IRFB/S/SL3607PbF
2www.irf.com
S
D
G
ISD ≤ 46A, di/dt ≤ 1920A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
Coss eff. (TR) is a fixed capacitance that gives the same charging time
as Coss while VDS is rising from 0 to 80% VDSS.
Coss eff. (ER) is a fixed capacitance that gives the same energy as
Coss while VDS is rising from 0 to 80% VDSS.
When mounted on 1" square PCB (FR-4 or G-10 Material). For recom-
mended footprint and soldering techniques refer to application note #AN-994.
Rθ is measured at TJ approximately 90°C.
Notes:
Calculated continuous current based on maximum allowable junction
temperature. Note that current limitations arising from heating of the
device leads may occur with some lead mounting arrangements.
Repetitive rating; pulse width limited by max. junction
temperature.
Limited by TJmax, starting TJ = 25°C, L = 0.12mH
RG = 25Ω, IAS = 46A, VGS =10V. Part not recommended for use
above this value.
Static @ T
J
= 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units
V
(BR)DSS
Drain-to-Source Breakdown Volta
e 75 ––– ––– V
∆V
(BR)DSS
∆T
J
Breakdown Volta
e Temp. Coefficient ––– 0.096 ––– V/°C
R
DS(on)
Static Drain-to-Source On-Resistance ––– 7.34 9.0 mΩ
V
GS(th)
Gate Threshold Volta
e 2.0 ––– 4.0 V
I
DSS
Drain-to-Source Leaka
e Current ––– ––– 20 µA
––– ––– 250
I
GSS
Gate-to-Source Forward Leaka
e ––– ––– 100 nA
Gate-to-Source Reverse Leaka
e ––– ––– -100
Dynamic @ T
J
= 25°C (unless otherwise specified)
Symbol Parameter Min. Typ. Max. Units
fs Forward Transconductance 115 ––– ––– S
Q
g
Total Gate Char
e ––– 56 84 nC
Q
gs
Gate-to-Source Char
e ––– 13 –––
Q
gd
Gate-to-Drain ("Miller") Char
e ––– 16 –––
Q
sync
Total Gate Char
e Sync. (Q
g
- Q
gd
)––– 40 –––
R
G(int)
Internal Gate Resistance ––– 0.55 ––– Ω
t
d(on)
Turn-On Delay Time ––– 16 ––– ns
t
r
Rise Time ––– 110 –––
t
d(off)
Turn-Off Delay Time ––– 43 –––
t
f
Fall Time ––– 96 –––
C
iss
Input Capacitance ––– 3070 ––– pF
C
oss
Output Capacitance ––– 280 –––
C
rss
Reverse Transfer Capacitance ––– 130 –––
C
oss
eff. (ER) Effective Output Capacitance (Energy Related)
––– 380 –––
C
oss
eff. (TR) Effective Output Capacitance (Time Related)
h
––– 610 –––
Diode Characteristics
Symbol Parameter Min. Typ. Max. Units
I
S
Continuous Source Current ––– ––– 80
c
A
(Body Diode)
I
SM
Pulsed Source Current ––– ––– 310
(Body Diode)
d
V
SD
Diode Forward Volta
e ––– ––– 1.3 V
t
rr
Reverse Recovery Time ––– 33 50 ns T
J
= 25°C V
R
= 64V,
––– 39 59 T
J
= 125°C I
F
= 46A
Q
rr
Reverse Recovery Char
e ––– 32 48 nC T
J
= 25°C
t
=
µs
––– 47 71 T
J
= 125°C
I
RRM
Reverse Recovery Current ––– 1.9 ––– A T
J
= 25°C
t
on
Forward Turn-On Time Intrinsic turn-on time is ne
li
ible (turn-on is dominated by LS+LD)
Conditions
V
DS
= 50V, I
D
= 46A
I
D
= 46A
V
GS
= 20V
V
GS
= -20V
MOSFET symbol
showing the
V
DS
= 38V
Conditions
V
GS
= 10V
g
V
GS
= 0V
V
DS
= 50V
ƒ = 1.0MHz
V
GS
= 0V, V
DS
= 0V to 60V
j
V
GS
= 0V, V
DS
= 0V to 60V
h
T
J
= 25°C, I
S
= 46A, V
GS
= 0V
g
integral reverse
p-n junction diode.
Conditions
V
GS
= 0V, I
D
= 250µA
Reference to 25°C, I
D
= 5mA
d
V
GS
= 10V, I
D
= 46A
g
V
DS
= V
GS
, I
D
= 100µA
V
DS
= 75V, V
GS
= 0V
V
DS
= 60V, V
GS
= 0V, T
J
= 125°C
I
D
= 46A
R
G
= 6.8Ω
V
GS
= 10V
g
V
DD
= 49V
I
D
= 46A, V
DS
=0V, V
GS
= 10V
http://store.iiic.cc/