ADIS16448BMLZ-P - ANALOG DEVICES

Compact, Precision

Ten Degrees of Freedom Inertial Sensor

Data Sheet

ADIS16448

Rev. H Document Feedback

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FEATURES

Triaxial digital gyroscope with digital range scaling

±250°/sec, ±500°/sec, ±1000°/sec settings

Axis-to-axis alignment, <0.05°

Triaxial digital accelerometer, ±18 g minimum

Triaxial digital magnetometer, ±1.9 gauss minimum

Digital barometer, 10 mbar to 1200 mbar

Calibrated pressure range: 300 mbar to 1100 mbar

Autonomous operation and data collection

No external configuration commands required

205 ms start-up time

Factory calibrated sensitivity, bias, and axial alignment

Calibration temperature range: −40°C to +85°C

SPI-compatible serial interface

Burst mode read sequence with optional CRC-16

Embedded temperature sensor

Programmable operation and control

Automatic and manual bias correction controls

Bartlett window FIR length, number of taps

Digital I/O: data ready, alarm indicator, general-purpose

Alarms for condition monitoring

Enable external sample clock input up to 1.1 kHz

Single command self test

Single-supply operation: 3.15 V to 3.45 V

2000 g shock survivability

Operating temperature range: −40°C to +105°C

APPLICATIONS

Platform stabilization and control

Navigation

Robotics

GENERAL DESCRIPTION

The ADIS16448 iSensor® device is a complete inertial system

that includes a triaxial gyroscope, a triaxial accelerometer, a

triaxial magnetometer, and pressure sensors. Each sensor in

the ADIS16448 combines industry-leading iMEMS® technology

with signal conditioning that optimizes dynamic performance.

The factory calibration characterizes each sensor for sensitivity,

bias, and alignment. As a result, each sensor has its own dynamic

compensation formulas that provide accurate sensor

measurements.

The ADIS16448 provides a simple, cost-effective method for

integrating accurate, multiaxis inertial sensing into industrial

systems, especially when compared with the complexity and

investment associated with discrete designs. All necessary motion

testing and calibration are part of the production process at the

factory, greatly reducing system integration time. Tight orthogonal

alignment simplifies inertial frame alignment in navigation systems.

The SPI and register structures provide a simple interface for

data collection and configuration control.

The ADIS16448 has a compatible pinout for systems that currently

use other Analog Devices, Inc., IMU products, such as

ADIS16334 or ADIS16485. The ADIS16448 is packaged in a

module that is approximately 24.1 mm × 37.7 mm × 10.8 mm

and has a standard connector interface.

FUNCTIONAL BLOCK DIAGRAM

CONTROLLLER

CLOCK

TRIAXIAL

GYRO

TRIAXIAL

ACCEL

POWER

MANAGEMENT

SCLK

DIN

DOUT

GND

VDD

TEMP

VDD

DIO1 DIO2 DIO3 DIO4/CLKIN RST

SPI

TRIAXIAL

MAGN

PRESSURE

SELF T EST I/O ALARMS

OUTPUT

DATA

REGISTERS

USER

CONTROL

REGISTERS

CALIBRATION

AND

FILTERS

ADIS16448

09946-001

Figure 1.

ADIS16448 Data Sheet

Rev. H | Page 2 of 26

TABLE OF CONTENTS

Features .............................................................................................. 1

Applications ....................................................................................... 1

General Description ......................................................................... 1

Functional Block Diagram .............................................................. 1

Revision History ............................................................................... 2

Specifications ..................................................................................... 4

Timing Specifications .................................................................. 6

Absolute Maximum Ratings ............................................................ 7

ESD Caution .................................................................................. 7

Pin Configuration and Function Descriptions ............................. 8

Typical Performance Characteristics ............................................. 9

User Registers .................................................................................. 10

User Interface .................................................................................. 11

Reading Sensor Data .................................................................. 11

Device Configuration ................................................................ 12

Output Data Registers .................................................................... 13

Gyroscopes .................................................................................. 13

Accelerometers ............................................................................ 13

Magnetometers ........................................................................... 14

Barometric Pressure ................................................................... 14

Remote Pressure Sensing ........................................................... 15

Internal Temperature ................................................................. 15

System Functions ............................................................................ 16

Global Commands ..................................................................... 16

Product Identification ................................................................ 16

Self-Test Function ....................................................................... 16

Status/Error Flags ....................................................................... 17

Memory Management ............................................................... 17

Input/Output Configuration ......................................................... 18

Data Ready Indicator ................................................................. 18

General-Purpose Input/Output................................................ 18

Digital Processing Configuration ................................................. 19

Gyroscopes/Accelerometers ..................................................... 19

Input Clock Configuration ....................................................... 19

Magnetometer/Barometer ......................................................... 20

Calibration ....................................................................................... 21

Gyroscopes .................................................................................. 21

Accelerometers ........................................................................... 21

Magnetometer Calibration ........................................................ 22

Flash Updates .............................................................................. 23

Restoring Factory Calibration .................................................. 23

Alarms .............................................................................................. 24

Static Alarm Use ......................................................................... 24

Dynamic Alarm Use .................................................................. 24

Alarm Reporting ........................................................................ 24

Applications Information .............................................................. 25

Mounting Tips ............................................................................ 25

Power Supply Considerations ................................................... 25

ADIS16IMU2/PCBZ .................................................................. 25

PC-Based Evaluation Tools ....................................................... 25

X-Ray Sensitivity ........................................................................ 25

Outline Dimensions ....................................................................... 26

Ordering Guide .......................................................................... 26

REVISION HISTORY

1/2019—Rev. G to Rev. H

Added Endnote 3, Table 1; Renumbered Sequentially ................ 5

Changes to Digital Filtering Section ................................................. 19

Added X-Ray Sensitivity Section .................................................. 25

5/2018—Rev. F to Rev. G

Changes to ADIS16IMU2/PCBZ Section and PC-Based

Evaluation Tools Section................................................................ 24

4/2017—Rev. E to Rev. F

Updated Layout ................................................................... Universal

Changed ADIS16448/PCBZ Section to ADIS16IMU2/PCBZ

Section .............................................................................................. 25

Changes to ADIS16IMU2/PCBZ Section, Figure 25, and

Figure 26 .......................................................................................... 25

Changes to Ordering Guide .......................................................... 26

Deleted Installation Section .......................................................... 27

8/2015—Rev. D to Rev. E

Change to Features Section .............................................................. 1

Changes to Input Sync Positive Pulse Width and Input Sync to

Data Ready Valid Transition Parameters, Table 2 ......................... 7

Changes to Figure 13 Caption ...................................................... 14

Added Burst Read Function with CRC Section ......................... 14

Changes to Figure 14 ...................................................................... 14

Changes to Table 30 ....................................................................... 18

5/2015—Rev. C to Rev. D

Changed ADIS16448AMLZ to ADIS16448BMLZ ... Throughout

Change to Features Section and General Description Section.... 1

Changes to Table 1 ............................................................................. 3

Changes to Table 3 ............................................................................. 6

Data Sheet ADIS16448

Rev. H | Page 3 of 26

Change to Figure 9 .......................................................................... 10

Changes to Ordering Guide ........................................................... 23

9/2014—Rev. B to Rev. C

Changes to General Description Section .......................................... 1

Changes Status/Error Flags Section .............................................. 15

Changes to Tabl e 54 ......................................................................... 21

Added Mounting Tips Section ...................................................... 22

7/2013—Rev. A to Rev. B

Changes to Linear Acceleration Effect on Bias Test Conditions ..... 3

Changes to Burst Read Function Section ..................................... 11

3/2013—Rev. 0 to Rev. A

Changed Start-Up Time from 192 ms to 205 ms .......................... 1

Changes to Tabl e 1 ............................................................................ 3

Changed VDD from 5 V to 3.3 V, Changed tSTALL from 1/fSCLK to

N/A, and Added Endnote 2; Table 2 ............................................... 5

Changes to Burst Read Function Section .................................... 11

Changes to Tabl e 23 ........................................................................ 13

Changes to Single Command Bias Correction Section ............. 19

Changes to ADIS16448/PCBZ Section ........................................ 22

Deleted Mounting, Approaches Section ...................................... 22

Updated Outline Dimensions ........................................................ 23

Changes to Ordering Guide ........................................................... 23

8/2012—Revision 0: Initial Version

ADIS16448 Data Sheet

Rev. H | Page 4 of 26

SPECIFICATIONS

TA = 25°C, VDD = 3.3 V, angular rate = 0°/sec, dynamic range = ±1000°/sec ± 1 g, unless otherwise noted.

Table 1.

Parameter Test Conditions/Comments Min Typ Max Unit

GYROSCOPES

Dynamic Range ±1000 ±1200 °/sec

Initial Sensitivity ±1000°/sec, see Table 12 0.04 °/sec/LSB

±500°/sec, see Table 12 0.02 °/sec/LSB

±250°/sec, see Table 12 0.01 °/sec/LSB

Repeatability1 −40°C ≤ TA ≤ +85°C 1 %

Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C ±40 ppm/°C

Misalignment Axis to axis ±0.05 Degrees

Axis to frame (package) ±0.5 Degrees

Nonlinearity Best fit straight line ±0.1 % of FS

Bias Repeatability1, 2 −40°C ≤ TA ≤ +85°C, 1 σ 0.5 °/sec

In-Run Bias Stability 1 σ, SMPL_PRD = 0x0001 14.5 °/hr

Angular Random Walk 1 σ, SMPL_PRD = 0x0001 0.66 °/√hr

Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C 0.005 °/sec/°C

Linear Acceleration Effect on Bias Any axis, 1 σ 0.015 °/sec/g

Bias Supply Sensitivity −40°C ≤ TA ≤ +85°C 0.2 °/sec/V

Output Noise ±1000°/sec range, no filtering 0.27 °/sec rms

Rate Noise Density f = 25 Hz, ±1000°/sec range, no filtering 0.0135 °/sec/√Hz rms

−3 dB Bandwidth 330 Hz

Sensor Resonant Frequency 17.5 kHz

ACCELEROMETERS Each axis

Dynamic Range ±18 g

Sensitivity See Table 16 for data format 0.833 mg/LSB

Repeatability1 −40°C ≤ TA ≤ +85°C 1 %

Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C ±40 ppm/°C

Misalignment Axis to axis 0.2 Degrees

Axis to frame (package) ±0.5 Degrees

Nonlinearity Best fit straight line 0.2 % of FS

Bias Repeatability1, 2, 3 −40°C ≤ TA ≤ +85°C, 1 σ 20 mg

In-Run Bias Stability 1 σ, SMPL_PRD = 0x0001 0.25 mg

Velocity Random Walk 1 σ, SMPL_PRD = 0x0001 0.11 m/sec/√hr

Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C

±0.15 mg/°C

Bias Supply Sensitivity −40°C ≤ TA ≤ +85°C 5 mg/V

Output Noise No filtering 5.1 mg rms

Noise Density No filtering 0.23 mg/√Hz rms

−3 dB Bandwidth 330 Hz

Sensor Resonant Frequency 5.5 kHz

MAGNETOMETERS

Dynamic Range ±1.9 gauss

Initial Sensitivity 25°C, see Table 20 for data format 140.04 142.9 145.76 µgauss/LSB

Sensitivity Temperature Coefficient Relative to 25°C, 1 σ 800 ppm/°C

Misalignment Axis to axis 0.25 Degrees

Axis to frame (package) 0.5 Degrees

Nonlinearity Best fit straight line 0.1 % of FS

Initial Bias Error 25°C, 0 gauss stimulus ±4 mgauss

Bias Temperature Coefficient −40°C ≤ TA ≤ +85°C 0.11 mgauss/°C

Output Noise 25°C, no filtering, rms 2.4 mgauss

Noise Density 25°C, no filtering, rms 0.4 mgauss/√Hz

Bandwidth −3 dB 25 Hz

Data Sheet ADIS16448

Rev. H | Page 5 of 26

Parameter Test Conditions/Comments Min Typ Max Unit

TEMPERATURE

Sensitivity See Table 23 0.07386 °C/LSB

BAROMETERS

Pressure Range, Operating 300 1100 mbar

Pressure Range Extended4 10 1200 mbar

Sensitivity 0.02 mbar/LSB

Voltage Dependence 0.18 %/V

Bias Supply Voltage Sensitivity 3.24 mbar/V

Total Error 25°C, 300 mbar to 1100 mbar 1.5 mbar

Relative Error5 −40°C to +85°C, 300 mbar to 1100 mbar 2.5 mbar

Linearity6 25°C, 300 mbar to 1100 mbar 0.1 % of FS

−40°C to +85°C, 300 mbar to 1100 mbar 0.2 % of FS

Noise 0.08 mbar rms

LOGIC INPUTS7

Input High Voltage, VIH 2.0 V

Input Low Voltage, VIL 0.8 V

Logic 1 Input Current, IIH VIH = 3.3 V ±0.2 ±10 µA

Logic 0 Input Current, IIL VIL = 0 V

All Pins Except RST 40 60 µA

RST Pin 1 mA

Input Capacitance, C

DIGITAL OUTPUTS7

Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V

Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V

FLASH MEMORY Endurance8 10,000 Cycles

Data Retention9 TJ = 85°C 20 Years

FUNCTIONAL TIMES10 Time until new data is available

Power-On Start-Up Time 205 ms

Reset Recovery Time11 90 ms

Flash Memory Back-Up Time 75 ms

Flash Memory Test Time 20 ms

Automatic Self-Test Time SMPL_PRD = 0x0001 45 ms

CONVERSION RATE

xGYRO_OUT, xACCL_OUT SMPL_PRD = 0x0001 819.2 SPS

xMAGN_OUT, BARO_OUT12 SMPL_PRD = 0x0001 51.2 SPS

Clock Accuracy ±3 %

Sync Input Clock13 0.8 1.1 kHz

POWER SUPPLY Operating voltage range, VDD 3.15 3.3 3.45 V

Power Supply Current 76 104 mA

1 The repeatability specifications represent analytical projections, which are based off of the following drift contributions and conditions: temperature hysteresis (−40°C

to +85°C), electronics drift (high-temperature operating life test: 85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles,

−40°C to +85°C), rate random walk (10 year projection), and broadband noise.

2 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density

specifications.

3 X-ray exposure may degrade this performance metric.

4 The extended pressure range is guaranteed by design.

5 The relative error assumes that the initial error, at 25°C, is corrected in the end application.

6 Linearity errors assume a full scale (FS) of 1000 mbar.

7 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.

8 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.

9 The data retention lifetime equivalent is at a junction temperature (TJ) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction

temperature.

10 These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.

11 The RST line must be held low for at least 10 μs to assure a proper reset and recovery sequence.

12 The xMAGN_OUT and BARO_OUT registers update at a rate that is 1/16th that of the other output registers.

13 The sync input clock functions below the specified minimum value but at reduced performance levels.

ADIS16448 Data Sheet

Rev. H | Page 6 of 26

TIMING SPECIFICATIONS

TA = 25°C, VDD = 3.3 V, unless otherwise noted.

Table 2.

Parameter Description

Normal Mode Burst Read

Unit Min1 Typ Max Min1 Typ Max

fSCLK Serial clock 0.01 2.0 0.01 1.0 MHz

tSTALL Stall period between data 9 N/A2 µs

tREADRATE Read rate 40 µs

tCS Chip select to SCLK edge 48.8 48.8 ns

tDAV DOUT valid after SCLK edge 100 100 ns

tDSU DIN setup time before SCLK rising edge 24.4 24.4 ns

tDHD DIN hold time after SCLK rising edge 48.8 48.8 ns

tSCLKR, tSCLKF SCLK rise/fall times, not shown in the Timing Diagrams section 5 12.5 5 12.5 ns

tDR, tDF DOUT rise/fall times, not shown in the Timing Diagrams section 5 12.5 5 12.5 ns

tSFS CS high after SCLK edge 5 5 ns

t1 Input sync positive pulse width 25 25 µs

tSTDR Input sync to data ready valid transition 600 600 µs

tNV Data invalid time 210 210 µs

t3 Input sync period 910 910 µs

1 Guaranteed by design and characterization, but not tested in production.

2 When using the burst read mode, the stall period is not applicable.

Timing Diagrams

SCLK

DOUT

DIN

1 2 3 4 5 6 15 16

R/W A5A6 A4 A3 A2 D2

MSB DB14

D1 LSB

DB13 DB12 DB10DB11 DB2 LSBDB1

SFS

DAV

DHD

DSU

09946-002

Figure 2. SPI Timing and Sequence

SCLK

READRATE

STALL

09946-003

Figure 3. Stall Time and Data Rate

CLOCK

DATA

READY

STDR

09946-004

Figure 4. Input Clock Timing Diagram

Data Sheet ADIS16448

Rev. H | Page 7 of 26

ABSOLUTE MAXIMUM RATINGS

Table 3.

Parameter Rating

Acceleration

Any Axis, Unpowered 2000 g

Any Axis, Powered 2000 g

VDD to GND −0.3 V to +3.45 V

Digital Input Voltage to GND −0.3 V to +VDD + 0.3 V

Digital Output Voltage to GND −0.3 V to +VDD + 0.3 V

Temperature

Operating Range −40°C to +105°C

Storage Range −65°C to +125°C1, 2

Pressure 2 bar

1 Extended exposure to temperatures outside the specified temperature

range of −40°C to +105°C can adversely affect the accuracy of the factory

calibration. For best accuracy, store the parts within the specified operating

range of −40°C to +105°C.

2 Although the device is capable of withstanding short-term exposure to

150°C, long-term exposure threatens internal mechanical integrity.

Stresses at or above those listed under Absolute Maximum

Ratings may cause permanent damage to the product. This is a

stress rating only; functional operation of the product at these

or any other conditions above those indicated in the operational

section of this specification is not implied. Operation beyond

the maximum operating conditions for extended periods may

affect product reliability.

Table 4. Package Characteristics

Package Type θJA (°C/W) θJC (°C/W) Mass (grams)

20-Lead Module (ML-20-2) 36.5 16.9 15

ESD CAUTION

ADIS16448 Data Sheet

Rev. H | Page 8 of 26

PIN CONFIGURATION AND FUNCTION DESCRIPTIONS

DIO4/CLKIN

DOUT

RST

VDD DIO2

GND

DNC

DIO3

SCLK

DIN

DIO1

VDD VDD

GND

DNC

ADIS16448

TOP VIEW

(No t t o Scal e)

NOTES

1. THIS REPRESENTATION DISPLAYS THE TOP VI EW W HEN THE

CONNECTO R IS VISIBLE AND FACI NG UP.

2. M ATING CONNE CTO R: S AM TEC CL M - 110-02 OR E QUIV ALENT.

3. DNC = DO NO T CONNE CT.

09946-005

Figure 5. Pin Configuration

PIN 1

PIN 20

USE THIS OPENING FOR

REMOTE PRESSURE SENSING.

HOLE IS TAPPED

FO R 10-32 SCREW THRE ADS .

09946-106

Figure 6. Pin Locations

Table 5. Pin Function Descriptions

Pin No. Mnemonic Type 1 Description

1 DIO3 I/O Configurable Digital Input/Output.

2 DIO4/CLKIN I/O Configurable Digital Input/Output or Sync Clock Input.

3 SCLK I SPI Serial Clock.

4 DOUT O SPI Data Output. Clocks the output on the SCLK falling edge.

5 DIN I SPI Data Input. Clocks the input on the SCLK rising edge.

6 CS I SPI Chip Select.

7 DIO1 I/O Configurable Digital Input/Output.

8 RST I Reset.

DIO2

I/O

Configurable Digital Input/Output.

10, 11, 12 VDD S Power Supply.

13, 14, 15 GND S Power Ground.

16, 17, 18, 19, 20 DNC N/A Do Not Connect. Do not connect to these pins.

1 I is input, O is output, S is supply, and N/A is not applicable.

Data Sheet ADIS16448

Rev. H | Page 9 of 26

TYPICAL PERFORMANCE CHARACTERISTICS

100

1000

0.01 0.1 110 100 1000

ROOT ALLAN VARI ANCE ( °/ Hour)

(Seconds)

–δ

+δ

AVERAGE

09946-127

Figure 7. Gyroscope Root Allan Variance

0.01

0.1

0.01 0.1 110 100 1000

ROOT ALLAN VARI ANCE ( mg)

TAU ( S econ ds)

AVERAGE

–δ

+δ

09946-128

Figure 8. Accelerometer Root Allan Variance

ADIS16448 Data Sheet

Rev. H | Page 10 of 26

USER REGISTERS

Table 6. User Register Memory Map1

Name

R/W

Flash Backup

Address

Default

Function

Bit Assignments

FLASH_CNT R Yes 0x00 N/A Flash memory write count See Table 32

Reserved N/A N/A 0x02 N/A N/A

XGYRO_OUT R No 0x04 N/A X-axis gyroscope output See Table 9

YGYRO_OUT R No 0x06 N/A Y-axis gyroscope output See Table 10

ZGYRO_OUT R No 0x08 N/A Z-axis gyroscope output See Table 11

XACCL_OUT R No 0x0A N/A X-axis accelerometer output See Table 13

YACCL_OUT R No 0x0C N/A Y-axis accelerometer output See Table 14

ZACCL_OUT R No 0x0E N/A Z-axis accelerometer output See Table 15

XMAGN_OUT R No 0x10 N/A X-axis magnetometer measurement See Table 17

YMAGN_OUT R No 0x12 N/A Y-axis magnetometer measurement See Table 18

ZMAGN_OUT R No 0x14 N/A Z-axis magnetometer measurement See Table 19

BARO_OUT R No 0x16 N/A Barometer pressure measurement, high word See Table 21

TEMP_OUT R No 0x18 N/A Temperature output See Table 23

XGYRO_OFF R/W Yes 0x1A 0x0000 X-axis gyroscope bias offset factor See Table 37

YGYRO_OFF R/W Yes 0x1C 0x0000 Y-axis gyroscope bias offset factor See Table 38

ZGYRO_OFF R/W Yes 0x1E 0x0000 Z-axis gyroscope bias offset factor See Table 39

XACCL_OFF R/W Yes 0x20 0x0000 X-axis acceleration bias offset factor See Table 40

YACCL_OFF R/W Yes 0x22 0x0000 Y-axis acceleration bias offset factor See Table 41

ZACCL_OFF R/W Yes 0x24 0x0000 Z-axis acceleration bias offset factor See Table 42

XMAGN_HIC R/W Yes 0x26 0x0000 X-axis magnetometer, hard iron factor See Table 43

YMAGN_HIC R/W Yes 0x28 0x0000 Y-axis magnetometer, hard iron factor See Table 44

ZMAGN_HIC R/W Yes 0x2A 0x0000 Z-axis magnetometer, hard iron factor See Table 45

XMAGN_SIC R/W Yes 0x2C 0x0000 X-axis magnetometer, soft iron factor See Table 46

YMAGN_SIC R/W Yes 0x2E 0x0000 Y-axis magnetometer, soft iron factor See Table 47

ZMAGN_SIC R/W Yes 0x30 0x0000 Z-axis magnetometer, soft iron factor See Table 48

GPIO_CTRL R/W No 0x32 0x0000 Auxiliary digital input/output control See Table 33

MSC_CTRL R/W Yes 0x34 0x0006 Miscellaneous control See Table 30

SMPL_PRD R/W Yes 0x36 0x0001 Internal sample period (rate) control See Table 34

SENS_AVG R/W Yes 0x38 0x0402 Dynamic range and digital filter control See Table 35

SEQ_CNT R N/A 0x3A N/A xMAGN_OUT and BARO_OUT counter See Table 36

DIAG_STAT R No 0x3C 0x0000 System status See Table 31

GLOB_CMD W N/A 0x3E 0x0000 System command See Table 25

ALM_MAG1 R/W Yes 0x40 0x0000 Alarm 1 amplitude threshold See Table 49

ALM_MAG2 R/W Yes 0x42 0x0000 Alarm 2 amplitude threshold See Table 50

ALM_SMPL1 R/W Yes 0x44 0x0000 Alarm 1 sample size See Table 51

ALM_SMPL2 R/W Yes 0x46 0x0000 Alarm 2 sample size See Table 52

ALM_CTRL R/W Yes 0x48 0x0000 Alarm control See Table 53

Reserved N/A N/A 0x4A to 0x51 N/A Reserved

LOT_ID1 R Yes 0x52 N/A Lot identification number See Table 26

LOT_ID2 R Yes 0x54 N/A Lot identification number See Table 27

PROD_ID R Yes 0x56 0x4040 Product identifier See Table 28

SERIAL_NUM R Yes 0x58 N/A Lot-specific serial number See Table 29

1 N/A means not applicable.

2 Each register contains two bytes. The address of the lower byte is displayed. The address of the upper byte is equal to the address of the lower byte plus 1.

Data Sheet ADIS16448

Rev. H | Page 11 of 26

USER INTERFACE

The ADIS16448 is an autonomous system that requires no user

initialization. When it has a valid power supply, it initializes itself

and starts sampling, processing, and loading sensor data into

the output registers at a sample rate of 819.2 SPS. DIO1 pulses

high after each sample cycle concludes. The SPI interface enables

simple integration with many embedded processor platforms,

as shown in Figure 9 (electrical connection) and Table 7 (pin

functions).

SYSTEM

PROCESSOR

SPI MASTER ADIS16448

SCLK

DIN

DOUT

SCLK

MOSI

MISO

+3.3V

IRQ DIO1

VDD I/O LINES ARE COMPATIBLE WITH

3.3V LOGIC LINES

11 12

13 14 15

09946-009

10µF

Figure 9. Electrical Connection Diagram

Table 7. Generic Master Processor Pin Names and Functions

Pin Name Function

SS Slave select

SCLK Serial clock

MOSI Master output, slave input

MISO Master input, slave output

IRQ Interrupt request

The ADIS16448 SPI interface supports full duplex serial commu-

nication (simultaneous transmit and receive) and uses the bit

sequence shown in Figure 12. Tabl e 8 provides a list of the most

common settings that require attention to initialize the serial

port of a processor for the ADIS16448 SPI interface.

Table 8. Generic Master Processor SPI Settings

Processor Setting Description

Master The ADIS16448 operates as a slave

SCLK Rate ≤ 2 MHz1 Maximum serial clock rate

SPI Mode 3 CPOL = 1 (polarity), CPHA = 1 (phase)

MSB-First Mode Bit sequence

16-Bit Mode Shift register/data length

1 For burst read, SCLK rate ≤ 1 MHz.

READING SENSOR DATA

The ADIS16448 provides two different options for acquiring

sensor data: single register and burst register. A single register

read requires two 16-bit SPI cycles. The first cycle requests the

contents of a register using the bit assignments in Figure 12.

Bit DC7 to Bit DC0 are don’t cares for a read, and then the output

Figure 10 includes three single register reads in succession. In

this example, the process starts with DIN = 0x0400 to request

the contents of XGYRO_OUT, then follows with 0x0600 to

request YGYRO_OUT and 0x0800 to request ZGYRO_OUT.

Full duplex operation enables processors to use the same 16-bit

SPI cycle to read data from DOUT while requesting the next set

of data on DIN. Figure 11 provides an example of the four SPI

signals when reading XGYRO_OUT in a repeating pattern.

XGYRO_OUT

DIN

DOUT

YGYRO_OUT ZGYRO_OUT

0x0400 0x0600 0x0800

09946-010

Figure 10. SPI Read Example

SCLK

DIN

DOUT

09946-111

DOUT = 1111 10011101 1010 = 0xF9DA = –1574 LSBs ≥ –62.96°/sec

DIN = 0000 0100 0000 0000 = 0x0400

Figure 11. Example SPI Read, Second 16-Bit Sequence

R/W R/W

A6 A5 A4 A3 A2 A1 A0 DC7 DC6 DC5 DC4 DC3 DC2 DC1 DC0

D0D1D2D3D4D5D6D7D8D9D10D11D12D13D14D15

SCLK

DIN

DOUT

A6 A5

D13D14D15

NOTES

1. T HE DOUT BIT PATTERN REFLECTS THE ENTIRE CONTENTS OF THE REGISTER IDENTIFIED BY [A6:A0]

IN T HE P RE V IO US 16- BIT DIN SE QUENCE WHEN R/W = 0.

2. I F R/ W = 1 DURI NG T HE P RE V IOUS S E QUENCE, DO UT IS NOT DE FINE D.

09946-013

Figure 12. SPI Communication Bit Sequence

ADIS16448 Data Sheet

Rev. H | Page 12 of 26

Burst Read Function

The burst read function provides a way to read all of the data

in one continuous stream of bits (no stall time). As shown in

Figure 13, start this mode by setting DIN = 0x3E00, while

keeping CS low for 12 additional, 16-bit read cycles. These

12 cycles produce the following sequence of output registers

on DOUT: DIAG_STAT, XGYRO_OUT, YGYRO_OUT,

ZGYRO_OUT, XACCL_OUT, YACCL_OUT, ZACCL_OUT,

XMAGN_OUT, YMAGN_OUT, ZMAGN_OUT, BARO_OUT,

and TEMP_OUT.

GLOB_CMD

SCLK

DIN

DOUT XGYRO_OUT

DIAG_STATTEMP_OUT

12 3 13

09946-113

Figure 13. Burst Read Sequence, MSC_CTRL[4] = 0

Burst Read Function with CRC

When MSC_CTRL[4] = 1, the ADIS16448 adds a CRC-16 code

at the end of the burst mode response (after TEMP_OUT), on

the DOUT line. This increases the total number of 16-bit

segments in the burst read operation to 14. The CRC-16 code

derives from the CCIT CRC-16 method and provides a simple

mechanism for verifying the correct communication of data

during a burst mode sequence. This method strings together

the data from the burst read output into a continuous binary

number (176 bits), divides it by 0x1021, and uses the remainder

of this operation as the CRC-16 code. The 176-bit binary

number contains the contents of the following registers, which

are in their order of significance in the 176-bit number:

XGYRO_OUT (most significant 16-bits), YGYRO_OUT,

ZGYRO_OUT, XACCL_OUT, YACCL_OUT, ZACCL_OUT,

XMAGN_OUT, YMAGN_OUT, ZMAGN_OUT, BARO_OUT,

and TEMP_OUT (least significant 16-bits).

GLOB_CMD

SCLK

DIN

DOUT XGYRO_OUTDIAG_STAT CRC-16

1 2 3 14

09946-113

Figure 14. Burst Ready Sequence, MSC_CTRL[4] = 1

SPI Read Test Sequence

Figure 15 provides a test pattern for testing the SPI communica-

tion. In this pattern, write 0x5600 to the DIN line in a repeating

pattern and raise chip select for at least 9 µs between each 16-bit

sequence. Starting with the second 16-bit sequence, DOUT

produces the contents of the PROD_ID (see Table 28) register,

0x4040.

DOUT = 0100 0000 0100 0000 = 0x4040 = 16,448

DIN = 0101 0110 0000 0000 = 0x5600

SCLK

DIN

DOUT

09946-011

Figure 15. SPI Test Read Pattern DIN = 0x5600, DOUT = 0x4040

DEVICE CONFIGURATION

The control registers in Table 6 provide users with a variety of

configuration options. The SPI provides access to these registers,

one byte at a time, using the bit assignments in Figure 12. Each

and Bits[15:8] represent the upper address. Figure 16 provides

an example of writing 0x04 to Address 0x36 (SMPL_PRD[15:8],

using DIN = 0xB704. This example reduces the sample rate by a

factor of eight (see Table 34).

SCLK

DIN

DIN = 10 11 0111 0000 0100 = 0xB704, WRITES 0x04 TO ADDRESS 0x37.

09 946-016

Figure 16. Example SPI Write Sequence

Dual Memory Structure

Writing configuration data to a control register updates its

SRAM contents, which are volatile. After optimizing each

relevant control register setting in a system, set GLOB_CMD[3]

= 1 (DIN = 0xBE08) to backup these settings in nonvolatile

flash memory. The flash backup process requires a valid power

supply level for the entire process time, 75 ms. Tabl e 6 provides

a user register memory map that includes a flash backup

column. A yes in this column indicates that a register has a

mirror location in flash and, when backed up properly, it

automatically restores itself during startup or after a reset.

Figure 17 provides a diagram of the dual memory structure

used to manage operation and store critical user settings.

NONVOLATILE

FLASH MEMORY

(NO SPI ACCESS)

MANUAL

FLASH

BACKUP

START-UP

RESET

VOLATILE

SRAM

SPI ACCESS

09946-017

Figure 17. SRAM and Flash Memory Diagram

Data Sheet ADIS16448

Rev. H | Page 13 of 26

OUTPUT DATA REGISTERS

Each sensor in the ADIS16448 has a dedicated output register

in the user register map (see Table 6). Figure 18 provides

arrows, which describe the direction or rotation (gX, gY, gZ),

acceleration (aX, aY, aZ), and magnetic field (mX, mY, mZ) that

produce a positive response in its output data.

GYROSCOPES

XGYRO_OUT (see Table 9) contains x-axis gyroscope data (gX

in Figure 18), YGYRO_OUT (see Tabl e 10) contains y-axis gyro-

scope data (gY in Figure 18), and ZGYRO_OUT (see Table 11)

contains z-axis gyroscope data (gZ in Figure 18). Table 12

illustrates the gyroscope data format with numerical examples.

Table 9. XGYRO_OUT (Base Address = 0x04), Read Only

Bits Description

[15:0] X-axis gyroscope data, twos complement format,

25 LSB/°/sec (SENS_AVG[15:8] = 0x04), 0°/sec = 0x0000

Table 10. YGYRO_OUT (Base Address = 0x06), Read Only

Bits Description

[15:0]

Y-axis gyroscope data, twos complement format,

25 LSB/°/sec (SENS_AVG[15:8] = 0x04), 0°/sec = 0x0000

Table 11. ZGYRO_OUT (Base Address = 0x08), Read Only

Bits Description

[15:0] Z-axis gyroscope data, twos complement format,

25 LSB/°/sec (SENS_AVG[15:8] = 0x04), 0°/sec = 0x0000

Table 12. Rotation Rate, Twos Complement Format1

Rotation

Rate (°/sec) Decimal Hex Binary

+1000 +25,000 0x61A8 0110 0001 1010 1000

+2 ÷ 25 +2 0x0002 0000 0000 0000 0010

+1 ÷ 25 +1 0x0001 0000 0000 0000 0001

0 0 0x0000 0000 0000 0000 0000

−1 ÷ 25 −1 0xFFFF 1111 1111 1111 1111

−2 ÷ 25 −2 0xFFFE 1111 1111 1111 1110

−1000 −25,000 0x9E58 1001 1110 0101 1000

1 SENS_AVG[15:8] = 0x04, see Table 35.

ACCELEROMETERS

XACCL_OUT (see Table 13) contains x-axis accelerometer data

(aX in Figure 18), YACCL_OUT (see Table 14) contains y-axis

accelerometer data (aY in Figure 18), and ZACCL_OUT (see

Table 15) contains z-axis accelerometer data (aZ in Figure 18).

Table 16 illustrates the accelerometer data format with numerical

examples.

Table 13. XACCL_OUT (Base Address = 0x0A), Read Only

Bits Description

[15:0] X-axis acceleration data, twos complement format,

1200 LSB/g, 0 g = 0x0000

Table 14. YACCL_OUT (Base Address = 0x0C), Read Only

Bits Description

[15:0] Y-axis acceleration data, twos complement format,

1200 LSB/g, 0 g = 0x0000

Table 15. ZACCL_OUT (Base Address = 0x0E), Read Only

Bits Description

[15:0] Z-axis acceleration data, twos complement format,

1200 LSB/g, 0 g = 0x0000

Table 16. Acceleration, Twos Complement Format

Acceleration (g) Decimal Hex Binary

+18 +21,600 0x5460 0101 0100 0101 0000

+2 ÷ 1200 +2 0x0002 0000 0000 0000 0010

+1 ÷ 1200 +1 0x0001 0000 0000 0000 0001

0 0 0x0000 0000 0000 0000 0000

−1 ÷ 1200 −1 0xFFFF 1111 1111 1111 1111

−2 ÷ 1200 −2 0xFFFE 1111 1111 1111 1110

−18 −21,600 0xABA0 1010 1011 1010 0000

ADIS16448 Data Sheet

Rev. H | Page 14 of 26

Y-AXIS X-AXIS

Z-AXIS

09946-206

Figure 18. Inertial Sensor Direction Reference

MAGNETOMETERS

XMAGN_OUT (see Table 17) contains x-axis magnetometer

data (mX in Figure 18), YMAGN_OUT (see Table 18) contains

y-axis magnetometer data (mY in Figure 18), and ZMAGN_OUT

(see Table 19) contains z-axis magnetometer data (mZ in Figure 18).

Table 20 illustrates the magnetometer data format with numerical

examples. The lower four bits of each magnetometer output

data register (xMAGN_OUT[3:0]) are not active at the maximum

update rate of 51.2 SPS. They become active when using

SMPL_PRD[12:8] to average and decimate the data. The number

of bits that become active is equal to the decimation setting

number in SMPL_PRD[12:8]. For example, if SMPL_PRD[15:8] =

0x02, xMAGN_OUT[15:2] are active and xMAGN_OUT[1:0]

are inactive.

Table 17. XMAGN_OUT (Base Address = 0x10), Read Only

Bits

Description

[15:0] X-axis magnetic field intensity data, ±1.9 gauss

twos complement, 7 LSB/mgauss, 0x0000 = 0 mgauss

Table 18. YMAGN_OUT (Base Address = 0x12), Read Only

Bits Description

[15:0] Y-axis magnetic field intensity data, ±1.9 gauss

twos complement, 7 LSB/mgauss, 0x0000 = 0 mgauss

Table 19. ZMAGN_OUT (Base Address = 0x14), Read Only

Bits Description

[15:0] Z-axis magnetic field intensity data, ±1.9 gauss

twos complement, 7 LSB/mgauss, 0x0000 = 0 mgauss

Table 20. Magnetometer, Twos Complement Format

Magnetic Field

(mgauss) Decimal Hex Binary

+1900

+13,300

0x33F4

0011 0011 1111 0100

+2 ÷ 7 +2 0x0002 0000 0000 0000 0010

+1 ÷ 7 +1 0x0001 0000 0000 0000 0001

0 0 0x0000 0000 0000 0000 0000

+1 ÷ 7 −1 0xFFFF 1111 1111 1111 1111

+2 ÷ 7 −2 0xFFFE 1111 1111 1111 1110

−1900 −13,300 0xCC0C 1100 1100 0000 1100

BAROMETRIC PRESSURE

BARO_OUT (see Table 21) contains the barometric pressure

data. Table 22 provides several numerical format examples for

BARO_OUT.

Table 21. BARO_OUT (Base Address = 0x16), Read Only

Bits Description

[15:0] Barometric pressure data, binary data format,

20 µbar per LSB, 0x0000 = 0 mbar

Table 22. Pressure, Binary, BARO_OUT

Pressure Decimal Hex Binary

1200 mbar 60,000 0xEA60 1110 1010 0110 0000

1100 mbar 55,000 0xD6D8 1101 0110 1101 1000

1000 mbar 50,000 0xC350 1100 0011 0101 0000

0.04 mbar 2 0x0002 0000 0000 0000 0010

0.02 mbar 1 0x0001 0000 0000 0000 0001

0 mbar 0 0x0000 0000 0000 0000 0000

Data Sheet ADIS16448

Rev. H | Page 15 of 26

REMOTE PRESSURE SENSING

The ADIS16448 package offers a threaded hole (10-32) to

support remote pressure sensing. Figure 19 provides an example

of a fitting, which mates this hole to a barbed interface that

enables a tight connection with rubber tubing (1/8˝).

09946-219

Figure 19. Barb Fitting for Remote Pressure Sensing

INTERNAL TEMPERATURE

The internal temperature measurement data loads into the

TEMP_OUT (see Table 23) register. Table 24 illustrates the

temperature data format. Note that this temperature represents

an internal temperature reading, which does not precisely

represent external conditions. The intended use of TEMP_OUT

is to monitor relative changes in temperature.

Table 23. TEMP_OUT (Base Address = 0x18), Read Only

Bits

Description

[15:12] Not used

[11:0] Twos complement, 0.07386°C/LSB, 31°C = 0x000

Table 24. Temperature, Twos Complement Format

Temperature (°C) Decimal Hex Binary

+105 +1002 3EA 0011 1110 1010

+85 +731 2DB 0010 1101 1011

+31.14772 +2 2 0000 0000 0010

+31.07386 +1 0 0000 0000 0001

+31 0 0 0000 0000 0000

+30.92614 −1 FFF 1111 1111 1111

+30.85228 −2 FFE 1111 1111 1110

−40 −962 C3E 1100 0011 1110

ADIS16448 Data Sheet

Rev. H | Page 16 of 26

SYSTEM FUNCTIONS

GLOBAL COMMANDS

The GLOB_CMD register in Table 25 provides trigger bits

for software reset, flash memory management, and calibration

control. Start each of these functions by writing a 1 to the

assigned bit in GLOB_CMD. After completing the task, the bit

automatically returns to 0. For example, set GLOB_CMD[7] = 1

(DIN = 0xBE80) to initiate a software reset. Set GLOB_CMD[3] =

1 (DIN = 0xBE08) to back up the user register contents in

nonvolatile flash. This sequence includes loading the control

registers with the data in their respective flash memory

locations prior to producing new data.

Table 25. GLOB_CMD (Base Address = 0x3E), Write Only

Bits Description (Default = 0x0000)

[15:8] Not used

7 Software reset

[6:4] Not used

3 Flash update

2 Not used

1 Factory calibration restore

0 Gyroscope bias correction

PRODUCT IDENTIFICATION

The PROD_ID register in Table 28 contains the binary equivalent

of 16,448. It provides a product specific variable for systems that

need to track this in their system software. The LOT_ID1 and

LOT_ID2 registers in Table 26 and Table 27 combine to provide

a unique, 32-bit lot identification code. The SERIAL_NUM

the serial number on the device label. The assigned serial

numbers in SERIAL_NUM are lot specific.

Table 26. LOT_ID1 (Base Address = 0x52), Read Only

Bits Description

[15:0] Lot identification, binary code

Table 27. LOT_ID2 (Base Address = 0x54), Read Only

Bits Description

[15:0] Lot identification, binary code

Table 28. PROD_ID (Base Address = 0x56), Read Only

Bits Description (Default = 0x4040)

[15:0] Product identification = 0x4040

Table 29. SERIAL_NUM (Base Address = 0x58), Read Only

Bits Description

[15:12] Reserved

[11:0] Serial number, 1 to 4094 (0xFFE)

SELF-TEST FUNCTION

The MSC_CTRL register in Table 30 provides a self-test

function for the gyroscopes, accelerometers, magnetometers,

and barometers. Note that the magnetometer results assume

that the nonearth magnetic fields are low, in comparison to the

magnetic field of the earth. This function allows the user to

verify the mechanical integrity of each MEMS sensor. When

enabled, the self test applies an electrostatic force to each internal

sensor element, which causes them to move. The movement in

each element simulates its response to actual rotation/acceleration

and generates a predictable electrical response in the sensor

outputs. Set MSC_CTRL[10] = 1 (DIN = 0xB504) to activate

the internal self test routine, which compares the response to an

expected range of responses and reports a pass/fail response to

DIAG_STAT[5]. If this is high, review DIAG_STAT[15:10] to

identify the failing sensor.

Table 30. MSC_CTRL (Base Address = 0x34), Read/Write

Bits Description (Default = 0x0006)

[15:12] Not used

11 Checksum memory test (cleared upon completion)1

1 = enabled, 0 = disabled

10 Internal self test (cleared upon completion)1

1 = enabled, 0 = disabled

[9:8] Do not use, always set to 00

7 Not used

6 Point of percussion, see Figure 23

1 = enabled, 0 = disabled

5 Not used

4 CRC-16 code for burst mode

1 = include the CRC-16 code in burst read output

sequence

0 = do not include the CRC-16 code in burst read

output sequence

3 Not used

2 Data ready enable

1 = enabled, 0 = disabled

1 Data ready polarity

1 = active high when data is valid

0 = active low when data is valid

0 Data ready line select

1 = DIO2, 0 = DIO1

1 The bit is automatically reset to 0 after finishing the test.

Data Sheet ADIS16448

Rev. H | Page 17 of 26

STATUS/ERROR FLAGS

The DIAG_STAT register in Table 31 provides error flags for

a number of functions. Each flag uses 1 to indicate an error

condition and 0 to indicate a normal condition. Reading this

all of the bits to 0 for monitoring future operation. If the error

condition remains, the error flag returns to 1 at the conclusion

of the next sample cycle. The SPI communication error flag in

DIAG_STAT[3] indicates that the number of SCLKs in a SPI

sequence did not equal a multiple of 16 SCLKs.

Table 31. DIAG_STAT (Base Address = 0x3C), Read Only

Bits Description (Default = 0x0000)

15 Z-axis accelerometer self-test failure

1 = fail, 0 = pass

14 Y-axis accelerometer self-test failure

1 = fail, 0 = pass

13 X-axis accelerometer self-test failure

1 = fail, 0 = pass

12 Z-axis gyroscope self-test failure

0 = pass

11 Y-axis gyroscope self-test failure

1 = fail, 0 = pass

10 X-axis gyroscope self-test failure

1 = fail, 0 = pass

9 Alarm 2 status

1 = active, 0 = inactive

8 Alarm 1 status

1 = active, 0 = inactive

7 New data, xMAGN_OUT/BARO_OUT

6 Flash test, checksum flag

1 = fail, 0 = pass

5 Self-test diagnostic error flag

1 = fail, 0 = pass

4 Sensor overrange

1 = overrange, 0 = normal

3 SPI communication failure

1 = fail, 0 = pass

2 Flash update failure

1 = fail, 0 = pass

1 Barometer functional test

1 = fail, 0 = pass

0 Magnetometer functional test

1 = fail, 0 = pass

Magnetometer/Barometer New Data Indicator

DIAG_STAT[7] indicates that all four registers have new,

unread data in them. This bit rises to 1 after the xMAGN_OUT

and BARO_OUT registers have new data updates. It lowers to

zero after one of the registers are accessed using a SPI-driven

read command. This bit does not return to zero after reading

DIAG_STAT.

MEMORY MANAGEMENT

The FLASH_CNT register in Table 32 provides a 16-bit counter

that helps track the number of write cycles to the nonvolatile flash

memory. The flash updates every time a manual flash update

occurs. A manual flash update is initiated by the GLOB_CMD[3]

bit and is performed at the completion of the GLOB_CMD[1:0]

functions (see Table 25).

Table 32. FLASH_CNT (Base Address = 0x00), Read Only

Bits Description

[15:0] Binary counter

Checksum Test

Set MSC_CTRL[11] = 1 (DIN = 0xB508) to perform a check-

sum test of the internal program memory. This function takes

a summation of the internal program memory and compares it

with the original summation value for the same locations (from

factory configuration). If the sum matches the correct value,

DIAG_STAT[6] is equal to 0. If it does not match, DIAG_STAT[6]

is equal to 1. Make sure that the power supply is within

specification for the entire 20 ms that this function takes to

complete.

ADIS16448 Data Sheet

Rev. H | Page 18 of 26

INPUT/OUTPUT CONFIGURATION

DATA READY INDICATOR

The data ready indicator provides a signal that indicates

when the registers are updating, so that system processors can

avoid data collision, a condition when internal register updates

happen at the same time that an external processor requests it.

The data ready signal has valid and invalid states. Using the

transition from invalid to valid to trigger an interrupt service

routine provides the most time for data acquisition (before the

next register update). See Figure 4 and Tabl e 2 for specific

timing information. MSC_CTRL[2:0] (see Tabl e 30) provide

control bits for enabling this function, selecting the polarity

of the valid state and I/O line assignment (DIO1, DIO2). The

factory default setting of MSC_CTRL[2:0] = 110 (DIN =

0xB406) establishes DIO1 as a data ready output line and assigns

the valid state with a logic high (1). Set MSC_CTRL[2:0] = 100

(DIN = 0xB404) to change the polarity of the data ready signal on

DIO1 for interrupt inputs that require negative logic inputs for

activation.

GENERAL-PURPOSE INPUT/OUTPUT

DIO1, DIO2, DIO3, and DIO4 are configurable, general-purpose

input/output lines that serve multiple purposes. The data

ready controls in MSC_CTRL[2:0] have the highest priority

for configuring DIO1 and DIO2. The alarm indicator controls in

ALM_CTRL[2:0] have the second highest priority for configuring

DIO1 and DIO2. The external clock control associated with

SMPL_PRD[0] has the highest priority for DIO4 configuration

(see Tabl e 34). GPIO_CTRL in Table 33 has the lowest priority

for configuring DIO1, DIO2, and DIO4, and has absolute

control over DIO3.

Table 33. GPIO_CTRL (Base Address = 0x32), Read/Write

Bits Description (Default = 0x0000)

[15:12] Not used

11 General-Purpose I/O Line 4 (DIO4) data level

10 General-Purpose I/O Line 3 (DIO3) data level

9 General-Purpose I/O Line 2 (DIO2) data level

8 General-Purpose I/O Line 1 (DIO1) data level

[7:4] Not used

3 General-Purpose I/O Line 4 (DIO4) direction control

1 = output, 0 = input

2 General-Purpose I/O Line 3 (DIO3) direction control

1 = output, 0 = input

1 General-Purpose I/O Line 2 (DIO2) direction control

1 = output, 0 = input

0 General-Purpose I/O Line 1 (DIO1) direction control

1 = output, 0 = input

Example Input/Output Configuration

For example, set GPIO_CTRL[3:0] = 0100 (DIN = 0xB204)

to set DIO3 as an output signal pin and DIO1, DIO2, and

DIO4 as input signal pins. Set the output on DIO3 to 1 by

setting GPIO_CTRL[10] = 1 (DIN = 0xB304). Then, read

GPIO_CTRL[7:0] (DIN = 0x3200) and mask off GPIO_CTRL[9:8]

and GPIO_CTRL[11] to monitor the digital signal levels on

DIO4, DIO2, and DIO1.

Data Sheet ADIS16448

Rev. H | Page 19 of 26

DIGITAL PROCESSING CONFIGURATION

GYROSCOPES/ACCELEROMETERS

Figure 21 provides a diagram that describes all signal-processing

components for the gyroscopes and accelerometers. The internal

sampling system produces new data in the xGYRO_OUT and

xACCL_OUT output data registers at a rate of 819.2 SPS. The

SMPL_PRD register in Table 34 provides two functional controls

that affect sampling and register update rates. SMPL_PRD[12:8]

provides a control for reducing the update rate, using an averaging

filter with a decimated output. These bits provide a binomial

control that divides the data rate by a factor of 2 every time this

number increases by 1. For example, set SMPL_PRD[15:8] =

0x04 (DIN = 0xB704) to set the decimation factor to 16. This

reduces the update rate to 51.2 SPS and the bandwidth to

~25 Hz. The SMPL_PRD[12:8] setting affects the update rate

for the TEMP_OUT register (see Table 23) as well.

Table 34. SMPL_PRD (Base Address = 0x36), Read/Write

Bits Description (Default = 0x0001)

[15:13] Not used

[12:8] D, decimation rate setting, binomial, see Figure 21

[7:1] Not used

0 Clock

1 = internal sampling clock, 819.2 SPS

0 = external sampling clock

INPUT CLOCK CONFIGURATION

SMPL_PRD[0] (see Table 34) provides a control for synchro-

nizing the internal sampling to an external clock source. Set

SMPL_PRD[0] = 0 (DIN = 0xB600) and GPIO_CTRL[3] = 0

(DIN = 0xB200) to enable the external clock. See Table 2 and

Figure 4 for timing information.

Digital Filtering

The SENS_AVG register in Table 35 provides user controls for

the low-pass filter. This filter contains two cascaded averaging

filters that provide a Bartlett window, FIR filter response (see

Figure 20). For example, set SENS_AVG[2:0] = 100 (DIN = 0xB804)

to set each stage to 16 taps. When used with the default sample

rate of 819.2 SPS and zero decimation (SMPL_PRD[15:8] = 0x00),

this value reduces the sensor bandwidth to approximately 16 Hz.

–20

–40

–60

–80

–100

–120

–140

0.001 0.01 0.1 1

MAG NITUDE ( dB)

FREQUENCY (

)

N = 2

N = 4

N = 16

N = 64

09946-018

Figure 20. Bartlett Window, FIR Filter Frequency Response

(Phase Delay = N Samples)

Dynamic Range

The SENS_AVG[10:8] bits provide three dynamic range

settings for the gyroscopes. The lower dynamic range settings

(±250°/sec and ±500°/sec) limit the minimum filter tap sizes

to maintain resolution. For example, set SENS_AVG[10:8] =

010 (DIN = 0xB902) for a measurement range of ±500°/sec.

Because this setting can influence the filter settings, program

SENS_AVG[10:8] before programming SENS_AVG[2:0] if more

filtering is required.

Table 35. SENS_AVG (Base Address = 0x38), Read/Write

Bits Description (Default = 0x0402)

[15:11] Not used

[10:8] Measurement range (sensitivity) selection

100 = ±1000°/sec (default condition)

010 = ±500°/sec, filter taps ≥ 4 (Bits[2:0] ≥ 0x02)

001 = ±250°/sec, filter taps ≥ 16 (Bits[2:0] ≥ 0x04)

[7:3] Not used

[2:0] Filter Size Variable B

Number of taps in each stage; NB = 2B

See Figure 20 for filter response

ADIS16448 Data Sheet

Rev. H | Page 20 of 26

MEMS

SENSOR

LOW-PASS

FILTER

330Hz

CLOCK

819.2SPS

ADC

BARTLETT WINDOW

FIR FILTER

AVERAGE/

DECIMATION

FILTER

EXTERNAL CLOCK E NABLED

BY SMPL_PRD[0] = 0

GYROSCOPES

LOW-PASS , TWO - P OLE ( 404Hz , 757Hz)

ACCELEROMETERS

LOW-PASS, SINGL E-PO L E (330Hz)

B = SENS_AVG[2:0]

NB = 2B

NB = NUMBER OF TAPS

(PER STAGE)

D = SMP L_PRD[ 12: 8]

ND = 2D

ND = NUMBER OF TAPS

÷ND

x(n)

n = 1

1NB

NBx(n)

n = 1

1NB

NBx(n)

n = 1

1ND

09946-019

Figure 21. Sampling and Frequency Response Block Diagram

MAGNETOMETER/BAROMETER

The magnetometer (xMAGN_OUT) and barometer output

registers (BARO_OUT) update at a rate of 51.2 SPS. When

using the external clock, these registers update at a rate of 1/16th

of the input clock frequency. The update rates for the magne-

tometer and barometers do not change with the SMPL_PRD

[15:8] register settings, unless SMPL_PRD[15:8] > 0x04.

New Data Indicators

DIAG_STAT[7] (see Table 31) offers a new data bit for the

magnetometer (xMAGN_OUT) and barometer output registers

(BARO_OUT) registers. This bit rises to a 1, right after the

xMAGN_OUT and BARO_OUT registers receive fresh data.

It returns to 0 after one of the four registers experiences a read

request.

The SEQ_CNT register (see Table 36) provides a counter

function to help determine when there is new data in the

magnetometer and barometer registers. When using the full

sample rate (SMPL_PRD[15:8] = 0x00), SEQ_CNT starts at

a value of 16 and decrements every time the gyroscope data

updates. When it reaches a value of 1, it returns to a value

16 after the next gyroscope update cycle. When SEQ_CNT

equals 16, the magnetometer (xMAGN_OUT) and barometer

(BARO_OUT) registers contain new data. The SEQ_CNT

read loops for new data in both magnetometer and barometer

outputs. When beginning a continuous read loop, read SEQ_CNT

to determine the number of sample cycles that must pass, before

the magnetometer and barometer registers update.

Table 36. SEQ_CNT (Base Address = 0x3A), Read Only

Bits Description

[15:11] Don’t care

[6:0] Binary counter: 16 to 1, when D = 0

Counter range = 16/2D – 1, when 1 ≤ D ≤ 4

See Table 34 for more information on D

Data Sheet ADIS16448

Rev. H | Page 21 of 26

CALIBRATION

The mechanical structure and assembly process of the ADIS16448

provide excellent position and alignment stability for each sensor,

even after subjected to temperature cycles, shock, vibration, and

other environmental conditions. The factory calibration includes a

dynamic characterization of each gyroscope and accelerometer over

temperature and generates sensor specific correction formulas.

GYROSCOPES

The XGYRO_OFF (see Table 37), YGYRO_OFF (see Table 38),

and ZGYRO_OFF (see Table 39) registers provide user-

programmable bias adjustment function for the X-, Y-, and

Z-axis gyroscopes, respectively. Figure 22 illustrates that they

contain bias correction factors that adjust to the sensor data

immediately before it loads into the output register.

xGYRO_OFF

xACCL_OFF

MEMS

SENSOR ADC FACTORY

CALIBRATION

AND

FILTERING

xGYRO_OUT

xACCL_OUT

09946-020

Figure 22. User Calibration, Gyroscopes, and Accelerometers

Gyroscope Bias Error Estimation

Any system level calibration function must start with an estimate

of the bias errors, which typically comes from a sample of gyro-

scope output data, when the device is not in motion. The sample

size of data depends on the accuracy goals. Figure 7 provides a

trade-off relationship between averaging time and the expected

accuracy of a bias measurement. Vibration, thermal gradients, and

power supply instability can influence the accuracy of this process.

Table 37. XGYRO_OFF (Base Address = 0x1A), Read/Write

Bits Description (Default = 0x0000)

[15:0] X-axis, gyroscope offset correction factor,

twos complement, 0.01°/sec/LSB, 0°/sec = 0x0000

Table 38. YGYRO_OFF (Base Address = 0x1C), Read/Write

Bits Description (Default = 0x0000)

[15:0] Y-axis, gyroscope offset correction factor,

twos complement, 0.01°/sec/LSB, 0°/sec = 0x0000

Table 39. ZGYRO_OFF (Base Address = 0x1E), Read/Write

Bits Description (Default = 0x0000)

[15:0] Z-axis, gyroscope offset correction factor,

twos complement, 0.01°/sec/LSB, 0°/sec = 0x0000

Gyroscope Bias Correction Factors

When the bias estimate is complete, multiply the estimate by −1

to change its polarity, convert it into digital format for the offset

correction registers (see Table 37, Table 38, and Table 39), and

write the correction factors to the correction registers. For

example, lower the X-axis bias by 10 LSB (0.1°/sec) by setting

XGYRO_OFF = 0xFFF6 (DIN = 0x9BFF, 0 x9AF6).

Single Command Bias Correction

GLOB_CMD[0] (see Tabl e 25) loads the xGYRO_OFF registers

with the values that are the opposite of the values that are in

xGYRO_OUT, at the time of initiation. Use this command,

together with the decimation filter (SMPL_PRD[12:8], see

Table 34), to automatically average the gyroscope data and

improve the accuracy of this function, as follows:

1. Set SENS_AVG[10:8] = 001 (DIN = 0xB901) to optimize

the xGYRO_OUT sensitivity to 0.01°/sec/LSB.

2. Set SMPL_PRD[12:8] = 0x10 (DIN = 0xB710) to set the

decimation rate to 65,536 (216), which provides an averaging

time of 80 seconds (65,536 ÷ 819.2 SPS).

3. Wait for 80 seconds while keeping the device motionless.

4. Set GLOB_CMD[0] = 1 (DIN = 0xBE01) and wait for the

time it takes to perform the flash memory backup.

ACCELEROMETERS

The XACCL_OFF (see Tabl e 40), YACCL_OFF (see Table 41),

and ZACCL_OFF (see Table 42) registers provide user

programmable bias adjustment function for the X-, Y-, and

Z-axis accelerometers, respectively. These registers adjust the

accelerometer data in the same manner as XGYRO_OFF in

Figure 22.

Table 40. XACCL_OFF (Base Address = 0x20), Read/Write

Bits Description (Default = 0x0000)

[15:0] X-axis, accelerometer offset correction factor,

twos complement, 1/1200 g/LSB, 0 g = 0x0000

Table 41. YACCL_OFF (Base Address = 0x22), Read/Write

Bits Description (Default = 0x0000)

[15:14] Not used

[13:0] Y-axis, accelerometer offset correction factor,

twos complement, 1/1200 g/LSB, 0 g = 0x0000

Table 42. ZACCL_OFF (Base Address = 0x24), Read/Write

Bits Description (Default = 0x0000)

[15:14] Not used

[13:0] Z-axis, accelerometer offset correction factor,

twos complement, 1/1200 g/LSB, 0 g = 0x0000

Accelerometer Bias Error Estimation

Under static conditions, orient each accelerometer in positions

where the response to gravity is predictable. A common approach

to this is to measure the response of each accelerometer when

they are oriented in peak response positions, that is, where ±1 g

is the ideal measurement position. Next, average the +1 g and

−1 g accelerometer measurements together to estimate the

residual bias error. Using more points in the rotation can

improve the accuracy of the response.

ADIS16448 Data Sheet

Rev. H | Page 22 of 26

Accelerometer Bias Correction Factors

When the bias estimate is complete, multiply the estimate by

−1 to change its polarity, convert it to the digital format for the

offset correction registers (see Table 40, Table 41 or Table 42)

and write the correction factors to the correction registers. For

example, lower the x-axis bias by 12 LSB (10 mg) by setting

XACCL_OFF = 0xFFF4 (DIN = 0xA1FF, 0xA0F4).

Point of Percussion Alignment

Set MSC_CTRL[6] = 1 (DIN = 0xB446) to enable this feature

and maintain the factory default settings for DIO1. This feature

performs a point of percussion translation to the point identified

in Figure 23. See Table 30 for more information on MSC_CTRL.

09946-119

ORIGINALIGNMENT

REF E RENCE P OI NT

SEE MSC_CT RL[6].

Figure 23. Point of Percussion Physical Reference

MAGNETOMETER CALIBRATION

The ADIS16448 provides registers that contribute to both hard

iron and soft iron correction factors, as shown in Figure 24.

ADC xMAGN_OUT

MAGNETIC

SENSOR

FACTORY

CALIBRATION

AND FILTERING

1 + xMAG N_S IC

xMAGN_HIC

09946-022

Figure 24. Hard Iron and Soft Iron Factor Correction

Hard Iron Correction

The XMAGN_HIC (see Table 43), YMAGN_HIC (see

Table 44), and ZMAGN_HIC (see Table 45) registers provide

the user programmable bias adjustment function for the X-, Y-,

and Z-axis magnetometers, respectively. Hard iron effects result

in an offset of the magnetometer response.

Table 43. XMAGN_HIC (Base Address = 0x26), Read/Write

Bits Description (Default = 0x0000)

[15:0] X-axis hard iron correction factor,

twos complement, 7 LSB/mgauss, 0x0000 = 0

Table 44. YMAGN_HIC (Base Address = 0x28), Read/Write

Bits Description (Default = 0x0000)

[15:0]

Y-axis hard iron correction factor,

twos complement, 7 LSB/mgauss, 0x0000 = 0

Table 45. ZMAGN_HIC (Base Address = 0x2A), Read/Write

Bits Description (Default = 0x0000)

[15:0] Z-axis hard iron correction factor,

twos complement, 7 LSB/mgauss, 0x0000 = 0 mgauss

Hard Iron Factors

When the hard iron error estimation is complete, take the

following steps:

1. Multiply the estimate by −1 to change its polarity.

2. Convert it into digital format for the hard iron correction

registers (see Table 43).

3. Write the correction factors to the registers. For example,

lower the x-axis bias by 10 LSB (~1.429 mgauss) by setting

XMAGN_HIC = 0xFFF6 (DIN = 0xA7FF, 0xA6F6)

Soft Iron Effects

The XMAGN_SIC (see Table 46), YMAGN_SIC (see Table 47),

and ZMAGN_SIC (see Table 48) registers provide an adjustment

variable for the magnetometer sensitivity adjustment in each

magnetometer response to simplify the process of performing a

system level soft iron correction.

Table 46. XMAGN_SIC (Base Address = 0x2C), Read/Write

Bits Description (Default = 0x8000)

[15:0] X-axis soft iron correction factor,

twos complement format, 1 LSB = 100%/32,767

0x7FFF = 100% increase (2×),

0x8000 = 100% decrease (0×)

Table 47. YMAGN_SIC (Base Address = 0x2E), Read/Write

Bits Description (Default = 0x8000)

[15:0] Y-axis soft iron correction factor,

twos complement format, 1 LSB = 100%/32,767

0x7FFF = 100% increase (2×),

0x8000 = 100% decrease (0×)

Table 48. ZMAGN_SIC (Base Address = 0x30), Read/Write

Bits Description (Default = 0x8000)

[15:0] Z-axis soft iron correction factor,

twos complement format, 1 LSB = 100%/32,767

0x7FFF = 100% increase (2×),

0x8000 = 100% decrease (0×)

Data Sheet ADIS16448

Rev. H | Page 23 of 26

FLASH UPDATES

When using the user calibration registers to optimize system

level accuracy, set GLOB_CMD[3] = 1 (DIN = 0xBE04) to save

these settings in nonvolatile flash memory. Be sure to consider

the endurance rating of the flash memory when determining how

often to update the user correction factors in the flash memory.

RESTORING FACTORY CALIBRATION

Set GLOB_CMD[1] = 1 (DIN = 0xBE02) to execute the factory

calibration restore function, which resets the gyroscope and accel-

erometer offset registers to 0x0000 and all sensor data to 0. Then, it

automatically updates the flash memory and restarts sampling and

processing data. See Table 25 for information on GLOB_CMD.

ADIS16448 Data Sheet

Rev. H | Page 24 of 26

ALARMS

Alarm 1 and Alarm 2 provide two independent alarms with

programmable levels, polarity, and data sources.

STATIC ALARM USE

The static alarms setting compares the data source selection

(ALM_CTRL[15:8]) with the values in the ALM_MAGx registers

listed in Table 49 and Table 50, using ALM_MAGx[15] to

determine the trigger polarity. The data format in these registers

matches the format of the data selection in ALM_CTRL[15:8].

See Table 54, Alarm 1, for a static alarm configuration example.

Table 49. ALM_MAG1 (Base Address = 0x40), Read/Write

Bits Description (Default = 0x0000)

[15:0] Threshold setting; matches for format of

ALM_CTRL[11:8] output register selection

Table 50. ALM_MAG2 (Base Address = 0x42), Read/Write

Bits Description (Default = 0x0000)

[15:0] Threshold setting; matches for format of

ALM_CTRL[15:12] output register selection

DYNAMIC ALARM USE

The dynamic alarm setting monitors the data selection for a

rate-of-change comparison. The rate-of-change comparison is

represented by the magnitude in the ALM_MAGx registers over

the time represented by the number-of-samples setting in the

ALM_SMPLx registers, located in Table 51 and Table 52. See

Table 54, Alarm 2, for a dynamic alarm configuration example.

Table 51. ALM_SMPL1 (Base Address = 0x44), Read/Write

Bits Description (Default = 0x0000)

[15:8] Not used

[7:0] Binary, number of samples (both 0x00 and 0x01 = 1)

Table 52. ALM_SMPL2 (Base Address = 0x46), Read/Write

Bits Description (Default = 0x0000)

[15:8] Not used

[7:0] Binary, number of samples (both 0x00 and 0x01 = 1)

ALARM REPORTING

The DIAG_STAT[9:8] bits provide error flags that indicate an

alarm condition. The ALM_CTRL[2:0] bits provide controls for

a hardware indicator using DIO1 or DIO2.

Table 53. ALM_CTRL (Base Address = 0x48), Read/Write

Bits Description (Default = 0x0000)

[15:12] Alarm 2 data source selection

0000 = disable

0001 = XGYRO_OUT

0010 = YGYRO_OUT

0011 = ZGYRO_OUT

0100 = XACCL_OUT

0101 = YACCL_OUT

0110 = ZACCL_OUT

0111 = XMAGN_OUT

1001 = YMAGN_OUT

1010 = ZMAGN_OUT

1011 = BARO_OUT

1100 = TEMP_OUT

[11:8] Alarm 1 data source selection (same as Alarm 2)

7 Alarm 2, dynamic/static (1 = dynamic, 0 = static)

6 Alarm 1, dynamic/static (1 = dynamic, 0 = static)

5 Alarm 2, polarity (1 = greater than ALM_MAG2)

4 Alarm 1, polarity (1 = greater than ALM_MAG1)

3 Data source filtering (1 = filtered, 0 = unfiltered)

2 Alarm indicator (1 = enabled, 0 = disabled)

1 Alarm indicator active polarity (1 = high, 0 = low)

0 Alarm output line select (1 = DIO2, 0 = DIO1)

Alarm Example

Table 54 offers an example that configures Alarm 1 to trigger when

filtered ZACCL_OUT data drops below 0.7 g and Alarm 2 to

trigger when filtered ZGYRO_OUT data changes by more than

50°/sec over a 100 ms period, or 500°/sec2. The filter setting

helps reduce false triggers from noise and refines the accuracy

of the trigger points. The ALM_SMPL2 setting of 82 samples

provides a comparison period that is approximately equal to

100 ms for an internal sample rate of 819.2 SPS.

Table 54. Alarm Configuration Example

DIN Description

0xC936, ALM_CTRL = 0x36AF

0xC8AF Alarm 2: dynamic, Δ-ZGYRO_OUT

(Δ-time, ALM_SMPL2) > ALM_MAG2

Alarm 1: static, ZACCL_OUT < ALM_MAG1, filtered data

DIO2 output indicator, positive polarity

0xC313,

0xC288

ALM_MAG2 = 0x04E2 = 1,250 LSB = 50°/sec

0xC10A,

0xC0F0

ALM_MAG1 = 0x0348 = 840 LSB = +0.7 g

0xC652 ALM_SMPL2[7:0] = 0x52 = 82 samples

82 samples ÷ 819.2 SPS = ~100 ms

Data Sheet ADIS16448

Rev. H | Page 25 of 26

APPLICATIONS INFORMATION

MOUNTING TIPS

The mounting and installation process can influence gyroscope

bias repeatability and other key parametric behaviors. To

preserve the best performance, use the following guidelines

when developing an attachment approach for the ADIS16448:

• Focus mounting force at the machine screw locations.

• Avoid direct force application on the substrate.

• Avoid placing mounting pressure on the package lid,

except for the edges that border the exposed side of the

substrate.

• Use a consistent mounting torque of 28 inch-ounces on

mounting hardware.

• Avoid placing translational forces on the electrical

connector.

For additional mounting ideas and tips, refer to the AN-1305

Application Note.

POWER SUPPLY CONSIDERATIONS

The power supply must be within 3.15 V and 3.45 V for normal

operation and optimal performance. During start up, the

internal power conversion system starts drawing current when

VDD reaches 1.6 V. The internal processor begins initializing

when VDD is equal to 2.35 V. After the processor starts, VDD

must reach 2.7 V within 128 ms. Also, make sure that the power

supply drops below 1.6 V to shut the device down. Figure 9

shows a 10 µF capacitor on the power supply. Using this

capacitor supports optimal noise performance in the sensors.

ADIS16IMU2/PCBZ

The ADIS1644X/FLEX and ADIS16IMU2/PCBZ accessories

provide a simplified method for connecting to an embedded

processor platform or to the E VAL-ADIS2 evaluation system.

Figure 26 provides a mechanical design example for using these

two components with the ADIS16448 inertial measurement

unit (IMU) in a system.

Figure 25 provides the pin assignments for J1 on the

ADIS16IMU2/PCBZ breakout board.

1RST 2SCLK

3CS 4DOUT

5DNC 6DIN

7GND 8GND

9GND 10 VDD

11VDD 12 VDD

13DIO1 14 DIO2

15DIO3 16 DIO4/CLKIN

09946-211

Figure 25. J1Pin Assignments for the ADIS16IMU2/PCBZ

The C1 and C2 locations on the ADIS16IMU2/PCBZ provide

users with the pads to install 10 µF of capacitance across VDD

and GND, which Figure 9 recommends for best performance.

PC-BASED EVALUATION TOOLS

The EVA L -ADIS2 supports PC-based evaluation of the

ADIS16448. Refer to the EVAL-ADIS2 Evaluation System Wiki

Guide for more information on connecting the ADIS16448 to

the E VA L-ADIS2 system.

X-RAY SENSITIVITY

Exposure to high dose rate X-rays, such as those in production

systems that inspect solder joints in electronic assemblies, may

affect accelerometer bias errors. For optimal performance, avoid

exposing the ADIS16448 to this type of inspection.

ADIS16448BMLZ

ADIS16IMU2/PCBZ

(I NTERF ACE BOARD)

33.40mm 23.75mm

20.15mm

30.10mm

10.07mm

15.05mm

NOTES

1. US E FO UR M 2 M ACHINE S CRE WS T O AT TACH THE ADIS16448.

2. US E FO UR M 3 M ACHINE S CRE WS T O AT TACH THE INT E RFACE PCB.

ADIS1644X/FLEX

(FLEXIBILE CONNECTOR/CABLE)

15mm TO

45mm

09946-021

Figure 26. Physical Diagram for ADIS16448 Accessories

ADIS16448 Data Sheet

Rev. H | Page 26 of 26

OUTLINE DIMENSIONS

03-14-2013-D

TOP VIEW SIDE VIEW

33.40

BSC

30.10

BSC

19.55 BS C

12.50 BS C

0.66

BSC

2.00 BS C

2.30 BS C

(2 PLCS)

2.30 BS C

(2 PLCS)

1.00

BSC

2.00

BSC

20.150

BSC

29.200

BSC

6.70

BSC

10-32 T HRE ADE D

HOLE

7.89

7.63

7.37

4.70

4.50

4.30

2.60

2.40 DIA.

2.20

38.08

37.70

37.32

24.53

24.15

23.77

END VIEW

2.84 BS C

(Pi n Hei ght )

5.18 BS C

(PCB to Connect or )

7.57

BSC

10.23

BSC

1.00 BS C

PITCH

11.10

10.80

10.50

2.96

2.70

2.44

Figure 27. 20-Lead Module with Connector Interface

(ML-20-2)

Dimensions shown in millimeters

ORDERING GUIDE

Model1, 2 Temperature Range Package Description Package Option

ADIS16448BMLZ −40°C to +105°C 20-Lead Module with Connector Interface ML-20-2

ADIS16448BMLZ-P −40°C to +105°C 20-Lead Module with Connector Interface ML-20-2

1 Z = RoHS Compliant Part.

2 The ADIS16448BMLZ-P includes Parylene-C coating on the internal substrate and components, which has a thickness of 0.001” (±20%), along with a connector that

has gold plating that is at least 0.00003 inches thick.

registered trademarks are the property of their respective owners.

D09946-0-1/19(H)