MSM30R0120-LQFP176 - OKI Semiconductor

MSM30R/32R/92R

0.5µm Sea Of Gates and Customer

Structured Arrays

July 2001

OKI ASIC PRODUCTS

D

ATA

S

HEET

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CONTENTS

Description ................................................................................................................................................................1

Features ....................................................................................................................................................................1

MSM30R/32R/92R Family Listing .......................................................................................................................3

Array Architecture ...................................................................................................................................................5

MSM92R000 CSA Layout Methodology ........................................................................................................5

Electrical Characteristics .........................................................................................................................................7

Macro Library .........................................................................................................................................................11

Macrocells for Driving Clock Trees ..............................................................................................................12

Oki Advanced Design Center Cad Tools ...........................................................................................................13

Design Process .................................................................................................................................................14

Automatic Test Pattern Generation ..............................................................................................................15

Floorplanning Design Flow ...........................................................................................................................15

IEEE JTAG Boundary Scan Support .............................................................................................................16

Package Options .....................................................................................................................................................17

1Oki Semiconductor

MSM30R/32R/92R

Second-Generation 0.5

µ

m Sea of Gates and Customer Structured Arrays

DESCRIPTION

Oki's second-generation 0.5µm ASIC products are available in both Sea Of Gates (SOG) and Customer

Structured Array (CSA) architectures. The MSM30R Series, MSM32R Series, and MSM92R Series all offer

increased density over their first-generation counterparts, as well as 3-V I/O buffers that are 5-V tolerant.

Both the SOG-based MSM30R Series and the CSA-based MSM92R Series use a three-layer metal process

on 0.5µm drawn (0.4µm L-effective) CMOS technology. The SOG-based MSM32R Series uses the same

SOG base-array architecture as the MSM30R Series, but offers two metal layers instead of three. The

semiconductor process is adapted from Oki's production-proven 16-Mbit DRAM manufacturing process.

The second-generation 0.5µm family retains the high speed and low power of Oki’s first-generation

0.5µm MSM13R/12R/98R family. The second-generation 0.5µm family also shares the same die sizes for

arrays with corresponding I/O counts, but the second-generation arrays can contain up to 60% more

gates than their first-generation counterparts. The second-generation family is optimized for 3-V core

operation, with optimized 3-V I/O buffers and 3-V I/O buffers that are 5-V tolerant, whereas the first-

generation family offers separate I/O buffers for mixed 3-V and 5-V operation. Oki's first-generation and

second-generation 0.5µm families together offer an unusually flexible mixed-voltage ASIC capability.

The 3-layer-metal MSM30R SOG Series contains 8 array bases, offering up to 448 I/O pads and over 600K

raw gates. The 2-layer metal MSM32R SOG Series contains five array bases, offering up to 320 I/O pads

and over 300K raw gates. These SOG array sizes are designed to fit the most popular Quad Flat Pack

(QFP) and Plastic Ball Grid Array (PBGA) packages. The MSM30R and MSM32R Series’ SOG architec-

ture allows rapid prototyping turnaround times, additionally offering the most cost-effective solution for

pad-limited circuits (particularly the 2-layer metal MSM32R Series).

The 3-layer-metal MSM92R CSA Series contains 36 array bases, offering a wider span of gate and I/O

counts than SOG Series. Oki uses the EPOCH memory compiler from Cascade Design Automation to

generate optimized single- and dual-port RAM macrocells for CSA designs. As such, the MSM92R Series

is suited to memory-intensive ASICs and high-volume designs where fine tuning of package size pro-

duces significant cost or real-estate savings.

FEATURES

• 0.5µm drawn two and three-layer metal CMOS

• Optimized 3.3-V core

• Optimized 3-V I/O and 3-V I/O that is 5-V tolerant

• SOG and CSA architecture availability

• 120-ps typical gate propagation delay (for a 2-input

4x-drive NAND gate with a fan-out of 2 and 0mm of

wire, operating at 3.3 V)

• Up to 1.2M raw gates and 624 pads

•User-configurable I/O with VSS, VDD, TTL, 3-state,

and 1 mA ~ 24 mA options

• Slew-rate-controlled outputs for low-radiated noise

• Clock tree cells with ≤ 0.5-ns clock skew, worst-case

(fan-out ≥ 9000 at 75 MHz)

• User-configurable single and dual-port memories

• Specialized macrocells, including phase-locked loop,

GTL, PECL, and PCI cells

• Floorplanning for front-end simulation, back-end

layout controls, and link to synthesis

• JTAG boundary scan and scan-path ATPG

• Support for popular CAE systems, including

Cadence, IKOS, Mentor Graphics, Synopsys,

Viewlogic, and Zycad

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MSM30R/32R/92R FAMILY LISTING

CSA Part# CSA Master# SOG Part# I/O Pads Raw Gates Rows

[1]

1. Row and column numbers are used to evaluate the number and size of mega macrocells that may be included into each array.

Columns Usable Gates

[2]

2. Usable gate count is design dependent and varies based upon the number of fan-outs per net, internal busses, floor plan,

RAM/ROM blocks, etc.

MSM92RB01 B92R020X020

—

80 14,688 72 204 11,750

MSM92RB02 B92R024X024 — 96 22,784 89 256 18,227

MSM92RB03 B92R026X026 MSM30R0020 104 27,440 98 280 21,952

MSM92RB04 B92R030X030 — 120 37,720 115 328 30,176

MSM92RB05 B92R032X032 — 128 43,296 123 352 34,637

— — MSM32R0050 144 56,000 140 400 26,880

MSM92RB06 B92R036X036 MSM30R0050 144 56,000 140 400 42,000

MSM92RB07 B92R038X038 — 152 63,176 149 424 47,382

MSM92RB08 B92R040X040 — 160 70,336 157 448 52,752

MSM92RB09 B92R042X042 — 168 78,352 166 472 58,764

— — MSM32R0080 176 86,304 174 496 38,837

MSM92RB10 B92R044X044 MSM30R0080 176 86,304 174 496 60,413

MSM92RB11 B92R048X048 — 192 103,904 191 544 72,733

MSM92RB12 B92R050X050 — 200 114,400 200 572 80,080

— — MSM32R0120 208 123,968 208 596 49,587

MSM92RB13 B92R052X052 MSM30R0120 208 123,968 208 596 86,778

MSM92RB14 B92R056X056 — 224 144,900 225 644 101,430

MSM92RB15 B92R060X060 — 240 167,464 242 692 117,225

— — MSM32R0190 256 191,660 259 740 72,831

MSM92RB16 B92R064X064 MSM30R0190 256 191,660 259 740 126,496

MSM92RB17 B92R068X068 — 272 217,488 276 788 143,542

MSM92RB18 B92R072X072 — 288 244,948 293 836 161,666

MSM92RB19 B92R076X076 — 304 274,040 310 884 180,866

— — MSM32R0300 320 306,072 327 936 110,186

MSM92RB20 B92R080X080 MSM30R0300 320 306,072 327 936 195,886

MSM92RB21 B92R084X084 — 336 338,496 344 984 216,637

MSM92RB22 B92R088X088 — 352 372,552 361 1032 238,433

MSM92RB23 B92R092X092 — 368 408,240 378 1080 261,274

MSM92RB24 B92R096X096 MSM30R0440 384 445,560 395 1128 276,247

MSM92RB25 B92R100X100 — 400 484,512 412 1176 300,397

MSM92RB26 B92R104X104 — 416 525,096 429 1224 325,560

MSM92RB27 B92R108X108 — 432 569,096 446 1276 352,840

MSM92RB28 B92R112X112 — 448 613,012 463 1324 367,807

MSM92RB29 B92R118X118 — 472 682,644 489 1396 409,586

MSM92RB30 B92R122X122 — 488 730,664 506 1444 438,398

MSM92RB31 B92R126X126 — 504 780,316 523 1492 468,190

MSM92RB32 B92R132X132 — 528 857,072 548 1564 514,243

MSM92RB33 B92R138X138 — 552 941,360 574 1640 564,816

MSM92RB34 B92R144X144 — 576 1,025,488 599 1712 615,293

MSM92RB35 B92R150X150 — 600 1,115,000 625 1784 669,000

MSM92RB36 B92R156X156 — 624 1,206,400 650 1856 723,840

3Oki Semiconductor

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MSM30R/32R/92R

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ARRAY ARCHITECTURE

The primary components of a 0.5

µ

m MSM30R/32R/92R circuit include:

• I/O base cells

• Configurable I/O pads for V

DD

, V

SS

, or I/O (optimized 3-V I/O and 3-V I/O that is 5-V tolerant)

•V

DD

and V

SS

pads dedicated to wafer probing

• Separate power bus for output buffers

• Separate power bus for internal core logic and input buffers

• Core base cells containing N-channel and P-channel pairs, arranged in column of gates

• Isolated gate structure for reduced input capacitance and increased routing flexibility

Each array has 24 dedicated corner pads for power and ground use during wafer probing, with four pads

per corner. The arrays also have separate power rings for the internal core functions (V

DDC

and V

SSC

)

and output drive transistors (V

DDO

and V

SSO

).

Figure 7. MSM30R0000 Array Architecture

MSM92R000 CSA Layout Methodology

The procedure to design, place, and route a CSA follows.

1. Select suitable base array frame from the available predefined sizes. To select an array size:

- Identify the macrocell functions required and the minimum array size to hold the macrocell

functions.

Core base cell

with 4 transistors

Separate power bus (VDDO, VSSO)

over I/O cell for output buffers(2nd

metal/3rd metal)

VDD, VSS pads (4) in each

corner for

wafer probing only

Configurable I/O pads

for VDD, VSS, or I/O

Separate power bus (VDDC, VSSC) for

internal core logic (2nd metal/3rd metal

I/O base cells

1,2, or 3 layer metal

interconnection in

core area

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- Add together all the area occupied by the required random logic and macrocells and select

the optimum array.

2. Make a floor plan for the design’s megacells.

- Oki Design Center engineers verify the master slice and review simulation.

- Oki Design Center or customer engineers floorplan the array using Oki’s proprietary floor-

planner or HLD DP3 and customer performance specifications.

- Using Oki CAD software, Design Center engineers remove the SOG transistors and replace

them with diffused memory macrocells to the customer’s specifications.

Figure 8

shows an array base after placement of the optimized memory macrocells.

Figure 8. Optimized Memory Macrocell Floor Plan

3. Place and route logic into the array transistors.

- Oki Design Center engineers use layout software and customer performance specifications

to connect the random logic and optimized memory macrocells.

Figure 9

marks the area in which placement and routing is performed with cross hatching.

Figure 9. Random Logic Place and Route

Mega macrocell

Early mask high-density ROM

High-density RAM

Multi-port RAM

5Oki Semiconductor

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MSM30R/32R/92R

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ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings (V

SS

= 0 V, T

j

= 25

°

C)

[1]

1. Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted

to the conditions in the other specifications of this data sheet. Exposure to absolute maximum rating conditions for extended periods

may affect device reliability.

Parameter Symbol Conditions Rated Value Unit

Power supply voltage V

DD

—

-0.3 ~ +4.6 V

Input voltage (normal buffers) V

I

-0.3 ~ V

DD

+0.3

V

(5-V tolerant) -0.3 ~ 6.0

Output voltage (normal buffers) V

O

-0.3 ~ V

DD

+0.3

(5-V tolerant) -0.3 ~ 6.0

Input current (normal buffers) I

I

-10 ~ +10 mA

(5-V tolerant) -6 ~ +6

Output current per I/O (normal buffers) I

O

I

O

= 1, 2, 4, 6, 8, 12, 24 mA -24 ~ +24 mA

(5-V tolerant) I

O

= 2, 4, 6, 8 mA -8 ~ +8

Storage temperature T

stg

—

-65 ~ +150

°

C

Recommended Operating Conditions (V

SS

= 0 V)

Parameter Symbol Rated Value Unit

Power supply voltage V

DD

(3 V) +3.0 ~ +3.6 V

Junction temperature T

j

-40 ~ +70

°

C

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MSM30R/32R/92R

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DC Characteristics (V

DD

= 3.0 V ~ 3.6 V, V

SS

= 0 V, T

j

= -40

°

C ~ +70

°

C)

Parameter Symbol Conditions

Rated Value

[1]

1. JEDEC Compatible; JESD8-1A LVTTL

UnitMin Typ

[2]

2. Typical condition is 3.3 V and T

j

= 25

o

C on a typical process.

Max

High-level input voltage V

IH

TTL input (normal) 2.0 — V

DD

+ 0.3

V

TTL input (5-V tolerant) 2.0 — 5.5

Low-level input voltage V

IL

TTL input (normal) -0.3 — 0.8

TTL input (5-V tolerant) -0.3 — 0.8

TTL- level Schmitt trigger input threshold

voltage (normal buffer) V

t+

TTL input — 1.5 2.0

V

t-

0.7 1.0 —

∆

V

t

V

t+

- V

t-

0.4 0.5 —

TTL-level Schmitt trigger input threshold

voltage (5-V tolerant) V

t+

TTL 5-V tolerant input — 1.5 2.0

V

t-

0.7 1.0 —

∆

V

t

V

t+

- V

t-

0.4 0.5 —

High-level output voltage

(normal buffer) V

OH

I

OH

= -100

µ

AV

DD

-0.2 — —

I

OH

= -1, -2, -4, -6, -8, -12 mA 2.4 — —

High-level output voltage

(5-V tolerant) I

OH

= -100

µ

AV

DD

-0.2 — —

I

OH

= -1, -2, -4, -6, -8 mA 2.4 — —

Low-level output voltage

(normal buffer) V

OL

I

OL

= 100

µ

A — — 0.2

I

OL

= 1, 2, 4, 6, 8, 12, 24

[3]

mA

3. 24 mA only available for open-drain outputs.

— — 0.4

Low-level output voltage

(5-V tolerant) I

OL

= 100

µ

A — — 0.2

I

OL

= 1, 2, 4, 6, 8 mA — — 0.4

High-level input current

(normal buffer) I

IH

V

IH

= V

DD

— 0.01 1

µ

A

V

IH

= V

DD

(50 k

Ω

pull-down) 15 66 170

High-level input current

(5-V tolerant) V

IH

= V

DD

- 0.01 1

V

IH

= V

DD

(50 k

Ω

pull-down) 15 66 170

Low-level input current

(normal buffer)

I

IL

V

IL

= V

SS

-1 -0.01 —

V

IL

= V

SS

(50 k

Ω

pull-up) -170 -66 -15

V

IL

= V

SS

(3 k

Ω

pull-up) -3.3 -1.1 -0.3 mA

Low-level input current

(5-V tolerant) V

IL

= V

SS

-1 -0.01 —

µ

A

V

IL

= V

SS

(50 k

Ω

pull-up) -170 -66 -15

V

IL

= V

SS

(3 k

Ω

pull-up) -3.3 -1.1 -0.3 mA

3-state output leakage current

(normal buffer) I

OZH

V

OH

= VDD — 0.01 1 µA

VOH = VDD (50 kΩ pull-down) 15 66 170

IOZL

VOL = VSS -1 -0.01 — µA

VOL = VSS (50 kΩ pull-up) -170 -66 -15

VOL = VSS (3 kΩ pull-up) -3.3 -1.1 -0.3 mA

3-state output leakage current

(5-V tolerant) IOZH VOH = VDD — 0.01 1 µA

VOH = VDD (50 kΩ pull-down) 15 66 170

IOZL

VOL = VSS -1 -0.01 — µA

VOL = VSS (50 kΩ pull-up) -170 -66 -15

VOL = VSS (3 kΩ pull-up) -3.3 -1.1 -0.3 mA

Stand-by current [4]

4. RAM/ROM should be in power-down mode.

IDDQ Output open, VIH=VDD, VIL=VSS Design Dependent µA

7Oki Semiconductor

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AC Characteristics

(VDD = 3.3 V, VSS = 0 V, Tj = 25° C)

Parameter Driving Type Conditions [1] [2]

1. Input transition time in 0.2 ns / 3.3 V.

2. Typical condition is 3.3 V and Tj = 25o C for a typical process.

Rated Value [3]

3. Rated value is calculated as an average of the L-H and H-L delay times of each macro type on a typical process.

Unit

Internal gate

propagation delay Inverter 1X F/O=2, L=0mm

VDD=3.3V 0.12 ns

2X 0.10

4X 0.08

2-input NAND 1X 0.17

2X 0.14

4X 0.12

2-input NOR 1X 0.21

2X 0.17

4X 0.18

Inverter 1X F/O=2, L=1mm

VDD=3.3V 0.28

2X 0.20

4X 0.13

2-input NAND 1X 0.36

2X 0.24

4X 0.17

2-input NOR 1X 0.47

2X 0.34

4X 0.30

Toggle frequency F/O=1,L=0mm 630 MHz

Input buffer

propagation delay TTL-level normal input buffer F/O=2,L=1mm 0.40 ns

TTL-level 5-V tolerant buffer 0.61

Output buffer

propagation delay Push-pull

(normal buffer) 4mA CL=20pF 1.87

8mA CL=50pF 2.14

12mA CL=100pF 2.71

3-state

(5-V tolerant) 4mA CL=20pF 2.29

Output buffer

transition time [4]

4. Output rising and falling times are both specified over a 10%-90% range

Push-pull

(normal buffer) 12mA CL=75pF 4.09 (r)

3.85 (f)

3-state

(5-V tolerant) 4mA CL=20pF 3.18 (r)

4.00 (f)

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MACRO LIBRARY

Oki Semiconductor supports a wide range of macrocells and macrofunctions, ranging from simple hard

macrocells for basic Boolean operations to large, user-parameterizable macrofunctions. The following

figure illustrates the main classes of macrocells and macrofunctions available.

Figure 10. Oki Macrocell and Macrofunction Library

Macro Library

Macrocells

Basic Macrocells

with Scan test

Clock Tree Driver

Macrocells

3V, 5V Tolerant

Output Macrocells

MSI Macrocells

Mega/Special

Macrocells [1]

3V, 5V Tolerant

Input

Macrofunctions

3V, 5V tolerant

Bi-Directional

Macrofunctions

MSI

Macrofunctions

Oscillator

Macrofunctions

Examples

NANDs

NORs EXORs

Latches

Flip-Flops

3-State Outputs

Push-Pull Outputs

PECL Outputs

Counters

Shift Registers

UART

PLL

Inputs

Inputs with Pull-Ups

74199

74163

Gated Oscillators

Open Drain Outputs

Slew Rate Control Outputs

PCI Outputs

Inputs with Pull-Downs

GTL Inputs

PECL Inputs

I/O

PCI I/O I/O with Pull-Downs

I/O with Pull-Ups

74151

SOG RAMs:

Single-Port RAMs

Dual-Port RAMs

82C37

82C54

Memory

Macrocells

82C59

Flip-Flops

Combinational Logic

[1] Under development

Optimized Diffused RAMs:

Single-Port RAMs

Dual-Port RAMs

PCI Controller

Ethernet Controller

9Oki Semiconductor

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Macrocells for Driving Clock Trees

Oki offers clock-tree drivers that guarantee a skew time of less than 0.5 ns. The advanced layout software

uses dynamic driver placement and sub-trunk allocation to optimize the clock-tree implementation for a

particular circuit. Features of the clock-tree driver-macrocells include:

• Clock skew ≤ 0.5 ns

• Automatic fan-out balancing

• Dynamic sub-trunk allocation

• Single clock tree driver logic symbol

• Single-level clock drivers

• Automatic branch length minimization

• Dynamic driver placement

• Up to four clock trunks

The clock-skew management scheme is described in detail in Oki’s 0.5µm Technology Clock Skew Manage-

ment Application Note.

Figure 11. Clock Tree Structure

Clock Tree

Driver Macrocell

Clock Drivers

Sub Trunk

Clocked Cell

Input BufferPad

Branch

Main Trunk

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OKI ADVANCED DESIGN CENTER CAD TOOLS

Oki’s advanced design center CAD tools include support for the following:

• Floorplanning for front-end simulation and back-end layout control

• Clock tree structures improve first-time silicon success by eliminating clock skew problems

• JTAG Boundary scan support

• Power calculation which predicts circuit power under simulation conditions to accurately model

package requirements

Design Kits

Vendor Platform Operating System [1]

1. Contact Oki Application Engineering for current software versions.

Vendor Software/Revision [1] Description

Cadence Sun® [2]

2. Sun or Sun-compatible.

Solaris Ambit Buildgates

NC-Verilog™

Verilog XL

Verifault™

Design Synthesis

Design Simulation

Fault Simulation

Synopsys Sun [2] Solaris Design Compiler Ultra +

Tetramax/ATPG

Primetime

DFT Compiler/Test Compiler

RTL Analyzer

VCS

Design synthesis

ATPG

Static Timing Analysis (STA)

Test synthesis

RTL check

Design Simulation

Model Technology

Inc. (MTI) Sun [2]

NT Solaris

WinNT4.0 MTI-VHDL

MTI-Verilog Design Simulation

Design Simulation

Exemplar Sun [2]

NT Solaris

WinNT4.0 Leonardo Spectrum Design Synthesis

Oki Sun [2] Solaris Floorplanner Floor planning

Verplex Sun [2] Solaris Tuxedo Formal verification

Zycad Sun [2] Solaris XPLUS Fault Simulation

11Oki Semiconductor

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Design Process

The following figure illustrates the overall IC design process, also indicating the three main interface

points between external design houses and Oki ASIC Application Engineering.

Floorplanning

Scan Insertion (Optional)

CDC [1]

Functional Test Vectors

VHDL/HDL Description

Test Vector Conversion

(Oki TPL [3])

Netlist Conversion

(EDIF 200)

TDC [2]

Pre-Layout Simulation

Layout / Timing Driven

Layout (optional) [6] Automatic Test

Pattern Generation

Static Timing Analysis

Post-Layout Simulation

Manufacturing

Prototype Test Program

Conversion

Level 1 [4]

Level 2

Level 2.5 [4]

Level 3 [4]

CAE Front-End

Oki Interface

[1] Oki’s Circuit Data Check program (CDC) verifies logic design rules

[2] Oki’s Test Data Check program (TDC) verifies test vector rules

[3] Oki’s Test Pattern Language (TPL)

[4] Alternate Customer-Oki design interfaces available in addition to standard level 2

[5] Standard design process includes fault simulation

[6] Requires Synopsys timing script for Oki timing driven layout

Gate-Level Simulation

Floorplanning

Synthesis

Fault Simulation [5]

Figure 12. Oki’s Design Process

Synopsys Timing Script

(optional)

Formal Verification

Verification (Design Rule

Check/Formal Verification)

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Automatic Test Pattern Generation

Oki’s 0.5µm ASIC technologies support Automatic Test Pattern Generation (ATPG) using full scan-path

design techniques, including the following:

• Increases fault coverage ≥ 95%

• Uses Synopsys Test Compiler

• Automatically inserts scan structures

• Connects scan chains

• Traces and reports scan chains

• Checks for rule violations

• Generates complete fault reports

• Allows multiple scan chains

• Supports vector compaction

ATPG methodology is described in detail in Oki’s 0.5µm Scan Path Application Note.

Figure 13. Full Scan Path Conﬁguration

Floorplanning Design Flow

Oki’s floorplanner can be classified as both a front-end floorplanner and a back-end floorplanner. During

front-end floorplanning, logic designers use the floorplanner to generate two files: a capacitance file for

pre-layout simulation, and a floorplanner interface file for layout.

During back-end floorplanning, the layout engineer transfers the floorplanner interface file to Oki’s pro-

prietary layout software, code-named Pegasus. The floorplanner interface file contains information about

the placement of blocks and groups of blocks. The back-end floorplanner is automated and is transparent

to logic designers.

Figure 14 shows a diagram of front-end floorplanning. Figure 15 shows a diagram of back-end floorplan-

ning.

Scan Data In

Scan Select

D

C

SD

SS

Q

QN

D

C

SD

SS

A B

Combinational Logic

FD1AS FD1AS

Scan Data OutQ

QN

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Figure 14. Front-End Floorplanning

Figure 15. Back-End Floorplanning

IEEE JTAG Boundary Scan Support

Boundary scan offers efficient board-level and chip-level testing capabilities. Benefits resulting from

incorporating boundary-scan logic into a design include:

• Improved chip-level and board-level testing and failure diagnostic capabilities

• Support for testing of components with limited probe access

• Easy-to-maintain testability and system self-test capability with on-board software

• Capability to fully isolate and test components on the scan path

• Built-in test logic that can be activated and monitored

• An optional Boundary Scan Identification (ID) Register

Oki’s boundary scan methodology meets the JTAG Boundary Scan standard, IEEE 1149.1-1990. Oki sup-

ports boundary scan on both Sea of Gates (SOG) and Customer Structured Array (CSA) ASIC

technologies. Either the customer or Oki can perform boundary-scan insertion. More information is

available in Oki’s JTAG Boundary Scan Application Note. Contact the Oki Application Engineering Depart-

ment for interface options.

Set Design

EDIF

EDIF Netlist

PLT

Pinlist File

Pre-Floor Plan

Floorplan

Floorplanner

rcEst

Simulation Interface File

FPI

Floorplanner Interface File

Pre-Layout

EDIF

EDIF Netlist

GCD

Layout

Pegasus

FPI

Floorplanner Interface File

FIF

Layout Interface File

14 Oki Semiconductor

■ MSM30R/32R/92R ■ ––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––

PACKAGE OPTIONS

MSM30R/32R/92R Package Menu

Product

Name

MSM92.

.

SOG I/O

Pad

s [1]

QFP TQFP LQFP PBGA FBGA

MSM

32R MSM

30R 44 64 80 100 128 160 208 240 304 44 64 80 100 128 144 176 208 256 352 420 560 144 224

RB01 80 ●❍❍ ●

RB02 96 ❍●❍❍ ● ●

RB03 0020 104 ●●❍❍ ●●●●

RB04 120 ❍●❍● ●●●●

RB05 128 ❍●❍❍ ●●●●●

RB06 0050 0050 144 ●●❍● ●●●●●●

RB07 152 ●●❍❍ ●●●●●●

RB08 160 ❍●❍❍ ●●●●●●

RB09 168 ❍●❍❍ ● ●●●●●●❍ ●

RB10 0080 0080 176 ❍●❍●●● ●●●●●●● ●

RB11 192 ❍●❍❍●● ❍●●● ●● ●

RB12 200 ❍●❍❍●●❍ ❍●●● ●● ●

RB13 0120 0120 208 ❍●❍❍●●● ●●●● ●●●● ●

RB14 224 ●❍❍●●● ●● ●●●● ●

RB15 240 ●❍❍●●●● ●● ●●●● ●

RB16 0190 0190 256 ●●❍●●●● ●● ●●●● ●

RB17 272 ●❍❍●●● ●● ●●●●● ●●

RB18 288 ●❍❍●❍● ●● ●●●●● ●●

RB19 304 ●❍❍●❍● ● ● ●●●●● ●●

RB20 0300 0300 320 ●●❍●●●●● ● ●●●●●● ●

RB21 336 ●❍❍●❍●●● ● ●●●●●● ●

RB22 352 ❍❍●●●● ●●●●●● ●

RB23 368 ●●●● ●●●●●● ●

RB24 0440 384 ●●●●● ●●●●●●

RB25 400 ●●●● ●●●●●●

RB26 416 ●●❍● ●●● ●●

RB27 432 ●●● ●●● ●●

RB28 448 ●● ●●● ●

RB29 472 ●❍● ●● ●

RB30 488 ●●❍ ●● ●

RB31 504 ❍●❍❍● ●● ●

RB32 528 ●●●● ●● ●

RB33 552 ●

RB34 576

15Oki Semiconductor

––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––– ■ MSM30R/32R/92R ■

RB35 600

RB36 624

Body Size (mm) 9x10 14x1414x2014x2028x2828x2828x2832x3240x4010x1010x1012x1214x1414x1420x2024x2428x2827x2735x3535x3535x3513x1315x15

Lead Pitch (mm) 0.8 0.8 0.8 0.65 0.8 0.65 0.5 0.5 0.5 0.8 0.5 0.5 0.5 0.4 0.5 0.5 0.5 1.27 1.27 1.27 1.00 0.8 0.8

Ball Count 256 352 420 560 144 224

Signal I/O 231 304 352 400 144 224

Power Balls 12 16 32 80 - -

Ground Balls 13 32 36 80 - -

1. I/O Pads can be used for input, output, bi-directional, power, or ground.

● = Available now; ❍ = In development

MSM30R/32R/92R Package Menu (Continued)

Product

Name

MSM92.

.

SOG I/O

Pad

s [1]

QFP TQFP LQFP PBGA FBGA

MSM

32R MSM

30R 44 64 80 100 128 160 208 240 304 44 64 80 100 128 144 176 208 256 352 420 560 144 224

16 Oki Semiconductor

■ MSM30R/32R/92R ■ ––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––––

NOTES

Oki Semiconductor

The information contained herein can change without notice owing to product and/or technical improvements.

Please make sure before using the product that the information you are referring to is up-to-date.

The outline of action and examples of application circuits described herein have been chosen as an explanation of the standard action

and performance of the product. When you actually plan to use the product, please ensure that the outside conditions are reflected in

the actual circuit and assembly designs.

Oki assumes no responsibility or liability whatsoever for any failure or unusual or unexpected operation resulting from misuse, neglect,

improper installation, repair, alteration or accident, improper handling, or unusual physical or electrical stress including, but not limited

to, exposure to parameters outside the specified maximum ratings or operation outside the specified operating range.

Neither indemnity against nor license of a third party's industrial and intellectual property right,etc.is granted by us in connection with

the use of product and/or the information and drawings contained herein. No responsibility is assumed by us for any infringement of a

third party's right which may result from the use thereof.

When designing your product, please use our product below the specified maximum ratings and within the specified operating ranges,

including but not limited to operating voltage, power dissipation, and operating temperature.

The products listed in this document are intended for use in general electronics equipment for commercial applications (e.g.,office

automation, communication equipment, measurement equipment, consumer electronics, etc.).These products are not authorized for

use in any system or application that requires special or enhanced quality and reliability characteristics nor in any system or application

where the failure of such system or application may result in the loss or damage of property or death or injury to humans. Such

applications include, but are not limited to: traffic control, automotive, safety, aerospace, nuclear power control, and medical, including

life support and maintenance.

Certain parts in this document may need governmental approval before they can be exported to certain countries. The purchaser

assumes the responsibility of determining the legality of export of these parts and will take appropriate and necessary steps, at their

own expense, for export to another country.

Oki Semiconductor reserves the right to make changes in specifications at anytime and without notice. This information furnished by

Oki Semiconductor in this publication is believed to be accurate and reliable. However, no responsibility is assumed by Oki

Semiconductor for its use; nor for any infringements of patents or other rights of third parties resulting from its use. No license is

granted under any patents or patent rights of Oki.

Oki REGIONAL SALES OFFICES

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Tel: 408/720-8940

Fax:408/720-8965

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Oki Web Site:

http://www.okisemi.com

Silicon Solutions

010053-002