Philips Semiconductors Product Specification Rev 3.1 October 2004
Flip Chip Package Specification MF1 FCP2 S50
4 PUBLIC
2 SPECIFICATIONS
2.1 Integrated Circuit
Functionality of the integrated circuit is described in the MF1 IC S50 Functional Specification.
2.2 Absolute Maximum Ratings
ABSOLUTE MAXIMUM RATINGS
1, 2
TEST CONDITIONS MIN TYP
1
MAX UNIT
Operating Temperature -25 - +70 °C
ESD Voltage Immunity
MIL-STD-883-C, Method
3015, Human Body Model
C= 100 pF, R = 1.5kς
2 - - kV
peak
Input Current
- - 30 mA
Storage and Processing temperature: refer to specification “FCP2 Flip Chip Package”
NOTES:
1. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any conditions other than those described in the Operating Conditions and
Electrical Characteristics section of this specification is not implied.
2. This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of excessive
static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater than the rated maxima.
2.3 Electrical Characteristics
T
jop
= - 25 to +70 °C
SYMBOL
PARAMETER TEST
CONDITIONS MIN TYP
1
MAX UNIT
f
IN
input frequency - 13.56 - MHz
C
in
Input Capacitance between LA - LB
2
22°C, Cp-D, 13.56
MHz, 2 V 14.85 20.13 pF
t
W
EEPROM write time - 2.9 - ms
t
ret
EEPROM Data Retention 10 - - Years
n
write
EEPROM Write Endurance 10
5
- - Cycles
NOTES:
1. Typical ratings are not guaranteed. These values listed are at room temperature.
2. Measured with an HP4258 LCR meter at 13.56 MHz.