5962-9174401MXA - e2v - Product.Network

REVISIONS

LTR DESCRIPTION DATE (YR-MO-DA) APPROVED

A

Update drawing to reflect current requirements. Editorial changes

throughout. - gap

01-03-07

Raymond Monnin

B Boilerplate update and part of five year review. tcr 06-10-02 Raymond Monnin

THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.

REV

SHEET

REV

SHEET

REV STATUS REV B B B B B B B B B B B B B B

OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14

PMIC N/A PREPARED BY

Gary L. Gross

DEFENSE SUPPLY CENTER COLUMBUS

STANDARD

MICROCIRCUIT

DRAWING

CHECKED BY

William J. Johnson

COLUMBUS, OHIO 43218-3990

http://www.dscc.dla.mil

THIS DRAWING IS

AVAILABLE

FOR USE BY ALL

DEPARTMENTS

APPROVED BY

Michael A. Frye

MICROCIRCUIT, MEMORY, DIGITAL, CMOS

REGISTERED 32K X 8-BIT UVEPROM,

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

DRAWING APPROVAL DATE

93-02-18

MONOLITHIC SILICON

AMSC N/A

REVISION LEVEL

B SIZE

A CAGE CODE

67268

5962-91744

SHEET

1 OF

14

DSCC FORM 2233

APR 97 5962-E600-06

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B SHEET 2

DSCC FORM 2234

APR 97

1. SCOPE

1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)

and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or

Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

1.2 PIN. The PIN is as shown in the following example:

5962 - 91744 01 M X X

Federal

stock class

designator

RHA

designator

(see 1.2.1)

Device

type

(see 1.2.2)

Device

class

designator

Case

outline

(see 1.2.4)

Lead

finish

(see 1.2.5)

\ / (see 1.2.3)

\/

Drawing number

1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are

marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A

specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

1.2.2 Device type(s). The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function Access time

01 7C277 32K X 8-bit registered UVEPROM 50 ns

02 7C277 32K X 8-bit registered UVEPROM 40 ns

1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as

follows:

Device class Device requirements documentation

M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-

JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A

Q or V Certification and qualification to MIL-PRF-38535

1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style 1/

X CDIP3-T28 or GDIP4-T28 28 Dual-in-line package

Y CQCC1-N32 32 Rectangular leadless chip carrier package

Z GDFP2-F28 28 Flat package

1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535,

appendix A for device class M.

1/ Lid shall be transparent to permit ultraviolet light erasure.

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1.3 Absolute maximum ratings. 1/

Supply voltage range to ground potential (VCC) ......................... -0.5 V dc to +7.0 V dc

DC voltage applied to the outputs in the high Z state ................ -0.5 V dc to +7.0 V dc

DC input voltage ....................................................................... -3.0 V dc to +7.0 V dc

DC program voltage .................................................................. 13.0 V dc

Maximum power dissipation ...................................................... 1.0 W 2/

Lead temperature (soldering, 10 seconds) ................................ +260°C

Thermal resistance, junction-to-case (θJC) ................................ See MIL-STD-1835

Junction temperature (TJ) .......................................................... +175°C

Storage temperature range (TSTG) ............................................ -65°C to +150°C

Temperature under bias............................................................. -55°C to +125°C

Endurance ................................................................................. 50 cycles/byte, minimum

Data retention ........................................................................... 10 years, minimum

1.4 Recommended operating conditions.

Supply voltage range (VCC) ....................................................... +4.5 V dc minimum to +5.5 V dc maximum

Ground voltage (GND) .............................................................. 0 V dc

Input high voltage (VIH) .............................................................. 2.0 V dc minimum

Input low voltage (VIL) ............................................................... 0.8 V dc maximum

Case operating temperature range (TC) .................................... -55°C to +125°C

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part

of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the

solicitation or contract.

DEPARTMENT OF DEFENSE SPECIFICATION

MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.

DEPARTMENT OF DEFENSE STANDARDS

MIL-STD-883 - Test Method Standard Microcircuits.

MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.

DEPARTMENT OF DEFENSE HANDBOOKS

MIL-HDBK-103 - List of Standard Microcircuit Drawings.

MIL-HDBK-780 - Standard Microcircuit Drawings.

(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from

the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)

1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the

maximum levels may degrade performance and affect reliability.

2/ Must withstand the added PD due to short circuit test e.g.; IOS.

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2.2 Non-Government publications. The following documents form a part of this document to the extent specified herein.

Unless otherwise specified, the issues of the documents are the issues of the documents cited in the solicitation.

ELECTRONIC INDUSTRIES ALLIANCE (EIA)

JEDEC Standard EIA/JESD 78 - IC Latch-Up Test.

(Applications for copies should be addressed to the Electronics Industries Alliance, 2500 Wilson Boulevard, Arlington, VA

22201; http://www.jedec.org.)

(Non-Government standards and other publications are normally available from the organizations that prepare or distribute

the documents. These documents also may be available in or through libraries or other informational services.)

2.3 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of

this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a

specific exemption has been obtained.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with

MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The

modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for

device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified

herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in

MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M.

3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Truth table. The truth table shall be as specified on figure 2.

3.2.3.1 Unprogrammed or erased devices. The truth table for unprogrammed devices for contracts involving no altered item

drawing shall be as specified on figure 2. When required in screening (see 4.2) group A, C, or D (see 4.3), the devices shall be

programmed by the manufacturer prior to test with a checkerboard pattern or equivalent (a minimum of 50 percent of the total

number of bits programmed) or to any altered item drawing pattern which includes at least 25 percent of the total number of bits

programmed.

3.2.3.2 Programmed devices. The truth table for programmed devices shall be specified by an altered item drawing.

3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the

electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full

case operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table IIA. The electrical

tests for each subgroup are defined in table I.

3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be

marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer

has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be

marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be

in accordance with MIL-PRF-38535, appendix A.

3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in

MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.

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3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535

listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of

compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see

6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this

drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and

herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.

3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for

device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.

3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2

herein) involving devices acquired to this drawing is required for any change that affects this drawing.

3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the

option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made

available onshore at the option of the reviewer.

3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in

microcircuit group number 42 (see MIL-PRF-38535, appendix A).

3.11 Processing EPROMS. All testing requirements and quality assurance provisions herein, shall be satisfied by the

manufacturer prior to delivery.

3.11.1 Erasure of EPROMS. When specified, devices shall be erased in accordance with the procedures and characteristics

specified by the manufacturer.

3.11.2 Programmability of EPROMS. When specified, devices shall be programmed to the specified pattern using the

procedures and characteristics specified by the manufacturer.

3.11.3 Verification of programmed or erased EPROMs. When specified, devices shall be verified as either programmed to a

specified program, or erased. As a minimum, verification shall consist of performing a functional test (subgroup 7) to verify that

all bits are in the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure, and shall be

removed from the lot.

3.12 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall

be done for initial characterization and after any design or process change which may affect data retention. The methods and

procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military

temperature range. The vendor's procedure shall be kept under document control and shall be made available upon request of

the acquiring or preparing activity, along with test data.

3.13 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This test shall be

done for initial characterization and after any design or process change which may affect the reprogrammability of the device.

The methods and procedures may be vendor specific, but shall guarantee the number of program/erase endurance cycles listed

in section 1.3 herein over the full military temperature range. The vendor's procedure shall be kept under document control and

shall be made available upon request of the acquiring or preparing activity, along with test data.

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TABLE I. Electrical performance characteristics.

Test Symbol Conditions

-55°C ≤ TC ≤ +125°C

4.5 V ≤ VCC ≤ 5.5 V

Group A

subgroups

Device

type

Limits

Unit

unless otherwise specified Min Max

Output high voltage VOH V

CC = 4.5 V, IOH = -2 mA 1, 2, 3 All 2.4 V

V

IH = 2.0 V, VIL = 0.8 V

Output low voltage VOL V

CC = 4.5 V, IOL = 8 mA 1, 2, 3 All 0.4 V

V

IH = 2.0 V, VIL= 0.8 V

Input high voltage 1/

VIH 1, 2, 3 All 2.0 V

Input low voltage 1/

VIL 1, 2, 3 All 0.8 V

Input leakage current IIX V

IN = VCC to GND 1, 2, 3 All -10 10 µA

V

CC = 5.5 V

Output leakage current IOZ V

OUT = VCC to GND 2/ 1, 2, 3 All -40 40 µA

V

CC = 5.5 V

Output short circuit IOS V

CC = 5.5 V, 1, 2, 3 All -20 -90 mA

current 3/, 4/ VOUT = GND

Power supply current ICC V

CC = 5.5 V, IOUT = 0 mA, 1, 2, 3 All 130 mA

VIH = 2.0 V, f = fmax 5/

Input capacitance 4/ CIN V

CC = 5.0 V, VIN= 2.0 V, 4 All 10 pF

TA = +25°C, f = 1 MHz

(see 4.4.1c)

Output capacitance 4/ COUT V

CC = 5.0 V, VIN = 2.0 V, 4 All 10 pF

TA = +25°C, f = 1 MHz

(see 4.4.1c)

Functional tests See 4.4.1d 7, 8 All

Address setup to ALE tAL See figures 3 and 4 and 6/ 9, 10, 11 All 10 ns

inactive

Address hold from ALE tLA 9, 10, 11 01 15 ns

inactive 02 10

See footnotes at end of table.

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TABLE I. Electrical performance characteristics – Continued.

Test Symbol Conditions

-55°C ≤ TC ≤ +125°C

4.5 V ≤ VCC ≤ 5.5 V

Group A

subgroups

Device

type

Limits

Unit

unless otherwise specified Min Max

Address pulse width tLL See figures 3 and 4 and 6/ 9, 10, 11 01 15 ns

02 10

Address setup to clock tSA 01 50

high 02 40

Address hold time from tHA All 0

clock high

ES setup to clock tSES All 15

high 3/

ES hold from clock tHES All 10

high 3/

Output valid from clock tCO 01 25

high 3/ 02 20

Clock pulse width tPWC All 20

Output low Z from tLZC 01 30

clock high 4/, 7/ 02 20

Output high Z from tHZC 01 30

clock high 4/, 7/, 9/ 02 20

Output low Z from E tLZE 01 30

low 4/, 8/ 02 20

Output high Z from E tHZE 01 30

high 4/, 8/, 9/ 02 20

1/ These are absolute values with respect to device ground and all overshoots and undershoots due to system or tester noise

are included.

2/ For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this

measurement.

3/ For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 1

second. VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.

4/ Tested initially and after any design or process changes that affect that parameter, and therefore shall be guaranteed to the

limits specified in table I.

5/ At f = fmax, address inputs are cycling at the maximum frequency of 1/tSA

6/ AC tests are performed with input rise and fall times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to

3.0 V, and the output load on figure 3.

7/ Applies only when the synchronous Es function is used.

8/ Applies only when the synchronous E function is used.

9/ Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on the output from the 1.5 V

level on the input, CL = 5 pF (including scope and jig). See figure 3.

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Device

types ALL

Case

outlines X, Z Y

Terminal

number Terminal

symbol

1 A9 NC

2 A8 A9

3 A7 A8

4 A6 A7

5 A5 A6

6 A4 A5

7 A3 A4

8 A2 A3

9 A1 A2

10 A0 A1

11 O0 A0

12 O1 NC

13 O2 O0

14 GND O1

15 O3 O2

16 O4 GND

17 O5 NC

18 O6 O3

19 O7 O4

20 E/ES O5

21 CP O6

22 ALE O7

23 A14 E/ES

24 A13 CP

25 A12 ALE

26 A11 NC

27 A10 A14

28 VCC A13

29 --- A12

30 --- A11

31 --- A10

32 --- VCC

FIGURE 1. Terminal connections.

Read modes

Mode A14-A0 E/ES CP ALE OUTPUTS

Read A14-A0 VIL VIH VIL O7-O0

Output Disable A14-A0 VIH X X HIGH Z

NOTE:

1. X can be VIL or VIH

FIGURE 2. Truth table.

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Circuit A Circuit B

Output load Output load for tHZC and tHZE

NOTE: Including scope and jig (minimum values).

Circuit

Load A B

R1 658 658

R2 403 403

CL 30 5

AC test conditions

Input pulse levels GND to 3.0 V

Input rise and fall times ≤ 5 ns

Input timing reference levels 1.5 V

Output reference levels 1.5 V

FIGURE 3. Output load circuit and test conditions.

SEE NOTE SEE NOTE

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FIGURE 4. Switching waveforms.

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4. VERIFICATION

4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with

MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan

shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in

accordance with MIL-PRF-38535, appendix A.

4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted

on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in

accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.

4.2.1 Additional criteria for device class M.

a. Burn-in test, method 1015 of MIL-STD-883.

(1) Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control

and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method

1015.

(2) TA = +125°C, minimum.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

4.2.2 Additional criteria for device classes Q and V.

a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the

device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under

document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall

specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in

method 1015 of MIL-STD-883.

b. Interim and final electrical test parameters shall be as specified in table IIA herein.

c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in

MIL-PRF-38535, appendix B.

4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in

accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups

A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).

4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with

MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein. Quality conformance inspection for

device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed

for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections

(see 4.4.1 through 4.4.4).

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4.4.1 Group A inspection.

a. Tests shall be as specified in table IIA herein.

b. Subgroups 5 and 6 in table I, method

c. Subgroup 4 (CIN and COUT measurements) shall be measured only for the initial test and after process or design

changes which may affect capacitance. Capacitance shall be measured between the designated terminal and GND at

a frequency of 1 MHz. Sample size is 15 devices with no failures, and all input and output terminals tested.

d. For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table. For device classes Q and V,

subgroups 7 and 8 shall include verifying the functionality of the device.

e. O/V (latch-up) tests shall be measured only for initial qualification and after any design or process changes which may

affect the performance of the device. For device class M, procedures and circuits shall be maintained under document

revision level control by the manufacturer and shall be made available to the preparing activity or acquiring activity upon

request. For device classes Q and V, the procedures and circuits shall be under the control of the device

manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the preparing activity or

acquiring activity upon request. Testing shall be on all pins, on five devices with zero failures. Latch-up test shall be

considered destructive. Information contained in JEDEC Standard EIA/JESD 78 may be used for reference.

f. All devices selected for testing shall be programmed with a checkerboard pattern, or equivalent. After completion of all

testing, the devices shall be erased and verified except devices being submitted to groups B, C, and D testing.

4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.

4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:

a. Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and

shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,

outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-

STD-883.

b. TA = +125°C, minimum.

c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.

4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,

or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The

test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with

MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the

inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-

883.

4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.

4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured

(see 3.5 herein).

a. End-point electrical parameters shall be as specified in table IIA herein.

b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as

specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to

radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device

classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25°C ±5°C,

after exposure, to the subgroups specified in table IIA herein.

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TABLE IIA. Electrical test requirements. 1/, 2/, 3/, 4/, 5/, 6/

Subgroups

(in accordance with

MIL-STD-883,

method 5005, table I)

Subgroups

(per MIL-PRF-38535,

table III)

Line

No. Test

Requirements

Device class M Device class Q Device class V

1 Interim electrical

Parameters (see 4.2) 1, 7, 9

2 Static burn-in I

method 1015 Not required Not required Required

3 Same as line 1 1*, 7* ∆

4 Dynamic burn-in

(method 1015) Required Required Required

5 Same as line 1 1*, 7* ∆

6 Final electrical

Parameters

(programmed devices)

1*, 2, 3, 7*, 8A, 8B, 9,

10, 11 1*, 2, 3, 7*, 8A,

8B, 9, 10, 11 1*, 2, 3, 7*, 8A,

8B, 9, 10, 11

6A Final electrical

Parameters

(unprogrammed devices)

1*, 2, 3, 7*, 8A, 8B 1*, 2, 3, 7*, 8A,

8B 1*, 2, 3, 7*, 8A,

8B

7 Group A test

Requirements 1, 2, 3, 4**, 7, 8A, 8B,

9, 10, 11 1, 2, 3, 4**, 7,

8A, 8B, 9, 10,

11

1, 2, 3, 4**, 7,

8A, 8B, 9, 10, 11

8 Group C end-point

electrical parameters 2, 3, 7, 8A, 8B 1, 2, 3, 7, 8A,

8B 1, 2, 3, 7, 8A,

8B, 9, 10, 11 ∆

9 Group D end-point

electrical parameters 2, 3, 8A, 8B 2, 3, 8A, 8B 2, 3, 8A, 8B

10 Group E end-point

electrical parameters 1, 7, 9 1, 7, 9 1, 7, 9

1

/ Blank spaces indicate tests are not applicable.

2

/ Any or all subgroups may be combined when using high-speed testers.

3

/ * indicates PDA applies to subgroup 1 and 7.

4

/ ** see 4.4.1c.

5

/ ∆ indicates delta limit (see table IIB) shall be required where specified, and the delta

values shall be computed with reference to the previous interim electrical parameters (line 1).

6

/ See 4.4.1e.

TABLE IIB. Delta limits at +25°C.

Device types Test 1/ All

IIX ±10 percent of specified

value in table I

IOZ ±10 percent of specified

value in table I

1/ The above parameter shall be recorded

before and after the required burn-in and

life tests to determine the delta.

STANDARD

MICROCIRCUIT DRAWING

SIZE

A

5962-91744

DEFENSE SUPPLY CENTER COLUMBUS

COLUMBUS, OHIO 43218-3990 REVISION LEVEL

B SHEET 14

DSCC FORM 2234

APR 97

4.5 Programming procedure. The programming procedures shall be as specified by the device manufacturer and shall be

made available upon request.

4.6 Delta measurements for device class V. Delta measurements, as specified in table IIA, shall be made and recorded

before and after the required burn-in screens and steady-state life tests to determine delta compliance. The electrical

parameters to be measured, with associated delta limits are listed in table IIB. The device manufacturer may, at his option,

either perform delta measurements or within 24 hours after burn-in perform final electrical parameter tests, subgroups 1, 7, and

9.

5. PACKAGING

5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes

Q and V or MIL-PRF-38535, appendix A for device class M.

6. NOTES

6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications

(original equipment), design applications, and logistics purposes.

6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor

prepared specification or drawing.

6.1.2 Substitutability. Device class Q devices will replace device class M devices.

6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for

the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.

6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus (DSCC) when a system

application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users

and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic

devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0544.

6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43218-3990, or telephone

(614) 692-0547.

6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in

MIL-PRF-38535 and MIL-HDBK-1331.

C

IN......................................................Input terminal capacitance.

C

OUT ...................................................Output terminal capacitance.

GND...................................................Ground zero voltage potential.

I

CC ......................................................Supply current.

I

IX........................................................Input current.

I

OZ ......................................................Output current.

T

C.......................................................Case temperature.

V

CC.....................................................Positive supply voltage.

6.6 Sources of supply.

6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535.

The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to

this drawing.

6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103.

The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been

submitted to and accepted by DSCC-VA.

STANDARD MICROCIRCUIT DRAWING BULLETIN

DATE: 06-10-02

Approved sources of supply for SMD 5962-91744 are listed below for immediate acquisition information only and shall

be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised

to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate

of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded by the next

dated revision of MIL-HDBK-103 and QML-38535. DSCC maintains an online database of all current sources of

supply at http://www.dscc.dla.mil/Programs/Smcr/.

Standard

microcircuit drawing

PIN 1/

Vendor

CAGE

number

Vendor

similar

PIN 2/

5962-9174401MXA 0C7V7 CY7C277-50WMB

5962-9174401MYA 0C7V7 CY7C277-50QMB

5962-9174401MZA 0C7V7 CY7C277-50TMB

5962-9174402MXA 0C7V7 CY7C277-40WMB

5962-9174402MYA 0C7V7 CY7C277-40QMB

5962-9174402MZA 0C7V7 CY7C277-40TMB

1/ The lead finish shown for each PIN representing

a hermetic package is the most readily available

from the manufacturer listed for that part. If the

desired lead finish is not listed contact the vendor

to determine its availability.

2/ Caution. Do not use this number for item

acquisition. Items acquired to this number may not

satisfy the performance requirements of this drawing.

Vendor CAGE Vendor name

number and address

0C7V7 QP Semiconductor

2945 Oakmead Village Court

Santa Clara, CA 95051

The information contained herein is disseminated for convenience only and the

Government assumes no liability whatsoever for any inaccuracies in the

information bulletin.