BTB04-600SL
4/5
0
1
2
3
4
5
6
7
8
25 50 75 100 125
Tj(°C)
(dI/dt)c [Tj] / (dI/dt)c [Tj = 125°C]
Fig. 9: Relative variation of critical rate of decrease
of main current versus junction temperature.
0.0
0.5
1.0
1.5
2.0
2.5
3.0
-40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 100 110 120 130
Tj(°C)
IGT
IH & IL
IGT, IH, IL[Tj] / IGT, IH, IL [Tj = 25°C]
Fig. 7: Relative variation of gate trigger current,
holding current and latching current versus junc-
tion temperature (typical values).
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
0.1 1.0 10.0 100.0
dV/dt (V/µs)
(dI/dt)c [(dV/dt)c] / Specified (dI/dt)c
Fig.8:Relativevariationofcriticalrateofdecrease
of main current versus reapplied dV/dt (typical val-
ues).
0
1
2
3
4
5
6
7
8
25 50 75 100 125
Tj(°C)
VD=VR=400V
dV/dt [Tj] / dV/dt [Tj = 125°C]
Fig. 10: Relative variation of static dV/dt immunity
versus junction temperature.
1
10
100
1000
0.01 0.10 1.00 10.00
tp(ms)
Tj initial=25°C
dI/dt limitation:
50A/µs ITSM
I²t
ITSM(A), I t (A s)
22
Fig. 6: Non repetitive surge peak on-state current
for a sinusoidal pulse with width tp < 10ms, and
corresponding value of I2t.
0
5
10
15
20
25
30
35
40
1 10 100 1000
Number of cycles
Non repetitive
Tj initial=25°C
Repetitive
Tc=110°C
t=20ms
ITSM(A)
Fig. 5: Surgepeakon-statecurrentversus number
of cycles.