L4411A-GSA - KEYSIGHT TECHNOLOGIES

Agilent L4411A

‘Low proﬁle’ 6½ Digit Multimeter

Leading the Industry in High-Performance

System Test

Product Overview

Agilent L4411A

6½-Digit High-

Performance DMM

• 50,000 readings/sec @ 4½ digits

direct to PC

• 10,000 readings/sec @ 5½ digits

direct to PC

• 1,000 readings/sec @ 6½ digits

direct to PC

• Analog level triggering

• Programmable pre/post triggering

• LAN extensions for instruments

(LXI), USB & GPIB standard

• 30 PPM 1 year basic DC accuracy

• DCV, ACV, DCI, ACI, 2-wire and

4-wire resistance, frequency,

period, and diode test

• Capacitance & temperature

measurements

• Expanded measurement ranges

Dramatic system performance

Whether it’s raw reading speed or

fast system throughput, the L4411A

sets a new benchmark in performance.

Using a new A/D technology, the

L4411A achieves an impressive

50,000 readings a second at 4½ digits,

and can stream readings to your

computer at this same speed!

Transactional I/O (single reading—

measurement and PC transfer time) is

3x faster than other popular modular

DMMs, significantly enhancing your

test throughput. Triggering is fast and

precise, with both trigger latency and

trigger jitter less than 1 µs, while bus

query response is less than 500 µs.

ACV measurements are faster as

well thanks to a digital measurement

technique that additionally improves

accuracy at high and low frequencies.

A new standard for modular

system DMMs

The L4411A 6½ digit high performance

DMM expands Agilent’s industry

leading offering of LXI system

products. For the test system integra-

tor looking for the next generation

modular DMM, this new meter offers

the industry’s best measurement

speed and throughput, a reduced size

(1 rack unit high), superior measure-

ment performance, and a choice of

computer interfaces, including LXI,

providing high performance, easy

to use, economical I/O. A simple

display, including ‘latest reading’

and LAN address, allows the system

integrator to quickly integrate and

debug the test system. And finally,

the DMM comes with a compatibility

mode, requiring little-to-no code

change to upgrade your test system

with next generation capabilities.

DMM dimensions (mm)

LXI—Class C

LAN Extensions for Instruments (LXI)

provides the next generation I/O for

system applications requiring high

throughput. Transfer rates of over

250,000 readings/sec are attainable

ensuring even the most data intensive

measurements are fast, without the

overhead cost of an instrument

mainframe. LXI provides a built-in

Graphical Web Interface that allows

you to interactively control the DMM

without the hassle of programming,

making it great for debugging your

system. The L4411A DMM is LXI —

Class C compliant.

Enhanced measurement

capabilities

The L4411A offers temperature and

capacitance capabilities in addition to

those measurements you have come

to expect such as DCV, ACV, DCI,

ACI, 2-wire and 4-wire resistance,

frequency, period and diode test. You

also get offset compensated Ohms,

allowing you to accurately measure

resistance in the presence of volt-

ages. Measurement ranges have been

expanded as well; for example, DC

and AC current ranges now go down

to 100 µA, resulting in 100 pA resolu-

tion. Real-time math and statistics are

included, and a peak-detect capability

allows you to capture peaks as short

as 20 µs.

System integration

When deciding on your next system

DMM you can’t go wrong with the

L4411A. Choose from LAN (LXI),

USB or GPIB interfaces, all standard

on the L4411A, to connect to your

computer. The 1U size is perfect

for space constrained applications

like aerospace/defense depot test.

Concerned about the viability of your

existing software programs? This

new DMM responds to standard

commands for programmable instru-

mentation (SCPI). Additionally there is

a 34401A/E1412A emulation mode to

ensure the easiest upgrade possible,

virtually eliminating costly software

and documentation changes. The

autoranging power supply allows

you to connect to any input power

without selecting input voltages or

changing fuses. Agilent’s I/O Library

Suite ships with the L4411A to help

you quickly establish an error-free

connection between your PC and

instrument. It provides robust instru-

ment control and works with the

software development environment

you choose.

Companion LXI switch modules

Need a switch to route your signal

to the L4411A? Consider Agilent’s

LXI switch modules. Choose from a

40-channel armature relay multiplexer

(L4421A), a dual/quad 4x8 reed relay

matrix (L4433A) or a 32-channel Form

A/C general purpose relay switch

module (L4437A). Additionally, Agilent

has LXI DAC, digital I/O and multi-

function modules to help complete

your test system requirements. All

from the leader in LXI instrumenta-

tion, Agilent Technologies.

Built to last

Our new DMM was designed to high

standards of ruggedness and reliabil-

ity. From the robust, compact package

to careful selection of components

and conservative circuit design, this

meter is built to last. Calculated mean

time between failure (MTBF) is in

excess of 100,000 hours. Backed by

a 1-year warranty and a worldwide

network of service centers, you can

buy with confidence.

Go to the web

For the latest information on these

or other Agilent DMMs, go to

www.agilent.com/find/dmm

DMM dimensions (mm)

212.3

363.2

40.9

Accuracy Speciﬁcations ± (% of reading + % of range) 1

1. Specifications are for 90 minute warm-up and 100 PLC.

2. Relative to calibration standards.

3. 20% overrange on all ranges, except DCV 1000 V, ACV 750 V, DCI and

ACI 3 A ranges.

4. For each additional volt over ± 500 V add 0.02 mV of error.

5. Specifications are for sinewave input > 0.3% of range and > 1 mVrms.

Add 30 µV error for frequencies below 1 kHz. 750 VAC range limited to 8 x 107

Volts-Hz. For each additional volt over 300 Vrms add 0.7 mVrms of error.

6. Specifications are for 4-wire resistance measurements, or 2-wire using

Math Null. Without Math Null, add 0.2 Ω additional error in 2-wire resistance

measurements.

7. Specifications are for sinewave input > 1% of range and > 10 µArms.

Frequencies > 5 kHz are typical for 1 A and 3 A ranges.

8. Specifications are for 1-hour warm-up using Math Null. Additional errors may

occur for non-film capacitors.

9. For total measurement accuracy, add temperature probe error.

10. Accuracy specifications are for the voltage measured at the input terminals only.

1 mA test current is typical. Variation in the current source will create some

variation in the voltage drop across a diode junction.

Function Range 3 Frequency,

test current or

burden voltage

24 hour 2

Tcal ±1°C

90 day

Tcal ±5°C

1 year

Tcal ±5°C

Temperature coefﬁcient/°C

0 °C to (Tcal -5°C)

(Tcal +5°C) to 55°C

DC voltage 100.0000 mV 0.0030 + 0.0030 0.0040 + 0.0035 0.0050 + 0.0035 0.0005 + 0.0005

1.000000 V 0.0020 + 0.0006 0.0030 + 0.0007 0.0035 + 0.0007 0.0005 + 0.0001

10.00000 V 0.0015 + 0.0004 0.0020 + 0.0005 0.0030 + 0.0005 0.0005 + 0.0001

100.0000 V 0.0020 + 0.0006 0.0035 + 0.0006 0.0040 + 0.0060 0.0005 + 0.0001

1000.000 V 4 0.0020 + 0.0006 0.0035 + 0.0006 0.0040 + 0.0060 0.0005 + 0.0001

True RMS

AC voltage 5

100.0000 mV

to 750.000 V

3 Hz – 5 Hz 0.50 + 0.02 0.50 + 0.03 0.50 + 0.03 0.010 + 0.003

5 Hz – 10 Hz 0.10 + 0.02 0.10 + 0.03 0.10 + 0.03 0.008 + 0.003

10 Hz – 20 kHz 0.02 + 0.02 0.04 + 0.02 0.045 + 0.02 0.005 + 0.002

20 kHz – 50 kHz 0.04 + 0.025 0.08 + 0.025 0.090 + 0.025 0.010 + 0.0025

50 kHz – 100 kHz 0.10 + 0.040 0.20 + 0.040 0.200 + 0.040 0.020 + 0.0040

100 kHz – 300 kHz 1.00 + 0.250 1.20 + 0.250 1.200 + 0.250 0.120 + 0.0200

Resistance 6 100.0000 Ω 1 mA 0.0030 + 0.0030 0.008 + 0.004 0.010 + 0.004 0.0006 + 0.0005

1.000000 kΩ 1 mA 0.0020 + 0.0005 0.007 + 0.001 0.010 + 0.001 0.0006 + 0.0001

10.00000 kΩ 100 µA 0.0020 + 0.0005 0.007 + 0.001 0.010 + 0.001 0.0006 + 0.0001

100.0000 kΩ 10 µA 0.0020 + 0.0005 0.010 + 0.001 0.012 + 0.001 0.0006 + 0.0001

1.000000 MΩ 5 µA 0.0020 + 0.0010 0.030 + 0.001 0.040 + 0.001 0.0010 + 0.0002

10.00000 MΩ 500 nA 0.0100 + 0.0010 0.600 + 0.001 0.800 + 0.001 0.0030 + 0.0004

100.0000 MΩ 500 nA || 10 MΩ 0.200 + 0.001 6.000 + 0.001 8.000 + 0.001 0.1000 + 0.0001

1.000000 GΩ 500 nA || 10 MΩ 2.000 + 0.001 1.0000 + 0.0001

DC current 100.0000 µA < 0.03 V 0.010 + 0.020 0.040 + 0.025 0.050 + 0.025 0.0020 + 0.0030

1.000000 mA < 0.30 V 0.007 + 0.006 0.030 + 0.006 0.050 + 0.006 0.0020 + 0.0005

10.00000 mA < 0.03 V 0.007 + 0.020 0.030 + 0.020 0.050 + 0.020 0.0020 + 0.0020

100.0000 mA < 0.30 V 0.010 + 0.004 0.030 + 0.005 0.050 + 0.005 0.0020 + 0.0005

1.000000 A < 0.80 V 0.050 + 0.006 0.080 + 0.010 0.100 + 0.010 0.0050 + 0.0010

3.000000 A < 2.0 V 0.100 + 0.020 0.120 + 0.020 0.150 + 0.020 0.0050 + 0.002

True RMS

AC current 7

100.0000 µA

to 3.00000 A

3 Hz – 5 kHz 0.10 + 0.04 0.10 + 0.04 0.10 + 0.04 0.015 + 0.006

5 kHz – 10 kHz 0.20 + 0.04 0.20 + 0.04 0.20 + 0.04 0.030 + 0.006

Frequency

or period

100 mV

to 750 V

3 Hz – 5 Hz 0.070 + 0.000 0.070 + 0.000 0.070 + 0.000 0.005 + 0.000

5 Hz – 10 Hz 0.040 + 0.000 0.040 + 0.000 0.040 + 0.000 0.005 + 0.000

10 Hz – 40 Hz 0.020 + 0.000 0.020 + 0.000 0.020 + 0.000 0.001 + 0.000

40 Hz – 300 kHz 0.005 + 0.000 0.006 + 0.000 0.007 + 0.000 0.001 + 0.000

Capacitance 8 1.0000 nF 500 nA 0.50 + 0.50 0.50 + 0.50 0.50 + 0.50 0.05 + 0.05

10.000 nF 1 µA 0.40 + 0.10 0.40 + 0.10 0.40 + 0.10 0.05 + 0.01

100.00 nF 10 µA 0.40 + 0.10 0.40 + 0.10 0.40 + 0.10 0.01 + 0.01

1.0000 µF 10 µA 0.40 + 0.10 0.40 + 0.10 0.40 + 0.10 0.01 + 0.01

10.000 µF 100 µA 0.40 + 0.10 0.40 + 0.10 0.40 + 0.10 0.01 + 0.01

Temperature 9

RTD

-200 °C to 600 °C

0.06 °C

0.003 °C

Thermistor -80 °C to 150 °C 0.08 °C 0.08 °C 0.08 °C 0.002 °C

Diode test 10 1.0000 V 1 mA 0.002 + 0.010 0.008 + 0.020 0.010 + 0.020 0.0010 + 0.0020

A-to-D converter noise performance

Integration time

(NPLC)

Resolution

(ppm of range) 1

Normal mode

rejection (dB) 2

Readings/second 4

0.001 30 0 50,000

0.002 15 0 25,000

0.006 6 0 10,000

0.02 3 0 3,000

0.06 1.5 0 1,000

0.2 0.7 0 300

1 0.3 55 60 (50)

2 0.2 110 3 30 (25)

10 0.1 110 3 6 (5)

100 0.03 110 3 0.6 (0.5)

1. Resolution is defined as the typical DCV 10 V range RMS noise.

Auto-zero on for NPLC ≥ 1. See manual for additional noise characteristics.

2. Normal mode rejection for power line frequency ± 0.1%.

3. For power-line frequency ± 1% 75 dB and for ± 3% 55 dB.

4. Maximum rate with auto-zero off for 60 Hz and (50 Hz) operation.

System reading and throughput rates

DMM memory to PC (maximum reading rate out of memory) 1

Drawing – Path B

Reading format GPIB

readings/sec

USB 2.0

readings/sec

LAN (VXI-11)

readings/sec

LAN (sockets)

readings/sec

ASCII 4,000 8,500 7,000 8,500

32-bit binary 89,000 265,000 110,000 270,000

64-bit binary 47,000 154,000 60,000 160,000

Direct I/O measurements (single reading – measure and I/O time) 1

Drawing – Path C

Maximum reading

rate into memory

or to direct I/O

(readings/sec)

Drawing–Path A or C

Function Resolution

(NPLC)

GPIB

msec

USB 2.0

msec

LAN

(VXI-11)

msec

LAN

(sockets)

msec

DCV/2-wire

resistance

0.001 2.6 2.9 4.6 3.2 50,000

ACV/

frequency

Fast ﬁlter

1 ms gate

10.0 10.0 10.0 10.0 500

1. ½ scale input signal, immediate trigger, trigger delay 0, auto-zero off, auto-range off, no math, null off,

60 Hz line frequency. See manual for performance on other functions.

System performance

Function

change

(msec) 1

Range change

LAN/GPIB

(msec) 2

Auto-range

(msec) 3

Maximum

external

trigger rate

Maximum

internal

trigger rate

DCV/2-wire

resistance

22 3.9/2.6 7.5 5,000/s 50,000/s

ACV/frequency 37 6.5/6.4 19 500/s 500/s

1. Time to change from 2-wire Resistance to this specified function, or DCV to 2-wire resistance using the

SCPI ”FUNC” command

2. Time to change from one range to the next higher range, ≤ 10 V, ≤ 10 MΩ

3. Time to automatically change one range and be ready for the new measurement, ≤ 10 V, ≤ 10 MΩ

DMM

input DMM memory

50 k readings

non-volatile

Path ‘A’

Path ‘C’ Path ‘B’

USB

LAN

GPIB

ADC

L4411A/

34410A/

34411A

DMM

System reading architecture

100

0.1

0.01

0.001 0.01 0.1 1 10 100

Integration time (NPLC)

RMS noise (ppm of range)

System reading architecture

Measurement Characteristics

DC voltage

Measurement

method:

Continuously integrating multi-slope IV A/D

converter

Linearity: 0.0002% of reading

(10 V range) + 0.0001% of range

Input

resistance: 0.1 V, 1 V, 10 V ranges 10 MΩ or > 10 GΩ

(selectable)

100 V, 1000 V ranges 10 MΩ ±1% (ﬁxed)

Input bias current: < 50 pA at 25 °C

Input protection: 1000 V

DC CMRR: 140 dB 1

True RMS AC voltage

Measurement

method:

AC-coupled True RMS measurement.

Digital sampling with anti-alias ﬁlter.

Crest factor: No additional error for crest factors < 10.

Limited by peak input and 300 kHz bandwidth.

Peak input: 300% of range or 1100 V

Overload

ranging:

Will select higher range if peak input

overload is detected during auto range.

Overload is reported in manual ranging.

AC CMR: 70 dB 2

Maximum input: 400 Vdc, 1100 Vpk

Input impedance: 1 MΩ ± 2% in parallel with < 150 pF

Input protection: 750 Vrms all ranges

Resistance

Measurement

method:

Selectable 2-wire or 4-wire.

Current source referenced to LO input.

Offset

compensation:

Selectable on the 100 Ω, 1 kΩ, and 10 kΩ

ranges

Max. lead

resistance

(4-wire):

10% of range per lead for 100 Ω, 1 kΩ. 1 kΩ

per lead on all other ranges

Input protection: 1000 V on all ranges

DC current

Current shunt: 200 Ω for 100 µA, 1 mA

2 Ω for 10 mA, 100 mA

0.1 Ω for 1 A, 3 A

Input protection: 3 A, 250 V fuse

True RMS AC current

Measurement

method:

AC-coupled true RMS measurement.

Directly coupled to the fuse and shunt.

Digital sampling with anti-alias ﬁlter.

Current shunt: 200 Ω for 100 µA, 1 mA

2 Ω for 10 mA, 100 mA

0.1 Ω for 1 A, 3 A

Maximum input: The peak value of the DC + AC current must

be < 300% of range. The RMS current must

be < 3 A including the DC current content.

Input protection: 3 A, 250 V fuse

Frequency and period

Measurement

method:

Reciprocal-counting technique. AC-coupled

input using the AC voltage measurement

function.

Input impedance: 1 MΩ ± 2% in parallel with < 150 pF

Input protection: 750 Vrms all ranges

Capacitance

Measurement

method:

Current input with measurement of

resulting ramp.

Connection type: 2-wire

Temperature

Thermistor: 2.2 kΩ, 5 kΩ, and 10 kΩ

RTD: α = 0.00385

Ro from 49 Ω to 2.1 kΩ

Diode test

Response time: 300 samples/sec

Continuity

threshold:

Fixed at 10 Ω

Operating characteristics

Maximum readings/second

Digits

Function 3 4.5 5.5 6.5

DCV 50 k 10 k 1 k

2-wire Ω 50 k 10 k 1 k

DCI 50 k 10 k 1 k

Frequency 500 90 10

Period 500 90 10

Filter setting fast med slow

ACV 500 150 50

ACI 500 150 50

Additional speciﬁcations

Resolution: See table on page 4

Overall bandwidth,

DCV & DCI:

15 kHz typical @ 20 µs aperture (-3 dB)

Triggering: Pre/Post, Analog Level, Int/Ext, Pos/Neg

Timebase

resolution:

19.9524 µs 0.01% accuracy

Trigger jitter: 2 µs (p-p), 20 µs (p-p) when pre-triggered

1. For 1 kΩ unbalanced in LO lead, ± 500 V peak maximum

2. For 1 kΩ unbalanced in LO lead and < 60 Hz, ± 500 V peak maximum

3. Maximum rate for DCV, DCI, and resistance functions

(using zero settling delay, autozero off, manual range)

Ordering Information

Spurious-free dynamic range & signal to noise

distortion ratio

Function Range Spur-free SNDR

DCV 1 V -75 dB 60 dB

10 V 1-70 dB 60 dB

100 V -75 dB 60 dB

1. 10 V range: 2 V (p-p) <signal< 16 V (p-p)

Triggering and memory

Reading hold

sensitivity:

1% of reading

Samples per

trigger:

1 to 1,000,000

Trigger delay: 0 to 3600 sec (20 µs step size)

External trigger: Programmable edge, low-power TTL

compatible

Delay: < 1 µs

Jitter: < 1 µs

Max rate: 5,000/sec

Min pulse width: 1 µs

Voltmeter

complete:

3 V logic output, 2 µs pulse with

programmable edge

Nonvolatile

memory:

50,000 readings

Volatile memory: 1,000,000 readings

Sample timer:

Range: 0 to 3600 s (20 µs step sizes)

Jitter: < 100 ns

General speciﬁcations

Power supply: 90 V – 264 V @ 45-66 Hz

90 V – 134 V @ 360 – 440 Hz

Power line

frequency:

Automatically sensed at power-on

Power

consumption:

50 VA peak (18 W average)

Operating

environment:

Full accuracy for 0 °C to 55 °C,

80% R.H. at 40 °C non-condensing

Storage

temperature:

-40 °C to 70 °C

Weight: 1.9 kg (4.25 Lbs)

Dimensions: (W x H x D) 40.9 mm x 212.3 mm x 363.2 mm

Safety: IEC 61010-1, EN 61010-1, UL 61010-1,

CAN/CSA-C22.2 No. 61010-1, refer to

Declarations of Conformity for current

revisions. Measurement CAT II 300V, CAT I

1000V. Pollution Degree 2

EMC: IEC 61326, EN 61326, CISPR 11, ICES-001,

AS/NZS 2064.1, refer to Declaration of

Conformity for current revisions.

Vibration & shock: MIL-T-28800E, Type III, Class 5 (Sine only)

LXI compliance: LXI Class C, ver. 1.0

Warranty: 1 year

Agilent L4411A Multimeter

Accessories included

Test report, power cord, LAN cross-over interface cable.

Product reference CD-ROM (34410-13601):

• Software

◦ IntuiLink software

◦ IVI-COM driver

◦ LabView driver

◦ Example programs

• Online documentation

◦ Programmer’s reference

◦ Getting started guide

◦ User’s guide

◦ Service guide

◦ Localized manuals

Agilent I/O Libraries CD-ROM (E2094-60003)

Options

Opt. 001 Front measurement terminals ONLY

Opt. A6J ANSI Z540 compliant calibration

Agilent accessories

Y1133A Measurement & trigger cable kit

Y1160A Rack mount kit for L4400A series instruments

racks 1 or 2 instruments side-by-side on

sliding tray

11059A Kelvin probe set

11060A Surface mount device (SMD) test probes

11062A Kelvin clip set

34134A DC coupled current probe

34136A High voltage probe

34138A Test lead set

34171B Input terminal connector (sold in pairs)

34172B Input calibration short (sold in pairs)

34330A 30 A current shunt

E2308A 5 kΩ thermistor probe

www.agilent.com

www.agilent.com/find/L4411A

www.agilent.com/find/dmm

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please contact your local Agilent office.

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Revised: June 8, 2011

Product specifications and descriptions

in this document subject to change

without notice.

Published in USA, November 16, 2011

5989-6303EN

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