1 May 07, 2004
UL62H256A
!32768 x 8 bit static CMOS RAM
!35 and 55 ns Access Time
!Common data inputs and
data outputs
!Three-state outputs
!Typ. operating supply current
35 ns: 45 mA
55 ns: 30 mA
!Standby current < 40 µA at 125 °C
!TTL/CMOS-compatible
!Power supply voltage 2.5 - 3.6 V
!Operating temperature range
-40 °C to 85 °C
-40 °C to 125 °C
!QS 9000 Quality Standard
!ESD protection > 2000 V
(MIL STD 883C M3015.7)
!Latch-up immunity >100 mA
!Package: SOP28 (300/330 mil)
The UL62H256A is a static RAM
manufactured using a CMOS pro-
cess technology with the following
operating modes:
- Read - Standby
- Write - Data Retention
The memory array is based on a
6-Transistor cell.
The circuit is activated by the fal-
ling edge of E. The address and
control inputs open simultaneously.
According to the information of W
and G, the data inputs, or outputs,
are active. In a Read cycle, the
data outputs are activated by the
falling edge of G, afterwards the
data word will be available at the
outputs DQ0-DQ7. After the
address change, the data outputs
go High-Z until the new information
is available. The data outputs have
no preferred state. The Read cycle
is finished by the falling edge of W,
or by the rising edge of E, respec-
tively.
Data retention is guaranteed down
to 2 V. With the exception of E, all
inputs consist of NOR gates, so
that no pull-up/pull-down resistors
are required.
Low Voltage Automotive Fast 32K x 8 SRAM
Pin Configuration
Top View
Signal Name Signal Description
A0 - A14 Address Inputs
DQ0 - DQ7 Data In/Out
EChip Enable
GOutput Enable
WWrite Enable
VCC Power Supply
Voltage
VSS Ground
Pin Description
1
A14 VCC28
2A12 W
27
4A6 A825
5A5 A924
3A7 A1326
6A4 A1123
7A3 G
22
8A2 A1021
12DQ1 DQ517
9A1 E
20
10
A0 DQ719
11DQ0 DQ618
13DQ2 DQ416
14VSS DQ315
SOP
Features Description
2 May 07, 2004
UL62H256A
*H or L
Operating Mode E W G DQ0 - DQ7
Standby/not selected H * * High-Z
Internal Read L H H High-Z
Read L H L Data Outputs Low-Z
Write L L * Data Inputs High-Z
Truth Table
Block Diagram
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
VCC VSS W GE
Row Address
Inputs
Column Address
Inputs
Address
Change
Detector
Column Decoder Row Decoder
Sense Amplifier/
Write Control Logic
Clock
Generator
Common Data I/O
Memory Cell
Array
512 Rows x
64 x 8 Columns
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
A11
A12
A13
A14
3 May 07, 2004
UL62H256A
aStresses greater than those listed under „Absolute Maximum Ratings“ may cause permanent damage to the device. This is a stress rating
only, and functional operation of the device at condition above those indicated in the operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended periods may affect reliability
bMaximum voltage is 4.6 V
cNot more than 1 output should be shorted at the same time. Duration of the short circuit should not exceed 30 s.
Absolute Maximum Ratings a Symbol Min. Max. Unit
Power Supply Voltage VCC -0.3 4.6 V
Input Voltage VI-0.5 VCC + 0.5 bV
Output Voltage VO-0.5 VCC + 0.5 bV
Power Dissipation PD-1W
Operating Temperature K-Type
A-Type
Ta-40
-40
85
125
°C
Storage Temperature Tstg -65 150 °C
Output Short-Circuit Current
at VCC = 3.3 V and VO = 0 V c| IOS | 100 mA
Characteristics
All voltages are referenced to VSS = 0 V (ground).
All characteristics are valid in the power supply voltage range and in the operating temperature range specified.
Dynamic measurements are based on a rise and fall time of 5 ns, measured between 10 % and 90 % of VI,as well as
input levels of VIL = 0.2 V and VIH = 2.8 V. The timing reference level of all input and output signals is 1.5 V,
with the exception of the tdis-times and ten-times, in which cases transition is measured ±200 mV from steady-state voltage.
d-2 V at Pulse Width 30 ns
Recommended
Operating Conditions Symbol Conditions Min. Max. Unit
Power Supply Voltage VCC 2.5 3.6 V
Input Low Voltage dVIL -0.3 0.5 V
Input High Voltage VIH 2.0 VCC + 0.3 V
4 May 07, 2004
UL62H256A
Electrical Characteristics Symbol Conditions Min. Max. Unit
Supply Current - Operating Mode
Supply Current - Standby Mode
(CMOS level)
Supply Current - Standby Mode
(TTL level)
ICC(OP)
ICC(SB)
ICC(SB)1
VCC
VIL
VIH
tcW
tcW
VCC
VE
K-Type
A-Type
VCC
VE
K-Type
A-Type
= 3.6 V
= 0.5 V
= 2.0 V
= 35 ns
= 55 ns
= 3.6 V
= VCC - 0.2 V
= 3.6 V
= 2.0 V
90
70
10
40
10
20
mA
mA
µA
µA
mA
mA
Output High Voltage
Output Low Voltage
VOH
VOL
VCC
IOH
VCC
IOL
= 2.5 V
= -1.0 mA
= 2.5 V
= 2.1 mA
2.2
0.4
V
V
Input High Leakage Current
Input Low Leakage Current
IIH
IIL
VCC
VIH
VCC
VIL
= 3.6 V
= 3.6 V
= 3.6 V
= 0 V
-2
A
µA
Output High Current
Output Low Current
IOH
IOL
VCC
VOH
VCC
VOL
= 2.5 V
= 2.2 V
= 2.5 V
= 0.4 V
2.1
-1.0 mA
mA
Output Leakage Current
High at Three-State Outputs
Low at Three-State Outputs
IOHZ
IOLZ
VCC
VOH
VCC
VOL
= 3.6 V
= 3.6 V
= 3.6 V
=0 V
-2
A
µA
5 May 07, 2004
UL62H256A
Switching Characteristics
Read Cycle
Symbol 35 55
Unit
Alt. IEC Min. Max. Min. Max.
Read Cycle Time tRC tcR 35 55 ns
Address Access Time to Data Valid tAA ta(A) 35 55 ns
Chip Enable Access Time to Data Valid tACE ta(E) 35 55 ns
G LOW to Data Valid tOE ta(G) 15 25 ns
E HIGH to Output in High-Z tHZCE tdis(E) 12 15 ns
G HIGH to Output in High-Z tHZOE tdis(G) 12 15 ns
E LOW to Output in Low-Z tLZCE ten(E) 33ns
G LOW to Output in Low-Z tLZOE ten(G) 00ns
Output Hold Time from Address Change tOH tv(A) 33ns
E LOW to Power-Up Time tPU 00ns
E HIGH to Power-Down Time tPD 35 55 ns
Switching Characteristics
Write Cycle
Symbol 35 55
Unit
Alt. IEC Min. Max. Min. Max.
Write Cycle Time tWC tcW 35 55 ns
Write Pulse Width tWP tw(W) 20 35 ns
Write Setup Time tWP tsu(W) 20 35 ns
Address Setup Time tAS tsu(A) 00ns
Address Valid to End of Write tAW tsu(A-WH) 25 40 ns
Chip Enable Setup Time tCW tsu(E) 25 40 ns
Pulse Width Chip Enable to End of Write tCW tw(E) 25 40 ns
Data Setup Time tDS tsu(D) 15 25 ns
Data Hold Time tDH th(D) 00ns
Address Hold from End of Write tAH th(A) 00ns
W LOW to Output in High-Z tHZWE tdis(W) 15 20 ns
G HIGH to Output in High-Z tHZOE tdis(G) 12 15 ns
W HIGH to Output in Low-Z tLZWE ten(W) 00ns
G LOW to Output in Low-Z tLZOE ten(G) 00ns
6 May 07, 2004
UL62H256A
Data Retention Mode
E - controlled
Data Retention
3.0 V
tsu(DR) trec
VCC
E
VCC(DR) 2 V
0 V
2.2 V
2.2 V
VCC(DR) - 0.2 V VE(DR) VCC(DR) + 0.3 V
Data Retention
Characteristics
Symbol
Conditions Min. Typ. Max. Unit
Alt. IEC
Data Retention Supply Voltage VCC(DR) 2V
Data Retention Supply Current ICC(DR) VCC(DR) = 2V
VE = VCC(DR) - 0.2 V
K-Type
A-Type
5
20
µA
µA
Data Retention Setup Time tCDR tsu(DR) See Data Retention
Waveforms (above)
0ns
Operating Recovery Time tRtrec tcR ns
Test Configuration for Functional Check
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
VIH
VIL
VSS
VCC
3.0 V
1076
1260
VO
Input level according to the
relevant test measurement
Simultaneous measure-
ment of all 8 output pins
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
A11
A12
A13
A14
E
W
G
30 pF e
e In measurement of tdis(E),tdis(W), ten(E), ten(W), ten(G) the capacitance is 5 pF.
7 May 07, 2004
UL62H256A
Capacitance Conditions Symbol Min. Max. Unit
Input Capacitance VCC
VI
f
Ta
= 3.3 V
= VSS
= 1 MHz
= 25 °C
CI7pF
Output Capacitance Co7pF
All pins not under test must be connected with ground by capacitors.
Date of manufacture
(The first 2 digits indicating
the year, and the last 2
digits the calendar week.)
Leadfree Green Package
Product specification
Assembly location and
trace code
Internal Code
Operating Temperature Range
K = -40 to 85 °C
A = -40 to 125 °C
S35AUL62H256A
Type
Package
S = SOP28 (300 mil)
S2 = SOP28 (330 mil) Type 2
Ordering Code
Leadfree Option
blank = Standard Package
G1 = Leadfree Green Package f
Access Time
35 = 35 ns
55 = 55 ns
Device Marking (example)
ZMD
UL62H256ASA
35 C 0425
1 ZZ G1
f on special request
Example
8 May 07, 2004
UL62H256A
tPU
tdis(G)
tdis(E)
tcR
Previous Data Valid Output Data Valid
Address Valid
Address Valid
tsu(A)
High-Z
ten(E)
ten(G)
ta(G)
ta(E)
Read Cycle 1: Ai-controlled (during Read Cycle : E = G = VIL, W = VIH)
Read Cycle 2: G-, E-controlled (during Read Cycle: W = VIH)
ta(A)
tcR
tv(A)
Ai
DQi
Output
Ai
G
DQi
Output tPD
ICC(OP)
ICC(SB)
50 % 50 %
Output Data Valid
E
9 May 07, 2004
UL62H256A
Write Cycle1: W-controlled
th(D)
Ai
E
W
DQi
Input
G
DQi
Output
tcW
tsu(E) th(A)
tw(W)
tsu(A)
tsu(D)
tdis(W) ten(W)
Address
Input Data Valid
High-Z
tsu(A-WH)
Write Cycle 2: E-controlled
Input Data Valid
tsu(A)
th(D)
Ai
E
W
DQi
Input
G
DQi
Output
tcW
tw(E) th(A)
tsu(W)
tsu(D)
tdis(W)
t
en(E)
High-Z
Address Valid
tdis(G)
L- to H-level undefined H- to L-level
The information describes the type of component and shall not be considered as assured characteristics.Terms of
delivery and rights to change design reserved.
Zentrum Mikroelektronik Dresden AG
Grenzstraße 28 D-01109 Dresden P. O. B. 80 01 34 D-01101 Dresden Germany
Phone: +49 351 8822 306Fax: +49 351 8822 337 Email: memory@zmd.de http://www.zmd.de
May 07, 2004
UL62H256A
LIFE SUPPORT POLICY
ZMD products are not designed, intended, or authorized for use as components in systems intended for surgical
implant into the body, or other applications intended to support or sustain life, or for any other application in which
the failure of the ZMD product could create a situation where personal injury or death may occur.
Components used in life-support devices or systems must be expressly authorized by ZMD for such purpose.
LIMITED WARRANTY
The information in this document has been carefully checked and is believed to be reliable. However Zentrum
Mikroelektronik Dresden AG (ZMD) makes no guarantee or warranty concerning the accuracy of said information
and shall not be responsible for any loss or damage of whatever nature resulting from the use of, or reliance upon it.
The information in this document describes the type of component and shall not be considered as assured charac-
teristics.
ZMD does not guarantee that the use of any information contained herein will not infringe upon the patent, trade-
mark, copyright, mask work right or other rights of third parties, and no patent or licence is implied hereby. This
document does not in any way extent ZMD’s warranty on any product beyond that set forth in its standard terms and
conditions of sale.
ZMD reserves terms of delivery and reserves the right to make changes in the products or specifications, or both,
presented in this publication at any time and without notice.