ONET1151L
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11.3 Gbps Low-Power Laser Diode Driver
Check for Samples: ONET1151L
1FEATURES DESCRIPTION
Digitally Selectable Modulation Current up to The ONET1151L device is a 3.3-V laser driver
85 mApp (10-ΩLoad) designed to directly modulate a laser at data rates
Digitally Selectable Bias Current up to 100-mA from 1 to 11.3 Gbps.
Source or Sink The device provides a 2-wire serial interface, which
2-Wire Digital Interface With Integrated Digital- allows digital control of the modulation and bias
to-Analog Converters (DACs) and Analog-to- currents, eliminating the need for external
Digital Converter (ADC) for Control and components. Output waveform control, in the form of
Diagnostic Management cross-point adjustment, de-emphasis, and output
Automatic Power Control (APC) Loop termination resistance are available to improve the
optical eye mask margin. An optional input equalizer
Adjustable Output Resistance and De- can be used for equalization of up to 150 mm (6 in.)
Emphasis of microstrip or stripline transmission line on FR4-
Programmable Input Equalizer printed circuit boards. The device contains internal
ADC and DACs to eliminate the need for special
Cross-Point Control purpose microcontrollers.
Selectable Monitor PD Current Range and
Polarity The ONET1151L device includes an integrated
automatic power control (APC) loop, which
Includes Laser Safety Features compensates for variations in laser average power
Single +3.3-V Supply over voltage and temperature and circuitry to support
Temperature –40°C to 100°C laser safety and transceiver management systems.
Surface Mount 4-mm × 4-mm, 24-Pin RoHS- The laser driver is characterized for operation from
Compliant QFN Package –40°C ambient to +100°C temperatures and is
Pin-Compatible to the ONET1101L Device available in a small footprint 4-mm × 4-mm, 24-pin,
RoHS-compliant QFN package that is pin-compatible
to the ONET1101L device.
APPLICATIONS
10-Gigabit Ethernet Optical Transmitters
and 10× Fibre Channel Optical Transmitters
SONET OC-192 and SDH STM-64 Optical
Transmitters
6-G and 10-G CPRI and OBSAI
SFP+ and XFP Transceiver Modules
1Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Copyright © 2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
PD
ADR0
ADR1
DIS
SDA
SCK
2
1
3
4
5
6
17
18
16
15
14
13
87 9 10 11 12
2324 22 21 20 19
BIAS
GND
VCC
COMP
MONB
MONP
VCC
MOD±
MOD±
MOD+
VCC
MOD+
GND
DIN+
DIN±
GND
RZTC
FLT
ONET1101L
24 Lead QFN
³RGE´
ONET1151L
24-Lead QFN
ONET1151L
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
24-Pin, RoHS-Compliant, QFN Package, 4 mm x 4 mm
With a Lead Pitch of 0,5 mm
(TOP VIEW)
Table 1. PIN DESCRIPTION
PIN Type Description
NAME NO.
ADR0 2 Digital-in I2C address programming pin. Leave this pad open for a default address of 0001000.
Pulling the pin to VCC changes the first address bit to 1 (address = 0001001).
ADR1 3 Digital-in I2C address programming pin. Leave this pad open for a default address of 0001000.
Pulling the pin to VCC changes the second address bit to 1 (address = 0001010).
BIAS 18 Analog Sinks or sources the bias current for the laser in both APC and open loop modes
COMP 15 Analog Compensation pin used to control the bandwidth of the APC loop. Connect a 0.01-µF
capacitor to ground.
DIN+ 9 Analog-in Noninverted data input. On-chip differentially 100 Ωterminated to DIN–. Must be AC
coupled.
DIN– 10 Analog-in Inverted data input. On-chip differentially 100 Ωterminated to DIN+. Must be AC coupled.
DIS 4 Digital-in Disables both bias and modulation currents when set to high state. Includes a 10-kΩpullup
resistor to VCC. Toggle to reset a fault condition.
FLT 7 Digital-out Fault detection flag. High level indicates that a fault has occurred. Open-drain output.
Requires an external 4.7-kΩto 10-kΩpullup resistor to VCC for proper operation.
GND 8, 11, 17, EP Supply Circuit ground. Exposed die pad (EP) must be grounded.
MOD+ 20, 21 CML-out Noninverted modulation current output. IMOD flows into this pin when input data is high.
MOD– 22, 23 CML-out Inverted modulation current output. IMOD flows into this pin when input data is low.
MONB 13 Analog-out Bias current monitor. Sources a 1% replica of the bias current. Connect an external resistor
to ground (GND) to use the analog monitor (DMONB = 0). If the voltage at this pin exceeds
1.16 V, a fault is triggered. Typically choose a resistor to give MONB voltage of 0.8 V at the
maximum desired bias current. If the digital monitor function is used (DMONB = 1), the
resistor must be removed.
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Table 1. PIN DESCRIPTION (continued)
MONP 14 Analog-out Photodiode current monitor. Sources a 12.5% replica of the photodiode current when
PDRNG = 1X, a 25% replica when PDRNG = 01, and a 50% replica when PDRNG = 00.
Connect an external resistor (5-kΩtypical) to ground (GND) to use the analog monitor
(DMONP = 0). If the voltage at this pin exceeds 1.16 V, a fault is triggered when MONPFLT
= 1. If the digital monitor function is used (DMONP = 1), the resistor must be removed.
PD 1 Analog Photodiode input. Pin can source or sink current dependent on register setting.
RZTC 12 Analog Connect external zero TC 28.7-kΩresistor to ground (GND). Used to generate a defined
zero TC reference current for internal DACs.
SCK 5 Digital-in 2-wire interface serial clock input. Includes a 10-kΩor 40-kΩpullup resistor to VCC.
SDA 6 Digital-in 2-wire interface serial data input. Includes a 10-kΩor 40-kΩpullup resistor to VCC.
VCC 16, 19, 24 Supply 3.3-V, –15% to +10% supply voltage
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Limiter
8-Bit Register Crosspoint
IMOD
IBIAS
Settings
Crosspoint
Adjust
Crosspoint Adjust
Power-On
Reset
Band-Gap, Analog References,
Power Supply Monitor, and
Temperature Sensor
Bias
Current
Generator
or Monitor
and APC
2-Wire Interface and Control Logic
SDA
SCK
DIS
PD
FLT
BIAS
DIN+
DIN-
BIAS
FLT
PD
RZTC
RZTC
Settings
8-Bit Register
8-Bit Register
10-Bit Register
10-Bit Register
8-Bit Register
Output Settings
ADC Settings
10-Bit Register
8-Bit Register
ADC
Analog to
Digital
Conversion
DC Offset Cancellation
Adjustable
Boost
8-Bit Register
Equalizer
MONB
MONP
PSM
TS
SDA
SCK
DIS
VCC
10 k
10 k
10 k
COMP
COMP
Limiter Current
8-Bit Register
25
MONB MONB
MONP MONP
OUT+
OUT-
Mod.
Current
Generator
25
Equalizer
+
+
ADR0
ADR1
ADR0
ADR1
8-Bit Register Bias Current Fault
Amplifier
100
3-Bit Register Monitor Settings
8-Bit Register PD Current Fault
VCC
VCC To all Blocks Except Output Driver
ONET1151L
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BLOCK DIAGRAM
Figure 1 shows a simplified block diagram of the ONET1151L device. The laser driver consists of:
Equalizer
Limiter
Output driver
DC offset cancellation with cross-point control
Power-on reset circuitry
2-wire serial interface including:
Control logic block
Modulation current generator
Bias current generator
Automatic power control loop
Analog reference block
Figure 1. Simplified Block Diagram of the ONET1151L
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ABSOLUTE MAXIMUM RATINGS(1)
Over operating free-air temperature range (unless otherwise noted) MIN MAX UNIT
VCC Supply voltage(2) –0.3 4.0
VADR0, VADR1, VDIS, VRZTC, Voltage at ADR0, ADR1, DIS, RZTC, SCK, SDA, DIN+, DIN–, –0.3 4.0 V
VSCK, VSDA, VDIN+, VDIN, VFLT, FLT, MONB, MONP, COMP, PD, BIAS, MOD+, MOD–(2)
VMONB, VMONP, VCOMP, VPD,
VBIAS, VMOD+, VMOD
IDIN–, IDIN+ Max current at input pins 25 mA
IMOD+, IMOD– Max current at output pins 120
ESD ESD rating at all pins 2 kV (HBM)
TJMaximum junction temperature 125
TSTG Storage temperature range –65 150 °C
TCCase temperature –40 110
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to network ground terminal.
RECOMMENDED OPERATING CONDITIONS
Over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITION MIN NOM MAX UNIT
VCC Supply voltage 2.8 3.3 3.63
VIH Digital input high voltage DIS, SCK, SDA, ADR0, ADR1 2 V
VIL Digital input low voltage DIS, SCK, SDA 0.8
Photodiode current range Control bit PDRNG = 1X, step size = 3 µA 3 080
Control bit PDRNG = 01, step size = 1.5 µA 1 540 µA
Control bit PDRNG = 00, step size = 0.75 µA 770
RRZTC Zero TC resistor value(1) 1.16-V band-gap bias across resistor, E96, 1% 28.4 28.7 29 kΩ
accuracy
vIN Differential input voltage swing 150 1200 mVp-p
TCTemperature at the thermal pad –40 100 °C
(1) Changing the value will alter the DAC ranges.
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DC ELECTRICAL CHARACTERISTICS
Over recommended operating conditions, with a 25-Ωsingle-ended output load, open-loop operation, IMOD = 30 mA,
IBIAS = 30 mA, and RRZTC = 28.7 kΩ, unless otherwise noted
PARAMETER TEST CONDITION MIN NOM MAX UNIT
VCC Supply voltage 2.8 3.3 3.63 V
IMOD = 30 mA, IBIAS = 30 mA, including IMOD and IBIAS, 120 135
EQENA = 0
IVCC Supply current IMOD = 30 mA, IBIAS = 30 mA, including IMOD and IBIAS, 123 140 mA
EQENA = 1
Output off (DIS = HIGH), IMOD = 30 mA, IBIAS = 30 mA 44
RIN Data input resistance Differential between DIN+ and DIN– 80 100 120 Ω
ROUT Output resistance Single-ended to VCC; ORADJ0 = ORADJ1 = 0 20 25 30 Ω
Digital input current SCK, SDA, pullup to VCC 360 470 µA
Digital input current DIS, pullup to VCC 360 470 µA
VOH Digital output high FLT, pullup to VCC, ISOURCE = 50 µA 2.3 V
voltage
VOL Digital output low FLT, pullup to VCC, ISINK = 350 µA 0.4 V
voltage
IBIAS-MIN Minimum bias current See (1) 5 mA
IBIAS-MAX Maximum bias Sink or source. DAC set to maximum, open and 88 100 mA
current closed loop
IBIAS-DIS Bias current during 100 µA
disable
Average power APC active ±0.5 dB
stability BIASPOL = 0 (sink) 0.8
Bias pin compliance V
voltage BIASPOL = 1 (source) VCC 0.8
Temperature sensor With one-point external midscale calibration ±3 °C
accuracy
VPD Photodiode reverse APC active, IPD = max 1.3 2.3 V
bias voltage
Photodiode fault Percent of target IPD (2) 150 %
current level IMONP / IPD with control bit PDRNG = 1X 10 12.5 15
Photodiode current IMONP / IPD with control bit PDRNG = 01 20 25 30 %
monitor ratio IMONP / IPD with control bit PDRNG = 00 40 50 60
Monitor diode DMI With external midscale calibration –10 +10 %
accuracy PD current > 200 µA, 400 µA, and 800 µA for
PDRNG = 00, 01, and 1X, respectively
BIASPOL = 0, IMONB / IBIAS (nominal 1 / 100 = 1%) 0.9 1.0 1.1
Bias current monitor %
ratio BIASPOL = 1, IMONB / IBIAS (nominal 1 / 70 = 1.43%) 1.25 1.43 1.61
Bias current DMI Bias current 20 mA ±10 %
accuracy
Power supply monitor With external midscale calibration –2.5 +2.5 %
accuracy
VCC-RST VCC reset threshold VCC voltage level which triggers power-on reset 2.5 2.8 V
voltage
VCC- VCC reset threshold 100 mV
RSTHYS voltage hysteresis
VMONB- Fault voltage at Fault occurs if voltage at MONB exceeds value 1.1 1.16 1.24 V
FLT MONB
VMONP- Fault voltage at MONPFLT = 1, Fault occurs if voltage at MONP 1.1 1.16 1.24 V
FLT MONP exceeds value
(1) The bias current can be set below the specified minimum according to the corresponding register setting; however, in closed-loop
operation, settings below the specified value may trigger a fault.
(2) Assured by simulation over process, supply and temperature variation
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AC ELECTRICAL CHARACTERISTICS
Over recommended operating conditions with 25-Ω, single-ended output load, open-loop operation, IMOD = 30 mA,
IBIAS = 30 mA, and RRZTC = 28.7 kΩ, unless otherwise noted. Typical operating condition is at VCC = 3.3 V and TA= +25°C
PARAMETER TEST CONDITION MIN NOM MAX UNIT
0.01 GHz < f 5 GHz –15
Differential input return
SDD11 dB
gain 5 GHz < f < 11.1 GHz –8
SCD11 Differential to common 0.01 GHz < f < 11.1 GHz –15 dB
mode conversion gain 0.01 GHz < f 5 GHz 20
Differential output
SDD22 dB
return gain 5 GHz < f < 11.1 GHz –12
tR-OUT Output rise time 20% 80%, tR-IN < 40 ps, 25-Ωload, single- 23 35 ps
ended
tF-OUT Output fall time 20% 80%, tF-IN < 40 ps, 25-Ωload, single- 23 35 ps
ended
IMOD-MIN Minimum modulation 5 mA
current
IMOD-MAX Maximum modulation AC-coupled outputs, 10-Ωdifferential load, 75 85 mA
current CPENA = 1
IMOD-STEP Modulation current 10-bit register 86 µA
step size EQENA = 0, PRBS7 + 72 ones + PRBS7 + 5 10
72 zeros at 11.3 Gbps, 150 mVpp, 600
mVpp, 1200 mVpp differential-input voltage
Deterministic output
DJ psP-P
EQENA = 1, PRBS7 + 72 ones + PRBS7 + 7
jitter 72 zeros at 11.3 Gbps, maximum
equalization with 6-in. transmission line at the
input, 400 mVpp at input to transmission line
RJ Random output jitter 0.2 0.6 psRMS
τAPC APC time constant CAPC 0.01 µF, IPD = 100 µA, PD-coupling 120 µs
ratio, CR = 40(1)
Cross-point control 30 70 %
range
TOFF Transmitter disable Rising edge of DIS to IBIAS 0.1 × IBIAS- 0.05 5 µs
time NOMINAL(1)
TON Disable negate time Falling edge of DIS to IBIAS 0.9 × IBIAS- 1 ms
NOMINAL(1)
TINIT1 Power-on to initialize Power-on to registers ready to be loaded 1 10 ms
TINIT2 Initialize to transmit Register load STOP command to part ready 2 ms
to transmit valid data(1)
TRESET DIS pulse width Time DIS must held high to reset part(1) 100 ns
TFAULT Fault assert time Time from fault condition to FLT high(1) 50 µs
(1) Assured by simulation over process, supply and temperature variation
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DETAILED DESCRIPTION
EQUALIZER
The data signal is applied to an input equalizer by means of the input signal pins DIN+ and DIN–, which provide
on-chip differential 100-Ωline-termination. The equalizer is enabled by setting EQENA = 1 (bit 1 of register 0).
Equalization of up to 150 mm (6 in.) of microstrip or stripline transmission line on FR4-printed circuit boards is
achievable. The amount of equalization is digitally controlled by the 2-wire interface and control logic block and is
dependent on the register settings EQADJ[0..7] (of register 6). To turn off and bypass the equalizer, set EQENA
= 0; this reduces the supply current. For details about the equalizer settings, see Table 5.
LIMITER
By limiting the output signal of the equalizer to a fixed value, the limiter removes any overshoot after the input
equalization and provides the input signal for the output driver. Make adjustments to the limiter bias current and
emitter follower current to trade off the rise and fall times and supply current. Adjust the limiter bias current
through LIMCSGN (bit 7 of register 9) and LIMC[0..2] (bits 4, 5, and 6 of register 9). Adjust the emitter follower
current through EFCSGN (bit 3 of register 9) and EFC[0..2] (bits 0, 1, and 2 of register 9).
HIGH-SPEED OUTPUT DRIVER
The modulation current sinks from the common-emitter node of the limiting-output driver-differential pair by
means of a modulation-current generator, which is digitally controlled by the 2-wire serial interface.
The collector nodes of the output stages connect to output pins MOD+ and MOD–. The collectors have internal
25-Ωback termination resistors to VCC. However, the resistance adjusts higher through ORADJ[0..1] (bits 3 and
4 of register 8). Setting ORADJ to 00, results in the lowest-output termination resistance and setting the bits to
11, results in the highest-output resistance. The outputs are optimized to drive a 25-Ω, single-ended load and
obtain the maximum modulation current of 85 mA. AC coupling and inductive pullups to VCC are required and
CPENA (bit 4 of register 1) should be set to 1.
To improve the eye-mask margin, output de-emphasis is applied by adjusting DE[0..2] (bits 0 to 2 of register 8).
The polarity of the output pins can be inverted by setting the output polarity switch bit, POL (bit 2 of register 0) to
1.
MODULATION CURRENT GENERATOR
The modulation current generator provides the current for the current modulator described previously. The circuit
is digitally controlled by the 2-wire interface block.
A 10-bit-wide control bus, MODC[0..9] (registers 2 and 3), sets the desired modulation current.
The modulation current can be disabled by setting the DIS input pin to a high level or setting ENA = 0 (bit 7 of
register 0). The modulation current is also disabled in a fault condition, if the internal fault detection enable
register flag FLTEN is set to 1 (bit 3 of register 0). To reduce the disable time, only the output stage can be
disabled by setting DISMODE = 1 (bit 1 of register 1).
DC OFFSET CANCELLATION AND CROSS-POINT CONTROL
The ONET1151L device has DC offset cancellation by default to compensate for internal offset voltages. To
adjust the eye-crossing point, set CPENA = 1 (bit 4 of register 1) and disable the offset cancellation by setting
OCDIS = 1 (bit 3 of register 1). Note that setting OCDIS = 1 with CPENA = 0 is an invalid state and results in the
modulation current being disabled. The crossing point can be moved toward the one level by setting CPSGN = 1
(bit 7 of register 7) and toward the zero level by setting CPSGN = 0. The percentage of shift depends upon the
register settings CPADJ[0..6] (register 7) and the cross-point adjustment range bits CPRNG[0..1] (register 1).
Setting CPRNG1 = 0 and CPRNG0 = 0 results in minimum adjustment capability and setting CPRNG1 = 1 and
CPRNG0 = 1 results in maximum adjustment capability.
In addition, the modulation current capability is increased by setting CPENA = 1 with or without the offset
cancellation being disabled. Table 2 provides a truth table for the various options.
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Table 2. ADC Selection Bits and the Monitored Parameter
CPENA (Bit 4, Register OCDIS (Bit 3, Register 1) Cross-Point Adjust Offset Cancellation High Modulation Current
1)
0 0 Disabled Enabled Disabled
0 1 Invalid Invalid Invalid
1 0 Disabled Enabled Enabled
1 1 Enabled Disabled Enabled
BIAS CURRENT GENERATION AND APC LOOP
The bias current generation and APC loop are controlled by the 2-wire interface. In open-loop operation, selected
by setting OLENA = 1 (bit 4 of register 0), the bias current is set directly by the 10-bit-wide control word
BIASC[0..9] (registers 4 and 5). In automatic power control mode, selected by setting OLENA = 0, the bias
current depends on the register settings BIASC[0..9] and the coupling ratio (CR) between the laser bias current
and the photodiode current, CR = IBIAS / IPD. If the photodiode anode is connected to the PD pin (PD pin is
sinking current), set PDPOL = 1 (bit 0 of register 0), and if the photodiode cathode is connected to the PD pin
(PD pin is sourcing current), set PDPOL = 0.
Three photodiode current ranges are selected by means of the PDRNG[0..1] bits (register 0). Select the
photodiode range to keep the laser bias control DAC, BIASC[0..9], close to the center of its range. This range
keeps the laser bias current set-point resolution high. For details regarding the bias current setting in open-loop
mode, as well as in closed-loop mode, see Table 5.
The ONET1151L device can source or sink the bias current. For the BIAS pin to act as a source, set BIASPOL =
1 (bit 2 of register 1) and for the BIAS pin to act as a sink, set BIASPOL = 0.
The bias current in sink mode is monitored using a current mirror with a gain equal to 1/100 and in source mode
with a gain equal to 1/70. By connecting a resistor between MONB and GND, the bias current can be monitored
as a voltage across the resistor. A low temperature coefficient precision resistor should be used. The bias current
can also be monitored as a 10 bit unsigned digital word through the 2-wire interface by setting DMONB = 1 (bit 0
of register 10) and removing the resistor to ground.
ANALOG REFERENCE
The ONET1151L laser driver is supplied by a single 3.3-V ±10% supply voltage connected to the VCC pins. This
voltage is referred to GND and can be monitored as a 10-bit unsigned digital word through the 2-wire interface.
On-chip band-gap voltage circuitry generates a reference voltage, independent of the supply voltage, from which
all other internally required voltages and bias currents are derived.
An external zero temperature coefficient resistor must be connected from the RZTC pin of the device to ground
(GND). This resistor is used to generate a precise, zero TC current, which is required as a reference current for
the on-chip DACs.
To minimize the module component count, the ONET1151L device provides an on-chip temperature sensor. The
temperature can be monitored as a 10-bit unsigned digital word through the 2-wire interface.
POWER-ON RESET
The ONE1151L device has power-on reset circuitry, which ensures that registers are reset to zero during start-
up. After the power on to initialize time (tINIT1), the internal registers are ready to be loaded. The device is ready
to transmit data after the initialize-to-transmit time (tINIT2), assuming that the chip enable bit ENA is set to 1 and
the disable pin DIS is low. The DIS pin has an internal 10-kΩpullup resistor, so the pin must be pulled low to
enable the outputs.
The ONET1151L device can be disabled using either the ENA control register bit or the disable pin DIS. In both
cases, the internal registers are not reset. After the disable pin DIS is set low and/or the enable bit ENA is reset
to 1, the device returns to its previous output settings.
To reduce the disable time, only the output stage can be disabled by setting DISMODE = 1 (bit 1 of register 1).
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BIAS I (mA) = 0.19 ADCxu
BIAS I (mA) = 0.12 ADCxu
IPD($  $'& IRU3'51*x xu
IPD($  $'& IRU3'51*xu
IPD($  $'& IRU3'51*xu
2.25 ADC + 1380
Power supply voltage (V) = 1409xu
T_cal( C) 273 ADC + 1362
Temperature ( C) 273
ADC_cal + 1362 x u
q
q
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ANALOG-TO-DIGITAL CONVERTER
The ONE1151L device has an internal 10-bit ADC that converts the analog monitors for temperature, power-
supply voltage, bias current, and photodiode current into a 10-bit unsigned digital word. The first 8 most
significant bits (MSBs) are available in register 14 and the 2 least significant bits (LSBs) are available in register
15. Depending on the accuracy required, 8 or 10 bits can be read. However, to read the two registers, two
separate read commands must be sent due to the architecture of the 2-wire interface.
The ADC is enabled by default, and to monitor a particular parameter, select the parameter with ADCSEL[0..1]
(bits 0 and 1 of register 13). Table 3 shows the ADCSEL bits and the monitored parameter.
Table 3. ADC Selection Bits and the Monitored Parameter
ADCSEL1 ADCSEL0 Monitored Parameter
0 0 Temperature
0 1 Supply voltage
1 0 Photodiode current
1 1 Bias current
To digitally monitor the photodiode current, ensure that DMONP = 1 (bit 1 of register 10) and a resistor is not
connected to the MONP pin. To digitally monitor the bias current, ensure that DMONB = 1 (bit 0 of register 10)
and a resistor is not connected to the MONB pin. If the ADC is not used to monitor the various parameters, then
it can be disabled by setting ADCDIS = 1 (bit 7 of register 13) and OSCDIS = 1 (bit 6 of register 13).
The recommended procedure for reading the ADC follows:
1. Disable the ADC (set bit 7 of register 13 to 1).
2. Set the desired ADC mode (set bits 0 and 1 of register 13 per Table 3).
3. Enable the ADC (set bit 7 of register 13 to 0).
4. Wait 500 µs.
5. Disable the ADC (set bit 7 of register 13 to 1).
6. Read the ADC conversion result from register 14 (MSB) and register 15 (LSB).
Convert the digital word read from the ADC to its analog equivalent through the following formulas.
Temperature without a midpoint calibration:
(1)
Temperature with a midpoint calibration:
(2)
Power supply voltage:
(3)
Photodiode current monitor:
(4)
(5)
(6)
Bias current monitor source mode:
(7)
Bias current monitor sink mode:
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where
ADCx = the decimal value read from the ADC
T_cal = the calibration temperature
ADC_cal = the decimal value read from the ADC at the calibration temperature (8)
For the photodiode and bias current monitors, a nonzero current must be applied to the ADC in order to read
back a valid result. For the cases when the bias current is set to zero, the DIS pin is set high or the ENA bit is set
to 0, bias current is not applied to the ADC and the digital reading is not valid.
2-WIRE INTERFACE AND CONTROL LOGIC
The ONET1151L device uses a 2-wire serial interface for digital control. The two circuit inputs, SDA and SCK,
are driven, respectively, by the serial data and serial clock from a microprocessor, for example. The SDA and
SCK pins have internal 10-kΩpullups to VCC. If a common interface is used to control multiple parts, the internal
pullups can be switched to 40 kΩby setting the TWITERM bit to 1 (bit 0 of register 1). The internal pullups
automatically switch to 40 kΩ, if the slave address is changed from its default value using the ADR0 or ADR1
pins.
The 2-wire interface allows write access to the internal memory map to modify control registers and read access
to read the control signals. The ONET1151L device is a slave device, which means that it cannot initiate a
transmission itself. The ONET1151L device always relies on the availability of the SCK signal for the duration of
the transmission. The master device provides the clock signal as well as the START and STOP commands. The
protocol for a data transmission is as follows:
1. START command
2. 7-bit slave address (0001000) followed by an eighth bit, which is the data direction bit (R/W). 0 indicates a
Write and 1 indicates a Read.
3. 8-bit register address
4. 8-bit register data word
5. STOP command
The first 2 bits of the slave address can be changed to 1 by grounding the ADR0 and ADR1 pins.
Regarding timing, the ONET1151L device is I2C compatible. Figure 2 shows the typical timing. Figure 3 shows a
complete data transfer. Table 4 lists parameters for Figure 2.
Descriptions of various events on the 2-wire interface follow:
Bus idle: Both SDA and SCK lines remain High.
Start data transfer: A change in the state of the SDA line, from High to Low, while the SCK line is High, defines
a Start condition (S). Each data transfer initiates with a Start condition.
Stop data transfer: A change in the state of the SDA line from Low to High while the SCK line is High, defines a
Stop condition (P). Each data transfer is terminated with a Stop condition. However, if the master still wishes to
communicate on the bus, it can generate a repeated Start condition and address another slave without first
generating a Stop condition.
Data transfer: Only one data byte can be transferred between a Start and a Stop condition. The receiver
acknowledges the transfer of data.
Acknowledge: Each receiving device, when addressed, is obliged to generate an acknowledge bit. The
transmitter releases the SDA line and a device that acknowledges must pull down the SDA line during the
acknowledge clock pulse so that the SDA line is stable Low during the High period of the acknowledge clock
pulse. Setup and hold times must be taken into account. When a slave-receiver does not acknowledge the slave
address, the data line must be left High by the slave. The master can then generate a Stop condition to abort the
transfer. If the slave-receiver does acknowledge the slave address, but some time later in the transfer cannot
receive any more data bytes, the master must abort the transfer. The slave indicates by generating no
acknowledgment on the first byte to follow. The slave leaves the data line High, and the master generates the
Stop condition.
Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 11
Product Folder Links: ONET1151L
tBUF
tHDSTA
tR
tLOW
tHDDAT
tHIGH tF
tSUDAT tSUSTA
tHDSTA
tSUSTO
P S S P
SDA
SCK
ONET1151L
SLLSEI7 DECEMBER 2013
www.ti.com
Figure 2. I2C Timing Diagram
12 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: ONET1151L
S Slave Address Wr A Register Address A Data Byte A P
1711 8 1 8 11
S Slave Address Wr A Register Address A Data Byte N P
1711 8 1 8 11
Write Sequence
Read Sequence
S
1
Slave Address Rd A
711
Legend
SStart Condition
Wr Write Bit (bit value = 0)
Rd Read Bit (bit value = 1)
AAcknowledge
NNot Acknowledged
P Stop Condition
ONET1151L
www.ti.com
SLLSEI7 DECEMBER 2013
Table 4. Timing Diagram Definitions
PARAMETER MIN MAX UNIT
fSCK SCK clock frequency 400 kHz
tBUF Bus free time between Start and Stop conditions 1.3 μs
tHDSTA Hold time after repeated Start condition. After this period, 0.6 μs
the first clock pulse is generated
tLOW Low period of the SCK clock 1.3 μs
tHIGH High period of the SCK clock 0.6 μs
tSUSTA Setup time for a repeated Start condition 0.6 μs
tHDDAT Data hold time 0 μs
tSUDAT Data setup time 100 ns
tRRise time of both SDA and SCK signals 300 ns
tFFall time of both SDA and SCK signals 300 ns
tSUSTO Setup time for Stop condition 0.6 μs
Figure 3. Programming Sequence
Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 13
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REGISTER MAPPING
Figure 4 through Figure 19 show the register mapping for register addresses 0 (0x00) through 15 (0x0F),
respectively.
register address 0 (0x00)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
ENA PDRNG1 PDRNG0 OLENA FLTEN POL EQENA PDPOL
Figure 4. Register 0 (0x00) Mapping Control Settings
register address 1 (0x01)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
CPTC CPRNG1 CPRNG0 CPENA OCDIS BIASPOL DISMODE TWITERM
Figure 5. Register 1 (0x01) Mapping Control Settings
register address 2 (0x02)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
MODC1 MODC0
Figure 6. Register 2 (0x02) Mapping Modulation Current
register address 3 (0x03)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
MODC9 MODC8 MODC7 MODC6 MODC5 MODC4 MODC3 MODC2
Figure 7. Register 3 (0x03) Mapping Modulation Current
register address 4 (0x04)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
BIASC1 BIASC0
Figure 8. Register 4 (0x04) Mapping Bias Current
register address 5 (0x05)
bit 7 bit 6 bit 5 bit 7 bit 6 bit 5 bit 4 bit 3
BIASC9 BIASC8 BIASC7 BIASC6 BIASC5 BIASC4 BIASC3 BIASC2
Figure 9. Register 5 (0x05) Mapping Bias Current
register address 6 (0x06)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
EQADJ7 EQADJ6 EQADJ5 EQADJ4 EQADJ3 EQADJ2 EQADJ1 EQADJ0
Figure 10. Register 6 (0x06) Mapping Equalizer Adjust
register address 7 (0x07)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
CPSGN CPADJ6 CPADJ5 CPADJ4 CPADJ3 CPADJ2 CPADJ1 CPADJ0
Figure 11. Register 7 (0x07) Mapping Cross-Point Adjust
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register address 8 (0x08)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
LOWGAIN ORADJ1 ORADJ0 DE2 DE1 DE0
Figure 12. Register 8 (0x08) Mapping Output Adjustments
register address 9 (0x09)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
LIMCSGN LMC2 LIMC1 LIMC0 EFCSGN EFC2 EFC1 EFC0
Figure 13. Register 9 (0x09) Mapping Limiter Bias Current Adjust
register address 10 (0x0A)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
MONPFLT DMONP DMONB
Figure 14. Register 10 (0x0A) Mapping Monitor Settings
register address 11 (0x0B)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
BMF7 BMF6 BMF5 BMF4 BMF3 BMF2 BMF1 BMF0
Figure 15. Register 11 (0x0B) Mapping Bias Monitor Fault Settings
register address 12 (0x0C)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
PMF7 PMF6 PMF5 PMF4 PMF3 PMF2 PMF1 PMF0
Figure 16. Register 12 (0x0C) Mapping Power Monitor Fault Settings
register address 13 (0x0D)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
ADCDIS OSCDIS ADCSEL1 ADCSEL0
Figure 17. Register 13 (0x0D) Mapping ADC Settings
register address 14 (0x0E)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
ADC9 ADC8 ADC7 ADC6 ADC5 ADC4 ADC3 ADC2
Figure 18. Register 14 (0x0E) Mapping ADC Output (Read Only)
register address 15 (0x0F)
bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0
ADC1 ADC0
Figure 19. Register 15 (0x0F) Mapping ADC Output (Read Only)
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Table 5 describes the circuit functionality based on the register settings.
Table 5. Register Functionality
Register Bit Symbol Function
Enable chip bit
7 ENA 1 = Chip enabled, can be toggled low to reset a fault condition.
0 = Chip disabled
Photodiode current range bits
6 PDRNG1 1X: up to 3080-µA / 3-µA resolution
5 PDRNG0 01: up to 1540-µA / 1.5-µA resolution
00: up to 770-μA / 0.75-μA resolution
Open-loop enable bit
4 OLENA 1 = Open-loop bias current control
0 = Closed-loop bias current control
Fault detection enable bit
03 FLTEN 1 = Fault detection on
0 = Fault detection off
Output polarity switch bit
2 POL 1: pin 22 = OUT– and pin 21 = OUT+
0: pin 22 = OUT+ and pin 21 = OUT–
Equalizer enable bit
1 EQENA 1 = Equalizer is enabled
0 = Equalizer is disabled and bypassed
Photodiode polarity bit
0 PDPOL 1 = Photodiode cathode connected to VCC
0 = Photodiode anode connected to GND
Cross-point temperature coefficient adjustment bit
7 CPTC 1 = Cross-point temperature coefficient is enabled
0 = Cross-point temperature coefficient is disabled
Cross-point adjustment range bits
6 CPRNG1 Minimum adjustment range for 00
5 CPRNG0 Maximum adjustment range for 11
Cross-point adjustment enable bit
4 CPENA 1 = Cross-point adjustment is enabled. Setting to 1 with OCDIS = 0 or 1 increases the modulation current.
0 = Cross-point adjustment is disabled
Offset cancellation disable bit
1 3 OCDIS 1 = DC offset cancellation is disabled. Do not set to 1 with CPENA set to 0.
0 = DC offset cancellation is enabled
Bias current polarity bit
2 BIASPOL 1 = Bias pin sources current
0 = Bias pin sinks current
Disable mode setting bit
1 DISMODE 1 = Only the output stage is disabled (fast-disable mode)
0 = Major parts of the signal path are disabled
2-wire interface input termination select bit
0 TWITERM 1 = 40 kΩselected
0 = 10 kΩselected
1 MODC1
20 MODC0
7 MODC9
6 MODC8
5 MODC7 Modulation current setting: sets the output voltage
Modulation current : 85-mA or 86-μA steps
4 MODC6
33 MODC5
2 MODC4
1 MODC3
0 MODC2
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Table 5. Register Functionality (continued)
Register Bit Symbol Function
1 BIASC1
40 BIASC0
7 BIASC9 Closed loop (APC):
6 BIASC8 Coupling ratio CR = IBIAS / IPD, BIASC = 0..1023, IBIAS 100 mA:
PDRNG = 00 (see above); IBIAS = 0.75 µA × CR × BIASC
5 BIASC7 PDRNG = 01 (see above); IBIAS = 1.5 µA × CR × BIASC
4 BIASC6 PDRNG = 1X (see above); IBIAS = 3 µA × CR × BIASC
5Open loop:
3 BIASC5 IBIAS = 102 µA × BIASC
2 BIASC4
1 BIASC3
0 BIASC2
7 EQADJ7
6 EQADJ6 Equalizer adjustment setting
5 EQADJ5 EQENA = 0 (see above)
4 EQADJ4 Equalizer is turned off and bypassed
6EQENA = 1 (see above)
3 EQADJ3 Maximum equalization for 00000000
2 EQADJ2 Minimum equalization for 11111111
1 EQADJ1
0 EQADJ0
7 CPSGN
6 CPADJ6 Eye cross-point adjustment setting
5 CPADJ5 CPSGN = 1 (positive shift)
Maximum shift for 1111111
4 CPADJ4
7 Minimum shift for 0000000
3 CPADJ3 CPSGN = 0 (negative shift)
Maximum shift for 1111111
2 CPADJ2 Minimum shift for 0000000
1 CPADJ1
0 CPADJ0
Path-gain control bit
7 LOWGAIN 1 = Half gain used to reduce power if cross-point adjustment is not used
0 = Full gain
6
5
8Output resistance adjustment setting
4 ORADJ1 00 = Lowest resistance
3 ORADJ0 11 = Highest resistance
2 DE2 Output De-emphasis adjustment setting
1 DE1 000 = No de-emphasis
0 DE0 111 = Maximum de-emphasis
Limiter bias current sign bit
7 LIMCSGN 1 = Decrease limiter bias current
0 = Increase limiter bias current
6 LIMC2 Limiter bias current selection bits
5 LIMC1 000 = No change
4 LIMC0 111 = Maximum current change
9Emitter follower sign bit
3 EFCSGN 1 = Decrease emitter follower current
0 = Increase emitter follower current
2 EFC2 Emitter follower current selection bits
1 EFC1 000 = No change
0 EFC0 111 = Maximum current change
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Table 5. Register Functionality (continued)
Register Bit Symbol Function
7
6
5
4
3
Analog photodiode current monitor fault trigger bit
10 2 MONPFLT 1 = Fault trigger on MONP pin is enabled
0 = Fault trigger on MONP pin is disabled
Digital photodiode current monitor selection bit (MONP)
1 DMONP 1 = Digital photodiode monitor is active (no external resistor is needed)
0 = Analog photodiode monitor is active (external resistor is required)
Digital bias current monitor selection bit (MONB)
0 DMONB 1 = Digital bias current monitor is active (no external resistor is needed)
0 = Analog bias current monitor is active (external resistor is required)
7 BMF7
6 BMF6
5 BMF5 Bias current monitor fault threshold
4 BMF4 With DMONB = 1
11 Register sets the value of the bias current that will trigger a fault.
3 BMF3 The external resistor on the MONB pin must be removed to use this feature.
2 BMF2
1 BMF1
0 BMF0
7 PMF7
6 PMF6
5 PMF5 Power monitor fault threshold
4 PMF4 With DMONP = 1
12 Register sets the value of the photodiode current that will trigger a fault.
3 PMF3 The external resistor on the MONP pin must be removed to use this feature.
2 PMF2
1 PMF1
0 PMF0
ADC disable bit
7 ADCDIS 1 = ADC disabled
0 = ADC enabled
ADC oscillator bit
6 OSCDIS 1 = Oscillator disabled
0 = Oscillator enabled
5
13 4
3
2
ADC input selection bits
00 selects the temperature sensor
1 ADCSEL1 01 selects the power supply monitor
0 ADCSEL0 10 selects MONP
11 selects MONB
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Table 5. Register Functionality (continued)
Register Bit Symbol Function
7 ADC9 (MSB)
6 ADC8
5 ADC7
4 ADC6
14 Digital representation of the ADC input source (read only)
3 ADC5
2 ADC4
1 ADC3
0 ADC2
7
6
5
4
15 3
2
1 ADC1 Digital representation of the ADC input source (read only)
0 ADC0 (LSB)
LASER SAFETY FEATURES AND FAULT RECOVERY PROCEDURE
The ONET1151L device provides built-in laser safety features. The following fault conditions are detected:
Voltage at MONB exceeds the voltage at RZTC (1.16 V), or alternately, if DMONB = 1 and the bias current
exceeds the bias current monitor fault threshold set by BMF[0..7] (register 11). When using the digital
monitor, the resistor to ground must be removed.
Voltage at MONP exceeds the voltage at RZTC (1.16 V) and the analog photodiode current monitor fault
trigger bit, MONPFLT (bit 2 of register 10), is set to 1. Alternately, a fault can be triggered if DMONP = 1 and
the bias current exceeds the bias current monitor fault threshold set by PMF[0..7] (register 12). When using
the digital monitor, the resistor to ground must be removed.
Photodiode current exceeds 150% of its set value.
Bias control DAC drops in value by more than 50% in one step.
If one or more fault conditions occur, and the fault enable bit FLTEN is set to 1, the ONET1151L device responds
by:
1. Setting the bias current to 0
2. Setting the modulation current to 0
3. Asserting and latching the FLT pin
Fault recovery is achieved by performing the following procedure:
1. The disable pin DIS, or the internal enable control bit ENA, or both, are toggled for at least the fault latch
reset time.
2. The FLT pin deasserts while the disable pin DIS is asserted or the enable bit ENA is deasserted.
3. If the fault condition is no longer present, the device returns to typical operation with its previous output
settings, after the disable negate time.
4. If the fault condition is still present, FLT reasserts once DIS is set to a low level and the part does not return
to typical operation.
Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 19
Product Folder Links: ONET1151L
MONP
DIN+
DIN±
MONB
MOD+
MOD-
VCC
PD
ADR0
DIS
SCK
SDA
MOD-
VCC
MOD+
GND
FLT
GND
RZTC
ADR1
BIAS
GND
VCC
COMP
ONET1151L
DIN+
DIN-
C1
C2
0.1 F
0.1 F
FLT
RZTC
RMONB
5 k
1.2 k
RMONP
MONB
MONP
SDA
SDK
DIS
0.1 F
LD Monitor
Photodiode
0.1 F
VCC
0.1 F
0.1 F
0.1 F
0.1 F
0.01 F
CCOMP
28.7 k
Optional
0.1 F
ONET1151L
SLLSEI7 DECEMBER 2013
www.ti.com
APPLICATIONS INFORMATION
Figure 20 shows a typical application circuit using the ONET1151L device with a differentially driven laser. The
laser driver is controlled through the 2-wire interface SDA and SCK by a microcontroller.
Figure 20. AC-Coupled Differential Drive
LAYOUT GUIDELINES
For optimum performance, use 50-Ωtransmission lines (100-Ωdifferential) for connecting the signal source to
the DIN+ and DIN– pins and 25-Ωtransmission lines (50-Ωdifferential) for connecting the modulation current
outputs, MOD+ and MOD-, to the laser. The length of the transmission lines should be kept as short as possible
to reduce loss and pattern-dependent jitter. TI recommends assembling the series matching resistor as close as
possible to the TOSA, if required.
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Product Folder Links: ONET1151L
0
5
10
15
20
25
30
35
±40 ±20 0 20 40 60 80 100
Transition Time (ps)
TA ± Free-Air Temperature (C)
C006
0
5
10
15
20
25
30
35
0 200 400 600 800 1000 1200
Transition Time (ps)
Modulation Current Register Setting ± Decimal
C005
0.0
0.1
0.2
0.3
0.4
0 200 400 600 800 1000 1200
Random Jitter (psrms)
Modulation Current Register Setting ± Decimal
C003
0.0
0.1
0.2
0.3
0.4
±40 ±20 0 20 40 60 80 100
Random Jitter (psrms)
TA ± Free-Air Temperature (C)
C004
0
2
4
6
8
0 200 400 600 800 1000 1200
Deterministic Jitter (pspp)
Modulation Current Register Setting ± Decimal
C001
0.00
2.00
4.00
6.00
8.00
-40 -20 0 20 40 60 80 100
Deterministic Jitter (pspp)
TA ± Free-Air Temperature (C)
C002
ONET1151L
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TYPICAL OPERATION CHARACTERISTICS
Typical operating condition is at VCC = +3.3 V, TA= +25°C, IBIASC = 30 mA, IMODC = 30 mA, VIN = 600 mVpp (unless otherwise
noted).
DETERMINISTIC JITTER DETERMINISTIC JITTER
vs vs
MODULATION CURRENT TEMPERATURE
Figure 21. Figure 22.
RANDOM JITTER RANDOM JITTER
vs vs
MODULATION CURRENT TEMPERATURE
Figure 23. Figure 24.
RISE-TIME AND FALL-TIME RISE-TIME AND FALL-TIME
vs vs
MODULATION CURRENT TEMPERATURE
Figure 25. Figure 26.
Copyright © 2013, Texas Instruments Incorporated Submit Documentation Feedback 21
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100
110
120
130
140
150
±40 ±20 0 20 40 60 80 100
Supply Current (mA)
TA ± Free-Air Temperature (C)
C011
14.8 ps/Div
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.0 0.5 1.0 1.5 2.0 2.5
Photodiode Monitor Current (mA)
Photodiode Current (mA)
C009
0
10
20
30
40
50
60
70
80
90
100
0 200 400 600 800 1000 1200
Modulation Current (mA)
Modulation Current Register Setting (Decimal)
C010
0
20
40
60
80
100
120
0 200 400 600 800 1000 1200
Sink OL Bias Current (mA)
Bias Current Register Setting (Decimal)
C007
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.2
0 20 40 60 80 100
Bias Monitor Current (mA)
Bias Current (mA)
C008
ONET1151L
SLLSEI7 DECEMBER 2013
www.ti.com
TYPICAL OPERATION CHARACTERISTICS (continued)
Typical operating condition is at VCC = +3.3 V, TA= +25°C, IBIASC = 30 mA, IMODC = 30 mA, VIN = 600 mVpp (unless otherwise
noted). BIAS CURRENT IN OPEN LOOP MODE BIAS-MONITOR CURRENT IMONB
vs vs
BIASC REGISTER SETTING BIAS CURRENT
Figure 27. Figure 28.
PHOTODIODE-MONITOR CURRENT IMONP MODULATION CURRENT
vs vs
PD CURRENT, PDRNG = 01 MODC REGISTER SETTING
Figure 29. Figure 30.
SUPPLY CURRENT
vs
TEMPERATURE
Figure 31. Figure 32. Eye-Diagram at 11.3 Gbps IMOD = 20 mA,
EQENA = 0
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14.8 ps/Div
14.8 ps/Div
14.8 ps/Div
ONET1151L
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SLLSEI7 DECEMBER 2013
TYPICAL OPERATION CHARACTERISTICS (continued)
Typical operating condition is at VCC = +3.3 V, TA= +25°C, IBIASC = 30 mA, IMODC = 30 mA, VIN = 600 mVpp (unless otherwise
noted).
Figure 33. Eye-Diagram at 11.3 Gbps IMOD = 40 mA, Figure 34. Eye-Diagram at 11.3 Gbps PRBS-31 Pattern,
IMOD= 60 mA, EQENA = 0
EQENA = 0
Figure 35. Eye-Diagram at 11.3 Gbps IMOD = 40 mA, EQENA = 1, 12 in. of FR4 at Inputs
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PACKAGE OPTION ADDENDUM
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Addendum-Page 1
PACKAGING INFORMATION
Orderable Device Status
(1)
Package Type Package
Drawing Pins Package
Qty Eco Plan
(2)
Lead/Ball Finish
(6)
MSL Peak Temp
(3)
Op Temp (°C) Device Marking
(4/5)
Samples
ONET1151LRGER ACTIVE VQFN RGE 24 3000 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 100 ONET
1151L
ONET1151LRGET ACTIVE VQFN RGE 24 250 Green (RoHS
& no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 100 ONET
1151L
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
PACKAGE OPTION ADDENDUM
www.ti.com 13-Dec-2013
Addendum-Page 2
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device Package
Type Package
Drawing Pins SPQ Reel
Diameter
(mm)
Reel
Width
W1 (mm)
A0
(mm) B0
(mm) K0
(mm) P1
(mm) W
(mm) Pin1
Quadrant
ONET1151LRGER VQFN RGE 24 3000 330.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2
ONET1151LRGET VQFN RGE 24 250 180.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2
PACKAGE MATERIALS INFORMATION
www.ti.com 22-Feb-2018
Pack Materials-Page 1
*All dimensions are nominal
Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)
ONET1151LRGER VQFN RGE 24 3000 367.0 367.0 35.0
ONET1151LRGET VQFN RGE 24 250 210.0 185.0 35.0
PACKAGE MATERIALS INFORMATION
www.ti.com 22-Feb-2018
Pack Materials-Page 2
GENERIC PACKAGE VIEW
Images above are just a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
RGE 24 VQFN - 1 mm max height
PLASTIC QUAD FLATPACK - NO LEAD
4204104/H
www.ti.com
PACKAGE OUTLINE
C
SEE TERMINAL
DETAIL
24X 0.3
0.2
2.45 0.1
24X 0.5
0.3
1 MAX
(0.2) TYP
0.05
0.00
20X 0.5
2X
2.5
2X 2.5
A4.1
3.9 B
4.1
3.9 0.3
0.2
0.5
0.3
VQFN - 1 mm max heightRGE0024B
PLASTIC QUAD FLATPACK - NO LEAD
4219013/A 05/2017
PIN 1 INDEX AREA
0.08 C
SEATING PLANE
1
613
18
7 12
24 19
(OPTIONAL)
PIN 1 ID 0.1 C A B
0.05
EXPOSED
THERMAL PAD
25 SYMM
SYMM
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
SCALE 3.000
DETAIL
OPTIONAL TERMINAL
TYPICAL
www.ti.com
EXAMPLE BOARD LAYOUT
0.07 MIN
ALL AROUND
0.07 MAX
ALL AROUND
24X (0.25)
24X (0.6)
( 0.2) TYP
VIA
20X (0.5)
(3.8)
(3.8)
( 2.45)
(R0.05)
TYP
(0.975) TYP
VQFN - 1 mm max heightRGE0024B
PLASTIC QUAD FLATPACK - NO LEAD
4219013/A 05/2017
SYMM
1
6
712
13
18
19
24
SYMM
LAND PATTERN EXAMPLE
EXPOSED METAL SHOWN
SCALE:15X
NOTES: (continued)
4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature
number SLUA271 (www.ti.com/lit/slua271).
5. Vias are optional depending on application, refer to device data sheet. If any vias are implemented, refer to their locations shown
on this view. It is recommended that vias under paste be filled, plugged or tented.
25
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
SOLDER MASK
DEFINED
EXPOSED
METAL
METAL
SOLDER MASK
OPENING
SOLDER MASK DETAILS
NON SOLDER MASK
DEFINED
(PREFERRED)
EXPOSED
METAL
www.ti.com
EXAMPLE STENCIL DESIGN
24X (0.6)
24X (0.25)
20X (0.5)
(3.8)
(3.8)
4X ( 1.08)
(0.64)
TYP
(0.64) TYP
(R0.05) TYP
VQFN - 1 mm max heightRGE0024B
PLASTIC QUAD FLATPACK - NO LEAD
4219013/A 05/2017
NOTES: (continued)
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
25
SYMM
METAL
TYP
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
EXPOSED PAD 25
78% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGE
SCALE:20X
SYMM
1
6
712
13
18
19
24
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ONET1151LRGER ONET1151LRGET