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ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. FDMS86550 N-Channel PowerTrench(R) MOSFET 60 V, 234 A, 1.65 m Features General Description This N-Channel MOSFET is produced using Fairchild Semiconductor's advanced PowerTrench(R) process that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance. Max rDS(on) = 1.65 m at VGS = 10 V, ID = 32 A Max rDS(on) = 2.2 m at VGS = 8 V, ID = 27 A Advanced Package and Silicon combination for low rDS(on) and high efficiency MSL1 robust package design Applications 100% UIL tested Primary DC-DC MOSFET RoHS Compliant Secondary Synchronous Rectifier Load Switch Bottom Top S Pin 1 D D D S S Pin 1 S D G S D S D G D D Power 56 MOSFET Maximum Ratings TA = 25 C unless otherwise noted Symbol VDS Drain to Source Voltage Parameter VGS Gate to Source Voltage Drain Current -Continuous ID TC = 25 C -Continuous TC = 100 C -Continuous TA = 25 C -Pulsed Single Pulse Avalanche Energy EAS PD TJ, TSTG TC = 25 C Power Dissipation TA = 25 C Units V 20 V (Note 5) 234 (Note 5) 148 (Note 1a) 32 (Note 4) 1021 (Note 3) Power Dissipation Ratings 60 937 156 (Note 1a) Operating and Storage Junction Temperature Range 2.7 -55 to +150 A mJ W C Thermal Characteristics RJC Thermal Resistance, Junction to Case RJA Thermal Resistance, Junction to Ambient 0.8 (Note 1a) 45 C/W Package Marking and Ordering Information Device Marking FDMS86550 Device FDMS86550 (c)2013 Fairchild Semiconductor Corporation FDMS86550 Rev.1.7 Package Power 56 Reel Size 13 '' 1 Tape Width 12 mm Quantity 3000 units www.fairchildsemi.com FDMS86550 N-Channel PowerTrench(R) MOSFET March 2015 Symbol Parameter Test Conditions Min Typ Max Units Off Characteristics BVDSS Drain to Source Breakdown Voltage ID = 250 A, VGS = 0 V BVDSS TJ Breakdown Voltage Temperature Coefficient ID = 250 A, referenced to 25 C IDSS Zero Gate Voltage Drain Current VDS = 48 V, VGS = 0 V 1 A IGSS Gate to Source Leakage Current VGS = 20 V, VDS = 0 V 100 nA 4.5 V 60 V 31 mV/C On Characteristics VGS(th) Gate to Source Threshold Voltage VGS = VDS, ID = 250 A VGS(th) TJ Gate to Source Threshold Voltage Temperature Coefficient ID = 250 A, referenced to 25 C VGS = 10 V, ID = 32 A 1.4 1.65 rDS(on) Static Drain to Source On Resistance VGS = 8 V, ID = 27 A 1.7 2.2 VGS = 10 V, ID = 32 A, TJ = 125 C 2.2 2.6 VDS = 5 V, ID = 32 A 96 gFS Forward Transconductance 2.5 3.3 -12 mV/C m S Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance Rg Gate Resistance VDS = 30 V, VGS = 0 V, f = 1 MHz 0.1 8235 11530 pF 2140 3000 pF 70 120 pF 0.9 2.7 ns Switching Characteristics td(on) Turn-On Delay Time 43 69 tr Rise Time 43 ns td(off) Turn-Off Delay Time VDD = 30 V, ID = 32 A, VGS = 10 V, RGEN = 6 27 42 67 ns tf Fall Time 11 20 ns Qg Total Gate Charge VGS = 0 V to 10 V 110 154 nC VGS = 0 V to 8 V 90 126 Qg Total Gate Charge Qgs Gate to Source Charge Qgd Gate to Drain "Miller" Charge VDD = 30 V, ID = 32 A nC 40 nC 20 nC Drain-Source Diode Characteristics VSD Source to Drain Diode Forward Voltage trr Reverse Recovery Time Qrr Reverse Recovery Charge VGS = 0 V, IS = 2.1 A (Note 2) 0.7 1.2 VGS = 0 V, IS = 32 A (Note 2) 0.8 1.3 68 109 ns 62 99 nC IF = 32 A, di/dt = 100 A/s V Notes: 1. RJA is determined with the device mounted on a 1 in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RCA is determined by the user's board design. a. 45 C/W when mounted on a 1 in2 pad of 2 oz copper. b. 115 C/W when mounted on a minimum pad of 2 oz copper. SS SF DS DF G SS SF DS DF G 2. Pulse Test: Pulse Width < 300 s, Duty cycle < 2.0%. 3. EAS of 937 mJ is based on starting TJ = 25 C, L = 3 mH, IAS = 25 A, VDD = 60 V, VGS = 10 V. 100% test at L = 0.1 mH, IAS = 79 A. 4. Pulsed Id please refer to Fig 11 SOA graph for more details. 5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design. (c)2013 Fairchild Semiconductor Corporation FDMS86550 Rev.1.7 2 www.fairchildsemi.com FDMS86550 N-Channel PowerTrench(R) MOSFET Electrical Characteristics TJ = 25 C unless otherwise noted 5 NORMALIZED DRAIN TO SOURCE ON-RESISTANCE ID, DRAIN CURRENT (A) 320 VGS = 10 V VGS = 8 V 240 VGS = 7 V VGS = 6.5 V 160 VGS = 6 V VGS = 5.5 V 80 PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX 0 0 1 2 3 4 VGS = 5.5 V 4 VGS = 6 V 3 VGS = 6.5 V VGS = 7 V 2 1 PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX 0 80 8 SOURCE ON-RESISTANCE (m) NORMALIZED DRAIN TO SOURCE ON-RESISTANCE ID = 32 A VGS = 10 V rDS(on), DRAIN TO 1.5 1.2 0.9 0 25 50 75 320 PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX ID = 32 A 6 4 TJ = 125 oC 2 TJ = 25 oC 0 100 125 150 4 TJ, JUNCTION TEMPERATURE (oC) 5 6 7 8 9 10 VGS, GATE TO SOURCE VOLTAGE (V) Figure 3. Normalized On- Resistance vs Junction Temperature Figure 4. On-Resistance vs Gate to Source Voltage 320 IS, REVERSE DRAIN CURRENT (A) 320 PULSE DURATION = 80 s DUTY CYCLE = 0.5% MAX 240 ID, DRAIN CURRENT (A) 240 Figure 2. Normalized On-Resistance vs Drain Current and Gate Voltage 1.8 -25 160 ID, DRAIN CURRENT (A) Figure 1. On-Region Characteristics -50 VGS = 10 V 0 5 VDS, DRAIN TO SOURCE VOLTAGE (V) 0.6 -75 VGS = 8 V VDS = 5 V 160 TJ = 150 oC TJ = 25 80 oC TJ = -55 oC 3 4 5 6 VGS = 0 V 10 TJ = 150 oC 1 TJ = 25 oC 0.1 TJ = -55 oC 0.01 0.001 0.0 0 2 100 7 0.2 0.4 0.6 0.8 1.0 VGS, GATE TO SOURCE VOLTAGE (V) VSD, BODY DIODE FORWARD VOLTAGE (V) Figure 5. Transfer Characteristics Figure 6. Source to Drain Diode Forward Voltage vs Source Current (c)2013 Fairchild Semiconductor Corporation FDMS86550 Rev.1.7 3 1.2 www.fairchildsemi.com FDMS86550 N-Channel PowerTrench(R) MOSFET Typical Characteristics TJ = 25 C unless otherwise noted 20000 Ciss 10000 ID = 32 A 8 VDD = 20 V CAPACITANCE (pF) VGS, GATE TO SOURCE VOLTAGE (V) 10 VDD = 30 V 6 VDD = 40 V 4 Coss 1000 Crss 100 2 f = 1 MHz VGS = 0 V 0 0 30 60 90 10 0.1 120 1 10 60 VDS, DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC) Figure 7. Gate Charge Characteristics Figure 8. Capacitance vs Drain to Source Voltage 250 100 o ID, DRAIN CURRENT (A) IAS, AVALANCHE CURRENT (A) RJC = 0.8 C/W TJ = 25 oC 10 TJ = 100 oC TJ = 125 oC 1 0.01 0.1 1 10 100 200 VGS = 10 V 150 VGS = 8 V 100 50 0 25 1000 75 100 125 150 TC, CASE TEMPERATURE ( C) Figure 9. Unclamped Inductive Switching Capability Figure 10. Maximum Continuous Drain Current vs Case Temperature 2000 1000 5000 P(PK), PEAK TRANSIENT POWER (W) ID, DRAIN CURRENT (A) 50 o tAV, TIME IN AVALANCHE (ms) 10 s 100 SINGLE PULSE RJC = 0.8 oC/W TC = 25 oC 1000 10 1 THIS AREA IS LIMITED BY rDS(on) 1 ms SINGLE PULSE TJ = MAX RATED RJC = 0.8 oC/W TC = 25 oC 0.1 0.1 100 s 10 ms CURVE BENT TO MEASURED DATA 1 10 DC 100 200 -3 10 -2 10 -1 10 1 t, PULSE WIDTH (sec) VDS, DRAIN to SOURCE VOLTAGE (V) Figure 11. Forward Bias Safe Operating Area (c)2013 Fairchild Semiconductor Corporation FDMS86550 Rev.1.7 100 -4 10 Figure 12. Single Pulse Maximum Power Dissipation 4 www.fairchildsemi.com FDMS86550 N-Channel PowerTrench(R) MOSFET Typical Characteristics TJ = 25 C unless otherwise noted r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 2 1 DUTY CYCLE-DESCENDING ORDER D = 0.5 0.2 0.1 0.05 0.02 0.01 PDM t1 0.1 t2 NOTES: ZJC(t) = r(t) x RJC SINGLE PULSE 0.01 -4 10 RJC = 0.8 C/W Peak TJ = PDM x ZJC(t) + TC Duty Cycle, D = t1 / t2 -3 -2 10 10 -1 10 1 t, RECTANGULAR PULSE DURATION (sec) Figure 13. Transient Thermal Response Curve (c)2013 Fairchild Semiconductor Corporation FDMS86550 Rev.1.7 5 www.fairchildsemi.com FDMS86550 N-Channel PowerTrench(R) MOSFET Typical Characteristics TJ = 25 C unless otherwise noted 5.10 4.90 A 3.81 PKG CL 8 4.42 B 5 8 7 6 5 1.14 KEEP OUT AREA 3.65 6.25 5.90 PKG CL 6.61 4.79 1.27 1 PIN #1 IDICATOR 4 TOP VIEW 1 2 3 4 1.27 SEE DETAIL A 0.61 3.81 5.10 LAND PATTERN RECOMMENDATION SIDE VIEW 3.81 0.10 1.27 (0.38) 1 C A B 0.47 (8X) 0.37 4 (0.35) 0.65 0.55 PIN #1 INDICATOR 4.66 4.46 8 5 4.33 4.13 0.70 BOTTOM VIEW 0.10 C 1.10 0.90 0.08 C C 0.25 0.15 SCALE: 2:1 0.05 0.00 SEATING PLANE NOTES: UNLESS OTHERWISE SPECIFIED A) PACKAGE STANDARD REFERENCE: JEDEC MO-240, ISSUE A, VAR. AA, B) ALL DIMENSIONS ARE IN MILLIMETERS. C) DIMENSIONS DO NOT INCLUDE BURRS OR MOLD FLASH. MOLD FLASH OR BURRS DOES NOT EXCEED 0.10MM. D) DIMENSIONING AND TOLERANCING PER ASME Y14.5M-2009. E) IT IS RECOMMENDED TO HAVE NO TRACES OR VIAS WITHIN THE KEEP OUT AREA. F) DRAWING FILE NAME: PQFN08JREV3. ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor's product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. "Typical" parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including "Typicals" must be validated for each customer application by customer's technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 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