1/34October 2005
M45PE10
1 Mbit, Low Voltage, Page-Erasable Serial Flash Memory
With Byte-Alterability and a 33 MHz SPI Bus Interface
FEATURES SUMMARY
1Mbit of Page-Erasable Flash Memory
Page Write (up to 256 Byt es) in 11ms (typica l)
Page Program (up to 256 Bytes) in 1.2ms
(typical)
Page Erase (256 By tes) in 10 m s (typical)
Sector Erase (512 Kbit)
2.7 to 3.6V Single Supply Voltage
SPI Bus Compatible Serial Interface
33MHz Clock Rate (maximum)
Deep Power-down Mode 1µA (typical)
Electronic Signature
JEDEC Standard Two-Byte Signature
(4011h)
More than 100,000 Write Cycles
More than 20 Year Data Retention
Packages
ECOPACK® (RoHS compliant)
Figure 1. Packag e s
SO8 (MN)
150 mil width
8
1
VDFPN8 (MP)
(MLP8)
M45PE10
2/34
TABLE OF CONTENTS
FEATURES SUMMARY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
SUMMARY DESCRIPTION. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
SIGNAL DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Serial Data Output (Q). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Serial Data Input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Serial Clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Chip Select (S) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Reset (Reset). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Write Protect (W). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
SPI MODES. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
OPERATING FEATURES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Sharing the Overhead of Modifying Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
An Easy Way to Modify Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
A Fast Way to Modify Data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Polling During a Write, Program or Erase Cycle . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Reset. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Active Power, Standby Power and Deep Power-Down Modes . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
WIP bit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
WEL bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Protection Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
MEMORY ORGANIZATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
INSTRUCTIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Write Enable (WREN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Write Disable (WRDI). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Read Identification (RDID) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Read Status Register (RDSR). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
WIP bit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
WEL bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Read Data Bytes (READ). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Read Data Bytes at Higher Speed (FAST_READ). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Page Write (PW). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Page Program (PP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Page Erase (PE). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Sector Erase (SE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Deep Power-down (DP). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Release from Deep Power-down (RDP). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
3/34
M45PE10
POWER-UP AND POWER-DOWN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
INITIAL DELIVERY STATE. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
MAXIMUM RATING. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
DC AND AC PARAMETERS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
PACKAGE MECHANICAL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
PART NUMBERING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
REVISION HISTORY. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
M45PE10
4/34
SUMMARY DESCRIPTION
The M45PE10 is a 1Mbit (128K x 8 bit) Serial
Paged Flash Memory accessed by a high speed
SPI-compatible bus.
The memory can be written or programmed 1 to
256 bytes at a time, u sing t he Page Writ e o r Page
Program instruction. The Page Write instruction
consists of an integrated Page Erase cycle fol-
lowed by a Page Program cycle.
The memory is organized as 2 sectors, each con-
taining 256 pages. Each page is 256 bytes wide.
Thus, the whole memory can be viewed as con-
sisting of 512 pages, or 131,072 bytes.
The memory can be erased a page at a time, using
the Page Erase instruction, or a sector at a time,
using the Sector Erase instruction.
In order to meet environmental requirements, ST
offers these devices in ECOPACK® packages.
ECOPACK® packages are Lead-free and RoHS
compliant.
ECOPACK is an ST trademark. ECOPACK speci-
fications are available at: www.st.com.
Figure 2. Logic Diagram
Figure 3. SO and VDFPN Connections
Note: 1. There is an exposed die pad dle on the undersi de of the
MLP8 package. This is pulled, internally, to VSS, and
must not be al lowed to be connecte d to any oth er voltage
or signal li ne on the PCB.
2. See PACKAGE MECHANICAL section for package di-
mensions, and how to identify pin-1.
Table 1. Signal Names
Reset
AI07403
S
VCC
M45PE10
VSS
W
Q
C
DC Serial Clock
D Serial Data Input
Q Serial Data Output
SChip Select
W Write Protect
Reset Reset
VCC Supply Voltage
VSS Ground
1
AI07404
2
3
4
8
7
6
5WS VCC
VSS
C
DQ
Reset
M45PE10
5/34
M45PE10
SIGNAL DESCRIPTION
Serial Data Output (Q). This output signal is
used to transfer data serially out of the device.
Data is shifted out on the falling edge of Serial
Clock (C).
Serial Data Input (D). This input signal is used to
transfer data ser ially into the device. It rece ives in-
structions, addresses, and the data to be pro-
grammed. Values a re latched on the rising e dge of
Serial Clock (C).
Serial Clock (C). This input signal provides the
timing of the serial interface. Instructions, address-
es, or data present at Serial Data Input (D) are
latched on the rising edge of Serial Clock (C). Data
on Serial Data Output (Q) changes after the falling
edge of Serial Clock (C).
Chip Select (S). When this input signal is High,
the device is deselected and Serial Data Output
(Q) is at high imped ance. Unless an internal Read ,
Program, Erase or Write cycle is in progress, the
device will be in the Standby Power mode (this is
not the Deep Power-down mode). Driving Chip
Select (S) Low selects the device, placing it in the
Active Power mode.
After Power-up, a falling edge on Chip Select (S)
is required prior to the start of any instruction.
Reset (Reset). The Reset (Reset) input provides
a hardware reset for the memory. In this mode, the
outputs are high impedance.
When Reset ( Reset) is driven High, the memory is
in the normal operating mode. When Reset (Re-
set) is driven Low, the memory will enter the Reset
mode, provided that no internal operation is cur-
rently in progress. Driving Reset (Reset) Low while
an internal operation is in progress has no effect
on that internal operation (a write cycle, program
cycle, or erase cycle).
Write Protect (W). This input signal puts the de-
vice in the Hardware Protected mode, when Write
Protect (W ) is connected to VSS, causing the first
256 pages of memory to become read-only by pro-
tecting them from write, program and erase oper-
ations. When Write Protect (W) is connected to
VCC, the first 256 pages of memory behave like
the other pages of memory.
M45PE10
6/34
SPI MODES
These de vices can be driv en by a micro controller
with its SPI peripheral running in either of the two
following modes:
CPOL=0, CPHA=0
CPOL=1, CPHA=1
For these two modes, input data is latched in on
the rising edge of Serial Clock (C), and output data
is available from the falling edge of Serial Clock
(C).
The difference bet ween th e two mod es, as shown
in Figure 5., is the clock polarity when the bus
master is in Stand-by mode and not transferring
data:
C remains at 0 for (CPOL=0, CPHA=0)
C remains at 1 for (CPOL=1, CPHA=1)
Figure 4. Bus Master and Memory Device s on the SPI Bus
Note: The Write Protect (W) signal should be driven, High or Low as appropriate.
Figure 5. SPI Modes Supported
AI04043B
Bus Master
(ST6, ST7, ST9,
ST10, Others) SPI Memory
Device
SDO
SDI
SCK
CQD
S
SPI Memory
Device
CQD
S
SPI Memory
Device
CQD
S
CS3 CS2 CS1
SPI Interface with
(CPOL, CPHA) =
(0, 0) or (1, 1)
WRP WRP WRP
AI01438B
C
MSB
CPHA
D
0
1
CPOL
0
1
Q
C
MSB
7/34
M45PE10
OPERATING FEATURES
Sharing the Overhead of Modifying Data
To write or prog ram on e ( or more) da ta bytes, two
instructions are required: Write Enable (WREN),
which is one byte, and a Page Write (PW) or Page
Program (PP) sequence, which consists of four
bytes plus data. This is followed by the int ernal cy-
cle (of duration tPW or tPP).
To share this overhead, the Page Write (PW) or
Page Program (PP) instruction allows up to 256
bytes to be programmed (changing bits from 1 to
0) or written (changing bits to 0 or 1) at a time, pro-
vided that they lie in consecutive addresses on the
same page of memory.
An Easy Way to Modify Data
The Page Write (PW) instruction provides a con-
venient way of modifying data (up to 256 contigu-
ous bytes at a time), and simply requires the start
address, and the new data in the instruction se-
quence.
The Page Write (PW) instruction is entered by
driving Chip Select (S) Low, and then transmitting
the instruction byte, thr ee ad dres s byte s ( A23-A0 )
and at least one data byte, and then driving Chip
Select (S) High. While Chip Select (S) is being
held Low, the data bytes are written to the data
buffer, star ting at the ad dress given in the th ird ad-
dress byte (A7-A0). When Chip Select (S) is driven
High, the Write cycle starts. The remaining, un-
changed, bytes of the data buffer are automatically
loaded with the values of the corresponding bytes
of the addressed memory page. The addressed
memory page then aut omatically put into an Erase
cycle. Finally, the addressed memory page is pro-
grammed with the contents of the data buffer.
All of this buffer management is handled internally,
and is transparent to the user. The user is given
the facility of being able to alter the contents of the
memory on a byte-by-byte ba sis.
For optimized timings, it is recommended to use
the Page Write (PW) instruction to write all con-
secutive targeted Bytes in a single sequence ver-
sus using several Page Write (PW) sequences
with each containing only a few Bytes (see Page
Write (PW) and AC Characteristics (33MHz oper-
ation)).
A Fast Way to Modify Data
The Page Program (PP) instruction provides a fast
way of modifying d ata (up to 256 contig uous bytes
at a time), provided that it only involves resetting
bits to 0 that had previously been set to 1.
This might be:
when the designer is programming the device
for the first time
when the designer knows that the page has
already been erased by an earlier Page Erase
(PE) or Sector Erase (SE) instruction. This is
useful, for example, when storing a fast
stream of data, having first performed the
erase cycle when time was availabl e
when the designer knows that the only
changes involve resetting bits to 0 that are still
set to 1. When this method is possible , it has
the additional advantage of minimising the
number of unnecessary erase operations, and
the extra stress incurred by each page.
For optimized timings, it is recommended to use
the Page Program (PP) instruction to program all
consecutive targeted Bytes in a single sequence
versus using several Page Program (PP) se-
quences with each containing only a few Bytes
(see Page Program (PP) and AC Characteristics
(33MHz operation)).
Polling Durin g a Write, Program or Erase Cyc le
A further improvement in the write, program or
erase time can be achieved by not waiting for the
worst case delay (tPW, tPP, tPE, or tSE). The Write
In Progress (WIP) bit is provided in the Status
Register so that th e application pro gram can mon-
itor its value, polling it to establish when the previ-
ous cycle is complete.
Reset
An internal Power On Reset circuit helps protect
against inadvertent data writes. Addition protec-
tion is provided by driving Reset (Reset) Low dur-
ing the Power-on process, and only driving it High
when VCC has reached the correct voltage level,
VCC(min).
Active Power, Standby Power and Deep
Power-Down Modes
When Chip Select (S) is Low, the device is select-
ed, and in the Active Power mode.
When Chip Select (S) is High, the device is dese-
lected, but coul d remain in the Active Power mode
until all internal cycles have completed (Program,
Erase, Write). The device then goes in to the
Standby Power mode. The device consumption
drops to ICC1.
The Deep Power-down mode is entered whe n the
specific instruction (the Deep Power-down (DP) in-
struction) is executed. The device consumption
drops further to ICC2. The device remains in this
mode until another specific instruction (the Re-
lease from De ep Powe r-down and Read Elect ron-
ic Signature (RES) instruction ) is executed.
All other instructions are ignored while the device
is in the Deep Power-down mode. This can be
used as an extra software protection mechanism,
when the device is not in a ctive use , to pro tect the
device from inadvertent Write, Program or Erase
instructions.
M45PE10
8/34
Status Register
The Status Register contains two status bits that
can be read by the Read Status Register (RDSR)
instruction.
WIP bit. The Write In Progress (WIP) bit indicates
whether the me mory is busy with a Write, Program
or Erase cycle.
WEL bit. The Write Enable Latch (WEL) bit indi-
cates the st atus of the internal Writ e Enable Latch.
Table 2. Status Register Format
Note: WEL and WIP are volatile read-only bits (WEL is se t an d re -
set by specific instructions; WIP is automatically set and re-
set by the internal logic of the device).
Protection Modes
The environments where non-vola tile memory de-
vices are used can be very noisy. No SPI device
can operate correc tly in the presence of excessive
noise. To help combat this, the M45PE10 features
the following data protection mechanisms:
Power On Reset and an internal timer (tPUW)
can provide protection ag ainst inadvertant
changes while the power supply is outside the
operating specification.
Program, Erase and Write instructions are
checked that they consist of a number of clock
pulses that is a multiple of eight, before they
are accepted for execution.
All instructions that modify data must be
preceded by a Write Enable (WREN)
instruction to set th e Writ e En ab le La tc h
(WEL) bit. This bit is returned to its reset state
by the following events:
Power-up
Reset (RESET) driven Low
Write Disable (WRDI) instruction
completion
Page Write (PW) instruction completion
Page Program (PP) instruction completion
Page Erase (PE) instruction completion
Sector Erase (SE) instruction completion
The Hardware Prot ected mode is entere d
when Write Protect (W) is driven Low, causing
the first 256 pages of memory to become
read-only. When Write Protect (W) is driven
High, the first 256 pages of memory behave
like the other pa ge s of mem o ry
The Reset (Reset) signal can be driven Low to
protect the contents of the memory during any
critical time , not just during Power-up and
Power-down.
In addition to the low power consumption
feature, the Deep Power-down mode offers
extra software prot ection from inadvertant
Write, Program and Erase instructions while
the device is not in active use.
b7 b0
0 0 0 0 0 0 WEL WIP
9/34
M45PE10
MEMORY ORGANIZATION
The memory is organized as:
512 pages (256 bytes each).
131,072 bytes (8 bits each)
2 sectors (512 Kbits, 65536 bytes each)
Each page can be individually:
programmed (bits are programmed from 1 to
0)
erased (bits are erased from 0 to 1)
written (bits are changed to either 0 or 1)
The device is Page or Sector Erasable (bits are
erased from 0 to 1).
Table 3. Memory Organizatio n
Figure 6. Block Diagram
Sector Address Range
1 10000h 1FFFFh
0 00000h 0FFFFh
AI07405
S
WControl Logic High Voltage
Generator
I/O Shift Register
Address Register
and Counter 256 Byte
Data Buffer
256 Bytes (Page Size)
X Decoder
Y Decoder
C
D
Q
Status
Register
00000h
1FFFFh
000FFh
Reset
10000h
First 256 Pages can
be made read-only
M45PE10
10/34
INSTRUCTIONS
All instructions, addresses and data are shifted in
and out of the device, most significa n t bit firs t.
Serial Data Input (D) is sampled on the first rising
edge of Serial Clock (C) after Chip Select (S) is
driven Low. Then, the one-byte instruction code
must be shifted in to the device, most significant bit
first, on Serial Data Input (D), each bit being
latched on the rising edges of Serial Clock (C).
The instruction set is listed in Table 4.
Every instruc tion sequence star ts with a one-byte
instruction code. Depending on the instruction,
this might be followed by address bytes, or by data
bytes, or by both or none.
In the case of a Read Data Bytes (READ), Read
Data Bytes at Higher Speed (Fast _Read) or Re ad
Status Register (RDSR) in struction, the shifted-in
instruction sequence is followed by a da ta-ou t se-
quence. Chip Select (S) can be driven High after
any bit of the data-out sequence is being shifted
out.
In the case of a Page Write (PW), Page Program
(PP), Page Erase (PE), Sector Erase (SE), Write
Enable (WREN), Write Disable (WRDI), Deep
Power-down (DP) or Release from Deep Power-
down (RDP) instruction, Chip Select (S) must be
driven High exactly at a byte boundary, otherwise
the instruction is rejected, and is not executed.
That is, Chip Select (S) must driven High when the
number of clock pulses afte r Chip Select (S) b eing
driven Low is an exact multiple of eight.
All attempts to ac cess the memory arr ay during a
Write cycle, Program cycle or Erase cycle are ig-
nored, and th e internal Wr ite cycle, Progr am cycle
or Erase cycle continues unaffected.
Table 4. Instruction Set
Instruction Description One-byte Instruction Code Address
Bytes Dummy
Bytes Data
Bytes
WREN Write Enable 0000 0110 06h 0 0 0
WRDI Write Disable 0000 0100 04h 0 0 0
RDID Read Identification 1001 1111 9Fh 0 0 1 to 3
RDSR Read Status Register 0000 0101 05h 0 0 1 to
READ Read Data Bytes 0000 0011 03h 3 0 1 to
FAST_READ Read Data Bytes at Higher Speed 0000 1011 0Bh 3 1 1 to
PW Page Write 0000 1010 0Ah 3 0 1 to 256
PP Page Program 0000 0010 02h 3 0 1 to 256
PE Page Erase 1101 1011 DBh 3 0 0
SE Sector Erase 1101 1000 D8h 3 0 0
DP Deep Power-down 1011 1001 B9h 0 0 0
RDP Release from Deep Power-down 1010 1011 ABh 0 0 0
11/34
M45PE10
Write Enable (WREN)
The Write Enable (WREN) instruction (Figure 7.)
sets the Write Enable La tch (WEL) bit.
The Write Enable La tch ( WEL) bit must be set pri-
or to every Page Wr ite ( PW) , Page Pr ogr am (PP),
Page Erase (PE), and Sector Erase (SE) instruc-
tion.
The Write Enable (WREN) instruction is entered
by driving Chip Select (S) Low, sending the in-
struction code, and then driving Chip Select (S)
High.
Figure 7. Write Enable (WREN) Instruction Sequence
Write Disable (WRDI)
The Write Disable (WRDI) instruction (Figure 8.)
resets the Write Enable Latch (WEL) bit.
The Write Disable (WRDI) instruction is entered by
driving Chip Select (S) Low, sending the instruc-
tion code, and th en driving Chip Select (S) High.
The Write Enable Latch (WEL) bit is reset under
the following conditions:
–Power-up
Write Disable (WRDI) instruction completion
Page Writ e (PW) instruction comple tio n
Page Program (PP) instr uction completion
Page Erase (PE) instruction completion
Sector Erase (SE) instruction completion
Figure 8. Write Disable (WRDI) Instruction Sequence
C
D
AI02281E
S
Q
21 34567
High Impedance
0
Instruction
C
D
AI03750D
S
Q
21 34567
High Impedance
0
Instruction
M45PE10
12/34
Read Identification (RDID)
The Read Identification (RDID) instruction allows
the 8-bit manufacturer identification to be read, fol-
lowed by two bytes of device identification. The
manufacturer identifica tion is assigned by JEDEC,
and has the va lue 20h for STMicroelectronics. The
device identification is assigned by the device
manufacturer, and indicates the memory type in
the first byte (40h), and the memory capacity of the
device in the second byte (11h).
Any Read Identification (RDID) instruction while
an Erase or Program cycle is in progress, is not
decoded, and has no effect on the cycle that is in
progress.
The device is first selec ted by driving Chip Select
(S) Low. Then , the 8-bi t instruction co de for th e in-
struction is shifted in. This is followed by the 24-bit
device identification, stored in the memory, being
shifted out on Serial Data Output (Q), each bit be-
ing shifted out during the falling edge of Serial
Clock (C).
The instruction sequence is shown in Figure 9.
The Read Identification (RDID) instruction is termi-
nated by driving Chip Select (S) High at any time
during data output.
When Chip Select (S) is driven High, the device is
put in the Standby Power mode. Once in the
Standby Power mode, the device waits to be se-
lected, so that it can receive, decode and execute
instructions.
Table 5. Read Identification (RDID) Data-Out Sequence
Figure 9. Read Identification (RDID) Instruction Sequence and Data-Out Sequence
Manufacturer Identification Device Identification
Memory Type Memory Capacity
20h 40h 11h
C
D
S
21 3456789101112131415
Instruction
0
AI06809
Q
Manufacturer Identification
High Impedance
MSB
15 1413 3210
Device Identification
MSB
16 16 18 28 29 30 31
13/34
M45PE10
Read Status Register (RDSR)
The Read Status Register (RDSR) instruction al-
lows the Status Register to be read. The Status
Register may be read at any time, even while a
Program, Erase or Write cycle is in progress.
When one of these cycles is in progress, it is rec-
ommended to check the Write In Progress (WIP)
bit before sending a new instruction to the device.
It is also possible to read the Status Register con-
tinuously, as shown in Figure 10.
The status bits of the Status Register are as fol-
lows:
WIP bit. The Write In Progress (WIP) bit indicat es
whether the m emory is busy with a Write, Prog ram
or Erase cycle. When set to 1, such a cycle is in
progress, when reset to 0 no such cycle is in
progress.
WEL bit. The Write Enable Latch (WEL) bit indi-
cates the status o f the internal Write Enable Lat ch.
When set to 1 the internal Write Enable Latch is
set, when set to 0 the internal Write Enable Latch
is reset and no Write, Program or Erase instruction
is accepted.
Figure 10. Read Status Register (RDSR) Instruction Se quence and Data-Out Sequence
C
D
S
21 3456789101112131415
Instruction
0
AI02031E
Q76543210
Status Register Out
High Impedance
MSB
76543210
Status Register Out
MSB
7
M45PE10
14/34
Read Data Bytes (READ)
The device is first selec ted by driving Chip Select
(S) Low. The instruction code for the Read Data
Bytes (READ) instruction is followed by a 3-byte
address (A23-A0) , each bit being latched-in d uring
the rising edge o f Serial Clock (C). Then t he mem-
ory contents, at that addr ess, is sh ift ed out on Se -
rial Data Output (Q), each bit being shifted out, at
a maximum frequency fR, during the falling edge of
Serial Clock (C).
The instruction sequence is shown in Figure 11.
The first byte addressed can be at any location.
The address is automatically incremented to the
next higher address after each byte of data is shift-
ed out. The wh ole memory can, therefore, be r ead
with a single Read Data Bytes (READ) instruction.
When the highe st address is reached, the addr ess
counter rolls over to 000000h, allowing the read
sequence to be continued indefinitely.
The Read Data Bytes (READ) instruction is termi-
nated by driving Chip Select (S) High. Chip Select
(S) can be driven High at any time dur ing data out-
put. Any Read Data Bytes (READ) instruction,
while an Erase, Program or Write cycle is in
progress, is rejected without having any e ffects on
the cycle that is in prog re ss .
Figure 11. Read Data Bytes (READ) Instruction Sequence and Data-Out Sequence
Note: Address bits A23 to A17 are Don’t Care.
C
D
AI03748D
S
Q
23
21 345678910 2829303132333435
2221 3210
36 37 38
76543 1 7
0
High Impedance Data Out 1
Instruction 24-Bit Address
0
MSB
MSB
2
39
Data Out 2
15/34
M45PE10
Read Data Bytes at Higher Speed
(FAST_READ)
The device is first selec ted by driving Chip Select
(S) Low. The instruction code for the Read Data
Bytes at Higher Speed (FAST_READ) instruction
is followed by a 3-byte address (A23-A0) and a
dummy byte, each bit being latched-in during the
rising edge of Serial Clock (C). Then the memory
contents, at that address, is shifted out on Serial
Data Output (Q), each bit being shifted out, at a
maximum frequency fC, during the falling edge of
Serial Clock (C).
The instruction sequence is shown in Figure 12.
The first byte addressed can be at any location.
The address is automatically incremented to the
next higher address after each byte of data is shift-
ed out. The wh ole memory can, therefore, be r ead
with a single Read Data Bytes at Higher Speed
(FAST_READ) instruction. When the highest ad-
dress is reached, the address counter rolls over to
000000h, allowing the read sequence to be contin-
ued indefinitely.
The Read Data Bytes at Higher Speed
(FAST_READ) instruction is termin at ed b y driving
Chip Select (S) High. Chip Select (S) can be driv-
en High at any time during data output. Any Read
Data Bytes at Higher Speed (FAST_READ) in-
struction, while an Erase, Program or Write cycle
is in progress, is rejected without having any ef-
fects on the cycle that is in progress.
Figure 12. Read Data Bytes at Higher Speed (FAST_READ) Instruction Sequence and Data-Out
Sequence
Note: Address bits A23 to A17 are Don’t Care.
C
D
AI04006
S
Q
23
21 345678910 28293031
2221 3210
High Impedance
Instruction 24 BIT ADDRESS
0
C
D
S
Q
32 33 34 36 37 38 39 40 41 42 43 44 45 46
765432 0
1
DATA OUT 1
Dummy Byte
MSB
76543210
DATA OUT 2
MSB MSB
7
47
765432 0
1
35
M45PE10
16/34
Page Write (PW)
The Page Write (PW) instruction allows bytes to
be written in th e memo ry. Bef ore it can be accept -
ed, a Write Enable (WREN) instructio n must previ-
ously have been executed. After the Write Enable
(WREN) instruction has been decoded, the device
sets the Write Enable La tch (WEL).
The Page Write (PW) instruction is entered by
driving Chip Select (S) Low, followed by the in-
struction code, three address bytes and at least
one data byte on Ser ial Data Input (D). The rest o f
the page remains unchanged if no power failure
occurs during this write cycle.
The Page Write (PW) instruction performs a page
erase cycle even if only one byte is updated.
If the 8 least significant address bits (A7-A0) are
not all zero, all transmitt ed data exceeding the ad-
dressed page boundary wrap round, and are writ-
ten from the start address of the same page (the
one whose 8 least significan t address b its (A7-A0 )
are all zero). Chip Select (S) must be driven Low
for the entire du ration of the sequence.
The instruction sequence is shown in Figure 13..
If more than 2 56 byte s are sent t o the d evice, pre-
viously latched data are discarded and the last 256
data bytes are guaranteed to be written correctly
within the same page. If less than 256 Data bytes
are sent to device, they are corre ctly writt en at the
requested addresses without having any effects
on the other b ytes of the sa me page.
For optimized timings, it is recommended to use
the Page Write (PW) instruction to write all con-
secutive targeted Bytes in a single sequence ver-
sus using several Page Write (PW) sequences
with each containing only a few Bytes (see AC
Characteristics (33MHz operation) ).
Chip Select (S) must be driven High after the
eighth bit of the last dat a byte has been latched in,
otherwise the Page Write (PW) instruction is not
executed.
As soon as Chip Select (S) is driven High, the self-
timed Page Write cycle (whose duration is tPW) is
initiated. While the Page Write cycle is in progress,
the Status Register may be read to check the val-
ue of the Write In Prog re ss ( WIP) bit . The Wr ite In
Progress (WIP) bit is 1 during the self-timed Page
Write cycle, and is 0 when it is completed. At some
unspecifie d time before the cycle is com plete, the
Write Enable Latch (WEL) bit is reset.
A Page Write (PW) instruction applied to a page
that is Hardware Protected is not executed.
Any Page Write (PW) instruction, while an Erase,
Program or Write cycle is in progress, is rejected
without having any effects on the cycle that is in
progress.
Figure 13. Page Write (PW) Instruction Sequence
Note: 1. Addre ss bits A23 to A17 are Do n’t Car e
2. 1 n 256
C
D
AI04045
S
4241 43 44 45 46 47 48 49 50 52 53 54 5540
C
D
S
23
21 345678910 2829303132333435
2221 3210
36 37 38
Instruction 24-Bit Address
0
765432 0
1
Data Byte 1
39
51
765432 0
1
Data Byte 2
765432 0
1
Data Byte 3 Data Byte n
765432 0
1
MSB MSB
MSB MSB MSB
17/34
M45PE10
Page Program (PP)
The Page Program (PP) instruction allows bytes to
be programmed in the memory (changing bits from
1 to 0, only). Before it can be accepted, a Write En-
able (WREN) instruction must previously have
been executed. After the Write Enable (WREN) in-
struction has been decoded, the device sets the
Write Enable Latch (WEL).
The Page Program (PP) instruction is entered by
driving Chip Select (S) Low, followed by the in-
struction code, three address bytes and at least
one data byte on Serial Data Input (D). If the 8
least significant address bits (A7-A0) are not all
zero, all transmitted data exceeding the ad-
dressed page boundary wrap round, and are pro-
grammed from th e start address of the sam e page
(the one whose 8 least significant address bits
(A7-A0) are all zero). Chip Select (S) must be driv-
en Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 14..
If more than 2 56 byte s are sent t o the d evice, pre-
viously latched data are discarded and the last 256
data bytes a re guara nteed to be programm ed cor-
rectly within the same page. If less than 256 Data
bytes are sent to device, they are correctly pro-
grammed at the r equested addresses without hav-
ing any effects on the other bytes of the same
page.
For optimized timings, it is recommended to use
the Page Program (PP) instruction to program all
consecutive targeted Bytes in a single sequence
versus using several Page Program (PP) se-
quences with each containing only a few Bytes
(see AC Characteristics (33MHz operation)).
Chip Select (S) must be driven High after the
eighth bit of the last dat a byte has been latched in,
otherwise the Page Program (PP) instruction is not
executed.
As soon as Chip Select (S) is driven High, the self-
timed Page Program cycle (whose duration is tPP)
is initiated. While the Page Program cycle is in
progress, the Status Register may be read to
check the value of t he Write In Progress (WIP) bit.
The Write In Progress (WIP) bit is 1 during the self-
timed Page Program cycle, and is 0 when it is
completed. At some unspecified time before the
cycle is complete, the Write Enable Latch (WEL)
bit is reset.
A Page Program (PP) instruction applied to a page
that is Hardware Protected is not executed.
Any Page Program (PP) instruction, while an
Erase, Program or Write cycle is in progress, is re-
jected without having any effe cts on the cycle th at
is in progress.
Figure 14. Page Program (PP) Instruction Sequence
Note: 1. Addre ss bits A23 to A17 are Do n’t Car e
2. 1 n 256
C
D
AI04044
S
4241 43 44 45 46 47 48 49 50 52 53 54 5540
C
D
S
23
21 345678910 2829303132333435
2221 3210
36 37 38
Instruction 24-Bit Address
0
765432 0
1
Data Byte 1
39
51
765432 0
1
Data Byte 2
765432 0
1
Data Byte 3 Data Byte n
765432 0
1
MSB MSB
MSB MSB MSB
M45PE10
18/34
Page Erase (PE)
The Page Erase (PE) instr uction sets to 1 (FFh) all
bits inside the chosen page. Before it can be ac-
cepted, a Write Enable (WREN) instruction must
previously have been executed. After the Write
Enable (WREN) instruction has been decoded,
the device sets the Write Enable Latch (WEL).
The Page Erase (PE) instruction is entered by
driving Chip Select (S) Low, followed by the in-
struction code, and three address bytes on Serial
Data Input (D). Any address inside the Page is a
valid addres s for the Pa ge Er ase (PE) in structio n.
Chip Select (S) must be driven Low for the entire
duration of the sequence.
The instruction sequence is shown in Figure 15..
Chip Select (S) must be driven High after the
eighth bit of the last address byte has been latched
in, otherwise the Page Erase (PE) instruction is
not executed. As soon as Chip Select (S) is driven
High, the self-timed Page Erase cycle (whose du-
ration is tPE) is initiated. While the Page Erase cy-
cle is in progress, t he Status Register may be r ead
to check the value of the Write In Progress (WIP)
bit. The Write I n Progr ess (WIP) bit is 1 d uri ng the
self-timed Page Erase cycle, and is 0 when it is
completed. At some unspecified time before the
cycle is complete, the Write Enable Latch (WEL)
bit is reset.
A Page Erase (PE) instruction applied to a page
that is Hardware Protected is not executed.
Any Page Erase (PE) instruction, while an Erase,
Program or Write cycle is in progress, is rejected
without having any effects on the cycle that is in
progress.
Figure 15. Page Erase (PE) Instruction Sequence
Note: Address bits A23 to A17 are Don’t Care.
24 Bit Address
C
D
AI04046
S
21 3456789 293031
Instruction
0
23 22 2 0
1
MSB
19/34
M45PE10
Sector Erase (SE)
The Sector Erase (SE) instruction sets to 1 (FFh)
all bits inside the chosen sector. Before it can be
accepted, a Write Enable (WREN) instruction
must previously have been executed. After the
Write Enable (WREN) instr uction has been decod-
ed, the device sets the Write Enab le Latch (WEL).
The Sector Erase (SE) instruction is entered by
driving Chip Select (S) Low, followed by the in-
struction code, and three address bytes on Serial
Data Input (D). Any address inside the Sector ( see
Table 3.) is a valid address for the Sector Erase
(SE) instruction. Chip Select (S) must be driven
Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 16..
Chip Select (S) must be driven High after the
eighth bit of the last address byte has been latched
in, otherwise the Sector Erase (SE) instruction is
not executed. As soon as Chip Select (S) is driven
High, the self-timed Sector Erase cycle (whose du-
ration is tSE) is initiated. While the Sector Erase cy-
cle is in progress, t he Status Register may be r ead
to check the value of the Write In Progress (WIP)
bit. The Write I n Progr ess (WIP) bit is 1 d uri ng the
self-timed Sector Erase cycle, and is 0 when it is
completed. At some unspecified time before the
cycle is complete, the Write Enable Latch (WEL)
bit is reset.
A Sector Erase (SE) instru ction applied to a sector
that contains a pa ge that is Hardware Protected is
not executed.
Any Sector Erase (SE) instruction, while an Erase,
Program or Write cycle is in progress, is rejected
without having any effects on the cycle that is in
progress.
Figure 16. Sector Erase (SE) Instruction Sequence
Note: Address bits A23 to A17 are Don’t Care.
24 Bit Address
C
D
AI03751D
S
21 3456789 293031
Instruction
0
23 22 2 0
1
MSB
M45PE10
20/34
Deep Power-down (DP)
Executing the Deep Power-down (DP) instruction
is the only wa y to put the device in the lowe st con-
sumption mode (the Deep Power-down mode). It
can also be used as an extra software protection
mechanism, w hile the device is not in active us e,
since in this mode, the device ignores all Write,
Program and Erase instructions.
Driving Chip Select (S) High deselects the device,
and puts the device in the Standby Power m ode (if
there is no internal cycle currently in progress). But
this mode is n ot the Deep Po wer-down mode. The
Deep Power-down mode can only be entered by
executing the Deep Power-down (DP) instruction,
to reduce the standby current (from ICC1 to ICC2,
as specified in Table 11.).
Once the device has entered the Deep Power-
down mode, all instruction s are ignored except the
Release from Deep Power-down (RDP) instruc-
tion. This relea se s th e de vice fro m this mo d e.
The Deep Power-down mode automatically stops
at Power-do wn, and the device always Power s-up
in the Standby Power mode.
The Deep Power-do wn (DP) in structio n is entered
by driving Chip Select (S) Low, followed by the in-
struction code on Serial Data Input (D). Chip Se-
lect (S) must be driven Low for the entire duration
of the sequence.
The instruction sequence is shown in Figure 17..
Chip Select (S) must be driven High after the
eighth bit of the instruction code has been latched
in, otherwise th e Deep Power-down (DP) instruc-
tion is not executed. As so on as Ch ip Select ( S ) is
driven High, it requires a delay of tDP before the
supply current is reduced to ICC2 and the Deep
Power-down mode is entered.
Any Deep Power-down (DP) instruction, while an
Erase, Program or Write cycle is in progress, is re-
jected without having any effe cts on the cycle th at
is in progress.
Figure 17. Deep Power-down (DP) Instruction Sequence
C
D
AI03753D
S
21 345670t
DP
Deep Power-down Mode
Stand-by Mode
Instruction
21/34
M45PE10
Release from Deep Power-down (RDP)
Once the device has entered the Deep Power-
down mode, all instruction s are ignored except the
Release from Deep Power-down (RDP) instruc-
tion. Executing this instruction takes the device out
of the Deep Power-down mode.
The Release from Deep Power-down (RDP) in-
struction is entered by driving Chip Select (S) Low,
followed by the instruct ion code on Serial Data In-
put (D). Chip Select (S ) must be driven Low for the
entire duration of the sequence.
The instruction sequence is shown in Figure 18..
The Release from Deep Power-down (RDP) in-
struction is terminated by driving Chip Select (S)
High. Sending additional clock cycles on Serial
Clock (C), while Chip Select (S) is driven Low,
cause the instruction to be rejected, and not exe-
cuted.
After Chip Select (S) has been driven High, fol-
lowed by a delay, tRDP, the device is put in the
Standby Power mode. Chip Select (S) must re-
main High at least until this period is over. The de-
vice waits to be selected, so that it can receive,
decode and execute inst ructions.
Any Release from Deep Power-down (RDP) in-
struction, while an Erase, Program or Write cycle
is in progress, is rejected without having any ef-
fects on the cycle that is in progress.
Figure 18. Release from Deep Power-down (RDP) Instruction Sequence
C
D
AI06807
S
21 345670tRDP
Stand-by Mode
Deep Power-down Mode
QHigh Impedance
Instruction
M45PE10
22/34
POWER-UP AND POWER-DOWN
At Power-up and Power-down, the device must
not be selecte d (that is Chip Select (S) must follow
the voltage applied on VCC) until VCC reaches the
correct value:
–V
CC(min) at Power-up, and t hen for a further
delay of tVSL
–V
SS at Power-down
Usually a simple pull-up resistor on Chip Select (S)
can be used to ensure safe and proper Power-up
and Power-down.
To avoid data corruption an d inadve rtent writ e op-
erations during power up, a Power On Reset
(POR) circuit is included. The logic inside the de-
vice is held reset while VCC is less than the Power
On Reset (POR) threshold value, VWI – all opera-
tions are disabled, and the device does not re-
spond to any instruction.
Moreover, the device ignores all Write Enable
(WREN), Page Write (PW), Page Program (PP),
Page Erase (PE) and Sector Erase (SE) instruc-
tions until a time delay of tPUW has elapsed after
the moment that VCC rises above the VWI thresh-
old. However, the correct operation of the device
is not guaranteed if, by this time, VCC is still below
VCC(min). No Write, Program or Erase instructions
should be sent until the later of:
–t
PUW after VCC passed the VWI threshold
–t
VSL after wrap roundVCC passed the
VCC(min) level
These values are specified in Table 6..
If the delay, tVSL, has elapsed, aft er VCC has risen
above VCC(min), the device can be selected for
READ instructions even if the tPUW delay is not yet
fully elapsed.
As an extra protection, the Reset (Reset) signal
can be driven Low for the whole duration of the
Power-up and Power-down phases.
At Power-up, the device is in the following state:
The device is in the Standby Power mode (not
the Deep Power-down mode).
The Write Enab le La tc h (WE L) bit is rese t.
Normal precautions must be taken for supply rail
decoupling, to stabilize the VCC supply. Eac h de-
vice in a system should have the VCC rail decou-
pled by a suitable capacitor close to the package
pins. (Generally, this capacitor is of the order of
0.1µF).
At Power-down, when VCC drops f rom the opera t-
ing voltage, to below the Power On Reset (POR)
threshold value, VWI, all operations are disabled
and the device does not respond to any instruc-
tion. (The designer needs to be aware that if a
Power-down occurs while a Write, Program or
Erase cycle is in progress, some data corruption
can result.)
Figure 19. Power-up Timing
VCC
AI04009C
VCC(min)
VWI
Reset State
of the
Device
Chip Selection Not Allowed
Program, Erase and Write Commands are Rejected by the Device
tVSL
tPUW
time
Read Access allowed Device fully
accessible
VCC(max)
23/34
M45PE10
Table 6. Power-Up Timing and VWI Threshold
Note: 1. These parameters are characterized only, over the temperature range –40°C to +85°C.
INITIAL DELIVERY STATE
The device is delivered with the memory array
erased: all bits are set to 1 (each byte contains
FFh). All usable Status Register bits are 0.
MAXIMUM RATING
Stressing the device outside the ratings listed in
Table 7. may cause pe rmanent damage t o the de-
vice. These are stress ratings only, and operation
of the device at these, or any other conditions out-
side those indicated in the Operating sections of
this specification, is not implied. Exposure to Ab-
solute Maximum Rating conditions for extended
periods may affect device reliability. Refer also to
the STMicroelectronics SURE Program and other
relevant quality documents.
Table 7. Absolut e Maximum Ratings
Note: 1. Compliant with JEDEC Std J-STD-020B (for small body, Sn-Pb or Pb assembly), the ST ECOPACK® 7191395 spec ificat ion, and
the European directive on Restrictions on Hazardous Substances (RoHS) 2002/95/EU
2. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 , R2=500 )
Symbol Parameter Min. Max. Unit
tVSL1VCC(min) to S low 30 µs
tPUW1Time delay before the first Write, Program or Erase instruction 1 10 ms
VWI1Write Inhibit Voltage 1.5 2.5 V
Symbol Parameter Min. Max. Unit
TSTG Storage Temperature –65 150 °C
TLEAD Lead Temperature during Soldering See note 1°C
VIO Input and Output Voltage (with respect to Ground) –0.6 4.0 V
VCC Supply Voltage –0.6 4.0 V
VESD Electrostatic Discharge Voltage (Human Body model) 2–2000 2000 V
M45PE10
24/34
DC AND AC PARAMETERS
This section summarizes the operating and mea-
surement conditions, and the DC and AC charac-
teristics of the device. The parameters in the DC
and AC Characteristic tables that follow are de-
rived from tests performed under the Measure-
ment Conditions summarized in the relevant
tables. Designers should check that the operating
conditions in their circuit match the measurement
conditions when relying on the quoted parame-
ters.
Table 8. Operating Conditions
Table 9. AC Measurement Conditions
Note: Output Hi-Z is defined as th e point where data out is no longer driven.
Figure 20. AC Measurement I/O Waveform
Table 10. Capacitance
Note: Sampled only, not 100% tested, at TA=25°C and a frequency of 20 MHz.
Symbol Parameter Min. Max. Unit
VCC Supply Voltage 2.7 3.6 V
TAAmbient Operating Temperature –40 85 °C
Symbol Parameter Min. Max. Unit
CLLoad Capacitance 30 pF
Input Rise and Fall Times 5 ns
Input Pulse Voltages 0.2VCC to 0.8VCC V
Input and Output Timing Reference Voltages 0.3VCC to 0.7VCC V
Symbol Parameter Test Condition Min. Max. Unit
COUT Output Capacitance (Q) VOUT = 0V 8 pF
CIN Input Capacitance (other pins) VIN = 0V 6 pF
AI00825B
0.8VCC
0.2VCC
0.7VCC
0.3VCC
Input and Output
Timing Reference Levels
Input Levels
25/34
M45PE10
Table 11. DC Characteristics
Symbol Parameter Test Condition
(in addition to those in Table 8.)Min. Max. Unit
ILI Input Leakage Current ± 2 µA
ILO Output Leakage Current ± 2 µA
ICC1 Standby Current
(Standby and Reset modes) S = VCC, VIN = VSS or VCC 50 µA
ICC2 Deep Po wer-down Current S = VCC, VIN = VSS or VCC 10 µA
ICC3 Operating Current
(FAST_READ) C = 0.1VCC / 0.9.VCC at 25MHz, Q = open 6mA
C = 0.1VCC / 0.9.VCC at 33MHz, Q = open 8
ICC4 Operating Current (PW) S = VCC 15 mA
ICC5 Operating Current (SE) S = VCC 15 mA
VIL Input Low Voltage – 0.5 0.3VCC V
VIH Input High Voltage 0.7VCC VCC+0.4 V
VOL Output Low Voltage IOL = 1.6 mA 0.4 V
VOH Output High Voltage IOH = –100 µAV
CC–0.2 V
M45PE10
26/34
Table 12. AC Characteristics (25MHz operation)
Note: 1. tCH + tCL must be greater than or equal to 1/ fC(max)
2. Value guaranteed by characterization, not 100% tested in production.
3. When using PP and PW instructions to update consecutive Bytes, optimized timings are obtained with one sequence including all
the Bytes versus several sequences of only a few Bytes. (1 n 256)
Test conditions specified in Table 8. and Table 9.
Symbol Alt. Parameter Min. Typ. Max. Unit
fCfCClock Frequency for the following
instructions: FAST_READ, PW, PP, PE,
SE, DP, RDP, WREN, WRDI, RDSR D.C. 25 MHz
fRClock Frequency for READ instructions D.C. 20 MHz
tCH 1tCLH Clock High Time 18 ns
tCL 1tCLL Clock Low Time 18 ns
Clock Slew Rate 2 (peak to peak) 0.03 V/ns
tSLCH tCSS S Active Setup Time (relative to C) 10 ns
tCHSL S Not Active Hold Time (relative to C) 10 ns
tDVCH tDSU Data In Setup Time 5 ns
tCHDX tDH Data In Hold Time 5 ns
tCHSH S Active Hold Time (relative to C) 10 ns
tSHCH S Not Active Setup Time (relative to C) 10 ns
tSHSL tCSH S Deselect Time 200 ns
tSHQZ 2tDIS Output Disable Time 15 ns
tCLQV tVClock Low to Output Valid 15 ns
tCLQX tHO Output Hold Time 0 ns
tRLRH 2tRST Reset Pulse Width 10 µs
tRHSL tREC Reset Recovery Time 3 µs
tSHRH Chip should have been deselected
before Reset is de-asserted 10 ns
tWHSL Write Protect Setup Time 50 ns
tSHWL Write Protect Hold Time 100 ns
tDP 2S to Deep Power-down 3 µs
tRDP 2S High to Standby Power mode 30 µs
tPW (3) Page Write Cycle Time (256 Bytes) 11 25 ms
Page Write Cycle Time (n Bytes) 10.2+
n*0.8/256
tPP (3) Page Program Cycle Time (256 Bytes) 1.2 5ms
Page Program Cycle Time (n Bytes) 0.4+
n*0.8/256
tPE Page Erase Cycle Time 10 20 ms
tSE Sector Erase Cycle Time 1 5 s
27/34
M45PE10
Table 13. AC Characteristics (33MHz operation)
Note: 1. tCH + tCL must be greater than or equal to 1/ fC
2. Value guaranteed by characterization, not 100% tested in production.
3. When using PP and PW instructions to update consecutive Bytes, optimized timings are obtained with one sequence including all
the Bytes versus several sequences of only a few Bytes. (1 n 256)
4. Details of how to find the date of marking are given in Application Note, AN1995.
33MHz only available for products marked since week 40 of 2005(4)
Test conditions specified in Table 8. and Table 9.
Symbol Alt. Parameter Min. Typ. Max. Unit
fCfC
Clock Frequency for the following
instructions: FAST_READ, PW, PP,
PE, SE, DP, RDP, WREN, WRDI,
RDSR
D.C. 33 MHz
fRClock Frequency for READ
instructions D.C. 20 MHz
tCH (1) tCLH Clock High Time 13 ns
tCL (1) tCLL Clock Low Time 13 ns
Clock Slew Rate 2 (peak to peak) 0.03 V/ns
tSLCH tCSS S Active Setup Time (relative to C) 10 ns
tCHSL S Not Active Hold Time (relative to C) 10 ns
tDVCH tDSU Data In Setup Time 3 ns
tCHDX tDH Data In Hold Time 5 ns
tCHSH S Active Hold Time (relative to C) 5 ns
tSHCH S Not Activ e Setup Time (relativ e to C) 5 ns
tSHSL tCSH S Deselect Time 200 ns
tSHQZ (2) tDIS Output Disable Time 12 ns
tCLQV tVClock Low to Output Valid 12 ns
tCLQX tHO Output Hold Time 0 ns
tTHSL Top Sector Lock Setup Time 50 ns
tSHTL Top Sector Lock Hold Time 100 ns
tDP (2) S to Deep Power-down 3 µs
tRDP (2) S High to Standby Power mode 30 µs
tPW (3) Page Write Cycle Time (256 Bytes) 11 25 ms
Page Write Cycle Time (n Bytes) 10.2+
n*0.8/256
tPP (3) Page Progr am Cycle Time (256 Bytes) 1.2 5ms
Page Program Cycle Time (n Bytes) 0.4+
n*0.8/256
tPE Page Erase Cycle Time 10 20 ms
tSE Sector Erase Cycle Time 1 5 s
M45PE10
28/34
Figure 21. Serial Input Timing
Figure 22. Write Protect Setup and Hold Timing
C
D
AI01447C
S
MSB IN
Q
tDVCH
High Impedance
LSB IN
tSLCH
tCHDX
tCHCL
tCLCH
tSHCH
tSHSL
tCHSHtCHSL
C
D
S
Q
High Impedance
W
tWHSL tSHWL
AI07439
29/34
M45PE10
Figure 23. Output Timing
Figure 24. Reset AC Waveforms
C
Q
AI01449D
S
LSB OUT
DADDR.LSB IN
tSHQZ
tCH
tCL
tQLQH
tQHQL
tCLQX
tCLQV
tCLQX
tCLQV
AI06808
Reset tRLRH
S
tRHSLtSHRH
M45PE10
30/34
PACKAGE MECHANICAL
Figure 25. SO8 narrow – 8 lead Plastic Small Outline, 150 mils body width, Package Outline
Note: Drawing is not to scale.
Table 14. SO8 narrow – 8 lead Plastic Small Outline, 150 mils body width, Package Mechanical Data
Symb. mm inches
Typ. Min. Max. Typ. Min. Max.
A 1.35 1.75 0.053 0.069
A1 0.10 0.25 0.004 0.010
B 0.33 0.51 0.013 0.020
C 0.19 0.25 0.007 0.010
D 4.80 5.00 0.189 0.197
E 3.80 4.00 0.150 0.157
e1.27––0.050––
H 5.80 6.20 0.228 0.244
h 0.25 0.50 0.010 0.020
L 0.40 0.90 0.016 0.035
α
N8 8
CP 0.10 0.004
SO-a
E
N
CP
Be
A
D
C
LA1 α
1
H
h x 45˚
31/34
M45PE10
Figure 26. MLP8, 8-lead Very thin Dual Flat Package No lead, 6x5mm, Package Outline
Note: Drawing is not to scale.
Table 15. MLP8, 8-lead Very thin Dual Flat Package No lead, 6x5mm, Package Mechanical Data
Symb. mm inches
Typ. Min. Max. Typ. Min. Max.
A 0.85 1.00 0.0335 0.0394
A1 0.00 0.05 0.0000 0.0020
A2 0.65 0.0256
A3 0.20 0.0079
b 0.40 0.35 0.48 0.0157 0.0138 0.0189
D 6.00 0.2362
D1 5.75 0.2264
D2 3.40 3.20 3.60 0.1339 0.1260 0.1417
E 5.00 0.1969
E1 4.75 0.1870
E2 4.00 3.80 4.20 0.1575 0.1496 0.1654
e 1.27 0.0500
L 0.60 0.50 0.75 0.0236 0.0197 0.0295
θ12° 12°
D
E
VDFPN-01
A2
A
A3
A1
E1
D1
eE2
D2
L
b
θ
M45PE10
32/34
PART NUMBERING
Table 16. Ordering Information Scheme
For a list of available options (speed, package,
etc.) or for further information on any aspect of this
device, please contact your nearest ST Sales Of-
fice.
The category of second Level Interconnect is
marked on the package and on the inner box label,
in compliance with JEDEC Standar d JESD97. The
maximum ratings related to soldering conditions
are also marked on the inner box label.
Example: M45PE10 V MP 6 T G
Device Type
M45PE = Serial Flash Memory for Data Storage
Device Function
10 = 1Mbit (128K x 8)
Operating Voltage
V = VCC = 2.7 to 3.6V
Package
MN = SO8 (150 mil width)
MP = VDFPN8 6x5mm (MLP8)
Device Grade
6 = Industrial temperature range, –40 to 85 °C.
Device tested with standard test flow
Option
blank = Standard Packing
T = Tape and Reel Packing
Plating Technology
blank = Standard SnPb plating
P or G = ECOPACK® (RoHS compliant)
33/34
M45PE10
REVISION HISTORY
Table 17. Document Revision History
Date Version Description of Revision
29-Apr-2003 1.0 Document written
04-Jun-2003 1.1 Description corrected of entering Hardware Protected mode (W must be driven, and
cannot be left unconnected).
04-Dec-2003 1.2 VIO(min) e xtended to –0.6V, tPW(typ) and tPP(typ) improv ed. Table of c ontents, warning
about exposed paddle on MLP8, and Pb-free options added. Change of naming for
VDFPN8 package.
25-Jun-2004 1.3 Soldering temperature information clarified for RoHS compliant de vices. De vice Grade
clarified.
22-Sep-2004 2.0 Document promoted to Preliminar y Data. Minor wording changes
08-Oct-2004 3.0 Document promoted to Mature Datasheet. No other changes
4-Oct-2005 4.0
Added AC Characteristics (33MHz operation). An Easy Way to Modify Data, A Fast
Way to Modify Data, Page Write (PW) and Page Program (PP) sections updated to
explain optimal use of Page Write and Page Program instructions. Updated ICC3
values in Table 11., DC Characteristics. Updated Table 16., Ordering Information
Scheme. Added Ecopack® information.
M45PE10
34/34
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