Product Brief October 1998 497AE and 1215E Boundary-Scan Master 2 Features The BSM2 is available in 2 versions: -- The 497AE is available in a 28-pin SOJ package. -- The 1215E device is available in a 48-pin TQFP package. The 497AE and 1215E differ in the following capabilities: -- The 497AE has an 8-bit data bus and no user I/O signals. -- The 1215E has a 16-bit data bus and 3 user I/O signals. Selectable between two operational modes: -- 497AA compatiblity mode -- Advanced operational mode (497AE) 3.3 V power supply, but fully 5 V (TTL) tolerant for all inputs and outputs Dedicated 8 kbits test data in (TDI) and test data out (TDO) buffers; FIFO or fully addressable Simple and flexible host interface options: -- 497AE, synchronous or asynchronous 8-bit data bus -- 1215E, 16-bit asynchronous data bus for maximum throughput Self-timing interface to a microprocessor/microcontroller Automatic test mode select (TMS) sequence generation Programmable test clock (TCK) generator with gated TCK mode Provides test reset (TRST*) optional TAP signal External pin control to 3-state test access port (TAP) signals (1215E) Conflict-free automatic test pattern generator (ATPG) 32-bit signature analysis register (SAR) with response masking for repeatable signatures TCK output frequency of 65 MHz Maskable processor interrupts; no lockup condition Built-in self-test for >95% fault coverage Supports protocols for multidrop backplane test configurations, such as TI 's1 addressable scan port protocol Provides retiming (pipeline) delays of up to 13 TCK cycles to correct skewing One general-purpose input, two general-purpose outputs. Outputs can be programmed for use as DMA control signals (1215E device only) Description The Lucent Technologies Microelectronics Group 497AE/1215E Boundary-Scan Master 2 (BSM2) communicates with a generic processor in parallel and controls the test and diagnosis (T&D) of a unit under test (UUT), which could be a device, board, or system, based on the ANSI/IEEE 2 standard 1149.11990 TAP and Boundary-Scan (B-S) Architecture. It serializes test vectors, delivers them to the UUT using the standard protocol, and stores the UUT response as raw data or as a signature. An ATPG generates four common test sequences for interconnect test, cluster test, etc. The device also solves the potential problems of bus conflict and nonrepeatable board-level signatures associated with the B/S architecture. Finally, the BSM2 provides support for edgeconnector/backplane test and system test and diagnosis. The BSM2 comes in two package sizes. The 497AE is a 3.3 V, 28-pin SOJ package that provides both software and hardware backward compatibility to the 497AA BSM. The 1215E is a 3.3 V, 48-pin TQFP package with a 16-bit data bus and direct register access. * Asterisk on any pin name indicates active-low. 1. TI is a registered trademark of Texas Instruments Inc. 2. IEEE is a registered trademark of The Institute of Electrical and Electronics Engineers, Inc. Product Brief October 1998 497AE and 1215E Boundary-Scan Master 2 Architecture PROG. TIMER COUNTER TCK SCAN COUNTER D0-X INTERNAL REGISTERS A0-X SCAN COUNTER IDLE COUNTER PROCESSOR INTERFACE CONTROL TRST* TVO FIFO 8K BITS TDO ATPG TVI FIFO 8K BITS TDI DEVICE CONTROLLER SAR 497AA COMPATIBLE MODE ADVANCED OPERATIONAL MODE TAP STATE TRACKER TMS AUTOMATIC TMS GENERATOR BOTH MASTER CLOCK TMS MACRO GENERATOR TCK GENERATOR (DIVIDER) TCK CONTROL GATE TCK For additional information, contact your Microelectronics Group Account Manager or the following: INTERNET: http://www.lucent.com/micro E-MAIL: docmaster@micro.lucent.com N. AMERICA: Microelectronics Group, Lucent Technologies Inc., 555 Union Boulevard, Room 30L-15P-BA, Allentown, PA 18103 1-800-372-2447, FAX 610-712-4106 (In CANADA: 1-800-553-2448, FAX 610-712-4106) ASIA PACIFIC: Microelectronics Group, Lucent Technologies Singapore Pte. Ltd., 77 Science Park Drive, #03-18 Cintech III, Singapore 118256 Tel. (65) 778 8833, FAX (65) 777 7495 CHINA: Microelectronics Group, Lucent Technologies (China) Co., Ltd., A-F2, 23/F, Zao Fong Universe Building, 1800 Zhong Shan Xi Road, Shanghai 200233 P. R. China Tel. (86) 21 6440 0468, ext. 316, FAX (86) 21 6440 0652 JAPAN: Microelectronics Group, Lucent Technologies Japan Ltd., 7-18, Higashi-Gotanda 2-chome, Shinagawa-ku, Tokyo 141, Japan Tel. (81) 3 5421 1600, FAX (81) 3 5421 1700 EUROPE: Data Requests: MICROELECTRONICS GROUP DATALINE: Tel. (44) 1189 324 299, FAX (44) 1189 328 148 Technical Inquiries: GERMANY: (49) 89 95086 0 (Munich), UNITED KINGDOM: (44) 1344 865 900 (Ascot), FRANCE: (33) 1 40 83 68 00 (Paris), SWEDEN: (46) 8 600 7070 (Stockholm), FINLAND: (358) 9 4354 2800 (Helsinki), ITALY: (39) 02 6608131 (Milan), SPAIN: (34) 1 807 1441 (Madrid) Lucent Technologies Inc. reserves the right to make changes to the product(s) or information contained herein without notice. N o liability is assumed as a result of their use or application. No rights under any patent accompany the sale of any such product(s) or information. Copyright (c) 1998 Lucent Technologies Inc. All Rights Reserved Printed in U.S.A. October 1998 PN99-011NTNB (Replaces PN98-020NTNB)