DocID15382 Rev 10 9/22
2N2907AHR Radiation hardness assurance
22
3 Radiation hardness assurance
The products guaranteed in radiation within the JANS system fully comply with the MIL-
PRF-19500/291 specification.
The products guaranteed in radiation within the ESCC system fully comply with the ESCC
5202/001 and ESCC 22900 specifications.
JANS radiation assurance
ST JANS parts guaranteed at 100 krad (Si), tested, in full compliancy with the MIL-PRF-
19500 specification, specifically the Group D, subgroup 2 inspection, between 50 and 300
rad/s. On top of the standard JANSR high dose rate by wafer lot guarantee, ST 2N2907AHR
series include an additional wafer by wafer 100 krad Low dose rate guarantee at 0.1 rad/s,
identical to the ESCC 100 krad guarantee. It is supported with the same Radiation
Verification Test report provided with each shipment. A brief summary of the standard High
Dose Rate by wafer lot JANSR guarantee is provided below:
– All test are performed in accordance to MIL-PRF-19500 and test method 1019 of
MIL-STD-750 for total Ionizing dose.
The table below provides for each monitored parameters of the test conditions and the
acceptance criteria
Table 6. MIL-PRF-19500 (test method 1019) post radiation electrical characteristics
Symbol Parameter Test conditions
Value
Unit
Min. Max.
ICBO
Collector to base
cutoff current
VCB = 60 20 µA
VCB = 50 V 20 nA
IEBO
Emitter to base
cutoff current
VEB = 5 V 20 µA
VEB = 4 V 100 nA
V(BR)CEO
Breakdown voltage,
collector to emitter IC = 10 mA 60 V
ICES
Collector to emitter
cutoff current VCE = 50 V 100 nA
hFE Forward-current
transfer ratio
VCE = 10 V; IC = 0.1 mA [37.5](1)
VCE = 10 V; IC = 1.0 mA [50](1) 400
VCE = 10 V; IC = 10 mA [50](1)
VCE = 10 V; IC = 150 mA [50](1) 300
VCE = 10 V; IC = 500 mA [25](1)
VCE(sat)
Collector-emitter
saturation voltage
IC = 150 mA; IB = 15 mA 0.46
V
IC = 500 mA; IB = 50 mA 1.84
VBE(sat)
Base-emitter
saturation voltage
IC = 150 mA; IB = 15 mA 0.6 1.5
V
IC = 500 mA; IB = 50 mA 3