a nd
Erase operations. It is also read during Erase Suspend when an address within a block
being erased is accessed.
The bits in the Status Register are summarized in Table 6: Status Register bits.
5.1 Data Polling bit (DQ7)
The Data Polling bit can be used to identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Erase Suspend. The Data
Polling bit is output on DQ7 when the Status Register is read.
During Program operations the Data Polling bit outputs the complement of the bit being
programmed to DQ7. After su ccessful completion of the Program operation the memory
returns to Read mode and Bus Read operations from the address just programmed output
DQ7, not its complement.
During Erase operations the Data Polling bit outputs ’0’, the complement of the er ased state
of DQ7. After successful completion of the Erase operation the memory returns to Read
Mode.
In Erase Suspend mode the Data Polling bit will output a ’1’ during a Bus Read operation
within a block being erased. The Data Polling bit will change from a ’0’ to a ’1’ when the
Program/Erase Controller has suspended the Erase operation.
Figure 4: Data P o lling flowchart, giv e s an e xa mple of ho w to use the Dat a Polling bit. A Valid
Address is the address bein g programmed or an address within the block being erased.
5.2 Toggle bit (DQ6)
The Toggle bit can be used to identify whether the Program/Erase Controller has
successfully completed its operation or if it has responded to an Er ase Suspend. The Toggle
bit is output on DQ6 when the Status Register is read.
During Program and Erase operations the Toggle bit changes from ’0’ to ’1’ to ’0’, etc., with
successive Bus Read operations at any address . After successful completion of the
operation the memory returns to Read mode.
During Erase Suspend mode the Toggle bit will output when addressing a cell within a bloc k
being erased. The Toggle bit will stop toggling when the Progr am/Erase Controller has
suspended the Erase operation.
Figure 5: Data Toggle flowchart, gives an example of how to use the Data Toggle bit.
M29F010B Status Register
21/35
5.3 Error bit (DQ5)
The Error bit can be used to identify errors detected by the Pro gram/Erase Controller. The
Error bit is set to ’1’ when a Program, Block Erase or Chip Erase operation fails to write the
correct data to the memory. If the Error bit is set a Read/Reset command must be issued
before other commands are issued. The Error bit is output on DQ5 when the Status Register
is read.
Note that the Prog ram command cannot change a bit se t a t ’0’ back to ’1’ and att emptin g t o
do so may or may not set DQ5 at ‘1’. In both cases, a successive Bus Read operation will
show the bit is still ’0’. One of the Er ase commands must be used to set all the bits in a b lock
or in the whole memory from ’0’ to ’1’.
5.4 Erase Timer bit (DQ3)
The Erase Timer bit can be used to identify the start of Program/Erase Controller operation
during a Bloc k Erase command. Once the Program/Erase Controller starts erasing the
Erase Timer bit is set to ’1’. Before the Program/Erase Controller starts the Erase Timer bit
is set to ’0’ and additional blocks to be erased may be written to the Command Interface.
The Erase Timer bi t is output on DQ3 when the Status Register is read.
5.5 Alternative Toggle bit (DQ2)
The Alternative Toggle bit can be used to monitor the Prog ram/Erase controller during Erase
operations. The Alternative Toggle bit is output on DQ2 when the Status Register is read.
During Chip Erase and Block Erase opera tions the Toggle bit changes from ’0’ to ’1’ to ’0’,
etc., with successive Bus Read operations from addresses within the blocks being erased.
Once the oper ation completes the memory returns to Read mode.
During Erase Suspend the Alternative Toggle bit changes from ’0’ to ’1’ to ’0’, etc. with
successive Bus Read ope r at ion s f rom addre sses within the blocks being erased. Bu s Read
operations to addresses within bloc ks not being erased will output the memory cell data as if
in Read mode.
After an Er a se op eration that cau ses the Err or bit to be set th e Alternative Toggle bit can be
used to identify which block or blocks have caused the error. The Alternative Toggle bit
changes from ’0’ to ’1’ to ’0’, etc. with successive Bus Read Operations from addresses
within blocks that have not erased correctly. The Alternative Toggle bit does not change if
the addressed block has erased correctly.
Status Register M29F010B
22/35
Figure 4. Data Polling flowchart
Table 6. Status Register bit s(1)
1. Unspecified data bits should be ignored.
Operation Address DQ7 DQ6 DQ5 DQ3 DQ2
Program Any address DQ7 Toggle 0
Program during Erase Suspend Any address DQ7 Toggle 0
Program Error Any address DQ7 Toggle 1
Chip Erase Any address 0 Toggle 0 1 Toggle
Block Erase before timeout Erasing block 0 Toggle 0 0 Toggle
Non-Erasing block 0 Toggle 0 0 No toggle
Block Erase Erasing block 0 Toggle 0 1 Tog gle
Non-Erasing block 0 Toggle 0 1 No toggle
Erase Suspend Erasing block 1 No toggle 0 Toggle
Non-Erasing block Data read as nor m al
Erase Error Good block address 0 Toggle 1 1 No toggle
Faulty block address 0 Toggle 1 1 Toggle
READ DQ5 & DQ7
at VALID ADDRESS
START
READ DQ7
at VALID ADDRESS
FAIL PASS
AI03598
DQ7
=
DATA YES
NO
YES
NO
DQ5
= 1
DQ7
=
DATA YES
NO
M29F010B Status Register
23/35
Figure 5. Data Toggle flowchart
READ DQ6
START
READ DQ6
TWICE
FAIL PASS
AI01370B
DQ6
=
TOGGLE NO
NO
YES
YES
DQ5
= 1
NO
YES
DQ6
=
TOGGLE
READ
DQ5 & DQ6
Maximum rating M29F010B
24/35
6 Maximum rating
Except for the rating "Operating Temperature Range", stresses above those listed in
Table 7: Absolute maximum ratings ma y cause permanent damage to the device. These are
stress rati ngs only an d op er at io n of th e device at these or any other conditions above those
indicated in the op erating se ctio ns of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability. Refer also to
the STMicroelectronics SURE Program and other relevant quality documents.
Table 7. Absolute maximum ratings
Symbol Parameter Value Unit
TAAmbient Operating temperature (Temperature Range 1) 0 to 70 °C
Ambient Operating temperature (Temperature Range 6) –40 to 85 °C
TBIAS Temperature under Bias –50 to 125 °C
TSTG Storage temperature –65 to 150 °C
VIO(1)
1. Minimum voltage may undershoot to –2V during transition and for less than 20ns during transitions.
Input or Output voltage –0.6 to 6 V
VCC Supply voltage –0.6 to 6 V
VID Identification voltage –0.6 to 13.5 V
M29F010B DC and AC parameters
25/35
7 DC and AC parameters
This section summarizes the operating measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC characteristics Tables that
follow, are derived from tests performed under the measurement conditions summarized in
Table 8: AC m easu rem ent co nd itio ns. Design ers shou ld check that the oper ating con ditions
in their circuit match t he operating conditions when relying on the quoted parameters.
Figure 6. AC testing Input/Output waveform
Table 8. AC measurement conditions
Parameter 45 70/90/120
AC test conditions High speed Standard
Load capacitance (CL) 30pF 100pF
Input Rise and Fall times 10ns 10ns
Input pulse voltages 0 to 3V 0.45 to 2.4V
Input and Output Timing Ref. v oltages 1.5V 0.8V and 2V
AI01275B
3V
High Speed
0V
1.5V
2.4V
Standard
0.45V
2.0V
0.8V
DC and AC parameters M29F010B
26/35
Figure 7. AC testing load circuit
Table 9. Capacitance(1)(2)
1. TA = 25 °C, f = 1 MHz.
2. Sampled only, not 100% tested.
Symbol Pa rameter Test condition Min Max Unit
CIN Input capacitance VIN = 0V 6 pF
COUT Output capacitance VOUT = 0V 12 pF
AI03027
1.3V
OUT
CL = 30pF or 100pF
CL includes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
M29F010B DC and AC parameters
27/35
Table 10. DC characteristics(1)
1. TA = 0 to 70°C, –40 to 85°C.
Symbol Parameter Test condition M in Typ (2)
2. TA = 25°, VCC = 5V.
Max Unit
ILI Input Leakage current 0V VIN VCC ±1 µA
ILO Output Leakage current 0V VOUT VCC ±1 µA
ICC1 Supply current (Read) E = VIL, G = VIH,
f = 6MHz 515mA
ICC2 Supply current (Standby) TTL E = VIH 1mA
ICC3 Supply current (Standby) CMOS E = VCC ±0.2V 30 100 µA
ICC4(3)
3. Sampled only, not 100% tested.
Supply current (Program/Erase) Program/Erase
controller active 20 mA
VIL Input Low voltage –0.5 0.8 V
VIH Input High voltage 2 VCC +0.5 V
VOL Output Low voltage IOL = 5.8mA 0.45 V
VOH Output High voltage TTL IOH = –2.5mA 2.4 V
Output High voltage CMOS IOH = –100µA VCC0.4 V
VID Identification voltage 11.5 12.5 V
IID Identification current A9 = VID 100 µA
VLKO(3) Program/Erase Lockout supply
voltage 3.2 4.2 V
DC and AC parameters M29F010B
28/35
Figure 8. Read Mode AC waveforms
Table 11. Read AC characteristics(1)
1. TA = 0 to 70°C, –40 to 85°C.
Symbol Alt Parameter Test condition 45 70/90/120 Unit
tAVAV tRC Address Valid to Next
Address Valid E = VIL, G = VIL Min 45 70 ns
tAVQV tACC Address Valid to Output
Valid E = VIL, G = VIL Max 45 70 ns
tELQX(2)
2. Sampled only, not 100% tested.
tLZ Chip Enable Low to Output
Transition G = VIL Min 0 0 ns
tELQV tCE Chip Enable Low to Output
Valid G = VIL Max 45 70 ns
tGLQX(2) tOLZ Output Enable Low to
Output Transition E = VIL Min 0 0 ns
tGLQV tOE Output Enable Low to
Output Valid E = VIL Max 25 30 ns
tEHQZ(2) tHZ Chip Enable High to Output
Hi-Z G = VIL Max 15 20 ns
tGHQZ(2) tDF Output Enable High to
Output Hi-Z E = VIL Max 15 20 ns
tEHQX, tGHQX,
tAXQX tOH
Chip Enable, Output Enable
or Address Transition to
Output Transition Min 0 0 ns
AI0
2
tAVAV
tAVQV tAXQ
X
tELQX tEHQZ
tGLQV
tGLQX tGHQX
VALID
-A16
Q
0-DQ7
tELQV tEHQ
X
tGHQZ
VALID
M29F010B DC and AC parameters
29/35
Figure 9. Write AC waveforms, Write Enable controlled
Table 12. Write AC characteristics, Write Enable controlle d(1)
1. TA = 0 to 70 °C, –40 to 85 °C.
Symbol Alt Parameter 45 70/90/120 Unit
tAVAV tWC Address Valid to Next Address Valid Min 45 70 ns
tELWL tCS Chip Enab le Low to Write Enable Low Min 0 0 ns
tWLWH tWP Write Enable Low to Write Enable High Min 40 45 ns
tDVWH tDS Input Valid to Write Enable High Min 25 30 ns
tWHDX tDH Wri te Enable High to Input Transition Min 0 0 ns
tWHEH tCH Write Enable High to Chip Enable High Min 0 0 ns
tWHWL tWPH Write Enable High to Write Enable Low Min 20 20 ns
tAVWL tAS Address Valid to Write Enable Low Min 0 0 ns
tWLAX tAH Write Enable Low to Address Transition Min 40 45 ns
tGHWL Output Enable High to Write Enable Low Min 0 0 ns
tWHGL tOEH Wri te Enable High to Output Enable Low Min 0 0 ns
tVCHEL tVCS VCC High to Chip Enable Low Min 50 50 µs
AI02927
E
G
W
A0-A16
DQ0-DQ7
VALID
VALID
VCC
tVCHEL
tWHEH
tWHWL
tELWL
tAVWL
tWHGL
tWLAX
tWHDX
tAVAV
tDVWH
tWLWHtGHWL
DC and AC parameters M29F010B
30/35
Figure 10. Write AC waveforms, Chip Enable controlled
Table 13. Write AC characteristics, Chip Enable controlled(1)
1. TA = 0 to 70 °C, –40 to 85 °C.
Symbol Alt Parameter 45 70/90/120 Unit
tAVAV tWC Address Valid to Next Address Valid Min 45 70 ns
tWLEL tWS Write Enable Low to Chip Enable Low Min 0 0 ns
tELEH tCP Chip Enable Low to Chip Enable High Min 40 45 ns
tDVEH tDS Input Valid to Chip Enable High Min 25 30 ns
tEHDX tDH Chip Enable High to Input Transition Min 0 0 ns
tEHWH tWH Chip Enable High to Write Enable High Min 0 0 ns
tEHEL tCPH Chip Enable High to Chip Enable Low Min 20 20 ns
tAVEL tAS Address Vali d to Chip Enable Low Min 0 0 ns
tELAX tAH Chip Enable Low to Address Transition Min 40 45 ns
tGHEL Output Enable High Chip Enable Low Min 0 0 ns
tEHGL tOEH Chip Enable High to Output Enable Low Min 0 0 ns
tVCHWL tVCS VCC High to Write Enable Low Min 50 50 µs
AI02928
E
G
W
A0-A16
DQ0-DQ7
VALID
VALID
VCC
tVCHWL
tEHWH
tEHEL
tWLEL
tAVEL
tEHGL
tELAX
tEHDX
tAVAV
tDVEH
tELEHtGHEL
M29F010B Package mechanical
31/35
8 Package mechanical
Figure 11. P LCC32 – 32 lead Plastic Leaded Chip Carri er, package outline
1. Drawing is not to scale.
Table 14. PLCC32 – 32 lead Plastic Leaded Chip Carrier, package mechanical data
Symbol millimeters inches
Typ Min Max Typ Min Max
A 3.17 3.56 0.125 0.140
A1 1.53 2.41 0.060 0.095
A2 0.38 0.015
B 0.33 0.53 0.013 0.021
B1 0.66 0.81 0.026 0.032
CP 0.10 0.004
D 12.32 12.57 0.485 0.495
D1 11.35 11.51 0.447 0.453
D2 4.78 5.66 0.188 0.223
D3 7.62 0.300
E 14.86 15.11 0.585 0.595
E1 13.89 14.05 0.547 0.553
E2 6.05 6.93 0.238 0.273
E3 10.16 0.400
e1.27– 0.050
F 0.00 0.13 0.000 0.005
N32 32
R 0.89 0.035
PLCC-A
D
E3 E1 E
1 N
D1
D3
CP
B
E2
e
B1
A1
A
R
0.51 (.020)
1.14 (.045)
F
A2
E2
D2 D2
Package mechanical M29F010B
32/35
Figure 12. TSOP32 – 32 lead Plastic Thin Small Outline, 8 x 20mm, package outline
Note: Drawing is not to scale.
Table 15. TSOP32 – 32 lead Plastic Thin Small Outline, 8 x 20mm, package
mechanical data
Symbol millimeters inches
Typ Min Max Typ Min Max
A 1.20 0.0472
A1 0.05 0.15 0.0020 0.0059
A2 0.95 1.05 0.0374 0.0413
B 0.17 0.25 0.0067 0.0098
C 0.10 0.21 0.0039 0.0083
D 19.80 20.20 0.7795 0.7953
D1 18.30 18.50 0.7205 0.7283
E 7.90 8.10 0.3110 0.3189
e0.50– 0.0197
L 0.50 0.70 0.0197 0.0276
α
N 32 32
CP 0.10 0.0039
TSOP-a
D1
E
1N
CP
B
e
A2
A
N/2
D
DIE
C
LA1 α
M29F010B Part numbering
33/35
9 Part numbering
For a list of a vailable options (Speed, Pack age, etc...) or fo r further information on any
aspect of this device, please cont act the ST Sales Office nearest to you.
Table 16. Ordering information scheme(1)
1. The last two characters of the ordering code may be replaced by a letter code for preprogrammed parts,
otherwise devices are shipped from the factory with the memory content bits erased to ’1’.
Example: M29 F010B 70 N 1 T
Device type
M29
Operatin g voltage
F = VCC = 5V ± 10%
Device function
010B = 1 Mbit (128Kb x8), unif orm bloc k
Speed
45 = 45 ns
70 = 70 ns
90 = 90 ns
120 = 120ns
Package
K = PLCC32
N = TSOP32: 8 x 20 mm
Temperature range
1 = 0 to 70°C
6 = –40 to 85°C
Option
Blank = Standard packing
T = Tape & Reel packing
E = ECOPACK Package, standard packing
F = ECOPACK Package, Tape & Reel packing
Revision history M29F010B
34/35
10 Revision history
Table 17. Revision history
Date Revision Revision details
July 1999 -01 First Issue
28-Jul-2000 -02
New document template
Document type: from Preliminary Data to Data Sheet
Status Register bit DQ5 clarification
Data Polling Flowchart diagram change (Figure 4)
Data Toggl e Flowchart diagram change (Figure 5)
Program/Erase Times specification change (Table 5)
ICC1 and ICC3 Typ. specification added (Table 10)
22-Apr-2002 -03 PLCC32 package mechanical data modified
19-Sep-2005 4.0
PDIP32 package removed.
Table 16: Ordering information sch eme : standard package added and
ECOPACK version added for both standard package, and Ta pe & Reel
packing.
06-Nov-2006 5 Converted document to new template; updated package mechanical
data in Section 8: Pac kage mechanical; removed temperature range 3
(–40 to 125°C) from entire document.
M29F010B
35/35
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