GT25Q102
2006-11-01
1
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
GT25Q102
High Power Switching Applications
Third-generation IGBT
Enhancement mode type
High speed: tf = 0.32 μs (max)
Low saturation voltage: VCE (sat) = 2.7 V (max)
Absolute Maximum Ratings (Ta = 25°C)
Characteristic Symbol Rating Unit
Collector-emitter voltage VCES 1200 V
Gate-emitter voltage VGES ±20 V
DC IC 25
Collector current
1 ms ICP 50
A
Collector power dissipation
(Tc = 25°C) PC 200 W
Junction temperature Tj 150 °C
Storage temperature range Tstg 55 to 150 °C
Note: Using continuously under heavy loads (e.g. the application of high
temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are
within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Marking
Unit: mm
JEDEC
JEITA
TOSHIBA 2-21F2C
Weight: 9.75 g (typ.)
GT25Q102
TOSHIBA
JAPAN
Lot No.
A
line indicates
lead (Pb)-free package or
lead (Pb)-free finish.
Part No. (or abbreviation code)
GT25Q102
2006-11-01
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Electrical Characteristics (Ta = 25°C)
Characteristic Symbol Test Condition Min Typ. Max Unit
Gate leakage current IGES V
GE = ±20 V, VCE = 0 ±500 nA
Collector cut-off current ICES V
CE = 1200 V, VGE = 0 1.0 mA
Gate-emitter cut-off voltage VGE (OFF) I
C = 2.5 mA, VCE = 5 V 4.0 7.0 V
Collector-emitter saturation voltage VCE (sat) I
C = 25 A, VGE = 15 V 2.1 2.7 V
Input capacitance Cies V
CE = 50 V, VGE = 0, f = 1 MHz 1360 pF
Rise time tr 0.10
Turn-on time ton 0.30
Fall time tf 0.16 0.32
Switching time
Turn-off time toff
Inductive Load
VCC = 600 V, IC = 25 A
VGG = ±15 V, RG = 43 Ω
(Note1)
0.68
μs
Thermal resistance Rth (j-c) 0.625 °C/W
Note1: Switching time measurement circuit and input/output waveforms
Note2: Switching loss measurement waveforms
GT25Q301
RG
IC
VCE
L VCC
VGE
10%
90%
VGE
VCE
IC
td (off)
toff
td (on) t
r
ton
0
0
tf
10%10% 10%
90%
10%
90%
10%
90%
VGE
VCE
IC
Eoff E
on
0
0 10%
GT25Q102
2006-11-01
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Collector current IC (A)
Collector-emitter voltage VCE (V)
Collector-emitter voltage VCE (V)
IC – VCE
Collector current IC (A)
Gate-emitter voltage VGE (V)
VCE – VGE
Collector-emitter voltage VCE (V)
Gate-emitter voltage VGE (V)
VCE – VGE
Collector-emitter voltage VCE (V)
Gate-emitter voltage VGE (V)
VCE – VGE
Gate-emitter voltage VGE (V)
IC – VGE
Case temperature Tc (°C)
VCE (sat) – Tc
Collector-emitter saturation voltage
VCE (sat) (V)
50
40
30
20
10
0
0 1 2 3 4 5
VGE = 9 V
Common emitter
Tc = 25°C
10
15 20
0 4 8 12 16 20
12
0
4
8
16
20
Common emitter
Tc = 40°C
50
25
IC = 10 A
20
16
12
8
4
0
0 4 8 12 16 20
Common emitter
Tc = 25°C
25
50
IC = 10 A
0 4 8 12 16 20
12
0
4
8
16
20
Common emitter
Tc = 125°C
25
50
IC = 10 A
50
40
30
20
10
0
0 4 8 12 16 20
Tc = 125°C
Common emitter
VCE = 5 V
25
40
4
3
2
1
0
60 20 20 60 100 140
Common
emitter
VGE = 15 V
25
50
IC = 10 A
GT25Q102
2006-11-01
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Gate resistance RG (Ω)
Switching time ton, tr – RG
Switching time ton, tr (μs)
Gate resistance RG (Ω)
Switching time toff, tf – RG
Switching time toff, tf (μs)
Gate resistance RG (Ω)
Switching loss Eon, Eoff – RG
Switching loss Eon, Eoff (mJ)
Collector current IC (A)
Switching time ton, tr – IC
Switching time ton, tr (μs)
Collector current IC (A)
Switching time toff, tf – IC
Switching time toff, tf (μs)
Collector current IC (A)
Switching loss Eon, Eoff – IC
Switching loss Eon, Eoff (mJ)
0.3
0.5
1
3
0.1
ton
tr
Common emitter
VCC = 600 V
VGG = ±15 V
IC = 25 A
: Tc = 25°C
: Tc = 125°C
5 10 30 50 100 3 500
0.05 300 5 10
0
0.3
0.1
0.01
0.03
1
15 20 25 30
Common emitter
VCC = 600 V
VGG = ±15 V
RG = 43 Ω
: Tc = 25°C
: Tc = 125°C
tr
ton
0.5
0.05
5 10
0
0.3
0.1
0.01
0.03
1
15 20 25 30
Common emitter
VCC = 600 V
VGG = ±15 V
RG = 43 Ω
: Tc = 25°C
: Tc = 125°C
tf
toff
0.5
0.05
0.05
0.3
0.5
1
0.1
tf
toff
Common emitter
VCC = 600 V
VGG = ±15 V
IC = 25 A
: Tc = 25°C
: Tc = 125°C
5 10 30 50 100 3 500 300
3
0.5
3
5
10
30
1
5 10 30 50 100 3 500 300
Eoff
Eon
Common emitter
VCC = 600 V
VGG = ±15 V
IC = 25 A
: Tc = 25°C
: Tc = 125°C
Note2
5 10
0
3
1
0.1
0.3
10
15 20 25 30
Common emitter
VCC = 600 V
VGG = ±15 V
RG = 43 Ω
: Tc = 25°C
: Tc = 125°C
Note2
Eoff
Eon
5
0.5
GT25Q102
2006-11-01
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Transient thermal impedance
Rth (t) (°C/W)
Collector current IC (A)
Gate-emitter voltage VGE (V)
Gate charge QG (nC)
VCE, VGE – QG
Collector-emitter voltage VCE (V)
Collector-emitter voltage VCE (V)
Safe operating area
Collector current IC (A)
Collector-emitter voltage VCE (V)
Reverse bias SOA
Pulse width tw (s)
Rth (t) – tw
Capacitance C (pF)
Collector-emitter voltage VCE (V)
C – VCE
0.3 1 0.1
300
100
10
30
1000
3000
10000
3 10 30 300 1000
Common emitter
VGE = 0
f = 1 MHz
Tc = 25°C
Cies
Coes
Cres
100
Common emitter
RL = 12 Ω
Tc = 25°C
0
0
40 80 120 160 200
0
4
8
12
16
20
200
400
600
800
1000
VCE = 200 V
600
400
0.3
1 3 10
0.5
1
3
5
10
30
30 100 300 30001000
0.1
100
50
Tj
<
=
125°C
VGE = ±15 V
RG = 43 Ω
0.3
1 3 10
0.5
1
3
5
10
30
30 100 300 30001000
0.1
100
50
*: Single nonrepetitive
pulse
Tc = 25°C
Curves must be derated
linearly with increase in
temperature.
IC max (pulsed)*
IC max
(continuous)
DC
operation
1 ms*
100 μs*
50 μs*
10 ms*
103
102
105 104 103 102 101 100 101 102
102
101
100
101
104
Tc = 25°C
GT25Q102
2006-11-01
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RESTRICTIONS ON PRODUCT USE 20070701-EN
The information contained herein is subject to change without notice.
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc.
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his
document shall be made at the customer’s own risk.
The products described in this document shall not be used or embedded to any downstream products of which
manufacture, use and/or sale are prohibited under any applicable laws and regulations.
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patents or other rights of
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Please contact your sales representative for product-by-product details in this document regarding RoHS
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occurring as a result of noncompliance with applicable laws and regulations.