
PRELIMINARY FPD10000AF
10W PACKAGED POWER PHEMT
Phone: +1 408 850-5790 http://www.filtronic.co.uk/semis Revised: 12/07/04
Fax: +1 408 850-5766 Email: sales@filcsi.com
• RECOMMENDED OPERATING BIAS CONDITIONS
Drain-Source Voltage: From 10 to 12V
Quiescent Current: From 180 (Class B) to 300 mA (Class AB) operation
• ABSOLUTE MAXIMUM RATINGS1
Parameter Symbol Test Conditions Min Max Units
Drain-Source Voltage VDS -3V < VGS < +0V 16 V
Gate-Source Voltage VGS 0V < VDS < +15V -3 V
Drain-Source Current IDS For VDS > 2V 50% IDSS mA
Gate Current IG Forward / Reverse current +50/-8 mA
RF Input Power2 P
IN Under any acceptable bias state 1.75 W
Channel Operating Temperature TCH Under any acceptable bias state 175 ºC
Storage Temperature TSTG Non-Operating Storage -40 150 ºC
Total Power Dissipation PTOT See De-Rating Note below 42 W
Gain Compression Comp. Under any bias conditions 5 dB
Simultaneous Combination of Limits3 2 or more Max. Limits 80 %
1TAmbient = 22°C unless otherwise noted 2Max. RF Input Limit must be further limited if input VSWR > 2.5:1
3Users should avoid exceeding 80% of 2 or more Limits simultaneously
Notes:
• Operating conditions that exceed the Absolute Maximum Ratings will result in permanent damage to the device.
• Total Power Dissipation defined as: PTOT ≡ (PDC + PIN) – POUT, where:
P
DC: DC Bias Power
PIN: RF Input Power
POUT: RF Output Power
• Total Power Dissipation to be de-rated as follows above 22°C:
PTOT= 42 - (0.286W/°C) x TPACK
where TPACK = source tab lead temperature above 22
°
C
(coefficient of de-rating formula is the Thermal Conductivity)
Example: For a 55°C Source flange temperature: PTOT = 42 - (0.286 x (55 – 22)) = 32.6W
• Note on Thermal Resistivity: The nominal value of 3.5°C/W is measured with the package mounted on a large
heatsink with thermal compound to ensure adequate contact. The package temperature is referred to the Source
flange.
• HANDLING PRECAUTIONS
To avoid damage to the devices care should be exercised during handling. Proper Electrostatic
Discharge (ESD) precautions should be observed at all stages of storage, handling, assembly, and
testing. These devices should be treated as Class 1A per ESD-STM5.1-1998, Human Body Model.
Further information on ESD control measures can be found in MIL-STD-1686 and MIL-HDBK-263.