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Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON
Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA
Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended
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July 2014
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0
FAN4149 Ground Fault Interrupter
FAN4149
Ground Fault Interrupter
Features
Meets 2015 UL943 Self-Test Requirements
(in combination with FAN41501)
Precision Sense Amplifier and Bandgap Reference
Low-VOS Offset for Direct DC Coupl ing o f Sense Coil
Built-in Noise Filter
High-Current SCR Gate Driver
Adjustable Sensitivity
500 µA Quiescent Current
Minimum External Components
Ideal for 120 V or 220 V Systems
Space-Saving, SOT23, 6-Pin Package
Applications
GFCI Output Receptacle
GFCI Circuit Breakers
Portable GF C I Cords
Residual-Current Devices (RCD)
Description
The FAN4149 is a low-power controller for detecting
hazardous current paths to ground and ground-to-
neutral faults. The FAN4149 application circuit opens
the load contacts before a harmful shock occ urs.
The FAN4149, in combination with the FAN41501 auto-
monitoring digit al controll er, meets the 20 15 UL943 self -
test requirements for permanently connected GFCI
products. The FAN4149 detects and protects against a
hot-wire-to-ground fault and a neutral-to-line/load short.
The FAN41501 periodically monitors the FAN4149 and
critical GFI components to comply wit h the 2015 UL943
requirements. The minimum numb er of com ponent s an d
the small 6-pin package allow for a dense, flexible,
application solution.
The FAN4149 contains a precision bandgap 14 V shunt
regulator, precision low-VOS sense amplifier, time-delay
noise filter, wi ndow-detection comparators, and an SCR
driver. The shunt regulator operates with a low
quiescent current, which allows for a high value, low-
wattage series supply resistor. T he internal temperature
compensated shunt regulator, sense amplifier, and bias
circuitry provide for precision ground-fault detection.
This enables the use of larger component variations so
that binning or trimming external components is not
required. The typical ±50 µV VOS sense amplifier offset
allows for direct DC coupling of the sense coil. This
eliminates the large AC-coupling capacitor. The internal
delay filter rejects high-frequency noise spikes common
with inductive loads. This decreases false nuisance
tripping. T he SCR driver provi des increased current and
temperature c ompensation t o allow for a wider selectio n
of external SC Rs.
The minimum number of external components and the
6-pin SOT23 package allow a low-cost, com pact design
and layout.
Ordering Informati on
Part Number Operating
Temperature Range Package Packing Method
FAN4149M6X -35°C to +85°C 6-Lead, SOT23, JEDEC M0-178, 1.6 mm Tape and Reel
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0 2
FAN4149 Ground Fault Interrupter
Block Diagram
Figure 1. Block Diagram
Typical Application
Figure 2. Typical Application(1,2)
Table 1. Typical Values
R1: 75 RIN: 470 Ω RTEST1: 15 RTEST2: 10 RSET: 750 (3)
R2: 75 R3: 1 MΩ R4: 909 C1: 22 nF C2: 10 nF
C3: 5.6 nF C4: 220 nF C5: 1 µF
XMFR: Magnetic Metals 5029/F3006
Notes:
1. Contact Fai r child for self-t es t requirement details.
2. Portions of this schematic are subject to U.S. patents 8,085,516 and 8,760,824.
3. Value depends on sense-coil char acteristics and application.
AMPOUT
VS
C
1
VFB
VREF
VREF
A
1
VS
Delay SCR
GND
Rectifier
and Bias
VREF
R
1
VTH
VS
I
1
SCR
Driver
Q
1
T
1
C
2
VTH
Line Neutral
MOV
Line Hot
R
SET
R
IN
Q1
Load Hot
Load Neutral
Solenoid
Sense Coil 1:1000
R
TEST1
C1
C3 C2
Neutral Coil 1:200
C4
AmpOut
SCR
VFB
VREF
GND
VS
FAN4149
Fault Test
SCR Test
EOL Alarm
Phase
GND
VDD
FAN41501
C5
R2
R3
R1
Q2
D2
D1
D3
D4
R
TEST2
D5
R4
TEST
D6
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0 3
FAN4149 Ground Fault Interrupter
Pin Configuration
Figure 3. Pin Configuration
Pin Definitions
Pin # Name Description
1 SCR Gate drive for external SCR
2 GND Supply input for FAN4149 circuitry
3 VS Supply input for FAN4149 circuitry
4 VREF Non-inverti ng input for current s ense amplifier
5 VFB Inverting input for current sense amplifier
6 Amp Out An ext er nal resistor conn ec ted to VFB sets the IFAULT sensit i v i ty threshold
6
VREF
VFBGND
VS
Amp Out
SCR PIN 1
2
1
34
5
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0 4
FAN4149 Ground Fault Interrupter
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable abov e the recommended oper ating conditions and stressing th e parts to these leve ls is not recommended.
In addition, e xt ended e xposure to stresses a bove t h e rec o mm ended oper at ing c on diti on s m a y affec t de vic e re lia bil it y.
The absolute m aximum ratings are str es s ratings only.
Symbol Parameter Condition Min. Max. Unit
ICC Supply Current Continuous Current, V S to GND 15 mA
VCC Supply Voltage Continuous Voltage to GND, All Pins -0.8 16.0 V
TSTG Storage Temperature Range -65 +150 °C
ESD Electrostat ic Discharge Capab il ity
Human Body Model,
ANSI/ESDA/JEDEC JS-001-2012 2.5 kV
Charged Device Model, JESD22-C101 1.0
DC Electrical Charac t er istics
Unless otherwise specified, TA=25°C, Ishunt=1 mA, and referencing Figure 2.
Symbol Parameter Conditions Min. Typ. Max. Unit
VREG Power Supply Shunt Regulat or
Voltage VS to GND 13.7 14.0 14.3 V
IQ Quiescent Current Line to GND=10 V 425 500 575 µA
VREF Reference Voltage VREF to GND 6.85 7.00 7.15 V
VTH Trip Threshold Amp Out to VREF 4.35 4.50 4.65 V
VOS Amplifier Offset Gain=1000 -175 ±50 175 µV
Amplifier Offset Drift(4) Gain=1000 -100 100 µV
IOS Amplifier Input Offset(5) Design Value -50 0 50 nA
G Amplifier DC Gain(5) Design Value 100 dB
fGBW Amplifier Gain Bandwidth(5) Design Value 3 MHz
VSW+ Amplifier Positive Voltage Swing Amp Out to VREF, IFAULT=10 µA 5.5 V
VSW- Amplifier Negative V ol tage Swing VREF to Amp Out, IFAULT=-10 µA 5.5 V
ISINK Amplifier Current Sink Amp Out=VREF + 3 V VFB=VREF + 100 mV 400 µA
ISRL Amplifier Current Source Amp Out=VREF – 3 V,VFB=VREF -100 mV 400 µA
td Delay Filter Delay from C 1 Trip to SCR L->H 0.65 1.00 1.35 ms
ROUT SCR Output R esistance SCR to GND=250 mV, Amp Out=VREF 0.5 1.0
VOUT SCR Output Voltage SCR to GND, Amp Out=VREF 1 10 mV
SCR Output Volt age SCR to GND, AMP Out=VREF +4 V 3.0 V
IOUT SCR Output Current SCR to GND=1 V Amp Out=VREF + 4 V,
ISHUNT=2 mA 650 725 µA
Notes:
4. Maximum VOS offset temperature cycling drift from initial value (JEDEC JESD22-A104).
5. Guaranteed by design, not tested in production.
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0 5
FAN4149 Ground Fault Interrupter
Functional Description
Refer to Figure 2.
The FAN4149 is a GFCI controller for AC ground-fault
circuit interrupters. The low-VOS offset for the sense
amplifier allows for direct DC coupling of the sense coil
when the FAN4149 is biased with a full-wave diode
bridge. T his allows for the F AN4149 to be us ed with the
FAN41501 digital auto-monitoring controller to provide
for a low-BOM-cost, complete, GFI solution with self
testing for the critical GFCI components.
The internal shunt regulator rectifier circuit is supplied
from the full-wave rectifier bridge and 75 k series
resistor. A typical 220 nF VS bypass cap acitor is us ed to
filter the VAC ripple voltage. The internal 14 V shunt
regulator uses a precision temperature-compensated
bandgap reference. The combination of precision
reference circuitry and precision sense amplifier
provides for an accurate ground-fault tolerance. This
allows for selection of external components with wider
and lower-cost parameter variations. Due to the low
quiescent current, a high-value external series resistor
(R1) can be used to reduce the maximum power wattage
required for this resistor. The 14 V shunt regulator
generates the VREF reference voltage for the sense
amplifier’s (A1) non-inverting input (AC ground
reference). It also supplies the bias for the delay timer
(t1), comparators (C1 & C2), and the SCR driver.
The secondary winding of the sense transformer is
connected to pin 4 (VREF) and to a resistor, RIN, which
is directly DC connected to the inverting input of the
sense amplifier at pin 5 (VFB). The feedback resistor
(RSET) converts the sense transformer’s secondary
current to a voltage at pin 6 (Amp Out). This voltage is
compared to the internal window comparator (C1 & C2).
When the Amp Out voltage exceeds the ±VTH threshold
voltage, the window comparator triggers the internal
delay timer. The output of the window comparator must
stay HIGH for the duration of the t1 timer. If the window
comparator’s output goes LOW, the internal delay timer
starts a reset cycle. If the windo w comparator’s output is
still HIGH at the end of the t1 pulse, the SCR driver
enables current source I1 and disables Q1. Current
source I1 then enables the external SCR; which
energizes the solenoid, opens the contact switches to
the load, and removes the hazardous ground fault. The
window comparator allows for detection of a positive or
negative IFAULT signal, independent from the phase of
the line voltage.
Calculation of RSET Resistor
The Amp Out signal must exceed the window
comparator’s VTH threshold voltage for longer than the
delay timer and calculated by:
VTH = IFAULT x 1.22 x RSET x COS(2π x (t/2P)) / N (1)
RSET = (VTH x N) / (1.22 x IFAULT x COS(π x t/P)) (2)
where:
VTH = 4.5 V
IFAULT = 5 mARMS (UL943)
T = 1 ms (timer dela y)
P = Period of the A C Line (1/60 Hz)
P = Period of the A C Line (1/60 Hz)
N= Ratio of se condary-to-primary turns (1000:1)
RSET = 750 k (standard 1% value)
In practice, the transformer is non-ideal, so RSET may
need to be adjusted by up to 30% to obtain the desired
IFAULT trip threshold.
Calculation of VOS Trip Threshold Error
Since the sense coil is directly connected to the
feedback of the sense amplifier, the VOS offset
introduces an IFAULT threshold error. This error can be
calculated as follows:
%Error =100 x (VOS x RSET) / (RIN + RLDC) / VTH (3)
where:
VOS = ±175 µV (worst case)
±50 µV (typical)
RSET = 750 k
RIN = 470 (t ypic al val ue)
RLDC = 75 (sense coil secondary DC resistance)
VTH = 4.5 V
%Error
= ± 5.4% (worst case)
± 1.5% (typica l)
The VOS ±100 µV maximum drift specification is based
on temperature cycling per JEDEC JESD22-A104,
Condition B, 850 temperature cycles at -55°C to
+125°C.
Grounded Neutral Detection
If the neutral load terminal side is incorrectly connected
to the earth ground, the sense coil does not correctly
detect the hazardous ground fault current from “load
hot to earth ground due to the partial IFAULT current
flowing from the grounded neutral fault (load neutral) to
earth ground.
To detect a grounded neutral fault, a grounded neutral
coil is required. When a low resistive path occurs from
the line neutral and load neutral terminals, the sense
and neutral coils are mutually coupled. The mutual
coupling produces a positive feedback path around the
sense amplifier, which causes the sense amplifier to
oscillate. When t he peak oscill ation voltage exceeds the
SCR trigger threshold, the internal delay timer is
enabled. Since the amplifier’s output signal is crossing
the window comparator’s trip threshold typically at
6 kHz, the dela y timer alternates between detection of a
fault/no-fault. The ratio of the fault/no-fault detection
time interval determines if the S C R driver is enabled.
The sensitivity of the grounded neutra l detection can be
changed by the neutral coil turns and the value of C2
and C3.
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0 6
FAN4149 Ground Fault Interrupter
GFCI Self Test Requirement
Starting in June of 2015, UL943 requires all
permanently connected GFCI products to perform a
self-test function. By adding Fairchild’s FAN41501
product to the FAN4149 application (see Figure 2), a
fully compliant 2015 UL943 self-test function can be
achieved with two, small, independent, 6-pin, 1.6 mm-
wide devices and a minimum number of external
components. The 2015 UL code requires that, at power
up, the GFCI self test the critical GFCI components --
FAN4149, SCR, sense coil, and solenoid -- within five
seconds and thereafter within every three hours. The
self-test cycle cannot open the load contacts. If a
component failure is detected, the load power must be
denied. Refer to the FAN41501 datasheet for more
details about the UL943 self-test features.
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0 7
FAN4149 Ground Fault Interrupter
Typical Performance Characteristics
Unless otherwise specified, TA=25°C and according t o Figure 2 with SCR disco nnec ted.
Ch1: VS (Pin 3), 10 V/Div Ch1: VS (Pin 3), 10 V/Div
Ch2: AmpOut (P in 6), 5 V/Div Ch2: AmpOut (Pin 6), 2 V/Div
Ch3: VREF (Pin 4), 5 V/Div Ch3: SCR (Pin 1), 1 V/Div
Ch4: SCR (Pin 1), 500 mV/Div Ch4: IFAULT, 10 mA/Div
Figure 4. Typical Waveforms, No Ground Fault Figure 5. Typical Waveforms, 4 mA Ground Fault
Ch1: VS (Pin 3), 10 V/Div Ch1: VS (Pin 3), 10 V/Div
Ch2: AmpOut (P in 6), 5 V/Div Ch2: AmpOut (Pin 6), 5 V/Div
Ch3: SCR (Pin 1), 1 V/Div Ch3: SCR (Pin 1), 1 V/Div
Ch4: IFAULT, 10 mA/Div
Figure 6. Typical Waveforms, 5 mA Ground Fault Figure 7. Typical Waveforms for Grounded Neutral
Detection
Continued on the following pa ge…
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0 8
FAN4149 Ground Fault Interrupter
Typical Performance Characteristics (Continued)
Unless otherwise specified, TA=25°C and according to Figure 1 with SCR disconnected.
Ch2: AmpOut (P in 6), 2 V/Div
Figure 8. Typical Waveform for Grounded Neutral
Detection
© 2014 Fairchild Semiconductor Corporation www.fairchildsemi.com
FAN4149 • Rev. 1.0.0 9
FAN4149 Ground Fault Interrupter
Typical Temperature Characteristics
Figure 9. Shunt Regulator Voltage vs. Temperature
Figure 10. Q uiescent Current vs. Temperature
Figure 11. Reference Voltage vs. Temperature
Figure 12. VH Threshold Voltage vs. Temperature
Figure 13. VL Threshold Voltage vs. Temperature
Figure 14. T ypical V
OS
vs. Temperature
Figure 15. IOUT S CR Out vs. Temperature
NOTES:
A. THIS PACKAGE CONFORMS TO JEDEC MO-178,
VARIATION AB.
B. ALL DIMENSIONS ARE IN MILLIMETERS.
C. DOES NOT INCLUDE MOLD FLASH, PROTRUSIONS
OR GATE BURRS.
D. DOES NOT INCLUDE INTERLEAD FLASH OR
PROTRUSIONS.
E. DIMENSIONS AND TOLERANCING AS PER ASME
Y14.5M-1994
F. DRAWING FILE NAME: MA06EREV2
1.30
0.90
0.15
0.05
SEATING PLANE
0.60 REF
0.60
0.30
FORMERLY:
SCALE: 2:1
DETAIL A
APPROVALS
5 JULY 07
DATE
2
MKT-MA06E
SHEET :
N/A OF1 1
1.6MM WIDE
MO-178 VARIATION AB,
6LD,SOT23,JEDEC
SEE DETAIL A
GAGE PLANE
0.25
1.45 MAX
0.08
0.22
LAND PATTERN RECOMMENDATION
RELEASE TO DOCUMENT CONTROL
DESCRIPTION
SYMM
LTR
A
C
L
REVISIONS
E.C.N. DATE BY/APP'D
C
C0.10
1:1 NA
/
0.15 CA-B
0.15 C
2X
2X 3 TIPS
6X
2.9
1.6
2X
1.9
A
2.8
1.4
0.15 C D
0.95
B2X 0.3-0.5
0.20 CA-B D
D
PIN 1 INDEX AREA
(0.95) (0.95)
(1.00MIN)
(1.90)
(2.60)
(0.70MIN)
R0.10MIN
R0.10MIN
C D
D
C
11/4/2006 H.ALLEN
2DWG UPDATED TO CONFORM TO MO178 5 JULY 07 L.HUEBENER
L.HUEBENER
H.ALLEN 17 JULY 07
www.onsemi.com
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arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
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