
LTC4360-1/LTC4360-2
6
Rev B
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OPERATION
Mobile devices like cell phones and MP3/MP4 players have
highly integrated subsystems fabricated from deep submi-
cron CMOS processes. The small form factor is accompa-
nied by low absolute maximum voltage ratings. The sensi-
tive electronics are susceptible to damage from transient or
DC overvoltage conditions from the power supply.
Failures or faults in the power adaptor can cause an over-
voltage event. So can hot-plugging an AC adaptor into the
power input of the mobile device (see ADI Application
Note 88). Today’s mobile devices derive their power sup-
ply or recharge their internal batteries from multiple alter-
native inputs like AC wall adaptors, car battery adaptors
and USB ports. A user may unknowingly plug in the wrong
adaptor, damaging the device with a high or even a nega-
tive power supply voltage.
The LTC4360 protects low voltage electronics from these
overvoltage conditions by controlling a low cost exter-
nal N-channel MOSFET configured as a pass transistor.
At power-up (VIN > 2.1V), a start-up delay cycle begins.
Any overvoltage condition causes the delay cycle to con-
tinue until a safe voltage is present. When the delay cycle
completes, an internal high side switch driver slowly
ramps up the MOSFET gate, powering up the output at
a controlled rate and limiting the inrush current to the
output capacitor.
If the voltage at the IN pin exceeds 5.8V (VIN(OV)),
GATE is pulled low quickly to protect the load. The
incoming power supply must remain below 5.7V
(VIN(OV) – ∆VOV) for the duration of the start-up delay to
restart the GATE ramp-up.
The LTC4360-1 has a CMOS compatible ON input. When
driven low, the part is enabled. When driven high, the
external N-channel MOSFET is turned off and the supply
current of the LTC4360-1 drops to 1.5µA. The PWRGD
pull-down releases during this low current sleep mode,
UVLO or overvoltage and the subsequent 130ms start-up
delay. After the start-up delay, GATE starts its slow ramp-
up and ramps higher than V
GATE(TH)
to trigger a 65ms
delay cycle. When that completes, PWRGD pulls low.
The LTC4360-2 has a GATEP pin that drives an optional
external P-channel MOSFET to provide protection against
negative voltages at IN.
The typical LTC4360 application protects 2.5V to 5.5V
systems in portable devices from power supply overvolt-
age. The basic application circuit is shown in Figure1.
Device operation and external component selection is
discussed in detail in the following sections.
APPLICATIONS INFORMATION
GATE
COUT
10µF
Si1470DH
IN
436012 F01
VOUT
5V
1.5A
VIN
5V
LTC4360-1
ON
OUT
PWRGD
GND
Figure1. Protection from Input Overvoltage
Start-Up
When VIN is less than the undervoltage lockout level of
2.1V, the GATE driver is held low and the PWRGD pull-
down is high impedance. When VIN rises above 2.1V and
ON (LTC4360-1) is held low, a 130ms delay cycle starts.
Any undervoltage or overvoltage event at IN (VIN < 2.1V or
VIN > 5.7V) restarts the delay cycle. This delay allows the
N-channel MOSFET to isolate the output from any input
transients that occur at start-up. When the delay cycle
completes, GATE starts its slow ramp-up.
GATE Control
An internal charge pump provides a gate overdrive greater
than 3.5V when 2.5V ≤ VIN < 3V. If VIN ≥ 3V, the gate drive
is guaranteed to be greater than 4.5V. This allows the use
of logic-level N-channel MOSFETs. An internal 6V clamp
between GATE and OUT protects the MOSFET gate.