LC72722PM
No. 6123-2/18
Specifications
Absolute Maximum Ratings at Ta = 25°C, Vssd = Vssa = 0V
Parameter Symbol Pin Name Ratings Unit
Maximum supply voltage Vddmax Vddd, Vdda -0.3 to +7.0 V
Maximum input voltage
Vin1max CL, DI, CE, SYR, T1, T2, T3, T4, T5, T6, T7, SYNC -0.3 to +7.0 V
Vin2max XIN -0.3 to Vddd+0.3 V
Vin3max MPXIN, CIN -0.3 to Vdda+0.3 V
Maximum output voltage
Vo1max DO, SYNC, RDS-ID, T3, T4, T5, T6, T7 -0.3 to +7.0 V
Vo2max XOUT -0.3 to Vddd+0.3 V
Vo3max FLOUT -0.3 to Vdda+0.3 V
Maximum output current
Io1max DO, T3, T4, T5, T6, T7 +6.0 mA
Io2max XOUT, FLOUT +3.0 mA
Io3max SYNC, RDS-ID +20.0 mA
Allowable power dissipation Pdmax (Ta≤85°C) 175 mW
Operating temperature Topr -40 to +85 °C
Storage temperature Tstg -55 to +125 °C
Allowable Operating Ranges at Ta = -40 to 85°C, Vssd = Vssa = 0V
Parameter Symbol Pin Name Conditions Ratings Unit
min typ max
Supply voltage Vdd1 Vddd, Vdda 4.5 5.0 5.5 V
Vdd2 Vddd Serial data hold voltage 2.0 V
Input high-level
voltage VIH CL, DI, CE, SYR, T1, T2 0.7Vddd 6.5 V
Input low-level voltage VIL CL, DI, CE, SYR, T1, T2 0 0.3Vddd V
Output voltage VO DO, SYNC, RDS-ID, T3,
T4, T5, T6, T7
6.5 V
Input amplitude
VIN1 MPXIN f=57±2kHz 50 mVrms
VIN2 100% modulation composite 100 mVrms
VXIN XIN 400 1500
mVrms
Guaranteed crystal
Oscillator frequencies XTAL XIN, XOUT CI≤120Ω (XS=0 ) 4.332 MHz
CI≤70Ω (XS=1) 8.664 MHz
Crystal oscillator
frequency
deviation TXtal XIN, XOUT fo=4.332MHz, 8.664MHz ±100 ppm
Data setup time tSU DI, CL 0.75 μs
Data hold time tHD DI, CL 0.75 μs
Clock low level time tCL CL 0.75 μs
Clock high level time tCH CL 0.75 μs
CE wait time tEL CE, CL 0.75 μs
CE setup time tES CE, CL 0.75 μs
CE hold time tEH CE, CL 0.75 μs
CE high-level time tCE CE 20 ms
Data latch change
time tLC 1.15 μs
Data output time tDC DO,CL Differs depending on the value
of the pull-up resistor used.
0.46 μs
tDH DO,CE
0.46 μs
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating
C onditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.