M58BW32FB4T3T - Micron Technology Inc.

M58BW16F, M58BW32F

16Mb or 32Mb (x32, Boot Block, Burst) 3.3V Supply Flash Memory

Features

• Supply voltage

– VDD = 2.7–3.6V (45ns) or

VDD = 2.5–3.3V (55ns)

– VDDQ = VDDQIN = 2.4V to VDD for I/O buffers

• High performance

– Access times: 45ns and 55ns

– Synchronous burst reads

– 75 MHz effective zero wait-state burst read

– Asynchronous page reads (4 double words)

• M58BW32F memory organization:

– Eight 64 Kbit small parameter blocks

– Four 128 Kbit large parameter blocks

– Sixty-two 512 Kbit main blocks

• M58BW16F memory organization:

– Eight 64 Kbit parameter blocks

– Thirty-one 512 Kbit main blocks

• Hardware block protection

– WP# pin to protect any block combination from

PROGRAM and ERASE operations

– PEN signal for program/erase enable

• Irreversible modify protection (OTP like) on

128 Kbits:

– Block 1 (bottom device) or block 72 (top device)

in the M58BW32F

– Blocks 2 and 3 (bottom device) or blocks 36 and

35 (top device) in the M58BW16F

• Security

– 64-bit unique device identifier (UID)

• Fast programming

– Write to buffer and program capability (8 double

words)

• Optimized for FDI drivers

– Common flash interface (CFI)

– Fast Program/Erase Suspend feature in each

block

• Low power consumption

– 100µA typical Standby current

• Electronic signature

• Manufacturer code: 0020h

– Top device codes:

M58BW32FT: 8838h

M58BW16FT: 883Ah

– Bottom device codes:

M58BW32FB: 8837h

M58BW16FB: 8839h

• Automotive device grade 3:

– Temperature: –40 to 125 °C

• Automotive grade certified

M58BW16F, M58BW32F

Features

CCMTD-1725822587-8496

m58bw_16-32f.pdf - Rev. D 6/18 EN 1Micron Technology, Inc. reserves the right to change products or specifications without notice.

Products and specifications discussed herein are subject to change by Micron without notice.

Part Numbering Information

Devices are shipped from the factory with memory content bits erased to 1. For available options, such as pack-

ages or speed, or for further information, contact your Micron sales representative. Part numbers can be verified at

www.micron.com. Feature and specification comparison by device type is available at www.micron.com/products.

Contact the factory for devices not found.

Table 1: Part Number Information Scheme

Part Number

Category Category Details

Device type M58 = Parallel Flash memory

Architecture B = Burst mode

Operating voltage W = [2.7V to 3.6V] VDD range for 45ns speed class

2.5V to 3.3V] VDD range for 55ns speed class

[2.4V to VDD] VDDQ range for 45ns and 55ns speed classes

Device function/density 32F = 32Mb (x32), boot block, burst, 0.11µm technology

16F = 16Mb (x32), boot block, burst, 0.11µm technology

Array matrix T = Top boot

B = Bottom boot

Speed 4 = 45ns

5 = 55ns

Package T = PQFP80

ZA = LBGA80, 1.0mm pitch

Temperature range 3 = Automotive grade certified,1 –40 to 125 °C

Packing Option Blank = Standard packing

T = Tape and reel packing

F = ECOPACK® package, tape and reel 24mm packing

Note: 1. Qualified and characterized according to AEC Q100 and Q003 or equivalent, advanced screening according

to AEC Q001 and Q002 or equivalent.

M58BW16F, M58BW32F

Features

CCMTD-1725822587-8496

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Contents

Important Notes and Warnings ......................................................................................................................... 7

Description ...................................................................................................................................................... 7

Block Protection ......................................................................................................................................... 13

OTP Protection ........................................................................................................................................... 14

Activation Sequence ............................................................................................................................... 14

Memory Map Addresses ............................................................................................................................. 15

Signal Descriptions ......................................................................................................................................... 22

Address Inputs (A[MAX:0]) .......................................................................................................................... 22

Data Inputs/Outputs (DQ[31:0]) .................................................................................................................. 22

Chip Enable (E#) ........................................................................................................................................ 22

Output Enable (G#) .................................................................................................................................... 22

Output Disable (GD#) ................................................................................................................................. 22

Write Enable (W#) ...................................................................................................................................... 23

Reset/Power-Down (RP#) ............................................................................................................................ 23

Program/Erase Enable (PEN) ...................................................................................................................... 23

Latch Enable (L#) ....................................................................................................................................... 23

Burst Clock (K) ........................................................................................................................................... 23

Burst Address Advance (B#) ........................................................................................................................ 24

Valid Data Ready (R) ................................................................................................................................... 24

Write Protect (WP#) .................................................................................................................................... 24

Supply Voltage (VDD) .................................................................................................................................. 24

Output Supply Voltage (VDDQ) ..................................................................................................................... 24

Input Supply Voltage (VDDQIN) .................................................................................................................... 24

Ground (VSS and VSSQ) ................................................................................................................................ 24

Don’t Use (DNU) ........................................................................................................................................ 25

Not Connected (NC) ................................................................................................................................... 25

Bus Operations ............................................................................................................................................... 26

Asynchronous Bus Operations .................................................................................................................... 26

Asynchronous Bus Read ......................................................................................................................... 26

Asynchronous Latch Controlled Bus Read ............................................................................................... 26

Asynchronous Page Read ........................................................................................................................ 27

Asynchronous Bus Write ......................................................................................................................... 27

Output Disable ....................................................................................................................................... 27

Standby ................................................................................................................................................. 27

Reset/Power-Down ................................................................................................................................. 27

Synchronous Bus Operations ...................................................................................................................... 28

Synchronous Burst Read ......................................................................................................................... 28

Synchronous Burst Read Suspend ........................................................................................................... 29

Burst Configuration Register ....................................................................................................................... 29

Read Select Bit M15 ................................................................................................................................ 30

Standby Disable Bit M14 ......................................................................................................................... 30

X-Latency Bits M13-M11 ......................................................................................................................... 30

Y-Latency Bit M9 .................................................................................................................................... 30

Valid Data Ready Bit M8 .......................................................................................................................... 30

Valid Clock Edge Bit (M6) ........................................................................................................................ 30

Burst Wrap Bit M3 .................................................................................................................................. 30

Burst Length Bits M2-M0 ........................................................................................................................ 30

Device Commands ......................................................................................................................................... 35

READ MEMORY ARRAY Command ............................................................................................................. 36

READ ELECTRONIC SIGNATURE Command ............................................................................................... 36

M58BW16F, M58BW32F

Features

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READ QUERY Command ............................................................................................................................ 36

READ STATUS REGISTER Command ........................................................................................................... 36

CLEAR STATUS REGISTER Command ......................................................................................................... 37

BLOCK ERASE Command ........................................................................................................................... 37

ERASE ALL MAIN BLOCKS Command ......................................................................................................... 37

PROGRAM Command ................................................................................................................................ 38

WRITE TO BUFFER AND PROGRAM Command .......................................................................................... 38

PROGRAM/ERASE SUSPEND Command ..................................................................................................... 39

PROGRAM/ERASE RESUME Command ...................................................................................................... 40

SET BURST CONFIGURATION REGISTER Command .................................................................................. 40

SET BLOCK PROTECTION CONFIGURATION REGISTER Command ............................................................ 40

CLEAR BLOCK PROTECTION CONFIGURATION REGISTER Command ....................................................... 41

Flowcharts ..................................................................................................................................................... 42

Status Register ................................................................................................................................................ 51

Program/Erase Controller Status (bit 7) ....................................................................................................... 51

Erase Suspend Status (bit 6) ........................................................................................................................ 52

Erase Status (Bit 5) ...................................................................................................................................... 52

Program/Write to Buffer and Program Status (Bit 4) ..................................................................................... 52

PEN Status (Bit 3) ....................................................................................................................................... 53

Program Suspend Status (Bit 2) ................................................................................................................... 53

Block Protection Status (Bit 1) ..................................................................................................................... 53

Reserved (Bit 0) .......................................................................................................................................... 53

Common Flash Interface (CFI) ........................................................................................................................ 54

Maximum Rating ............................................................................................................................................ 61

Program and Erase Times and Endurance Cycles ............................................................................................. 62

DC and AC Parameters ................................................................................................................................... 63

Operating Conditions and Capacitance ....................................................................................................... 63

DC Characteristics ...................................................................................................................................... 65

Asynchronous Bus Read AC Characteristics ................................................................................................. 66

Asynchronous Page Read AC Characteristics ................................................................................................ 70

Asynchronous Write AC Characteristics ....................................................................................................... 71

Synchronous Burst Read AC Characteristics ................................................................................................. 75

AC and DC Power Characteristics ................................................................................................................ 81

Package Dimensions ....................................................................................................................................... 84

Revision History ............................................................................................................................................. 86

Rev. D – 6/18 .............................................................................................................................................. 86

Rev. C – 5/16 ............................................................................................................................................... 86

Rev. B – 12/15 ............................................................................................................................................. 86

Rev. A – 1/13 ............................................................................................................................................... 86

M58BW16F, M58BW32F

Features

CCMTD-1725822587-8496

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List of Figures

Figure 1: Logic Diagram ................................................................................................................................. 10

Figure 2: LBGA Connections (Top View through Package) ............................................................................... 12

Figure 3: PQFP Connections (Top View through Package) ............................................................................... 13

Figure 4: Example Burst Configuration X-1-1-1 ............................................................................................... 33

Figure 5: Example Burst Configuration X-2-2-2 ............................................................................................... 34

Figure 6: Program Flowchart and Pseudocode ................................................................................................ 42

Figure 7: Program Suspend & Resume Flowchart and Pseudocode .................................................................. 43

Figure 8: Block Erase Flowchart and Pseudocode ............................................................................................ 44

Figure 9: Erase Suspend & Resume Flowchart and Pseudocode ....................................................................... 45

Figure 10: Power-up Sequence followed by Synchronous Burst Read ............................................................... 46

Figure 11: Command Interface and Program/Erase Controller Flowchart (A) ................................................... 47

Figure 12: Command Interface and Program/Erase Controller Flowchart (B) ................................................... 48

Figure 13: Command Interface and Program/Erase Controller Flowchart (C) ................................................... 49

Figure 14: Command Interface and Program/Erase Controller Flowchart (D) ................................................... 50

Figure 15: AC Measurement Input/Output Waveform ..................................................................................... 63

Figure 16: AC Measurement Load Circuit ....................................................................................................... 64

Figure 17: Asynchronous Bus Read AC Waveforms .......................................................................................... 66

Figure 18: Asynchronous Latch Controlled Bus Read AC Waveforms ................................................................ 67

Figure 19: Asynchronous Chip Enable Controlled Bus Read AC Waveforms ...................................................... 67

Figure 20: Asynchronous Address Controlled Bus Read AC Waveforms ............................................................ 68

Figure 21: Asynchronous Page Read AC Waveforms ........................................................................................ 70

Figure 22: Asynchronous Write E# - Controlled AC Waveforms ........................................................................ 71

Figure 23: Asynchronous Write W# - Controlled AC Waveforms ....................................................................... 73

Figure 24: Synchronous Burst Read, Latch Enable Controlled (data valid from ’n’ clock rising edge) ................. 75

Figure 25: Synchronous Burst Read, Chip Enable Controlled (data valid from ’n’ clock rising edge) ................... 76

Figure 26: Synchronous Burst Read, Valid Address Transition Controlled (data valid

from ’n’ clock rising edge) ........................................................................................................................... 77

Figure 27: Synchronous Burst Read (data valid from ’n’ clock rising edge) ........................................................ 78

Figure 28: Synchronous Burst Read (valid data ready output) .......................................................................... 78

Figure 29: Synchronous Burst Read (Burst Address Advance) .......................................................................... 79

Figure 30: Clock Input AC waveform .............................................................................................................. 79

Figure 31: Power Supply Slope Specification ................................................................................................... 81

Figure 32: Reset, Power-down, and Power-up AC Waveforms - Control Pins LOW ............................................. 82

Figure 33: Reset, Power-down, and Power-up AC Waveforms - Control Pins Toggling ........................................ 82

Figure 34: 80-Pin LBGA – 10mm x 12mm ........................................................................................................ 84

Figure 35: 80-Lead PQFP ............................................................................................................................... 85

M58BW16F, M58BW32F

Features

CCMTD-1725822587-8496

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List of Tables

Table 1: Part Number Information Scheme ....................................................................................................... 2

Table 2: Signal Names .................................................................................................................................... 10

Table 3: M58BW32F Top Boot Block Addresses ............................................................................................... 15

Table 4: M58BW32F Bottom Boot Block Addresses .......................................................................................... 17

Table 5: M58BW16F Top Boot Block Addresses ............................................................................................... 19

Table 6: M58BW16F Bottom Boot Block Addresses .......................................................................................... 20

Table 7: Asynchronous Bus Operations1 ......................................................................................................... 28

Table 8: Synchronous Burst Read Bus Operations1 .......................................................................................... 29

Table 9: Burst Configuration Register ............................................................................................................. 31

Table 10: WAIT States .................................................................................................................................... 32

Table 11: Burst Type Definition ...................................................................................................................... 32

Table 12: Commands1 ................................................................................................................................... 35

Table 13: Read Electronic Signature ............................................................................................................... 36

Table 14: Status Register Bits .......................................................................................................................... 51

Table 15: Query Structure Overview ............................................................................................................... 54

Table 16: CFI - Query Address and Data Output .............................................................................................. 54

Table 17: CFI - Device Voltage and Timing Specification ................................................................................. 55

Table 18: M58BW16F Device Geometry Definition .......................................................................................... 56

Table 19: M58BW16F Extended Query Information ......................................................................................... 57

Table 20: M58BW32F Device Geometry Definition .......................................................................................... 58

Table 21: M58BW32F Extended Query Information ......................................................................................... 59

Table 22: Protection Register Information ...................................................................................................... 60

Table 23: Absolute Maximum Ratings ............................................................................................................. 61

Table 24: Data Retention ............................................................................................................................... 61

Table 25: Program and Erase Times and Endurance Cycles1 ............................................................................ 62

Table 26: Operating and AC Measurement Conditions .................................................................................... 63

Table 27: Device Capacitance ........................................................................................................................ 64

Table 28: Asynchronous Bus Read AC Characteristics ...................................................................................... 69

Table 29: Asynchronous Page Read AC Characteristics .................................................................................... 70

Table 30: Asynchronous Write E# - Controlled AC Characteristics .................................................................... 72

Table 31: Asynchronous Write E# - Controlled AC Characteristics .................................................................... 74

Table 32: Synchronous Burst Read AC Characteristics ..................................................................................... 80

Table 33: Power Supply AC and DC Characteristics ......................................................................................... 81

Table 34: Reset, Power-Down, and Power-Up AC Characteristics ..................................................................... 83

M58BW16F, M58BW32F

Features

CCMTD-1725822587-8496

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Important Notes and Warnings

Micron Technology, Inc. ("Micron") reserves the right to make changes to information published in this document,

including without limitation specifications and product descriptions. This document supersedes and replaces all

information supplied prior to the publication hereof. You may not rely on any information set forth in this docu-

ment if you obtain the product described herein from any unauthorized distributor or other source not authorized

by Micron.

Automotive Applications. Products are not designed or intended for use in automotive applications unless specifi-

cally designated by Micron as automotive-grade by their respective data sheets. Distributor and customer/distrib-

utor shall assume the sole risk and liability for and shall indemnify and hold Micron harmless against all claims,

costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of

product liability, personal injury, death, or property damage resulting directly or indirectly from any use of non-

automotive-grade products in automotive applications. Customer/distributor shall ensure that the terms and con-

ditions of sale between customer/distributor and any customer of distributor/customer (1) state that Micron

products are not designed or intended for use in automotive applications unless specifically designated by Micron

as automotive-grade by their respective data sheets and (2) require such customer of distributor/customer to in-

demnify and hold Micron harmless against all claims, costs, damages, and expenses and reasonable attorneys'

fees arising out of, directly or indirectly, any claim of product liability, personal injury, death, or property damage

resulting from any use of non-automotive-grade products in automotive applications.

Critical Applications. Products are not authorized for use in applications in which failure of the Micron compo-

nent could result, directly or indirectly in death, personal injury, or severe property or environmental damage

("Critical Applications"). Customer must protect against death, personal injury, and severe property and environ-

mental damage by incorporating safety design measures into customer's applications to ensure that failure of the

Micron component will not result in such harms. Should customer or distributor purchase, use, or sell any Micron

component for any critical application, customer and distributor shall indemnify and hold harmless Micron and

its subsidiaries, subcontractors, and affiliates and the directors, officers, and employees of each against all claims,

costs, damages, and expenses and reasonable attorneys' fees arising out of, directly or indirectly, any claim of

product liability, personal injury, or death arising in any way out of such critical application, whether or not Mi-

cron or its subsidiaries, subcontractors, or affiliates were negligent in the design, manufacture, or warning of the

Micron product.

Customer Responsibility. Customers are responsible for the design, manufacture, and operation of their systems,

applications, and products using Micron products. ALL SEMICONDUCTOR PRODUCTS HAVE INHERENT FAIL-

URE RATES AND LIMITED USEFUL LIVES. IT IS THE CUSTOMER'S SOLE RESPONSIBILITY TO DETERMINE

WHETHER THE MICRON PRODUCT IS SUITABLE AND FIT FOR THE CUSTOMER'S SYSTEM, APPLICATION, OR

PRODUCT. Customers must ensure that adequate design, manufacturing, and operating safeguards are included

in customer's applications and products to eliminate the risk that personal injury, death, or severe property or en-

vironmental damages will result from failure of any semiconductor component.

Limited Warranty. In no event shall Micron be liable for any indirect, incidental, punitive, special or consequential

damages (including without limitation lost profits, lost savings, business interruption, costs related to the removal

or replacement of any products or rework charges) whether or not such damages are based on tort, warranty,

breach of contract or other legal theory, unless explicitly stated in a written agreement executed by Micron's duly

authorized representative.

Description

The M58BW16F and M58BW32F are 16 and 32 Mbit non-volatile Flash memories, re-

spectively. They can be erased electrically at block level and programmed in-system on

a double-word basis using a 2.7–3.6V or 2.5–3.3V VDD supply for the circuit and a VDDQ

supply voltage (2.4V to VDD) for the input and output buffers.

M58BW16F, M58BW32F

Important Notes and Warnings

CCMTD-1725822587-8496

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In the rest of the document the M58BW16F and M58BW32F will be referred to as

M58BWxxF unless otherwise specified.

The devices support asynchronous (latch controlled READ and page READ) and syn-

chronous bus operations. The synchronous burst read interface allows a high data

transfer rate controlled by the burst clock signal, K. It is capable of bursting fixed or un-

limited lengths of data. The burst type, latency and length are configurable and can be

easily adapted to a large variety of system clock frequencies and microprocessors. All

WRITE operations are asynchronous. On power-up the memory defaults to read mode

with an asynchronous bus.

The device features an asymmetrical block architecture:

• The M58BW32F has an array of 62 main blocks of 512Kb each, plus 4 large parameter

blocks of 128Kb each and 8 small parameter blocks of 64Kb each. The large and small

parameter blocks are located either at the top (M58BW32FT) or at the bottom

(M58BW32FB) of the address space. The first large parameter block is referred to as

boot block and can be used either to store a boot code or parameters. The memory

array organization is detailed in the M58BW32F top boot block addresses table and

the M58BW32F bottom boot block addresses table.

• The M58BW16F has an array of 8 parameter blocks of 64Kb each and 31 main blocks

of 512Kb each. In the M58BW16FT the parameter blocks are located at the top of the

address space whereas in the M58BW16FB, they are located at the bottom. The mem-

ory array organization is detailed in the M58BW16F top boot block addresses table

and the M58BW16F bottom boot block addresses table.

PROGRAM and ERASE commands are written to the command interface of the memo-

ry. An on-chip program/erase controller simplifies the process of programming or eras-

ing the memory by taking care of all of the special operations that are required to up-

date the memory contents. The end of a PROGRAM or ERASE operation can be detected

and any error conditions identified in the status register. The command set required to

control the memory is consistent with JEDEC standards.

An ERASE operation can be suspended in order to perform either READ or PROGRAM

in any other block, and then resumed. The PROGRAM operation can be suspended to

read data in any other block, and then resumed. Each block can be programmed and

erased over 100,000 cycles.

All blocks are protected during power-up. The M58BWxxF features the following levels

of hardware and software block protection to avoid unwanted PROGRAM/ERASE oper-

ations:

• Write/protect enable input, WP#, hardware protects a combination of blocks from

PROGRAM and ERASE operations. The blocks to be protected are configured individ-

ually by issuing a SET BLOCK PROTECTION CONFIGURATION REGISTER or a CLEAR

BLOCK PROTECTION CONFIGURATION REGISTER command.

• All PROGRAM or ERASE operations are blocked when RP#, is held LOW.

• A program/erase enable input, PEN, is used to protect all blocks, preventing PRO-

GRAM and ERASE operations from affecting their data.

• A permanent user-enabled protection against Modify operations is available:

on one specific 128Kb parameter block in the M58BW32F – block 1 for bottom devices

or block 72 for top devices

M58BW16F, M58BW32F

Description

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on two specific 64Kb parameter blocks in the M58BW16F – blocks 2 and 3 for bottom

devices or blocks 36 and 35 for top devices.

A reset/power-down mode is entered when the RP# input is LOW. In this mode the pow-

er consumption is reduced to the standby level, the device is write protected and both

the status and burst configuration registers are cleared. A recovery time is required

when the RP# input goes HIGH.

A manufacturer code and a device code are available. They can be read from the memo-

ry allowing programming equipment or applications to automatically match their inter-

face to the characteristics of the memory.

Finally, the M58BWxxF features a 64-bit unique device identifier (UID) which is pro-

grammed by Micron on the production line. It is unique for each die and can be used to

implement cryptographic algorithms to improve security. Information is available in

the CFI area (see the M58BW16F extended query information table).

The memory is offered in PQFP80 (14 x 20mm) and LBGA80 (1.0mm pitch) packages

and it is supplied with all the bits erased (set to ’1’).

M58BW16F, M58BW32F

Description

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Figure 1: Logic Diagram

A0-Amax(1) DQ0-DQ31

VDD

VSS

RP#

GD#

VDDQ

WP#

VSSQ

VDDQIN

PEN

Note: 1. Amax is equal to A18 in the M58BW16F, and to A19 in the M58BW32F.

Table 2: Signal Names

Signal name Function Direction

A[MAX:0]1Address inputs Inputs

DQ[7:0] Data input/output, command input I/O

DQ[15:8] Data input/output, Burst configuration register I/O

DQ[31:16] Data input/output I/O

B# Burst address advance Input

E# Chip enable Input

G# Output enable Input

K Burst clock Input

L# Latch enable Input

R Valid data ready Output

RP# Reset/Power-down Input

W# Write enable Input

GD# Output disable Input

WP# Write protect Input

M58BW16F, M58BW32F

Description

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Table 2: Signal Names (Continued)

Signal name Function Direction

VDD Supply voltage

VDDQ Power supply for output buffers

VDDQIN Power supply for input buffers only

PEN Program/Erase enable Input

VSS Ground

VSSQ Input/output ground

NC Not connected internally

DNU Don’t use as internally connected

Note: 1. A[MAX] is equal to A18 in the M58BW16F, and to A19 in the M58BW32F.

M58BW16F, M58BW32F

Description

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Figure 2: LBGA Connections (Top View through Package)

DQ24DQ7VSSQ

VDDQ

DQ26DQ4VDDQ

DQ29

VSS

DQ0DQ3D

A0NCA7A11A18A17C

A1A4A5A8

RP#

A13A16B

A2A3A6

VDD

PENVDD

A14A

87654321

DQ20DQ18DQ19DQ17DQ11DQ12DQ13

VDDQ

DQ23DQ8VDDQ

NCGD#W#

VDDQIN

DQ16RG#L#DQ14DQ15

A15 VSS

A12 A9

A10 NC

A19/

NC(1) NC DQ31 DQ30

DQ2 DQ28

DQ6 DQ25 VSSQ

DQ10 DQ9 DQ21

WP#

DQ1 DQ27

DQ5 NC

DQ22

Note: 1. Ball D3 is NC in the M58BW16F and A19 in the M58BW32F.

M58BW16F, M58BW32F

Description

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Figure 3: PQFP Connections (Top View through Package)

VDDQ

DQ24

DQ25

DQ18

DQ17

DQ16

DQ19

DQ20

DQ21

DQ22

DQ23

VDDQ

DQ29

DQ26

DQ30

DQ31

DQ28

DQ27

A11

VSS

A12

A13

A14

A10

GD#

WP#

VSS

RP#

VDDQ

DQ7

DQ6

DQ13

DQ14

DQ15

DQ12

DQ11

DQ10

DQ9

VSSQ

DQ8

DQ2

DQ5

DQ0

A19/NC(1)

A18

A16

A17

DQ3

DQ4

VSSQ

PEN

VDD

A15

DQ1

VDDQ

VSSQ

VDD

VDDQIN

Note: 1. Pin 44 is NC in the M58BW16F and A19 in the M58BW32F.

Block Protection

The M58BWxxF features four different levels of block protection.

•Write Protect pin, WP#, - When WP# is LOW, V IL, the protection status that has been

configured in the Block Protection Configuration Register is activated. The Block Pro-

tection Configuration Register is volatile. Any combination of blocks is possible. Any

attempt to program or erase a protected block will return an error in the Status Regis-

ter (see the Status Register bits table).

•Reset/Power-down pin, RP#, - If the device is held in reset mode (RP# at VIL), no PRO-

GRAM or ERASE operation can be performed on any block.

M58BW16F, M58BW32F

Description

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•Program/Erase Enable (PEN), - The Program/Erase Enable input, PEN, protects all

blocks by preventing PROGRAM and ERASE operations from modifying the data. Pri-

or to issuing a PROGRAM or ERASE command, the program/erase enable must be set

to HIGH (VIH). If it is LOW (VIL), the PROGRAM or ERASE operation is not accepted

and an error is generated in the Status Register.

•Permanent protection against modify operations - specific OTP-like blocks can be

permanently protected against modify operations (Program/Erase):

in the M58BW32F, a unique 128-Kbit parameter block – block 1 (01000h-01FFFh) for

bottom devices or block 72 (FE000h-FEFFFh) for top devices

in the M58BW16F, two 64-Kbit parameter blocks – blocks 2 and 3 (01000h-01FFFh) for

bottom devices or blocks 36 and 35 (7E000h-7EFFFh) for top devices

This protection is user-enabled. Details of how this protection is activated are provi-

ded in a dedicated application note.

After a device reset the first two kinds of block protection (WP#, RP#) can be combined

to give a flexible block protection. All blocks are protected at power-up.

OTP Protection

The OTP protection is an user-enabled feature that permanently protects specific

blocks, so called OTP blocks, against modify operations (program/erase). It is available:

• On one specific 128-kbit parameter block in the M58BW32F- block 1 (01000h-01FFFh)

for bottom devices or block 72 (FE000h-FEFFFh) for top devices

• On two specific 64-kbit parameter blocks in the M58BW16F- block 2 and 3

(01000h-01FFFh) for bottom devices or block 36 and 35 (7E000h-7EFFFh) for top de-

vices.

The default state is unprotected. However, once the protection has been enabled, it is

impossible to disable it and the OTP blocks will remain “modify protected” permanent-

ly.

Obviously, this information is stored in internal nonvolatile registers.

Activation Sequence

If the user wants to make the OTP protection effective on a part, he has to issue the

LOCK OTP PROTECTION command.

The Lock OTP protection requires 2 write cycles:

• write (ADD=000AAh, DATA=49h) - LOCK OTP PROTECTION command 1

• write (ADD=00003h, DATA=0000 0000h) - LOCK OTP PROTECTION command 2

This sequence of commands has to be given with Write Protect Enable WP_N=’1’. The

user can check its execution polling on the SR in the same way as a normal PROGRAM

command.

The program duration lasts about 35 µs like for a standard PROGRAM command. It is

also possible to detect the end of the operation by polling the Status Register.

Any Erase attempt returns A3h in the Status Register while any Program attempt returns

93h.

M58BW16F, M58BW32F

Description

CCMTD-1725822587-8496

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Once the first write cycle of the LOCK OTP PROTECTION command is issued, a wrong

address on second write cycle will cause the activation sequence to fail. The Status Reg-

ister allows detecting this event and its value is then B1h (invalid sequence).

As a consequence, the protection is not active and the sequence must be restarted after

a CLEAR STATUS REGISTER command.

The LOCK OTP PROTECTION command cannot be suspended.

Memory Map Addresses

Table 3: M58BW32F Top Boot Block Addresses

Block Number Size (Kbit) Address Range1

73 128 FF000h-FFFFFh

72 128 FE000h-FEFFFh2

71 128 FD000h-FDFFFh

70 128 FC000h-FCFFFh

69 64 FB800h-FBFFFh

68 64 FB000h-FB7FFh

67 64 FA800h-FAFFFh

66 64 FA000h-FA7FFh

65 64 F9800h-F9FFFh

64 64 F9000h-F97FFh

63 64 F8800h-F8FFFh

62 64 F8000h-F87FFh

61 512 F4000h-F7FFFh

60 512 F0000h-F3FFFh

59 512 EC000h-EFFFFh

58 512 E8000h-EBFFFh

57 512 E4000h-E7FFFh

56 512 E0000h-E3FFFh

55 512 DC000h-DFFFFh

54 512 D8000h-DBFFFh

53 512 D4000h-D7FFFh

52 512 D0000h-D3FFFh

51 512 CC000h-CFFFFh

50 512 C8000h-CBFFFh

49 512 C4000h-C7FFFh

48 512 C0000h-C3FFFh

47 512 BC000h-BFFFFh

46 512 B8000h-BBFFFh

45 512 B4000h-B7FFFh

44 512 B0000h-B3FFFh

M58BW16F, M58BW32F

Description

CCMTD-1725822587-8496

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Table 3: M58BW32F Top Boot Block Addresses (Continued)

Block Number Size (Kbit) Address Range1

43 512 AC000h-AFFFFh

42 512 A8000h-ABFFFh

41 512 A4000h-A7FFFh

40 512 A0000h-A3FFFh

39 512 9C000h-9FFFFh

38 512 98000h-9BFFFh

37 512 94000h-97FFFh

36 512 90000h-93FFFh

35 512 8C000h-8FFFFh

34 512 88000h-8BFFFh

33 512 84000h-87FFFh

32 512 80000h-83FFFh

31 512 7C000h-7FFFFh

30 512 78000h-7BFFFh

29 512 74000h-77FFFh

28 512 70000h-73FFFh

27 512 6C000h-6FFFFh

26 512 68000h-6BFFFh

25 512 64000h-67FFFh

24 512 60000h-63FFFh

23 512 5C000h-5FFFFh

22 512 58000h-5BFFFh

21 512 54000h-57FFFh

20 512 50000h-53FFFh

19 512 4C000h-4FFFFh

18 512 48000h-4BFFFh

17 512 44000h-47FFFh

16 512 40000h-43FFFh

15 512 3C000h-3FFFFh

14 512 38000h-3BFFFh

13 512 34000h-37FFFh

12 512 30000h-33FFFh

11 512 2C000h-2FFFFh

10 512 28000h-2BFFFh

9 512 24000h-27FFFh

8 512 20000h-23FFFh

7 512 1C000h-1FFFFh

6 512 18000h-1BFFFh

M58BW16F, M58BW32F

Description

CCMTD-1725822587-8496

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Table 3: M58BW32F Top Boot Block Addresses (Continued)

Block Number Size (Kbit) Address Range1

5 512 14000h-17FFFh

4 512 10000h-13FFFh

3 512 0C000h-0FFFFh

2 512 08000h-0BFFFh

1 512 04000h-07FFFh

0 512 00000h-03FFFh

Notes: 1. Addresses are indicated in 32-bit addressing.

2. OTP block.

Table 4: M58BW32F Bottom Boot Block Addresses

# Size (Kbit) Address Range1

73 512 FC000h-FFFFFh

72 512 F8000h-FBFFFh

71 512 F4000h-F7FFFh

70 512 F0000h-F3FFFh

69 512 EC000h-EFFFFh

68 512 E8000h-EBFFFh

67 512 E4000h-E7FFFh

66 512 E0000h-E3FFFh

65 512 DC000h-DFFFFh

64 512 D8000h-DBFFFh

63 512 D4000h-D7FFFh

62 512 D0000h-D3FFFh

61 512 CC000h-CFFFFh

60 512 C8000h-CBFFFh

59 512 C4000h-C7FFFh

58 512 C0000h-C3FFFh

57 512 BC000h-BFFFFh

56 512 B8000h-BBFFFh

55 512 B4000h-B7FFFh

54 512 B0000h-B3FFFh

53 512 AC000h-AFFFFh

52 512 A8000h-ABFFFh

51 512 A4000h-A7FFFh

50 512 A0000h-A3FFFh

49 512 9C000h-9FFFFh

48 512 98000h-9BFFFh

M58BW16F, M58BW32F

Description

CCMTD-1725822587-8496

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Table 4: M58BW32F Bottom Boot Block Addresses (Continued)

# Size (Kbit) Address Range1

47 512 94000h-97FFFh

46 512 90000h-93FFFh

45 512 8C000h-8FFFFh

44 512 88000h-8BFFFh

43 512 84000h-87FFFh

42 512 80000h-83FFFh

41 512 7C000h-7FFFFh

40 512 78000h-7BFFFh

39 512 74000h-77FFFh

38 512 70000h-73FFFh

37 512 6C000h-6FFFFh

36 512 68000h-6BFFFh

35 512 64000h-67FFFh

34 512 60000h-63FFFh

33 512 5C000h-5FFFFh

32 512 58000h-5BFFFh

31 512 54000h-57FFFh

30 512 50000h-53FFFh

29 512 4C000h-4FFFFh

28 512 48000h-4BFFFh

27 512 44000h-47FFFh

26 512 40000h-43FFFh

25 512 3C000h-3FFFFh

24 512 38000h-3BFFFh

23 512 34000h-37FFFh

22 512 30000h-33FFFh

21 512 2C000h-2FFFFh

20 512 28000h-2BFFFh

19 512 24000h-27FFFh

18 512 20000h-23FFFh

17 512 1C000h-1FFFFh

16 512 18000h-1BFFFh

15 512 14000h-17FFFh

14 512 10000h-13FFFh

13 512 0C000h-0FFFFh

12 512 08000h-0BFFFh

11 64 07800h-07FFFh

10 64 07000h-077FFh

M58BW16F, M58BW32F

Description

CCMTD-1725822587-8496

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Table 4: M58BW32F Bottom Boot Block Addresses (Continued)

# Size (Kbit) Address Range1

9 64 06800h-06FFFh

8 64 06000h-067FFh

7 64 05800h-05FFFh

6 64 05000h-057FFh

5 64 04800h-04FFFh

4 64 04000h-047FFh

3 128 03000h-03FFFh

2 128 02000h-02FFFh

1 128 01000h-01FFFh2

0 128 00000h-00FFFh

Notes: 1. Addresses are indicated in 32-bit word addressing.

2. OTP block.

Table 5: M58BW16F Top Boot Block Addresses

# Size (Kbit) Address Range

38 64 7F800h-7FFFFh

37 64 7F000h-7F7FFh

36164 7E800h-7EFFFh

35164 7E000h-7E7FFh

34 64 7D800h-7DFFFh

33 64 7D000h-7D7FFh

32 64 7C800h-7CFFFh

31 64 7C000h-7C7FFh

30 512 78000h-7BFFFh

29 512 74000h-77FFFh

28 512 70000h-73FFFh

27 512 6C000h-6FFFFh

26 512 68000h-6BFFFh

25 512 64000h-67FFFh

24 512 60000h-63FFFh

23 512 5C000h-5FFFFh

22 512 58000h-5BFFFh

21 512 54000h-57FFFh

20 512 50000h-53FFFh

19 512 4C000h-4FFFFh

18 512 48000h-4BFFFh

17 512 44000h-47FFFh

M58BW16F, M58BW32F

Description

CCMTD-1725822587-8496

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Table 5: M58BW16F Top Boot Block Addresses (Continued)

# Size (Kbit) Address Range

16 512 40000h-43FFFh

15 512 3C000h-3FFFFh

14 512 38000h-3BFFFh

13 512 34000h-37FFFh

12 512 30000h-33FFFh

11 512 2C000h-2FFFFh

10 512 28000h-2BFFFh

9 512 24000h-27FFFh

8 512 20000h-23FFFh

7 512 1C000h-1FFFFh

6 512 18000h-1BFFFh

5 512 14000h-17FFFh

4 512 10000h-13FFFh

3 512 0C000h-0FFFFh

2 512 08000h-0BFFFh

1 512 04000h-07FFFh

0 512 00000h-03FFFh

Note: 1. OTP block.

Table 6: M58BW16F Bottom Boot Block Addresses

# Size (Kbit) Address Range

38 512 7C000h-7FFFFh

37 512 78000h-7BFFFh

36 512 74000h-77FFFh

35 512 70000h-73FFFh

34 512 6C000h-6FFFFh

33 512 68000h-6BFFFh

32 512 64000h-67FFFh

31 512 60000h-63FFFh

30 512 5C000h-5FFFFh

29 512 58000h-5BFFFh

28 512 54000h-57FFFh

27 512 50000h-53FFFh

26 512 4C000h-4FFFFh

25 512 48000h-4BFFFh

24 512 44000h-47FFFh

23 512 40000h-43FFFh

M58BW16F, M58BW32F

Description

CCMTD-1725822587-8496

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Table 6: M58BW16F Bottom Boot Block Addresses (Continued)

# Size (Kbit) Address Range

22 512 3C000h-3FFFFh

21 512 38000h-3BFFFh

20 512 34000h-37FFFh

19 512 30000h-33FFFh

18 512 2C000h-2FFFFh

17 512 28000h-2BFFFh

16 512 24000h-27FFFh

15 512 20000h-23FFFh

14 512 1C000h-1FFFFh

13 512 18000h-1BFFFh

12 512 14000h-17FFFh

11 512 10000h-13FFFh

10 512 0C000h-0FFFFh

9 512 08000h-0BFFFh

8 512 04000h-07FFFh

7 64 03800h-03FFFh

6 64 03000h-037FFh

5 64 02800h-02FFFh

4 64 02000h-027FFh

3164 01800h-01FFFh

2164 01000h-017FFh

1 64 00800h-00FFFh

0 64 00000h-007FFh

Note: 1. OTP block.

M58BW16F, M58BW32F

Description

CCMTD-1725822587-8496

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Signal Descriptions

See the Logic Diagram figure and the Signal Names table for an overview of the signals

connected to this device.

Address Inputs (A[MAX:0])

Amax is equal to A18 in the M58BW16F, and to A19 in the M58BW32F.

The address inputs are used to select the cells to access in the memory array during bus

operations. During WRITE operations they control the commands sent to the command

interface of the Program/Erase controller. E# must be LOW when selecting the address-

es.

The address inputs are latched on the rising edge of L#, or on the active edge of K,

whichever occurs first, in a READ operation. The address inputs are latched on the ris-

ing edge of E#, W#, or L#, whichever occurs first in a WRITE operation. The address

latch is transparent when L# is LOW. The address is internally latched in an ERASE or

PROGRAM operation.

Data Inputs/Outputs (DQ[31:0])

The data inputs/outputs output the data stored at the selected address during a bus

READ operation, or are used to input the data during a PROGRAM operation. During

bus WRITE operations they represent the commands sent to the command interface of

the program/erase controller. When used to input data or WRITE commands they are

latched on the rising edge of W# or E#, whichever occurs first.

When E# and G# are both LOW and GD# is HIGH, the data bus outputs data from the

memory array, the electronic signature, the block protection configuration register, the

CFI information, or the contents of the burst configuration register or status register.

The data bus is high impedance when the device is deselected with E# and G# both

HIGH, and either GD# or RP# LOW. The status register content is output on DQ0-DQ7

and DQ8-DQ31 are LOW.

Chip Enable (E#)

The chip enable, E#, input activates the memory control logic, input buffers, decoders,

and sense amplifiers. E# at HIGH deselects the memory and reduces the power con-

sumption to the standby level.

Output Enable (G#)

The output enable, G#, gates the outputs through the data output buffers during a

READ operation, when GD# is HIGH. When G# is HIGH, the outputs are high impe-

dance independently of G#.

Output Disable (GD#)

The output disable, GD#, deactivates the data output buffers. When GD#, is HIGH, the

outputs are driven by G#. When GD#, is LOW, the outputs are high impedance inde-

pendently of GD#. The GD# pin must be connected to an external pull-up resistor as

there is no internal pull-up resistor to drive the pin.

M58BW16F, M58BW32F

Signal Descriptions

CCMTD-1725822587-8496

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Write Enable (W#)

The write enable, W#, input controls writing to the command interface, input address,

and data latches. Both addresses and data can be latched on the rising edge of W# (also

see Latch Enable, L#).

Reset/Power-Down (RP#)

The reset/power-down, RP#, is used to apply a hardware reset to the memory. A hard-

ware reset is achieved by holding RP# LOW for at least tPLPH. Writing is inhibited to pro-

tect data, and the command interface and program/erase controller are reset. The sta-

tus register information is cleared and power consumption is reduced to the standby

level (IDD1). The device acts as deselected; that is, the data outputs are high impedance.

After RP# goes HIGH, the memory will be ready for bus READ operations after a delay of

tPHEL or bus WRITE operations after tPHWL.

If Reset/Power-down goes LOW, VIL, during a BLOCK ERASE or a PROGRAM operation,

the internal state machine handles the operation as a program/erase suspend, so the

maximum time defined in the Program, Erase times and endurance cycles table must

be applied.

During power-up, power should be applied simultaneously to VDD and VDDQIN with RP#

held LOW. When the supplies are stable RP# is taken to HIGH. G#, E#, and W#, should

be held HIGH during power-up.

In an application, it is recommended to associate RP# with the reset signal of the micro-

processor. Otherwise, if a RESET operation occurs while the memory is performing an

ERASE or PROGRAM operation, the memory may output the status register information

instead of being initialized to the default asynchronous random read mode.

See the Reset, Power-down, and Power-up AC characteristics table and the Reset, Pow-

er-down and Power-up AC waveforms - Control pins Low figure for more details.

Program/Erase Enable (PEN)

The program/erase enable input, PEN, protects all blocks by preventing PROGRAM and

ERASE operations from modifying the data. Prior to issuing a PROGRAM or ERASE com-

mand, PEN must be set to HIGH. If it is LOW, the PROGRAM or ERASE operation is not

accepted and an error is generated in the status register.

Latch Enable (L#)

The bus interface can be configured to latch the address inputs on the rising edge of

latch enable, L#, for asynchronous latch enable controlled READ or WRITE operations

or synchronous burst READ operations. In synchronous burst READ operations, the ad-

dress is latched on the active edge of the clock when L# is LOW. Once latched, the ad-

dresses may change without affecting the address used by the memory. When L# is

LOW, the latch is transparent. L# can remain LOW for asynchronous random READ and

WRITE operations.

Burst Clock (K)

The Burst Clock, K, is used to synchronize the memory with the external bus during

synchronous burst READ operations. Bus signals are latched on the active edge of the K.

In synchronous burst read mode, the address is latched on the first active clock edge

M58BW16F, M58BW32F

Signal Descriptions

CCMTD-1725822587-8496

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when L# is LOW, or on the rising edge of L#, whichever occurs first. During asynchro-

nous bus operations the clock is not used.

Burst Address Advance (B#)

The burst address advance, B#, controls the advancing of the address by the internal ad-

dress counter during synchronous burst READ operations.

B# is only sampled on the active clock edge of K when the X-latency time has expired. If

B# is LOW, the internal address counter advances. If B# is HIGH, the internal address

counter does not change; the same data remains on the data inputs/outputs and B# is

not sampled until the Y-latency expires. B# may be tied to VIL.

Valid Data Ready (R)

The Valid Data Ready output, R, can be used during synchronous burst READ opera-

tions to identify if the memory is ready to output data or not. The R pin output can be

configured to be active on the clock edge of the invalid data read cycle or one cycle be-

fore that. The R pin HIGH indicates that new data is or will be available. When R is LOW,

the previous data outputs remain active.

Write Protect (WP#)

The Write Protect, WP#, provides protection against PROGRAM or ERASE operations.

When WP# is LOW, the protection status that has been configured in the block protec-

tion configuration register is activated. PROGRAM and ERASE operations to protected

blocks are disabled. When WP# is HIGH, all the blocks can be programmed or erased, if

no other protection is used.

Supply Voltage (VDD)

The supply voltage, VDD, is the core power supply. All internal circuits draw their current

from the VDD pin, including the program/erase controller.

Output Supply Voltage (VDDQ)

The output supply voltage, VDDQ, is the output buffer power supply for all operations

(READ, PROGRAM, and ERASE) used for DQ0-DQ31 when used as outputs.

Input Supply Voltage (VDDQIN)

The input supply voltage, VDDQIN, is the power supply for all input signal. Input signals

are: K, B#, L#, W#, GD#, G#, E#, A0-Amax, and DQ0-DQ31, when used as inputs.

Ground (VSS and VSSQ)

The ground VSS is the reference for the internal supply voltage VDD. The ground VSSQ is

the reference for the output and input supplies VDDQ, and VDDQIN. It is essential to con-

nect VSS and VSSQ together.

Note: A 0.1µF capacitor should be connected between the supply voltages, VDD, VDDQ,

and VDDQIN, and the grounds, VSS and VSSQ to decouple the current surges from the

power supply. The PCB track widths must be sufficient to carry the currents required

during all operations of the parts, see the DC Characteristics table, for maximum cur-

rent supply requirements.

M58BW16F, M58BW32F

Signal Descriptions

CCMTD-1725822587-8496

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Don’t Use (DNU)

The DNU pin should not be used as it is internally connected. Its voltage level can be

between VSS and VDDQ or leave it unconnected.

Not Connected (NC)

The NC pin is not physically connected to the device.

M58BW16F, M58BW32F

Signal Descriptions

CCMTD-1725822587-8496

m58bw_16-32f.pdf - Rev. D 6/18 EN 25 Micron Technology, Inc. reserves the right to change products or specifications without notice.

Bus Operations

Each bus operation that controls the memory is described in this section, see the Asyn-

chronous Bus Operations table and the Synchronous Burst Read Bus Operations table

for a summary. The bus operation is selected through the burst configuration register;

the bits in this register are described at the end of this section.

On power-up or after a hardware reset the memory defaults to asynchronous bus read

and asynchronous bus write. No synchronous operation can be performed until the

burst configuration register has been configured. The electronic signature, block pro-

tection configuration, CFI, or status register will be read in asynchronous mode regard-

less of the burst configuration register settings.

Typically glitches of less than 5 ns on CE# or WE# are ignored by the memory and do

not affect bus operations.

Asynchronous Bus Operations

For ASYNCHRONOUS BUS operations refer to the Asynchronous Bus Operations table

together with the following text. The read access will start at whichever of the three fol-

lowing events occurs last: valid address transition, E# going LOW, or L# going LOW.

Asynchronous Bus Read

Asynchronous bus READ operations read from the memory cells, or specific registers

(electronic signature, block protection configuration register, status register, CFI ,and

burst configuration register) in the command interface. A valid bus operation involves

setting the desired address on the address inputs, applying a LOW signal to E# and G#

and keeping W# and GD# HIGH. The data inputs/outputs will output the value, see the

Asynchronous Bus Read AC Waveforms figure and the Asynchronous Bus Read AC

Characteristics table for details of when the output becomes valid.

Asynchronous read is the default read mode which the device enters on power-up or on

return from reset/power-down.

Asynchronous Latch Controlled Bus Read

Asynchronous latch controlled bus READ operations read from the memory cells or

specific registers in the command interface. The address is latched in the memory be-

fore the value is output on the data bus, allowing the address to change during the cycle

without affecting the address that the memory uses.

A valid bus operation involves setting the desired address on the address inputs, setting

E# and L# LOW and keeping W# and GD# HIGH; the address is latched on the rising

edge of L#. Once latched, the address inputs can change. To read data on the data in-

puts/outputs, G# must be set LOW; see the Asynchronous Latch Controlled Bus Read

AC Waveforms figure and the Asynchronous Bus Read AC Characteristics table for de-

tails on when the output becomes valid.

Note that, since the L# input is transparent when set LOW, asynchronous bus READ op-

erations can be performed when the memory is configured for asynchronous latch ena-

ble bus operations by holding L# LOW throughout the bus operation.

M58BW16F, M58BW32F

Bus Operations

CCMTD-1725822587-8496

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Asynchronous Page Read

Asynchronous page READ operations are used to read from several addresses within the

same memory page. Each memory page is 4 double-words and is addressed by the ad-

dress inputs A0 and A1.

Data is read internally and stored in the page buffer. Valid bus operations are the same

as asynchronous bus READ operations but with different timings. The first READ opera-

tion within the page has identical timings, while subsequent reads within the same

page have much shorter access times. If the page changes, then the normal, longer tim-

ings apply again. A page READ does not support latched controlled READ.

See the Asynchronous Page Read AC Waveforms figure and the Asynchronous Page

Read AC Characteristics table for details on when the outputs become valid.

Asynchronous Bus Write

Asynchronous bus WRITE operations write to the command interface in order to send

commands to the memory or to latch addresses and input data for programming. Bus

WRITE operations are asynchronous, and K is don’t care during bus WRITE operations.

A valid asynchronous bus WRITE operation begins by setting the desired address on the

address inputs, and setting E#, W#, and L# LOW and G# HIGH. The address inputs are

latched by the command interface on the rising edge of E#, W#, or L# whichever occurs

first. Commands and input data are latched on the rising edge of E# or W#, whichever

occurs first. G# must remain HIGH during the entire asynchronous bus WRITE opera-

tion.

See DC and AC Parameters for details of the timing and waveforms requirements.

Output Disable

The data outputs are high impedance when the G# is HIGH or GD# is LOW.

Standby

When E# is HIGH, and the program/erase controller is idle, the memory enters standby

mode, the power consumption is reduced to the standby level (IDD1) and the data in-

puts/output pins are placed in the high impedance state regardless of G#, W#, or GD#

inputs.

The standby mode can be disabled by setting the standby disable bit (M14) of the burst

configuration register to ‘1’ (see the DC Characteristics table).

Reset/Power-Down

The memory is in Reset/Power-down mode when Reset/Power-down (RP#) is LOW. The

power consumption is reduced to the standby level (IDD1) and the outputs are high im-

pedance, independent of the E#, G#, GD#, or W# inputs. In this mode the device is write

protected and both the status and the burst configuration registers are cleared. A recov-

ery time is required when the RP# input goes HIGH.

M58BW16F, M58BW32F

Bus Operations

CCMTD-1725822587-8496

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Table 7: Asynchronous Bus Operations1

Bus Operation Step E# G# GD# W# RP# L# A[MAX:0] DQ[31:0]

ASYNCHRONOUS BUS

VIL VIL VIH VIH VIH VIL Address Data output

ASYNCHRONOUS LATCH

CONTROLLED BUS READ

Address latch VIL VIH VIH VIH VIH VIL Address High-Z

Read VIL VIL VIH VIH VIH VIH X Data output

ASYNCHRONOUS PAGE

READ

VIL VIL VIH VIH VIH X Address Data output

ASYNCHRONOUS BUS

WRITE

VIL VIH X VIL VIH VIL Address Data input

OUTPUT ENABLE, G# VIL VIH VIH VIH VIH X X High-Z

OUTPUT DISABLE, GD# VIL VIL VIL VIH VIH X X High-Z

STANDBY VIH X X X VIH X X High-Z

RESET/POWER-DOWN, RP# X X X X VIL X X High-Z

Notes: 1. X = Don’t care.

2. Data, Manufacturer code, Device code, Burst Configuration Register, Standby Status,

and Block Protection Configuration Register are read using the ASYNCHRONOUS BUS

READ command.

Synchronous Bus Operations

Synchronous Burst Read

Synchronous burst READ operations are used to read from the memory at specific times

synchronized to an external reference clock. The valid edge of the clock signal is the ris-

ing edge for M58BW32F, while for M58BW16F it is determined by setting M6 bit of the

burst configuration register. Once the Flash memory is configured in burst mode, it is

mandatory to have an active clock signal since the switching of the output buffer data-

bus is synchronized to the active edge of the clock. In the absence of clock, no data is

output.

The burst type, length and latency can be configured. The different configurations for

synchronous burst READ operations are described in the Burst Configuration Register.

Refer to the Example Burst Configuration X-1-1-1 figure for examples of synchronous

burst operations.

In continuous burst read, one burst READ operation can access the entire memory se-

quentially by keeping B# LOW for the appropriate number of clock cycles. At the end of

the memory address space, the burst read restarts from the beginning at address

000000h.

A valid synchronous burst READ operation begins when the burst clock is active and E#

and L# are LOW. The burst start address is latched and loaded into the internal burst

address counter on the valid edge of K or on the rising edge of L#, whichever occurs

first.

After an initial memory latency time, the memory outputs data at each clock cycle (or

two clock cycles depending on the value of bit M9 of Burst Configuration Register). The

M58BW16F, M58BW32F

Bus Operations

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B# input controls the memory burst output. The second burst output is on the next

clock valid edge after the B# has been pulled LOW.

Valid data ready, R, monitors if the memory burst boundary is exceeded and the burst

controller of the microprocessor needs to insert wait states. When R is LOW on the ac-

tive clock edge, no new data is available and the memory does not increment the inter-

nal address counter at the active clock edge even if B# is LOW. R may be configured (by

bit M8 of Burst Configuration Register) to be valid immediately at the active clock edge.

A synchronous burst READ operation will be suspended if B# goes HIGH. If G# is LOW

and GD# is HIGH, the last data is still valid. If G# is HIGH or GD#, is LOW, but B# is LOW,

the internal burst address counter is incremented at each active edge of K.

The synchronous burst read timing diagrams and AC characteristics are described in

the AC and DC Parameters. See Figures Synchronous Burst Read, Latch Enable Control-

led (data valid from ’n’ clock rising edge), Synchronous Burst Read (data valid from ’n’

clock rising edge), Synchronous Burst Read - valid data ready output, and Synchronous

Burst Read - Burst Address Advance and the Synchronous Burst Read AC Characteristics

table.

Synchronous Burst Read Suspend

During a synchronous burst READ operation, it is possible to suspend the operation,

freeing the data bus for other higher priority devices.

A valid synchronous burst READ operation is suspended when both G# and B# are

HIGH. The B# going HIGH stops the burst counter, and the G# going HIGH inhibits the

data outputs. The synchronous burst READ operation can be resumed by setting G#

LOW.

Table 8: Synchronous Burst Read Bus Operations1

Bus operation Step E# G# GD# RP# K L# B#

A[MAX:0]

DQ[31:0]

SYNCHRONOUS

BURST READ2

Address latch VIL VIH X VIH A3VIL X Address input

Read VIL VIL VIH VIH A3VIH VIL Data output

Read suspend VIL VIH X VIH X VIH VIH High-Z

Read resume VIL VIL VIH VIH A3VIH VIL Data output

Burst address advance VIL VIH X VIH A3VIH VIL High-Z

Read abort, E# VIH X X VIH X X X High-Z

Read abort, RP# X X X VIL X X X High-Z

Notes: 1. X = Don't care, VIL or VIH.

2. M15 = 0, Bit M15 is in the Burst Configuration Register.

3. A = Active edge (See bit M6 in the burst configuration register for further details on the

active edge of K).

Burst Configuration Register

The burst configuration register is used to configure the type of bus access that the

memory will perform.

M58BW16F, M58BW32F

Bus Operations

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The burst configuration register is set through the command interface and will retain its

information until it is re-configured, the device is reset, or the device goes into reset/

power-down mode. The burst configuration register bits are described in the Burst Con-

figuration Register table. They specify the selection of the burst length, burst type, burst

X and Y latencies and the READ operation. Refer to the Example Burst Configuration

X-1-1-1 figure for examples of synchronous burst configurations.

Read Select Bit M15

The read select bit, M15, is used to switch between asynchronous and synchronous bus

READ operations. When the read select bit is set to 1, bus READ operations are asyn-

chronous; when the read select bit is set to 0, bus READ operations are synchronous. On

reset or power-up, the read select bit is set to 1 for asynchronous accesses.

Standby Disable Bit M14

The standby disable bit, M14, is used to disable the standby mode. When the standby

bit is 1, the device will not enter standby mode when E# goes HIGH.

X-Latency Bits M13-M11

The X-latency bits M13-M11 are used during synchronous bus READ operations to set

the number of clock edges between the address being latched and the edge where the

first data become available. For correct operation the X-latency bits can only assume

the values in the burst configuration register table.

Y-Latency Bit M9

The Y-latency bit is used during synchronous bus READ operations to set the number of

clock cycles between consecutive reads. When the Y-latency bit is 1, the data changes

each clock cycle. When the Y-latency is 2, the data changes every second clock cycle.

Valid Data Ready Bit M8

The valid data ready bit controls the timing of pin R. When the valid data ready bit is 0,

pin R output is driven LOW for the active clock edge when invalid data is output on the

bus. When the valid data ready bit is 1, pin R output is driven LOW one clock cycle prior

to invalid data being output on the bus.

Valid Clock Edge Bit (M6)

For M58BW16F, the valid clock edge bit, M6, is used to configure the active edge of K

during synchronous burst READ operations. When the valid clock edge bit is 0, the fall-

ing edge of K is the active edge; when the valid clock edge bit is 1, the rising edge of K is

active. For M58BW32F, bit M6 is "Don’t Care." Only rising edge of K is available.

Burst Wrap Bit M3

The burst READ operations can be confined inside the 4 or 8 double-word boundary

(wrap) or overcome the boundary (no wrap). The wrap burst bit is used to select be-

tween wrap and no wrap. When the wrap burst bit is set to 0, the burst READ operation

wraps; when it is set to 1, the burst READ operation does not wrap.

Burst Length Bits M2-M0

The burst length bits set the maximum number of double-words that can be output

during a synchronous burst READ operation. Burst lengths of 4, 8, or continuous burst

M58BW16F, M58BW32F

Bus Operations

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are available. The Burst Configuration Register table gives the valid combinations of the

burst length bits that the memory accepts.

If either a continuous or a no wrap burst READ operation has been initiated, the device

will output data synchronously. Depending on the starting address, the device asserts

the pin R to communicate that some wait states are needed before the data valid ap-

pearance. As shown in the WAIT States table, the bits ADD[4:0] of the starting address

will determine the number of WAIT states that the device is going to drive in the data

bus lines. Elsewhere, the burst mode will run without activating the pin R output.

Table 9: Burst Configuration Register

Note 1 applies to the entire table.

Bit Description Value Description Notes

M15 Read select 0 Synchronous burst read

1 Asynchronous read (default at power-up)

M14 Standby disable 0 Standby mode enabled (default at power-up)

1 Standby mode disabled

M13-M11 X-latency 000 Reserved (default at power-up) 2

001 3, 3-1-1-1, 3-2-2-2

010 4, 4-1-1-1, 4-2-2-2

011 5, 5-1-1-1, 5-2-2-2

100 6, 6-1-1-1, 6-2-2-2

101 7, 7-1-1-1, 7-2-2-2

110 8, 8-1-1-1, 8-2-2-2

111 Reserved

M10 Reserved 0 Write 0 to reserved bits

M9 Y-latency 0 One burst clock cycle (default at power-up) 3

1 Two burst clock cycles

M8 Valid data ready 0 R valid LOW during valid burst clock edge (default at

power-up)

1 R valid LOW 1 data cycle before valid burst clock edge

M7 0 Reserved (default at power-up) 4

1 To be set to "1" whenever synchronous burst read is

selected (this is M15 = 0)

M6 Valid clock edge 0 Falling burst clock edge (default at power-up) 5

1 Rising burst clock edge

M5-M4 Reserved 00 Write 0 to reserved bits

M3 Wrapping 0 Wrap (default at power-up)

1 No Wrap

M58BW16F, M58BW32F

Bus Operations

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Table 9: Burst Configuration Register (Continued)

Note 1 applies to the entire table.

Bit Description Value Description Notes

M2-M0 Burst length 000 Reserved (default at power-up)

001 4 double-words

010 8 double-words

011 Reserved

100 Reserved

101 Reserved

110 Reserved

111 Continuous

Notes: 1. M10, M5, and M4 are reserved for future use.

2. X latencies can be calculated as: (tAVQV – tLLKH + tQVKH) + tSYSTEM MARGIN < (X -1) tK. X is an

integer number from 4 to 8, tK is the clock period and tSYSTEM MARGIN is the time margin

required for the calculation.

3. Y latencies can be calculated as: tKHQV + tSYSTEM MARGIN + tQVKH < Y tK.

4. M7 bit is Don’t Care in the M58BW32F.

5. M6 bit is Don’t Care in the M58BW32F and the device has the rising burst clock edge set.

To maintain the compatibility this could be modified and read.

Table 10: WAIT States

ADD[4:0] Number of Clock WAIT States

11101 1

11110 2

11111 3

Table 11: Burst Type Definition

Starting

Address X4 X8 Continuous

0 0 0-1-2-3 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7-8-9-10

0 1 1-2-3-0 1-2-3-4-5-6-7-0 1-2-3-4-5-6-7-8-9-10-11

0 2 2-3-0-1 2-3-4-5-6-7-0-1 2-3-4-5-6-7-8-9-10-11-12

0 3 3-0-1-2 3-4-5-6-7-0-1-2 3-4-5-6-7-8-9-10-11-12-13

0 4 – 4-5-6-7-0-1-2-3 4-5-6-7-8-9-10-11-12-13-14

0 5 – 5-6-7-0-1-2-3-4 5-6-7-8-9-10-11-12-13-14-15

0 6 – 6-7-0-1-2-3-4-5 6-7-8-9-10-11-12-13-14-15-16

0 7 – 7-0-1-2-3-4-5-6 7-8-9-10-11-12-13-14-15-16-17

0 8 – - 8-9-10-11-12-13-14-15-16-17-18

1 0 0-1-2-3 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7-8-9-10

1 1 1-2-3-4 1-2-3-4-5-6-7-8 1-2-3-4-5-6-7-8-9-10-11

M58BW16F, M58BW32F

Bus Operations

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Table 11: Burst Type Definition (Continued)

Starting

Address X4 X8 Continuous

1 2 2-3-4-5 2-3-4-5-6-7-8-9 2-3-4-5-6-7-8-9-10-11-12

1 3 3-4-5-6 3-4-5-6-7-8-9-10 3-4-5-6-7-8-9-10-11-12-13

1 4 4-5-6-7 4-5-6-7-8-9-10-11 4-5-6-7-8-9-10-11-12-13-14

1 5 5-6-7-8 5-6-7-8-9-10-11-12 5-6-7-8-9-10-11-12-13-14-15

1 6 6-7-8-9 6-7-8-9-10-11-12-13 6-7-8-9-10-11-12-13-14-15-16

1 7 7-8-9-10 7-8-9-10-11-12-13-14 7-8-9-10-11-12-13-14-15-16-17

1 8 10-11-12-13 8-9-10-11-12-13-14-15 8-9-10-11-12-13-14-15-16-17-18

Figure 4: Example Burst Configuration X-1-1-1

ADD

Valid Valid

Valid

Valid Valid Valid

Valid

Valid Valid Valid

Valid Valid

Valid Valid Valid

Valid Valid ValidValid

Valid

5-1-1-1

0 1 2345 6 7 8 9

6-1-1-1

7-1-1-1

8-1-1-1

4-1-1-1

3-1-1-1

Valid Valid

Valid

M58BW16F, M58BW32F

Bus Operations

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Figure 5: Example Burst Configuration X-2-2-2

ADD Valid

0 1 2345 6 7 8 9

Not

Valid

Not

Valid

Not

Valid

Not

Valid

Not

Valid

Not

Valid

Not

Valid

Not

Valid

Valid Valid

Not

Valid

Not

Valid

5-2-2-2

Valid

6-2-2-2

Valid Valid

7-2-2-2

Valid

8-2-2-2

M58BW16F, M58BW32F

Bus Operations

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Device Commands

All bus WRITE operations to the memory are interpreted by the command interface.

Commands consist of one or more sequential bus WRITE operations. The commands

are summarized in the Commands table.

Table 12: Commands1

Command Cycles

Bus Operations

1st cycle 2nd cycle 3rd cycle 4th cycle

Op. Addr. Data Op. Addr. Data Op. Addr. Data Op. Addr. Data

READ MEMORY ARRAY ≥ 2 Write X FFh Read RA RD

READ ELECTRONIC SIGNA-

TURE2

≥ 2 Write X 90h Read IDA IDD

READ STATUS REGISTER 1 Write X 70h

READ QUERY ≥ 2 Write X 98h Read RA RD

CLEAR STATUS REGISTER 1 Write X 50h

BULK ERASE 2 Write 55h 20h Write BA D0h

ERASE ALL MAIN BLOCKS 2 Write 55h 80h Write AAh D0h

PROGRAM any block 2 Write AAh 40h

10h

Write PA PD

OTP block 2 Write AAh 40h Write PA PD

WRITE TO BUFFER AND

PROGRAM

Ν+4 Write AAh E8h Write BA N Write PA PD Write X D0h

PROGRAM/ERASE SUS-

PEND

1 Write X B0h

PROGRAM/ERASE RESUME 1 Write X D0h

SET BURST CONFIGURA-

TION REGISTER

3 Write X 60h Write BCRh 03h Read RA RD

SET BLOCK PROTECTION

CONFIGURATION REGISTER

2 Write X 60h Write BA 01h

CLEAR BLOCK PROTEC-

TION CONFIGURATION

2 Write X 60h Write BA D0h

LOCK OTP PROTECTION 2 Write AAh 49h Write 03h 00h

Notes: 1. X Don’t care; RA Read Address, RD Read Data, ID Device Code, IDA Identifier Address,

IDD Identifier Data, SRD Status Register Data, PA Program Address; PD Program Data,

QA Query Address, QD Query Data, BA Any address in the Block, BCR Burst Configura-

tion Register value, N+1 number of Words to program, BA Block address.

2. Manufacturer code, device code, burst configuration register, and block protection con-

figuration register of each block are read using the READ ELECTRONIC SIGNATURE com-

mand.

M58BW16F, M58BW32F

Device Commands

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READ MEMORY ARRAY Command

The READ MEMORY ARRAY command returns the memory to read mode. One bus

write cycle is required to issue the command and return the memory to read mode.

Subsequent READ operations will output the addressed memory array data. Once the

command is issued, the memory remains in read mode until another command is is-

sued. From read mode, READ commands will access the memory array.

READ ELECTRONIC SIGNATURE Command

The READ ELECTRONIC SIGNATURE command is used to read the manufacturer code,

the device code, the block protection configuration register and the burst configuration

issued, subsequent bus READ operations, depending on the address specified, read the

manufacturer code, the device code, the block protection configuration or the burst

configuration register until another command is issued.

Table 13: Read Electronic Signature

Code Device A[MAX:0] DQ[31:0]

Manufacturer All 00000h 00000020h

Device M58BW16FT 00001h 0000883Ah

M58BW16FB 00001h 00008839h

M58BW32FT 00001h 00008838h

M58BW32FB 00001h 00008837h

Burst Configuration Register All 00005h BCR1

Block Protection Configuration

All SBA+02h200000000h (Unprotected)

00000001h (Protected)

Notes: 1. BCR = Burst Configuration Register.

2. SBA is the start address of each block.

READ QUERY Command

The READ QUERY command is used to read data from the common flash interface

(CFI) memory area. One bus write cycle is required to issue the command. Once the

command is issued, subsequent bus READ operations read from the CFI memory area,

depending on the address specified.

READ STATUS REGISTER Command

The READ STATUS REGISTER command is used to read the status register. One bus

write cycle is required to issue the command. Once it is issued, subsequent bus READ

operations read the status register until another command is issued.

The status register information is present on DQ0-DQ7 when E# and G# are LOW and

GD# is at HIGH.

An interactive update of the status register bits is possible by toggling G# or GD#. This

update is also possible during PROGRAM, ERASE, or WRITE TO BUFFER and PRO-

GRAM operations by performing the following: deactivate the device with E# LOW and

then reactivate the device with E# and G# LOW and GD# HIGH.

M58BW16F, M58BW32F

Device Commands

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The content of the status register may also be read at the completion of PROGRAM,

ERASE, SUSPEND, or WRITE TO BUFFER and PROGRAM operations. During PRO-

GRAM, ERASE, or WRITE TO BUFFER and PROGRAM commands, DQ7 indicates the

program/erase controller status. It is valid until the operation is completed or suspen-

ded.

See the Status Register and Status Register Bits tables for details on the definitions of the

status register bits.

CLEAR STATUS REGISTER Command

The CLEAR STATUS REGISTER command can be used to reset to 0 bits 1, 3, 4 and 5 in

the status register. One bus write cycle is required to issue this command. Once the

command is issued, the memory returns to its previous mode, and subsequent bus

READ operations continue to output the same data.

The bits in the status register do not automatically return to 0 when a new PROGRAM,

ERASE, BLOCK PROTECT, BLOCK UNPROTECT, or WRITE TO BUFFER and PROGRAM

commands are issued. If an error occurs, it is essential to clear any error bits in the sta-

tus register by issuing a CLEAR STATUS REGISTER command before attempting a new

PROGRAM, ERASE, RESUME, or WRITE TO BUFFER and PROGRAM commands.

BLOCK ERASE Command

The BLOCK ERASE command can be used to erase a block. It sets all of the bits in the

block to ‘1’. All previous data in the block is lost. If the block is protected then the

ERASE operation will abort, the data in the block will not be changed and the Status

Two bus write cycles are required to issue the command; the first write cycle sets up the

command, the second confirms the command, latches the block address in the pro-

gram/erase controller, and starts the program/erase controller. The sequence is aborted

if the CONFIRM command is not given, and the device will output the status register

data with bits 4 and 5 set to 1.

Once the command is issued, subsequent bus READ operations read the status register.

See the section on the status register for details on the definitions of the status register

bits. During the ERASE operation, the memory will accept only the READ STATUS REG-

ISTER command and the PROGRAM/ERASE SUSPEND command. All other commands

are ignored.

If PEN is HIGH, the operation can be performed. If PEN goes below HIGH, the opera-

tion aborts and the PEN status bit in the status register is set to 1. The status register

should be cleared before reissuing the command.

Typical erase times are given in the Program and Erase Times and Endurance Cycles ta-

ble. See the Block Erase Flowchart and Pseudocode figure for a suggested flowchart on

using the BLOCK ERASE command.

ERASE ALL MAIN BLOCKS Command

The ERASE ALL MAIN BLOCKS command is used to erase all main blocks (62 main

blocks for M58BW32F and 31 main blocks for M58BW16F).

without affecting the parameter blocks. Issuing the command sets every bit in each

main block to 1. All data previously stored in the main blocks are lost.

M58BW16F, M58BW32F

Device Commands

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Two bus write cycles are required to issue this command. The first cycle sets up the

command, and the second cycle confirms the command and starts the program/erase

controller. If the CONFIRM command is not given, the sequence is aborted, and status

If the address given in the second cycle is located in a protected block, the ERASE ALL

MAIN BLOCKS operation aborts. The data remains unchanged in all blocks and the sta-

tus register outputs the error.

Once the command has been issued, subsequent bus READ operations output the sta-

tus register. See the Status Register for details.

During an ERASE ALL MAIN BLOCKS operation, only the READ STATUS REGISTER

command is accepted by the memory; any other command are ignored. The ERASE ALL

MAIN BLOCKS command cannot be suspended once it has begun.

If PEN is HIGH, the operation will be performed. Otherwise, the operation aborts and

the status register PEN bit (bit 3) is set to 1. The status register should be cleared before

reissuing the command.

PROGRAM Command

The PROGRAM command is used to program the memory array. Two bus write opera-

tions are required to issue the command; the first write cycle sets up the PROGRAM

command, and the second write cycle latches the address and data to be programmed

and starts the program/erase controller. A PROGRAM operation can be aborted by writ-

ing FFFFFFFFh to any address after the program set-up command has been given.

The PROGRAM command is also used to program the OTP block. Refer to the Com-

mands table for details of the address.

Once the command is issued, subsequent bus READ operations read the status register.

See the Status Register table for details on the definitions of the status register bits. Dur-

ing the PROGRAM operation, the memory will accept only the READ STATUS REGIS-

TER command and the PROGRAM/ERASE SUSPEND command. All other commands

will be ignored.

If RP#, falls to LOW during programming, the operation will be aborted.

If PEN is HIGH, the operation can be performed. Otherwise, the operation aborts, and

the PEN status bit in the status register is set to 1. The status register should be cleared

before reissuing the command. See also the Program Flowchart and Pseudocode figure.

WRITE TO BUFFER AND PROGRAM Command

The WRITE TO BUFFER AND PROGRAM command makes use of the device’s double

word (32 bit) write buffer to speed up programming. Up to eight double words can be

loaded into the write buffer and programmed into the memory. The following succes-

sive steps are required to issue the command.

1. One bus WRITE operation is required to set up the WRITE TO BUFFER AND PRO-

GRAM command. Any bus READ operations will start to output the status register

after the 1st cycle.

2. Use one bus WRITE operation to write the selected memory block address (any

address in the block where the values will be programmed can be used) along with

the value N on the data inputs/outputs, where N+1 is the number of words to be

programmed. The maximum value of N+1 is 8 words.

M58BW16F, M58BW32F

Device Commands

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3. Use N+1 bus WRITE operations to load the address and data for each word into

the write buffer. The address must be between Start address and Start address plus

N, where start address is the first word address.

4. Finally, use one bus WRITE operation to issue the final cycle to confirm the com-

mand and start the PROGRAM operation.

If any address is outside the block boundaries or if the correct sequence is not followed,

status register bits 4 and 5 are set to 1 and the operation will abort without affecting the

data in the memory array. A protected block must be unprotected using the BLOCKS

UNPROTECT command.

During a WRITE TO BUFFER AND PROGRAM operation, the memory will accept only

the READ STATUS REGISTER and the PROGRAM/ERASE SUSPEND commands. All oth-

er commands are ignored. If PEN is HIGH, the operation executes. Otherwise, the oper-

ation aborts and the status register PEN bit (bit 3) is set to 1. The status register should

be cleared before reissuing the command.

PROGRAM/ERASE SUSPEND Command

The PROGRAM/ERASE SUSPEND command is used to pause a PROGRAM, ERASE, or

WRITE TO BUFFER AND PROGRAM operation. The command will be accepted only

during a PROGRAM, ERASE, or WRITE TO BUFFER AND PROGRAM operation. It can be

issued at any time during a PROGRAM, ERASE, or WRITE TO BUFFER AND PROGRAM

operation. The command is ignored if the device is already in suspend mode.

One bus write cycle is required to issue the command and pause the program/erase

controller. Once the command is issued, it is necessary to poll the program/erase con-

troller status bit (bit 7) to find out when the program/erase controller has paused. No

other commands will be accepted until the program/erase controller has paused, after

which the memory will continue to output the status register until another command is

issued.

During the polling period between issuing the PROGRAM/ERASE SUSPEND command

and the program/erase controller pausing, it is possible for the operation to complete.

Once the program/erase controller status bit (bit 7) indicates that the program/erase

controller is no longer active, the program suspend status bit (bit 2) or the erase sus-

pend status bit (bit 6) can be used to determine if the operation has completed or is sus-

pended. For timing on the delay between issuing the PROGRAM/ERASE SUSPEND

command and the program/erase controller pausing, see the Program and Erase Times

and Endurance Cycles table.

During execution of a PROGRAM/ERASE SUSPEND command, the READ MEMORY AR-

RAY, READ STATUS REGISTER, READ ELECTRONIC SIGNATURE, READ QUERY, and

PROGRAM/ERASE SUSPEND commands will be accepted by the command interface.

Additionally, if the suspended operation was an ERASE operation, the PROGRAM,

WRITE TO BUFFER AND PROGRAM, SET/CLEAR BLOCK PROTECTION CONFIGURA-

TION REGISTER, and PROGRAM SUSPEND commands will also be accepted. When a

PROGRAM operation is completed inside a BLOCK ERASE SUSPEND operation, the

READ MEMORY ARRAY command must be issued to reset the device in read mode.

Then, the ERASE RESUME command can be issued to complete the whole sequence.

Only the blocks not being erased may be read or programmed correctly.

ERASE operations can be suspended in a systematic and periodical way; however, to

ensure the effectiveness of ERASE operations and avoid infinite erase times, it is imper-

ative to wait a minimum time between successive ERASE RESUME and ERASE SUS-

M58BW16F, M58BW32F

Device Commands

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PEND commands. This time, called the minimum effective erase time, is given in the

Program and Erase Times and Endurance Cycles table.

See the Program Suspend & Resume Flowchart and Pseudocode figure and the Erase

Suspend and Resume Flowchart and Pseudocode figure for suggested flowcharts on us-

ing the PROGRAM/ERASE SUSPEND command.

PROGRAM/ERASE RESUME Command

The PROGRAM/ERASE RESUME command can be used to restart the program/erase

controller after a PROGRAM/ERASE SUSPEND operation has paused it. One bus write

cycle is required to issue the PROGRAM/ERASE RESUME command.

See the Program Suspend and Resume Flowchart and Pseudocode figure, and the Erase

Suspend and Resume Flowchart and Pseudocode figure for information on using the

PROGRAM/ERASE RESUME command.

SET BURST CONFIGURATION REGISTER Command

The SET BURST CONFIGURATION REGISTER command is used to write a new value to

the burst configuration register. This register defines the burst length, type, X and Y la-

tencies, and synchronous/asynchronous read mode. For M58BW16F only, it also de-

fines the valid clock edge configuration.

Two bus write cycles are required to issue the SET BURST CONFIGURATION REGISTER

command. The first cycle writes the setup command. The second cycle writes the ad-

dress where the new burst configuration register content is to be written and then con-

firms the command. If the command is not confirmed, the sequence is aborted and the

device outputs the status register with bits 4 and 5 set to 1. Once the command is is-

sued, the memory returns to read mode as if a READ MEMORY ARRAY command had

been issued.

The value for the burst configuration register is always presented on A0-A15. M0 is on

A0, M1 on A1, etc.; address bits A16-Amax are ignored.

SET BLOCK PROTECTION CONFIGURATION REGISTER Command

The SET BLOCK PROTECTION CONFIGURATION REGISTER command is used to con-

figure the block protection configuration register to ‘protected’, for a specific block.

Protected blocks are fully protected from program or erase when WP# pin is LOW. The

status of a protected block can be changed to ‘unprotected’ by using the CLEAR BLOCK

PROTECTION CONFIGURATION REGISTER command. At power-up, all blocks are con-

figured as ‘protected’.

Two bus operations are required to issue a SET BLOCK PROTECTION CONFIGURA-

TION REGISTER command:

• The first cycle writes the setup command

• The second write cycle specifies the address of the block to protect and confirms the

command. If the command is not confirmed, the sequence is aborted and the device

outputs the status register with bits 4 and 5 set to 1.

To protect multiple blocks, the SET BLOCK PROTECTION CONFIGURATION REGISTER

command must be repeated for each block. Any attempt to reprotect a block already

protected does not change its status.

M58BW16F, M58BW32F

Device Commands

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CLEAR BLOCK PROTECTION CONFIGURATION REGISTER Command

The CLEAR BLOCK PROTECTION CONFIGURATION REGISTER command is used to

configure the block protection configuration register to ‘unprotected’, for a specific

block thus allowing PROGRAM/ERASE operations to this block, regardless of the WP#

pin status.

Two bus operations are required to issue a CLEAR BLOCK PROTECTION CONFIGURA-

TION REGISTER command:

• The first cycle writes the setup command

• The second write cycle specifies the address of the block to unprotect and confirms

the command. If the command is not confirmed, the sequence is aborted and the de-

vice outputs the status register with bits 4 and 5 set to 1.

To unprotect multiple blocks, the CLEAR BLOCK PROTECTION CONFIGURATION

block already unprotected does not affect its status.

M58BW16F, M58BW32F

Device Commands

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Flowcharts

Figure 6: Program Flowchart and Pseudocode

Write 40h

Start

Write Address

& Data

Read Status

YES

b7 = 1

YES

b3 = 0

b4 = 0

PEN Invalid

Error (1)

Program

Error (1)

Program command:

– write 40h, Address AAh

– write Address & Data

(memory enters read status

state after the Program command)

do:

– read status register

(E or G must be toggled)

while b7 = 1

If b3 = 1, PEN invalid error:

– error handler

If b4 = 1, Program error:

– error handler

YES

End

b1 = 0 Program to Protect

Block Error

If b1 = 1, Program to Protected Block Error:

– error handler

YES

Note: 1. If an error is found, the Status Register must be cleared before further P/E operations.

M58BW16F, M58BW32F

Flowcharts

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Figure 7: Program Suspend & Resume Flowchart and Pseudocode

Write 70h

Read Status

YES

b7 = 1

YES

b2 = 1

Program Continues

Write FFh

Program/Erase Suspend command:

– write B0h

– write 70h

do:

– read status register

while b7 = 1

If b2 = 0, Program completed

Read Memory Array command:

– write FFh

– one or more data reads

from other blocks

Write D0h Program Erase Resume command:

– write D0h

to resume programming

– if the program operation completed

then this is not necessary. The device

returns to Read Array as normal

(as if the Program/Erase Suspend

command was not issued).

Read data from

another block

Start

Write B0h

Program Complete

Write FFh

Read Data

M58BW16F, M58BW32F

Flowcharts

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Figure 8: Block Erase Flowchart and Pseudocode

Write 20h

Start

Write Block Address

& D0h

Read Status

YES

b7 = 1

YES

b3 = 0

YES

b4 and b5

= 1

PEN Invalid

Error (1)

Command

Sequence Error

Erase command:

– write 20h, Address 55h

– write Block Address

(A11-A19) & D0h

(memory enters read status

state after the Erase command)

do:

– read status register

(E or G must be toggled)

if Erase command given execute

suspend erase loop

while b7 = 1

If b3 = 1, PEN invalid error:

– error handler

If b4, b5 = 1, Command Sequence error:

– error handler

b5 = 0 Erase

Error (1)

YES

Suspend

Loop

If b5 = 1, Erase error:

– error handler

YES

End

YES

b1 = 0 Erase to Protected

Block Error

If b1 = 1, Erase to Protected Block Error:

– error handler

Note: 1. If an error is found, the Status Register must be cleared before further Program/Erase

operations.

M58BW16F, M58BW32F

Flowcharts

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Figure 9: Erase Suspend & Resume Flowchart and Pseudocode

Write 70h

Read Status

YES

b7 = 1

YES

b6 = 1

Erase Continues

Write FFh

Program/Erase Suspend command

Do:

– Read status register while b7 = 1

(b7 = Program/Erase status bit)

If b6 = 0, Erase is completed

(b6 = Erase Suspend status bit)

Read Memory Array command:

– Write FFh

– One or more data reads

from other blocks

Write D0h

Read data from

another block

or Program

Erase cycle in progress

Write B0h

Erase Complete

Write FFh

Read Data

Program/Erase Resume command:

– Write D0h to resume the Erase

operation

The device returns to Read mode as normal

(as if the Program/Erase Suspend was not issued).

M58BW16F, M58BW32F

Flowcharts

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Figure 10: Power-up Sequence followed by Synchronous Burst Read

Power-up

or Reset

Asynchronous Read

Write 60h command

Write 03h with A15-A0

BCR inputs

Synchronous Read

BCR bit 15 = '1'

Set Burst Configuration Register command:

– write 60h

– write 03h

and BCR on A15-A0

BCR bit 15 = '0'

BCR bit 14-bit 0 = '1'

M58BW16F, M58BW32F

Flowcharts

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Figure 11: Command Interface and Program/Erase Controller Flowchart (A)

READ ELEC.

SIGNATURE

YES

90h

READ

STATUS

YES

70h

ERASE

SET-UP

YES

20h

PROGRAM

SET-UP

YES

40h

CLEAR

STATUS

YES

50h

WAIT FOR

COMMAND

WRITE

READ

STATUS

READ

ARRAY

YES

READ CFI

YES

98h

D0h

ERASE

COMMAND

ERROR

M58BW16F, M58BW32F

Flowcharts

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Figure 12: Command Interface and Program/Erase Controller Flowchart (B)

SET BCR

SET_UP

YES

60h

FFh

03h

YES

M58BW16F, M58BW32F

Flowcharts

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Figure 13: Command Interface and Program/Erase Controller Flowchart (C)

READ

STATUS

70h

ERASE

READY

B0h

NO READ

STATUS

YES READY

ERASE

SUSPEND

YES

READ

ARRAY

YES

ERASE

SUSPENDED

READ

STATUS

YES

40h

D0h

PROGRAM

SET_UP

YES

NO YES READ

STATUS

M58BW16F, M58BW32F

Flowcharts

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Figure 14: Command Interface and Program/Erase Controller Flowchart (D)

READ

STATUS

70h

PROGRAM

READY

B0h

NO READ

STATUS

YES READY

PROGRAM

SUSPEND

READ

ARRAY

YES

PROGRAM

SUSPENDED

READ

STATUS

YES

D0h

YES

NO YES READ

STATUS

YES

M58BW16F, M58BW32F

Flowcharts

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Status Register

The Status Register provides information on the current or previous PROGRAM, ERASE,

WRITE TO BUFFER AND PROGRAM, or BLOCK PROTECT operation. The various bits in

the Status Register convey information and errors on the operation. They are output on

DQ[7:0].

To read the Status Register the READ STATUS REGISTER command can be issued. The

Status Register is automatically read after PROGRAM, ERASE, WRITE TO BUFFER AND

PROGRAM, BLOCK PROTECT, PROGRAM/ERASE RESUME commands. The Status Reg-

ister can be read from any address.

The contents of the Status Register can be updated during a PROGRAM, ERASE, OR

WRITE TO BUFFER AND PROGRAM operation by toggling the Output Enable or Output

Disable pins or by de-activating (Chip Enable, VIH) and then reactivating (Chip Enable

and Output Enable, VIL, and Output Disable, VIH.) the device.

The Status Register bits are summarized in the Status Register bits table. Refer to the

Status Register bits table in conjunction with the following text descriptions.

Table 14: Status Register Bits

Bit Name Logic level Definition

7 Program/Erase controller sta-

tus

’1’ Ready

’0’ Busy

6 Erase suspend status ’1’ Suspended

’0’ In progress or completed

5 Erase status ’1’ Erase error

’0’ Erase success

4 Program status, ’1’ Program error

’0’ Program success

3 PEN status bit ‘0’ No program or erase attempted

‘1’ Program or erase attempted

2 Program suspend status ’1’ Suspended

’0’ In progress or completed

1 Erase/Program in a protected

block

’1’ Program/erase on protected block, abort

’0’ No operations to protected blocks

0 Reserved ’1’ Reserved

Program/Erase Controller Status (bit 7)

The program/erase controller status bit indicates whether the program/erase controller

is active or inactive. When the program/erase controller status bit is set to ‘0’, the pro-

gram/erase controller is active; when bit 7 is set to 1, the program/erase controller is in-

active.

The program/erase controller status is set to 0 immediately after a PROGRAM/ERASE

SUSPEND command is issued and until the program/erase controller pauses. After the

program/erase controller pauses, the bit is set to 1.

M58BW16F, M58BW32F

Status Register

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During PROGRAM, ERASE, and WRITE TO BUFFER AND PROGRAM operations, the

program/erase controller status bit can be polled to find the end of the operation. The

other bits in the status register should not be tested until the program/erase controller

completes the operation and the bit is set to ‘.

After the program/erase controller completes its operation, the erase status (bit 5) and

program status (bit 4) should be tested for errors.

Erase Suspend Status (bit 6)

The Erase Suspend Status bit indicates that an ERASE operation has been suspended

and is waiting to be resumed. The Erase Suspend Status should only be considered valid

when the Program/Erase Controller Status bit is set to ‘1’ (Program/Erase controller in-

active); after a Program/Erase Suspend command is issued the memory may still com-

plete the operation rather than entering the Suspend mode.

When the Erase Suspend Status bit is set to ‘0’, the Program/Erase controller is active or

has completed its operation; when the bit is set to ‘1’, a PROGRAM/ERASE SUSPEND

command has been issued and the memory is waiting for a PROGRAM/ERASE RESUME

command.

When a PROGRAM/ERASE RESUME command is issued the Erase Suspend Status bit

returns to ‘0’.

Erase Status (Bit 5)

The Erase Status bit can be used to identify if the memory has failed to verify that the

block has erased correctly. The Erase Status bit should be read once the Program/Erase

Controller Status bit is High (Program/Erase controller inactive).

When the Erase Status bit is set to ‘0’, the memory has successfully verified that the

block has erased correctly. When the Erase Status bit is set to ‘1’, the Program/Erase

controller has applied the maximum number of pulses to the block and still failed to

verify that the block has erased correctly.

Once set to ‘1’, the Erase Status bit can only be reset to ‘0’ by a CLEAR STATUS REGIS-

TER command or a hardware reset. If set to 1 it should be reset before a new PROGRAM,

ERASE, or WRITE TO BUFFER AND PROGRAM command is issued, otherwise the new

command will appear to fail.

Program/Write to Buffer and Program Status (Bit 4)

The Program/Write to Buffer and Program Status bit is used to identify a Program fail-

ure or a Write to Buffer and Program failure. Bit 4 should be read once the Program/

Erase Controller Status bit is High (Program/Erase controller inactive).

When bit 4 is set to ‘0’ the memory has successfully verified that the device has pro-

grammed correctly. When bit 4 is set to ‘1’ the device has failed to verify that the data

has been programmed correctly.

Once set to ‘1’, the Program Status bit can only be reset to ‘0’ by a CLEAR STATUS REG-

ISTER command or a hardware reset. If set to 1 it should be reset before a new PRO-

GRAM, ERASE, or WRITE TO BUFFER AND PROGRAM command is issued, otherwise

the new command will appear to fail.

M58BW16F, M58BW32F

Status Register

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PEN Status (Bit 3)

The PEN Status bit can be used to identify when a PROGRAM, ERASE, or WRITE TO

BUFFER AND PROGRAM operation has been attempted when PEN is LOW.

When bit 3 is set to 0, no PROGRAM, ERASE, or WRITE TO BUFFER AND PROGRAM op-

eration has been attempted with PEN LOW since the last CLEAR STATUS REGISTER

command or hardware reset.

When bit 3 is set to 1, a PROGRAM, ERASE, or WRITE TO BUFFER AND PROGRAM op-

eration has been attempted with PEN LOW.

Once set to 1, bit 3 can only be reset by a CLEAR STATUS REGISTER command or a

hardware reset. If set to 1, it should be reset before a new PROGRAM, ERASE, or WRITE

TO BUFFER AND PROGRAM command is issued. Otherwise the new command will ap-

pear to fail.

Program Suspend Status (Bit 2)

The program suspend status bit indicates that a PROGRAM or WRITE TO BUFFER AND

PROGRAM operation has been suspended and is waiting to be resumed. The program

suspend status should be considered valid only when the program/erase controller sta-

tus bit is set to 1 (program/erase controller inactive). After a PROGRAM/ERASE SUS-

PEND command is issued, the memory may still complete the operation rather than

entering the suspend mode.

When the program suspend status bit is set to ‘0’, the program/erase controller is active

or has completed its operation. When the bit is set to 1, a PROGRAM/ERASE SUSPEND

command has been issued and the memory is waiting for a PROGAM/ERASE RESUME

command.

When a PROGRAM/ERASE RESUME command is issued the program suspend status

bit returns to 0.

Block Protection Status (Bit 1)

The block protection status bit can be used to identify if a PROGRAM, ERASE, or WRITE

TO BUFFER AND PROGRAM operation has tried to modify the contents of a protected

block.

When the block protection status bit is set to 0, no PROGRAM, ERASE, or WRITE TO

BUFFER AND PROGRAM operation has been attempted to protected blocks since the

last CLEAR STATUS REGISTER command or hardware reset. When the block protection

status bit is set to 1, a PROGRAM, ERASE, or WRITE TO BUFFER AND PROGRAM opera-

tion has been attempted on a protected block.

Once set to 1, the block protection status bit can only be reset LOW by a CLEAR STATUS

PROGRAM, ERASE, or WRITE TO BUFFER AND PROGRAM command is issued. Other-

wise the new command will appear to fail.

Reserved (Bit 0)

This bit is reserved for future use.

M58BW16F, M58BW32F

Status Register

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Common Flash Interface (CFI)

The common Flash interface is a JEDEC approved, standardized data structure that can

be read from the Flash memory device. It allows a system software to query the device

to determine various electrical and timing parameters, density information and func-

tions supported by the memory. The system can interface easily with the device, ena-

bling the software to upgrade itself when necessary.

When the CFI QUERY command (RCFI) is issued the device enters CFI Query mode and

the data structure is read from the memory. The following tables show the addresses

used to retrieve the data.

Table 15: Query Structure Overview

Offset Sub-section name Description

00h 0020h Manufacturer code Micron

01h 883A

8839

8838

8837

Device code M58BW16FT (top)

M58BW16FB (bottom)

M58BW32FT (top)

M58BW32FB (bottom)

10h CFI query identification string Command set ID and algorithm data offset

1Bh System interface information Device timing and voltage information

27h Device geometry definition Flash memory layout

P(h)1Primary algorithm-specific extended query

table

Additional information specific to the primary algorithm (optional)

A(h)2Alternate algorithm-specific extended

query table

Additional information specific to the alternate algorithm (optional)

Notes: 1. Offset 15h defines P which points to the primary algorithm extended query address ta-

ble.

2. Offset 19h defines A which points to the alternate algorithm extended query address ta-

ble.

Table 16: CFI - Query Address and Data Output

Address A0-Amax Data Instruction

10h 51h "Q" 51h; "Q"

Query ASCII string 52h; "R"

59h; "Y"

11h 52h "R"

12h 59h "Y"

13h 03h Primary vendor:

Command set and control interface ID code

14h 00h

15h 35h (M58BW16F)

39h (M58BW32F)

Primary algorithm extended query address table: P(h)

16h 00h

17h 00h Alternate vendor:

Command set and control interface ID code

18h 00h

M58BW16F, M58BW32F

Common Flash Interface (CFI)

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Table 16: CFI - Query Address and Data Output (Continued)

Address A0-Amax Data Instruction

19h 00h Alternate algorithm extended query address table

1Ah 00h

Notes: 1. The x 8 or byte address and the x 16 or word address mode are not available.

2. Query data are always presented on DQ7-DQ0. DQ31-DQ8 are set to '0'.

Table 17: CFI - Device Voltage and Timing Specification

Address

A0-Amax Data Description Value

1Bh 27h1VDD min 2.7V

1Ch 36h1VDD max 3.6V

1Dh xxxx xxxxh Reserved

1Eh xxxx xxxxh Reserved

1Fh 04h 2n µs typical for word, double word program 16µs

20h xxxx xxxxh Reserved

21h 0Ah 2n ms, typical time-out for erase block 1s

22h xxxx xxxxh Reserved

23h xxxx xxxxh Reserved

24h xxxx xxxxh Reserved

25h xxxx xxxxh Reserved

26h xxxx xxxxh Reserved

Note: 1. 1 Bits are coded in binary code decimal, bit7 to bit4 are scaled in Volts and bit3 to bit0 in

mV.

M58BW16F, M58BW32F

Common Flash Interface (CFI)

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Table 18: M58BW16F Device Geometry Definition

Address A0-Amax Data Description Value

27h 15h 2n number of bytes memory size 2 Mbytes

28h 03h Device interface sync./async. x 32

29h 00h Organization sync./async. Asynchronous

2Ah 00h Maximum number of byte in multi-byte program = 2n32 bytes

2Bh 00h

2Ch 02h Bit7-0 = number of erase block regions in device 2

2Dh 1Eh Number (n-1) of erase blocks of identical size; n = 31 31 blocks

2Eh 00h

2Fh 00h Erase block region information x 256 bytes per erase block (64 Kbytes) 512 Kbits

30h 01h

31h 07h Number (n-1) of erase blocks of identical size; n = 8 8 blocks

32h 00h

33h 20h Erase block region information x 256 bytes per erase block (8 Kbytes) 64 Kbits

34h 00h

Note: 1. This table is valid for top configuration. For bottom configuration, refer to the

M58BW16F Bottom Boot Block Addresses table.

M58BW16F, M58BW32F

Common Flash Interface (CFI)

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Table 19: M58BW16F Extended Query Information

Address 0ffset Address Amax-A0 Data (hex) Description

(P)h 35h 50 P Query ASCII string - extended table

(P+1)h 36h 52 R

(P+2)h 37h 49 Y

(P+3)h 38h 31h Major revision number

(P+4)h 39h 31h Minor revision number

(P+5)h 3Ah 86h Optional feature: (1=yes, 0=no)

bit0, Chip Erase supported (0= no)

bit1, Suspend Erase supported (1=yes)

bit2, Suspend Program supported (1=yes)

bit3, Lock/Unlock supported (0=no)

bit4, Queue Erase supported (0=no)

bit5, Instant individual block locking (0=no)

bit6, Protection bits supported (0=no)

bit7, Page Read supported (1=yes)

bit8, Synchronous Read supported (1=yes)

Bit9, Reserved

(P+6)h 3Bh 01h Synchronous Read supported

(P+7)h 3Ch 00h

(P+8)h 3Dh 00h

(P+9)h 3Eh 01h Function allowed after suspend:

Program allowed after erase suspend (1=yes)

Bit 7-1 reserved for future use

(P+A)h-(P+D)h 3Fh-42h Reserved

(P+13)h-(P+40)h 48h-7Fh Reserved

(P+41)h 80h xxxx xxxxh Unique device ID - 1 (16 bits)

(P+42)h 81h xxxx xxxxh Unique device ID - 2 (16 bits)

(P+43)h 82h xxxx xxxxh Unique device ID - 3 (16 bits)

(P+44)h 83h xxxx xxxxh Unique device ID - 4 (16 bits)

M58BW16F, M58BW32F

Common Flash Interface (CFI)

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Table 20: M58BW32F Device Geometry Definition

Address A0-Amax Data Description Value

27h 16h 2n number of bytes memory size 4 Mbytes

28h 03h Device interface sync./async. x 32

29h 00h Organization sync./async. Asynchronous

2Ah 05h Maximum number of byte in multi-byte program = 2n32 bytes

2Bh 00h

2Ch 03h Bit7-0 = number of erase block regions in device 3

2Dh 3Dh Number (n-1) of erase block regions of identical size; n = 61 62 blocks

2Eh 00h

2Fh 00h Erase block region information x 256 bytes per erase block (64

Kbytes)

512 Kbits

30h 01h

31h 07h Number (n-1) of erase blocks of identical size; n = 8 8 blocks

32h 00h

33h 20h Erase block region information x 256 bytes per erase block (8

Kbytes)

64 Kbits

34h 00h

35h 03h Number (n-1) of erase block of identical size; n = 8 8 blocks

36h 00h

37h 40h Erase block region information x 256 bytes per erase block (16

Kbytes)

128 Kbits

38h 00h

Note: 1. This table is valid for top configuration. For bottom configuration, refer to the

M58BW32F Bottom Boot Block Addresses table.

M58BW16F, M58BW32F

Common Flash Interface (CFI)

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Table 21: M58BW32F Extended Query Information

Address Offset Address Amax-A0 Data (hex) Description

(P)h 39h 50 P Query ASCII string - extended table

(P+1)h 3Ah 52 R

(P+2)h 3Bh 49 Y

(P+3)h 3Ch 31h Major revision number

(P+4)h 3Dh 31h Minor revision number

(P+5)h 3Eh 86h Optional feature: (1=yes, 0=no)

bit0, Chip Erase supported (0= no)

bit1, Suspend Erase supported (1=yes)

bit2, Suspend Program supported (1=yes)

bit3, Lock/Unlock supported (0=no)

bit4, Queue Erase supported (0=no)

bit5, Instant individual block locking (0=no)

bit6, Protection bits supported (0=no)

bit7, Page Read supported (1=yes)

bit8, Synchronous Read supported (1=yes)

Bit 9, Reserved

(P+6)h 3Fh 01h Synchronous Read supported

(P+7)h 40h 00h

(P+8)h 41h 00h

(P+9)h 42h 01h Function allowed after suspend:

Program allowed after erase suspend (1=yes)

Bit 7-1 reserved for future use

(P+A)h-(P+D)h 43h-46h Reserved

(P+13)h-(P+40)h 4Ch-7Fh Reserved

(P+41)h 80h xxxx xxxxh Unique device ID - 1 (16 bits)

(P+42)h 81h xxxx xxxxh Unique device ID - 2 (16 bits)

(P+43)h 82h xxxx xxxxh Unique device ID - 3 (16 bits)

(P+44)h 83h xxxx xxxxh Unique device ID - 4 (16 bits)

M58BW16F, M58BW32F

Common Flash Interface (CFI)

CCMTD-1725822587-8496

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Table 22: Protection Register Information

Address

A0-Amax

Data

Instruction

Value

M58BW16FT

M58BW16FB

M58BW32FT

M58BW32FB

M58BW16FT

M58BW16FB

M58BW32FT

M58BW32FB

(P+E)h 0x02

0x02

0x01

Number of protection register field in

JEDEC ID space, Block region informa-

tion X256 bytes

2 x 64Kb

1 x 128Kb

(P+F)h 0x01

0xFE

0x01

0xFE

Protection field: this field describes

user-available OTP protection register

bytes.

Bits 7-0=physical low address

Bits 15-8=physical high address bits

23-16=’n’, 2n=Factory pre-program-

med bytes bits 31-24=’n’, 2n=user

programmable bytes

- -

(P+10)h 0x01

0xFE

0x01

0xFE

- -

(P+11)h 0x0

0x0

- -

(P+12)h 0x12

0x12

2 x 64Kb

1 x 128Kb

M58BW16F, M58BW32F

Common Flash Interface (CFI)

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Maximum Rating

Stressing the device above the ratings listed in the Absolute maximum ratings table,

may cause permanent damage to the device. These are stress ratings only and operation

of the device at these or any other conditions above those indicated in the operating

sections of this specification is not implied. Exposure to absolute maximum rating con-

ditions for extended periods may affect device reliability.

Table 23: Absolute Maximum Ratings

Symbol Parameter

Value

UnitMin Max

TBIAS Temperature under bias –40 125 °C

TSTG Storage temperature –55 155 °C

VIO Input or output voltage –0.6 VDDQ + 0.6

VDDQIN + 0.6

VDD, VDDQ, VDDQIN Supply voltage –0.6 4.2 V

Table 24: Data Retention

Power Supply

VDD Unit

External Temperature

Unit25 °C 125 °C

0 V 20 7 Years

2.5 V – 25 Years

2.7 V – 15 Years

M58BW16F, M58BW32F

Maximum Rating

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Program and Erase Times and Endurance Cycles

Table 25: Program and Erase Times and Endurance Cycles1

Parameters

M58BW16F M58BW32F

UnitMin Typ Max Min Typ Max

Full chip program 15 20 15 20 s

Double word program 15 35 15 35 µs

512 Kbit block erase 1 2 1 2 s

128 Kbit block erase 0.8 1.6 0.8 1.6 s

64 Kbit block erase 0.6 1.2 0.6 1.2 s

Erase all main blocks 45 60 30 50 s

Program suspend latency time 10 10 µs

Erase suspend latency time 30 30 µs

Minimum effective erase time2 40 40 µs

Program/erase cycles (per block) 100,000 100,000 cycles

Notes: 1. TA = –40 to 125 °C, VDD = 2.7V to 3.6V, VDDQ = 2.6V to VDD.

2. The minimum effective erase time is defined as the minimum time required between

the last ERASE RESUME command and the next ERASE SUSPEND command for the inter-

nal Flash memory program/erase controller to be able to execute its algorithm.

M58BW16F, M58BW32F

Program and Erase Times and Endurance Cycles

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DC and AC Parameters

This section summarizes the operating and measurement conditions, and the DC and

AC characteristics of the device. The parameters in the DC and AC characteristics tables

that follow, are derived from tests performed under the measurement conditions sum-

marized in Operating and AC measurement conditions table. Designers should check

that the operating conditions in their circuit match the measurement conditions when

relying on the quoted parameters.

Operating Conditions and Capacitance

This section summarizes the operating and measurement conditions, and the DC and

AC characteristics of the device. The parameters in the DC and AC characteristics tables

that follow, are derived from tests performed under the measurement conditions sum-

marized in Operating and AC measurement conditions table. Designers should check

that the operating conditions in their circuit match the measurement conditions when

relying on the quoted parameters.

Table 26: Operating and AC Measurement Conditions

Parameter

M58BW16F, M58BW32F

Units

45ns 55ns

Min Max Min Max

Supply voltage (VDD) 2.7 3.6 2.5 3.3 V

Input/output supply voltage (VDDQ) 2.4 3.6 2.4 3.3 V

Ambient temperature (TA) Grade 3 –40 125 –40 125 °C

Load capacitance (CL) 30 30 pF

Clock rise and fall times 3 3 ns

Input rise and fall times 3 3 ns

Input pulses voltages 0 to VDDQ 0 to VDDQ V

Input and output timing ref. voltages VDDQ/2 VDDQ/2 V

Figure 15: AC Measurement Input/Output Waveform

VDDQ

VDDQIN

VDDQ / 2

VDDQIN / 2

Note: 1. VDD = VDDQ.

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 16: AC Measurement Load Circuit

OUT

CL includes JIG capacitance

DEVICE

UNDER

TEST

Table 27: Device Capacitance

Symbol Parameter Test condition Typ Max Unit

CIN Input capacitance VIN = 0 V 6 8 pF

COUT Output capacitance VOUT = 0 V 8 12 pF

Notes: 1. TA = 25 °C, f = 1 MHz.

2. Sampled only, not 100% tested.

M58BW16F, M58BW32F

DC and AC Parameters

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DC Characteristics

Symbol Parameter Test Condition Min Max Unit Notes

ILI Input leakage current 0V ≤ VIN ≤ VDDQIN ±1 µA

ILO Output leakage current 0V ≤ VOUT ≤ VDDQ ±5 µA

IDD Supply current (Random

read)

E# = VIL, G# = VIH,

fadd = 6 MHz

25 mA

IDDP-UP Supply current (Power-

up)

20 mA 1

IDDB Supply current (Burst

read)

E# = VIL, G# = VIH,

fclock = 75 MHz

50 mA

IDD1 Supply current (Stand-

by)

E# = RP# = VDD ±0.2V 150 µA 2

IDD2 Supply current (Pro-

gram or Erase)

Program, Erase in progress 30 mA

IDD3 Supply current

(Erase/Program sus-

pend)

E# = VIH 150 µA

IDD4 Supply current (Standby

disable)

5 10 mA

VIL Input LOW voltage –0.5 0.2VDDQIN V

VIH Input HIGH voltage (for

DQ lines)

0.8VDDQIN VDDQ + 0.3 V

VIH Input HIGH voltage (for

input only lines)

0.8VDDQIN 3.6 V

VOL Output LOW voltage IOL = 100µA 0.1 V

VOH Output HIGH voltage

CMOS

IOH = –100µA VDDQ - 0.1 V

VLKO VDD supply voltage

(Erase and program

lockout)

2.2 V

Notes: 1. IDDP-UP is the current needed from the device until RP goes to its logic HIGH level when

the power supply is stable (tVDHPH). See the Reset, Power-down, and Power-up AC wave-

forms - Control pins Low figure and the Reset, Power-down, and Power-up AC wave-

forms - Control pins toggling.

2. The Standby mode can be disabled by setting the standby disable bit (M14) of the burst

configuration register to ‘1’.

M58BW16F, M58BW32F

DC and AC Parameters

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Asynchronous Bus Read AC Characteristics

Figure 17: Asynchronous Bus Read AC Waveforms

A[19:0]

DQ[31:0]

VALID

tAXQX

tELQX

tELQV

tAVQV

tGLQX

tGLQV tEHQX

tEHQZ

tGHQX

tGHQZ

See also Page Read

OUTPUT

tEHLX

tAVAV

GD#

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 18: Asynchronous Latch Controlled Bus Read AC Waveforms

A[19:0]

DQ[31:0]

VALID

tEHLXtLHLL

tLHAX

tLLLH

tEHQX

tEHQZ

tGHQX

GHQZ

tLLQV

tLLQX

tGLQX

tGLQV

See also Page Read

OUTPUT

tAVLH

Figure 19: Asynchronous Chip Enable Controlled Bus Read AC Waveforms

A[19:0]

DQ[31:0]

VALID

tEHLX

tLHAX

tAVLH

tELLH

tEHQX

tEHQZ

tGHQX

GHQZ

tELQX

tELQV

tGLQX

tGLQV

See also Page Read

OUTPUT

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 20: Asynchronous Address Controlled Bus Read AC Waveforms

A[19:0]

DQ[31:0]

VALID

tEHLX

tLHAX

tAVLH

tEHQX

tEHQZ

tGHQX

GHQZ

tAVQV

tGLQX

tGLQV

See also Page Read

OUTPUT

tLLLH

M58BW16F, M58BW32F

DC and AC Parameters

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Table 28: Asynchronous Bus Read AC Characteristics

Symbol Parameter Test condition Min/Max

M58BWxxF

Unit Notes45ns 55ns

tAVAV Address valid to address valid E# = VIL, G# = VIL Min 45 55 ns

tAVQV Address valid to output valid E# = VIL, G# = VIL Max 45 55 ns

tAXQX Address transition to output transi-

tion

L# = VIL, G# = VIL Min 0 0 ns

tEHLX Chip enable HIGH to latch enable

transition

Min 0 0 ns

tEHQX Chip enable HIGH to output transi-

tion

G# = VIL Min 0 0 ns

tEHQZ Chip enable HIGH to output High-Z G# = VIL Max 20 20 ns

tELQV Chip enable LOW to output valid G# = VIL Max 45 55 ns 1

tGHQX Output enable HIGH to output tran-

sition

E# = VIL Min 0 0 ns

tGHQZ Output enable HIGH to output

High-Z

E# = VIL Max 15 15 ns

tGLQV Output enable LOW to output valid E# = VIL Max 15 15 ns

tGLQX Output enable LOW to output tran-

sition

E = VIL Min 0 0 ns

tLHAX Latch enable HIGH to address tran-

sition

E# = VIL Min 5 5 ns

tLHLL Latch enable HIGH to latch enable

LOW

Min 10 10 ns

tLLLH Latch enable LOW to latch enable

HIGH

E# = VIL Min 10 10 ns

tLLQV Latch enable LOW to output valid

chip enable LOW to output valid

E# = VIL, G# = VIL Max 45 55 ns

tLLQX Latch enable LOW to output transi-

tion

E# = VIL, G# = VIL Min 0 0 ns

tELQX Chip enable LOW to output transi-

tion

L# = VIL, G# = VIL Min 0 0 ns

tAVLH Address valid to latch enable LOW Min 10 10 ns

tELLH Chip enable LOW to latch enable

HIGH

Min 10 10 ns

Note: 1. Output enable G# may be delayed up to tELQV - tGLQV after the falling edge of chip ena-

ble E# without increasing tELQV.

M58BW16F, M58BW32F

DC and AC Parameters

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Asynchronous Page Read AC Characteristics

Figure 21: Asynchronous Page Read AC Waveforms

A0-A1

DQ0-DQ31

A0 and/or A1

tAVQV1

OUTPUT

tAXQX

OUTPUT + 1

Table 29: Asynchronous Page Read AC Characteristics

Symbol Parameter Test Conditions Max/Min

M58BWxxF

Unit45ns 55ns

tAVQV1 Address valid to output valid E# = VIL, G# = VIL Max 25 25 ns

tAXQX Address transition to output

transition

E# = VIL, G# = VIL Min 0 0 ns

Note: 1. For other timings see the Asynchronous Bus Read AC characteristics table.

M58BW16F, M58BW32F

DC and AC Parameters

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Asynchronous Write AC Characteristics

Figure 22: Asynchronous Write E# - Controlled AC Waveforms

DQ[31:0]

A[19:0]

Command

VALID VALID VALID

tAVEH

Status Register

PEN

tEHAX tAVLH tLHAX

tDVEH

tVPHEH

Read Status Register 1st PollingConfirm Command or Data InputSetup Command

tAVAV

tEHEL

tELLH

tEHWH

tELEH tLLLH

tELGL

tWLEL

tEHDX tELQV

Command/Data

M58BW16F, M58BW32F

DC and AC Parameters

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Table 30: Asynchronous Write E# - Controlled AC Characteristics

Symbol Parameter Test condition Max/Min

M58BWxxF

Unit45ns 55ns

tAVAV Address valid to address valid Min 45 55 ns

tAVEH Address valid to chip enable HIGH Min 25 30 ns

tEHAX Chip enable HIGH to address

transition

Min 0 0 ns

tELEH Chip enable LOW to chip enable

HIGH

W# = VIL Min 25 30 ns

tEHEL Chip enable HIGH to chip enable

LOW

Min 20 20 ns

tDVEH Data input valid to chip enable

HIGH

W# = VIL Min 25 30 ns

tEHDX Chip enable HIGH to input transi-

tion

W# = VIL Min 0 0 ns

tAVLH Address valid to latch enable

HIGH

Min 10 10 ns

tLHAX Latch enable HIGH to address

transition

Min 5 5 ns

tLLLH Latch enable LOW to latch enable

HIGH

Min 10 10 ns

tELLH Chip enable LOW to latch enable

HIGH

Min 10 10 ns

tEHGL Chip enable HIGH to output ena-

ble LOW

Min 150 150 ns

tWLEL Write enable LOW to chip enable

LOW

Min 0 0 ns

tEHWH Chip enable HIGH to write enable

HIGH

Min 0 0 ns

tELQV Chip enable LOW to output valid G# = VIL Max 45 55 ns

tVPHEH PEN HIGH to chip enable HIGH Min 0 0 ns

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 23: Asynchronous Write W# - Controlled AC Waveforms

DQ[31:0]

A[19:0]

Command

VALID VALID VALID

tAVWH

Status Register

PEN

tWHAX tAVLH tLHAX

tDVWH

tVPHWH

Read Status Register 1st PollingConfirm Command or Data InputSetup Command

tAVAV

tELLH

tWHEH

tLLLH

tELWL

tWLWH tWHWL

tWHDX tELQV

tWHGL

Command/Data

M58BW16F, M58BW32F

DC and AC Parameters

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Table 31: Asynchronous Write E# - Controlled AC Characteristics

Symbol Parameter Test condition Max/Min

M58BWxxF

Unit45ns 55ns

tAVAV Address valid to address valid Min 45 55 ns

tAVWH Address valid to write enable

HIGH

E# = VIL Min 25 30 ns

tWHAX Write enable HIGH to address

transition

Min 0 0 ns

tWLWH Write enable LOW to write ena-

ble HIGH

E# = VIL Min 25 30 ns

tWHWL Write enable HIGH to write ena-

ble LOW

Min 20 20 ns

tDVWH Data input valid to write enable

HIGH

E# = VIL Min 25 30 ns

tWHDX Write enable HIGH to input tran-

sition

E# = VIL Min 0 0 ns

tAVLH Address valid to latch enable

HIGH

E# = VIL Min 10 10 ns

tLHAX Latch enable HIGH to address

transition

E# = VIL Min 5 5 ns

tLLLH Latch enable LOW to latch enable

HIGH

Min 10 10 ns

tELLH Chip enable LOW to latch enable

HIGH

Min 10 10 ns

tELWL Chip enable LOW to write enable

LOW

Min 0 0 ns

tWHEH Write enable HIGH to chip enable

HIGH

Min 0 0 ns

tWHGL Write enable HIGH to output ena-

ble LOW

Min 150 150 ns

tELQV Chip enable LOW to output valid G# = VIL Max 45 55 ns

tVPHWH PEN HIGH to write enable HIGH Min 0 0 ns

M58BW16F, M58BW32F

DC and AC Parameters

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Synchronous Burst Read AC Characteristics

Figure 24: Synchronous Burst Read, Latch Enable Controlled (data valid from ’n’ clock rising edge)

DQ[31:0]

A[19:0]

VALID

tKHAX

n+2

n+1n

tKHLL

tLLKH

tELLL

tAVLL

tKHLH

tEHQX

tEHQZ

tGHQX

tGHQZ

tGLQV

Setup

OUTPUT

tKHQV

Note: n depends on Burst X-Latency.

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 25: Synchronous Burst Read, Chip Enable Controlled (data valid from ’n’ clock rising edge)

DQ[31:0]

A[19:0] VALID

tKHAX

n+2

n+1n

tKHEL

tELKH tKHLH

tEHQX

tEHQZ

tGHQX

tGHQZ

tGLQV

Setup

OUTPUT

tKHQV

Note: n depends on Burst X-Latency.

tBLKH

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 26: Synchronous Burst Read, Valid Address Transition Controlled (data valid

from ’n’ clock rising edge)

DQ[31:0]

A[19:0] VALID

tKHAX

n+2

n+1n

tAVKH

tKHLH

tEHQX

tEHQZ

tGHQX

tGHQZ

tGLQV

Setup

OUTPUT

tKHQV

Note: n depends on Burst X-Latency.

tBLKH

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 27: Synchronous Burst Read (data valid from ’n’ clock rising edge)

n+5

n+4

n+3

n+2

n+1n

DQ[31:0]

tKHQX

Q0 Q1 Q2 Q3 Q4 Q5

SETUP Burst Read

Q0 to Q3

tKHQV

Note: n depends on Burst X-Latency

Note: 1. For set up signals and timings see Synchronous Burst Read.

Figure 28: Synchronous Burst Read (valid data ready output)

Output (1) V V V V

tRLKH

(2)

Notes: 1. Valid Data Ready = Valid Low during valid clock edge.

2. V= Valid output.

3. The internal timing of R follows DQ.

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 29: Synchronous Burst Read (Burst Address Advance)

Q0 Q1 Q2

VALID

tGLQV

tBLKH tBHKH

DQ0-DQ31

A0-A19

Figure 30: Clock Input AC waveform

tKHKL

tKLKH

M58BW16F, M58BW32F

DC and AC Parameters

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Table 32: Synchronous Burst Read AC Characteristics

Notes apply to the entire table.

Symbol Parameter Test condition Max/Min

M58BWxxF

Unit45ns 55ns

f Clock frequency X-Latency = 3 Max 40 33 MHz

X-Latency = 4 Max 56 40 MHz

X-Latency = 5 or 6 Max 75 56 MHz

tAVKH Address valid to valid clock

edge

E# = VIL, L# = VIL

X-Latency = 3

Min 12 13 ns

E# = VIL, L# = VIL

X-Latency = 4, 5, or 6

Min 6 7 ns

tKHKL Clock HIGH time Min 6 6 ns

tKLKH Clock LOW time Min 6 6 ns

tBHKH Burst address advance HIGH to

valid clock edge

E# = VIL, G# = VIL, L# = VIH Min 8 8 ns

tBLKH Burst address advance LOW to

valid cock edge

E# = VIL, G# = VIL, L# = VIH Min 8 8 ns

tELKH Chip enable LOW to valid clock

edge

L# = VIL

X-Latency = 3

Min 12 13 ns

L# = VIL

X-Latency = 4, 5, or 6

Min 6 7 ns

tGLQV Output enable LOW to output

valid

E# = VIL, L# = VIH Max 15 15 ns

tKHAX Valid clock edge to address

transition

E# = VIL Min 5 5 ns

tKHEL Valid clock edge to chip enable

LOW

L# = VIL Min 0 0 ns

tKHLL Valid clock edge to latch ena-

ble LOW

E# = VIL Min 0 0 ns

tKHLH Valid clock edge to latch ena-

ble HIGH

E# = VIL Min 0 0 ns

tKHQX Valid clock edge to output

transition

E# = VIL, G# = VIL, L# = VIH Min 2 2 ns

tLLKH Latch enable LOW to valid

clock edge

E# = VIL

X-Latency = 3

Min 12 13 ns

E# = VIL

X-Latency = 4, 5, or 6

M58BW16F Min 6 5 ns

M58BW32F Min 6 7 ns

tRLKH Valid data ready LOW to valid

clock edge

E# = VIL, G# = VIL, L = VIH Min 6 6 ns

tKHQV Valid clock edge to output val-

E# = VIL, G# = VIL, L# = VIH Max 8 8 ns

Notes: 1. Data output should be read on the valid clock edge.

2. For other timings, see the Asynchronous Bus Read AC characteristics table.

M58BW16F, M58BW32F

DC and AC Parameters

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AC and DC Power Characteristics

Figure 31: Power Supply Slope Specification

VDH

VDHH

Voltage

Time

tVDH

Table 33: Power Supply AC and DC Characteristics

Symbol Description Min Max Unit

VDH Minimum value of power supply (VDD)10.9VDD V

VDHH Maximum value of power supply (VDD) 3.6 V

tVDH Time required from power supply to reach the VDH value 50 50,000 µs

Note: 1. This threshold is 90% of the minimum value allowed to VDD.

M58BW16F, M58BW32F

DC and AC Parameters

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Figure 32: Reset, Power-down, and Power-up AC Waveforms - Control Pins LOW

tPHWL

tPHEL

tPHGL

tPHLL

VDD, VDDQ

tVDHPH tPLPH

Power-up Reset

RHi-Z

tPHRH tPLRZ

Hi-Z

tPHRH

RP#

W#, E#, G#, L#

Figure 33: Reset, Power-down, and Power-up AC Waveforms - Control Pins Toggling

tPHWL

tPHEL

tPHGL

tPHLL

tVDHPH tPLPH

Power-up Reset

Hi-Z

tPHRH

tPLRZ

Hi-Z

tPHRH

tWLRH

tGLRH

tELRH

tLLRH

RP#

W#, E#, G#, L#

VDD, VDDQ

M58BW16F, M58BW32F

DC and AC Parameters

CCMTD-1725822587-8496

m58bw_16-32f.pdf - Rev. D 6/18 EN 82 Micron Technology, Inc. reserves the right to change products or specifications without notice.

Table 34: Reset, Power-Down, and Power-Up AC Characteristics

Symbol Parameter Min Max Unit

tPHEL Reset/Power-down HIGH to chip enable LOW 50 ns

tPHLL Reset/Power-down HIGH to latch enable LOW 50 ns

tPHQV

1Reset/Power-down HIGH to output valid 95 ns

tPHWL Reset/Power-down HIGH to write enable LOW 50 ns

tPHGL Reset/Power-down HIGH to output enable LOW 50 ns

tPLPH Reset/Power-down LOW to reset/power-down HIGH 100 ns

tPHRH1Reset/Power-down HIGH to valid data (Flash) ready HIGH 95 ns

tVDHPH Supply voltages HIGH to reset/power-down HIGH 50 µs

tPLRZ Reset/Power-down LOW to data ready (Flash) HIGH impedance 80 ns

tWLRH Write enable LOW to data ready (Flash) HIGH impedance 80 ns

tGLRH Output enable LOW to data ready HIGH impedance 80 ns

tELRH Chip enable LOW to data ready (Flash) HIGH impedance 80 ns

tLLRH Latch enable LOW to data ready (Flash) HIGH impedance 80 ns

Note: 1. This time is tPHEL + tAVQV or tPHEL + tELQV.

M58BW16F, M58BW32F

DC and AC Parameters

CCMTD-1725822587-8496

m58bw_16-32f.pdf - Rev. D 6/18 EN 83 Micron Technology, Inc. reserves the right to change products or specifications without notice.

Package Dimensions

Figure 34: 80-Pin LBGA – 10mm x 12mm

BALL A1

1.60 MAX

0.40 MIN

0.15 MAX

1.05 MAX

10.00 TYP

12.00 TYP

7.00 TYP

9.00 TYP

0.60 TYP

1.50 TYP

1.00 TYP

0.50 TYP

Note: 1. All dimensions are in millimeters. Drawing is not to scale

M58BW16F, M58BW32F

Package Dimensions

CCMTD-1725822587-8496

m58bw_16-32f.pdf - Rev. D 6/18 EN 84 Micron Technology, Inc. reserves the right to change products or specifications without notice.

Figure 35: 80-Lead PQFP

+0.2517.20

+0.1014.00

+0.252.80

+0.150.80

0.25 MIN

3.40 MAX

0.10 MAX

12.00 TYP

0.80 TYP

1.60 TYP

0.30 MIN/

0.45 MAX

0.13 MIN/

0.23 MAX

+0.2523.20

+0.1020.00

18.40 TYP

MIN0oMAX

Note: 1. All dimensions are in millimeters. Drawing is not to scale.

M58BW16F, M58BW32F

Package Dimensions

CCMTD-1725822587-8496

m58bw_16-32f.pdf - Rev. D 6/18 EN 85 Micron Technology, Inc. reserves the right to change products or specifications without notice.

Revision History

Rev. D – 6/18

• Added Important Notes and Warnings section for further clarification aligning to in-

dustry standards

Rev. C – 5/16

• Updated Burst Configuration Register table in Bus Operations section

Rev. B – 12/15

• Updated DC Characteristics table

Rev. A – 1/13

• Micron rebrand initial release

8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-4000

www.micron.com/products/support Sales inquiries: 800-932-4992

Micron and the Micron logo are trademarks of Micron Technology, Inc.

All other trademarks are the property of their respective owners.

This data sheet contains minimum and maximum limits specified over the power supply and temperature range set forth herein.

Although considered final, these specifications are subject to change, as further product development and data characterization some-

times occur.

M58BW16F, M58BW32F

Revision History

CCMTD-1725822587-8496

m58bw_16-32f.pdf - Rev. D 6/18 EN 86 Micron Technology, Inc. reserves the right to change products or specifications without notice.