PCIMX516AJM6C - Freescale Semiconductor / Motorola

Preliminary—Subject to Change Without Notice

Freescale Semiconductor

Data Sheet: Advance Information

Document Number: IMX51AEC

Rev. 1, 11/2009

IMX51A

Package Information

Plastic Package

Case 2017 19 x 19 mm, 0.8 mm pitch

Ordering Information

See Ta bl e 1 on page 2 for ordering information.

This document contains information on a new product. Specifications and information herein

are subject to change without notice.

1 Introduction

The MCIMX51A (i.MX51A) Automotive Infotainment

Processor represents Freescale Semiconductor ’s latest

addition to a growing family of multimedia focused

products offering high performance processing with a

high degree of functional integration, aimed at the

growing automotive infotainment ma rket. This device

includes two graphics processors, 720p video

processing, dual display, and many I/Os.

The i.MX51A processor features Freescale’ s advanced

implementation of the ARM Cortex A8™ core, targeting

speeds up to 600 MHz with 200 MHz I/O bus clock

DDR2 and mobileDDR . This device is well-suited for

graphics rende ring for HMI and navigation, high

performance speech processing with large data bases,

video processing and display, audio playback and

ripping, and many other applications.

i.MX51A Automotive and

Infotainment Applications

Processors

1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

1.1 Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . 2

1.2 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

2.1 Special Signal Considerations. . . . . . . . . . . . . . . . 11

3 Electrical Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . 13

3.1 Chip-Level Conditions . . . . . . . . . . . . . . . . . . . . . . 13

3.2 Supply Power-Up/Power-Down Requirements and

Restrictions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19

3.3 I/O DC Parameters . . . . . . . . . . . . . . . . . . . . . . . . 20

3.4 Output Buffer Impedance Characteristics . . . . . . . 26

3.5 I/O AC Parameters . . . . . . . . . . . . . . . . . . . . . . . . 29

3.6 Module Timing. . . . . . . . . . . . . . . . . . . . . . . . . . . . 34

3.7 External Peripheral Interfaces . . . . . . . . . . . . . . . . 58

4 Package Information and Contact Assignments . . . . . . 135

4.1 19 × 19 mm Package Information . . . . . . . . . . . . 135

4.2 19 x 19 mm, 0.8 Pitch Ball Map. . . . . . . . . . . . . . 153

5 Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 157

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

2Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Introduction

Features of the i. MX51A processor include the following:

• Smart Speed Technology—The i.MX51A device has power management throughout the IC that

enables the rich suite of multimedia feature a nd peripherals to achieve minimum power

consumption in both active and various low power modes. Smart Speed Technology enables the

designer to deliver a feature-rich product that requires levels of power that are far less than ind ustry

expectations.

• Multimedia —The multimedia perfor mance of the ARM Cortex A8 is enhanc ed wi th a multi-le vel

cache system, a Multi-standar d Hardware Video CODECs, autonomous image pr oces sing unit,

multi-standard audio CODECs, Neon (an advanced SIMD, 32 bit single-precision floating point

support and vector floating point co-processor), and a programmable smart DMA controller.

• Powerful Graphics Acceleration—The i.MX51A processor has an integrated Graphics Processing

Unit which includes an OpenGl 2.0 GPU that provides 27Mtri/sec, 166Mpix/s, and 664Mpix/s

z-plane performance. Silicon version 2.0 of the i.MX51A device includes an independent OpenVG

GPU operating at166Mpix/s.

• Interface Flexibility—The i.MX51A processor supports connections to all popular types of

external memories: mobile DDR, DDR2, PSRAM, NOR Flash, NAND Flash (MLC and SLC), and

OneNAND (managed NAND). The i.MX51A processor also includes a rich multime dia suite of

interfaces: LCD controller for two displays, CMOS sensor interface, High-Speed USB On-The-Go

plus three High-Speed USB hosts, high-speed MMC/SDIO, Fast Ethernet controller, UART, I2C,

I2S (SSI), and others.

1.1 Ordering Information

Table 1 provides the ordering information.

Table 1. Ordering Information

Part Number1

1Part numbers with a PC prefix indicate non-production engineering parts.

Mask Set Features

Junction

Temperature

Range (°C)

Package2

2Case 2017 and Case 2058 are RoHS compliant, lead-free, MSL = 3.

PCIMX511AJM6C M77X No hardware video codecs

No display or camera interfaces

–40 to 125 19 x 19 mm, 0.8 mm pitch BGA

Case 2017

PCIMX514AJM6C M77X No hardware video codecs –40 to 125 19 x 19 mm, 0.8 mm pitch BGA

Case 2017

PCIMX516AJM6C M77X Full specification –40 to 125 19 x 19 mm, 0.8 mm pitch BGA

Case 2017

Introduction

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 3

Preliminary—Subject to Change Without Notice

1.2 Block Diagram

Figure 1 shows the functional modules of the processor.

Figure 1. Functional Block Diagram

Application Processor Domain (AP)

External

Memory I/F

Smart DMA

(SDMA)

SDMA Peripherals

AP Peripherals

ARM Cortex A8

Internal

RAM

DDR

Memory

NOR/Nand

Flash

Audio/Power

Management

ARM Cortex A8

L1 I/D cache

SSI

eSDHC (4)

SPBA

eCSPI

(1 of 2)

UART

SIM

Camera 1

Platform

P-ATA

RF/IF ICs SIM

Bluetooth WLAN USB-OTG MMC/SDIO Keypad

Neon and VFP

L2 cache

ETM, CTI0,1

XVR

JTAG IrDA

XVR Access.

Conn.

Video

LCD Display 2

LCD Display 1

Camera 2

Proc. Unit

(VPU)

Timers

CSPI

UART (3)

GPT

PWM (2)

EPIT (2)

GPIOx32 (4)

WDOG (2)

1-WIRE

C(2),HSI

IOMUXC

IIM

AUDMUX

KPP

SJC

AXI and AHB Switch Fabric

Boot

ROM

SSI (3)

RTIC

SCC

SRTC

CSU

Fuse Box

Clock and Reset

PLL (3)

CCM

GPC

SRC

Debug

DAP

TPIU

Graphics

TV-Out

TV Encoder

FIRI

Memory

SAHARA

Lite

Security

TZIC

USB PHY

SPDIF Tx

Image Processing

Subsystem

Battery Ctrl

Device

USB

Dev/Host

GPS

Ethernet

USB OTG +

3 HS Ports

Digital

Audio ATA HDD

CTI (2)

eCSPI

)

XTALOSC

(128 Kbytes)

CAMP (2)

FEC

3D Graphics

Proc Unit

(GPU)

2D Graphics

Proc Unit

(GPU2D)

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

4Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Features

2Features

The i.MX51A processor contains a large number of digital and analog modules that are described in

Table 2.

Table 2. i.MX51A Digital and Analog Modules

Block

Mnemonic Block Name Subsystem Brief Description

1-WIRE 1-Wire

Interface

Connectivity

Peripherals

1-Wire support provided for interfacing with an on-board EEPROM, and smart

battery interfaces, for example: Dallas DS2502.

ARM Cortex

A8™

ARM Cortex

A8™ Platform

ARM The ARM Cortex A8™ Core Platform consists of the ARM Cortex A8™

processor version r2p5 (with TrustZone) and its essential sub-blocks. It contains

the Level 2 Cache Controller, 32-Kbyte L1 instruction cache, 32-Kbyte L1 data

cache, and a 256-Kbyte L2 cache. The platform also contains an Event Monitor

and Debug modules. It also has a NEON co-processor with SIMD media

processing architecture, register file with 32 ×64-bit general-purpose registers,

an Integer execute pipeline (ALU, Shift, MAC), dual, single-precision floating

point execute pipeline (FADD, FMUL), load/store and permute pipeline and a

Non-Pipelined Vector Floating Point (VFP) co-processor (VFPv3).

Audio

Subsystem

Audio

Subsystem

Multimedia

Peripherals

The elements of the audio subsystem are three Synchronous Serial Interfaces

(SSI1-3), a Digital Audio Mux (AUDMUX), and Digital Audio Out (SPDIF TX).

See the specific interface listings in this table.

AUDMUX Digital Audio

Mux

Multimedia

Peripherals

The AUDMUX is a programmable interconnect for voice, audio, and

synchronous data routing between host serial interfaces (for example, SSI1,

SSI2, and SSI3) and peripheral serial interfaces (audio and voice codecs). The

AUDMUX has seven ports (three internal and four external) with identical

functionality and programming models. A desired connectivity is achieved by

configuring two or more AUDMUX ports.

CCM

GPC

SRC

Clock Control

Module

Global Power

Controller

System Reset

Controller

Clocks,

Resets, and

Power Control

These modules are responsible for clock and reset distribution in the system,

and also for system power management. The modules include three PLLs and

a Frequency Pre-Multiplier (FPM).

CSPI-1,

eCSPI-2

eCSPI-3

Configurable

SPI,

Enhanced

CSPI

Connectivity

Peripherals

Full-duplex enhanced Synchronous Serial Interface, with data rate up to

66.5Mbit/s (for eCSPI, master mode). It is configurable to support Master/Slave

modes, four chip selects to support multiple peripherals.

CSU Central

Security Unit

Security The Central Security Unit (CSU) is responsible for setting comprehensive

security policy within the i.MX51A platform, and for sharing security information

between the various security modules. The Security Control Registers (SCR) of

the CSU are set during boot time by the High Assurance Boot (HAB) code and

are locked to prevent further writing.

Debug

System

Debug

System

Control

The Debug System provides real-time trace debug capability of both instructions

and data. It supports a trace protocol that is an integral part of the ARM Real

Time Debug solution (RealView). Real-time tracing is controlled by specifying a

set of triggering and filtering resources, which include address and data

comparators, cross-system triggers, counters, and sequencers.

Features

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 5

Preliminary—Subject to Change Without Notice

EMI External

Memory

Interface

Connectivity

Peripherals

The EMI is an external and internal memory interface. It performs arbitration

between multi-AXI masters to multi-memory controllers, divided into four major

channels: fast memories (Mobile DDR, DDR2) channel, slow memories

(NOR-FLASH/PSRAM/NAND-FLASH etc.) channel, internal memory (RAM,

ROM) channel and graphical memory (GMEM) Channel.

In order to increase the bandwidth performance, the EMI separates the buffering

and the arbitration between different channels so parallel accesses can occur.

By separating the channels, slow accesses do not interfere with fast accesses.

EMI features:

• 64-bit and 32-bit AXI ports

• Enhanced arbitration scheme for fast channel, including dynamic master

priority, and taking into account which pages are open or closed and what

type (Read or Write) was the last access

• Flexible bank interleaving

• Supports 16/32-bit Mobile DDR up to 200 MHz SDCLK (mDDR400)

• Supports 16/32-bit (Non-Mobile) DDR2 up to 200 MHz SDCLK (DDR2-400)

• Supports up to 2 Gbit Mobile DDR memories

• Supports 16-bit (in muxed mode only) PSRAM memories (sync and async

operating modes), at slow frequency, for debugging purposes

• Supports 32-bit NOR-Flash memories (only in muxed mode), at slow

frequencies for debugging purposes

• Supports 4/8-ECC, page sizes of 512 Bytes, 2 KBytes and 4 KBytes

• NAND-Flash (including MLC)

• Multiple chip selects

• Enhanced Mobile DDR memory controller, supporting access latency hiding

• Supports watermarking for security (Internal and external memories)

• Supports Samsung OneNAND™ (only in muxed I/O mode)

EPIT-1

EPIT-2

Enhanced

Periodic

Interrupt

Timer

Peripherals

Each EPIT is a 32-bit “set and forget” timer that starts counting after the EPIT is

enabled by software. It is capable of providing precise interrupts at regular

intervals with minimal processor intervention. It has a 12-bit prescaler for division

of input clock frequency to get the required time setting for the interrupts to occur,

and counter values can be programmed on the fly.

eSDHC-1

eSDHC-2

eSDHC-3

Enhanced

Multi-Media

Card/

Secure Digital

Host

Controller

Connectivity

Peripherals

The features of the eSDHC module, when serving as host, include the following:

• Conforms to SD Host Controller Standard Specification version 2.0

• Compatible with the MMC System Specification version 4.2

• Compatible with the SD Memory Card Specification version 2.0

• Compatible with the SDIO Card Specification version 1.2

• Designed to work with SD Memory, miniSD Memory, SDIO, miniSDIO, SD

Combo, MMC and MMC RS cards

• Configurable to work in one of the following modes:

—SD/SDIO 1-bit, 4-bit

—MMC 1-bit, 4-bit, 8-bit

• Full-/high-speed mode

• Host clock frequency variable between 32 kHz to 52 MHz

• Up to 200 Mbps data transfer for SD/SDIO cards using four parallel data lines

• Up to 416 Mbps data transfer for MMC cards using eight parallel data lines

Table 2. i.MX51A Digital and Analog Modules (continued)

Block

Mnemonic Block Name Subsystem Brief Description

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

6Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Features

eSDHC-4

(muxed with

P-ATA)

Enhanced

Multi-Media

Card/

Secure Digital

Host

Controller

Connectivity

Peripherals

Can be configured as eSDHC (see above) and is muxed with the P-ATA

interface.

FEC Fast Ethernet

Controller

Connectivity

Peripherals

The Ethernet Media Access Controller (MAC) is designed to support both

10 Mbps and 100 Mbps ethernet/IEEE Std 802.3™ networks. An external

transceiver interface and transceiver function are required to complete the

interface to the media.

FIRI Fast

Infra-Red

Interface

Connectivity

Peripherals

Fast Infra-Red Interface

GPIO-1

GPIO-2

GPIO-3

GPIO-4

General

Purpose I/O

Modules

System

Control

Peripherals

These modules are used for general purpose input/output to external ICs. Each

GPIO module supports up to 32 bits of I/O.

GPT General

Purpose

Timer

Peripherals

Each GPT is a 32-bit “free-running” or “set and forget” mode timer with a

programmable prescaler and compare and capture register. A timer counter

value can be captured using an external event, and can be configured to trigger

a capture event on either the leading or trailing edges of an input pulse. When

the timer is configured to operate in “set and forget” mode, it is capable of

providing precise interrupts at regular intervals with minimal processor

intervention. The counter has output compare logic to provide the status and

interrupt at comparison. This timer can be configured to run either on an external

clock or on an internal clock.

GPU Graphics

Processing

Unit

Multimedia

Peripherals

The GPU provides hardware acceleration for 2D and 3D graphics

algorithms with sufficient processor power to run desk-top quality

interactive graphics applications on displays up to HD720

resolution. It supports color representation up to 32 bits per pixel.

The GPU with its 128 KByte memory enables high performance mobile 3D and

2D vector graphics at rates up to 27 Mtriangles/sec, 166 M pixels/sec, 664

Mpixels/sec (Z).

GPU2D Graphics

Processing

Unit-2D Ver. 1

Multimedia

Peripherals

The GPU2D provides hardware acceleration for 2D graphic

algorithms with sufficient processor power to run desk-top quality

interactive graphics applications on displays up to HD720 resolution.

I2C-1

I2C-2

HS-I2C

I2C Interface Connectivity

Peripherals

I2C provides serial interface for controlling peripheral devices. Data rates of up

to 400 Kbps are supported by two of the I2C ports. Data rates of up to 3.4 Mbps

(I2C Specification v2.1) are supported by the HS-I2C.

Note: See the errata for the HS-I2C in the i.MX51 Chip Errata. The two standard

I2C modules have no errata.

Table 2. i.MX51A Digital and Analog Modules (continued)

Block

Mnemonic Block Name Subsystem Brief Description

Features

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 7

Preliminary—Subject to Change Without Notice

IIM IC

Identification

Module

Security The IC Identification Module (IIM) provides an interface for reading,

programming, and/or overriding identification and control information stored in

on-chip fuse elements. The module supports electrically programmable poly

fuses (e-Fuses). The IIM also provides a set of volatile software-accessible

signals that can be used for software control of hardware elements not requiring

non-volatility. The IIM provides the primary user-visible mechanism for

interfacing with on-chip fuse elements. Among the uses for the fuses are unique

chip identifiers, mask revision numbers, cryptographic keys, JTAG secure mode,

boot characteristics, and various control signals requiring permanent

non-volatility. The IIM also provides up to 28 volatile control signals. The IIM

consists of a master controller, a software fuse value shadow cache, and a set

of registers to hold the values of signals visible outside the module.

IOMUXC IOMUX

Control

System

Control

Peripherals

This module enables flexible I/O multiplexing. Each I/O pad has default as well

as several alternate functions. The alternate functions are software configurable.

IPU Image

Processing

Unit

Multimedia

Peripherals

IPU enables connectivity to displays and image sensors, relevant processing

and synchronization. It supports two display ports and two camera ports,

through the following interfaces.

• Legacy Interfaces

• Analog TV interfaces (through a TV encoder bridge)

The processing includes:

• Support for camera control

• Image enhancement: color adjustment and gamut mapping, gamma

correction and contrast enhancement, sharpening and noise reduction

• Video/graphics combining

• Support for display backlight reduction

• Image conversion—resizing, rotation, inversion and color space conversion

• Synchronization and control capabilities, allowing autonomous operation.

• Hardware de-interlacing support

KPP Keypad Port Connectivity

Peripherals

The KPP supports an 8 ×8 external keypad matrix. The KPP features are as

follows:

• Open drain design

• Glitch suppression circuit design

• Multiple keys detection

• Standby key press detection

P-ATA (Muxed

with

eSDHC-4

Parallel ATA Connectivity

Peripherals

The P-ATA block is an AT attachment host interface. Its main use is to interface

with hard disc drives and optical disc drives. It interfaces with the ATA-5

(UDMA-4) compliant device over a number of ATA signals. It is possible to

connect a bus buffer between the host side and the device side. This is muxed

with eSDHC-4 interfaces.

PWM-1

PWM-2

Pulse Width

Modulation

Connectivity

Peripherals

The pulse-width modulator (PWM) has a 16-bit counter and is optimized to

generate sound from stored sample audio images. It can also generate tones.

The PWM uses 16-bit resolution and a 4x16 data FIFO to generate sound.

RAM

128 Kbytes

Internal RAM Internal

Memory

Unified RAM, can be split between Secure RAM and Non-Secure RAM

ROM

36 Kbytes

Boot ROM Internal

Memory

Supports secure and regular Boot Modes

Table 2. i.MX51A Digital and Analog Modules (continued)

Block

Mnemonic Block Name Subsystem Brief Description

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

8Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Features

RTIC Real Time

Integrity

Checker

Security Protecting read-only data from modification is one of the basic elements in

trusted platforms. The Run-Time Integrity Checker v3 (RTICv3) module, is a data

monitoring device responsible for ensuring that memory content is not corrupted

during program execution. The RTICv3 mechanism periodically checks the

integrity of code or data sections during normal OS run-time execution without

interfering with normal operation. The RTICv3’s purpose is to ensure the integrity

of the peripheral memory contents, protect against unauthorized external

memory elements replacement, and assist with boot authentication.

SAHARA Lite SAHARA

security

accelerator

Lite

Security SAHARA (Symmetric/Asymmetric Hashing and Random Accelerator) is a

security co-processor. It implements symmetric encryption algorithms, (AES,

DES, 3DES, and RC4), public key algorithms, hashing algorithms (MD5, SHA-1,

SHA-224, and SHA-256), and a hardware random number generator. It has a

slave IP bus interface for the host to write configuration and command

information, and to read status information. It also has a DMA controller, with an

AHB bus interface, to reduce the burden on the host to move the required data

to and from memory.

SCC Security

Controller

Security The Security Controller is a security assurance hardware module designed to

safely hold sensitive data such as encryption keys, digital right management

(DRM) keys, passwords, and biometrics reference data. The SCC monitors the

system’s alert signal to determine if the data paths to and from it are

secure—that is, cannot be accessed from outside of the defined security

perimeter. If not, it erases all sensitive data on its internal RAM. The SCC also

features a Key Encryption Module (KEM) that allows non-volatile (external

memory) storage of any sensitive data that is temporarily not in use. The KEM

utilizes a device-specific hidden secret key and a symmetric cryptographic

algorithm to transform the sensitive data into encrypted data.

SDMA Smart Direct

Memory

Access

System

Control

Peripherals

The SDMA is multi-channel flexible DMA engine. It helps in maximizing system

performance by off loading various cores in dynamic data routing.

The SDMA features list is as follows:

• Powered by a 16-bit instruction-set micro-RISC engine

• Multi-channel DMA supports up to 32 time-division multiplexed DMA channels

• 48 events with total flexibility to trigger any combination of channels

• Memory accesses including linear, FIFO, and 2D addressing

• Shared peripherals between ARM Cortex A8™ and SDMA

• Very fast context-switching with two-level priority-based preemptive

multi-tasking

• DMA units with auto-flush and prefetch capability

• Flexible address management for DMA transfers (increment, decrement, and

no address changes on source and destination address)

• DMA ports can handle unit-directional and bi-directional flows (copy mode)

• Up to 8-word buffer for configurable burst transfers for EMI

• Support of byte-swapping and CRC calculations

• A library of scripts and API are available

SIM Subscriber

Identity

Module

Interface

Connectivity

Peripherals

The SIM is an asynchronous interface with additional features for allowing

communication with Smart Cards conforming to the ISO 7816 specification. The

SIM is designed to facilitate communication to SIM cards or pre-paid phone

cards.

Table 2. i.MX51A Digital and Analog Modules (continued)

Block

Mnemonic Block Name Subsystem Brief Description

Features

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 9

Preliminary—Subject to Change Without Notice

SJC Secure JTAG

Interface

System

Control

Peripherals

JTAG manipulation is a known hacker’s method of executing unauthorized

program code, getting control over secure applications, and running code in

privileged modes. The JTAG port provides a debug access to several hardware

blocks including the ARM processor and the system bus.

The JTAG port must be accessible during platform initial laboratory bring-up,

manufacturing tests and troubleshooting, as well as for software debugging by

authorized entities. However, in order to properly secure the system,

unauthorized JTAG usage should be strictly forbidden.

In order to prevent JTAG manipulation while allowing access for manufacturing

tests and software debugging, the i.MX51A processor incorporates a

mechanism for regulating JTAG access. The i.MX51A Secure JTAG Controller

provides four different JTAG security modes that can be selected via e-fuse

configuration.

SPBA Shared

Peripheral

Bus Arbiter

System

Control

Peripherals

SPBA (Shared Peripheral Bus Arbiter) is a two-to-one IP bus interface (IP bus)

arbiter.

SPDIF Sony Philips

Digital

Interface

Multimedia

Peripherals

A standard digital audio transmission protocol developed jointly by the Sony and

Philips corporations. Only the transmitter functionality is supported.

SRTC Secure Real

Time Clock

Security The SRTC incorporates a special System State Retention Register (SSRR) that

stores system parameters during system shutdown modes. This register and all

SRTC counters are powered by dedicated supply rail NVCC_SRTC_POW. The

NVCC_SRTC_POW can be energized even if all other supply rails are shut

down. The power for this block comes from NVCC_SRTC_POW supply. When

this supply is driven by the MC13892 power management controller, this block

can be power backed up via the coin-cell feature of the MC13892.This register

is helpful for storing warm boot parameters. The SSRR also stores the system

security state. In case of a security violation, the SSRR mark the event (security

violation indication).

SSI-1 I2S/SSI/AC97

Interface

Connectivity

Peripherals

The SSI is a full-duplex synchronous interface used on the i.MX51A processor

to provide connectivity with off-chip audio peripherals. The SSI interfaces

connect internally to the AUDMUX which interfaces to the i.MX51 system

memory. The SSI supports a wide variety of protocols (SSI normal, SSI network,

I2S, and AC-97), bit depths (up to 24 bits per word), and clock/frame sync

options.

Each SSI has two pairs of 8x24 FIFOs and hardware support for an external

DMA controller in order to minimize its impact on system performance. The

second pair of FIFOs provides hardware interleaving of a second audio stream,

which reduces CPU overhead in use cases where two timeslots are being used

simultaneously.

SSI-2

SSI-3

TVE TV Encoder Multimedia The TVE is implemented in conjunction with the Image Processing Unit (IPU)

allowing handheld devices to display captured still images and

video directly on a TV or LCD projector. It supports the following analog video

outputs: composite, S-video, and component video up to HD720p/1080i.

Table 2. i.MX51A Digital and Analog Modules (continued)

Block

Mnemonic Block Name Subsystem Brief Description

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

10 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Features

TZIC TrustZone

Aware

Interrupt

Controller

ARM/Control The TrustZone Interrupt Controller (TZIC) collects interrupt requests from all

i.MX51A sources and routes them to the ARM core. Each interrupt can be

configured as a normal or a secure interrupt. Software Force Registers and

software Priority Masking are also supported.

UART-1

UART-2

UART-3

UART

Interface

Connectivity

Peripherals

Each of the UART modules supports the following serial data transmit/receive

protocols and configurations:

• 7 or 8 bit data words, 1 or 2 stop bits, programmable parity (even, odd, or

none)

• Programmable baud rates up to 4 MHz. This is a higher max baud rate relative

to the 1.875 MHz, which is stated by the TIA/EIA-232-F standard and previous

Freescale UART modules.

• 32-byte FIFO on Tx and 32 half-word FIFO on Rx supporting auto-baud

• IrDA 1.0 support (up to SIR speed of 115200 bps)

• Option to operate as 8-pins full UART, DCE, or DTE

USB USB 2.0

High-Speed

OTG and 3x

Hosts

Connectivity

Peripherals

USB-OTG contains one high-speed OTG module, which is internally connected

to the on-chip HS USB PHY. There are an additional three high-speed host

modules that require external USB PHYs.

VPU Video

Processing

Unit

Multimedia

Peripherals

A high-performing video processing unit (VPU), which covers many SD-level

video decoders and SD-level encoders as a multi-standard video codec engine

as well as several important video processing such as rotation and mirroring.

VPU Features:

• MPEG-4 decode: 720p, 30 fps, simple profile and advanced simple profile

• MPEG-4 encode: D1, 25/30 fps, simple profile

• H.263 decode: 720p, 30 fps, profile 3

• H.263 encode: D1, 25/30 fps, profile 3

• H.264 decode: 720p, 30 fps, baseline, main, and high profile

• H.264 encode: D1, 25/30 fps, baseline profile

• MPEG-2 decode: 720p, 30 fps, MP-ML

• MPEG-2 encode: D1, 25/30 fps, MP-ML (in software with partial acceleration

in hardware)

• VC-1 decode: 720p, 30 fps, simple, main, and advanced profile

• DivX decode: 720p, 30 fps versions 3, 4, and 5

• RV10 decode: 720p, 30 fps

• MJPEG decode: 32 Mpix/s

• MJPEG encode: 64 Mpix/s

WDOG-1 Watch Dog Timer

Peripherals

The Watch Dog Timer supports two comparison points during each counting

period. Each of the comparison points is configurable to evoke an interrupt to the

ARM core, and a second point evokes an external event on the WDOG line.

Table 2. i.MX51A Digital and Analog Modules (continued)

Block

Mnemonic Block Name Subsystem Brief Description

Features

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 11

Preliminary—Subject to Change Without Notice

2.1 Special Signal Considerations

Table 3 lists special signal considerations for the i.MX51. The signal names are listed in alphabetical order.

The package contact assignments are found in Section 4, “Package Information and Contact

Assignments.” Signal descriptions are defined in the i.MX51 reference manual.

WDOG-2

(TZ)

Watch Dog

(TrustZone)

Timer

Peripherals

The TrustZone Watchdog (TZ WDOG) timer module protects against TrustZone

starvation by providing a method of escaping normal mode and forcing a switch

to the TZ mode. TZ starvation is a situation where the normal OS prevents

switching to the TZ mode. This situation should be avoided, as it can

compromise the system’s security. Once the TZ WDOG module is activated, it

must be serviced by TZ software on a periodic basis. If servicing does not take

place, the timer times out. Upon a time-out, the TZ WDOG asserts a TZ mapped

interrupt that forces switching to the TZ mode. If it is still not served, the TZ

WDOG asserts a security violation signal to the CSU. The TZ WDOG module

cannot be programmed or deactivated by a normal mode SW.

XTALOSC Crystal

Oscillator I/F

Clocking The XTALOSC module allows connectivity to an external crystal.

Table 3. Special Signal Considerations

Signal Name Remarks

CKIH1, CKIH2 Inputs feeding CAMPs (Clock Amplifiers) that have on-chip ac coupling precluding the need for

external coupling capacitors. The CAMPs are enabled by default, but the main clocks feeding the

on-chip clock tree are sourced from XTAL/EXTAL by default. Optionally, the use of a low jitter

external oscillators to feed CKIH1 or CKIH2 (while not required) can be an advantage if low jitter

or special frequency clock sources are required by modules driven by CKIH1 or CKIH2. See CCM

chapter in the i.MX51 reference manual for details on the respective clock trees.

After initialization, the CAMPs could be disabled (if not used) by CCM registers (CCR CAMPx_EN

field). If disabled, the on-chip CAMP output is low; the input is irrelevant. If unused, the user should

tie CKIH1/CKIH2 to GND for best practice.

CLK_SS Clock Source Select is the input that selects the default reference clock source providing input to

the DPLLs. To use a reference in the megahertz range per Table 8, tie CLK_SS to GND to select

EXTAL/XTAL. To use a reference in the kilohertz range per Table 59, tie CLK_SS to NVCC_PER3

to select CKIL. After initialization, the reference clock source can be changed (initial setting is

overwritten).

Note: Because this input has a keeper circuit, Freescale recommends tying this input to directly

to GND or NVCC_PER3. If a series resistor is used its value must be ≤ 4.7 kΩ.

COMP The user should bypass this reference with an external 0.1 µF capacitor tied to GND. If TV OUT is

not used, float the COMP contact and ensure the DACs are powered down.

Note: Previous engineering samples required this reference to be bypassed to a positive supply.

FASTR_ANA and

FASTR_DIG

These signals are reserved for Freescale manufacturing use only. User must tie both connections

to GND.

GPANAIO This signal is reserved for Freescale manufacturing use only. Users should float this output.

GPIO_NAND This is a general-purpose input/output (GPIO3_12) on the NVCC_NANDF_A power rail.

Table 2. i.MX51A Digital and Analog Modules (continued)

Block

Mnemonic Block Name Subsystem Brief Description

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

12 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Features

IOB, IOG, IOR, IOB_BACK,

IOG_BACK, and

IOR_BACK

These signals are analog TV outputs that should be tied to GND when not being used.

JTAG_

nnnn

The JTAG interface is summarized in Ta b le 4 . Use of external resistors is unnecessary. However,

if external resistors are used, the user must ensure that the on-chip pull-up/down configuration is

followed. For example, do not use an external pull down on an input that has on-chip pull-up.

JTAG_TDO is configured with a keeper circuit such that the floating condition is eliminated if an

external pull resistor is not present. An external pull resistor on JTAG_TDO is detrimental and

should be avoided.

JTAG_MOD is referenced as SJC_MOD in the i.MX51 Reference Manual. Both names refer to the

same signal. JTAG_MOD must be externally connected to GND for normal operation. Termination

to GND through an external pull-down resistor (such as 1 kΩ) is allowed.

NC These signals are No Connect (NC) and should be floated by the user.

PMIC_INT_REQ When using the MC13892 power management IC, the PMIC_INT_REQ high-priority interrupt input

on i.MX51 should be either floated or tied to NVCC_SRTC_POW with a 4.7 kΩ to 68 kΩ resistor.

This avoids a continuous current drain on the real-time clock backup battery due to a 100 kΩ

on-chip pull-up resistor.

PMIC_INT_REQ is not used by the Freescale BSP (board support package) software. The BSP

requires that the general-purpose INT output from the MC13892 be connected to i.MX51 GPIO

input GPIO1_8 configured to cause an interrupt that is not high-priority.

The original intent was for PMIC_INT_REQ to be connected to a circuit that detects when the

battery is almost depleted. In this case, the I/O must be configured as alternate mode 0 (ALT0 =

power fail).

POR_B This cold reset negative logic input resets all modules and logic in the IC.

Note: The POR_B input must be immediately asserted at power-up and remain asserted until

after the last power rail is at its working voltage.

RESET_IN_B This warm reset negative logic input resets all modules and logic except for the following:

• Test logic (JTAG, IOMUXC, DAP)

•SRTC

• Memory repair – Configuration of memory repair per fuse settings

• Cold reset logic of WDOG – Some WDOG logic is only reset by POR_B. See WDOG chapter

in i.MX51 Reference Manual for details.

RREFEXT Determines the reference current for the USB PHY bandgap reference. An external 6.04 kΩ 1%

resistor to GND is required.

SGND, SVCC, and

SVDDGP

These sense lines provide the ability to sense actual on-chip voltage levels on their respective

supplies. SGND monitors differentials of the on-chip ground versus an external power source.

SVCC monitors on-chip VCC, and SVDDGP monitors VDDGP. Freescale recommends connection

of the SVCC and SVDDGP signals to the feedback inputs of switching power-supplies or to test

points.

STR This signal is reserved for Freescale manufacturing use. The user should float this signal.

TEST_MODE TEST_MODE is for Freescale factory use only. This signal is internally connected to an on-chip

pull-down device. Users must either float this signal or tie it to GND.

Table 3. Special Signal Considerations (continued)

Signal Name Remarks

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 13

Preliminary—Subject to Change Without Notice

3 Electrical Characteristics

This section provides the device and module-level electrical characteristics for the i.MX51Aprocessor.

3.1 Chip-Level Conditions

This section provides the device-level electrical characteristics for the IC. See Table 5 for a quick reference

to the individual tables and sections.

VREF When using VREF with DDR-2 I/O, the nominal 0.9 V reference voltage must be half of the

NVCC_EMI_DRAM supply. The user must tie VREF to a precision external resistor divider. Use a

1 kΩ 0.5% resistor to GND and a 1 kΩ 0.5% resistor to NVCC_EMI_DRAM. Shunt each resistor

with a closely-mounted 0.1 µF capacitor.

To reduce supply current, a pair of 1.5 kΩ 0.1% resistors can be used. Using resistors with

recommended tolerances ensures the ± 2% VREF tolerance (per the DDR-2 specification) is

maintained when four DDR-2 ICs plus the i.MX51 are drawing current on the resistor divider.

Note: When VREF is used with mDDR this signal must be tied to GND.

VREFOUT This signal determines the Triple Video DAC (TVDAC) reference voltage. The user must tie

VREFOUT to an external 1.18 kΩ 1% resistor to GND.

VREG This regulator is no longer used and should be floated by the user.

XTAL/EXTAL The user should tie a fundamental-mode crystal across XTAL and EXTAL. The crystal must be

rated for a maximum drive level of 100 μW or higher. An ESR (equivalent series resistance) of

80 Ω or less is recommended. Freescale BSP (Board Support Package) software requires 24 MHz

on EXTAL.

The crystal can be eliminated if an external 24 MHz oscillator is available. In this case, EXTAL must

be directly driven by the external oscillator and XTAL is floated. The EXTAL signal level must swing

from NVCC_OSC to GND. If the clock is used for USB, then there are strict jitter requirements: <

50 ps peak-to-peak below 1.2 MHz and < 100 ps peak-to-peak above 1.2 MHz for the USB PHY.

The COSC_EN bit in the CCM (Clock Control Module) must be cleared to put the on-chip oscillator

circuit in bypass mode which allows EXTAL to be externally driven. COSC_EN is bit 12 in the CCR

Table 4. JTAG Controller Interface Summary

JTAG I/O Type On-chip Termination

JTAG_TCK Input 100 kΩ pull-down

JTAG_TMS Input 47 kΩ pull-up

JTAG_TDI Input 47 kΩ pull-up

JTAG_TDO 3-state output Keeper

JTAG_TRSTB Input 47 kΩ pull-up

JTAG_DE_B Input/open-drain output 47 kΩ pull-up

JTAG_MOD Input 100 kΩ pull-down

Table 3. Special Signal Considerations (continued)

Signal Name Remarks

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

14 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

CAUTION

Str esses beyond those lis ted under Table 6 may cause permanent damage to

the device. These are stress ratings only. Functional operation of the device

at these or any other conditions beyond those indicated under Table 8,

"i.MX51A Operating Ranges," on page 15 is not implied. Exposure to

absolute-maximum-rated conditions for extended periods may affect device

reliability.

Table 7 provides the thermal resistanc e data.

Table 5. i.MX51A Chip-Level Conditions

For these characteristics, … Topic appears …

Table 6, “Absolute Maximum Ratings” on page 14

Ta b le 7 , “Thermal Resistance Data”on page 14

Ta b le 8 , “i.MX51A Operating Ranges”on page 15

Ta b le 9 , “Interface Frequency”on page 16

Table 6. Absolute Maximum Ratings

Parameter Description Symbol Min Max Unit

Peripheral Core Supply Voltage VCC –0.3 1.35 V

ARM Core Supply Voltage VDDGP –0.3 1.15 V

Supply Voltage (UHVIO, I2C) Supplies denoted as I/O Supply –0.5 3.6 V

Supply Voltage (except UHVIO, I2C) Supplies denoted as I/O Supply –0.5 3.3 V

USB VBUS VBUS — 5.25 V

Input/Output Voltage Range Vin/Vout –0.5 OVDD +0.31

1The term OVDD in this section refers to the associated supply rail of an input or output. The association is described in

Table 111 on page 139. The maximum range can be superseded by the DC tables.

ESD Damage Immunity: Vesd V

Human Body Model (HBM)

Charge Device Model (CDM)

—

2000

500

Storage Temperature Range TSTORAGE –40 125 oC

Junction Temperature TJ—125

2During the life of the device, TJ must be limited to a cumulative of 2% of the time over 105oC.

Table 7. Thermal Resistance Data

Rating Board Symbol Value Unit

Junction to Case1, 19 x 19 mm package

1Rjc-x per JEDEC 51-12: The junction-to-case thermal resistance. The “x” indicates the case surface where Tcase is measured

and through which 100% of the junction power is forced to flow due to the cold plate heat sink fixture placed either at the top (T)

or bottom (B) of the package, with no board attached to the package.

—R

θJC 6°C/W

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 15

Preliminary—Subject to Change Without Notice

Table 8. i.MX51A Operating Ranges

Symbol Parameter Minimum1Nominal2Maximum1Unit

VDDGP

MCIMX51xA products

ARM core supply voltage

0< fARM ≤ 600 MHz

0.95 1.0 1.1 V

ARM core supply voltage

Stop mode

0.930.95 1.05 V

VCC

MCIMX51xA products

Peripheral supply voltage High Performance

Mode (HPM) The clock frequencies are derived

from AXI and AHB buses using 133 or 166 MHz

(as needed). The DDR clock rate is 200 MHz.

Note: For detailed information about the use of

133 or 166 MHz clocks, refer to the i.MX51

Reference Manual.

1.175 1.225 1.275 V

Peripheral supply voltage—Stop mode 0.930.95 1.275 V

VDDA Memory arrays voltage—Run Mode 1.15 1.20 1.275 V

Memory arrays voltage—Stop Mode 0.930.95 1.275 V

VDD_DIG_PLL_A

VDD_DIG_PLL_B

PLL Digital supplies 1.15 1.2 1.35 V

VDD_ANA_PLL_A

VDD_ANA_PLL_B

PLL Analog supplies 1.75 1.8 1.95 V

NVCC_EMI

NVCC_PER5

NVCC_PER10

NVCC_PER11

NVCC_PER12

NVCC_PER13

NVCC_PER14

GPIO EMI Supply and additional digital power

supplies.

1.65 1.875 or

2.775

3.1 V

NVCC_IPUx3

NVCC_PER3

NVCC_PER8

NVCC_PER9

GPIO IPU Supply and additional digital power

supplies.

1.65 1.875 or

2.775

3.1 V

NVCC_EMI_DRAM DDR and Fuse Read Supply 1.65 1.8 1.95 V

VDD_FUSE4Fusebox Program Supply (Write Only) 3.0 — 3.3 V

NVCC_NANDF_x5

NVCC_PER15

NVCC_PER17

Ultra High voltage I/O (UHVIO) supplies — V

UHVIO_L 1.65 1.875 1.95

UHVIO_H 2.5 2.775 3.1

UHVIO_UH 3.0 3.3 3.6

NVCC_USBPHY

NVCC_OSC

USB_PHY analog supply, oscillator analog

supply6

2.25 2.5 2.75 V

TVDAC_DHVDD,

NVCC_TV_BACK,

AHVDDRGB

TVE-to-DAC level shifter supply, cable detector

supply, analog power supply to RGB channel

2.69 2.75 2.91 V

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

16 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

NVCC_HS4_1

NVCC_HS4_2

NVCC_HS6

NVCC_HS10

HS-GPIO additional digital power supplies 1.65 — 3.1 V

NVCC_I2C I2C and HS-I2C I/O Supply71.65 1.875 1.95 V

2.7 3.0 3.3

NVCC_SRTC_

POW

SRTC Core and I/O Supply (LVIO) 1.1 1.2 1.3 V

VDDA33 USB PHY I/O analog supply 3.0 3.3 3.6 V

VBUS See Tab le 6 on page 14 and Table 109

on page 135 for details. This is not a power

supply.

—— ——

1Voltage at the package power supply contact must be maintained between the minimum and maximum voltages. The design

must allow for supply tolerances and system voltage drops.

2The nominal values for the supplies indicate the target setpoint for a tolerance no tighter than ± 50 mV. Use of supplies with a

tighter tolerance allows reduction of the setpoint with commensurate power savings.

3The NVCC_IPUx rails are isolated from one another. This allows the connection of different supply voltages for each one. For

example, NVCC_IPU2 can operate at 1.8 V while NVCC_IPU4 operates at 3.0 V.

4In Read mode, Freescale recommends VDD_FUSE be floated or grounded. Tying VDD_FUSE to a positive supply (3.0 V–3.3

V) increases the possibility of inadvertently blowing fuses and is not recommended.

5The NAND Flash supplies are composed of three groups: A, B, and C. Each group can be powered with a different supply

voltage. For example, NVCC_NANDF_A = 1.8 V, NVCC_NANDF_B = 3.0 V, NVCC_NANDF_C = 2.7 V.

6The analog supplies should be isolated in the application design. Use of series inductors is recommended.

7Operation of the HS-I2C and I2C is not guaranteed when operated between the supply voltages of 1.95 to 2.7 V.

Table 9. Interface Frequency

Parameter Description Symbol Min Max Unit

JTAG: TCK Operating Frequency ftck See Table 86, "JTAG Timing," on page 117 MHz

CKIL: Operating Frequency fckil See Table 61, "FPM Specifications," on page 67 kHz

CKIH: Operating Frequency fckih See Table 34, "CAMP Electrical Parameters (CKIH1,

CKIH2)," on page 35

MHz

XTAL Oscillator fxtal 22 27 MHz

Table 8. i.MX51A Operating Ranges (continued)

Symbol Parameter Minimum1Nominal2Maximum1Unit

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 17

Preliminary—Subject to Change Without Notice

3.1.1 Supply Current

Table 11 shows the current core consumption (not including I/O) of the i.MX51.

Table 10. Fuse Supply Current

Description Symbol Min Typ Max Unit

eFuse Program Current.1

Current to required to program one eFuse bit: The associated

VDD_FUSE supply per Table 8.

1The current Iprogram is only required during program time (tprogram).

Iprogram —60TBDmA

eFuse Read Current2

Current necessary to read an 8-bit eFuse word

2The current Iread is present for approximately TBD ns of the read access to the 8-bit word. The current is derived from the

DDR supply (NVCC_EMI_DRAM).

Iread —TBDTBDmA

Table 11. i.MX51 Stop Mode Current and Power Consumption

Mode Condition Supply Nominal Unit

Stop Mode

• External reference clocks

gated

• Power gating for ARM and

processing units

• Stop mode voltage

VDDGP = 0.95 V, VCC = 0.95 V, VDDA = 0.95 V

ARM CORE in SRPG mode

L1 and L2 caches power gated

IPU in S&RPG mode

VPU and GPU in PG mode

All PLLs off, all CCM-generated clocks off

CKIL input on with 32 kHz signal present

All modules disabled

USBPHY PLL off

External (MHz) crystal and on-chip oscillator

powered down (SBYOS bit asserted)

No external resistive loads that cause current flow

Standby voltage allowed (VSTBY bit is asserted)

TA = 25°C

VDDGP 0.18 mA

VCC 0.35

VDDA 0.15

NVCC_OSC 0.012

Total 0.66 mW

Stop Mode

• External reference clocks

gated

• Power gating for ARM and

processing units

• HPM voltage

VDDGP = 1.0 V, VCC = 1.225 V, VDDA = 1.2 V

ARM CORE in SRPG mode

L1 and L2 caches power gated

IPU in S&RPG mode

VPU and GPU in PG mode

All PLLs off, all CCM-generated clocks off

CKIL input on with 32 kHz signal present

All modules disabled.

USBPHY PLL off

External (MHz) crystal and on-chip oscillator

powered down (SBYOS bit asserted)

No external resistive loads that cause current flow

TA = 25°C

VDDGP 0.24 mA

VCC 0.45

VDDA 0.2

NVCC_OSC 0.012

Total 1.09 mW

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

18 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.1.2 USB PHY Current Consumption

Stop Mode

• External reference clocks

enabled

• Power gating for ARM and

processing units

• HPM voltage

VDDGP = 1.0 V, VCC = 1.225 V, VDDA = 1.20 V

ARM CORE in SRPG mode

L1 and L2 caches power gated

IPU in S&RPG mode

VPU and GPU in PG mode

All PLLs off, all CCM-generated clocks off

CKIL input on with 32 kHz signal present

All modules disabled

USBPHY PLL off

External (MHz) crystal and on-chip oscillator pow-

ered and generating reference clock

No external resistive loads that cause current flow

TA = 25°C

VDDGP 0.24 mA

VCC 0.45

VDDA 0.2

NVCC_OSC 1.5

To t a l 4 . 8 m W

Stop Mode

• External reference clocks

enabled

• No power gating for ARM and

processing units

• HPM voltage

VDDGP = 1.0 V, VCC = 1.225 V, VDDA = 1.2 V

All PLLs off, all CCM-generated clocks off

CKIL input on with 32 kHz signal present

All modules disabled

USBPHY PLL off

External (MHz) crystal and on-chip oscillator

powered and generating reference clock

No external resistive loads that cause current flow

TA = 25°C

VDDGP 50 mA

VCC 2

VDDA 1.15

NVCC_OSC 1.5

To t a l 6 3 m W

Table 12. USB PHY Current Consumption

Parameter Conditions Typical @ 25 °C Max Unit

Analog Supply

VDDA33 (3.3 V)

Full Speed

RX 5.5 6

TX 7 8

High Speed

RX 5 6

TX 5 6

Analog Supply

NVCC_USBPHY (2.5 V)

Full Speed

RX 6.5 7

TX 6.5 7

High Speed

RX 12 13

TX 21 22

Table 11. i.MX51 Stop Mode Current and Power Consumption (continued)

Mode Condition Supply Nominal Unit

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 19

Preliminary—Subject to Change Without Notice

3.2 Supply Power-Up/Power-Down Requirements and Restrictions

The system design must comply with the power-up and power-down sequence guidelines as described in

this section to guarantee reliable operation of the device. Any deviation from these sequences may result

in the following situations:

• Excessive current during power-up phase

• Prevention of the device from booting

• Irreversible damage to the i.MX51A processor (worst-case scenario)

3.2.1 Power-Up Sequence

Figure 2 shows the power-up sequence.

Figure 2. Power-Up Sequence

Digital Supply

VCC (1.2 V)

Full Speed

RX 6 7

TX 6 7

High Speed

RX 6 7

TX 6 7

VDDA33 + NVCC_USBPHY +VCC Suspend 50 100 μA

Table 12. USB PHY Current Consumption (continued)

Parameter Conditions Typical @ 25 °C Max Unit

AHVDDRGB

NVCC_TV_BACK

TVDAC_DHVDD

VDD_DIG_PLL_A/B

VDD_ANA_PLL_A/B

NVCC_OSC

NVCC_USBPHY

VDDA33

NVCC_EMI_DRAM

NVCC_SRTC_POW

VDDA

NVCC_NANDF_x

NVCC_PER15

NVCC_PER17

NVCC_HS4_1

NVCC_HS4_2

NVCC_HS6

NVCC_HS10

NVCC_PERx2

NVCC_EMI

NVCC_IPU

NVCC_I2C

VDDGP4

VDD_FUSE1

VCC

1. VDD_FUSE should only be powered when writing.

2. NVCC_PERx refers to NVCC_PER 3, 5, 8, 9, 10, 11, 12, 13, 14.

3. No power-up sequence dependencies exist between the supplies shown in the block diagram shaded in gray.

4. There is no requirement for VDDGP to be preceded by any other power supply other than NVCC_SRTC_POW.

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

20 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

NOTE

The POR_B input must be immediately asserted at power-up and remain

asserted until afte r the last power rail is at its working voltage.

3.2.2 Power-Down Sequence

The following power-down sequence is recommend for the i.MX51A processor:

• To be provided.

3.3 I/O DC Parameters

This section includes the DC parameters of the followin g I/O types:

• General Purpose I/O and High-Speed General Purpose I/O (GPIO/HSGPIO)

• Double Data Rate 2 (DDR2)

• Low Voltage I/O (LVIO)

• Ultra High Voltage I/O (UHVIO)

• High-Speed I2C and I2C

• Enhanced Secure Digital Host Controller (eSDHC)

NOTE

The term ‘OVDD’ in this section refers to the associated supply rail of an

input or output. The association is shown in Table 111.

3.3.1 GPIO/HSGPIO I/0 DC Parameters

The parameters in Table 13 a re guaranteed per the operating ranges in Table 8, unless otherwise noted.

Table 13. GPIO/HSGPIO DC Electrical Characteristics

Parameter Symbol Test Conditions Min Typ Max Unit

High-level output voltage Voh Iout = -1 mA OVDD –0.15 — OVDD + 0.3 V

Low-level output voltage Vol Iout = 1mA — — 0.15 V

High-level output current Ioh Vout = 0.8×OVDD

Low drive

Medium drive

High drive

Max drive

–1.9

–3.7

–5.2

–6.6

——

Low-level output current Iol Vout = 0.2×OVDD

Low drive

Medium drive

High drive

Max drive

1.9

3.7

5.2

6.6

——

High-Level DC input voltage1 VIH — 0.7 ×OVDD — OVDD V

Low-Level DC input voltage1VIL — 0 — 0.3×OVDD V

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 21

Preliminary—Subject to Change Without Notice

3.3.2 DDR2 I/O DC Parameters

The parameters in Table 14 a re guaranteed per the operating ranges in Table 8, unless otherwise noted.

Input Hysteresis VHYS OVDD = 1.875

OVDD = 2.775

0.25 0.34

0.45

—V

Schmitt trigger VT+1, 2VT+ — 0.5OVDD — — V

Schmitt trigger VT-1, 2 VT- — — — 0.5 ×OVDD V

Input current (no pull-up/down) IIN VI = OVDD or 0 — — TBD —

Input current (22 kΩ Pull-up) IIN VI = 0

VI = OVDD

— — 161

TBD

μA

Input current (47 kΩ Pull-up) IIN VI = 0

VI = OVDD

——76

TBD

μA

Input current (100 kΩ Pull-up) IIN VI = 0

VI=OVDD

——36

TBD

μA

Input current (100 kΩ Pull-down) IIN VI = 0

VI = OVDD

——TBD

μA

High-impedance I/O supply

current

Icc-ovdd VI = OVDD or 0 — — TBD μA

Keeper Circuit Resistance OVDD = 1.875V

OVDD = 2.775V

—

kΩ

1To maintain a valid level, the transition edge of the input must sustain a constant slew rate (monotonic) from the current DC

level through to the target DC level, VIL or VIH. Monotonic input transition time is from 0.1ns to 1s.

2Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.

Table 14. DDR2 I/O DC Electrical Parameters

Parameters Symbol Test Conditions Min Max Unit

High-level output voltage Voh — OVDD – 0.28 — V

Low-level output voltage Vol — — 0.28 V

Output minimum Source Current Ioh OVDD=1.7V Vout=1.42V –13.4 — mA

Output min Sink Current Iol OVDD=1.7V Vout=0.28V 13.4 — mA

DC input Logic High VIH — OVDD/2+0.125 OVDD+0.3 V

DC input Logic Low VIL — –0.3 OVDD/2–0.125 V

Input voltage range of each differential input Vin — –0.3 OVDD+0.3 V

Differential input voltage required for switching Vid — 0.25 OVDD+0.6 V

Termination Voltage Vtt Vtt tracking OVDD/2 OVDD/2 – 0.04 OVDD/2 + 0.04 V

Input current (no pull-up/down) Iin VI = 0

VI=OVDD

—

TBD

µA

Table 13. GPIO/HSGPIO DC Electrical Characteristics (continued)

Parameter Symbol Test Conditions Min Typ Max Unit

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

22 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.3.3 Low Voltage I/O (LVIO) DC Parameters

The parameters in Table 15 a re guaranteed per the operating ranges in Table 8, unless otherwise noted.

Table 15. LVIO DC Electrical Characteristics

DC Electrical Characteristics Symbol Test Conditions Min Typ Max Unit

High-level output voltage Voh Iout = –1 mA OVDD–0.15 — — V

Low-level output voltage Vol Iout = 1 mA — — 0.15 V

High-level output current I

Ioh

Vout = 0.8 ×OVDD

Low Drive

Medium Drive

High Drive

Max Drive

–2.1

–4.2

–6.3

–8.4

——

Low-level output current I

Iol

Vout = 0.2 ×OVDD

Low Drive

Medium Drive

High Drive

Max Drive

2.1

4.2

6.3

8.4

——

High-Level DC input voltage1

1To maintain a valid level, the transition edge of the input must sustain a constant slew rate (monotonic) from the current DC

level through to the target DC level, VIL or VIH. Monotonic input transition time is from 0.1 ns to 1 s.

VIH — 0.7 ×OVDD — OVDD V

Low-Level DC input voltage1VIL — 0 — 0.3 ×OVDD V

Input Hysteresis VHYS OVDD = 1.875

OVDD = 2.775

0.35 0.62

1.27

—V

Schmitt trigger VT+1, 2

2Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.

VT+ — 0.5 ×OVDD — — V

Schmitt trigger VT–1, 2 VT– — — — 0.5 ×OVDD V

Input current (no pull-up/down) IIN VI = 0 or OVDD — — TBD μA

Input current (22 kΩ Pull-up) IIN VI = 0

VI = OVDD

——16

TBD

μA

Input current (47 kΩ Pull-up) IIN VI = 0

VI = OVDD

——76

TBD

μA

Input current (100 kΩ Pull-up) IIN VI = 0

VI = OVDD

——36

TBD

μA

Input current (100 kΩ Pull-down) IIN VI = 0

VI = OVDD

——TBD

μA

Keeper Circuit Resistance — OVDD = 1.875V

OVDD = 2.775V

—

kΩ

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 23

Preliminary—Subject to Change Without Notice

3.3.4 Ultra-High Voltage I/O (UHVIO) DC Parameters

The parameters in Table 16 a re guaranteed per the operating ranges in Table 8, unless otherwise noted.

Table 16. UHVIO DC Electrical Characteristics1

1This table applies with VCC down to 0.9 V. UHVIO are functional down to 0.85 V with degraded performance.

DC Electrical Characteristics Symbol Test Conditions Min Typ Max Unit

High-level output voltage Voh Iout = –1mA OVDD–0.15 — — V

Low-level output voltage Vol Iout = 1mA — — 0.15 V

High-level output current, low voltage mode

Ioh_lv

Vout = 0.8 ×OVDD

Low Drive

Medium Drive

High Drive

–2.2

–4.4

–6.6

——

High-level output current, high voltage mode

Ioh_hv

Vout = 0.8 ×OVDD

Low Drive

Medium Drive

High Drive

–5.1

–10.2

–15.3

——

Low-level output current, low voltage mode

Iol_lv

Vout = 0.2 ×OVDD

Low Drive

Medium Drive

High Drive

2.2

4.4

6.6

——

Low-level output current, high voltage mode

Iol_hv

Vout = 0.2 ×OVDD

Low Drive

Medium Drive

High Drive

5.1

10.2

15.3

——

High-Level DC input voltage2,3

2 To maintain a valid level, the transitioning edge of the input must sustain a constant slew rate (monotonic) from the current DC

level through to the target DC level, VIL or VIH. Monotonic input transition time is from 0.1 ns to 1 s.

VIH — 0.7 ×OVDD — OVDD V

Low-Level DC input voltage2,3 VIL — 0 — 0.3 ×OVDD V

Input Hysteresis VHYS low voltage mode

high voltage mode

0.38

0.95

—0.43

1.33

Schmitt trigger VT+2,4 VT+ — 0.5OVDD — — V

Schmitt trigger VT–2,4 VT– — — — 0.5 ×OVDD V

Input current (no pull-up/down) IIN VI = 0

VI = OVDD

——TBDμA

Input current (22 kΩ Pull-up) IIN VI = 0

VI = OVDD

— — 202

TBD

μA

Input current (47 kΩ Pull-up) IIN VI = 0

VI = OVDD

——61

TBD

μA

Input current (100 kΩ Pull-up) IIN VI = 0

VI = OVDD

——47

TBD

μA

Input current (360 kΩ Pull-down) IIN VI = 0

VI = OVDD

——TBD

5.7

μA

Keeper Circuit Resistance — NA — 17 — kΩ

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

24 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.3.5 I2C I/O DC Parameters

NOTE: See the errata for HS-I2C in i.MX51 Chip Errata document. The two s tandard I2C modules have

no errata

The DC Elec trical Characteristics listed below are guarantee d using operating ranges per Table 8, unless

otherwise noted.

3.3.6 eSDHCv2 Electrical I/O DC Parameters

This module is designed to interface with both low a nd high-voltage cards. See Table 8 for UHVIO

supply ranges. Table 18 lists the Module Name electrical DC characteristics.

3Overshoot and undershoot conditions (transitions above OVDD and below OVSS) on switching pads must be held below 0.6 V,

and the duration of the overshoot/undershoot must not exceed 10% of the system clock cycle. Overshoot/undershoot must be

controlled through printed circuit board layout, transmission line impedance matching, signal line termination, or other methods.

Non-compliance to this specification may affect device reliability or cause permanent damage to the device.

4Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.

Table 1 7. I2C Standard/Fast/High-Speed Mode Electrical Parameters for Low/Medium Drive Strength

Parameter Symbol Test Conditions Min Typ Max Unit

Low-level output voltage Vol Iol = 3mA — — 0.4 V

High-Level DC input voltage 1

1To maintain a valid level, the transitioning edge of the input must sustain a constant slew rate (monotonic) from the current

DC level through to the target DC level, VIL or VIH. Monotonic input transition time is from 0.1ns to 1s.

VIH — 0.7 ×OVDD — OVDD V

Low-Level DC input voltage1VIL — 0 — 0.3 ×OVDD V

Input Hysteresis VHYS — 0.25 — — V

Schmitt trigger VT+1,2

2Hysteresis of 250 mV is guaranteed over all operating conditions when hysteresis is enabled.

VT+ — 0.5 ×OVDD — — V

Schmitt trigger VT– 1,2 VT– — — — 0.5 ×OVDD V

I/O leakage current (no pull-up) Iin VI = OVDD or 0 — — TBD μA

Table 18. MMC/SD Interface Electrical Specification

Parameter Min Max Unit Condition/Remark

All Inputs

Input Leakage Current –10 10 μA—

All Outputs

Output Leakage Current –10 10 μA—

Power Supply

Power Up Time — 250 ms —

Supply Current 100 200 mA —

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 25

Preliminary—Subject to Change Without Notice

3.3.7 USBOTG Electrical DC Parameters

3.3.8 USB Port Electrical DC Characteristics

Table 19 and Table 20 li st the electri cal DC char act er i stics.

Bus Signal Line Load

Pull-up Resistance 10 100 kΩInternal Pull-up

Open Drain Resistance NA NA kΩFor MMC cards only

External Loading Drive 40 — pF CMD/CLK/DAT0–7 PADs must drive

external 40 pF loading in all working

conditions

Open Drain Signal Level For MMC cards only

Output High Voltage VDD –0.2 — V IOH = –100 µA

Output Low Voltage — 0.3 V IOL = 2 mA

Bus Signal Levels

Output HIGH Voltage 0.75 ×VDD —VIOH = –100 µA @VDD min

Output LOW Voltage — 0.125 ×OVDD V IOL = 100 µA @VDD min

Input HIGH Voltage 0.625 ×OVDD OVDD + 0.3 V —

Input LOW Voltage GND –0.3 0.25 ×OVDD V —

Table 19. USBOTG Interface Electrical Specification

Parameter Symbol Signals Min Max Unit Test Conditions

Input High Voltage VIH USB_VPOUT

USB_VMOUT

USB_XRXD,

USB_VPIN,

USB_VMIN

VDD x 0.7 VDD V —

Input low Voltage VIL USB_VPOUT

USB_VMOUT

USB_XRXD,

USB_VPIN,

USB_VMIN

0 VDD × 0.3 V —

Output High Voltage VOH USB_VPOUT

USB_VMOUT

USB_TXENB

VDD –0.43 — V 7 mA Drv

at IOH = 5 mA

Output Low Voltage VOL USB_VPOUT

USB_VMOUT

USB_TXENB

—0.43V7 mA Drv

at IOH = 5 mA

Table 18. MMC/SD Interface Electrical Specification (continued)

Parameter Min Max Unit Condition/Remark

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

26 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.4 Output Buffer Impedance Characteristics

This section defines the I/O Impedance parameters of the i.MX51A processor.

3.4.1 LVIO I/O Output Buffer Impedance

Table 20. USB Interface Electrical Specification

Parameter Symbol Signals Min Max Unit Test Conditions

Input High Voltage VIH USB_DAT_VP

USB_SE0_VM

USB_RCV,

USB_VP1,

USB_VM1

VDD x 0.7 VDD V —

Input Low Voltage VIL USB_DAT_VP

USB_SE0_VM

USB_RCV,

USB_VP1,

USB_VM1

0 VDD x 0.3 V —

Output High Voltage VOH USB_DAT_VP

USB_SE0_VM

USB_TXOE_B

VDD –0.43 — V 7 mA Drv

at Iout = 5 mA

Output Low Voltage VOL USB_DAT_VP

USB_SE0_VM

USB_TXOE_B

—0.43 V7 mA Drv

at Iout = 5 mA

Table 21. LVIO I/O Output Buffer Impedance

Parameter Symbol Conditions Min

Typical

Max Unit

OVDD 2.775 V OVDD 1.875 V

Output Driver

Impedance

Rpu Low Drive Strength, Ztl = 150 Ω

Medium Drive Strength, Ztl = 75 Ω

High Drive Strength, Ztl = 50 Ω

Max Drive Strength, Ztl = 37.5 Ω

104

150

250

125

Output Driver

Impedance

Rpd Low Drive Strength, Ztl = 150 Ω

Medium Drive Strength, Ztl = 75 Ω

High Drive Strength, Ztl = 50 Ω

Max Drive Strength, Ztl = 37.5 Ω

134

243

122

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 27

Preliminary—Subject to Change Without Notice

3.4.2 DDR Output Buffer Impedance

3.4.3 UHVIO Output Buffer Impedance

NOTE

Output driver impedance is measured with “long” transmission line of

impedance Ztl attached to I/O pad and incident wave launched into

transmission lime. Rpu/Rpd and Z tl form a voltage divider that defines

specific voltage of incident wave relative to OVDD. Output driver

impedance is calculated from this voltage divider (see Figure 3).

Table 22. DDR I/O Output Buffer Impedance

Parameter Symbol Test Conditions

Best Case

Tj=–20 °C

OVDD =1.95 V

VCC =1.3 V

Typical

Tj=25 °C

OVDD =1.8 V

VCC =1.2 V

Worst Case

Tj=105 °C

OVDD =1.6 V

VCC =1.1 V Unit

s0–s5

000000

s0–s5

111111

s0–s5

101010

s0–s5

111111

s0–s5

111111

Output Driver

Impedance

Rpu Low Drive Strength, Ztl = 150 Ω

Medium Drive Strength, Ztl = 75 Ω

High Drive Strength, Ztl = 50 Ω,

280

140

93.4

55.2

27.6

18.4

150

50.4

34.8

23.2

90.3

45.4

Output Driver

Impedance

Rpd Low Drive Strength, Ztl = 150 Ω

Medium Drive Strength, Ztl = 75 Ω

High Drive Strength, Ztl = 50 Ω,

293

147

87.7

32.8

16.4

131

65.6

43.8

48.8

14.6

24.3

Table 23. UHVIO Output Buffer Impedance

Parameter Symbol Test Conditions

Min Typ Max

Unit

OVDD

1.95 V

OVDD

3.0 V

OVDD

1.875 V

OVDD

3.3 V

OVDD

1.65 V

OVDD

3.6 V

Output Driver

Impedance

Rpu Low Drive Strength, Ztl = 150 Ω

Medium Drive Strength, Ztl = 75 Ω

High Drive Strength, Ztl = 50 Ω

114

124

135

198

206

103

Output Driver

Impedance

Rpd Low Drive Strength, Ztl =1 50 Ω

Medium Drive Strength, Ztl = 75 Ω

High Drive Strength, Ztl = 50 Ω

118

126

154

179

217

109

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

28 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

Figure 3. Impedance Matching Load for Measurement

ipp_do

Cload = 1p

Ztl Ω, L = 20 inches

predriver

PMOS (Rpu)

NMOS (Rpd)

pad

OVDD

OVSS

t,(ns)

U,(V)

OVDD

t,(ns)

VDD

Vin (do)

Vout (pad)

U,(V)

Vref

Rpu = Vovdd – Vref1

Vref1 × Ztl

Rpd = × Ztl

Vref2

Vovdd – Vref2

Vref1 Vref2

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 29

Preliminary—Subject to Change Without Notice

3.5 I/O AC Parameters

The load circuit and output transition time wave forms are shown in Figure 4 and Figure 5. AC electrical

characteristics for slow and fast I/O are presented in the Table 24 and Table 25, respectively.

Figure 4. Load Circuit for Output

Figure 5. Output Transition Time Waveform

3.5.1 Slow I/O AC Parameters

Table 24. Slow I/O AC Parameters

Parameter Symbol Test Condition Min Rise/Fall Typ Max Rise/Fall Unit

Output Pad Transition Times (Max Drive) tr, tf 15 pF

35 pF

— — 1.98/1.52

3.08/2.69

Output Pad Transition Times (High Drive) tr, tf 15 pF

35 pF

— — 2.31/1.838

3.8/2.4

Output Pad Transition Times (Medium Drive) tr, tf 15 pF

35 pF

— — 2.92/2.43

5.37/4.99

Output Pad Transition Times (Low Drive) tr, tf 15 pF

35 pF

— — 4.93/4.53

10.55/9.79

Output Pad Slew Rate (Max Drive) tps 15 pF

35 pF

0.5/0.65

0.32/0.37

—— V/ns

Output Pad Slew Rate (High Drive) tps 15 pF

35 pF

0.43/0.54

0.26/0.41

—— V/ns

Output Pad Slew Rate (Medium Drive) tps 15 pF

35 pF

0.34/0.41

0.18/0.2

—— V/ns

Output Pad Slew Rate (Low Drive) tps 15 pF

35 pF

0.20/0.22

0.09/0.1

—— V/ns

Output Pad di/dt (Max Drive) tdit — — — 30 mA/ns

Output Pad di/dt (High Drive) tdit — — — 23 mA/ns

Output Pad di/dt (Medium drive) tdit — — — 15 mA/ns

Tes t Po int

From Output

Under Test

CL includes package, probe and fixture capacitance

NVCC

20%

80% 80%

20%

tr tf

Output (at I/O)

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

30 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.5.2 Fast I/O AC Parameters

3.5.3 I2C AC Parameters

NOTE: See the errata for HS-I2C in i.MX51 Chip Errata document. The two s tandard I2C modules have

no errata

Figure 6 depicts the load circuit for output pads for standard- and fast-mode. Figure 7 depicts the output

pad transition time definition. Figure 6 depicts pull-up current source measurement for HS-mode. Figure 8

Output Pad di/dt (Low drive) tdit — — — 7 mA/ns

Input Transition Times1trm — — — 25 ns

1Hysteresis mode is recommended for inputs with transition times greater than 25 ns.

Table 25. Fast I/O AC Parameters

Parameter Symbol Test

Condition Min Rise/Fall Typ Max Rise/Fall Unit

Output Pad Transition Times (Max Drive) tr, tf 15 pF

35 pF

— — 1.429/1.275

2.770/2.526

Output Pad Transition Times (High

Drive)

tr, tf 15 pF

35 pF

— — 1.793/1.607

3.565/3.29

Output Pad Transition Times (Medium

Drive)

tr, tf 15 pF

35 pF

— — 2.542/2.257

5.252/4.918

Output Pad Transition Times (Low Drive) tr, tf 15 pF

35 pF

— — 4.641/4.456

10.699/10.0

Output Pad Slew Rate (Max Drive) tps 15 pF

35 pF

0.69/0.78

0.36/0.39

—— V/ns

Output Pad Slew Rate (High Drive) tps 15 pF

35 pF

0.55/0.62

0.28/0.30

—— V/ns

Output Pad Slew Rate (Medium Drive) tps 15 pF

35 pF

0.39/0.44

0.19/0.20

—— V/ns

Output Pad Slew Rate (Low Drive) tps 15 pF

35 pF

0.21/0.22

0.09/0.1

—— V/ns

Output Pad di/dt (Max Drive) tdit — — — 70 mA/ns

Output Pad di/dt (High Drive) tdit — — — 53 mA/ns

Output Pad di/dt (Medium drive) tdit — — — 35 mA/ns

Output Pad di/dt (Low drive) tdit — — — 18 mA/ns

Input Transition Times1

1Hysteresis mode is recommended for inputs with transition time greater than 25 ns.

trm — — — 25 ns

Table 24. Slow I/O AC Parameters (continued)

Parameter Symbol Test Condition Min Rise/Fall Typ Max Rise/Fall Unit

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 31

Preliminary—Subject to Change Without Notice

depicts load circuit with external pull-up current source for HS-mode. Figure 9 depicts HS-mode timing

definition.

Figure 6. Load Circuit for Standard- and Fast-Mode

Figure 7. Definition of Timing for Standard- and Fast-Mode

Figure 8. Load Circuit for HS-Mode with External Pull-Up Current Source

Figure 9. Definition of Timing for HS-Mode

Test Po int

From Output

Under Test CL

CL includes package, probe and fixture capacitance

OVDD

70%

30%

Output

Test Po int

From Output

Under Test

CL2

3 mA1

OVDD

1Load current when output is between 0.3×OVDD and 0.7×OVDD

2CL includes package, probe, and fixture capacitance.

Notes:

OVDD

30%

70% 70%

30%

tTLH tTHL

Output (at pad)

PA3Max = max of tTLH and tTHL

PA4Max = max tTHL

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

32 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

The electr ical char act er ist ics f o r I2C I/O are listed in the tables from the Table 26 to the Table 29

on page 33. Characterist ics are guaranteed using opera ting ranges per Table 8, unless otherwise noted.

Table 26. I2C Standard- and Fast-Mode Electrical Parameters

for Low/Medium Drive Strength and OVDD = 2.7 V–3.3 V

Parameter Symbol Test Conditions Min Typ Max Unit

Output fall time,

(low driver strength)

tf from VIHmin to VILmax with CL from 10 pF to 400 pF — — 52 ns

Output fall time,

(medium driver strength)

tf from VIHmin to VILmax with CL from 10 pF to 400 pF — — 28 ns

Table 27. I2C Standard- and Fast-Mode Electrical Parameters

for Low/Medium Drive Strength and OVDD =1.65 V–1.95 V

Parameter Symbol Test Conditions Min Typ Max Unit

Output fall time,

(low driver strength)

tof from VIHmin to VILmax with CL from 10 pF to 400 pF — — 70 ns

Output fall time,

(medium driver strength)

tof from VIHmin to VILmax with CL from 10 pF to 400 pF — — 35 ns

Table 28. I2C High-Speed Mode Electrical Parameters

for Low/Medium Drive Strength and OVDD =2.7 V – 3.3 V

Parameter Symbol Test Conditions Min Typ Max Unit

Output rise time (current-source enabled) and

fall time at SCLH

(low driver strength)

trCL, tfCL with a 3mA external

pull-up current source

and CL = 100 pF

— — 18/21 ns

Output rise time (current-source enabled) and

fall time at SCLH

(medium driver strength)

trCL, tfCL with a 3mA external

pull-up current source

and CL = 100 pF

—— 9/9 ns

Output fall time at SDAH

(low driver strength)

tfDA with CL from 10 pF to

100 pF

— — 14 ns

Output fall time at SDAH

(medium driver strength)

tfDA with CL from 10 pF to

100 pF

—— 8 ns

Output fall time at SDAH

(low driver strength)

tfDA CL = 400 pF — — 52 ns

Output fall time at SDAH

(medium driver strength)

tfDA CL = 400 pF — — 27 ns

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 33

Preliminary—Subject to Change Without Notice

Table 29. I2C High-Speed Mode Electrical Parameters

for Low/Medium Drive Strength and OVDD = 1.65 V – 1.95 V

Parameter Symbol Test Conditions Min Typ Max Unit

Output rise time (current-source

enabled) and fall time at SCLH

(low driver strength)

trCL, tfCL with a 3mA external pull-up current

source and CL = 100 pF

——10/74ns

Output rise time (current-source

enabled) and fall time at SCLH

(medium driver strength)

trCL, tfCL with a 3mA external pull-up current

source and CL = 100 pF

— — 7/14 ns

Output fall time at SDAH

(low driver strength)

tfDA with CL from 10 pF to 100 pF 0 — 17 ns

Output fall time at SDAH

(medium driver strength)

tfDA with CL from 10 pF to 100 pF 0 — 9 ns

Output fall time at SDAH

(low driver strength)

tfDA CL = 400 pF 30 — 67 ns

Output fall time at SDAH

(medium driver strength)

tfDA CL = 400 pF 15 — 34 ns

Table 30. Low Voltage I2C I/O Parameters

Parameter Symbol Test Condition Min Rise/Fall Typ Max Rise/Fall Unit

Output Pad di/dt (Medium drive) tdit — — — 22 mA/ns

Output Pad di/dt (Low drive) tdit — — — 11 mA/ns

Input Transition Times1

1Hysteresis mode is recommended for inputs with transition time greater than 25 ns

trm — — — 25 ns

Table 31. High Voltage I2C I/O Parameters

Parameter Symbol Test Condition Min Rise/Fall Typ Max Rise/Fall Unit

Output Pad Transition Times (Medium Drive) tr, tf 15 pF

35 pF

—— 3/3

6/5

Output Pad Transition Times (Low Drive) tr, tf 15 pF

35 pF

—— 5/5

9/9

Output Pad Slew Rate (Medium Drive) tps 15 pF

35 pF

0/0

——V/ns

Output Pad Slew Rate (Low Drive) tps 15 pF

35 pF

0/0

——V/ns

Output Pad di/dt (Medium drive) tdit — — — 36 mA/ns

Output Pad di/dt (Low drive) tdit — — — 16 mA/ns

Input Transition Times1

1Hysteresis mode is recommended for inputs with transition time > 25 ns

trm — — — 25 ns

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

34 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.6 Module Timing

This section contains the timing and electrical parameters for the modules in the i.MX51A processor.

3.6.1 Reset Timings Parameters

Figure 10 shows the reset timing and Table 32 lists the timing parameters.

Figure 10. Reset Timing Diagram

3.6.2 WDOG Reset Timing Parameters

Figure 11 shows the WDOG reset timing and Table 33 lists the timing parameter s.

Figure 11. WATCHDOG_RST Timing Diagram

NOTE

CKIL is approximately 32 kHz. TCKIL is one period or approximately 30 μs.

3.6.3 AUDMUX Timing Parameters

The AUDMUX provides a programmable interconnect logic for voice, audio and data routing between

internal serial interfaces (SSIs) and external serial interfaces (audio and voice codecs). The AC timing of

AUDMUX external pins is hence governed by the SSI module.

Table 32. Reset Timing Parameters

ID Parameter Min Max Unit

CC1 Duration of RESET_IN to be qualified as valid (input slope = 5 ns) 50 — ns

Table 33. WATCHDOG_RST Timing Parameters

ID Parameter Min Max Unit

CC5 Duration of WATCHDOG_RESET Assertion 1 — TCKIL

RESET_IN

CC1

(Input)

WATCHDOG_RST

CC5

(Input)

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 35

Preliminary—Subject to Change Without Notice

3.6.4 Clock Amplifier Parameters (CKIH1, CKIH2)

The input to Clock Amplifier (CAMP) is internally ac-coupled allowing direct interface to a s quare wave

or sinusoidal frequency source. No external series capacitors are required

3.6.5 DPLL Electrical Parameters

Table 34. CAMP Electrical Parameters (CKIH1, CKIH2)

Parameter Min Typ Max Unit

Input frequency 8.0 — 40.0 MHz

VIL (for square wave input) 0 — 0.3 V

VIH (for square wave input) (VCC 1 –0.25)

1VCC is the supply voltage of CAMP.

—3 V

Sinusoidal input amplitude 0.4 2

2This value of the sinusoidal input will be determined during characterization.

—VDDVp-p

Output duty cycle 45 50 55 %

Table 35. DPLL Electrical Parameters

Parameter Test Conditions/Remarks Min Typ Max Unit

Reference clock frequency range1

1Device input range cannot exceed the electrical specifications of the CAMP, see Table 3 4.

— 10 — 100 MHz

Reference clock frequency range after

pre-divider

—10—40MHz

Output clock frequency range (dpdck_2) — 300 — 1025 MHz

Pre-division factor2

2The values specified here are internal to DPLL. Inside the DPLL, a “1” is added to the value specified by the user.Therefore,

the user has to enter a value “1” less than the desired value at the inputs of DPLL for PDF and MFD.

—1—16—

Multiplication factor integer part — 5 — 15 —

Multiplication factor numerator3Should be less than denominator –67108862 — 67108862 —

Multiplication factor denominator2— 1 — 67108863 —

Output Duty Cycle — 48.5 50 51.5 %

Frequency lock time4

(FOL mode or non-integer MF)

———398

Tdpdref

Phase lock time — — — 100

µs

Frequency jitter5 (peak value) — — 0.02 0.04

Tdck

Phase jitter (peak value) FPL mode, integer and fractional MF — 2.0 3.5 ns

Power dissipation

fdck

= 300 MHz @ avdd = 1.8 V,

dvdd = 1.2 V

fdck

= 650 MHz @ avdd = 1.8 V,

dvdd = 1.2 V

— — 0.65 (avdd)

0.92 (dvdd)

1.98 (avdd)

1.8 (dvdd)

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Electrical Characteristics

3.6.6 NAND Flash Controller (NFC) Parameters

This section provides the relative timing requirements among different signals of NFC at the module level

in the different opera tional modes.

Timing paramete rs in Figure 12, through Figure 15, Figure 17, and Table 37 show the default NFC mode

(asymmetric mode) using two Flash clock cycles per one access of RE_B and WE_B.

Timing parameters in Figure 12, Figure 13, Figure 14, Figure 16, Figure 17, and Table 37 show symmetric

NFC mode using one Flash clock cycle per one access of RE_B and WE_B.

W ith r eference to the timing diagr ams, a hi gh is defined as 80% of si gnal value and low is defined a s 20%

of signal value. All parameters are given in nanoseconds. The BGA contact load used in calculations is 20

pF (except for NF16 - 40 pF) and there is max drive strength on all contacts.

All timing pa rameters are a funct ion of T, which is the period of the flash_clk clock (“enfc_clk” at system

level). This clock frequency can be controlled by the user, configuring CCM (SoC clock controller). The

clock is derived from emi_slow_clk after single divider. Table 36 demonstrates few examples for clock

frequency settings.

3The maximum total multiplication factor (MFI + MFN/MFD) allowed is 15.Therefore, if the MFI value is 15, MFN value must be

zero.

4Tdpdref is the time period of the reference clock after predivider.According to the specification, the maximum lock time in FOL

mode is 398 cycles of divided reference clock when DPLL starts after full reset.

5Tdck is the time period of the output clock, dpdck_2.

Table 36. NFC Clock Settings Examples

emi_slow_clk (MHz) nfc_podf (Division Factor) enfc_clk (MHz) T—Clock Period (ns)1

1Rounded up to whole nanoseconds.

133 (max value) 5 (reset value) 26.6 38

133 4 33.25 31

133 3 44.33 23

Electrical Characteristics

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Figure 12. Command Latch Cycle Timing

Figure 13. Address Latch Cycle Timing

Figure 14. Write Data Latch Timing

NFCLE

NFCE_B

NFWE_B

NFIO[7:0] command

NF9

NF8

NF1 NF2

NF5

NF3 NF4

NFCE_B

NFWE_B

NFALE

NFIO[7:0] Address

NF9

NF8

NF5

NF3 NF4

NF6

NF11

NF10

NF7

NFCE_B

NFWE_B

NFIO[15:0] Data to NF

NF9

NF8

NF5

NF3

NF11

NF10

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Electrical Characteristics

Figure 15. Read Data Latch Timing - asymmetric mode.

Figure 16. Read Data Latch Timing - Symmetric Mode.

NFCE_B

NFRE_B

NFRB_B

NFIO[15:0] Data from NF

NF13

NF15

NF14

NF17

NF12

NF16

NFCE_B

NFRE_B

NFRB_B

NFIO[15:0] Data from NF

NF13

NF15

NF14

NF12

NF16 NF18

Electrical Characteristics

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Figure 17. Other Timing Parameters.

Table 37. NFC—Timing Characteristics

ID PARAMETER Symbol Asymmetric

Mode Min

Symmetric

Mode Min Max

NF1 NFCLE setup Time tCLS 2T+0.1 2T+0.1 -

NF2 NFCLE Hold Time tCLH T- 4 . 4 5 T- 4 . 4 5 -

NF3 NFCE_B Setup Time tCS 2T+0.95 T+0.95 -

NF4 NFCE_B Hold Time tCH 2T-5.55 1.5T-5.55 -

NF5 NFWE_B Pulse Width tWP T- 1 . 4 0 . 5 T- 1 . 4 -

NF6 NFALE Setup Time tALS 2T+0.1 2T+0.1 -

NF7 NFALE Hold Time tALH T- 4 . 45 T- 4 . 4 5 -

NF8 Data Setup Time tDS T- 0 . 9 0 . 5 T- 0 . 9 -

NF9 Data Hold Time tDH T-5.55 0.5T-5.55 -

NF10 Write Cycle Time tWC 2T T -

NF11 NFWE_B Hold Time tWH T-1.15 0.5T-1.15 -

NF12 Ready to NFRE_B Low tRR 9T+8.9 9T+8.9 -

NF13 NFRE_B Pulse Width tRP 1.5T 0.5T -

NF14 READ Cycle Time tRC 2T T -

NF15 NFRE_B High Hold Time tREH 0.5T-1.15 0.5T-1.15 -

NF161Data Setup on READ tDSR 11.2+0.5T-Tdl211.2-Tdl2-

NF173Data Hold on READ tDHR 0-2Taclk+T

NF184Data Hold on READ tDHR -Tdl

2-11.2 2Taclk+T

NF19 CLE to RE delay tCLR 13T+1.5 13T+1.5

NF20 CE to RE delay tCRE T-3.45 T-3.45 T+0.3

NFCLE

NFCE_B

NFRE_B

NFRB_B

NFWE_B

NF20

NF19

NF21

NF22

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Electrical Characteristics

3.6.7 External Interface Module (WEIM)

3.6.7.1 WEIM Signal Cross Reference

Table 38 is a guide to help the user identify signals in the WEIM Chapter of the Reference Manual

Chapte r that are the same as those mentioned in this data sheet.

NF21 WE high to RE low tWHR 14T-5.45 14T-5.45

NF22 WE high to busy tWB 6T

1tDSR is calculated by the following formula:

Asymmetric mode: tDSR = tREpd + tDpd + 1/2T - Tdl2

Symmetric mode: tDSR = tREpd + tDpd - Tdl2

tREpd + tDpd = 11.2 ns (including clock skew)

where tREpd is RE propogation delay in the chip including IO pad delay, and tDpd is Data propogation delay

from IO pad to EMI including IO pad delay.

tDSR can be used to determine tREA max parameter with the following formula: tREA = 1.5T - tDSR.

2Tdl is composed of 4 delay-line units each generates an equal delay with min 1.25 ns and max 1 aclk

period (Taclk). Default is 1/4 aclk period for each delay-line unit, so all 4 delay lines together generates

a total of 1 aclk period. Taclk is “emi_slow_clk” of the system, which default value is 7.5 ns (133MHz).

3NF17 is defined only in asymmetric operation mode.

NF17 max value is equivalent to max tRHZ value that can be used with NFC.

Taclk is “emi_slow_clk” of the system.

4NF18 is defined only in Symmetric operation mode.

tDHR (MIN) is calculated by the following formula: Tdl2 - (tREpd + tDpd)

where tREpd is RE propogation delay in the chip including IO pad delay, and tDpd is Data propogation delay

from IO pad to EMI including IO pad delay.

NF18 max value is equivalent to max tRHZ value that can be used with NFC.

Taclk is “emi_slow_clk” of the system.

Table 38. WEIM Signal Cross Reference

Reference Manual

WEIM Chapter Nomenclature

Data Sheet Nomenclature,

Reference Manual External Signals and Pin Multiplexing Chapter,

and IOMUX Controller Chapter Nomenclature

BCLK EIM_BCLK

CSx EIM_CSx

WE_B EIM_RW

OE_B EIM_OE

BEy_B EIM_EBx

ADV EIM_LBA

ADDR EIM_A[27:16], EIM_DA[15:0]

ADDR/M_DATA EIM_DAx (Addr/Data muxed mode)

Table 37. NFC—Timing Characteristics (continued)

ID PARAMETER Symbol Asymmetric

Mode Min

Symmetric

Mode Min Max

Electrical Characteristics

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3.6.7.2 WEIM Internal Module Multiplexing

Table 39 provides WEIM internal muxing information.

DATA EIM_NFC_D (Data bus shared with NAND Flash)

EIM_Dx (dedicated data bus)

WAIT_B EIM_WAIT

Table 39. WEIM Internal Module Multiplexing

Package Signal

Name

EIM 16-Bit MUXed

Data/Address

EIM 16-Bit

Non-MUXed

Data/Address

EIM 32-Bit MUXed

Data/Address

EIM MUXed to NAND

Flash DATA

EIM_DA0 DA0 A0 DA0 —

EIM_DA1 DA1 A1 DA1 —

EIM_DA2 DA2 A2 DA2 —

EIM_DA3 DA3 A3 DA3 —

EIM_DA4 DA4 A4 DA4 —

EIM_DA5 DA5 A5 DA5 —

EIM_DA6 DA6 A6 DA6 —

EIM_DA7 DA7 A7 DA7 —

EIM_DA8 DA8 A8 DA8 —

EIM_DA9 DA9 A9 DA9 —

EIM_DA10 DA10 A10 DA10 —

EIM_DA11 DA11 A11 DA11 —

EIM_DA12 DA12 A12 DA12 —

EIM_DA13 DA13 A13 DA13 —

EIM_DA14 DA14 A14 DA14 —

EIM_DA15 DA15 A15 DA15 —

EIM_D16 — D0 D16 —

EIM_D17 — D1 D17 —

EIM_D18 — D2 D18 —

EIM_D19 — D3 D19 —

EIM_D20 — D4 D20 —

EIM_D21 — D5 D21 —

Table 38. WEIM Signal Cross Reference (continued)

Reference Manual

WEIM Chapter Nomenclature

Data Sheet Nomenclature,

Reference Manual External Signals and Pin Multiplexing Chapter,

and IOMUX Controller Chapter Nomenclature

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Electrical Characteristics

EIM_D22 — D6 D22 —

EIM_D23 — D7 D23 —

EIM_D24 — D8 D24 —

EIM_D25 — D9 D25 —

EIM_D26 — D10 D26 —

EIM_D27 — D11 D27 —

EIM_D28 — D12 D28 —

EIM_D29 — D13 D29 —

EIM_D30 — D14 D30 —

EIM_D31 — D15 D31 —

EIM_A16 A16 A16 A16 A16

EIM_A17 A17 A17 A17 A17

EIM_A18 A18 A18 A18 A18

EIM_A19 A19 A19 A19 A19

EIM_A20 A20 A20 A20 A20

EIM_A21 A21 A21 A21 A21

EIM_A22 A22 A22 A22 A22

EIM_A23 A23 A23 A23 A23

EIM_A24 A24 A24 A24 A24

EIM_A25 A25 A25 A25 A25

EIM_A26 A26 A26 A26 A26

EIM_A27 A27 A27 A27 A27

EIM_EB0 EB0 EB0 EB0 EB0

EIM_EB1 EB1 EB1 EB1 EB1

EIM_EB2 EB2 EB2 EB2 EB2

EIM_EB3 EB3 EB3 EB3 EB3

EIM_OE OE OE OE OE

EIM_CS0 CS0 CS0 CS0 CS0

EIM_CS1 CS1 CS1 CS1 CS1

EIM_CS2 CS2 CS2 CS2 CS2

EIM_CS3 CS3 CS3 CS3 CS3

Table 39. WEIM Internal Module Multiplexing (continued)

Package Signal

Name

EIM 16-Bit MUXed

Data/Address

EIM 16-Bit

Non-MUXed

Data/Address

EIM 32-Bit MUXed

Data/Address

EIM MUXed to NAND

Flash DATA

Electrical Characteristics

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3.6.7.3 General WEIM Timing

The following diagrams and tables specify the timings related to the WEIM module. All WEIM output

control signals may be asserted and deasserted by an internal clock synchronized to the BCLK rising

edge according to corres ponding assertion/negation control fields.

Figure 18. WEIM Outputs Timing Diagram

EIM_CS4 CS4 CS4 CS4 CS4

EIM_CS5 CS5 CS5 CS5 CS5

EIM_DTACK DTACK DTACK DTACK DTACK

EIM_WAIT WAIT WAIT WAIT WAIT

EIM_LBA LBA LBA LBA LBA

EIM_BCLK BCLK BCLK BCLK BCLK

EIM_RW RW RW RW RW

EIM_CRE CRE CRE CRE CRE

EIM_SDBA1 SDBA1 SDBA1 SDBA1 SDBA1

EIM_SDBA0 SDBA0 SDBA0 SDBA0 SDBA0

Table 39. WEIM Internal Module Multiplexing (continued)

Package Signal

Name

EIM 16-Bit MUXed

Data/Address

EIM 16-Bit

Non-MUXed

Data/Address

EIM 32-Bit MUXed

Data/Address

EIM MUXed to NAND

Flash DATA

WE4

Address

CSx_B

WE_B

OE_B

BCLK

BEy_B

ADV_B

Output Data

...

WE5

WE6 WE7

WE8 WE9

WE10 WE11

WE12 WE13

WE14 WE15

WE16 WE17

WE3

WE2

WE1

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Electrical Characteristics

Figure 19. WEIM Inputs Timing Diagram

Table 40. WEIM Bus Timing Parameters 1

ID Parameter

BCD = 0 BCD = 1 BCD = 2 BCD = 3

Min Max Min Max Min Max Min Max

WE1 BCLK Cycle time2t — 2t — 3t — 4t —

WE2 BCLK Low Level Width 0.4t — 0.8t — 1.2t — 1.6t —

WE3 BCLK High Level Width 0.4t — 0.8t — 1.2t — 1.6t —

WE4 Clock rise to address valid30.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE5 Clock rise to address invalid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE6 Clock rise to CSx_B valid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE7 Clock rise to CSx_B invalid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE8 Clock rise to WE_B Valid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE9 Clock rise to WE_B Invalid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE10 Clock rise to OE_B Valid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE11 Clock rise to OE_B Invalid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE12 Clock rise to BEy_B Valid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE13 Clock rise to BEy_B Invalid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE14 Clock rise to ADV_B Valid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE15 Clock rise to ADV_B Invalid 0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 3t-1.25 3t+1.75

WE16 Clock rise to Output Data

Valid

0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 2t-1.25 2t+1.75

WE17 Clock rise to Output Data

Invalid

0.5t-1.25 0.5t+1.75 t-1.25 t+1.75 2t-1.25 2t+1.75 2t-1.25 2t+1.75

WE18 Input Data setup time to

Clock rise

2—2—2—2—

WE19 Input Data hold time from

Clock rise

2.5 — 2.5 — 2.5 — 2.5 —

Input Data

WAIT_B

BCLK

WE19

WE18

WE21

WE20

Electrical Characteristics

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3.6.7.4 Examples of WEIM Accesses

The following diagrams give few examples of basic WEIM accesses to external memory devices with the

timing parameters mentioned previously for spec ific cont rol p a ra me te rs set ting s.

Figure 20. Synchronous Memory Read Access, WSC=1

WE20 WAIT_B setup time to

Clock rise

2—2—2—2—

WE21 WAIT_B hold time from

Clock rise

2.5 — 2.5 — 2.5 — 2.5 —

1t is axi_clk cycle time. The maximum allowed axi_clk frequency is 133 MHz, whereas the maximum allowed BCLK frequency

is 104 MHz. As a result if BCD = 0, axi_clk must be ≤104 MHz. If BCD = 1, then 133 MHz is allowed for axi_clk, resulting in

a BCLK of 66.5 MHz. When the clock branch to WEIM is decreased to 104 MHz, other busses are impacted which are

clocked from this source. See the CCM chapter of the i.MX51 Reference Manual for a detailed clock tree description.

2BCLK parameters are being measured from the 50% point. i.e., high is defined as 50% of signal value and low is defined as

50% as signal value.

3For signal measurements “High” is defined as 80% of signal value and “Low” is defined as 20% of signal value.

Table 40. WEIM Bus Timing Parameters (continued)1

ID Parameter

BCD = 0 BCD = 1 BCD = 2 BCD = 3

Min Max Min Max Min Max Min Max

Last Valid Address Address v1

D(v1)

BCLK

ADDR

DATA

WE_B

ADV_B

OE_B

BEy_B

CSx_B

Next Address

WE4 WE5

WE6 WE7

WE10 WE11

WE13

WE12

WE14 WE15

WE18

WE19

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Electrical Characteristics

Figure 21. Synchronous Memory, Write Access, WSC=1, WBEA=1, WBEN=1, and WADVN=0

Figure 22. Synchronous 16-Bit Memory, Two Non-Sequential 32-bit Read Accesses, WSC=2, SRD=1, BCD=0

Last Valid Address Address V1

D(V1)

BCLK

ADDR

DATA

WE_B

ADV_B

OE_B

BEy_B

CSx_B

Next Address

WE4 WE5

WE6 WE7

WE8 WE9

WE12 WE13

WE14

WE15

WE16 WE17

Last Valid Addr Address V1 Address V2

D(V1)

D(V1+1) D(V2) D(V2+1)

BCLK

ADDR

WAIT_B

DATA Halfword Halfword

CSx_B

WE_B

ADV_B

OE_B

BEy_B

Halfword Halfword

WE4 WE5

WE7

WE10 WE11

WE12 WE13

WE14 WE15

WE18

WE19

WE20

WE21

WE6

WE15

WE14

Electrical Characteristics

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Figure 23. Synchronous Memory, Burst Write, BCS=1, WSC=4, SRD=1, and BCD=0

Figure 24. Muxed Address/Data (A/D) Mode, Synchronous Write Access, WSC=6,

ADVA=1, ADVN=1, and ADH=1

NOTE

In 32-bit muxed address/data (A/D) mode the16 MSBs are driven on the

data bus.

Last Valid Addr

BCLK

ADDR

DATA

CSx_B

WE_B

ADV_B

OE_B

BEy_B

WAIT_B

Address V1

D(V1) D(V2) D(V4)D(V3)

WE12

WE4 WE5

WE6 WE7

WE8 WE9

WE13

WE14

WE16 WE16

WE17 WE17

WE20

WE21

WE15

Last

BCLK

ADDR/

WE_B

ADV_B

OE_B

BEy_B

CSx_B

Address V1 Write Data

Valid Addr

M_DATA

WE4 WE16

WE6 WE7

WE9

WE8

WE10 WE11

WE14 WE15

WE17

WE5

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Electrical Characteristics

Figure 25. 16-Bit Muxed A/D Mode, Synchronous Read Access, WSC=7, RADVN=1, ADH=1, OEA=2

The Figure 26, Figure 27, Figure 28, and Table 41 help to determine timing parameters relative chip

select (CS) state for asynchronous and DTACK WEIM accesses with corresponding WEIM bit fields and

the timing parameters mentioned above.

Figure 26. Asynchronous Memory Read Access

Last

BCLK

ADDR/

WE_B

ADV_B

OE_B

BEy_B

CSx_B

Address V1 DataValid Addr

M_DATA

WE5

WE6

WE7

WE14 WE15

WE10 WE11

WE12 WE13

WE18

WE19

WE4

Last Valid Address Address V1

D(V1)

ADDR

DATA

WE_B

ADV_B

OE_B

BEy_B

CSx_B

Next Address

WE39

WE35

WE37

WE32

WE36

WE38

WE43

WE40

WE31

WE44

Electrical Characteristics

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Figure 27. Asynchronous Memory Write Access

Figure 28. DTACK Read Access

Table 41. WEIM Asynchronous Timing Parameters Table Relative Chip Select

ID Parameter

Determination by

Synchronous Measured

Parameters 1

Min Max Unit

WE31 CSx_B valid to Address Valid WE4 – WE6 – CSA2— 3 – CSA ns

WE32 Address Invalid to CSx_B

invalid

WE7 – WE5 – CSN3 —3 – CSNns

WE33 CSx_B Valid to WE_B Valid WE8 – WE6 + (WEA – CSA) — 3 + (WEA – CSA) ns

Last Valid Address Address V1

D(V1)

ADDR

DATA

WE_B

ADV_B

OE_B

BEy_B

CSx_B

Next Address

WE31

WE39

WE33

WE45

WE32

WE40

WE34

WE46

WE42

WE41

Last Valid Address Address V1

D(V1)

ADDR

DATA

WE_B

ADV_B

OE_B

BEy_B

CSx_B

Next Address

WE39

WE35

WE37

WE32

WE36

WE38

WE43

WE40

WE31

WE44

DATA

WE47

WE48

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Electrical Characteristics

WE34 WE_B Invalid to CSx_B Invalid WE7 – WE9 + (WEN – CSN) — 3 – (WEN_CSN) ns

WE35 CSx_B Valid to OE_B Valid WE10 – WE6 + (OEA – CSA) — 3 + (OEA – CSA) ns

WE36 OE_B Invalid to CSx_B Invalid WE7 – WE11 + (OEN – CSN) — 3 – (OEN – CSN) ns

WE37 CSx_B Valid to BEy_B Valid

(Read access)

WE12 – WE6 + (RBEA – CSA) — 3 + (RBEA4 – CSA) ns

WE38 BEy_B Invalid to CSx_B Invalid

(Read access)

WE7 – WE13 + (RBEN – CSN) — 3 – (RBEN5 – CSN) ns

WE39 CSx_B Valid to ADV_B Valid WE14 – WE6 + (ADV – CSA) — 3 + (ADVA – CSA) ns

WE40 ADV_B Invalid to CSx_B Invalid

(ADVL is asserted)

WE7 – WE15 – CSN — 3 – CSN ns

WE41 CSx_B Valid to Output Data

Valid

WE16 – WE6 – WCSA — 3 – WCSA ns

WE42 Output Data Invalid to CSx_B

Invalid

WE17 – WE7 – CSN — 3 – CSN ns

WE43 Input Data Valid to CSx_B

Invalid

MAXCO + MAXDI MAXCO6 + MAXDI7—ns

WE44 CSx_B Invalid to Input Data

invalid

00—ns

WE45 CSx_B Valid to BEy_B Valid

(Write access)

WE12 – WE6 + (WBEA – CSA) — 3 + (WBEA – CSA) ns

WE46 BEy_B Invalid to CSx_B Invalid

(Write access)

WE7 – WE13 + (WBEN – CSN) — –3 + (WBEN – CSN) ns

WE47 Dtack Valid to CSx_B Invalid MAXCO + MAXDTI MAXCO6 + MAXDTI8—ns

WE48 CSx_B Invalid to Dtack invalid 0 0 — ns

1Parameters WE4... WE21 value see in the Ta bl e 4 1 .

2CS Assertion. This bit field determines when CS signal is asserted during read/write cycles.

3CS Negation. This bit field determines when CS signal is negated during read/write cycles.

4BE Assertion. This bit field determines when BE signal is asserted during read cycles.

5BE Negation. This bit field determines when BE signal is negated during read cycles.

6Output maximum delay from internal driving the FFs to chip outputs. The Max. delay between all memory controls (addr,

csx_b, oe_b, we_b, bey_b, and adv_b)

7Maximum delay from chip input data to internal FFs. The max. delay between all data input pins.

8DTACK maximum delay from chip input data to internal FF.

Table 41. WEIM Asynchronous Timing Parameters Table Relative Chip Select (continued)

ID Parameter

Determination by

Synchronous Measured

Parameters 1

Min Max Unit

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3.6.8 SDRAM Controller Timing Parameters

3.6.8.1 Mobile DDR SDRAM Timing Parameters

Figure 29. Mobile DDR SDRAM Basic Timing Parameters

Table 42. Mobile DDR SDRAM Timing Parameter Table

ID Parameter Symbol

200 MHz 166 MHz 133 MHz

Unit

Min Max Min Max Min Max

DD1 SDRAM clock high-level width tCH 0.45 0.55 0.45 0.55 0.45 0.55 tCK

DD2 SDRAM clock low-level width tCL 0.45 0.55 0.45 0.55 0.45 0.55 tCK

DD3 SDRAM clock cycle time tCK 5—6—7.5—ns

DD4 CS, RAS, CAS, CKE, WE setup time tIS1

1This parameter is affected by pad timing. if the slew rate is < 1 V/ns, 0.2 ns should be added to the value. For cmos65 pads

this is true for medium and low drive strengths.

0.9 — 1.1 — 1.3 — ns

DD5 CS, RAS, CAS, CKE, WE hold time tIH10.9 — 1.1 — 1.3 — ns

DD6 Address output setup time tIS10.9 — 1.1 — 1.3 — ns

DD7 Address output hold time tIH10.9 — 1.1 — 1.3 — ns

SDCLK

ADDR ROW/BA COL/BA

CAS

RAS

DD1

DD3

DD2

DD4

DD5

DD6 DD7

SDCLK

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Electrical Characteristics

Figure 30. Mobile DDR SDRAM Write cycle Timing Diagram

Table 43. Mobile DDR SDRAM Write Cycle Parameter Table1

1Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for

address and controls

ID Parameter Symbol

200 MHz2

2SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal

value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK

and SDCLK (inverted clock).

166 MHz 133 MHz

Unit

Min Max Min Max Min Max

DD17 DQ and DQM setup time to DQS tDS3

3This parameter is affected by pad timing. If the slew rate is < 1 V/ns, 0.1 ns should be increased to this value.

0.48 — 0.6 — 0.8 — ns

DD18 DQ and DQM hold time to DQS tDH10.48 — 0.6 — 0.8 — ns

DD19 Write cycle DQS falling edge to

SDCLK output setup time

tDSS 0.2 — 0.2 — 0.2 — tCK

DD20 Write cycle DQS falling edge to

SDCLK output hold time

tDSH 0.2 — 0.2 — 0.2 — tCK

DD21 Write command to first DQS latching

transition

tDQSS 0.75 1.25 0.75 1.25 0.75 1.25 tCK

DD22 DQS high level width tDQSH 0.4 0.6 0.4 0.6 0.4 0.6 tCK

DD23 DQS low level width tDQSL 0.4 0.6 0.4 0.6 0.4 0.6 tCK

SDCLK

SDCLK_B

DQS (output)

DQ (output)

DQM (output)

Data Data Data Data Data Data Data Data

DM DM DM DM DM DM DM DM

DD17

DD18 DD18

DD19 DD20

DD21 DD23

DD22

Electrical Characteristics

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Figure 31. Mobile DDR SDRAM DQ vs. DQS and SDCLK READ Cycle Timing Diagram

Table 44. Mobile DDR SDRAM Read Cycle Parameter Table1

1Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for

address and controls

ID PARAMETER Symbol

200 MHz2

2SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal

value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK

and SDCLK (inverted clock)

166 MHz 133 MHz

Unit

Min Max Min Max Min Max

DD24 DQS - DQ Skew (defines the Data valid window in read cycles

related to DQS)

tDQSQ — 0.4 — 0.75 — 0.85 ns

DD25 DQS DQ in HOLD time from DQS tQH 1.75 — 2.05 — 2.6 — ns

DD26 DQS output access time from SDCLK posedge tDQSCK 2 5 2 5.5 2 6.5 ns

SDCLK

SDCLK_B

DQS (input)

DQ (input) Data

Data

DataData

Data

DataData

DD26

DD24

DD25

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Electrical Characteristics

3.6.9 DDR2 SDRAM Specific Parameters

Figure 32 shows the timing parame ters for DDR2. The timing parame ters for this diagram appear in

Table 45.

Figure 32. DDR2 SDRAM Basic Timing Parameters

Table 45. DDR2 SDRAM Timing Parameter Table

ID Parameter Symbol

SDCLK = 200 MHz

Unit

Min Max

DDR1 SDRAM clock high-level width tCH 0.45 0.55 tCK

DDR2 SDRAM clock low-level width tCL 0.45 0.55 tCK

DDR3 SDRAM clock cycle time tCK 5—ns

DDR4 CS, RAS, CAS, CKE, WE, ODT setup time tIS10.35 — ns

DDR5 CS, RAS, CAS, CKE, WE, ODT hold time tIH10.475 — ns

SDCLK

ADDR ROW/BA COL/BA

CAS

RAS

DDR1

DDR3

DDR2

DDR4

DDR5

DDR6

DDR7

SDCLK

ODT/CKE

DDR4

Electrical Characteristics

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DDR6 Address output setup time tIS10.35 — ns

DDR7 Address output hold time tIH10.475 — ns

1These values are for command/address slew rates of 1V/ns and SDCLK / SDCLK_B differential slew rate of 2 V/ns. For

different values use the settings shown in Ta b l e 4 6 .

Table 46. Derating Values for DDR2-400 (SDCLK = 200 MHz)

Command /

Address

Slew Rate

(V/ns)

SDCLK Differential Slew Rates1,2

1Test conditions are: Capacitance 15 pF for DDR contacts. Recommended drive strengths: Medium for SDCLK and High for

address and controls.

2SDCLK and DQS related parameters are measured from the 50% point. For example, a high is defined as 50% of the signal

value and a low is defined as 50% of the signal value. DDR SDRAM CLK parameters are measured at the crossing point of

SDCLK and SDCLK_B

Unit2.0 V/ns 1.5 V/ns 1.0 V/ns

ΔtlS ΔtlH ΔtlS ΔtlH ΔtlS ΔtlH

4.0 +187 +94 +217 +124 +247 +154 ps

3.5 +179 +89 +209 +119 +239 +149 ps

3.0 +167 +83 +197 +113 +227 +143 ps

2.5 +150 +75 +180 +105 +210 +135 ps

2.0 +125 +45 +155 +75 +185 +105 ps

1.5 +83 +21 +113 +51 +143 +81 ps

1.0 +0 +0 +30 +30 +60 +60 ps

0.9 –11 –14 +19 +16 +49 +46 ps

0.8 –25 –31 +5 –1 +35 +29 ps

0.7 –43 –54 –13 –24 +17 +6 ps

0.6 –67 –83 –37 –53 –7 –23 ps

0.5 –110 –125 –80 –95 –50 –65 ps

0.4 –175 –188 –145 –158 –115 –128 ps

0.3 –285 –292 –255 –262 –225 –232 ps

0.25 –350 –375 –320 –345 –290 –315 ps

0.2 –525 –500 –495 –470 –465 –440 ps

0.15 –800 –708 –770 –678 –740 –648 ps

0.1 –1450 –1125 –1420 –1095 –1390 –1065 ps

Table 45. DDR2 SDRAM Timing Parameter Table (continued)

ID Parameter Symbol

SDCLK = 200 MHz

Unit

Min Max

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Electrical Characteristics

Figure 33. DDR2 SDRAM Write Cycle

Table 47. DDR2 SDRAM Write Cycle

ID PARAMETER Symbol

SDCLK = 200 MHz

Unit

Min Max

DDR17 DQ and DQM setup time to DQS (differential strobe)1

1These values are for DQ/DM slew rates of 1 V/ns and DQS/DQS_B differential slew rates of 2 V/ns. For different values use

derating table below

tDS(base) 0.15 — ns

DDR18 DQ and DQM hold time to DQS (differential strobe)1tDH(base) 0.275 — ns

DDR17 DQ and DQM setup time to DQS (single-ended strobe)2

2These values are for DQ/DM slew rates of 1 V/ns and DQS slew rates of 1 V/ns. For different values use derating table below

tDS1(base) 0.025 — ns

DDR18 DQ and DQM hold time to DQS (single-ended strobe)2tDH1(base) 0.025 — ns

DDR19 Write cycle DQS falling edge to SDCLK output setup time tDSS 0.2 — tCK

DDR20 Write cycle DQS falling edge to SDCLK output hold time tDSH 0.2 — tCK

DDR21 DQS latching rising transitions to associated clock edges tDQSS –0.25 0.25 tCK

DDR22 DQS high level width tDQSH 0.35 — tCK

DDR23 DQS low level width tDQSL 0.35 — tCK

SDCLK

SDCLK_B

DQS (output)

DQ (output)

DQM (output)

Data Data Data Data Data Data Data Data

DM DM DM DM DM DM DM DM

DDR17

DDR18 DDR18

DDR19 DDR20

DDR21

DDR23

DDR22

Electrical Characteristics

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Table 48. Derating values for DDR2 Differential DQS1,2

Table 49. Derating values for DDR2 Single Ended DQS3,4

1. Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for

address and controls.

2. SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal

value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK

and SDCLK (inverted clock).

3. Test conditions are: Capacitance 15 pF for DDR PADS. Recommended drive strengths is medium for SDCLK and high for

address and controls.

4. SDRAM CLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal

value and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK

and SDCLK (inverted clock).

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Electrical Characteristics

Figure 34. DDR2 SDRAM DQ vs. DQS and SDCLK READ Cycle

3.7 External Peripheral Interfaces

3.7.1 CSPI Timing Parameters

This section describe s the timing paramete rs of the CSPI. The CSPI has separa te timing paramete rs for

master and slave modes. The nomenclature used with the CSPI modules and the respective routing of these

signals is shown in Table 51 on page 59.

Table 50. DDR2 SDRAM Read Cycle1

1Test conditions are: Capacitance of 15 pF for DDR contacts. The recommended drive strength is Medium for SDCLK and High

for address and controls

ID Parameter Symbol

SDCLK = 200 MHz2

2SDCLK and DQS related parameters are being measured from the 50% point. that is, high is defined as 50% of signal value

and low is defined as 50% as signal value. DDR SDRAM CLK parameters are measured at the crossing point of SDCLK and

SDCLK_B.

Unit

Min Max

DDR24 DQS - DQ Skew (defines the Data valid window in read cycles related to

DQS).

tDQSQ —0.35ns

DDR25 DQS DQ in HOLD time from DQS tQH 1.8 — ns

DDR26 DQS output access time from SDCLK posedge tDQSCK –0.5 0.5 ns

SDCLK

SDCLK_B

DQS (input)

DQ (input)

DATA

DATADATA

DATA

DATADATA

DDR26

DDR24

DDR25

Electrical Characteristics

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3.7.1.1 CSPI Master Mode Timing

Figure 35 de picts the timing of CSPI in Master mode and Table 52 lists the CSPI Master Mode timing

characteristics.

Figure 35. CSPI Master Mode Timing Diagram

Table 51. CSPI Nomenclature and Routing

Module I/O Access

eCSPI1 CSPI11, USBH1, and DI1 via IOMUX

1This set of BGA contacts is labeled CSPI, but is actually an eCSPI channel

eCSPI2 NANDF and USBH1 via IOMUX

CSPI NANDF, USBH1, SD1, SD2, and GPIO via IOMUX

Table 52. CSPI Master Mode Timing Parameters

ID Parameter Symbol Min Max Unit

CS1 CSPIx_CLK Cycle Time tclk 60 — ns

CS2 CSPIx_CLK High or Low Time tSW 6—ns

CS3 CSPIx_CLK Rise or Fall tRISE/FALL ——ns

CS4 CSPIx_CS_x pulse width tCSLH 15 — ns

CS5 CSPIx_CS_x Lead Time (CS setup time) tSCS 5—ns

CS6 CSPIx_CS_x Lag Time (CS hold time) tHCS 5—ns

CS7 CSPIx_DO Setup Time tSmosi 5—ns

CS8 CSPIx_DO Hold Time tHmosi 5—ns

CS9 CSPIx_DI Setup Time tSmiso 5—ns

CS1

CS7 CS8

CS2

CS4

CS6 CS5

CS9 CS10

CSPIx_CLK

CSPIx_CS_x

CSPIx_DO

CSPIx_DI

CSPIx_DRYN1

CS11

CS3

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Electrical Characteristics

3.7.1.2 CSPI Slave Mode Timing

Figure 36 de picts the timing of CSPI in Slave mode. Table 53 lists the CSPI Slave Mode timing

characteristics.

Figure 36. CSPI Slave Mode Timing Diagram

CS10 CSPIx_DI Hold Time tHmiso 5—ns

CS11 CSPIx_DRYN Setup Time tSDRY 5—ns

Table 53. CSPI Slave Mode Timing Parameters

ID Parameter Symbol Min Max Unit

CS1 CSPIx_CLK Cycle Time tclk 60 — ns

CS2 CSPIx_CLK High or Low Time tSW 15 — ns

CS3 CSPIx_CLK Rise or Fall tRISE/FALL ——ns

CS4 CSPIx_CS_x pulse width tCSLH 30 — ns

CS5 CSPIx_CS_x Lead Time (CS setup time) tSCS 5—ns

CS6 CSPIx_CS_x Lag Time (CS hold time) tHCS 5—ns

CS7 CSPIx_DO Setup Time tSmosi 5—ns

CS8 CSPIx_DO Hold Time tHmosi 5—ns

CS9 CSPIx_DI Setup Time tSmiso 5—ns

CS10 CSPIx_DI Hold Time tHmiso 5—ns

Table 52. CSPI Master Mode Timing Parameters (continued)

ID Parameter Symbol Min Max Unit

CS1

CS7CS8

CS2

CS4

CS6 CS5

CS9CS10

CSPIx_CLK

CSPIx_CS_x

CSPIx_DI

CSPIx_DO

CS3

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3.7.2 eCSPI Timing Parameters

This section describes the timing parameters of the eCSPI. T he eC SPI has separate timing parameters for

master and slave modes. The nomenclature used with the CSPI modules and the respective routing of these

signals is shown in Table 51 on page 59.

3.7.2.1 eCSPI Master Mode Timing

Figure 35 depicts the timing of eCSPI in Master mode and Table 52 lists the eCSPI Maste r Mode timing

characteristics.

Figure 37. eCSPI Master Mode Timing Diagram

Table 54. eCSPI Master Mode Timing Parameters

ID Parameter Symbol Min Max Unit

CS1 eCSPIx_CLK Cycle Time–Read

eCSPIx_CLK Cycle Time–Write

tclk 60

—ns

CS2 eCSPIx_CLK High or Low Time tSW 6—ns

CS3 eCSPIx_CLK Rise or Fall tRISE/FALL ——ns

CS4 eCSPIx_CS_x pulse width tCSLH 15 — ns

CS5 eCSPIx_CS_x Lead Time (CS setup time) tSCS 5—ns

CS6 eCSPIx_CS_x Lag Time (CS hold time) tHCS 5—ns

CS7 eCSPIx_DO Setup Time tSmosi 5—ns

CS8 eCSPIx_DO Hold Time tHmosi 5—ns

CS9 eCSPIx_DI Setup Time tSmiso 5—ns

CS10 eCSPIx_DI Hold Time tHmiso 5—ns

CS11 eCSPIx_DRYN Setup Time tSDRY 5—ns

CS1

CS7 CS8

CS2

CS4

CS6 CS5

CS9 CS10

eCSPIx_CLK

eCSPIx_CS_x

eCSPIx_DO

eCSPIx_DI

eCSPIx_DRYN1

CS11

CS3

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3.7.2.2 eCSPI Slave Mode Timing

Figure 37 depicts the timing of eCSPI in Slave mode and Table 54 lis ts the eCSPI Slave Mode timing

characteristics.

Figure 38. eCSPI Slave Mode Timing Diagram

Table 55. eCSPI Slave Mode Timing Parameters

ID Parameter Symbol Min Max Unit

CS1 eCSPIx_CLK Cycle Time–Read

eCSPIx_CLK Cycle Time–Write

tclk 60

—ns

CS2 eCSPIx_CLK High or Low Time tSW 6—ns

CS3 eCSPIx_CLK Rise or Fall tRISE/FALL ——ns

CS4 eCSPIx_CS_x pulse width tCSLH 15 — ns

CS5 eCSPIx_CS_x Lead Time (CS setup time) tSCS 5—ns

CS6 eCSPIx_CS_x Lag Time (CS hold time) tHCS 5—ns

CS7 eCSPIx_DO Setup Time tSmosi 5—ns

CS8 eCSPIx_DO Hold Time tHmosi 5—ns

CS9 eCSPIx_DI Setup Time tSmiso 5—ns

CS10 eCSPIx_DI Hold Time tHmiso 5—ns

CS1

CS7 CS8

CS2

CS4

CS6 CS5

CS9CS10

eCSPIx_CLK

eCSPIx_CS_x

eCSPIx_DI

eCSPIx_DO

CS3

Electrical Characteristics

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3.7.3 eSDHCv2 Timing Parameters

This section describes the electrica l information of the eSDHCv2.

Figure 39 depicts the timing of eSDHCv2, and Table 56 lists the eSDHCv2 timing characteristics.

Figure 39. eSDHCv2 Timing

Table 56. eSDHCv2 Interface Timing Specification

ID Parameter Symbols Min Max Unit

Card Input Clock

SD1 Clock Frequency (Low Speed) fPP10400kHz

Clock Frequency (SD/SDIO Full Speed/High Speed) fPP20 25/50 MHz

Clock Frequency (MMC Full Speed/High Speed) fPP30 20/52 MHz

Clock Frequency (Identification Mode) fOD 100 400 kHz

SD2 Clock Low Time tWL 7—ns

SD3 Clock High Time tWH 7—ns

SD4 Clock Rise Time tTLH —3ns

SD5 Clock Fall Time tTHL —3ns

eSDHC Output / Card Inputs CMD, DAT (Reference to CLK)

SD6 eSDHC Output Delay tOD –33ns

eSDHC Input / Card Outputs CMD, DAT (Reference to CLK)

SD1

SD3

SD5

SD4

SD7

MMCx_CMD

output from eSDHCv2 to card

MMCx_DAT_1

......

MMCx_DAT_7

MMCx_DAT_0

MMCx_CMD

input from card to eSDHCv2

MMCx_DAT_1

......

MMCx_DAT_3

MMCx_DAT_0

MMCx_CLK

SD2

SD8

SD6

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Electrical Characteristics

3.7.4 FEC AC Timing Parameters

This section describes the electrical information of the Fast Ethernet Controller (FEC) module. The FEC

is designed to s upport both 10 and 100 Mbps Ethernet/IEEE 802.3 networks. An external transceiver

interface and transceiver function are required to complete the interface to the media. The FEC supports

the 10/100 Mbps MII (18 pins in total) and the 10 Mbps-only 7-wire interface, which uses 7 of the MII

pins, for connection to an external Etherne t transceiver. For the pin list of MII and 7-wire, refer to the

i.MX51 Reference Manual.

This section describes the AC timing specifications of the FEC. The MII signals are compatible with

transceivers operating at a voltage of 3.3 V.

3.7.4.1 MII Receive Signal Timing

The MII receive signal timing involves the FE C_RXD[3:0], FEC_RX_DV, FEC_RX_ER, and

FEC_RX_CLK signals. The receiver functions correctly up to a FEC_RX_CLK maximum frequency of

25 MHz + 1%. There is no minimum frequency requirement but the processor clock frequency must

exceed twice the FEC_RX_CLK frequenc y. Table 57 lists the MII recei ve chann el signal timing

parameters and Figure 40 shows MII receive signal timings.

SD7 eSDHC Input Setup Time tISU 2.5 — ns

SD8 eSDHC Input Hold Time tIH42.5 — ns

1In low speed mode, card clock must be lower than 400 kHz, voltage ranges from 2.7 to 3.6 V.

2In normal speed mode for SD/SDIO card, clock frequency can be any value between 0–25 MHz. In high-speed mode, clock

frequency can be any value between 0–50 MHz.

3In normal speed mode for MMC card, clock frequency can be any value between 0–20 MHz. In high-speed mode, clock

frequency can be any value between 0–52 MHz.

4To satisfy hold timing, the delay difference between clock input and cmd/data input must not exceed 2 ns.

Table 57. MII Receive Signal Timing

Num Characteristic1

1FEC_RX_DV, FEC_RX_CLK, and FEC_RXD0 have same timing in 10 Mbps 7-wire interface mode.

Min Max Unit

M1 FEC_RXD[3:0], FEC_RX_DV, FEC_RX_ER to FEC_RX_CLK setup 5 — ns

M2 FEC_RX_CLK to FEC_RXD[3:0], FEC_RX_DV, FEC_RX_ER hold 5 — ns

M3 FEC_RX_CLK pulse width high 35% 65% FEC_RX_CLK period

M4 FEC_RX_CLK pulse width low 35% 65% FEC_RX_CLK period

Table 56. eSDHCv2 Interface Timing Specification (continued)

ID Parameter Symbols Min Max Unit

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Figure 40. MII Receive Signal Timing Diagram

3.7.4.2 MII Transmit Signal Timing

The MII trans mit signal timing affects the FEC_TXD[3:0] , FEC_T X_EN, FEC_TX_ER , and

FEC _TX_CLK signals. The transm itte r functions corr ectly up to a FEC_TX_CLK maximum frequenc y

of 25 MHz + 1%. There is no minimum frequency requirement. In addition, the processor clock frequency

must exceed t wice the FEC _TX_C LK frequency. Table 58 lists MII transmit channel timing parameters

and Figure 41 shows MII transmit signal timing diagram for the value s listed in Table 58.

Figure 41. MII Transmit Signal Timing Diagram

Table 58. MII Transmit Signal Timing

Num Characteristic1

1FEC_TX_EN, FEC_TX_CLK, and FEC_TXD0 have the same timing in 10 Mbps 7-wire interface mode.

Min Max Unit

M5 FEC_TX_CLK to FEC_TXD[3:0], FEC_TX_EN, FEC_TX_ER invalid 5 — ns

M6 FEC_TX_CLK to FEC_TXD[3:0], FEC_TX_EN, FEC_TX_ER valid — 20 ns

M7 FEC_TX_CLK pulse width high 35% 65% FEC_TX_CLK period

M8 FEC_TX_CLK pulse width low 35% 65% FEC_TX_CLK period

FEC_RX_CLK (input)

FEC_RXD[3:0] (inputs)

FEC_RX_DV

FEC_RX_ER

M1 M2

FEC_TX_CLK (input)

FEC_TXD[3:0] (outputs)

FEC_TX_EN

FEC_TX_ER

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Electrical Characteristics

3.7.4.3 MII Async Inputs Signal Timing (FEC_CRS and FEC_COL)

Table 59 lis t s MII async hronous inputs signal timing information. Figure 42 shows MII asynchronous

input timings listed in Table 59.

Figure 42. MII Async Inputs Timing Diagram

3.7.4.4 MII Serial Management Channel Timing (FEC_MDIO and FEC_MDC)

Table 60 lists MII serial management channel timings. Figure 43 shows MII serial management channel

timings listed in Table 60. The MDC frequency should be equal to or less than 2.5 MHz to be compliant

with the IEEE 802.3 MII specification. However the FEC can function correctly with a maximum MDC

frequency of 15 MHz.

Table 59. MII Async Inputs Signal Timing

Num Characteristic Min Max Unit

M91

1FEC_COL has the same timing in 10 Mbit 7-wire interface mode.

FEC_CRS to FEC_COL minimum pulse width 1.5 — FEC_TX_CLK period

Table 60. MII Transmit Signal Timing

ID Characteristic Min Max Unit

M10 FEC_MDC falling edge to FEC_MDIO output invalid (minimum propagation delay) 0 — ns

M11 FEC_MDC falling edge to FEC_MDIO output valid (max propagation delay) — 5 ns

M12 FEC_MDIO (input) to FEC_MDC rising edge setup 18 — ns

M13 FEC_MDIO (input) to FEC_MDC rising edge hold 0 — ns

M14 FEC_MDC pulse width high 40% 60% FEC_MDC period

M15 FEC_MDC pulse width low 40% 60% FEC_MDC period

FEC_CRS, FEC_COL

Electrical Characteristics

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Figure 43. MII Serial Management Channel Timing Diagram

3.7.5 Frequency Pre-Multiplier (FPM) Electrical Parameters (CKIL)

The FPM is a DPLL that converts a signal operating in the kilohertz region into a clock signal operating

in the megahertz region. The output of the FPM provides the reference frequency for the on-chip DPLLs.

Par ameter s of the FPM are listed in Table 61.

3.7.6 High-Speed I2C (HS-I2C) Timing Parameters

This section describes the timing parame ters of the HS-I2C module. This module can operate in the

following modes: Standard, Fast and High speed.

NOTE

See the errata for the HS-I2C module in the i.MX51 Chip Errata. There are

two standard I2C modules that have no errata.

Table 61. FPM Specifications

Parameter Min Typ Max Unit

Reference clock frequency range—CKIL 32 32.768 256 kHz

FPM output clock frequency range 8 — 33 MHz

FPM multiplication factor (test condition is changed by a factor of 2) 128 — 1024 —

Lock-in time1

1plrf = 1 cycle assumed missed + x cycles for reset deassert + y cycles for calibration and lock x[ts] = {2,3,5,9};

y[ts] = {7,8,10,14}; where ts is the chosen time scale of the reference clock. In this case reference clock = 32 kHz which makes

ts = 0, therefore total time required for achieving lock is 10(1+2+7) cycles or 312.5 µs.

— — 312.5 µs

Cycle-to-cycle frequency jitter (peak to peak) — 8 20 ns

FEC_MDC (output)

FEC_MDIO (output)

M14

M15

M10

M11

M12 M13

FEC_MDIO (input)

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Electrical Characteristics

3.7.6.1 Standard and Fast Mode Timing Parameters

Figure 44 de picts the standard and fast mode timings of HS-I2C module, and Table 62 lists the timing

characteristics.

Figure 44. HS-I2C Standard and Fast Mode Bus Timing

Table 62. HS-I2C Timing Parameters—Standard and Fast Mode

ID Parameter

Standard Mode Fast Mode

Unit

Min Max Min Max

IC1 SCLH cycle time 10 — 2.5 — µs

IC2 Hold time (repeated) START condition 4.0 — 0.6 — µs

IC3 Set-up time for STOP condition 4.0 — 0.6 — µs

IC4 Data hold time 01

1A device must internally provide a hold time of at least 300 ns for SDAH signal in order to bridge the undefined region of the

falling edge of SCLH.

3.452

2The maximum hold time has only to be met if the device does not stretch the LOW period (ID no IC6) of the SCLH signal

010.92µs

IC5 HIGH Period of SCLH Clock 4.0 — 0.6 — µs

IC6 LOW Period of the SCLH Clock 4.7 — 1.3 — µs

IC7 Set-up time for a repeated START condition 4.7 — 0.6 — µs

IC8 Data set-up time 250 — 1003

3A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the requirement of Set-up time (ID No IC8)

of 250 ns must then be met. This automatically is the case if the device does not stretch the LOW period of the SCLH signal.

If such a device does stretch the LOW period of the SCLH signal, it must output the next data bit to the SDAH line max_rise_time

(ID No IC10) + data_setup_time (ID No IC8) = 1000 + 250 = 1250 ns (according to the Standard-mode I2C-bus specification)

before the SCLH line is released.

—ns

IC9 Bus free time between a STOP and START condition 4.7 — 1.3 — µs

IC10 Rise time of both SDAH and SCLH signals — 1000 20+0.1Cb4

4Cb = total capacitance of one bus line in pF.

300 ns

IC11 Fall time of both SDAH and SCLH signals — 300 20+0.1Cb4300 ns

IC12 Capacitive load for each bus line (Cb) — 100 — 100 pF

IC10 IC11 IC9

IC2 IC8 IC4 IC7 IC3

IC6

IC10

IC5

IC11 START STOP START

START

SDAH

SCLH

IC1

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3.7.6.2 High-Speed Mode Timing Parameters

Figure 45 depicts the high-speed mode timings of HS-I2C module, and Table 63 lists the timing

characteristics.

Figure 45. High-Speed Mode Timing

Table 6 3. HS-I2C High-Speed Mode Timing Parameters

ID Parameter

High-Speed Mode

Unit

Min Max

IC1 SCLH cycle time 10 3.4 MHz

IC2 Setup time (repeated) START condition 160 — ns

IC3 Hold time (repeated) START condition 160 — ns

IC4 LOW Period of the SCLH Clock 160 — ns

IC5 HIGH Period of SCLH Clock 60 — ns

IC6 Data set-up time 10 — ns

IC7 Data hold time 01

1A device must internally provide a hold time of at least 300 ns for SDAH signal in order to bridge the undefined region of the

falling edge of SCLH.

70 ns

IC8 Rise time of SCLH 10 40 ns

IC9 Rise time of SCLH signal after a repeated START condition and after an acknowledge bit 10 80 ns

IC10 Fall time of SCLH signal 10 40 ns

IC11 Rise time of SDAH signal 10 80 ns

IC12 Fall time of SDAH signal 10 80 ns

IC13 Set-up time for STOP condition 160 — ns

IC14 Capacitive load for each bus line (Cb) — 100 pF

IC11 IC12

IC3 IC6 IC7 IC2 IC13

IC4

IC9

IC5

IC10 START STOP START

START

SDAH

SCLH

IC1

IC8

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Electrical Characteristics

3.7.7 I2C Module Timing Parameters

This section describes the timing parame ters of the I2C Module. Figure 46 depicts the timing of I2C

module, and Table 64 lists the I2C Module timing characteristics.

Figure 46. I2C Bus Timing

Table 64. I2C Module Timing Parameters

ID Parameter

Standard Mode

Supply Voltage =

1.65 V–1.95 V, 2.7 V–3.3 V

Fast Mode

Supply Voltage =

2.7 V–3.3 V Unit

Min Max Min Max

IC1 I2CLK cycle time 10 — 2.5 — µs

IC2 Hold time (repeated) START condition 4.0 — 0.6 — µs

IC3 Set-up time for STOP condition 4.0 — 0.6 — µs

IC4 Data hold time 01

1A device must internally provide a hold time of at least 300 ns for I2DAT signal in order to bridge the undefined region of the

falling edge of I2CLK.

3.452

2The maximum hold time has only to be met if the device does not stretch the LOW period (ID no IC5) of the I2CLK signal

010.92µs

IC5 HIGH Period of I2CLK Clock 4.0 — 0.6 — µs

IC6 LOW Period of the I2CLK Clock 4.7 — 1.3 — µs

IC7 Set-up time for a repeated START condition 4.7 — 0.6 — µs

IC8 Data set-up time 250 — 1003

3A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the requirement of Set-up time (ID No IC7)

of 250 ns must be met. This automatically is the case if the device does not stretch the LOW period of the I2CLK signal.

If such a device does stretch the LOW period of the I2CLK signal, it must output the next data bit to the I2DAT line

max_rise_time (IC9) + data_setup_time (IC7) = 1000 + 250 = 1250 ns (according to the Standard-mode I2C-bus specification)

before the I2CLK line is released.

—ns

IC9 Bus free time between a STOP and START condition 4.7 — 1.3 — µs

IC10 Rise time of both I2DAT and I2CLK signals — 1000 20 + 0.1Cb4

4Cb = total capacitance of one bus line in pF.

300 ns

IC11 Fall time of both I2DAT and I2CLK signals — 300 20 + 0.1Cb4300 ns

IC12 Capacitive load for each bus line (Cb) — 400 — 400 pF

IC10 IC11 IC9

IC2 IC8 IC4 IC7 IC3

IC6

IC10

IC5

IC11 START STOP START

START

I2DAT

I2CLK

IC1

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3.7.8 Image Processing Unit (IPU) Module Parameters

The purpose of the IPU is to provide comprehensive support for the flow of data fr om an image sensor

and/or to a display device. This support covers all aspects of these activities:

• Connectivity to relevant devices—cameras, displays, graphics accelerators, and TV encoders.

• Related image processing and manipulation: sensor image signal processing, display processing,

image conversions, and other related functions.

• Synchroniza tion and control capabilities such as avoidance of tearing artifacts.

3.7.8.1 Sensor Interface Timings

There are three camera timing modes supported by the IPU.

3.7.8.1.1 BT.656 and BT.1120 Video Mode

Smart camera sensors, which include imaging processing, usually support video mode transfer. They use

an embedded timing syntax to replace the SENSB_VSYNC and SENSB_HSYNC signals. The timing

syntax is defined by the BT. 656/BT.1120 standards.

This operation mode f ollows the recommendations of ITU BT.656/ ITU B T.1 120 specifications. The only

control signal used is SENSB_PIX_CLK. Start-of-frame and active-line si gnals are embedded in the data

stream . An active line star t s with a SAV code and ends with a EAV code. In some cases, digital blanking

is i nserted in between EAV and SAV code. The CSI decodes and filters ou t the timing-coding from the data

stream, thus recover ing SENSB_V SYNC and SENSB_HSYNC signals for internal use. On BT.656 one

component per cycle is received over the SENSB_DATA bus. On BT.1120 two components per cycle are

received over the SENSB_DATA bus.

3.7.8.1.2 Gated Clock Mode

The SENSB_VSYNC, SENSB_HSYNC, and SENSB_PIX_CLK signals are used in this mode. See

Figure 47.

Figure 47. Gated Clock Mode Timing Diagram

SENSB_VSYNC

SENSB_HSYNC

SENSB_PIX_CLK

SENSB_DATA[19:0] invalid

1st byte

n+1th frame

invalid

1st byte

nth frame

Active Line

Start of Frame

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Electrical Characteristics

A frame starts with a rising edge on SENSB_VSYNC (all the timings correspond to straight polarity of the

corresponding signa ls). Then SENSB_HSYNC goes to high and hold for the entire line. Pixel clock is

valid as long as SENSB_HSYNC is high. Data is la tched at the rising edge of the valid pixel clocks.

SENSB_HSYNC goes to low at the end of line. Pixel clocks then become invalid and the CSI stops

receiving data from the stream . For next line the SENSB_HSYNC timing repeats. For next frame the

SENSB _VSYNC timing repeats.

3.7.8.1.3 Non-Gated Clock Mode

The timing is the same as the gate d-clock mode (described in Section 3.7.8.1.2, “Gated Clock Mode”),

except for the SENSB_HSYNC signal, which is not used. See Figure 48. All incoming pixel clocks are

valid and cause data to be latched into the input FIFO. The SENSB_PIX_CLK signal is inactive (states

low) until valid data is going to be transmitted over the bus.

Figure 48. Non-Gated Clock Mode Timing Diagram

The timing described in Figure 48 is that of a typical sensor. Some other sensors may have a slightly

different timing. The CSI can be programmed to support rising/falling-edge triggered SENSB_VSYNC;

active-high/low SENSB_HSYNC; and rising/falling-edge triggered SENSB_PIX_CLK.

3.7.8.2 Electrical Characteristics

Figure 49 de picts the sensor interf ace timing. SENSB_MCLK signal descri bed here is not generated by

the IPU.

Figure 49. Sensor Interface Timing Diagram

SENSB_VSYNC

SENSB_PIX_CLK

SENSB_DATA[19:0] invalid

1st byte

n+1th frame

invalid

1st byte

nth frame

Start of Frame

IP3

SENSB_DATA,

SENSB_VSYNC,

IP2 1/IP1

SENSB_PIX_CLK

(Sensor Output)

SENSB_HSYNC

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3.7.8.3 IPU Display Interface Signal Mapping

The IPU supports a number of dis play output video formats. Table 66 defines the mapping of the Dis play

Interface Pins used during various supported video interface formats.

Table 65. Sensor Interface Timing Characteristics

ID Parameter Symbol Min Max Unit

IP1 Sensor output (pixel) clock frequency Fpck 0.01 120 MHz

IP2 Data and control setup time Tsu 3 — ns

IP3 Data and control holdup time Thd 2 — ns

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Electrical Characteristics

Table 66. Video Signal Cross-Reference

i.MX51A LCD

Comment1

Port Name

(x=1,2)

RGB,

Signal

Name

(General)

RGB/TV Signal Allocation (Example) Smart

16-bit

RGB

18-bit

RGB

24 Bit

RGB

8-bit

YCrCb2

16-bit

YCrCb

20-bit

YCrCb

Signal

Name

DISPx_DAT0 DAT[0] B[0] B[0] B[0] Y/C[0] C[0] C[0] DAT[0] The restrictions are as follows:

a) There are maximal three

continuous groups of bits that

could be independently mapped to

the external bus.

Groups should not be overlapped.

b) The bit order is expressed in

each of the bit groups, for example

B[0] = least significant blue pixel

bit

DISPx_DAT1 DAT[1] B[1] B[1] B[1] Y/C[1] C[1] C[1] DAT[1]

DISPx_DAT2 DAT[2] B[2] B[2] B[2] Y/C[2] C[2] C[2] DAT[2]

DISPx_DAT3 DAT[3] B[3] B[3] B[3] Y/C[3] C[3] C[3] DAT[3]

DISPx_DAT4 DAT[4] B[4] B[4] B[4] Y/C[4] C[4] C[4] DAT[4]

DISPx_DAT5 DAT[5] G[0] B[5] B[5] Y/C[5] C[5] C[5] DAT[5]

DISPx_DAT6 DAT[6] G[1] G[0] B[6] Y/C[6] C[6] C[6] DAT[6]

DISPx_DAT7 DAT[7] G[2] G[1] B[7] Y/C[7] C[7] C[7] DAT[7]

DISPx_DAT8 DAT[8] G[3] G[2] G[0] — Y[0] C[8] DAT[8]

DISPx_DAT9 DAT[9] G[4] G[3] G[1] — Y[1] C[9] DAT[9]

DISPx_DAT10 DAT[10] G[5] G[4] G[2] — Y[2] Y[0] DAT[10]

DISPx_DAT11 DAT[11] R[0] G[5] G[3] — Y[3] Y[1] DAT[11]

DISPx_DAT12 DAT[12] R[1] R[0] G[4] — Y[4] Y[2] DAT[12]

DISPx_DAT13 DAT[13] R[2] R[1] G[5] — Y[5] Y[3] DAT[13]

DISPx_DAT14 DAT[14] R[3] R[2] G[6] — Y[6] Y[4] DAT[14]

DISPx_DAT15 DAT[15] R[4] R[3] G[7] — Y[7] Y[5] DAT[15]

DISPx_DAT16 DAT[16] — R[4] R[0] — — Y[6] —

DISPx_DAT17 DAT[17] — R[5] R[1] — — Y[7] —

DISPx_DAT18 DAT[18] — — R[2] — — Y[8] —

DISPx_DAT19 DAT[19] — — R[3] — — Y[9] —

DISPx_DAT20 DAT[20] — — R[4] — — — —

DISPx_DAT21 DAT[21] — — R[5] — — — —

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DISPx_DAT22 DAT[22] — — R[6] — — — — —

DISPx_DAT23 DAT[23] — — R[7] — — — — —

DIx_DISP_CLK PixCLK — —

DIx_PIN1 — VSYNC_IN May be required for anti-tearing

DIx_PIN2 HSYNC — —

DIx_PIN3 VSYNC — VSYNC out

DIx_PIN4 — — Additional frame/row synchronous

signals with programmable timing

DIx_PIN5 — —

DIx_PIN6 — —

DIx_PIN7 — —

DIx_PIN8 — —

DIx_D0_CS — CS0 —

DIx_D1_CS — CS1 Alternate mode of PWM output for

contrast or brightness control

DIx_PIN11 — WR —

DIx_PIN12 — RD —

DIx_PIN13 — RS1 Register select signal

DIx_PIN14 — RS2 Optional RS2

DIx_PIN15 DRDY/DV DRDY Data validation/blank, data enable

DIx_PIN16 — — Additional data synchronous

signals with programmable

features/timing

DIx_PIN17 Q —

1 Signal mapping (both data and control/synchronization) is flexible. The table provides examples.

2This mode works in compliance with recommendation ITU-R BT.656. The timing reference signals (frame start, frame end, line

start, and line end) are embedded in the 8-bit data bus. Only video data is supported, transmission of non-video related data

during blanking intervals is not supported.

Table 66. Video Signal Cross-Reference (continued)

i.MX51A LCD

Comment1

Port Name

(x=1,2)

RGB,

Signal

Name

(General)

RGB/TV Signal Allocation (Example) Smart

16-bit

RGB

18-bit

RGB

24 Bit

RGB

8-bit

YCrCb2

16-bit

YCrCb

20-bit

YCrCb

Signal

Name

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Electrical Characteristics

3.7.8.4 IPU Display Interface Timing

The IPU Display Interface supports two kinds of display’ s accesses: synchronous and asynchronous. There

are two groups of external interface pins to provide synchronous and asynchronous controls accordantly.

3.7.8.4.1 Synchronous Controls

The synchronous control is a signal that changes it s value as a function either of a system or of an external

clock. This control has a permanent period and a permanent wave form.

There are special physical outputs to provide synchronous controls:

• The ipp_disp_clk is a dedicated base synchronous signal that is used to generate a base display

(component, pixel) clock for a display.

• The ipp_pin_1– ipp_pin_7 are general purpose synchronous pins, that can be used to provide

HSYNC, VSYNC, DRDY or any else independent signal to a display.

The IPU has a system of internal binding counters for internal events (like HSYNC/VSYCN etc.)

calculation. The internal event (local start point) is synchronized with internal DI_CLK. A suitable control

starts from the local start point with predefined UP and DOWN values to calculate control’s changing

points with half DI_CLK resolution. A full description of the counters system is in the IPU chapter of the

i.MX51 reference manual.

3.7.8.4.2 Asynchronous Controls

The asynchronous control is a data oriented signal that changes its a value with an output data according

to an additional internal flags coming with the data.

There are special physical outputs to provide asynchronous controls, as follows:

• The ipp_d0_cs and ipp_d1_cspins are dedicated to provide chip select signals to two displays

• The ipp_pin_11– ipp_pin_17 are general purpose asynchronous pins, that can be used to provide

WR. RD, RS or any else data oriented signal to display.

NOTE

The IPU has independent signal generators for asynchronous signals

toggling. When a DI decides to put a new asynchronous data in the bus, a

new internal star t (local st ar t point) is generated. The signals generators

calculate predefined UP and DOWN values to change pins states with half

DI_CLK resolution.

3.7.8.5 Synchronous Interfaces to Standard Active Matrix TFT LCD Panels

3.7.8.5.1 IPU Display Operating Signals

The IPU uses four control signals and data to operate a standard synchronous interface:

• IPP_DIS P_CLK—Clock to display

• HSYNC—Horizontal synchronization

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• VSYNC—Vertical synchronization

• DRDY—Active data

All synchronous display controls are generated on base of an internal generated “local start point” . The

synchronous display controls can be placed on time axis with DI’s offset, up and down parameters. The

display access can be whole number of DI clock (Tdiclk) only. The IPP_DATA can not be moved relative

to the local start point.

3.7.8.5.2 LCD Interface Functional Description

Figure 50 depicts the LCD interface timing for a generic active matrix color TFT panel. In this figure

signals are shown with negative polarity. The sequence of events for active matrix interface timing is:

• DI_CLK internal DI clock, used for calculation of other controls.

• IPP_DISP_CLK latches data into the panel on its negative edge (when positive polarity is

selected). In active mode, IPP_DISP_CLK runs continuously.

• HSYNC causes the panel to start a new line. (Usually IPP_PIN_2 is used as HSYNC)

• VSYNC causes the panel to start a new frame. It always encompasses at least one HSYNC pulse.

(Usually IPP_PIN_3 is used as VSYNC)

• DRDY acts like an output enable signal to the CRT display. This output enables the data to be

shifted onto the display. When disabled, the data is invalid and the trace is off.

(For DRDY can be used either synchronous or asynchronous generic purpose pin as well.)

Figure 50. Interface Timing Diagram for TFT (Active Matrix) Panels

123 mm-1

HSYNC

VSYNC

HSYNC

LINE 1 LINE 2 LINE 3 LINE 4 LINE n-1 LINE n

DRDY

IPP_DISP_CLK

IPP_DATA

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Electrical Characteristics

3.7.8.5.3 TFT Panel Sync Pulse Timing Diagrams

Figure 51 de picts the horizonta l timing (timing of one line), including both the horizontal sync pulse and

the data. All shown on the figure parameters are programmable. All contr ols are st arted by corr esponding

internal events—local start points. The timing diagrams correspond to inverse polarity of the

IPP_DISP_CLK signal and active-low polarity of the HSYNC, VSYNC and DR DY signals.

Figure 51. TFT Panels Timing Diagram—Horizontal Sync Pulse

Figure 52 depicts the vertical timing (timing of one frame). All parameters shown in the figure are

programmable.

Figure 52. TFT Panels Timing Diagram—Vertical Sync Pulse

DI clock

VSYNC

HSYNC

DRDY

D0 D1

IP5o

IP13o

IP9o

IP8o IP8

IP9

IP10

IP7

IP5

IP6

local start point

IPP_DISP_CLK

IPP_DATA

IP14

VSYNC

HSYNC

DRDY

Start of frame End of frame

IP12

IP15

IP13

IP11

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Table 67 shows timing characteristics of s ignals presented in Figure 51 and Figure 52.

Table 67. Synchronous Display Interface Timing Characteristics (Pixel Level)

ID Parameter Symbol Value Description Unit

IP5 Display interface clock period Tdicp (1) Display interface clock. IPP_DISP_CLK ns

IP6 Display pixel clock period Tdpcp DISP_CLK_PER_PIXEL

× Tdicp

Time of translation of one pixel to display,

DISP_CLK_PER_PIXEL—number of pixel

components in one pixel (1.n). The

DISP_CLK_PER_PIXEL is virtual

parameter to define Display pixel clock

period.

The DISP_CLK_PER_PIXEL is received by

DC/DI one access division to n

components.

IP7 Screen width time Tsw (SCREEN_WIDTH)

× Tdicp

SCREEN_WIDTH—screen width in,

interface clocks. horizontal blanking

included.

The SCREEN_WIDTH should be built by

suitable DI’s counter2.

IP8 HSYNC width time Thsw (HSYNC_WIDTH) HSYNC_WIDTH—Hsync width in DI_CLK

with 0.5 DI_CLK resolution. Defined by DI’s

counter.

IP9 Horizontal blank interval 1 Thbi1 BGXP × Tdicp BGXP—Width of a horizontal blanking

before a first active data in a line. (in

interface clocks). The BGXP should be built

by suitable DI’s counter.

IP10 Horizontal blank interval 2 Thbi2 (SCREEN_WIDTH -

BGXP - FW) × Tdicp

Width a horizontal blanking after a last

active data in a line. (in interface clocks)

FW—with of active line in interface clocks.

The FW should be built by suitable DI’s

counter.

IP12 Screen height Tsh (SCREEN_HEIGHT)

× Tsw

SCREEN_HEIGHT— screen height in lines

with blanking

The SCREEN_HEIGHT is a distance

between 2 VSYNCs.

The SCREEN_HEIGHT should be built by

suitable DI’s counter.

IP13 VSYNC width Tvsw VSYNC_WIDTH VSYNC_WIDTH—Vsync width in DI_CLK

with 0.5 DI_CLK resolution. Defined by DI’s

counter

IP14 Vertical blank interval 1 Tvbi1 BGYP × Tsw BGYP—width of first Vertical

blanking interval in line.The BGYP should

be built by suitable DI’s counter.

IP15 Vertical blank interval 2 Tvbi2 (SCREEN_HEIGHT -

BGYP - FH) × Tsw

width of second Vertical

blanking interval in line.The FH should be

built by suitable DI’s counter.

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The maximal accuracy of UP/DOWN edge of controls is

IP5o Offset of IPP_DISP_CLK Todicp DISP_CLK_OFFSET

× Tdiclk

DISP_CLK_OFFSET— offset of

IPP_DISP_CLK edges from local start

point, in DI_CLK×2

(0.5 DI_CLK Resolution)

Defined by DISP_CLK counter

IP13o Offset of VSYNC Tovs VSYNC_OFFSET

× Tdiclk

VSYNC_OFFSET—offset of Vsync edges

from a local start point, when a Vsync

should be active, in DI_CLK×2

(0.5 DI_CLK Resolution).The

VSYNC_OFFSET should be built by

suitable DI’s counter.

IP8o Offset of HSYNC Tohs HSYNC_OFFSET

× Tdiclk

HSYNC_OFFSET—offset of Hsync edges

from a local start point, when a Hsync

should be active, in DI_CLK×2

(0.5 DI_CLK Resolution).The

HSYNC_OFFSET should be built by

suitable DI’s counter.

IP9o Offset of DRDY Todrdy DRDY_OFFSET

× Tdiclk

DRDY_OFFSET— offset of DRDY edges

from a suitable local start point, when a

corresponding data has been set on the

bus, in DI_CLK×2

(0.5 DI_CLK Resolution)

The DRDY_OFFSET should be built by

suitable DI’s counter.

1Display interface clock period immediate value.

DISP_CLK_PERIOD—number of DI_CLK per one Tdicp. Resolution 1/16 of DI_CLK

DI_CLK_PERIOD—relation of between programing clock frequency and current system clock frequency

Display interface clock period average value.

2DI’s counter can define offset, period and UP/DOWN characteristic of output signal according to programed parameters of the

counter. Same of parameters in the table are not defined by DI’s registers directly (by name), but can be generated by

corresponding DI’s counter. The SCREEN_WIDTH is an input value for DI’s HSYNC generation counter. The distance

between HSYNCs is a SCREEN_WIDTH.

Table 67. Synchronous Display Interface Timing Characteristics (Pixel Level) (continued)

ID Parameter Symbol Value Description Unit

Tdicp

Tdiclk

DISP_CLK_PERIOD

DI_CLK_PERIOD

-------------------------------------------------------

× for integer DISP_CLK_PERIOD

DI_CLK_PERIOD

-------------------------------------------------------,

Tdiclk floor DISP_CLK_PERIOD

DI_CLK_PERIOD

-------------------------------------------------------0.5 0.5±+

⎝⎠

⎛⎞

for fractional DISP_CLK_PERIOD

DI_CLK_PERIOD

-------------------------------------------------------,

⎩

⎪

⎨

⎪

⎧

Tdicp Tdiclk

DISP_CLK_PERIOD

DI_CLK_PERIOD

-------------------------------------------------------

×=

Accuracy 0.5 Tdiclk

×()0.75ns±=

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 81

Preliminary—Subject to Change Without Notice

The maximal accuracy of UP/DOWN edge of IPP_DATA is

The DISP_CLK_PERIOD, DI_CLK_PERIOD parameters are programmed via registers.

Figure 53 depicts the synchronous display interface timing for access level. The DISP_CLK_DOWN and

DISP_C LK_UP paramete rs are set via the Register.

Figure 53. Synchronous Display Interface Timing Diagram—Access Level

Table 68. Synchronous Display Interface Timing Characteristics (Access Level)

ID Parameter Symbol Min Typ1

1The exact conditions have not been finalized, but will likely match the current customer requirement for their specific display.

These conditions may be chip specific.

Max Unit

IP16 Display interface clock

low time

Tckl Tdicd-Tdicu–1.5 Tdicd2–Tdicu3Tdicd–Tdicu+1.5 ns

IP17 Display interface clock

high time

Tckh Tdicp–Tdicd+Tdicu–1.5 Tdicp–Tdicd+Tdicu Tdicp–Tdicd+Tdicu+1.5 ns

IP18 Data setup time Tdsu Tdicd–1.5 Tdicu — ns

IP19 Data holdup time Tdhd Tdicp–Tdicd–1.5 Tdicp–Tdicu — ns

IP20o Control signals offset

times (defines for each

pin)

Tocsu Tocsu–1.5 Tocsu Tocsu+1.5 —

IP20 Control signals setup

time to display interface

clock (defines for each

pin)

Tcsu Tdicd–1.5–Tocsu%Tdicp Tdicu — ns

Accuracy Tdiclk 0.75ns±=

IP19 IP18

IP20

VSYNC

IP17IP16

DRDY

HSYNC

other controls

IP20o

local start point

Tdicd

Tdicu

IPP_DISP_CLK

IPP_DATA

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

82 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.8.6 Interface to a TV Encoder

The interface has an 8-bit data bus, transferring a single 8-bit value (Y/U/V) in each cycle. The timing of

the interface is described in Figure 54.

NOTE

• The frequency of the clock DISP_CLK is 27 MHz (within 10%)

• The HSYNC, VSYNC signals are active low.

• The DRDY signal is shown as active high.

• The transition to the next row is marked by the negative edge of the

HSYNC signal. It remains low for a single clock cyc le

• The transition to the next field/f rame is marked by the negative edge of

the VSYNC signal. It remains low for at least one clock cycles

— At a transition to an odd field (of the next frame), the negative edges

of VSYNC and HSYNC coincide.

— At a transition is to an even field (of the s ame frame), they do not

coincide.

• The active intervals—during which data is transferred—are marked by

the HSYNC signal being high.

2Display interface clock down time

3Display interface clock up time

where CEIL(X) rounds the elements of X to the nearest integers towards infinity.

Tdicd 1

---T

diclk ceil×2 DISP_CLK_DOWN×

DI_CLK_PERIOD

-------------------------------------------------------------

⎝⎠

⎛⎞

Tdicu 1

---T

diclk ceil×2 DISP_CLK_UP×

DI_CLK_PERIOD

---------------------------------------------------

⎝⎠

⎛⎞

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 83

Preliminary—Subject to Change Without Notice

Figure 54. TV Encoder Interface Timing Diagram

HSYNC

VSYNC

Cb Y CrCb Y Cr Y

Pixel Data Timing

Line and Field Timing - NTSC

Even Field Odd Field

Odd Field Even Field

624621

311308

Line and Field Timing - PAL

HSYNC

DRDY

VSYNC

HSYNC

DRDY

VSYNC

Even Field Odd Field

Odd Field Even Field

1523

262261

DRDY

HSYNC

DRDY

VSYNC

HSYNC

VSYNC

524 525 2 3 4 10

263 264 265 266 267 268 269 273

622 623 625 1 2 23

309 310 312 313 314 336

316315

DRDY

DISP_CLK

IPP_DATA

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

84 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.8.6.1 TV Encoder Performance Specifications

The TV encoder output spe cifica tions are shown in Table 69.

Table 69. TV Encoder Video Performance Specifications

Parameter Conditions Min Typ Max Unit

DAC STATIC PERFORMANCE

Resolution1 10 Bits

Integral Nonlinearity (INL)21 2 LSBs

Differential Nonlinearity (DNL)20.6 1 LSBs

Channel-to-channel gain matching22%

Full scale output voltage2Rload = 37.5 Ohm

Rset = 1.05 kOhm

1.24 1.306 1.37 V

DAC DYNAMIC PERFORMANCE

Spurious Free Dynamic Range (SFDR) Fout = 3.38 MHz

Fsamp = 216 MHz

59 dBc

Spurious Free Dynamic Range (SFDR) Fout = 9.28 MHz

Fsamp = 297 MHz

54 dBc

VIDEO PERFORMANCE IN SD MODE2, 3

Short Term Jitter (Line to Line) 2.5 ±ns

Long Term Jitter (Field to Field) 3.5 ±ns

Frequency Response 0-4.0 MHz -0.1 0.1 dB

5.75 MHz -0.7 0 dB

Luminance Nonlinearity 0.5 ±%

Differential Gain 0.35 %

Differential Phase 0.6 Degrees

Signal-to-Noise Ratio (SNR) Flat field full bandwidth 75 dB

Hue Accuracy 0.8 ±Degrees

Color Saturation Accuracy 1.5 ±%

Chroma AM Noise -70 dB

Chroma PM Noise -47 dB

Chroma Nonlinear Phase 0.5 ±Degrees

Chroma Nonlinear Gain 2.5 ±%

Chroma/Luma Intermodulation 0.1 ±%

Chroma/Luma Gain Inequality 1.0 ±%

Chroma/Luma Delay Inequality 1.0 ±ns

VIDEO PERFORMANCE IN HD MODE2

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 85

Preliminary—Subject to Change Without Notice

3.7.8.7 Asynchronous Interfaces

3.7.8.7.1 Standard Parallel Interfaces

The IPU has four signal generator machines for asynchronous signal. Each machine generates IPU’s

internal control levels (0 or 1) by UP and DOWN are defined in Registers. Each asynchronous pin has a

dynamic connection with one of the signal gener ators. This connection is redefine d again with a new

display access (pixel/component) The IPU can generate control signals according to system 80/68

requirements. The burst length is received as a result from predefined behavior of the internal signal

generator machines.

The access to a display is realized by th e followi ng:

• CS (IPP_CS) chip selec t

• WR (IPP_PIN_11) write strobe

• RD (IPP_PIN_12) read strobe

• RS (IPP_PIN_13) Register select (A0)

Both system 80 and system 68k interfaces are supported for all described modes as depicted in Figure 55,

Figure 56, Figure 57, and Figure 58. The timing images correspond to active-low IPP_CS, WR and RD

signals.

Each asynchronous access is defined by an access size parameter . This parameter can be different between

different kinds of accesses. This parameter defines a length of windows, when suitable controls of the

current access are valid. A pause between two different display accesses can be guaranteed by programing

of suitable access sizes. There are no minimal/maximal hold/setup time hard defined by DI. Each control

signal can be switch ed at any time during access siz e.

Luma Frequency Response 0-30 MHz -0.7 0.1 dB

Chroma Frequency Response 0-15 MHz,

YCbCr 422 mode

TBD TBD dB

Luma Nonlinearity 2.6 %

Chroma Nonlinearity 2.2 %

Luma Signal-to-Noise Ratio 0-30 MHz TBD dB

Chroma Signal-to-Noise Ratio 0-15 MHz TBD dB

1Guaranteed by design

2Guaranteed by characterization

3Rset = 1.05 kOhm

Table 69. TV Encoder Video Performance Specifications (continued)

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

86 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

Figure 55. Asynchronous Parallel System 80 Interface (Type 1) Timing Diagram

Burst access mode with sampling by CS signal

Single access mode (all control signals are not active for one display interface clock after each display access)

IPP_CS

IPP_DATA

IPP_CS

IPP_DATA

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 87

Preliminary—Subject to Change Without Notice

Figure 56. Asynchronous Parallel System 80 Interface (Type 2) Timing Diagram

Burst access mode with sampling by WR/RD signals

Single access mode (all control signals are not active for one display interface clock after each display access)

IPP_CS

IPP_DATA

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

88 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

Figure 57. Asynchronous Parallel System 68k Interface (Type 1) Timing Diagram

(READ/WRITE)

(ENABLE)

(READ/WRITE)

(ENABLE)

Burst access mode with sampling by CS signal

Single access mode (all control signals are not active for one display interface clock after each display access)

IPP_CS

IPP_DATA

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 89

Preliminary—Subject to Change Without Notice

Figure 58. Asynchronous Parallel System 68k Interface (Type 2) TIming Diagram

(READ/WRITE)

(ENABLE)

(READ/WRITE)

(ENABLE)

Burst access mode with sampling by ENABLE signal

Single access mode (all control signals are not active for one display interface clock after each display access)

IPP_CS

IPP_DATA

IPP_CS

IPP_DATA

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

90 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

Display operation can be performed with IPP_WAIT signal. The DI reacts to the incoming IPP_WAIT

signal with 2 DI_CLK delay. The DI finishes a current access and a next access is postponed until

IPP_WAI T rel ease. Figure 59 shows timing of the parallel interface with IPP_WAIT control.

Figure 59. Parallel Interface Timing Diagram—Read Wait States

DI clock

IPP_DATA

IPP_WAIT

IPP_DATA_IN

waiting

IP39

IPP_CS

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 91

Preliminary—Subject to Change Without Notice

3.7.8.7.2 Asynchronous Parallel Interface Timing Parameters

Figure 60 depicts timing of asynchronous parallel interfaces based on the system 80 and system 68k

interfaces. Table 71 shows timing characteristics at display access level. All timing diagrams are based

on active low control signals (signals polarity is controlled via the DI _DISP_SIG_POL Register).

Figure 60. Asynchronous Parallel Interface Timing Diagram

Table 70. Asynchronous Display Interface Timing Parameters (Pixel Level)

ID Parameter Symbol Value Description Unit

IP27 Read system cycle time Tcycr ACCESS_SIZE_# predefined value in DI REGISTER ns

IP28a Address Write system cycle time Tcycwa ACCESS_SIZE_# predefined value in DI REGISTER ns

IP28d Data Write system cycle time Tcycwd ACCESS_SIZE_# predefined value in DI REGISTER ns

IP29 RS start Tdcsrr UP# RS strobe switch, predefined value

in DI REGISTER

IP30 CS start Tdcsc UP# CS strobe switch, predefined value

in DI REGISTER

IP31 CS hold Tdchc DOWN# CS strobe release, predefined

value in DI REGISTER

—

DI clock

A0 D0 D1

PP_DATA_IN D2 D3

local start point

IP27

IP28d

IP28a

local start point

IP37

IP33

IP35

IP38

IP34

IP36

IP29

IP31

IP32

IP47 IP30

IPP_CS

IPP_DATA

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

92 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

IP32 RS hold Tdchrr DOWN# RS strobe release, predefined

value in DI REGISTER

—

IP33 Read start Tdcsr UP# read strobe switch, predefined

value in DI REGISTER

IP34 Read hold Tdchr DOWN# read strobe release signal,

predefined value in DI REGISTER

IP35 Write start Tdcsw UP# write strobe switch, predefined

value in DI REGISTER

IP36 Controls hold time for write Tdchw DOWN# write strobe release, predefined

value in DI REGISTER

IP37 Slave device data delay1Tracc Delay of incoming data Physical delay of display’s data,

defined from Read access local

start point

IP38 Slave device data hold time3Troh Hold time of data on the buss Time that display read data is valid

in input bus

IP47 Read time point13 Tdrp Data sampling point Point of input data sampling by DI,

predefined in DC Microcode

—

1This parameter is a requirement to the display connected to the IPU.

Table 71. Asynchronous Parallel Interface Timing Parameters (Access Level)

ID Parameter Symbol Min Typ1Max Unit

IP27 Read system cycle time Tcycr Tdicpr–1.5 Tdicpr2Tdicpr+1.5 ns

IP28 Write system cycle time Tcycw Tdicpw–1.5 Tdicpw3Tdicpw+1.5 ns

IP29 RS start Tdcsrr Tdicurs–1.5 Tdicurs Tdicurs+1.5 ns

IP30 CS start Tdcsc Tdicucs–1.5 Tdicur Tdicucs+1.5 ns

IP31 CS hold Tdchc TdicdcsTdicucs–1.5 Tdicdcs4–Tdicucs5Tdicdcs–Tdicucs+1.5 ns

IP32 RS hold Tdchrr Tdicdrs–Tdicurs–1.5 Tdicdrs6–Tdicurs7Tdicdrs–Tdicurs+1.5 ns

IP33 Controls setup time for read Tdcsr Tdicur–1.5 Tdicur Tdicur+1.5 ns

IP34 Controls hold time for read Tdchr Tdicdr–Tdicur–1.5 Tdicdr8–Tdicur9Tdicdr–Tdicur+1.5 ns

IP35 Controls setup time for write Tdcsw Tdicuw–1.5 Tdicuw Tdicuw+1.5 ns

IP36 Controls hold time for write Tdchw Tdicdw–Tdicuw–1.5 Tdicpw10–Tdicuw11 Tdicdw–Tdicuw+1.5 ns

IP37 Slave device data delay12 Tracc 0 — Tdrp13–Tlbd14–Tdicur–1.5 ns

IP38 Slave device data hold time8Troh Tdrp–Tlbd–Tdicdr+1.5 — Tdicpr–Tdicdr–1.5 ns

Table 70. Asynchronous Display Interface Timing Parameters (Pixel Level) (continued)

ID Parameter Symbol Value Description Unit

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 93

Preliminary—Subject to Change Without Notice

IP39 Setup time for wait signal Tswait — — — —

IP47 Read time point13 Tdrp Tdrp–1.5 Tdrp Tdrp+1.5 ns

1The exact conditions have not been finalized, but will likely match the current customer requirement for their specific display.

These conditions may be chip specific.

2Display period value for read

ACCESS_SIZE is predefined in REGISTER

3Display period value for write

ACCESS_SIZE is predefined in REGISTER

4Display control down for CS

DISP_DOWN is predefined in REGISTER

5Display control up for CS

DISP_UP is predefined in REGISTER

6Display control down for RS

DISP_DOWN is predefined in REGISTER

7Display control up for RS

DISP_UP is predefined in REGISTER

8Display control down for read

DISP_DOWN is predefined in REGISTER

Table 71. Asynchronous Parallel Interface Timing Parameters (Access Level) (continued)

ID Parameter Symbol Min Typ1Max Unit

Tdicpr TDI_CLK ceil×DI_ACCESS_SIZE_#

DI_CLK_PERIOD

---------------------------------------------------------

Tdicpw TDI_CLK ceil×

DI_ACCESS_SIZE_#

DI_CLK_PERIOD

---------------------------------------------------------

Tdicdcs 1

---T

DI_CLK ceil×2 DISP_DOWN_#×

DI_CLK_PERIOD

-----------------------------------------------------

⎝⎠

⎛⎞

Tdicucs 1

---T

DI_CLK ceil×2 DISP_UP_#×

DI_CLK_PERIOD

-----------------------------------------------

⎝⎠

⎛⎞

Tdicdrs 1

---T

DI_CLK ceil×2 DISP_DOWN_#×

DI_CLK_PERIOD

-----------------------------------------------------

⎝⎠

⎛⎞

Tdicurs 1

---T

DI_CLK ceil×2 DISP_UP_#×

DI_CLK_PERIOD

-----------------------------------------------

⎝⎠

⎛⎞

Tdicdr 1

---T

DI_CLK ceil×2 DISP_DOWN_#×

DI_CLK_PERIOD

-----------------------------------------------------

⎝⎠

⎛⎞

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

94 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.8.8 Standard Serial Interfaces

The IPU supports the following types of asynchronous serial interfaces:

1. 3-wire (with bidirectional data line ).

2. 4-wire (with separate data input and output lines).

3. 5-wire type 1 (with sampling RS by the serial clock).

4. 5-wire type 2 (with sampling RS by the chip select signal).

The IPU has four independent outputs and one i nput. T he port can be configured to provide 3, 4, or 5- wire

interfaces.

Figure 61 depicts the timing diagram of the 3-wire serial interface. The timing diagrams correspond to

active-low IPP#_CS signal and the straight polarity of the IPP_CLK signal.

For this interface, a bidirec tional data line is used outside the chip. The IPU still uses sepa rate input and

output data lines (IPP_IND_DISPB_SD_D and IPP_DO_DISPB_SD_D). The I/O mux should provide

joining the interna l data lines to the bidirectiona l extern al line accor ding to the IPP_OBE_DISPB_SD_D

signal provided by the IPU.

9Display control up for read

DISP_UP is predefined in REGISTER

10Display control down for read

DISP_DOWN is predefined in REGISTER

11Display control up for write

DISP_UP is predefined in REGISTER

12This parameter is a requirement to the display connected to the IPU

13Data read point

Note: DISP#_READ_EN—operand of DC’s MICROCDE READ command to sample incoming data

14Loop back delay Tlbd is the cumulative propagation delay of read controls and read data. It includes an IPU output delay, a

chip-level output delay, board delays, a chip-level input delay, an IPU input delay. This value is chip specific.

Tdicur 1

---T

DI_CLK ceil×2 DISP_UP_#×

DI_CLK_PERIOD

-----------------------------------------------

⎝⎠

⎛⎞

Tdicdrw 1

---T

DI_CLK ceil×2 DISP_DOWN_#×

DI_CLK_PERIOD

-----------------------------------------------------

⎝⎠

⎛⎞

Tdicuw 1

---T

DI_CLK ceil×2 DISP_UP_#×

DI_CLK_PERIOD

-----------------------------------------------

⎝⎠

⎛⎞

Tdrp TDI_CLK ceil×DISP#_READ_EN

DI_CLK_PERIOD

-------------------------------------------------

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 95

Preliminary—Subject to Change Without Notice

Figure 61. 3-Wire Serial Interface Timing Diagram

Figure 62 depicts timing diagr am of the 4-wire serial interface. For this interface, there are separate input

and output data lines both inside and outside the chip.

Figure 62. 4-Wire Serial Interface Timing Diagram

Preamble

DISPB_D#_CS

DISPB_SD_D_CLK

DISPB_SD_D RW RS

Input or output data

D7 D6 D5 D4 D3 D2 D1 D0

programed

delay

programed

delay

Preamble

DISPB_D#_CS

DISPB_SD_D_CLK

DISPB_SD_D RW RS

Output data

D7 D6 D5 D4 D3 D2 D1 D0

DISPB_SD_D

(Output)

(Input)

Preamble

DISPB_D#_CS

DISPB_SD_D_CLK

DISPB_SD_D RW RS

Input data

DISPB_SD_D D7 D6 D5 D4 D3 D2 D1 D0

(Output)

(Input)

Write

Read

programed

delay

programed

delay

programed

delay

programed

delay

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

96 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

Figure 63 depicts timing of the 5-wire serial interface. For this interface, a separate RS line is added.

Figure 63. 5-Wire Serial Interface Timing Diagram

Preamble

DISPB_D#_CS

DISPB_SD_D_CLK

DISPB_SD_D RW

Output data

D7 D6 D5 D4 D3 D2 D1 D0

DISPB_SD_D

(Output)

(Input)

Preamble

DISPB_D#_CS

DISPB_SD_D_CLK

DISPB_SD_D RW

Input data

DISPB_SD_D

D7 D6 D5 D4 D3 D2 D1 D0

(Output)

(Input)

Write

Read

DISPB_SER_RS

programed

delay

programed

delay

programed

delay

programed

delay

programed

delay

programed

delay

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 97

Preliminary—Subject to Change Without Notice

3.7.8.8.1 Asynchronous Serial Interface Timing Parameters

Figure 64 de picts timing of the serial interface. Table 72 shows timing character istics at display access

level.

Figure 64. Asynchronous Serial Interface Timing Diagram

Table 72. Asynchronous Serial Interface Timing Characteristics (Access Level)

ID Parameter Symbol Min Typ1Max Unit

IP48 Read system cycle time Tcycr Tdicpr–1.5 Tdicpr2Tdicpr+1.5 ns

IP49 Write system cycle time Tcycw Tdicpw–1.5 Tdicpw3Tdicpw+1.5 ns

IP50 Read clock low pulse width Trl Tdicdr–Tdicur–1.5 Tdicdr4–Tdicur5Tdicdr–Tdicur+1.5 ns

IP51 Read clock high pulse width Trh Tdicpr–Tdicdr+Tdicur–1.5 Tdicpr–Tdicdr+

Tdicur

Tdicpr–Tdicdr+Tdicur+

1.5

DI clock

IPP_DISPB_DO_SD_D

IPP_DO_DISPB_SER_CS

IPP_DO_DISPB_SER_RS

IPP_DO_DISPB_SD_D_CLK

IPP_IND_DISPB_SD_D

local start point

IP68

IP48, IP49, IP62, IP63

IP51,53

IP55, IP57, IP54, IP56,

IP65, IP67

IP60,

IP58

IP59

IP50, IP52

IP64, IP66

IP61

IP69

IP70

IP71

IP72

IP73

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Preliminary—Subject to Change Without Notice

Electrical Characteristics

IP52 Write clock low pulse width Twl Tdicdw–Tdicuw–1.5 Tdicdw6–Tdicuw7Tdicdw–Tdicuw+1.5 ns

IP53 Write clock high pulse width Twh Tdicpw–Tdicdw+

Tdicuw–1.5

Tdicpw–Tdicdw+

Tdicuw

Tdicpw–Tdicdw+

Tdicuw+1.5

IP54 Controls setup time for read Tdcsr Tdicur–1.5 Tdicur — ns

IP55 Controls hold time for read Tdchr Tdicpr–Tdicdr–1.5 Tdicpr–Tdicdr — ns

IP56 Controls setup time for write Tdcsw Tdicuw–1.5 Tdicuw — ns

IP57 Controls hold time for write Tdchw Tdicpw–Tdicdw–1.5 Tdicpw–Tdicdw — ns

IP58 Slave device data delay8Tracc 0 — Tdrp9–Tlbd10-Tdicur-1.5 ns

IP59 Slave device data hold time8Troh Tdrp-Tlbd-Tdicdr+1.5 — Tdicpr-Tdicdr-1.5 ns

IP60 Write data setup time Tds Tdicdw-1.5 Tdicdw — ns

IP61 Write data hold time Tdh Tdicpw-Tdicdw-1.5 Tdicpw-Tdicdw — ns

IP62 Read period2Tdicpr Tdicpr-1.5 Tdicpr Tdicpr+1.5 ns

IP63 Write period3Tdicpw Tdicpw-1.5 Tdicpw Tdicpw+1.5 ns

IP64 Read down time4Tdicdr Tdicdr-1.5 Tdicdr Tdicdr+1.5 ns

IP65 Read up time5Tdicur Tdicur-1.5 Tdicur Tdicur+1.5 ns

IP66 Write down time6Tdicdw Tdicdw-1.5 Tdicdw Tdicdw+1.5 ns

IP67 Write up time7Tdicuw Tdicuw-1.5 Tdicuw Tdicuw+1.5 ns

IP68 Read time point9Tdrp Tdrp-1.5 Tdrp Tdrp+1.5 ns

IP69 Clock offset11 Toclk Toclk-1.5 Toclk Toclk+1.5 ns

IP70 RS up time12 Tdicurs Tdicurs–1.5 Tdicurs Tdicurs+1.5 ns

IP71 RS down time13 Tdicdrs Tdicdrs -1.5 Tdicdrs Tdicdrs+1.5 ns

IP72 CS up time14 Tdicucs Tdicucs –1.5 Tdicucs Tdicucs+1.5 ns

IP73 CS down time15 Tdicdcs Tdicdcs –1.5 Tdicdcs Tdicdcs+1.5 ns

1The exact conditions have not been finalized, but will likely match the current customer requirement for their specific display.

These conditions may be chip specific.

2Display interface clock period value for read

3Display interface clock period value for write

Table 72. Asynchronous Serial Interface Timing Characteristics (Access Level) (continued)

ID Parameter Symbol Min Typ1Max Unit

Tdicpr TDI_CLK ceil×DISP#_IF_CLK_PER_RD

DI_CLK_PERIOD

--------------------------------------------------------------------

Tdicpw TDI_CLK ceil×DISP#_IF_CLK_PER_WR

DI_CLK_PERIOD

----------------------------------------------------------------------

Electrical Characteristics

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Freescale Semiconductor 99

Preliminary—Subject to Change Without Notice

4Display interface clock down time for read

5Display interface clock up time for read

6Display interface clock down time for write

7Display interface clock up time for write

8This parameter is a requirement to the display connected to the IPU

9Data read point

DISP_RD_EN is predefined in REGISTER

10Loop back delay Tlbd is the cumulative propagation delay of read controls and read data. It includes an IPU output delay, a

chip-level output delay, board delays, a chip-level input delay, an IPU input delay. This value is chip specific.

11Display interface clock offset value

CLK_OFFSET is predefined in REGISTER

12Display RS up time

DISP_RS_UP is predefined in REGISTER

13Display RS down time

DISP_RS_DOWN is predefined in REGISTER

14Display RS up time

DISP_CS_UP is predefined in REGISTER

Tdicdr 1

---T

DI_CLK ceil×2 DISP_DOWN_#×

DI_CLK_PERIOD

-----------------------------------------------------

⎝⎠

⎛⎞

Tdicur 1

---T

DI_CLK ceil×2 DISP_UP_#×

DI_CLK_PERIOD

-----------------------------------------------

⎝⎠

⎛⎞

Tdicdw 1

---T

DI_CLK ceil×2 DISP_DOWN_#×

DI_CLK_PERIOD

-----------------------------------------------------

⎝⎠

⎛⎞

Tdicuw 1

---T

DI_CLK ceil×2 DISP_UP_#×

DI_CLK_PERIOD

-----------------------------------------------

⎝⎠

⎛⎞

Tdrp TDI_CLK ceil×DISP_READ_EN

DI_CLK_PERIOD

-----------------------------------------------

Toclk TDI_CLK ceil×DISP_CLK_OFFSET

DI_CLK_PERIOD

--------------------------------------------------------

Tdicurs TDI_CLK ceil×DISP_RS_UP_#

DI_CLK_PERIOD

-----------------------------------------------

Tdicdrs TDI_CLK ceil×DISP_RS_DOWN_#

DI_CLK_PERIOD

------------------------------------------------------

Tdicucs TDI_CLK ceil×DISP_CS_UP_#

DI_CLK_PERIOD

-----------------------------------------------

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Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.9 1-Wire Timing Parameters

Figure 65 de picts the RPP timing, and Table 73 lis ts the RPP timing parame te rs .

Figure 65. Reset and Presence Pulses (RPP) Timing Diagram

Figure 66 de picts Write 0 Sequence timing, and Table 74 lists the timing parameters.

Figure 66. Write 0 Sequence Timing Diagram

15Display RS down time

DISP_CS_DOWN is predefined in REGISTER.

Table 73. RPP Sequence Delay Comparisons Timing Parameters

ID Parameters Symbol Min Typ Max Unit

OW1 Reset Time Low tRSTL 480 511 — µs

OW2 Presence Detect High tPDH 15 — 60 µs

OW3 Presence Detect Low tPDL 60 — 240 µs

OW4 Reset Time High tRSTH 480 512 — µs

Table 74. WR0 Sequence Timing Parameters

ID Parameter Symbol Min Typ Max Unit

OW5 Write 0 Low Time tWR0_low 60 100 120 µs

OW6 Transmission Time Slot tSLOT OW5 117 120 µs

Tdicdcs TDI_CLK ceil×()

DISP_CS_DOWN_#

DI_CLK_PERIOD

------------------------------------------------------

One-Wire bus

DS2502 Tx

“Presence Pulse”

(BATT_LINE)

1-WIRE Tx

“Reset Pulse”

OW1

OW2

OW3

OW4

OW5

OW6

One-Wire bus

(BATT_LINE)

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

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Preliminary—Subject to Change Without Notice

Figure 67 de picts Write 1 Sequence timing, Figure 68 depicts the Read Sequence timing, and Table 75

lists the timing parameters.

Figure 67. Write 1 Sequence Timing Diagram

Figure 68. Read Sequence Timing Diagram

3.7.10 Pulse Width Modulator (PWM) Timing Parameters

This section describes the electrical information of the PWM.The PWM can be programmed to select one

of three clock signals as its source frequency . The selected clock signal is passed through a prescaler before

being input to the count er. The output is available at the pulse-width modulator output (PWMO) external

pin.

Table 75. WR1 /RD Timing Parameters

ID Parameter Symbol Min Typ Max Unit

OW7 Write /Read Low Time tLOW1 1 5 15 µs

OW8 Transmission Time Slot tSLOT 60 117 120 µs

OW9 Release Time tRELEASE 15 — 45 µs

OW7

OW8

One-Wire bus

(BATT_LINE)

OW7

OW8

OW9

One-Wire bus

(BATT_LINE)

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102 Freescale Semiconductor

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Electrical Characteristics

Figure 69 depicts the timing of the PWM, and Table 76 lists the PWM timing pa rameters.

Figure 69. PWM Timing

3.7.11 P-ATA Timing Parameters

This section describes the timing parameters of the Pa rallel ATA module which are compliant with

ATA/ ATAPI-6 speci f icati on.

Parallel AT A module can work on PIO/Multi-Word DMA/Ultra DMA transfer modes. Each transfer mode

has different data transfer rate, Ultra DMA mode 4 data transfer rate is up to 100MB/s. Parallel ATA

module interface consist of a total of 29 pins , Some pins act on different function in different transfer

mode. There are different requirements of timing relationships among the function pins conform with

ATA/ATAPI-6 specification and these requirements are configurable by the ATA module registers.

Table 77 and Figure 70 define the AC character isti cs of all the P-ATA inte rface signal s on all data

transfer modes .

Table 76. PWM Output Timing Parameter

Ref. No. Parameter Min Max Unit

1 System CLK frequency1

1CL of PWMO = 30 pF

0 ipg_clk MHz

2a Clock high time 12.29 — ns

2b Clock low time 9.91 — ns

3a Clock fall time — 0.5 ns

3b Clock rise time — 0.5 ns

4a Output delay time — 9.37 ns

4b Output setup time 8.71 — ns

System Clock

2a 1

PWM Output

3a 4b

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 103

Preliminary—Subject to Change Without Notice

Figure 70. P-ATA Interface Signals Timing Diagram

The user needs to use level shifters for 5.0 V compatibility on the ATA interface. The i.MX51 P-ATA

interfac e is 3.3 V compatible.

The use of bus buffers introduces delay on the bus and introduces skew between signal lines. These factors

make it difficult to operate the bus at the highest speed (UDMA-5) when bus buffers are used. If fast

UDMA mode operation is needed, this may not be c ompatible with bus buffers.

Another area of attention is the slew rate limit imposed by the ATA specifi cation on the ATA bus.

According to this limit, any signal driven on the bus should have a slew rate between 0.4 and 1.2 V/ns with

a 40 pF load. Not many vendors of bus buffers specify slew rate of the outgoing signals.

When bus buffers are used, the ata_data bus buffer is special. This is a bidirectional bus buffer, so a

direction control signal is needed. This dir ection control signal is a t a_buffer_en. When its high, the bus

should drive from host to device. When its low, the bus should drive from device to host. Steering of the

signal is s uch that contention on the host and device tri-state busses is always avoided.

Table 77. AC Characteristics of All Interface Signals

ID Parameter Symbol Min Max Unit

SI1 Rising edge slew rate for any signal on ATA interface.1

1SRISE and SFALL shall meet this requirement when measured at the sender’s connector from 10–90% of full signal

amplitude with all capacitive loads from 15–40 pF where all signals have the same capacitive load value.

Srise — 1.25 V/ns

SI2 Falling edge slew rate for any signal on ATA interface (see note) Sfall — 1.25 V/ns

SI3 Host interface signal capacitance at the host connector Chost —20pF

ATA Interface Signals

SI1SI2

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

104 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

In the timing equations, some timing parameters are used. These parameter s depend on the

implementation of the i .MX51 P-AT A interface on sili con, the bus buffe r used, the cable delay and cable

skew. Table 78 s hows ATA timing parameters.

Table 78. P-ATA Timing Parameters

Name Description Value/

Contributing Factor1

1Values provided where applicable.

T Bus clock period (ipg_clk_ata) Peripheral clock frequency

ti_ds Set-up time ata_data to ata_iordy edge (UDMA-in only)

UDMA0

UDMA1

UDMA2, UDMA3

UDMA4

UDMA5

15 ns

10 ns

7 ns

5 ns

4 ns

ti_dh Hold time ata_iordy edge to ata_data (UDMA-in only)

UDMA0, UDMA1, UDMA2, UDMA3, UDMA4

UDMA5

5.0 ns

4.6 ns

tco Propagation delay bus clock L-to-H to

ata_cs0, ata_cs1, ata_da2, ata_da1, ata_da0, ata_dior, ata_diow, ata_dmack,

ata_data, ata_buffer_en

12.0 ns

tsu Set-up time ata_data

to bus clock L-to-H 8.5 ns

tsui Set-up time ata_iordy to bus clock H-to-L 8.5 ns

thi Hold time ata_iordy

to bus clock H to L 2.5 ns

tskew1 Max difference in propagation delay bus clock L-to-H to any of following signals

ata_cs0, ata_cs1, ata_da2, ata_da1, ata_da0, ata_dior, ata_diow, ata_dmack,

ata_data (write), ata_buffer_en

7ns

tskew2 Max difference in buffer propagation delay for any of following signals

ata_cs0, ata_cs1, ata_da2, ata_da1, ata_da0, ata_dior, ata_diow, ata_dmack,

ata_data (write), ata_buffer_en

Transceiver

tskew3 Max difference in buffer propagation delay for any of following signals ata_iordy,

ata_data (read)

Transceiver

tbuf Max buffer propagation delay Transceiver

tcable1 Cable propagation delay for ata_data Cable

tcable2 Cable propagation delay for control signals ata_dior, ata_diow, ata_iordy,

ata_dmack

Cable

tskew4 Max difference in cable propagation delay between ata_iordy and ata_data (read) Cable

tskew5 Max difference in cable propagation delay between (ata_dior, ata_diow,

ata_dmack) and ata_cs0, ata_cs1, ata_da2, ata_da1, ata_da0, ata_data(write)

Cable

tskew6 Max difference in cable propagation delay without accounting for ground bounce Cable

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 105

Preliminary—Subject to Change Without Notice

3.7.11.1 PIO Mode Read Timing

Figure 71 shows timing for PIO read, and Table 79 lists the timing parameters for PIO read.

Figure 71. PIO Read Timing Diagram

Table 79. PIO Read Timing Parameters

ATA

Parameter

from Figure 71 Value Controlling

Variable

t1 t1 t1 (min) = time_1 × T – (tskew1 + tskew2 + tskew5) time_1

t2 t2r t2 min) = time_2r × T – (tskew1 + tskew2 + tskew5) time_2r

t9 t9 t9 (min) = time_9 × T – (tskew1 + tskew2 + tskew6) time_3

t5 t5 t5 (min) = tco + tsu + tbuf + tbuf + tcable1 + tcable2 If not met, increase

time_2

t6 t6 0 —

tA tA tA (min) = (1.5 + time_ax) × T – (tco + tsui + tcable2 + tcable2 + 2×tbuf) time_ax

trd trd1 trd1 (max) = (–trd) + (tskew3 + tskew4)

trd1 (min) = (time_pio_rdx – 0.5)×T – (tsu + thi)

(time_pio_rdx – 0.5) × T > tsu + thi + tskew3 + tskew4

time_pio_rdx

t0 — t0 (min) = (time_1 + time_2 + time_9) × T time_1, time_2r, time_9

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

106 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

Figure 72 shows timing for PIO write, and Table 80 lists the timing parameters for PIO write.

Figure 72. Multi-word DMA (MDMA) Timing

Table 80. PIO Write Timing Parameters

ATA

Parameter

from Figure 72 Value Controlling

Variable

t1 t1 t1 (min) = time_1 × T – (tskew1 + tskew2 + tskew5) time_1

t2 t2w t2 (min) = time_2w × T – (tskew1 + tskew2 + tskew5) time_2w

t9 t9 t9 (min) = time_9 × T – (tskew1 + tskew2 + tskew6) time_9

t3 — t3 (min) = (time_2w – time_on)× T – (tskew1 + tskew2 +tskew5) If not met, increase

time_2w

t4 t4 t4 (min) = time_4 × T – tskew1 time_4

tA tA tA = (1.5 + time_ax) × T – (tco + tsui + tcable2 + tcable2 + 2×tbuf) time_ax

t0 — t0(min) = (time_1 + time_2 + time_9) × T time_1, time_2r,

time_9

— — Avoid bus contention when switching buffer on by making ton long enough —

— — Avoid bus contention when switching buffer off by making toff long enough —

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 107

Preliminary—Subject to Change Without Notice

Figure 73 s hows timing for MDMA read, Figure 74 shows timing for MDMA write, and Table 81 lists

the timing parameters for MDMA read and write.

Figure 73. MDMA Read Timing Diagram

Figure 74. MDMA Write Timing Diagram

Table 81. MDMA Read and Write Timing Parameters

ATA

Parameter

from

Figure 73,

Figure 74

Value Controlling

Variable

tm, ti tm tm (min) = ti (min) = time_m × T – (tskew1 + tskew2 + tskew5) time_m

td td, td1 td1.(min) = td (min) = time_d × T – (tskew1 + tskew2 + tskew6) time_d

tk tk tk.(min) = time_k × T – (tskew1 + tskew2 + tskew6) time_k

t0 — t0 (min) = (time_d + time_k) × T time_d, time_k

tg(read) tgr tgr (min-read) = tco + tsu + tbuf + tbuf + tcable1 + tcable2

tgr.(min-drive) = td – te(drive)

time_d

tf(read) tfr tfr (min-drive) = 0 —

tg(write) — tg (min-write) = time_d × T – (tskew1 + tskew2 + tskew5) time_d

tf(write) — tf (min-write) = time_k × T – (tskew1 + tskew2 + tskew6) time_k

tL — tL (max) = (time_d + time_k–2)×T – (tsu + tco + 2×tbuf + 2×tcable2) time_d, time_k

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108 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.11.2 Ultra DMA (UDMA) Input Timing

Figure 75 s hows t iming when the UDMA in transfer star ts, Figure 76 shows timing when the UDMA in

host terminat es transfer, Figure 77 shows timing when the UDMA in device terminates transf er, and

Table 82 lists the timing parameters for UDMA in burst.

Figure 75. UDMA In Transfer Starts Timing Diagram

Figure 76. UDMA In Host Terminates Transfer Timing Diagram

tn, tj tkjn tn= tj= tkjn = (max(time_k,. time_jn) × T – (tskew1 + tskew2 + tskew6) time_jn

—ton

toff

ton = time_on × T – tskew1

toff = time_off × T – tskew1

—

Table 81. MDMA Read and Write Timing Parameters (continued)

ATA

Parameter

from

Figure 73,

Figure 74

Value Controlling

Variable

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 109

Preliminary—Subject to Change Without Notice

Figure 77. UDMA In Device Terminates Transfer Timing Diagram

Table 82. UDMA In Burst Timing Parameters

ATA

Parameter

from

Figure 75,

Figure 76,

Figure 77

Description Controlling Variable

tack tack tack (min) = (time_ack × T) – (tskew1 + tskew2) time_ack

tenv tenv tenv (min) = (time_env × T) – (tskew1 + tskew2)

tenv (max) = (time_env × T) + (tskew1 + tskew2)

time_env

tds tds1 tds – (tskew3) – ti_ds > 0 tskew3, ti_ds, ti_dh

should be low enough

tdh tdh1 tdh – (tskew3) – ti_dh > 0

tcyc tc1 (tcyc – tskew) > T T big enough

trp trp trp (min) = time_rp × T – (tskew1 + tskew2 + tskew6) time_rp

—tx1

1There is a special timing requirement in the ATA host that requires the internal DIOW to go only high 3 clocks after the last

active edge on the DSTROBE signal. The equation given on this line tries to capture this constraint.

(time_rp × T) – (tco + tsu + 3T + 2 ×tbuf + 2×tcable2) > trfs (drive) time_rp

tmli tmli1 tmli1 (min) = (time_mlix + 0.4) × T time_mlix

tzah tzah tzah (min) = (time_zah + 0.4) × T time_zah

tdzfs tdzfs tdzfs = (time_dzfs × T) – (tskew1 + tskew2) time_dzfs

tcvh tcvh tcvh = (time_cvh ×T) – (tskew1 + tskew2) time_cvh

—ton

toff2

2Make ton and toff big enough to avoid bus contention.

ton = time_on × T – tskew1

toff = time_off × T – tskew1

—

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

110 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.11.3 UDMA Output Timing

Figure 78 shows timing when the UDMA out transfer starts, Figure 79 shows timing when the UDMA out

host terminat es transfer, Figure 80 shows timing when the UDMA out device terminates transfer, and

Table 83 lists the timing parameters for UDMA out burst.

Figure 78. UDMA Out Transfer Starts Timing Diagram

Figure 79. UDMA Out Host Terminates Transfer Timing Diagram

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 111

Preliminary—Subject to Change Without Notice

Figure 80. UDMA Out Device Terminates Transfer Timing Diagram

Table 83. UDMA Out Burst Timing Parameters

ATA

Parameter

from

Figure 78,

Figure 79,

Figure 80

Value Controlling

Variable

tack tack tack (min) = (time_ack × T) – (tskew1 + tskew2) time_ack

tenv tenv tenv (min) = (time_env × T) – (tskew1 + tskew2)

tenv (max) = (time_env × T) + (tskew1 + tskew2)

time_env

tdvs tdvs tdvs = (time_dvs × T) – (tskew1 + tskew2) time_dvs

tdvh tdvh tdvs = (time_dvh × T) – (tskew1 + tskew2) time_dvh

tcyc tcyc tcyc = time_cyc × T – (tskew1 + tskew2) time_cyc

t2cyc — t2cyc = time_cyc × 2 × T time_cyc

trfs1 trfs trfs = 1.6 × T + tsui + tco + tbuf + tbuf —

— tdzfs tdzfs = time_dzfs × T – (tskew1) time_dzfs

tss tss tss = time_ss × T – (tskew1 + tskew2) time_ss

tmli tdzfs_mli tdzfs_mli =max (time_dzfs, time_mli) × T – (tskew1 + tskew2) —

tli tli1 tli1 > 0 —

tli tli2 tli2 > 0 —

tli tli3 tli3 > 0 —

tcvh tcvh tcvh = (time_cvh ×T) – (tskew1 + tskew2) time_cvh

—ton

toff

ton = time_on × T – tskew1

toff = time_off × T – tskew1

—

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

112 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.12 SIM (Subscriber Identification Module) Timing

This section describes the electrical parameters of the SIM module. Each SIM module interface consists

of 12 signals (two separate ports each containing six signals). Typically a a port uses five signals.

The interface is designed to be used with synchronous SIM cards meaning the SIM module provides the

clock used by the SI M card. The clock frequency is typically 372 times the T x/Rxdata rate, however the

SIM module can work with CLK fr equencies of 16 times the Tx/Rx da ta rate.

There is no timing relationship between the clock and the data. The clock that the SIM module provides

to the S IM card is us ed by the SIM card to r ecover the clock from the data in the same manner as standard

UART data exchanges. All six si gnals (5 for bi-directional Tx/Rx) of the SIM module are asynchronous

to each other.

There are no required timing relationshi ps between signals in normal mode. The SIM card is initiate d by

the interface device; t he SIM card responds with Answer to Reset. Although the SIM interface has no

defined requirements, the ISO-7816 defines reset and power-down sequences. (For detailed information,

see ISO-7816.)

Table 84 defines the general timing requirem ents for the SIM interf ace.

Figure 81. SIM Clock Timing Diagram

Table 84. SIM Timing Parameters, High Drive Strength

ID Parameter Symbol Min Max Unit

SI1 SIM Clock Frequency (SIMx_CLKy)1,

150% duty cycle clock

Sfreq 0.01 25 MHz

SI2 SIM Clock Rise Time (SIMx_CLKy)2

2With C = 50 pF

Srise —0.09×(1/Sfreq)ns

SI3 SIM Clock Fall Time (SIMx_CLKy)3

3With C = 50 pF

Sfall —0.09×(1/Sfreq)ns

SI4 SIM Input Transition Time

(SIMx_DATAy_RX_TX, SIMx_SIMPDy)

Strans 10 25 ns

SI5 SIM I/O Rise Time / Fall

Time(SIMx_DATAy_RX_TX)4

4With Cin = 30 pF, Cout = 30 pF

Tr/T f — 1 µs

SI6 SIM RST Rise Time / Fall Time(SIMx_RSTy)5

5With Cin = 30 pF

Tr/T f — 1 µs

SIMx_CLKy

SI2SI3

1/SI1

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 113

Preliminary—Subject to Change Without Notice

3.7.12.1 Reset Sequence

3.7.12.1.1 Cards with internal reset

The sequence of reset for this kind of SIM Cards is as follows (see Figure 82):

• After power up, the clock signal is enabled on SIMx_CLKy(time T0)

• After 200 clock cycles, RX must be high.

• The card must send a response on RX acknowledging the reset between 400 and 40000 clock

cycles after T0.

Figure 82. Internal-Reset Card Reset Sequence

3.7.12.1.2 Cards with Active Low Reset

The sequence of re set for this kind of car d is as follows (see Figure 83):

• After power- up, the clock signal is enabled on SIMx_CLKy (time T0)

• After 200 clock cycles, SIMx_DATAy_RX_TX must be high.

• SIMx_RSTy must remain Low for at least 40000 clock cycles after T0 (no response is to be

received on RX during those 40000 clock cycles)

• SIMx_RSTy is set High (time T1)

• SIMx_RSTy must remain High for at least 40000 clock cycles after T1 and a response must be

received on SIMx_DATAy_R X_TX between 400 and 40000 clock cycles after T1.

SIMx_SVENy

SIMx_CLKy

SIMx_DATAy_RX_TX

response

< 200 clock cycles

< 40000 clock cycles400 clock cycles <

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114 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

Figure 83. Active-Low-Reset Cards Reset Sequence

3.7.12.2 Power Down Sequence

Power down sequence for SIM interface is as follows:

• SIMx_SIMPDy port detects the remova l of the SI M Card

• SIMx_RSTy goes Low

• SIMx_CLKy goes Low

• SIMx_DATAy_RX_TX goes Low

• SIMx_SVENy goes Low

Each of these steps is done in one CKIL period (usually 32 kHz). Power -down can be started because of a

SIM Card removal detection or launched by the processor. Find in the table and figure below the usual

timing requirements for this sequence, with Fckil = CKIL frequency value.

SIMx_SVENy

SIMx_CLKy

SIMx_DATAy_RX_TX

response

SIMx_RSTy

< 200 clock cycles

< 40000 clock cycles400 clock cycles <

400000 clock cycles <

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 115

Preliminary—Subject to Change Without Notice

Figure 84. SmartCard Interface Power Down AC Timing

Table 85. Timing Requirements for Power Down Sequence

ID Parameter Symbol Min Max Unit

SI7 SIM reset to SIM clock stop Srst2clk 0.9×1/Fckil 1.1×1/Fckil ns

SI8 SIM reset to SIM TX data low Srst2dat 1.8×1/Fckil 2.2×1/Fckil ns

SI9 SIM reset to SIM voltage enable low Srst2ven 2.7×1/Fckil 3.3×1/Fckil ns

SI10 SIM presence detect to SIM reset low Spd2rst 0.9×1/Fckil 1.1×1/Fckil ns

SIMx_SIMPDy

SIMx_RSTy

SIMx_CLKy

SIMx_DATAy_RX_TX

SIMx_SVENy

SI7

SI8

SI9

SI10

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116 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.13 SCAN JTAG Controller (SJC) Timing Parameters

Figure 85 depicts the SJC test clock input timing. Figure 86 depicts the SJC boundary scan timing.

Figure 87 depi cts the SJC test access por t. Signal param eters are listed i n Table 86.

Figure 85. Test Clock Input Timing Diagram

Figure 86. Boundary Scan (JTAG) Timing Diagram

TCK

(Input) VM VM

VIH VIL

SJ1

SJ2 SJ2

SJ3

TCK

(Input)

Data

Inputs

Data

Outputs

Data

Outputs

Data

Outputs

VIH

VIL

Input Data Valid

Output Data Valid

SJ4 SJ5

SJ6

SJ7

SJ6

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

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Preliminary—Subject to Change Without Notice

Figure 87. Test Access Port Timing Diagram

Figure 88. TRST Timing Diagram

Table 86. JTAG Timing

ID Parameter1,2

All Frequencies

Unit

Min Max

SJ0 TCK frequency of operation 1/(3•TDC)10.001 22 MHz

SJ1 TCK cycle time in crystal mode 45 — ns

SJ2 TCK clock pulse width measured at VM222.5 — ns

SJ3 TCK rise and fall times — 3 ns

SJ4 Boundary scan input data set-up time 5 — ns

SJ5 Boundary scan input data hold time 24 — ns

SJ6 TCK low to output data valid — 40 ns

SJ7 TCK low to output high impedance — 40 ns

SJ8 TMS, TDI data set-up time 5 — ns

TCK

(Input)

TDI

(Input)

TDO

(Output)

TDO

(Output)

TDO

(Output)

VIH

VIL

Input Data Valid

Output Data Valid

TMS

SJ8 SJ9

SJ10

SJ11

SJ10

TCK

(Input)

TRST

(Input)

SJ13

SJ12

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Electrical Characteristics

3.7.14 SPDIF Timing Parameters

Table 87 shows the timing parame ters for the Sony/Philips Digital Interconnect Format (SPDIF).

3.7.15 SSI Timing Parameters

This section describes the timing parameters of the SSI module. The connectivity of the serial synchronous

interfac es is summarized in Table 88.

SJ9 TMS, TDI data hold time 25 — ns

SJ10 TCK low to TDO data valid — 44 ns

SJ11 TCK low to TDO high impedance — 44 ns

SJ12 TRST assert time 100 — ns

SJ13 TRST set-up time to TCK low 40 — ns

1TDC = target frequency of SJC

2VM = mid-point voltage

Table 87. SPDIF Timing

Characteristics Symbol

All Frequencies

Unit

Min Max

SPDIFOUT output (load = 50 pF)

•Skew

• Transition rising

• Transition falling

——

—

1.5

24.2

31.3

SPDIFOUT output (load = 30 pF)

•Skew

• Transition rising

• Transition falling

——

—

1.5

13.6

18.0

Table 88. AUDMUX Port Allocation

Port Signal Nomenclature Type and Access

AUDMUX port 1 SSI 1 Internal

AUDMUX port 2 SSI 2 Internal

AUDMUX port 3 AUD3 External – AUD3 I/O

AUDMUX port 4 AUD4 External – EIM or CSPI1 I/O via IOMUX

AUDMUX port 5 AUD5 External – EIM or SD1 I/O via IOMUX

Table 86. JTAG Timing (continued)

ID Parameter1,2

All Frequencies

Unit

Min Max

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 119

Preliminary—Subject to Change Without Notice

NOTE

• The terms WL and B L used in the timing diagra ms and tables refer to

Word Length (WL) and Byte Length (BL).

• The SSI timing diagrams use generi c signal names wherein the names

used in the i.MX51 reference manual are channel specific signal names.

For example, a channel clock referenced in the IOMUXC chapter as

AUD3_TXC appears in the timing diagram as TXC.

Figure 89. SSI Transmitter Internal Clock Timing Diagram

3.7.15.1 SSI Transmitter Timing with Internal Clock

AUDMUX port 6 AUD6 External – EIM or DISP2 via IOMUX

AUDMUX port 7 SSI 3 Internal

Table 89. SSI Transmitter Timing with Internal Clock

ID Parameter Min Max Unit

Internal Clock Operation

SS1 (Tx/Rx) CK clock period 81.4 — ns

SS2 (Tx/Rx) CK clock high period 36.0 — ns

SS3 (Tx/Rx) CK clock rise time — 6.0 ns

Table 88. AUDMUX Port Allocation (continued)

Port Signal Nomenclature Type and Access

SS19

SS1

SS2 SS4

SS3SS5

SS6 SS8

SS10 SS12

SS14

SS18

SS15

SS17

SS16

SS43

SS42

Note: SRXD input in synchronous mode only

TXC

(Output)

TXFS (wl)

(Output)

TXFS (bl)

(Output)

RXD

(Input)

TXD

(Output)

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

120 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

NOTE

• All the timings for the SSI are given for a non-inverted serial clock

polarity (TSCKP/RSCKP = 0) and a non-inverted frame sync

(TFSI/R FSI = 0). If the polarity of the clock and/or the frame sync have

been inverted, all the timing remains valid by inverting the clock signal

STCK/SRCK and/or the frame sync STFS/SRFS shown in the tables

and in the figures.

• All timings are on Audiomux Pads when SS I is being used for data

transfer.

• The terms WL and B L refer to Wor d Length (WL) and B y te Length

(BL).

• ”Tx” and “Rx” refer to the Transm it and Rece ive sections of the SSI.

• For internal Frame Sync operation using external clock, the FS timing is

same as that of Tx Data (for example, during AC97 mode of operation).

SS4 (Tx/Rx) CK clock low period 36.0 — ns

SS5 (Tx/Rx) CK clock fall time — 6.0 ns

SS6 (Tx) CK high to FS (bl) high — 15.0 ns

SS8 (Tx) CK high to FS (bl) low — 15.0 ns

SS10 (Tx) CK high to FS (wl) high — 15.0 ns

SS12 (Tx) CK high to FS (wl) low — 15.0 ns

SS14 (Tx/Rx) Internal FS rise time — 6.0 ns

SS15 (Tx/Rx) Internal FS fall time — 6.0 ns

SS16 (Tx) CK high to STXD valid from high impedance — 15.0 ns

SS17 (Tx) CK high to STXD high/low — 15.0 ns

SS18 (Tx) CK high to STXD high impedance — 15.0 ns

SS19 STXD rise/fall time — 6.0 ns

Synchronous Internal Clock Operation

SS42 SRXD setup before (Tx) CK falling 10.0 — ns

SS43 SRXD hold after (Tx) CK falling 0.0 — ns

SS52 Loading — 25.0 pF

Table 89. SSI Transmitter Timing (continued)with Internal Clock (continued)

ID Parameter Min Max Unit

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 121

Preliminary—Subject to Change Without Notice

3.7.15.2 SSI Receiver Timing with Internal Clock

Figure 90. SSI Receiver Internal Clock Timing Diagram

Table 90. SSI Receiver Timing with Internal Clock

ID Parameter Min Max Unit

Internal Clock Operation

SS1 (Tx/Rx) CK clock period 81.4 — ns

SS2 (Tx/Rx) CK clock high period 36.0 — ns

SS3 (Tx/Rx) CK clock rise time — 6.0 ns

SS4 (Tx/Rx) CK clock low period 36.0 — ns

SS5 (Tx/Rx) CK clock fall time — 6.0 ns

SS7 (Rx) CK high to FS (bl) high — 15.0 ns

SS9 (Rx) CK high to FS (bl) low — 15.0 ns

SS11 (Rx) CK high to FS (wl) high — 15.0 ns

SS13 (Rx) CK high to FS (wl) low — 15.0 ns

SS20 SRXD setup time before (Rx) CK low 10.0 — ns

SS21 SRXD hold time after (Rx) CK low 0.0 — ns

Oversampling Clock Operation

SS47 Oversampling clock period 15.04 — ns

SS50

SS48

SS1

SS4SS2

SS51

SS20

SS21

SS49

SS7 SS9

SS11 SS13

SS47

SS3

SS5

TXC

(Output)

TXFS (bl)

(Output)

TXFS (wl)

(Output)

RXD

(Input)

RXC

(Output)

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122 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

NOTE

• All the timings for the SSI are given for a non-inverted serial clock

polarity (TSCKP/RSCKP = 0) and a non-inverted frame sync

(TFSI/R FSI = 0). If the polarity of the clock and/or the frame sync have

been inverted, all the timing remains valid by inverting the clock signal

STCK/SRCK and/or the frame sync STFS/SRFS shown in the tables

and in the figures.

• All timings are on Audiomux Pads when SS I is being used for data

transfer.

• “Tx” and “Rx” refer to the Transm it and Rece ive sections of the SSI.

• The terms WL and B L refer to Wor d Length (WL) and B y te Length

(BL).

• For internal Frame Sync operation using external clock, the FS timing is

same as that of Tx Data (for example, during AC97 mode of operation).

SS48 Oversampling clock high period 6.0 — ns

SS49 Oversampling clock rise time — 3.0 ns

SS50 Oversampling clock low period 6.0 — ns

SS51 Oversampling clock fall time — 3.0 ns

Table 90. SSI Receiver Timing with Internal Clock (continued)

ID Parameter Min Max Unit

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 123

Preliminary—Subject to Change Without Notice

3.7.15.3 SSI Transmitter Timing with External Clock

Figure 91. SSI Transmitter External Clock Timing Diagram

Table 91. SSI Transmitter Timing with External Clock

ID Parameter Min Max Unit

External Clock Operation

SS22 (Tx/Rx) CK clock period 81.4 — ns

SS23 (Tx/Rx) CK clock high period 36.0 — ns

SS24 (Tx/Rx) CK clock rise time — 6.0 ns

SS25 (Tx/Rx) CK clock low period 36.0 — ns

SS26 (Tx/Rx) CK clock fall time — 6.0 ns

SS27 (Tx) CK high to FS (bl) high –10.0 15.0 ns

SS29 (Tx) CK high to FS (bl) low 10.0 — ns

SS31 (Tx) CK high to FS (wl) high –10.0 15.0 ns

SS33 (Tx) CK high to FS (wl) low 10.0 — ns

SS37 (Tx) CK high to STXD valid from high impedance — 15.0 ns

SS38 (Tx) CK high to STXD high/low — 15.0 ns

SS39 (Tx) CK high to STXD high impedance — 15.0 ns

SS45

SS33

SS24

SS26

SS25

SS23

Note: SRXD Input in Synchronous mode only

SS31

SS29

SS27

SS22

SS44

SS39

SS38

SS37

SS46

TXC

(Input)

TXFS (bl)

(Input)

TXFS (wl)

(Input)

TXD

(Output)

RXD

(Input)

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

124 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

NOTE

• All the timings for the SSI are given for a non-inverted serial clock

polarity (TSCKP/RSCKP = 0) and a non-inverted frame sync

(TFSI/R FSI = 0). If the polarity of the clock and/or the frame sync have

been inverted, all the timing remains valid by inverting the clock signal

STCK/SRCK and/or the frame sync STFS/SRFS shown in the tables

and in the figures.

• All timings are on Audiomux Pads when SS I is being used for data

transfer.

• “Tx” and “Rx” refer to the Transm it and Rece ive sections of the SSI.

• The terms WL and B L refer to Wor d Length (WL) and B y te Length

(BL).

• For internal Frame Sync operation using external clock, the FS timing is

same as that of Tx Data (for example, during AC97 mode of operation).

3.7.15.4 SSI Receiver Timing with External Clock

Figure 92. SSI Receiver External Clock Timing Diagram

Synchronous External Clock Operation

SS44 SRXD setup before (Tx) CK falling 10.0 — ns

SS45 SRXD hold after (Tx) CK falling 2.0 — ns

SS46 SRXD rise/fall time — 6.0 ns

Table 91. SSI Transmitter Timing with External Clock (continued)

ID Parameter Min Max Unit

SS24

SS34

SS35

SS30

SS28

SS26

SS25

SS23

SS40

SS22

SS32

SS36

SS41

TXC

(Input)

TXFS (bl)

(Input)

TXFS (wl)

(Input)

RXD

(Input)

Electrical Characteristics

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 125

Preliminary—Subject to Change Without Notice

NOTE

• All the timings for the SSI are given for a non-inverted serial clock

polarity (TSCKP/RSCKP = 0) and a non-inverted frame sync

(TFSI/R FSI = 0). If the polarity of the clock and/or the frame sync have

been inverted, all the timing remains valid by inverting the clock signal

STCK/SRCK and/or the frame sync STFS/SRFS shown in the tables

and in the figures.

• All timings are on Audiomux Pads when SS I is being used for data

transfer.

• “Tx” and “Rx” refer to the Transm it and Rece ive sections of the SSI.

• The terms WL and B L refer to Wor d Length (WL) and B y te Length

(BL).

• For internal Frame Sync operation using external clock, the FS timing is

same as that of Tx Data (for example, during AC97 mode of operation).

Table 92. SSI Receiver Timing with External Clock

ID Parameter Min Max Unit

External Clock Operation

SS22 (Tx/Rx) CK clock period 81.4 — ns

SS23 (Tx/Rx) CK clock high period 36 — ns

SS24 (Tx/Rx) CK clock rise time — 6.0 ns

SS25 (Tx/Rx) CK clock low period 36 — ns

SS26 (Tx/Rx) CK clock fall time — 6.0 ns

SS28 (Rx) CK high to FS (bl) high –10 15.0 ns

SS30 (Rx) CK high to FS (bl) low 10 — ns

SS32 (Rx) CK high to FS (wl) high –10 15.0 ns

SS34 (Rx) CK high to FS (wl) low 10 — ns

SS35 (Tx/Rx) External FS rise time — 6.0 ns

SS36 (Tx/Rx) External FS fall time — 6.0 ns

SS40 SRXD setup time before (Rx) CK low 10 — ns

SS41 SRXD hold time after (Rx) CK low 2 — ns

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126 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Electrical Characteristics

3.7.16 UART

Table 93 shows the UART I/O configuration based on which mode is enabled.

3.7.17 USBOH3 Parameters

This section describes the electrical parameters of the USB OTG port and USB HOST ports . For on-chip

USB PHY parameters see Section 3.7.19, “USB PHY Parameters.”

3.7.17.1 USB Serial Interface

In order to support four serial different interfaces, the USB serial t ransceiver can b e configur ed t o oper ate

in one of four modes:

• DAT_SE0 bidirectional, 3-wire mode

• DAT_SE0 unidirectional, 6-wire mode

• VP_VM bidirectional, 4-wire mode

• VP_VM unidirectional, 6-wire mode

The USB controller does not support ULPI Serial mode. Only the legacy se rial mode is supported.

Table 93. UART I/O Configuration vs. Mode

Port

DTE Mode DCE Mode

Direction Description Direction Description

RTS Output RTS from DTE to DCE Input RTS from DTE to DCE

CTS Input CTS from DCE to DTE Output CTS from DCE to DTE

DTR Output DTR from DTE to DCE Input DTR from DTE to DCE

DSR Input DSR from DCE to DTE Output DSR from DCE to DTE

DCD Input DCD from DCE to DTE Output DCD from DCE to DTE

RI Input RING from DCE to DTE Output RING from DCE to DTE

TXD_MUX Input Serial data from DCE to DTE Output Serial data from DCE to DTE

RXD_MUX Output Serial data from DTE to DCE Input Serial data from DTE to DCE

Table 94. Serial Mode Signal Map for 6-pin FsLs Serial Mode

Signal Maps to Direction Description

tx_enable data(0) In Active high transmit enable

tx_dat data(1) In Transmit differential data on D+/D–

tx_se0 data(2) In Transmit single-ended zero on D+/D–

int data(3) Out Active high interrupt indication

Must be asserted whenever any unmasked interrupt occurs

rx_dp data(4) Out Single-ended receive data from D+

rx_dm data(5) Out Single-ended receive data from D–

Electrical Characteristics

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3.7.17.1.1 USB DAT_SE0 Bi-Directional Mode

Figure 93. USB Transmit Waveform in DAT_SE0 Bi-Directional Mode

rx_rcv data(6) Out Differential receive data from D+/D–

Reserved data(7) Out Reserved The PHY must drive this signal low

Table 95. Serial Mode Signal Map for 3-pin FsLs Serial Mode

Signal Maps to Direction Description

tx_enable data(0) In Active high transmit enable

dat data(1) I/O Transmit differential data on D+/D– when tx_enable is high

Receive differential data on D+/D– when tx_enable is low

se0 data(2) I/O Transmit single-ended zero on D+/D– when tx_enable is high

Receive single-ended zero on D+/D– when tx_enable is low

int data(3) Out Active high interrupt indication

Must be asserted whenever any unmasked interrupt occurs

Table 96. Signal Definitions—DAT_SE0 Bi-Directional Mode

Name Direction Signal Description

USB_TXOE_B Out Transmit enable, active low

USB_DAT_VP Out

TX data when USB_TXOE_B is low

Differential RX data when USB_TXOE_B is high

USB_SE0_VM Out

SE0 drive when USB_TXOE_B is low

SE0 RX indicator when USB_TXOE_B is high

Table 94. Serial Mode Signal Map for 6-pin FsLs Serial Mode (continued)

Signal Maps to Direction Description

USB_DAT_VP

USB_SE0_VM US1

US2

Trans mit

US4

USB_TXOE_B

US3

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Preliminary—Subject to Change Without Notice

Electrical Characteristics

Figure 94. USB Receive Waveform in DAT_SE0 Bi-Directional Mode

3.7.17.1.2 USB DAT_SE0 Unidirectional Mode

Table 97. Definitions of USB Receive Waveform in DAT_SE0 Bi-Directional Mode

ID Parameter Signal Name Direction Min Max Unit Conditions/

Reference Signal

US1 TX Rise/Fall Time USB_DAT_VP Out – 5.0 ns 50 pF

US2 TX Rise/Fall Time USB_SE0_VM Out – 5.0 ns 50 pF

US3 TX Rise/Fall Time USB_TXOE_B Out – 5.0 ns 50 pF

US4 TX Duty Cycle USB_DAT_VP Out 49.0 51.0 % –

US7 RX Rise/Fall Time USB_DAT_VP In – 3.0 ns 35 pF

US8 RX Rise/Fall Time USB_SE0_VM In – 3.0 ns 35 pF

Table 98. Signal Definitions—DAT_SE0 Unidirectional Mode

Name Direction Signal Description

USB_TXOE_B Out Transmit enable, active low

USB_DAT_VP Out TX data when USB_TXOE_B is low

USB_SE0_VM Out SE0 drive when USB_TXOE_B is low

USB_VP1 In Buffered data on DP when USB_TXOE_B is high

USB_VM1 In Buffered data on DM when USB_TXOE_B is high

USB_RCV In Differential RX data when USB_TXOE_B is high

US8

US7

USB_DAT_VP

USB_SE0_VM

USB_TXOE_B

Receive

USB_SE0_VM

Electrical Characteristics

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Preliminary—Subject to Change Without Notice

Figure 95. USB Transmit Waveform in DAT_SE0 Uni-directional Mode

Figure 96. USB Receive Waveform in DAT_SE0 Uni-directional Mode

Table 99. USB Port Timing Specification in DAT_SE0 Uni-directional Mode

ID Parameter Signal Name Signal

Source Min Max Unit Condition/

Reference Signal

US9 TX Rise/Fall Time USB_DAT_VP Out – 5.0 ns 50 pF

US10 TX Rise/Fall Time USB_SE0_VM Out – 5.0 ns 50 pF

US11 TX Rise/Fall Time USB_TXOE_B Out – 5.0 ns 50 pF

US12 TX Duty Cycle USB_DAT_VP Out 49.0 51.0 % –

US15 RX Rise/Fall Time USB_VP1 In – 3.0 ns 35 pF

US16 RX Rise/Fall Time USB_VM1 In – 3.0 ns 35 pF

US17 RX Rise/Fall Time USB_RCV In – 3.0 ns 35 pF

USB_DAT_VP

USB_SE0_VM US9

US10

Tr a n s m i t

US12

USB_TXOE_B

US11

US16

US15/US17

USB_DAT_VP

USB_TXOE_B

Receive

USB_SE0_VM

USB_RCV

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Electrical Characteristics

3.7.17.1.3 USB VP_VM Bi-Directional Mode

Figure 97. USB Transmit Waveform in VP_VM Bi-Directional Mode

Figure 98. USB Receive Waveform in VP_VM Bi-Directional Mode

Table 100. Signal Definitions—VP_VM Bi-Directional Mode

Name Direction Signal Description

USB_TXOE_B Out Transmit enable, active low

USB_DAT_VP Out (Tx)

In (Rx)

TX VP data when USB_TXOE_B is low

RX VP data when USB_TXOE_B is high

USB_SE0_VM Out (Tx)

In (Rx)

TX VM data when USB_TXOE_B low

RX VM data when USB_TXOE_B high

USB_RCV In Differential RX data

USB_DAT_VP

USB_SE0_VM

US18

US19

Transmit

USB_TXOE_B

US20

US22

US21

US22

USB_DAT_VP

USB_SE0_VM

US26

US28 US27

US29

USB_RCV

Receive

Electrical Characteristics

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Preliminary—Subject to Change Without Notice

3.7.17.1.4 USB VP_VM Uni-Directional Mode

Figure 99. USB Transmit Waveform in VP_VM Unidirectional Mode

Table 101. USB Port Timing Specification in VP_VM Bi-directional Mode

ID Parameter Signal Name Direction Min Max Unit Condition / Reference Signal

US18 TX Rise/Fall Time USB_DAT_VP Out — 5.0 ns 50 pF

US19 TX Rise/Fall Time USB_SE0_VM Out — 5.0 ns 50 pF

US20 TX Rise/Fall Time USB_TXOE_B Out — 5.0 ns 50 pF

US21 TX Duty Cycle USB_DAT_VP Out 49.0 51.0 % —

US22 TX Overlap USB_SE0_VM Out –3.0 3.0 ns USB_DAT_VP

US26 RX Rise/Fall Time USB_DAT_VP In — 3.0 ns 35 pF

US27 RX Rise/Fall Time USB_SE0_VM In — 3.0 ns 35 pF

US28 RX Skew USB_DAT_VP Out –4.0 4.0 ns USB_SE0_VM

US29 RX Skew USB_RCV Out –6.0 2.0 ns USB_DAT_VP

Table 102. USB Signal Definitions—VP_VM Uni-Directional Mode

Name Direction Signal Description

USB_TXOE_B Out Transmit enable, active low

USB_DAT_VP Out TX VP data when USB_TXOE_B is low

USB_SE0_VM Out TX VM data when USB_TXOE_B is low

USB_VP1 In RX VP data when USB_TXOE_B is high

USB_VM1 In RX VM data when USB_TXOE_B is high

USB_RCV In Differential RX data

USB_DAT_VP

USB_SE0_VM

US30

US31

Transmit

USB_TXOE_B

US32

US34

US33

US34

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Electrical Characteristics

Figure 100. USB Receive Waveform in VP_VM Unidirectional Mode

Table 103. USB Timing Specification in VP_VM Unidirectional Mode

ID Parameter Signal Direction Min Max Unit Conditions / Reference Signal

US30 TX Rise/Fall Time USB_DAT_VP Out — 5.0 ns 50 pF

US31 TX Rise/Fall Time USB_SE0_VM Out — 5.0 ns 50 pF

US32 TX Rise/Fall Time USB_TXOE_B Out — 5.0 ns 50 pF

US33 TX Duty Cycle USB_DAT_VP Out 49.0 51.0 % —

US34 TX Overlap USB_SE0_VM Out –3.0 3.0 ns USB_DAT_VP

US38 RX Rise/Fall Time USB_VP1 In — 3.0 ns 35 pF

US39 RX Rise/Fall Time USB_VM1 In — 3.0 ns 35 pF

US40 RX Skew USB_VP1 Out –4.0 4.0 ns USB_SE0_VM

US41 RX Skew USB_RCV Out –6.0 2.0 ns USB_DAT_VP

US38

USB_VM1

Receive

USB_RCV

USB_TXOE_B

US41

US40

US39

USB_VP1

Electrical Characteristics

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Preliminary—Subject to Change Without Notice

3.7.18 USB Parallel Interface Timing

Electrical and timing specifications of Parallel Interface are presented in the subsequent sections.

Figure 101. USB Transmit/Receive Waveform in Parallel Mode

Table 104. Signal Definitions—Parallel Interface (Normal ULPI)

Name Direction Signal Description

USB_Clk In Interface clock. All interface signals are synchronous to Clock.

USB_Data[7:0] I/O Bi-directional data bus, driven low by the link during idle. Bus

ownership is determined by Dir.

USB_Dir In Direction. Control the direction of the Data bus.

USB_Stp Out Stop. The link asserts this signal for 1 clock cycle to stop the data

stream currently on the bus.

USB_Nxt In Next. The PHY asserts this signal to throttle the data.

Table 105. USB Timing Specification for ULPI Parallel Mode

ID Parameter Min Max Unit Conditions /

Reference Signal

US15 Setup Time (Dir, Nxt in, Data in) 6 — ns 10 pF

US16 Hold Time (Dir, Nxt in, Data in) 0 — ns 10 pF

US17 Output delay Time (Stp out, Data out) — 9 ns 10 pF

USB_Stp

USB_Dir/Nxt

US17

US16

USB_Data

US15

US16

US15

US17

USB_Clk

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134 Freescale Semiconductor

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Electrical Characteristics

3.7.19 USB PHY Parameters

3.7.19.1 USB PHY AC Parameters

3.7.19.2 USB PHY Additional Electrical Parameters

3.7.19.3 USB PHY System Clocking (SYSCLK)

Table 106. USB PHY AC Timing Parameters

Parameter Conditions Min Typ Max Unit

trise 1.5Mbps

12Mbps

480Mbps

0.5

— 300

tfall 1.5Mbps

12Mbps

480Mbps

0.5

— 300

Jitter 1.5Mbps

12Mbps

480Mbps

——10

0.2

Table 107. Additional Electrical Characteristics for USB PHY

Parameter Conditions Min Typ Max Unit

Vcm DC

(dc level measured at receiver connector)

HS Mode

LS/FS Mode

–0.05

0.8

—0.5

2.5

Crossover Voltage LS Mode

FS Mode

1.3

—2

Power supply ripple noise

(analog 3.3 V)

<160 MHz –50 0 50 mV

Power supply ripple noise

(analog 2.5 V)

<1.2 MHz

>1.2 MHz

–10

–50

Power supply ripple noise

(Digital 1.2)

All conditions –50 0 50 mV

Table 108. USB PHY System Clocking Parameters

Parameter Conditions Min Typ Max Unit

Clock deviation — –150 — 150 ppm

Rise/fall time — — — 200 ps

Jitter (peak-peak) <1.2 MHz 0 — 50 ps

Jitter (peak-peak) >1.2 MHz 0 — 100 ps

Duty-cycle — 40 — 60 %

Package Information and Contact Assignments

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Preliminary—Subject to Change Without Notice

3.7.19.4 USB PHY Voltage Thresholds

4 Package Information and Contact Assignments

This section includes the contact assignment information and mechanical package drawing.

4.1 19 x 19 mm Package Information

This section contains the outline drawing, signal assignment map, ground/power/reference ID (by ball grid

location) for the 19 ×19 mm, 0.8 mm pitch pa ckage.

Table 109. VBUS Comparators Thresholds

Parameter Conditions Min Typ Max Unit

A-Device Session Valid — 0.8 1.4 2.0 V

B-Device Session Valid — 0.8 1.4 4.0 V

B-Device Session End — 0.2 0.45 0.8 V

VBUS Valid Comparator Threshold1

1For VBUS maximum rating, see Ta b le 6 on page 14

—4.44.64.75V

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136 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

4.1.1 BGA—Case 2017, 19 x 19 mm, 0.8 mm Pitch

Figure 102. 19 x 19 mm Package: Case 2017-01—0.8 mm Pitch

Package Information and Contact Assignments

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Preliminary—Subject to Change Without Notice

4.1.1.1 19 x 19 mm Package Drawing Notes

The following notes apply to Figure 102.

1All dimensions in millimeters.

2Dimensioning and tolerancing per ASME Y14.5M-1994.

3Maximum solder ball diameter measured parallel to Datum A.

4Datum A, the seating plane, is determined by the spherical crowns of the solder balls.

5Parallelism measurement shall exclude any effect of mark on top surface of package.

4.1.2 19 x 19 mm Signal Assignments, Power Rails, and I/O

Table 110 shows the device connection list and Table 111 displays an alpha-sorted list of the s ignal

assignments including associated power supplies.

4.1.2.1 19 x 19 mm Ground, Power, Sense, and Reference Contact Assignments

Table 110 shows the device connection list for ground, power, sense, and refer ence contact signals

alpha-sorted by name.

Table 110. 19 x 19 mm Ground, Power, Sense, and Reference Contact Assignments

Contact Name Contact Assignment

AHVDDRGB Y18, AA18

AHVSSRGB Y19, AA19

GND A1, A23, G5, H9, J8, J9, J10, J12, J13, J14, K8, K9, K10, K11, K12, K13, K14, L8, L9, L10, L11,L12,

L13, L14, M9, M10, M11, M12, M13, M14, M15, N8, N9, N10, N11, N12, N13, N14, N15, N16, P8,

P9, P10, P11, P12, P13, P14, P15, R8, R9, R10, R11,R12, R13, R14, R15, R16, T5, T16, AC1,

AC21, AC23

GND_ANA_PLL_A U7

GND_ANA_PLL_B U17

GND_DIG_PLL_A T7

GND_DIG_PLL_B V18

NGND_OSC V17

NGND_TV_BACK T15

NGND_USBPHY L16

NVCC_EMI U8, U9, U10, U11, U12, V7

NVCC_EMI_DRAM H6, J6, K6, L6, M6, N6, P6, R6, T6

NVCC_HS10 M16

NVCC_HS4_1 M18

NVCC_HS4_2 N18

NVCC_HS6 M17

NVCC_I2C T14

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138 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

NVCC_IPU2 T18

NVCC_IPU4 G16

NVCC_IPU5 H17

NVCC_IPU6 J17

NVCC_IPU7 K17

NVCC_IPU8 P18

NVCC_IPU9 R18

NVCC_NANDF_A E6, F5

NVCC_NANDF_B G9

NVCC_NANDF_C G10

NVCC_OSC W17

NVCC_PER3 U18

NVCC_PER5 G15

NVCC_PER8 H16

NVCC_PER9 H10

NVCC_PER10 H11

NVCC_PER11 G11

NVCC_PER12 G12

NVCC_PER13 G13

NVCC_PER14 U13

NVCC_PER15 H15

NVCC_PER17 G14

NVCC_SRTC_POW U14

NVCC_TV_BACK U16

NVCC_USBPHY L17

RREFEXT K19

SGND J11

SVCC H14

SVDDGP F13

TVDAC_DHVDD V16

VBUS K20

VCC H13, J15, J16, K15, K16, L7, L15, M7, N7, N17, P7, P17, R17, T8, T9, T10, T11, T12, T17

VDD_ANA_PLL_A V6

Table 110. 19 x 19 mm Ground, Power, Sense, and Reference Contact Assignments (continued)

Contact Name Contact Assignment

Package Information and Contact Assignments

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 139

Preliminary—Subject to Change Without Notice

4.1.2.2 19 x 19 mm, Signal Assignments, Power Rails, and I/O

Table 111 displays an alpha-sorted list of the signal assignments including power rails.

VDD_ANA_PLL_B W19

VDD_DIG_PLL_A U6

VDD_DIG_PLL_B W18

VDD_FUSE R7

VDDA G8, H8, H12, M8, P16, T13

VDDA33 L18

VDDGP F6, F7, F8, F9, F10, F11, F12, G6, G7, H7, J7, K7

VREFOUT U15

VREF R5

VREG K21

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1Configuraton

after Reset1

AUD3_BB_CK C8 NVCC_PER9 GPIO Input Keeper

AUD3_BB_FS A9 NVCC_PER9 GPIO Input Keeper

AUD3_BB_RXD B9 NVCC_PER9 GPIO Input Keeper

AUD3_BB_TXD E9 NVCC_PER9 GPIO Input Keeper

BOOT_MODE0 AB21 NVCC_PER3 LVIO Input 100 kΩ pull-up

BOOT_MODE1 AB22 NVCC_PER3 LVIO Input 100 kΩ pull-up

CKIH1 V19 NVCC_PER3 Analog Input Analog

CKIH2 AA20 NVCC_PER3 Analog Input Analog

CKIL Y16 NVCC_SRTC_POW GPIO Input Standard CMOS

CLK_SS AA21 NVCC_PER3 LVIO Input 100 kΩ pull-up

COMP Y17 AHVDDRGB Analog Input Analog

CSI1_D10 R22 NVCC_HS10 HSGPIO Input Keeper

CSI1_D11 R23 NVCC_HS10 HSGPIO Input Keeper

CSI1_D12 P22 NVCC_HS10 HSGPIO Input Keeper

CSI1_D13 P23 NVCC_HS10 HSGPIO Input Keeper

CSI1_D14 M20 NVCC_HS10 HSGPIO Input Keeper

Table 110. 19 x 19 mm Ground, Power, Sense, and Reference Contact Assignments (continued)

Contact Name Contact Assignment

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

140 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

CSI1_D15 M21 NVCC_HS10 HSGPIO Input Keeper

CSI1_D16 N22 NVCC_HS10 HSGPIO Input Keeper

CSI1_D17 N23 NVCC_HS10 HSGPIO Input Keeper

CSI1_D18 M22 NVCC_HS10 HSGPIO Input Keeper

CSI1_D19 M23 NVCC_HS10 HSGPIO Input Keeper

CSI1_D8 E18 NVCC_PER8 GPIO Input Keeper

CSI1_D9 A21 NVCC_PER8 GPIO Input Keeper

CSI1_HSYNC A20 NVCC_PER8 GPIO Input Keeper

CSI1_MCLK B20 NVCC_PER8 GPIO Input Keeper

CSI1_PIXCLK F18 NVCC_PER8 GPIO Input Keeper

CSI1_VSYNC G18 NVCC_PER8 GPIO Input Keeper

CSI2_D12 B8 NVCC_PER9 GPIO Input Keeper

CSI2_D13 C7 NVCC_PER9 GPIO Input Keeper

CSI2_D14 L20 NVCC_HS4_1 HSGPIO Input Keeper

CSI2_D15 L21 NVCC_HS4_1 HSGPIO Input Keeper

CSI2_D16 L22 NVCC_HS4_1 HSGPIO Input Keeper

CSI2_D17 L23 NVCC_HS4_1 HSGPIO Input Keeper

CSI2_D18 D9 NVCC_PER9 GPIO Input Keeper

CSI2_D19 A8 NVCC_PER9 GPIO Input Keeper

CSI2_HSYNC C18 NVCC_PER8 GPIO Input Keeper

CSI2_PIXCLK E19 NVCC_PER8 GPIO Input Keeper

CSI2_VSYNC F19 NVCC_PER8 GPIO Input Keeper

CSPI1_MISO C10 NVCC_PER10 GPIO Input 100 kΩ pull-up

CSPI1_MOSI D10 NVCC_PER10 GPIO Input 100 kΩ pull-up

CSPI1_RDY C9 NVCC_PER10 GPIO Input Keeper

CSPI1_SCLK A10 NVCC_PER10 GPIO Input 100 kΩ pull-up

CSPI1_SS0 E10 NVCC_PER10 GPIO Input 100 kΩ pull-up

CSPI1_SS1 B10 NVCC_PER10 GPIO Input 100 kΩ pull-up

DI_GP1 H21 NVCC_IPU6 GPIO Input Keeper

DI_GP2 J19 NVCC_IPU6 GPIO Input Keeper

DI_GP3 H22 NVCC_IPU7 GPIO Input 100 kΩ pull-up

DI_GP4 J22 NVCC_IPU7 GPIO Input 100 kΩ pull-up

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

Package Information and Contact Assignments

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 141

Preliminary—Subject to Change Without Notice

DI1_D0_CS U21 NVCC_IPU2 GPIO Output Low

DI1_D1_CS AB23 NVCC_IPU2 GPIO Output Low

DI1_DISP_CLK J18 NVCC_IPU6 GPIO Output Low

DI1_PIN11 Y22 NVCC_IPU2 GPIO Output Low

DI1_PIN12 AA22 NVCC_IPU2 GPIO Output Low

DI1_PIN13 T20 NVCC_IPU2 GPIO Output High

DI1_PIN15 H20 NVCC_IPU6 GPIO Output High

DI1_PIN2 G23 NVCC_IPU6 GPIO Output High

DI1_PIN3 G22 NVCC_IPU6 GPIO Output High

DI2_DISP_CLK J21 NVCC_IPU7 GPIO Output High

DI2_PIN2 J20 NVCC_IPU7 GPIO Output High

DI2_PIN3 K18 NVCC_IPU7 GPIO Output High

DI2_PIN4 H23 NVCC_IPU7 GPIO Input Keeper

DISP1_DAT0 N20 NVCC_HS6 HSGPIO Input Keeper

DISP1_DAT1 N21 NVCC_HS6 HSGPIO Input Keeper

DISP1_DAT102D22 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT112D23 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT122E21 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT132F20 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT142E22 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT152G19 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT162E23 NVCC_IPU5 GPIO Input Keeper

DISP1_DAT172F21 NVCC_IPU5 GPIO Input Keeper

DISP1_DAT182G20 NVCC_IPU5 GPIO Input Keeper

DISP1_DAT192H18 NVCC_IPU5 GPIO Input Keeper

DISP1_DAT2 U22 NVCC_HS6 HSGPIO Input Keeper

DISP1_DAT202F23 NVCC_IPU5 GPIO Input Keeper

DISP1_DAT212H19 NVCC_IPU5 GPIO Input Keeper

DISP1_DAT222F22 NVCC_IPU5 GPIO Input Keeper

DISP1_DAT232G21 NVCC_IPU5 GPIO Input Keeper

DISP1_DAT3 U23 NVCC_HS6 HSGPIO Input Keeper

DISP1_DAT4 T22 NVCC_HS6 HSGPIO Input Keeper

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

142 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

DISP1_DAT5 T23 NVCC_HS6 HSGPIO Input Keeper

DISP1_DAT62C22 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT72C23 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT82D21 NVCC_IPU4 GPIO Input Keeper

DISP1_DAT92E20 NVCC_IPU4 GPIO Input Keeper

DISP2_DAT0 R21 NVCC_IPU8 GPIO Input Keeper

DISP2_DAT1 M19 NVCC_IPU8 GPIO Input Keeper

DISP2_DAT10 W22 NVCC_IPU9 GPIO Input Keeper

DISP2_DAT11 R19 NVCC_IPU9 GPIO Input Keeper

DISP2_DAT12 Y23 NVCC_IPU9 GPIO Input Keeper

DISP2_DAT13 T19 NVCC_IPU9 GPIO Input Keeper

DISP2_DAT14 AA23 NVCC_IPU9 GPIO Input Keeper

DISP2_DAT15 T21 NVCC_IPU9 GPIO Input Keeper

DISP2_DAT2 P20 NVCC_HS4_2 HSGPIO Input Keeper

DISP2_DAT3 P21 NVCC_HS4_2 HSGPIO Input Keeper

DISP2_DAT4 V22 NVCC_HS4_2 HSGPIO Input Keeper

DISP2_DAT5 V23 NVCC_HS4_2 HSGPIO Input Keeper

DISP2_DAT6 N19 NVCC_IPU8 GPIO Input Keeper

DISP2_DAT7 W23 NVCC_IPU8 GPIO Input Keeper

DISP2_DAT8 P19 NVCC_IPU9 GPIO Input Keeper

DISP2_DAT9 R20 NVCC_IPU9 GPIO Input Keeper

DISPB2_SER_CLK AC22 NVCC_IPU2 GPIO Output High

DISPB2_SER_DIN U19 NVCC_IPU2 GPIO Input 100 kΩ pull-up

DISPB2_SER_DIO V21 NVCC_IPU2 GPIO Input 100 kΩ pull-up

DISPB2_SER_RS W21 NVCC_IPU2 GPIO Output High

DN K22 VDDA33 Analog Output –

DP K23 VDDA33 Analog Output –

DRAM_A0 AB1 NVCC_EMI_DRAM DDR2 Output High

DRAM_A1 AA2 NVCC_EMI_DRAM DDR2 Output High

DRAM_A10 V2 NVCC_EMI_DRAM DDR2 Output High

DRAM_A11 U4 NVCC_EMI_DRAM DDR2 Output High

DRAM_A12 U2 NVCC_EMI_DRAM DDR2 Output High

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

Package Information and Contact Assignments

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 143

Preliminary—Subject to Change Without Notice

DRAM_A13 U1 NVCC_EMI_DRAM DDR2 Output High

DRAM_A14 T2 NVCC_EMI_DRAM DDR2 Output High

DRAM_A2 AA3 NVCC_EMI_DRAM DDR2 Output High

DRAM_A3 V5 NVCC_EMI_DRAM DDR2 Output High

DRAM_A4 W4 NVCC_EMI_DRAM DDR2 Output High

DRAM_A5 Y2 NVCC_EMI_DRAM DDR2 Output High

DRAM_A6 W3 NVCC_EMI_DRAM DDR2 Output High

DRAM_A7 Y1 NVCC_EMI_DRAM DDR2 Output High

DRAM_A8 W2 NVCC_EMI_DRAM DDR2 Output High

DRAM_A9 V3 NVCC_EMI_DRAM DDR2 Output High

DRAM_CAS V4 NVCC_EMI_DRAM DDR2 Output High

DRAM_CS0 Y4 NVCC_EMI_DRAM DDR2 Output High

DRAM_CS1 Y3 NVCC_EMI_DRAM DDR2 Output High

DRAM_D0 T1 NVCC_EMI_DRAM DDR2 Output High

DRAM_D1 R3 NVCC_EMI_DRAM DDR2 Output High

DRAM_D10 M3 NVCC_EMI_DRAM DDR2 Output High

DRAM_D11 M4 NVCC_EMI_DRAM DDR2 Output High

DRAM_D12 M1 NVCC_EMI_DRAM DDR2 Output High

DRAM_D13 M5 NVCC_EMI_DRAM DDR2 Output High

DRAM_D14 L5 NVCC_EMI_DRAM DDR2 Output High

DRAM_D15 L4 NVCC_EMI_DRAM DDR2 Output High

DRAM_D16 L3 NVCC_EMI_DRAM DDR2 Output High

DRAM_D17 L2 NVCC_EMI_DRAM DDR2 Output High

DRAM_D18 L1 NVCC_EMI_DRAM DDR2 Output High

DRAM_D19 K1 NVCC_EMI_DRAM DDR2 Output High

DRAM_D2 R2 NVCC_EMI_DRAM DDR2 Output High

DRAM_D20 K3 NVCC_EMI_DRAM DDR2 Output High

DRAM_D21 K4 NVCC_EMI_DRAM DDR2 Output High

DRAM_D22 J3 NVCC_EMI_DRAM DDR2 Output High

DRAM_D23 J4 NVCC_EMI_DRAM DDR2 Output High

DRAM_D24 K5 NVCC_EMI_DRAM DDR2 Output High

DRAM_D25 H1 NVCC_EMI_DRAM DDR2 Output High

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

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144 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

DRAM_D26 H2 NVCC_EMI_DRAM DDR2 Output High

DRAM_D27 J5 NVCC_EMI_DRAM DDR2 Output High

DRAM_D28 G1 NVCC_EMI_DRAM DDR2 Output High

DRAM_D29 G2 NVCC_EMI_DRAM DDR2 Output High

DRAM_D3 R1 NVCC_EMI_DRAM DDR2 Output High

DRAM_D30 G3 NVCC_EMI_DRAM DDR2 Output High

DRAM_D31 G4 NVCC_EMI_DRAM DDR2 Output High

DRAM_D4 R4 NVCC_EMI_DRAM DDR2 Output High

DRAM_D5 P5 NVCC_EMI_DRAM DDR2 Output High

DRAM_D6 P4 NVCC_EMI_DRAM DDR2 Output High

DRAM_D7 N5 NVCC_EMI_DRAM DDR2 Output High

DRAM_D8 N2 NVCC_EMI_DRAM DDR2 Output High

DRAM_D9 N1 NVCC_EMI_DRAM DDR2 Output High

DRAM_DQM0 P3 NVCC_EMI_DRAM DDR2 Output High

DRAM_DQM1 M2 NVCC_EMI_DRAM DDR2 Output High

DRAM_DQM2 K2 NVCC_EMI_DRAM DDR2 Output High

DRAM_DQM3 H5 NVCC_EMI_DRAM DDR2 Output High

DRAM_RAS W1 NVCC_EMI_DRAM DDR2 Output High

DRAM_SDCKE0 AA1 NVCC_EMI_DRAM DDR2 Output High

DRAM_SDCKE1 W5 NVCC_EMI_DRAM DDR2 Output High

DRAM_SDCLK T3 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDCLK_B T4 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDQS0 P2 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDQS0_B P1 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDQS1 N4 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDQS1_B N3 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDQS2 J1 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDQS2_B J2 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDQS3 H3 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDQS3_B H4 NVCC_EMI_DRAM DDR2CLK Output High

DRAM_SDWE U5 NVCC_EMI_DRAM DDR2 Output High

EIM_A162AA9 NVCC_EMI GPIO Input 100 kΩ pull-up

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

Package Information and Contact Assignments

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 145

Preliminary—Subject to Change Without Notice

EIM_A172AB9 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A182AC8 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A192AA8 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A202AB8 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A212AC7 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A22 AB7 NVCC_EMI GPIO Output High

EIM_A232AC6 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A24 AC5 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A25 AB6 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A26 AC4 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_A27 AB5 NVCC_EMI GPIO Input Keeper

EIM_BCLK AA4 NVCC_EMI GPIO Input Keeper

EIM_CRE AB2 NVCC_EMI GPIO Output High

EIM_CS0 W6 NVCC_EMI GPIO Output High

EIM_CS1 Y6 NVCC_EMI GPIO Output High

EIM_CS2 Y7 NVCC_EMI GPIO Input Keeper

EIM_CS3 AC3 NVCC_EMI GPIO Input Keeper

EIM_CS4 AA6 NVCC_EMI GPIO Input Keeper

EIM_CS5 AA5 NVCC_EMI GPIO Input Keeper

EIM_D16 AC12 NVCC_EMI GPIO Input Keeper

EIM_D17 W10 NVCC_EMI GPIO Input Keeper

EIM_D18 AA11 NVCC_EMI GPIO Input Keeper

EIM_D19 Y10 NVCC_EMI GPIO Input Keeper

EIM_D20 AB11 NVCC_EMI GPIO Input Keeper

EIM_D21 W9 NVCC_EMI GPIO Input Keeper

EIM_D22 AC11 NVCC_EMI GPIO Input Keeper

EIM_D23 V8 NVCC_EMI GPIO Input Keeper

EIM_D24 AA10 NVCC_EMI GPIO Input Keeper

EIM_D25 Y9 NVCC_EMI GPIO Input Keeper

EIM_D26 AB10 NVCC_EMI GPIO Input Keeper

EIM_D27 W8 NVCC_EMI GPIO Input Keeper

EIM_D28 AC10 NVCC_EMI GPIO Input Keeper

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

146 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

EIM_D29 Y8 NVCC_EMI GPIO Input Keeper

EIM_D30 AC9 NVCC_EMI GPIO Input Keeper

EIM_D31 W7 NVCC_EMI GPIO Input Keeper

EIM_DA0 AC15 NVCC_EMI GPIO Input Keeper

EIM_DA1 V13 NVCC_EMI GPIO Input Keeper

EIM_DA10 AC13 NVCC_EMI GPIO Input Keeper

EIM_DA11 V11 NVCC_EMI GPIO Input Keeper

EIM_DA12 AA12 NVCC_EMI GPIO Input Keeper

EIM_DA13 W11 NVCC_EMI GPIO Input Keeper

EIM_DA14 AB12 NVCC_EMI GPIO Input Keeper

EIM_DA15 Y11 NVCC_EMI GPIO Input Keeper

EIM_DA2 AA14 NVCC_EMI GPIO Input Keeper

EIM_DA3 AB14 NVCC_EMI GPIO Input Keeper

EIM_DA4 AC14 NVCC_EMI GPIO Input Keeper

EIM_DA5 Y13 NVCC_EMI GPIO Input Keeper

EIM_DA6 AA13 NVCC_EMI GPIO Input Keeper

EIM_DA7 W13 NVCC_EMI GPIO Input Keeper

EIM_DA8 AB13 NVCC_EMI GPIO Input Keeper

EIM_DA9 Y12 NVCC_EMI GPIO Input Keeper

EIM_DTACK Y5 NVCC_EMI GPIO Input 100 kΩ pull-up

EIM_EB0 V12 NVCC_EMI GPIO Output High

EIM_EB1 W12 NVCC_EMI GPIO Output High

EIM_EB2 V10 NVCC_EMI GPIO Input Keeper

EIM_EB3 V9 NVCC_EMI GPIO Input Keeper

EIM_LBA AC2 NVCC_EMI GPIO Output High

EIM_OE AA7 NVCC_EMI GPIO Output High

EIM_RW AB3 NVCC_EMI GPIO Output High

EIM_SDBA0 V1 NVCC_EMI_DRAM DDR2 Output High

EIM_SDBA1 U3 NVCC_EMI_DRAM DDR2 Output High

EIM_SDBA2 F1 NVCC_EMI_DRAM DDR2 Output High

EIM_SDODT0 F3 NVCC_EMI_DRAM DDR2 Output High

EIM_SDODT1 F2 NVCC_EMI_DRAM DDR2 Output High

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

Package Information and Contact Assignments

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

Freescale Semiconductor 147

Preliminary—Subject to Change Without Notice

EIM_WAIT AB4 NVCC_EMI GPIO Input 100 kΩ pull-up

EXTAL AB20 NVCC_OSC Analog Input –

FASTR_ANA W20 NVCC_PER3 – Input –

FASTR_DIG Y20 NVCC_PER3 – Input –

GPANAIO J23 NVCC_USBPHY Analog Output –

GPIO_NAND D5 NVCC_NANDF_A UHVIO Input 100 kΩ pull-up

GPIO1_0 B21 NVCC_PER5 GPIO Input Keeper

GPIO1_1 D20 NVCC_PER5 GPIO Input Keeper

GPIO1_2 A22 NVCC_PER5 GPIO Input Keeper

GPIO1_3 D18 NVCC_PER5 GPIO Input Keeper

GPIO1_4 B22 NVCC_PER5 GPIO Input Keeper

GPIO1_5 D19 NVCC_PER5 GPIO Input Keeper

GPIO1_6 C19 NVCC_PER5 GPIO Input Keeper

GPIO1_7 B23 NVCC_PER5 GPIO Input Keeper

GPIO1_8 C21 NVCC_PER5 GPIO Input Keeper

GPIO1_9 C20 NVCC_PER5 GPIO Input Keeper

I2C1_CLK W15 NVCC_I2C I2CIO Input 47 kΩ pull-up

I2C1_DAT AB16 NVCC_I2C I2CIO Input 47 kΩ pull-up

ID L19 NVCC_USBPHY Analog Input Pull-up

IOB AC19 AHVDDRGB Analog Output —

IOB_BACK AB19 — Analog Output —

IOG AC18 AHVDDRGB Analog Output —

IOG_BACK AB18 — Analog Output —

IOR AC17 AHVDDRGB Analog Output —

IOR_BACK AB17 — Analog Output —

JTAG_DE_B AB15 NVCC_PER14 GPIO Input/Open-drain

output

47 kΩ pull-up

JTAG_MOD V14 NVCC_PER14 GPIO Input 100 kΩ pull-down

JTAG_TCK V15 NVCC_PER14 GPIO Input 100 kΩ pull-down

JTAG_TDI Y14 NVCC_PER14 GPIO Input 47 kΩ pull-up

JTAG_TDO AA15 NVCC_PER14 GPIO 3-state output Keeper

JTAG_TMS AC16 NVCC_PER14 GPIO Input 47 kΩ pull-up

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

148 Freescale Semiconductor

Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

JTAG_TRSTB W14 NVCC_PER14 GPIO Input 47 kΩ pull-up

KEY_COL0 E15 NVCC_PER13 GPIO Input 100 kΩ pull-up

KEY_COL1 A16 NVCC_PER13 GPIO Input 100 kΩ pull-up

KEY_COL2 D15 NVCC_PER13 GPIO Input 100 kΩ pull-up

KEY_COL33B17 NVCC_PER13 GPIO Output High

KEY_COL43F16 NVCC_PER13 GPIO Output Low

KEY_COL53C16 NVCC_PER13 GPIO Output Low

KEY_ROW0 D14 NVCC_PER13 GPIO Input 100 kΩ pull-up

KEY_ROW1 B16 NVCC_PER13 GPIO Input 100 kΩ pull-up

KEY_ROW2 F15 NVCC_PER13 GPIO Input 100 kΩ pull-up

KEY_ROW3 C15 NVCC_PER13 GPIO Input 100 kΩ pull-up

NANDF_ALE E3 NVCC_NANDF_A UHVIO Output High

NANDF_CLE F4 NVCC_NANDF_A UHVIO Output High

NANDF_CS0 C3 NVCC_NANDF_A UHVIO Output High

NANDF_CS1 C2 NVCC_NANDF_A UHVIO Output High

NANDF_CS2 E4 NVCC_NANDF_A UHVIO Output High

NANDF_CS3 B1 NVCC_NANDF_A UHVIO Output High

NANDF_CS4 B2 NVCC_NANDF_A UHVIO Output Low

NANDF_CS5 A2 NVCC_NANDF_A UHVIO Output Low

NANDF_CS6 E5 NVCC_NANDF_B UHVIO Output Low

NANDF_CS7 C4 NVCC_NANDF_B UHVIO Output Low

NANDF_D0 A7 NVCC_NANDF_C UHVIO Input Keeper

NANDF_D1 E8 NVCC_NANDF_C UHVIO Input Keeper

NANDF_D10 B5 NVCC_NANDF_B UHVIO Input Keeper

NANDF_D11 D7 NVCC_NANDF_B UHVIO Input Keeper

NANDF_D12 C5 NVCC_NANDF_B UHVIO Input Keeper

NANDF_D13 A3 NVCC_NANDF_B UHVIO Input Keeper

NANDF_D14 B4 NVCC_NANDF_B UHVIO Input Keeper

NANDF_D15 D6 NVCC_NANDF_B UHVIO Input Keeper

NANDF_D2 A6 NVCC_NANDF_C UHVIO Input Keeper

NANDF_D3 D8 NVCC_NANDF_C UHVIO Input Keeper

NANDF_D4 B7 NVCC_NANDF_C UHVIO Input Keeper

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

Package Information and Contact Assignments

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NANDF_D5 A5 NVCC_NANDF_C UHVIO Input Keeper

NANDF_D6 B6 NVCC_NANDF_C UHVIO Input Keeper

NANDF_D7 C6 NVCC_NANDF_B UHVIO Input Keeper

NANDF_D8 A4 NVCC_NANDF_B UHVIO Input Keeper

NANDF_D9 E7 NVCC_NANDF_B UHVIO Input Keeper

NANDF_RB0 D2 NVCC_NANDF_A UHVIO Input 100 kΩ pull-up

NANDF_RB1 D4 NVCC_NANDF_A UHVIO Input 100 kΩ pull-up

NANDF_RB2 D3 NVCC_NANDF_A UHVIO Input 100 kΩ pull-up

NANDF_RB3 C1 NVCC_NANDF_A UHVIO Input 100 kΩ pull-up

NANDF_RDY_INT B3 NVCC_NANDF_B UHVIO Input 100 kΩ pull-up

NANDF_RE_B E2 NVCC_NANDF_A UHVIO Output —

NANDF_WE_B E1 NVCC_NANDF_A UHVIO Output —

NANDF_WP_B D1 NVCC_NANDF_A UHVIO Output —

OWIRE_LINE E14 NVCC_PER12 GPIO Input 100 kΩ pull-up

PMIC_INT_REQ AA16 NVCC_SRTC_POW GPIO Input 100 kΩ pull-up

PMIC_ON_REQ W16 NVCC_SRTC_POW GPIO Input 100 kΩ pull-up

PMIC_RDY AA17 NVCC_SRTC_POW GPIO Input 100 kΩ pull-up

PMIC_STBY_REQ Y15 NVCC_SRTC_POW GPIO Input 100 kΩ pull-up

POR_B U20 NVCC_PER3 LVIO Input 100 kΩ pull-up

RESET_IN_B Y21 NVCC_PER3 LVIO Input 100 kΩ pull-up

SD1_CLK A17 NVCC_PER15 UHVIO Output —

SD1_CMD E16 NVCC_PER15 UHVIO Input 47 kΩ pull-up

SD1_DATA0 D16 NVCC_PER15 UHVIO Input 47 kΩ pull-up

SD1_DATA1 A18 NVCC_PER15 UHVIO Input 47 kΩ pull-up

SD1_DATA2 F17 NVCC_PER15 UHVIO Input 47 kΩ pull-up

SD1_DATA3 A19 NVCC_PER15 UHVIO Input 360 kΩ pull-down

SD2_CLK B18 NVCC_PER17 UHVIO Output —

SD2_CMD G17 NVCC_PER17 UHVIO Input 47 kΩ pull-up

SD2_DATA0 E17 NVCC_PER17 UHVIO Input 47 kΩ pull-up

SD2_DATA1 B19 NVCC_PER17 UHVIO Input 47 kΩ pull-up

SD2_DATA2 D17 NVCC_PER17 UHVIO Input 47 kΩ pull-up

SD2_DATA3 C17 NVCC_PER17 UHVIO Input 360 kΩ pull-down

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

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Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

STR A15 NVCC_PER12 — —

TEST_MODE V20 NVCC_PER3 GPIO Input 100 kΩ pull-down

UART1_CTS B14 NVVCC_PER12 GPIO Input 100 kΩ pull-up

UART1_RTS D13 NVVCC_PER12 GPIO Input 100 kΩ pull-up

UART1_RXD E13 NVVCC_PER12 GPIO Input 100 kΩ pull-up

UART1_TXD A13 NVVCC_PER12 GPIO Input 100 kΩ pull-up

UART2_RXD A14 NVVCC_PER12 GPIO Input 100 kΩ pull-up

UART2_TXD C14 NVVCC_PER12 GPIO Input 100 kΩ pull-up

UART3_RXD F14 NVVCC_PER12 GPIO Input Keeper

UART3_TXD B15 NVVCC_PER12 GPIO Input Keeper

USBH1_CLK D11 NVCC_PER11 GPIO Input Keeper

USBH1_DATA0 E12 NVCC_PER11 GPIO Input Keeper

USBH1_DATA1 A11 NVCC_PER11 GPIO Input Keeper

USBH1_DATA2 B12 NVCC_PER11 GPIO Input Keeper

USBH1_DATA3 C12 NVCC_PER11 GPIO Input Keeper

USBH1_DATA4 D12 NVCC_PER11 GPIO Input Keeper

USBH1_DATA5 A12 NVCC_PER11 GPIO Input Keeper

USBH1_DATA6 B13 NVCC_PER11 GPIO Input Keeper

USBH1_DATA7 C13 NVCC_PER11 GPIO Input Keeper

USBH1_DIR B11 NVCC_PER11 GPIO Input Keeper

USBH1_NXT C11 NVCC_PER11 GPIO Input Keeper

USBH1_STP E11 NVCC_PER11 GPIO Input Keeper

XTAL AC20 NVCC_OSC Analog Output —

1The state immediately after reset and before ROM firmware or software has executed.

2During power-on reset this port acts as input for fuse override signal. See Table 112 on page 151 for details

3During power-on reset this port acts as output for diagnostic signal. See Table 112 on page 151 for details

Table 111. 19 x 19 mm Signal Assignments, Power Rails, and I/O (continued)

Contact Name Contact

Assignment Power Rail I/O Buffer Type Direction after

Reset1

Configuraton

after Reset1

Package Information and Contact Assignments

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4.1.2.3 Fuse Override Considerations

Table 112 li s ts the contacts that can be overridden with fuse settings.

Table 112. Fuse Override Contacts

Contact name Direction

After Reset

Configuration

After Reset Signal Configuration1 External Termination for Fuse Override

DISP1_DAT10 Input Keeper BT_SPARE_SIZE 4.7 kΩ pull-up or pull-down

DISP1_DAT11 Input Keeper BT_LPB_FREQ[2] 4.7 kΩ pull-up or pull-down

DISP1_DAT12 Input Keeper BT_MLC_SEL 4.7 kΩ pull-up or pull-down

DISP1_DAT13 Input Keeper BT_MEM_CTL[0] 4.7 kΩ pull-up or pull-down

DISP1_DAT14 Input Keeper BT_MEM_CTL[1] 4.7 kΩ pull-up or pull-down

DISP1_DAT15 Input Keeper BT_BUS_WIDTH 4.7 kΩ pull-up or pull-down

DISP1_DAT16 Input Keeper BT_PAGE_SIZE[0] 4.7 kΩ pull-up or pull-down

DISP1_DAT17 Input Keeper BT_PAGE_SIZE[1] 4.7 kΩ pull-up or pull-down

DISP1_DAT18 Input Keeper BT_WEIM_MUXED[0] 4.7 kΩ pull-up or pull-down

DISP1_DAT19 Input Keeper BT_WEIM_MUXED[1] 4.7 kΩ pull-up or pull-down

DISP1_DAT20 Input Keeper BT_MEM_TYPE[0] 4.7 kΩ pull-up or pull-down

DISP1_DAT21 Input Keeper BT_MEM_TYPE[1] 4.7 kΩ pull-up or pull-down

DISP1_DAT22 Input Keeper BT_LPB_FREQ[0] 4.7 kΩ pull-up or pull-down

DISP1_DAT23 Input Keeper BT_LPB_FREQ[1] 4.7 kΩ pull-up or pull-down

DISP1_DAT6 Input Keeper BT_USB_SRC 4.7 kΩ pull-up or pull-down

DISP1_DAT7 Input Keeper BT_EEPROM_CFG 4.7 kΩ pull-up or pull-down

DISP1_DAT8 Input Keeper BT_SRC[0] 4.7 kΩ pull-up or pull-down

DISP1_DAT9 Input Keeper BT_SRC[1] 4.7 kΩ pull-up or pull-down

EIM_A16 Input 100 kΩ pull-up OSC_FREQ_SEL[0] 4.7 kΩ pull-down or none for high level2

EIM_A17 Input 100 kΩ pull-up OSC_FREQ_SEL[1] 4.7 kΩ pull-down or none for high level2

EIM_A18 Input 100 kΩ pull-up BT_LPB[0] 4.7 kΩ pull-down or none for high level2

EIM_A19 Input 100 kΩ pull-up BT_LPB[1] 4.7 kΩ pull-down or none for high level2

EIM_A20 Input 100 kΩ pull-up BT_UART_SRC[0] 4.7 kΩ pull-down or none for high level2

EIM_A21 Input 100 kΩ pull-up BT_UART_SRC[1] 4.7 kΩ pull-down or none for high level2

EIM_A23 Input 100 kΩ pull-up No longer used; formerly

BT_HPN_EN.

none

KEY_COL3 Output High Output for diagnostic signal

INT_BOOT during

power-on reset

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Preliminary—Subject to Change Without Notice

Package Information and Contact Assignments

KEY_COL4 Output Low Output for diagnostic signal

ANY_PU_RST during

power-on reset

KEY_COL5 Output Low Output for diagnostic signal

JTAG_ACT during power-on

reset

1Signal Configuration as Fuse Override Input at Power Up. These are special I/O lines that control the boot up configuration

during product development. In production, the boot configuration is controlled by fuses.

2Consider using an external 68 kΩ pull-up if system constraints indicate that the on-chip 100 kΩ pull-up is too weak.

Table 112. Fuse Override Contacts (continued)

Contact name Direction

After Reset

Configuration

After Reset Signal Configuration1 External Termination for Fuse Override

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Package Information and Contact Assignments

4.2 19 x 19 mm, 0.8 Pitch Ball Map

Table 113 shows the 19 × 19 mm, 0.8 pitch ball map.

Table 113. 19 × 19 mm, 0.8 Pitch Ball Map

GND

NANDF_CS5

NANDF_D13

NANDF_D8

NANDF_D5

NANDF_D2

NANDF_D0

CSI2_D19

AUD3_BB_FS

CSPI1_SCLK

USBH1_DATA1

USBH1_DATA5

UART1_TXD

UART2_RXD

STR

KEY_COL1

SD1_CLK

SD1_DATA1

SD1_DATA3

CSI1_HSYNC

CSI1_D9

GPIO1_2

GND

NANDF_CS3

NANDF_CS4

NANDF_RDY_INT

NANDF_D14

NANDF_D10

NANDF_D6

NANDF_D4

CSI2_D12

AUD3_BB_RXD

CSPI1_SS1

USBH1_DIR

USBH1_DATA2

USBH1_DATA6

UART1_CTS

UART3_TXD

KEY_ROW1

KEY_COL3

SD2_CLK

SD2_DATA1

CSI1_MCLK

GPIO1_0

GPIO1_4

GPIO1_7

NANDF_RB3

NANDF_CS1

NANDF_CS0

NANDF_CS7

NANDF_D12

NANDF_D7

CSI2_D13

AUD3_BB_CK

CSPI1_RDY

CSPI1_MISO

USBH1_NXT

USBH1_DATA3

USBH1_DATA7

UART2_TXD

KEY_ROW3

KEY_COL5

SD2_DATA3

CSI2_HSYNC

GPIO1_6

GPIO1_9

GPIO1_8

DISP1_DAT6

DISP1_DAT7

NANDF_WP_B

NANDF_RB0

NANDF_RB2

NANDF_RB1

GPIO_NAND

NANDF_D15

NANDF_D11

NANDF_D3

CSI2_D18

CSPI1_MOSI

USBH1_CLK

USBH1_DATA4

UART1_RTS

KEY_ROW0

KEY_COL2

SD1_DATA0

SD2_DATA2

GPIO1_3

GPIO1_5

GPIO1_1

DISP1_DAT8

DISP1_DAT10

DISP1_DAT11

NANDF_WE_B

NANDF_RE_B

NANDF_ALE

NANDF_CS2

NANDF_CS6

NVCC_NANDF_A

NANDF_D9

NANDF_D1

AUD3_BB_TXD

CSPI1_SS0

USBH1_STP

USBH1_DATA0

UART1_RXD

OWIRE_LINE

KEY_COL0

SD1_CMD

SD2_DATA0

CSI1_D8

CSI2_PIXCLK

DISP1_DAT9

DISP1_DAT12

DISP1_DAT14

DISP1_DAT16

EIM_SDBA2

EIM_SDODT1

EIM_SDODT0

NANDF_CLE

NVCC_NANDF_A

VDDGP

SVDDGP

UART3_RXD

KEY_ROW2

KEY_COL4

SD1_DATA2

CSI1_PIXCLK

CSI2_VSYNC

DISP1_DAT13

DISP1_DAT17

DISP1_DAT22

DISP1_DAT20

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Package Information and Contact Assignments

DRAM_D28

DRAM_D29

DRAM_D30

DRAM_D31

GND

VDDGP

VDDA

NVCC_NANDF_B

NVCC_NANDF_C

NVCC_PER11

NVCC_PER12

NVCC_PER13

NVCC_PER17

NVCC_PER5

NVCC_IPU4

SD2_CMD

CSI1_VSYNC

DISP1_DAT15

DISP1_DAT18

DISP1_DAT23

DI1_PIN3

DI1_PIN2

DRAM_D25

DRAM_D26

DRAM_SDQS3

DRAM_SDQS3_B

DRAM_DQM3

NVCC_EMI_DRAM

VDDGP

VDDA

GND

NVCC_PER9

NVCC_PER10

VDDA

VCC

SVCC

NVCC_PER15

NVCC_PER8

NVCC_IPU5

DISP1_DAT19

DISP1_DAT21

DI1_PIN15

DI_GP1

DI_GP3

DI2_PIN4

DRAM_SDQS2

DRAM_SDQS2_B

DRAM_D22

DRAM_D23

DRAM_D27

NVCC_EMI_DRAM

VDDGP

GND

SGND

GND

VCC

NVCC_IPU6

DI1_DISP_CLK

DI_GP2

DI2_PIN2

DI2_DISP_CLK

DI_GP4

GPANAIO

DRAM_D19

DRAM_DQM2

DRAM_D20

DRAM_D21

DRAM_D24

NVCC_EMI_DRAM

VDDGP

GND

VCC

NVCC_IPU7

DI2_PIN3

RREFEXT

VBUS

VREG

DRAM_D18

DRAM_D17

DRAM_D16

DRAM_D15

DRAM_D14

NVCC_EMI_DRAM

VCC

GND

VCC

NGND_USBPHY

NVCC_USBPHY

VDDA33

CSI2_D14

CSI2_D15

CSI2_D16

CSI2_D17

Table 113. 19 × 19 mm, 0.8 Pitch Ball Map (continued)

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Package Information and Contact Assignments

DRAM_D12

DRAM_DQM1

DRAM_D10

DRAM_D11

DRAM_D13

NVCC_EMI_DRAM

VCC

VDDA

GND

NVCC_HS10

NVCC_HS6

NVCC_HS4_1

DISP2_DAT1

CSI1_D14

CSI1_D15

CSI1_D18

CSI1_D19

DRAM_D9

DRAM_D8

DRAM_SDQS1_B

DRAM_SDQS1

DRAM_D7

NVCC_EMI_DRAM

VCC

GND

VCC

NVCC_HS4_2

DISP2_DAT6

DISP1_DAT0

DISP1_DAT1

CSI1_D16

CSI1_D17

DRAM_SDQS0_B

DRAM_SDQS0

DRAM_DQM0

DRAM_D6

DRAM_D5

NVCC_EMI_DRAM

VCC

GND

VDDA

VCC

NVCC_IPU8

DISP2_DAT8

DISP2_DAT2

DISP2_DAT3

CSI1_D12

CSI1_D13

DRAM_D3

DRAM_D2

DRAM_D1

DRAM_D4

VREF

NVCC_EMI_DRAM

VDD_FUSE

GND

VCC

NVCC_IPU9

DISP2_DAT11

DISP2_DAT9

DISP2_DAT0

CSI1_D10

CSI1_D11

DRAM_D0

DRAM_A14

DRAM_SDCLK

DRAM_SDCLK_B

GND

NVCC_EMI_DRAM

GND_DIG_PLL_A

VCC

VDDA

NVCC_I2C

NGND_TV_BACK

GND

VCC

NVCC_IPU2

DISP2_DAT13

DI1_PIN13

DISP2_DAT15

DISP1_DAT4

DISP1_DAT5

DRAM_A13

DRAM_A12

EIM_SDBA1

DRAM_A11

DRAM_SDWE

VDD_DIG_PLL_A

GND_ANA_PLL_A

NVCC_EMI

NVCC_PER14

NVCC_SRTC_POW

VREFOUT

NVCC_TV_BACK

GND_ANA_PLL_B

NVCC_PER3

DISPB2_SER_DIN

POR_B

DI1_D0_CS

DISP1_DAT2

DISP1_DAT3

Table 113. 19 × 19 mm, 0.8 Pitch Ball Map (continued)

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156 Freescale Semiconductor

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Package Information and Contact Assignments

EIM_SDBA0

DRAM_A10

DRAM_A9

DRAM_CAS

DRAM_A3

VDD_ANA_PLL_A

NVCC_EMI

EIM_D23

EIM_EB3

EIM_EB2

EIM_DA11

EIM_EB0

EIM_DA1

JTAG_MOD

JTAG_TCK

TVDAC_DHVDD

NGND_OSC

GND_DIG_PLL_B

CKIH1

TEST_MODE

DISPB2_SER_DIO

DISP2_DAT4

DISP2_DAT5

DRAM_RAS

DRAM_A8

DRAM_A6

DRAM_A4

DRAM_SDCKE1

EIM_CS0

EIM_D31

EIM_D27

EIM_D21

EIM_D17

EIM_DA13

EIM_EB1

EIM_DA7

JTAG_TRSTB

I2C1_CLK

PMIC_ON_REQ

NVCC_OSC

VDD_DIG_PLL_B

VDD_ANA_PLL_B

FASTR _A NA

DISPB2_SER_RS

DISP2_DAT10

DISP2_DAT7

DRAM_A7

DRAM_A5

DRAM_CS1

DRAM_CS0

EIM_DTACK

EIM_CS1

EIM_CS2

EIM_D29

EIM_D25

EIM_D19

EIM_DA15

EIM_DA9

EIM_DA5

JTAG_TDI

PMIC_STBY_REQ

CKIL

COMP

AHVDDRGB

AHVSSRGB

FASTR_DIG

RESET_IN_B

DI1_PIN11

DISP2_DAT12

DRAM_SDCKE0

DRAM_A1

DRAM_A2

EIM_BCLK

EIM_CS5

EIM_CS4

EIM_OE

EIM_A19

EIM_A16

EIM_D24

EIM_D18

EIM_DA12

EIM_DA6

EIM_DA2

JTAG_TDO

PMIC_INT_REQ

PMIC_RDY

AHVDDRGB

AHVSSRGB

CKIH2

CLK_SS

DI1_PIN12

DISP2_DAT14

DRAM_A0

EIM_CRE

EIM_RW

EIM_WAIT

EIM_A27

EIM_A25

EIM_A22

EIM_A20

EIM_A17

EIM_D26

EIM_D20

EIM_DA14

EIM_DA8

EIM_DA3

JTAG_DE_B

I2C1_DAT

IOR_BACK

IOG_BACK

IOB_BACK

EXTAL

BOOT_MODE0

BOOT_MODE1

DI1_D1_CS

GND

EIM_LBA

EIM_CS3

EIM_A26

EIM_A24

EIM_A23

EIM_A21

EIM_A18

EIM_D30

EIM_D28

EIM_D22

EIM_D16

EIM_DA10

EIM_DA4

EIM_DA0

JTAG_TMS

IOR

IOG

IOB

XTAL

GND

DISPB2_SER_CLK

GND

Table 113. 19 × 19 mm, 0.8 Pitch Ball Map (continued)

Revision History

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Preliminary—Subject to Change Without Notice

5 Revision History

Table 114 provides a revision history for this data sheet.

Table 114. i.MX51 Data Sheet Document Revision History

Rev.

Number Date Substantive Change(s)

1 10/30/2009 Initial public release.

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THIS PAGE INTENTIONALLY LEFT BLANK

i.MX51A Automotive and Infotainment Applications Processors, Rev. 1

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THIS PAGE INTENTIONALLY LEFT BLANK

Document Number: IMX51AEC

Rev. 1

11/2009

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