IS42/45VM16320D
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8M x 16Bits x 4Banks Mobile Synchronous DRAM
Description
These IS42/45VM16320D are mobile 536,870,912 bits CMOS Synchronous DRAM organized as 4 banks of 8,388,608 words x 16 bits.
These products are offering fully synchronous operation and are referenced to a positive edge of the clock. All inputs and outputs are
synchronized with the rising edge of the clock input. The data paths are internally pipelined to achieve very high bandwidth. All input
and output voltage levels are compatible with LVCMOS.
JEDEC standard 1.8V power supply
Auto refresh and self re fresh
All pins are compatible w ith LVCMOS interface
8K refresh cycles every 16ms (A2 grade) or
64 ms (Commercial, Industrial, A1 grade)
Programmab le Burst Length and Burst Type
- 1, 2, 4, 8 or Full Page for Sequential Burst
- 4 or 8 for Interleave Burst
Programmable CAS Latency : 2,3 clocks
All inputs a nd outputs referenced to the positive edge of the
s ystem cloc k
Data mask function by DQM
Internal 4 banks operation
Burst Read Single Write operation
Special Function Supp ort
- PASR ( Partia l Array Self Refresh)
- Auto TCSR(Temperature Compens ated Self Refresh)
- Programmable Driver Strength Control
- Full Strength or 1/2, 1/4 or 1/8 of Full Strength
- Deep Power Down Mode
Automatic precharge, includes CONCURRENT Auto Precharge
Mode and controlled Precharge
Features
Copyright © 2010 Integrated S i l i con Solution, Inc. All rights reserved. IS S I reserves the right t o mak e changes t o this specification and its
products at any tim e without not i ce. ISSI assum es no liability arising out of the appli cation or us e of any i nformation, products or services
described herein. Custom ers are advised to obtain the latest version of this device specif ic ation before relying on any publi shed inf orm ati on
and before pl acing orders f or products.
Integrated Sil i c on Soluti on, Inc . does not recomm end the use of any of it s products in l i f e support applic ations where the failure or
malfuncti on of the product can reas onabl y be expected to cause fail ure of the li fe support system or to signi f i cantly affect its safety or
effectiveness . Products are not authorized for us e i n such applications unless Integrated S i l i con Solution, Inc. receives written assurance to
its satisfactio n, that:
a.) the risk of injury or damage has been minimized;
b.) the user ass ume all such risk s; and
c.) potential liability of Integrated Silicon Solution, Inc is adequately protected under the circumstances
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Figure1: 54Ba ll FBGA Ba ll As s ignmen t
[Top View]
A
B
C
D
E
F
G
H
J
1 2 3 4 5 6 7 8 9
VSS DQ15 VSSQ
DQ14 DQ13 VDDQ
DQ12 DQ11 VSSQ
DQ10 DQ9 VDDQ
UDQM CLK CKE
A12 A11 A9
A8 A7 A6
VSS A5 A4
VDDQ DQ0 VDD
VSSQ DQ2 DQ1
VDDQ DQ4 DQ3
VSSQ DQ6 DQ5
/CAS /RAS /WE
BA0 BA1 /CS
A0 A1 A10
A3 A2 VDD
DQ8 NC VSS VDD LDQM DQ7
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Table2: Pin Des c riptions
Pin Pin Name Descriptions
CLK System Clock The system clock input. All other inputs are reg istered to the
SDRAM on the rising edge CLK.
CKE Clock Ena ble Controls internal c lock sig nal and when deactivated , the SDRAM
will be one of the states among power down, suspend or self
refresh.
/CS Chip Select Enable or disable all inputs except CLK, CKE and DQM.
BA0~BA1 Bank Addres s Selects bank to be activated during RAS activity.
Selects bank to be read/written during CAS activity.
A0~A12 Address Row Address : RA0~RA12
Column Address : CA0~CA9
Auto Precharge : A10
/RAS, /C AS, /WE Row Address Strobe,
Column Address Strobe,
Write Enable
RAS, CAS and WE define the operation.
Refer function truth table for details.
LDQM,UDQM Data Input/Output Mask Controls output buffers in rea d mode and masks input data in
write mode.
DQ0~DQ15 Data Input/Output M ultiplexed data input/output pin.
VDD/VSS Power Supply/Ground Pow er supply for internal circuits a nd input buffers .
VDDQ/VSSQ Data Output Power/Ground Power supply for output buffers.
NC No Connection No connection.
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BANK D
ROW DECODER
BANK C
ROW DECODER
TCSR
PASR
Figure2: Functional Block Diagram
CONTROL LOGIC
COMMA ND DECOD ER
COLUMN
ADDRESS
BUFFER &
BURST
COUNTER
CLOCK
GENERATOR
CLK
CKE
ROW
ADDRESS
BUFFER &
REFRESH
COUNTER
/CS
/RAS
/CAS
/WE
MODE
REGISTER
BANK B
ROW DECODER
BANK A
ROW DECODER
SENSE A MPL IF IER
COL UMN DECO DER
& LATCH CIRCUIT
DQ
DQM
ADDRESS
DATA CONTROL CIRCUIT
LATCH CIRCUIT
INPUT & OUTPUT
BUFFER
EXTENDED
MODE
REGISTER
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CKE
CKE
IDLE
ROW
ACTIVE
SELF
REFRESH
CBR
REFRESH
POWER
DOWN
ACTIVE
POWER
DOWN
READ WRITE
READ A WRITE A
PRE-
CHARGE
READ
SUSPEND
READ A
SUSPEND
WRITE
SUSPEND
WRITE A
SUSPEND
POWER
ON
MODE
REGISTER
SET
PRECHARGE
CKE
CKE
CKE
CKE
CKE
CKE
READ
WRITE
CKE
CKE
READ
WRITE
PRE
ACT
REF
MRS
Automatic Seque nce
Manual Input
Figure3: Simpl if ied S ta te Dia gra m
EXTENDED
MODE
REGISTER
SET
DEEP
POWER
DOWN
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WB
Burst Type
Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type and is
selected via bit M3. The ordering of accesses within a burst is determined by the burst length, the burst type and the starting column
address, as shown in Table 3.
Table 3: Burst Definition
M9 Write Burst Mode
0 Burst Read and Burst Write
1 Burst Re ad and Sing le Write
M3 Burst Type
0 Sequential
1 Interleave
M6 M5 M4 CAS Late ncy
0 0 0 Reserved
0 0 1 Reserved
0 1 0 2
0 1 1 3
1 0 0 Reserved
1 0 1 Reserved
1 1 0 Reserved
1 1 1 Reserved
M2 M1 M0 Burst Length
M3 = 0 M3 = 1
0 0 0 1 1
0 0 1 2 2
0 1 0 4 4
0 1 1 8 8
1 0 0 Reserved Reserved
1 0 1 Reserved Reserved
1 1 0 Reserved Reserved
1 1 1 Full P age Reserved
Burst
Length
Starting Col umn
Address Order of Access Within a Burst
Sequential Interleaved
A2 A1 A0
2 0 0-1 0-1
1 1-0 1-0
4
0 0 0-1-2-3 0-1-2-3
0 1 1-2-3-0 1-0-3-2
1 0 2-3-0-1 2-3-0-1
1 1 3-0-1-2 3-2-1-0
8
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7
0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6
0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5
0 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4
1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3
1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2
1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1
1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
Full
Page n=A0-9
(Location 0 -1,023)
Cn, Cn+1. Cn+2,
Cn+3, Cn+4…
…Cn-1, Cn... Not Supported
Note :
1. For full-page accesses: y = 1024
2. For a burst length of two, A1-A9 select the block-
of-two burst; A0 selects the starting column within the
block.
3. For a burst length of four, A2-A9 select the block-
of-four burst; A0-A1 select the starting column within
the block.
4. For a burst length of eight, A3-A9 select the
block-of-eight burst; A0-A2 select the starting column
within the block.
5. For a full-page burst, the full row is selected and A0-A9
select the starting column.
6. Whenever a boundary of the block is reached within a
given sequence above, the following access wraps
within the block.
7. For a burst length of one, A0-A9 select the unique
column to be accessed, and mode register bit M3 is
ignored.
0 CAS Latency BT Burst Length
Address Bus
0 1 2 3 4 5 6 10 9 8 7 11
A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11
Mode Register (Mx)
0 0
0
Figure4: Mode Register Def ini tion
Note: M14(BA1) and M13(BA0) must be set to “0” to select Mode Register (vs . the Extended Mode Regis ter)
BA0
BA1
0
12
13
0 0
14
A12
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0 PASR
Figure5: Extended Mode Register
Address Bus
Extend ed Mod e Regi st er (Ex)
0 1 2 3 4 5 6 10 9 8 7 11
A0 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 A11
E2 E1 E0 Self Refresh Coverage
0 0 0 All Banks
0 0 1 Two Banks (BA1=0)
0 1 0 One Bank (BA1=BA0=0)
0 1 1 Reserved
1 0 0 Reserved
1 0 1 Reserved
1 1 0 Reserved
1 1 1 Reserved
Note: E14(BA1) must be set to “1” and E13(BA0 ) must be set to “0” to select Extended Mode Register (vs. the base Mode
Register)
E6 E5 Driver Strength
0 0 Full Strength
0 1 1/2 Strength
1 0 1/4 Strength
1 1 1/8 Strengt h
0 0 0 0 DS
BA0
BA1
0
12
13
0 0
0
1
14
A12
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In general, this 512Mb SDRAM (8M x 16Bits x 4banks) is a multi-bank DRAM that operates at 1.8V and includes a synchronous
interface (all signals are registered on the positive edge of the clock signal, CLK). Each of the 134,217,728-bit banks is organized as
8,192 rows by 1,024 columns by 16-bits
Read and write accesses to the SDRAM are burst oriented; accesses start at a selected location and continue for a programmed
number of locations in a programmed sequence. Accesses begin with the registration of an ACTIVE command, which is then followed
by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and
row to be accessed (BA0-BA1 select the bank, A0-A12 select the row). The address bits (BA0-BA1 select the bank, A0-A9 select the
column) registered coincident with the READ or WRITE command are used to select the starting column location for the burst access.
Prior to normal operation, the SDRAM must be initialized. The following sections provide detailed information covering device
initialization, register definition, command descriptions and device operation.
Power up and Initialization
SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in
undefined operation. Once power is applied to VDD and VDDQ(simultaneously) and the clock is stable(stable clock is defined as a
signal cycling within timing constraints specified for the clock pin), the SDRAM requires a 200µs delay prior to issuing any command
other than a COMMAND INHIBIT or NOP. CKE must be held high during the entire initialization period until the PRECHARGE command
has been issued. Starting at some point during this 200µs period and continuing at least through the end of this period, COMMAND
INHIBIT or NOP commands should be applied.
Once the 200µs delay has been satisfied with at least one COMMAND INHIBIT or NOP command having been applied, a PRECHARGE
command should be applied. All banks must then be precharged, thereby placing the device in the all banks idle state.
Once in the idle state, two AUTO REFRESH cycles must be performed. After the AUTO REFRESH cycles are complete, the SDRAM is
ready for mode register programming. Because the mode register will power up in an unknown state, it should be loaded prior to
applying any operational command. And a extended mode register set command will be issued to program specific mode of self
refresh operation(PASR). The following these cycles, the Mobile SDRAM is ready for normal operation.
Register Definition
Mode Register
The mode register is used to define the specific mode of operation of the SDRAM. This definition includes the selection of a burst
length, a burst type, a CAS latency, an operating mode and a write burst mode. The mode register is programmed via the LOAD
MODE REGISTER command and will retain the stored information until it is programmed again or the device loses power.
Mode register bits M0-M2 specify the burst length, M3 specifies the type of burst (sequential or interleaved), M4-M6 specify the CAS
latency, M7 and M8 specify the operating mode, M9 specifies the write burst mode, and M10-M12 should be set to zero. M13 and M14
should be set to zero to prevent the setting of the extended mode register.
The mode register must be loaded when all banks are idle, and the controller must wait the specified time before initiating the
subsequent operation. Violating either of these requirements will result in unspecified operation.
Functional Description
Extended Mode Register
The Extended Mode Register controls the functions beyond those controlled by the Mode Register. These additional functions are
special features of the BATRAM device. They include Partial Array Self Refresh (PASR) and Driver Strength (DS).
The Extended Mode Register is programmed via the Mode Register Set command and retains the stored information until it is
programmed again or the device loses power.
The Extended Mode Register must be programmed with E7 through E12 set to “0”, and E14 must be set to “1” and E13 must be set to
“0”. The Extended Mode Register must be loaded when all banks are idle and no bursts are in progress, and the controller must wait
the specified time before initiating any subsequent operation. Violating either of these requirements results in unspecified operation.
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Burst Length
Read and write accesses to the SDRAM are burst oriented, with the burst length being programmable, as shown in Figure 1. The burst
length determines the maximum number of column locations that can be accessed for a given READ or WRITE command. Burst
lengths of 1, 2, 4 or 8 locations are available for both the sequential and the interleaved burst types, and a full-page burst is available
for the sequential type. The full-page burst is used in conjunction with the BURST TERMINATE command to generate arbitrary burst
lengths.
Reserved states should not be used, as unknown operation or incompatibility with future versions may result. When a READ or WRITE
command is issued, a block of columns equal to the burst length is effectively selected. All accesses for that burst take place within
this block, meaning that the burst will wrap within the block if a boundary is reached. The block is uniquely selected by A1-A9 when
the burst length is set to two; by A2-A9 when the burst length is set to four; and by A3-A9 when the burst length is set to eight. The
remaining (least significant) address bit(s) is (are) used to select the starting location within the block. Full-page bursts wrap within
the page if the boundary is reached.
Bank(Row) Active
The Bank Active command is used to activate a row in a specified bank of the device. This command is initiated by activating CS, RAS and
deasserting CAS, WE at the positive edge of the clock. The value on the BA0-BA1 selects the ba nk, and the value on the A0-A12 selects
the row.
This row remains active for column acces s until a precharge command is issued to that bank. Read and write operations can only b e
initiated on this activated bank after the minimum tR CD time is passed from the activate command.
Read
The READ command is used to initiate the burst read of data. This comma nd is initiated by activating CS, CAS, and dea sserting WE, RAS at
the positive edge of the clock. BA0-BA1 input select the bank, A0 -A9 address inputs select the starting c olumn loc ation. T he value on input
A10 determines whether or not Auto Precharge is used. If Auto Precharge is selected the row being accessed w ill be precharged at the
end of the READ burst; if Auto Precharge is not selected, the row will remain active for subsequent accesses. The length of burst a nd the
CAS latency will be determined by the va lues programmed during the MRS command.
Write
The WRITE command is used to initiate the burs t write of data. This command is initiated by activating CS, CAS, WE and deas serting RAS
at the positive ed ge of the clock. BA0-BA1 input select the bank, A0-A9 address inputs select the starting column location. The value on
input A10 determines whether or not Auto Precharge is used. If Auto Pr e charge is selected the row being accessed w ill be precharged at
the end of the WRITE burst; if Auto Precharge is not selected, the row will remain active for subsequent accesses.
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CAS Latency
The CAS latency is the delay, in clock cycles, between the registration of a READ command and the availability of the first piece of
output data. The latency can be set to two or three clocks. If a READ command is registered at clock edge n, and the latency is
m
clocks, the data will be available by clock edge
n +
m. The DQs will start driving as a result of the clock edge one cycle earlier
(n + m
-
1), and provided that the relevant access times are met, the data will be valid by clock edge
n +
m. For example, assuming that the
clock cycle time is such that all relevant access times are met, if a READ command is registered at T0 and the latency is programmed to
two clocks, the DQs will start driving after T1 and the data will be valid by T2, as shown in Figure 6. Reserved states should not be used
as unknown operation or incompatibility with future versions may result.
Operating Mode
The normal operating mode is selected by setting M7 and M8 to zero; the other combinations of values for M7 and M8 are reserved
for future use and/or test modes. The programmed burst length applies to both READ and WRITE bursts. Test modes and reserved
states should not be used because unknown operation or incompatibility with future versions may result.
Write Burst Mode
When M9 = 0, the burst length programmed via M0-M2 applies to both READ and WRITE bursts; when M9 = 1, the programmed
burst length applies to READ bursts, but write accesses are single-location (nonburst) accesses.
CLK
COMMAND
DQ
NOP NOP
Dout
T0 T1 T2
tLZ tOH
tAC
CAS Latency=2
T3
READ
CLK
COMMAND
DQ
NOP NOP
Dout
T0 T1 T2
tLZ tOH
tAC
CAS Latency=3
T3
NOP
T4
READ
DON’T CARE
UNDEFINED
Figure6: CAS Latency
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Table4: Command Truth Table
Function CKEn-1 CKEn /CS /RAS /CAS /WE DQM ADDR A10 Note
Command Inhinit (NOP) H X H X X X X X
No Operation (NOP) H X L H H H X X
Mode Register Set H X L L L L X OP CODE 4
Extended Mode Register Set H X L L L L X OP CODE 4
Active (selec t bank and
activate row) H X L L H H X Bank/Row
Read H X L H L H L/H Bank/Col L 5
Read with Autoprecharge H X L H L H L/H Bank/Col H 5
Write H X L H L L L/H Bank/Col L 5
Write with Autoprecharge H X L H L L L/H Bank/Col H 5
Precharge All Banks H X L L H L X X H
Precharge Selected Bank H X L L H L X Bank L
Burst Stop H H L H H L X X
Auto Refresh H H L L L H X X 3
Self Refresh Entry H L L L L H X X 3
Self Refresh Exit L H H X X X X X 2
L H H H
Precharge Power Down Entry H L H X X X X X
L H H H
Precharge Dow n Exit L H H X X X X X
L H H H
Clock Suspend Entry H L H X X X X X
L V V V
Clock Suspend Exit L H X X X
Deep Power Down Entry H L L H H L X X 6
Deep Power Down Exit L H X X X
Note :
1. CKEn is the logic state of CKE at clock edge n; CKEn-1 was the state of CKE at the previous clock edge.
H: High Level, L: Low Level, X: Don't Care, V: Valid
2. Exiting Self R efresh oc curs by asynchronous ly bringing CKE from low to high and will put the device in the all banks idle state once
tXSR is met. Command Inhibit or NOP commands should be issued on any cloc k edges occuring during the tXSR period. A minimum
of two NOP commands must be provided during tXSR period.
3. During refresh operation, internal refr esh counter c ontrols row addressing ; all inputs and I/Os are “Don’t Care” except fo r CKE.
4. A0-A12 define OP CODE wr itten to the mode register, and BA [1:0] must be issued 0 in the mode register set, and 1 in the extended
mode register set.
5. DQM “L” means the data Write/Ouput Enable and “H” means the Write inhibit/Output High -Z. Write DQM Latency is 0 CLK and Read
DQM Latency is 2 CLK.
6. Standard SDRAM parts assign this command sequence as Burst Terminate. For Bat Ram parts, the Burst Terminate command is
assigned to the Deep Pow e r Down function.
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Table5: Function Truth Table
Current
State
Command Action Note
/CS /RAS /CAS /WE BA A0-A12 Description
Idle
L L L L OP CODE Mode Register Set Set the Mode Register 14
L L L H X X Auto or Self Refresh Start Auto or Self
Refresh 5
L L H L BA X Precharge No Operation
L L H H BA Row Add. Bank Activate Activate the Specified
Bank and Row
L H L L BA Col Add./ A10 Write/WriteAP ILLEGAL 4
L H L H BA Col Add./ A10 Read/ReadAP ILLEGAL 4
L H H H X X No Operation No Operation 3
H X X X X X Device Deselect No Operation or Power
Down 3
Row
Active
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge Precharge 7
L L H H BA Row Add. Bank Activate ILLEGAL 4
L H L L BA Col Add./A10 Write/Write AP Start Write : Optional
AP(A10=H) 6
L H L H BA Col Add./A10 Read/Read A P Start Read : Optional
AP(A10=H) 6
L H H H X X No Operation No Operation
H X X X X X Device Deselect No Operation
Read
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge Termination Burst :
Start the Precharge
L L H H BA Row Add. Bank Activate ILLEGAL 4
L H L L BA Col Add./A10 Write/WriteAP Termination Burs t :
Start Write(AP) 8,9
L H L H BA Col Add./A10 Read/Rea d AP Terimination Burst :
Start Read(AP) 8
L H H H X X No Operation Continue the Burst
H X X X X X Device Deselect Continue the Burst
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Table5: Function Truth Table
Current
State
Command Action Note
/CS /RAS /CAS /WE BA A0-A12 Description
Write
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge Termination Burst :
Start the Precharge 10
L L H H BA Row Add. Bank Activate ILLEGAL 4
L H L L BA Col Add./A10 Write/WriteAP T ermination Burst :
Start Write(AP) 8
L H L H BA Col Add./A10 Read/ReadAP Terimination Burs t :
Start READ(AP) 8,9
L H H H X X No Operation Continue the Burst
H X X X X X Device Deselect Continue the Burst
Read
with
Auto
Precharge
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge ILLEGAL 4,12
L L H H BA Row Add. Bank Activate ILLEGAL 4,12
L H L L BA Col Add./A10 Write/WriteAP ILLEGAL 12
L H L H BA Col Add./A10 Read/ReadAP ILLEGAL 12
L H H H X X No Operation Continue the Burst
H X X X X X Device Deselect Continue the Burst
Write
with
Auto
Precharge
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge ILLEGAL 4,12
L L H H BA Row Add. Bank Activate ILLEGAL 4,12
L H L L BA Col Add./A10 Write/WriteAP ILLEGAL 12
L H L H BA Col Add./A10 Read/ReadAP ILLEGAL 12
L H H H X X No Operation Continue the Burst
H X X X X X Device Deselect Continue the Burst
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Table5: Function Truth Table
Current
State
Command Action Note
/CS /RAS /CAS /WE BA A0-A12 Description
Precharging
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge No Operation : Bank(s)
Idle after tRP
L L H H BA Row Add. Bank Activate ILLEGAL 4,12
L H L L BA Col Add./ A10 Write/WriteAP ILLEGAL 4,12
L H L H BA Col Add./ A10 Read/ReadAP ILLEGAL 4,12
L H H H X X No Operation No Opera tion : Bank(s)
Idle after tRP
H X X X X X Device Deselect No Operation : Bank(s)
Idle after tRP
Row
Activating
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge ILLEGAL 4,12
L L H H BA Row Add. Bank Activate ILLEGAL 4,11,12
L H L L BA Col Add./A10 Write/Write AP ILLEGAL 4,12
L H L H BA Col Add./A10 Read/Rea d AP ILLEGAL 4,12
L H H H X X No Operation No Operation : ROw
Active after tRCD
H X X X X X Device Deselect No Operation : ROw
Active after tRCD
Write
Recovering
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge ILLEGAL 4,13
L L H H BA Row Add. Bank Activate ILLEGAL 4,12
L H L L BA Col Add./A10 Write/WriteAP Start Write : Optional
AP(A10=H)
L H L H BA Col Add./A10 Read/Read AP Start Write : Optional
AP(A10=H) 9
L H H H X X No Operation No Operation : Row
Active after tDPL
H X X X X X Device Deselect No Operation : Row
Active after tDPL
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Table5: Function Truth Table
Current
State
Command Action Note
/CS /RAS /CAS /WE BA A0-A12 Description
Write
Recovering
with
Auto
Precharge
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge ILLEGAL 4,13
L L H H BA Row Add. Bank Activate ILLEGAL 4,12
L H L L BA Col Add./ A10 Write/WriteAP ILLEGAL 4,12
L H L H BA Col Add./ A10 Read/ReadAP ILLEGAL 4,9,12
L H H H X X No Operation No Operation :
Precharge after tDPL
H X X X X X Device Deselect No Operation :
Precharge after tDPL
Refreshing
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge ILLEGAL 13
L L H H BA Row Add. Bank Activate ILLEGAL 13
L H L L BA Col Add./A10 Write/Write AP ILLEGAL 13
L H L H BA Col Add./A10 Read/Rea d AP ILLEGAL 13
L H H H X X No Operation No Operation : Idle
after tRC
H X X X X X Device Deselect No Operation : Idle
after tRC
Mode
Register
Accessing
L L L L OP CODE Mode Register Set ILLEGAL 13,14
L L L H X X Auto or Self Refresh ILLEGAL 13
L L H L BA X Precharge ILLEGAL 13
L L H H BA Row Add. Bank Activate ILLEGAL 13
L H L L BA Col Add./A10 Write/WriteAP ILLEGAL 13
L H L H BA Col Add./A10 Read/Rea d AP ILLEGAL 13
L H H H X X No Operation No Operation : Idle
after 2 Clock Cycle
H X X X X X Device Deselect No Operation : Idle
after 2 Clock Cycle
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Note :
1. H: Logic High, L: Logic Low, X : Don't care, BA: Bank Address, AP: Auto Precharge.
2. All entries a ssume that CKE was active during the preceding clock cyc le.
3. If both banks are idle and CKE is inactive, then in power down cycle
4. Illegal to bank in specified states . Func tion may be legal in the bank indicated by Bank Address ,
d e pending on the state of that bank.
5. If both banks are idle and CKE is inactive, then Self Refresh mode.
6. Illegal if tR C D is not satisfied.
7. Illegal if tR AS is not satisfied.
8. Must satisfy burst interrupt c ondition.
9. Must satisfy bus contention, bus turn around, and/or write recovery requirements .
10. Must mask preceding data which don't satis fy tDPL.
11. Illegal if tRRD is not satisfied
12. Illegal for single bank, but legal for other banks in multi-bank devices.
13. Illegal for all banks.
14. Mode R egis ter Set and Extended Mode Register Set is same command truth table except BA.
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Table6: CKE Truth Table
Current
State
CKE Command
Action Note
Prev
Cycle Current
Cycle /CS /RAS /CAS /WE BA A0-A12
Self
Refresh
H X X X X X X X INVALID 2
L H H X X X X X Exit Self Refresh with Device
Deselect 3
L H L H H H X X E xit Self Refresh with No
Operation 3
L H L H H L X X ILLEGAL 3
L H L H L X X X ILLEGAL 3
L H L L X X X X ILLEGAL 3
L L X X X X X X M aintain Self R efresh
Power
Down
H X X X X X X X INVALID 2
L H H X X X X X Power Down Mode Exit, All
Banks Idle 3
L H H H X X
L H L
L X X X X ILLEGAL
3
X L X X X
X X L X X
L L X X X X X X M aintain Pow er Down Mode
Deep
Power
Down
H X X X X X X X INVALID 2
L H X X X X X X Deep Power Down Mode Set 6
L L X X X X X X Maintain Deep Power Down
Mode
All
Banks
Idle
H H H X X X Refer to the Idl e State
section of the Current State
Truth Table
4
H H L H X X 4
H H L L H X 4
H H L L L H X X Auto Refresh
H H L L L L OP CODE Mode Register Set 5
H L H X X X Refer to the Idle State
section of the Current State
Truth Table
4
H L L H X X 4
H L L L H X 4
H L L L L H X X Entry Self Refresh 5
H L L L L L OP CODE Mode Register Set
L X X X X X X X Power Down 5
Any
State
other
than
listed
above
H H X X X X X X Refer to Operations of the
Current State Truth Table
H L X X X X X X Begin Clock Suspend next
cycle
L H X X X X X X Exit Clock Suspend next
cycle
L L X X X X X X Maintain Clock Sus pend
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IS42/45VM16320D
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Note :
1. H: Logic High, L: Logic Low, X : Don't care
2. For the given current state CKE must be low in the previous cycle.
3. When CKE has a low to high transition, the clock and other inputs are re-enab le d asynchronously. When exiting power down mode ,
a NOP (or Device Deselect) command is required on the first positive ed ge of clock after CKE goes high.
4. The address inputs depend on the comm and that is issued.
5. The Precharge Power Down mode, the Self Refresh mode, and the Mode Register Set can only be entered from the all banks idle state.
6. When CKE has a low to high transition, the clock and other inputs are re-enab led asynchronous ly.
When exiting dee p power down mod e , a NOP (or Device Deselect) command is required on the first positive edge of clock after CKE goes
high and is maintained for a minimum 300usec.
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Table7: Absolute Ma ximum Rating
Parameter Symbol Rating Unit
Ambient Operating Temperature (Ind ustrial)
TA
-40 ~ 85
°C Ambient Operating Temperature (Automotive, A1) -40 ~ 85
Ambient Operating Temperature (Automotive, A2) -40 ~ 105
Storage Temperature TSTG -55 ~ 150 °C
Voltage on Any Pin relative to VSS VIN, VOUT -1.0 ~ 2.6 V
Voltage on VDD relative to VSS VDD, VDDQ -1.0 ~ 2.6 V
Short Circuit Output Current IOS 50 mA
Power Dissipation PD 1 W
Note :
Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only, and functional operation of the device at these or any other conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Table8: Capacitance (TA=25 °C, f=1MHz, VDD=1.8V)
Parameter Pin Symbol Min Max Unit
Input Capacitance CLK CI1 2 4 pF
A0~A12, BA0~BA 1, C K E, /C S, /RA S ,
/CAS, /WE, LDQM, UDQM CI2 2 4 pF
Data Input/Output Capacitance DQ0~DQ15 CIO 2 6 pF
Table9: DC Opera ting Condition (Vo ltage r efer enced t o VSS=0V, TA: within specified operat in g tem perat u r e ran ge)
Parameter Symbol Min Typ Max Unit Note
Power Supply Voltage VDD 1.7 1.8 1.95 V
VDDQ 1.7 1.8 1.95 V 1
Input High Voltage VIH 0.8 x VDDQ - VDDQ+0.3 V 2
Input Low Voltage VIL -0.3 0 0.3 V 3
Output High Voltage VOH VDDQ 0.2 - - V IOH= -0.1mA
Output Low Voltage VOL - - 0.2 V IOL= +0.1mA
Input Leakage Current ILI -1 - 1 uA 4
Output Leakage Current ILO -1.5 1.5 uA 5
Note :
1. VDDQ must not exceed the level of VDD
2. VIH(max) = 2.2V AC. The overshoot voltage duration is 3ns.
3. VIL(min) = -1.0V AC. The overshoot voltage duration is 3ns.
4. Any input 0V VIN VDDQ.
I nput leakage currents include Hi-Z output leakage for all bi-directional buffer s with tri-s tate outputs .
5. DOUT is disabled, 0V VOUT VDDQ.
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Table10: AC Operating Condition (TA: within specified operating temperature range, VDD = 1.8V, VSS=0V)
Parameter Symbol Typ Unit
AC Input High/Low Level Voltage VIH / VIL 0.9 x VDDQ / 0.2 V
Input Timing Measurement Referenc e Level Voltage VTRIP 0.5 x VDDQ V
Input Rise / Fall Time tR / t F 1 / 1 ns
Output Timing Meas urement Refer ence Level Voltag e VOUTREF 0.5 x VDDQ V
Output Load Capacitance for Ac cess Time Measurem e nt CL 30 pF
Output
14K
14K
1.8V
30pF
Output
30pF
50
VTT=0.5 x VDDQ
Z0=50
DC Output Load Circuit AC Output Load Circuit
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Table11: DC Character i st i c (DC operating conditions unless otherwise noted) (2)
Parameter Sym Test Conditio n Speed Unit Note
-6 -75
Operating Current IDD1 Burst Length=1, One Bank Active,
tRC tRC(min) IOL = 0 mA 70 65 mA 1
Precharge Standby Current
in Power Dow n Mode IDD2P CKE VIL(max), tCK = 10ns 0.4 mA
IDD2PS CKE & CLK VIL( ma x ), tCK = 0.4
Precharge Standby Current
in Non P ower Down Mode
IDD2N CKE VIH(min), /CS VIH(min), tCK = 10ns
Input signals are changed one time during 2 clks. 5 mA
IDD2NS CKE VIH(min), CLK VIL(max), tCK =
Input signals are stable. 2
Active Standby Current
in Power Dow n Mode IDD3P CKE VIL(max), tCK = 10ns 6 mA 3,4
IDD3PS CKE & CLK VIL( ma x ), tCK = 6
Active Standby Current
in Non P ower Down Mode
IDD3N CKE VIH(min), /CS VIH(min), tCK = 10ns
Input signals are changed one time during 2 clks. 15 mA 3,4
IDD3NS CKE VIH(min), CLK VIL(max), tCK =
Input signals are stable. 10
Burst Mode Operating Current IDD4 tCK>tCK(min), IOL = 0 mA, Page Burst
All Banks Activated, tCCD = 1 clk 110 100 mA 1
Auto Refresh Current (8K Cycle) IDD5 tRC tRFC(min), All Banks Active 90 mA
Self
Refresh
Current
PASR TCSR
IDD6 CKE 0.2V uA 5
4 banks 85°C 800
40°C 560
2 Bank 85°C 550
40°C 380
1 Bank 85°C 450
40°C 310
Deep Power Down Mode Current IDD7 10 uA 5,6
Note :
1. Measured with outputs open.
2. Unless other wise noted, input swing le vels are CMOS (VIH = VDDQ, VIL = VSSQ).
3. Address and other input signals transition one time ever y tw o clocks.
4. For A2 temperature grade with TA > 85°C: IDD3P, IDD3PS, IDD3N, and IDD3NS are derated to 5 0% above the values.
5. Self-refresh Mode and Deep Power Down Mode are not supported for A2 grade with TA > 85°C.
6. Typical value at room temperature.
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Table12: AC Character i st i c (AC operation conditions unless otherwise noted)
Parameter Sym -6 -75 Unit Note
Min Max Min Max
CLK Cycle Time CL = 3 tCK3 6 1000 7.5 1000
ns
1
CL = 2 tCK2 10 10
Access time from CLK (pos. edge) CL = 3 tAC3 5.4 6 2
CL = 2 tAC2 8 8
CLK High-Level Width tCH 2 2.5 3
CLK Low-Level Width tCL 2 2.5 3
CKE Setup Time tCKS 1.5 1.5
CKE Hold Time tCKH 1.0 1.0
/CS, /RAS, /CAS, /WE, DQM Setup Time tCMS 1.5 1.5
/CS, /RAS, /CAS, /WE, DQM Hold Time tCMH 1.0 1.0
Address Setup Time tAS 1.5 1.5
Address Hold Time tAH 1.0 1.0
Data-In Setup Time tDS 1.5 1.5
Data-In Hold Time tDH 1.0 1.0
Data-Out High-Impedance Time
from CLK (pos.edge) CL = 3 tHZ3 5.4 6 4
CL = 2 tHZ2 8 8
Data-Out Low-Impedance Time tLZ 1.0 1.0
Data-Out Hold Time (l oad) tOH 2.5 3
ACTIVE to PRECHARGE command tRAS 42 100K 45 100K
PRECHARGE command period tRP 18 22.5
ACTIVE bank a to ACTIVE bank a command tRC 60 67.5 5
ACTIVE bank a to ACTIVE bank b command tRRD 12 15
ACTIVE to READ or WRITE delay tRCD 18 22.5
READ/WRITE command to READ/WRITE
command tCCD 1 1 CLK 6
Data-in to PRECHARGE command tDPL 15 15 ns 7
Data-in to ACTIVE command tDAL 33 37.5 7
LOA D MOD E REGIS TER com man d to ACTIVE
or REFRESH c omm and tMRD 2 2
CLK
8
Data-out to high-impedance from
PRECHARGE command CL = 3 tROH3 3 3 6
CL = 2 tROH2 2 2
Last data-in to burst STOP command tBDL 1 1 6
Last data-in to new READ/WRITE command tCDL 1 1 6
Refresh period (8,192 rows) tREF 64 64 ms 10
AUTO REFRESH peri od tRFC 110 110 ns 5
Exit SELF REFRESH to ACTIVE command tXSR 110 110 5
Transition time tT 0.5 1.2 0.5 1.2
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IS42/45VM16320D
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Note :
1. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the
clock pin) during access or precharge states (READ, WRITE, including tDPL, and PRECHARGE commands). CKE may be used to
reduce the data rate.
2. tAC at CL = 3 with no load is 5.5ns and is guaranteed by design. Access time to be measured with input signals of 1V/ns edge
rate, from 0.8V to 0.2V. If tR > 1ns, then (tR/2-0.5)ns should be added to the parameter.
3. AC characteristics assume tT = 1ns. If tR & tF > 1ns, then [(tR+tF)/2-1]ns should be added to the parameter.
4. tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. The last valid
data element will meet tOH before going High-Z.
5. Parameter guaranteed by design.
A. Target values listed with alternative values in parentheses.
B. tRFC must be less than or equal to tRC+1CLK
tXSR must be less than or equal to tRC+1CLK
6. Required clocks are specified by JEDEC functionality and are not dependent on any timing parameter.
7. Timing actually specified by tDPL plus tRP; clock(s) specified as a reference only at minimum cycle rate
8. JEDEC and PC100 specify three clocks.
9. A new command can be given tRC after self refresh exit.
10. The specification in the table for tREF is applicable for all temperature grades with TA +85°C. Only A2 automotive temperature
grade supports operation with TA > +85°C, and this value must be further constrained with a maximum tREF of 16ms.
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IS42/45VM16320D
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Temperature Compensated Self Refresh
Temperature Compensated Self Refresh allows the controller to program the Refresh interval during SELF REFRESH mode, according to
the case temperature of the Mobile SDRAM device. This allows great power savings during SELF REFRESH during most operating
temperature ranges. Only during extreme temperatures would the controller have to select a TCSR level that will guarantee data during
SELF REFRESH.
Every cell in the DRAM requires refreshing due to the capacitor losing its charge over time. The refresh rate is dependent on
temperature. At higher temperatures a capacitor loses charge quicker than at lower temperatures, requiring the cells to be refreshed
more often. Historically, during Self Refresh, the refresh rate has been set to accommodate the worst case, or highest temperature
range expected.
Thus, during ambient temperatures, the power consumed during refresh was unnecessarily high, because the refresh rate was set to
accommodate the higher temperatures.
This temperature compensated refresh rate will save power when the DRAM is operating at normal temperatures.
Partial Array Self Refresh
For further power savings during SELF REFRESH, the PASR feature allows the controller to select the amount of memory that will be
refreshed during SELF REFRESH. The refresh options are All Banks, Two Banks, and One Bank. WRITE and READ commands can still
occur during standard operation, but only the selected banks will be refreshed during SELF REFRESH. Data in banks that are disabled
will be lost.
Deep Power Down
Deep Power Down is an operating mode to achieve maximum power reduction by eliminating the power of the whole memory array of
the devices. Data will not be retained once the device enters Deep Power Down Mode.
This mode is entered by having all banks idle then /CS and /WE held low with /RAS and /CAS held high at the rising edge of the clock,
while CKE is low. This mode is exited by asserting CKE high. The Power up and Initialization sequence must be applied following Deep
Power Down Exit before normal operation can resume. This mode is not supported with TA > +85°C.
Special Operation for Low Power Consumption
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Figure7: Deep P ower D own Mode Entry
Figure8: Deep P ower D own Mode Exit
Precharge if needed Deep Power Down Entry
tRP DON’T CARE
/CS
/RAS
/CAS
/WE
CLK
CKE
100 µ s tRP tRFC
Deep Power Down Exit
All Banks Precharge
Auto Refresh Mode Register Set
Extended Mode Register Set
New Command
Auto Refresh
DON’T CARE
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IS42/45VM16320D
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Configuration Frequency
(MHz) Speed
(ns) Order Part No. Package
32Mx16 166 6 IS42VM16320D-6BLI 54-ball BGA, Lead-free
133 7.5 IS42VM16320D-75BLI 54-ball BGA, Lead-free
Ordering Inform ation VDD = 1.8V
Industrial Range: (-40oC to +85oC)
Configuration Frequency
(MHz) Speed
(ns) Order Part No. Package
32Mx16 133 7.5 IS45VM16320D-75BLA1 54-ball BGA, Lead-free
Automotive Range, A1: (-40oC to +85oC)
Configuration Frequency
(MHz) Speed
(ns) Order Part No. Package
32Mx16 133 7.5 IS45VM16320D-75BLA2 54-ball BGA, Lead-free
Automotive Range, A2: (-40oC to +105oC)
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IS42/45VM16320D
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