IRF7501PbF
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Parameter Min. Typ. Max. Units Conditions
ISContinuous Source Current MOSFET symbol
(Body Diode) showing the
ISM Pulsed Source Current integral reverse
(Body Diode) p-n junction diode.
VSD Diode Forward Voltage ––– ––– 1.2 V TJ = 25°C, IS = 1.7A, VGS = 0V
trr Reverse Recovery Time ––– 39 59 ns TJ = 25°C, IF = 1.7A
Qrr Reverse Recovery Charge ––– 37 56 nC di/dt = 100A/μs
Source-Drain Ratings and Characteristics
––– –––
––– ––– 19
1.25
A
S
D
G
Surface mounted on FR-4 board, t ≤10sec
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 10 )
ISD ≤ 1.7A, di/dt ≤ 66A/μs, VDD ≤ V(BR)DSS,
TJ ≤ 150°C
Notes:
Pulse width ≤ 300μs; duty cycle ≤ 2%
Parameter Min. Typ. Max. Units Conditions
V(BR)DSS Drain-to-Source Breakdown Voltage 20 ––– ––– V VGS = 0V, ID = 250μA
ΔV(BR)DSS/ΔTJBreakdown Voltage Temp. Coefficient ––– 0.041 ––– V/°C Reference to 25°C, ID = 1mA
––– 0.085 0.135 VGS = 4.5V, ID = 1.7A
––– 0.120 0.20 VGS = 2.7V, ID = 0.85A
VGS(th) Gate Threshold Voltage 0.70 ––– ––– V VDS = VGS, ID = 250μA
gfs Forward Transconductance 2.6 ––– ––– S VDS = 10V, ID = 0.85A
––– ––– 1.0 VDS = 16V, VGS = 0V
––– ––– 25 VDS = 16V, VGS = 0V, TJ = 125°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 12V
Gate-to-Source Reverse Leakage ––– ––– -100 VGS = -12V
QgTotal Gate Charge ––– 5.3 8.0 ID = 1.7A
Qgs Gate-to-Source Charge ––– 0.84 1.3 nC VDS = 16V
Qgd Gate-to-Drain ("Miller") Charge ––– 2.2 3.3 VGS = 4.5V, See Fig. 9
td(on) Turn-On Delay Time ––– 5.7 ––– VDD = 10V
trRise Time ––– 24 ––– ID = 1.7A
td(off) Turn-Off Delay Time ––– 15 ––– RG = 6.0Ω
tfFall Time ––– 16 ––– RD = 5.7Ω
Ciss Input Capacitance ––– 260 ––– VGS = 0V
Coss Output Capacitance ––– 130 ––– pF VDS = 15V
Crss Reverse Transfer Capacitance ––– 61 ––– ƒ = 1.0MHz, See Fig. 8
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
IGSS
μA
Ω
RDS(on) Static Drain-to-Source On-Resistance
IDSS Drain-to-Source Leakage Current
nA
ns