2SJ506(L), 2SJ506(S)
Silicon P Channel MOS FET
High Speed Power Switching
ADE-208-548C (Z)
4th. Edition
Jun. 1998
Features
Low on-resistance
RDS(on) = 0.065 typ. (at VGS = –10V, ID = –5A)
Low drive current
High speed switching
4V gate drive devices.
Outline
123
44
123
1. Gate
2. Drain
3. Source
4. Drain
DPAK–2
D
G
S
2SJ506(L), 2SJ506(S)
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage VDSS –30 V
Gate to source voltage VGSS ±20 V
Drain current ID–10 A
Drain peak current ID(pulse) Note1 –40 A
Body to drain diode reverse drain current IDR –10 A
Channel dissipation Pch Note2 20 W
Channel temperature Tch 150 °C
Storage temperature Tstg –55 to +150 °C
Notes: 1. PW 10µs, duty cycle 1 %
2. Value at Tc = 25°C
2SJ506(L), 2SJ506(S)
3
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown
voltage V(BR)DSS –30 V ID = –10mA, VGS = 0
Gate to source breakdown
voltage V(BR)GSS ±20 V IG = ±100µA, VDS = 0
Zero gate voltege drain
current IDSS –10 µAV
DS = –30 V, VGS = 0
Gate to source leak current IGSS ±10 µAV
GS = ±16V, VDS = 0
Gate to source cutoff voltage VGS(off) –1.0 –2.0 V ID = –1mA, VDS = –10V
Static drain to source on state RDS(on) 6585mI
D
= –5A, VGS = –10VNote3
resistance RDS(on) 110 180 mID = –5A, VGS = –4V Note3
Forward transfer admittance |yfs| 1016—S I
D
= –5A, VDS = –10V Note3
Input capacitance Ciss 660 pF VDS = –10V
Output capacitance Coss 440 pF VGS = 0
Reverse transfer capacitance Crss 140 pF f = 1MHz
Turn-on delay time td(on) 12 ns ID = –5A, RL = 2
Rise time tr 65 ns VGS = –10V
Turn-off delay time td(off) —85—ns
Fall time tf—65—ns
Body to drain diode forward
voltage VDF –1.05 V IF = –10A, VGS = 0
Body to drain diode reverse
recovery time trr 65 ns IF = –10A, VGS = 0
diF/ dt = 50A/µs
Note: 3. Pulse test
2SJ506(L), 2SJ506(S)
4
Main Characteristics
40
30
20
10
050 100 150 200
–20
–16
–12
–8
–4
0–4 –8 –12 –16 –20
–4 V
0 1–2–345
–3 V
–20
–16
–12
–8
–4
–3.5 V
DS
V = –10 V
Pulse Test
–10 V
Tc = –25 °C
Pulse Test
V = –2.5 V
GS 75 °C
–5 V
–4.5 V 25 °C
–6 V
–8 V
–500
–200
–100
–20
–0.1
–10
–2
–10
–0.1–0.2 –0.5 –1 –2 –5
–50
–5
–1
–0.2
–0.5
–20 –50
Ta = 25 °C
1 ms
PW = 10 ms (1shot)
10 µs
100 µs
DC Operation
(Tc = 25 °C)
Channel Dissipation Pch (W)
Case Temperature Tc (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Operation in
this area is
limited by RDS(on)
Drain Current I (A)
D
Typical Output Characteristics
Drain to Source Voltage V (V)
DS Gate to Source Voltage V (V)
GS
Typical Transfer Characteristics
Drain Current I (A)
D
2SJ506(L), 2SJ506(S)
5
–2
–1.6
–1.2
–0.8
–0.4
0–4 –8 –12 –16 –20
200
160
120
80
40
–40 0 40 80 120 160
0
–2,–5 A
Pulse Test
Pulse Test
I = –10 A
D
GS
V = –10 V
–10 A
GS
V = –4 V –2 A
100
10
0.5
2
1
5
20
I = –10 A
D
–2 A
–5 A
50
–0.1 –50
–0.2 –0.5 –1 –2 –5 –10 –20
25 °C
75 °C
V = –10 V
DS
Pulse Test
Tc = –25 °C
–1 –2 –5 –10 –20 –50 –100
1000
500
50
20
10
200
100
Pulse Test
–10 V
V = –4 V
GS
–5 A
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
V (V)
DS(on)
Drain to Source Saturation Voltage
Gate to Source Voltage V (V)
GS
Static Drain to Source on State Resistance
vs. Drain Current
Drain Current I (A)
D
Drain to Source On State Resistance
R ( )
DS(on)
Static Drain to Source on State Resistance
vs. Temperature
Case Temperature Tc (°C)
R ( )
DS(on)
Static Drain to Source on State Resistance
Forward Transfer Admittance vs.
Drain Current
Drain Current I (A)
D
Forward Transfer Admittance |y | (S)
fs
2SJ506(L), 2SJ506(S)
6
100
50
20
10
–0.1 –0.2 –1 0 –10 –20 –30 –40 –50
200
100
50
1000
200
500
100
10
20
5
–0.1–0.2 –1 –2 –5
–0.5 –5
20
10
–10
500
–20 –50
–2
=
1000
2000
5000
Ciss
Coss
Crss
V = 0
f = 1 MHz
GS
–20
0
–10
–20
–30
–40
0
0
–4
–8
–12
–16
–20–50 81624
32 40
DS
V
GS
V
V = –25 V
–10 V
–5 V
DD
V = –5 V
–10 V
–25 V
DD
I = –10 A
D
50
–0.5 –10
r
t
d(off)
t
tf
d(on)
t
V = –10 V, V = –10 V
PW = 10 µs, duty < 1 %
GS DD
di / dt = 50 A / µs
V = 0, Ta = 25 °C
GS
Body to Drain Diode Reverse
Recovery Time
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs.
Drain to Source Voltage
Dynamic Input Characteristics
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Switching Time t (ns)
Switching Characteristics
Drain Current I (A)
D
2SJ506(L), 2SJ506(S)
7
–20
–16
–12
–8
–4
0–0.4 –0.8 –1.2 –1.6 –2.0
–10 V
–5 V Pulse Test
V = 0.5 V
GS
3
1
0.3
0.1
0.03
0.01
10 µ100 µ1 m 10 m 100 m 1 10
DM
P
PW
T
D = PW
T
ch – c(t) = s (t) • ch – c
ch – c = 6.25 °C/W, Tc = 25 °C
θ γ θ
θ
D = 1
0.5
0.2
0.01
0.02
0.1
0.05
1 shot Pulse
Tc = 25°C
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width
Reverse Drain Current vs.
Source to Drain Voltage
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Normalized Transient Thermal Impedance
s (t)
γ
2SJ506(L), 2SJ506(S)
8
Vin Monitor
D.U.T.
Vin
–10 V
RL
V
= –10 V
DD
tr
td(on)
Vin
90% 90%
10%
10%
Vout
td(off)
Vout
Monitor
50
90%
10%
tf
Switching Time Test Circuit Waveforms
2SJ506(L), 2SJ506(S)
9
Package Dimensions
Hitachi Code
JEDEC
EIAJ
Mass
(reference value)
DPAK (L)-(2)
0.42 g
6.5 ± 0.5 2.3 ± 0.2
0.55 ± 0.1
1.2 ± 0.3
0.55 ± 0.1
5.5 ± 0.5 1.7 ± 0.5
16.2 ± 0.5
4.7 ± 0.5
5.4 ± 0.5
1.15 ± 0.1
2.29 ± 0.5 2.29 ± 0.5
0.8 ± 0.1
0.55 ± 0.1
3.1 ± 0.5
(0.7)
As of January, 2001
Unit: mm
2SJ506(L), 2SJ506(S)
10
Hitachi Code
JEDEC
EIAJ
Mass
(reference value)
DPAK (S)-(1),(2)
Conforms
0.28 g
As of January, 2001
Unit: mm
6.5 ± 0.5
5.4 ± 0.5 2.3 ± 0.2
0.55 ± 0.1
0 – 0.25
0.55 ± 0.1
1.7 ± 0.5
5.5 ± 0.5
2.5 ± 0.5
1.15 ± 0.1
0.8 ± 0.1
2.29 ± 0.5
2.29 ± 0.5
1.2 Max
(4.9)
(5.3)
2SJ506(L), 2SJ506(S)
11
Hitachi Code
JEDEC
EIAJ
Mass
(reference value)
DPAK (S)-(3)
Conforms
0.28 g
As of January, 2001
Unit: mm
6.5 ± 0.5
5.4 ± 0.5 2.3 ± 0.2
0.55 ± 0.1
0 – 0.25
0.55 ± 0.1
1.5 ± 0.5
5.5 ± 0.5
2.5 ± 0.5
1.15 ± 0.1
0.8 ± 0.1
2.29 ± 0.5
2.29 ± 0.5
1.2 Max
(5.1)
(5.1)
(0.1)(0.1)
2SJ506(L), 2SJ506(S)
12
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-
safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
Copyright Hitachi, Ltd., 2000. All rights reserved. Printed in Japan.
Hitachi Asia Ltd.
Hitachi Tower
16 Collyer Quay #20-00,
Singapore 049318
Tel : <65>-538-6533/538-8577
Fax : <65>-538-6933/538-3877
URL : http://www.hitachi.com.sg
URL NorthAmerica : http://semiconductor.hitachi.com/
Europe : http://www.hitachi-eu.com/hel/ecg
Asia : http://sicapac.hitachi-asia.com
Japan : http://www.hitachi.co.jp/Sicd/indx.htm
Hitachi Asia Ltd.
(Taipei Branch Office)
4/F, No. 167, Tun Hwa North Road,
Hung-Kuo Building,
Taipei (105), Taiwan
Tel : <886>-(2)-2718-3666
Fax : <886>-(2)-2718-8180
Telex : 23222 HAS-TP
URL : http://www.hitachi.com.tw
Hitachi Asia (Hong Kong) Ltd.
Group III (Electronic Components)
7/F., North Tower,
World Finance Centre,
Harbour City, Canton Road
Tsim Sha Tsui, Kowloon,
Hong Kong
Tel : <852>-(2)-735-9218
Fax : <852>-(2)-730-0281
URL : http://www.hitachi.com.hk
Hitachi Europe Ltd.
Electronic Components Group.
Whitebrook Park
Lower Cookham Road
Maidenhead
Berkshire SL6 8YA, United Kingdom
Tel: <44> (1628) 585000
Fax: <44> (1628) 585160
Hitachi Europe GmbH
Electronic Components Group
Dornacher Straβe 3
D-85622 Feldkirchen, Munich
Germany
Tel: <49> (89) 9 9180-0
Fax: <49> (89) 9 29 30 00
Hitachi Semiconductor
(America) Inc.
179 East Tasman Drive,
San Jose,CA 95134
Tel: <1> (408) 433-1990
Fax: <1>(408) 433-0223
For further information write to:
Colophon 2.0