EP1K10-2-TQFP144 - Altera Corporation

Altera Corporation 1

ACEX 1K

Programmable Logic Device Family

September 2001, ver. 3.3 Data Sheet

A-DS-ACEX-3.3

Development

Tools

Features...

■

Programmable logic devices (PLDs), providing low cost

system-on-a-programmable-chip (SOPC) integration in a single

device

– Enhanced embedded array for implementing megafunctions

such as efficient memory and specialized logic functions

– Dual-port capability with up to 16-bit width per embedded array

block (EAB)

– Logic array for general logic functions

■

High density

– 10,000 to 100,000 typical gates (see Table 1)

– Up to 49,152 RAM bits (4,096 bits per EAB, all of which can be

used without reducing logic capacity)

■

Cost-efficient programmable architecture for high-volume

applications

– Cost-optimized process

– Low cost solution for high-performance communications

applications

■

System-level features

– MultiVolt

I/O pins can drive or be driven by 2.5-V, 3.3-V, or

5.0-V devices

– Low power consumption

– Bidirectional I/O performance (setup time [

] and clock-to-

output delay [

]) up to 250 MHz

– Fully compliant with the peripheral component interconnect

Special Interest Group (PCI SIG)

PCI Local Bus Specification,

Revision 2.2

for 3.3-V operation at 33 MHz or 66 MHz

Table 1. ACEX

1K Device Features

Feature EP1K10 EP1K30 EP1K50 EP1K100

Typical gates 10,000 30,000 50,000 100,000

Maximum system gates 56,000 119,000 199,000 257,000

Logic elements (LEs) 576 1,728 2,880 4,992

EABs 3 6 10 12

Total RAM bits 12,288 24,576 40,960 49,152

Maximum user I/O pins 136 171 249 333

2 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

...and More

Features

– -1 speed grade devices are compliant with

PCI Local Bus

Specification, Revision 2.2

for 5.0-V operation

– Built-in Joint Test Action Group (JTAG) boundary-scan test

(BST) circuitry compliant with IEEE Std. 1149.1-1990, available

without consuming additional device logic.

– Operate with a 2.5-V internal supply voltage

– In-circuit reconfigurability (ICR) via external configuration

devices, intelligent controller, or JTAG port

– ClockLock

and ClockBoost

options for reduced clock delay,

clock skew, and clock multiplication

– Built-in, low-skew clock distribution trees

– 100

functional testing of all devices; test vectors or scan chains

are not required

– Pull-up on I/O pins before and during configuration

■

Flexible interconnect

– FastTrack

Interconnect continuous routing structure for fast,

predictable interconnect delays

– Dedicated carry chain that implements arithmetic functions such

as fast adders, counters, and comparators (automatically used by

software tools and megafunctions)

– Dedicated cascade chain that implements high-speed,

high-fan-in logic functions (automatically used by software tools

and megafunctions)

– Tri-state emulation that implements internal tri-state buses

– Up to six global clock signals and four global clear signals

■

Powerful I/O pins

– Individual tri-state output enable control for each pin

– Open-drain option on each I/O pin

– Programmable output slew-rate control to reduce switching

noise

– Clamp to V

CCIO

user-selectable on a pin-by-pin basis

– Supports hot-socketing

Altera Corporation 3

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

■

Software design support and automatic place-and-route provided by

Altera development systems for Windows-based PCs and Sun

SPARCstation, and HP 9000 Series 700/800 workstations

■

Flexible package options are available in 100 to 484 pins, including

the innovative FineLine BGA

packages (see Tables 2 and 3)

■

Additional design entry and simulation support provided by EDIF

2 0 0 and 3 0 0 netlist files, library of parameterized modules (LPM),

DesignWare components, Verilog HDL, VHDL, and other interfaces

to popular EDA tools from manufacturers such as Cadence,

Exemplar Logic, Mentor Graphics, OrCAD, Synopsys, Synplicity,

VeriBest, and Viewlogic

Notes:

(1) ACEX 1K device package types include thin quad flat pack (TQFP), plastic quad flat pack (PQFP), and FineLine

BGA packages.

(2) Devices in the same package are pin-compatible, although some devices have more I/O pins than others. When

planning device migration, use the I/O pins that are common to all devices.

(3) This option is supported with a 256-pin FineLine BGA package. By using SameFrame

pin migration, all FineLine

BGA packages are pin-compatible. For example, a board can be designed to support 256-pin and 484-pin FineLine

BGA packages.

Table 2. ACEX 1K Package Options & I/O Pin Count

Notes (1), (2)

Device 100-Pin TQFP 144-Pin TQFP 208-Pin PQFP 256-Pin

FineLine BGA 484-Pin

FineLine BGA

EP1K10 66 92 120 136 136

(3)

EP1K30 102 147 171 171

(3)

EP1K50 102 147 186 249

EP1K100 147 186 333

Table 3. ACEX 1K Package Sizes

Device 100-Pin TQFP 144-Pin TQFP 208-Pin PQFP 256-Pin

FineLine BGA 484-Pin

FineLine BGA

Pitch (mm) 0.50 0.50 0.50 1.0 1.0

Area (mm

) 256 484 936 289 529

Length

width

(mm

mm) 16

16 22

22 30.6

30.6 17

17 23

4 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

General

Description

Altera

ACEX 1K devices provide a die-efficient, low-cost architecture by

combining look-up table (LUT) architecture with EABs. LUT-based logic

provides optimized performance and efficiency for data-path, register

intensive, mathematical, or digital signal processing (DSP) designs, while

EABs implement RAM, ROM, dual-port RAM, or first-in first-out (FIFO)

functions. These elements make ACEX 1K suitable for complex logic

functions and memory functions such as digital signal processing, wide

data-path manipulation, data transformation and microcontrollers, as

required in high-performance communications applications. Based on

reconfigurable CMOS SRAM elements, the ACEX 1K architecture

incorporates all features necessary to implement common gate array

megafunctions, along with a high pin count to enable an effective interface

with system components. The advanced process and the low voltage

requirement of the 2.5-V core allow ACEX 1K devices to meet the

requirements of low-cost, high-volume applications ranging from DSL

modems to low-cost switches.

The ability to reconfigure ACEX 1K devices enables complete testing prior

to shipment and allows the designer to focus on simulation and design

verification. ACEX 1K device reconfigurability eliminates inventory

management for gate array designs and test vector generation for fault

coverage.

Table 4 shows ACEX 1K device performance for some common designs.

All performance results were obtained with Synopsys DesignWare or

LPM functions. Special design techniques are not required to implement

the applications; the designer simply infers or instantiates a function in a

Verilog HDL, VHDL, Altera Hardware Description Language (AHDL), or

schematic design file.

Notes:

(1) This application uses combinatorial inputs and outputs.

(2) This application uses registered inputs and outputs.

Table 4. ACEX 1K Device Performance

Application Resources

Used Performance

LEs EABs Speed Grade Units

-1 -2 -3

16-bit loadable counter 16 0 285 232 185 MHz

16-bit accumulator 16 0 285 232 185 MHz

16-to-1 multiplexer

(1)

10 0 3.5 4.5 6.6 ns

16-bit multiplier with 3-stage pipeline

(2)

592 0 156 131 93 MHz

256

16 RAM read cycle speed

(2)

0 1 278 196 143 MHz

256

16 RAM write cycle speed

(2)

0 1 185 143 111 MHz

Altera Corporation 5

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Table 5 shows ACEX 1K device performance for more complex designs.

These designs are available as Altera MegaCore

functions.

Each ACEX 1K device contains an embedded array and a logic array. The

embedded array is used to implement a variety of memory functions or

complex logic functions, such as digital signal processing (DSP), wide

data-path manipulation, microcontroller applications, and data-

transformation functions. The logic array performs the same function as

the sea-of-gates in the gate array and is used to implement general logic

such as counters, adders, state machines, and multiplexers. The

combination of embedded and logic arrays provides the high

performance and high density of embedded gate arrays, enabling

designers to implement an entire system on a single device.

ACEX 1K devices are configured at system power-up with data stored in

an Altera serial configuration device or provided by a system controller.

Altera offers EPC16, EPC2, EPC1, and EPC1441 configuration devices,

which configure ACEX 1K devices via a serial data stream. Configuration

data can also be downloaded from system RAM or via the Altera

MasterBlaster

, ByteBlasterMV

, or BitBlaster

download cables.

After an ACEX 1K device has been configured, it can be reconfigured in-

circuit by resetting the device and loading new data. Because

reconfiguration requires less than 40 ms, real-time changes can be made

during system operation.

ACEX 1K devices contain an interface that permits microprocessors to

configure ACEX 1K devices serially or in parallel, and synchronously or

asynchronously. The interface also enables microprocessors to treat an

ACEX 1K device as memory and configure it by writing to a virtual

memory location, simplifying device reconfiguration.

Table 5. ACEX 1K Device Performance for Complex Designs

Application LEs

Used Performance

Speed Grade Units

-1 -2 -3

16-bit, 8-tap parallel finite impulse response (FIR)

filter 597 192 156 116 MSPS

8-bit, 512-point Fast Fourier transform (FFT)

function 1,854 23.4 28.7 38.9

113 92 68 MHz

a16450

universal asynchronous

receiver/transmitter (UART) 342 36 28 20.5 MHz

6 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

For more information on the configuration of ACEX 1K devices, see the

following documents:

■

Configuration Devices for ACEX, APEX, FLEX, & Mercury Devices Data

Sheet

■

MasterBlaster Serial/USB Communications Cable Data Sheet

■

ByteBlasterMV Parallel Port Download Cable Data Sheet

■

BitBlaster Serial Download Cable Data Sheet

ACEX 1K devices are supported by Altera development systems, which

are integrated packages that offer schematic, text (including AHDL), and

waveform design entry, compilation and logic synthesis, full simulation

and worst-case timing analysis, and device configuration. The software

provides EDIF 2 0 0 and 3 0 0, LPM, VHDL, Verilog HDL, and other

interfaces for additional design entry and simulation support from other

industry-standard PC- and UNIX workstation-based EDA tools.

The Altera software works easily with common gate array EDA tools for

synthesis and simulation. For example, the Altera software can generate

Verilog HDL files for simulation with tools such as Cadence Verilog-XL.

Additionally, the Altera software contains EDA libraries that use device-

specific features such as carry chains, which are used for fast counter and

arithmetic functions. For instance, the Synopsys Design Compiler library

supplied with the Altera development system includes DesignWare

functions that are optimized for the ACEX 1K device architecture.

The Altera development systems run on Windows-based PCs and Sun

SPARCstation, and HP 9000 Series 700/800 workstations.

For more information, see the

MAX+PLUS II Programmable Logic

Development System & Software Data Sheet

and the

Quartus Programmable

Logic Development System & Software Data Sheet

Functional

Description

Each ACEX 1K device contains an enhanced embedded array that

implements memory and specialized logic functions, and a logic array

that implements general logic.

The embedded array consists of a series of EABs. When implementing

memory functions, each EAB provides 4,096 bits, which can be used to

create RAM, ROM, dual-port RAM, or first-in first-out (FIFO) functions.

When implementing logic, each EAB can contribute 100 to 600 gates

towards complex logic functions such as multipliers, microcontrollers,

state machines, and DSP functions. EABs can be used independently, or

multiple EABs can be combined to implement larger functions.

Altera Corporation 7

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

The logic array consists of logic array blocks (LABs). Each LAB contains

eight LEs and a local interconnect. An LE consists of a 4-input LUT, a

programmable flipflop, and dedicated signal paths for carry and cascade

functions. The eight LEs can be used to create medium-sized blocks of

logic—such as 8-bit counters, address decoders, or state machines—or

combined across LABs to create larger logic blocks. Each LAB represents

about 96 usable logic gates.

Signal interconnections within ACEX 1K devices (as well as to and from

device pins) are provided by the FastTrack Interconnect routing structure,

which is a series of fast, continuous row and column channels that run the

entire length and width of the device.

Each I/O pin is fed by an I/O element (IOE) located at the end of each row

and column of the FastTrack Interconnect routing structure. Each IOE

contains a bidirectional I/O buffer and a flipflop that can be used as either

an output or input register to feed input, output, or bidirectional signals.

When used with a dedicated clock pin, these registers provide exceptional

performance. As inputs, they provide setup times as low as 1.1 ns and

hold times of 0 ns. As outputs, these registers provide clock-to-output

times as low as 2.5 ns. IOEs provide a variety of features, such as JTAG

BST support, slew-rate control, tri-state buffers, and open-drain outputs.

Figure 1 shows a block diagram of the ACEX 1K device architecture. Each

group of LEs is combined into an LAB; groups of LABs are arranged into

rows and columns. Each row also contains a single EAB. The LABs and

EABs are interconnected by the FastTrack Interconnect routing structure.

IOEs are located at the end of each row and column of the FastTrack

Interconnect routing structure.

8 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 1. ACEX 1K Device Block Diagram

ACEX 1K devices provide six dedicated inputs that drive the flipflops’

control inputs and ensure the efficient distribution of high-speed, low-

skew (less than 1.0 ns) control signals. These signals use dedicated routing

channels that provide shorter delays and lower skews than the FastTrack

Interconnect routing structure. Four of the dedicated inputs drive four

global signals. These four global signals can also be driven by internal

logic, providing an ideal solution for a clock divider or an internally

generated asynchronous clear signal that clears many registers in the

device.

I/O Element

(IOE)

Logic Array

Block (LAB)

Row

Interconnect

IOEIOE

IOE

Local Interconnect

IOEIOE

IOEIOE IOEIOE

IOEIOE

Logic Element (LE)

Column

Interconnect

IOE

EAB

Logic

Array

IOEIOE

IOEIOE IOEIOE

Embedded Array Block (EAB)

Embedded Array

IOE

Logic Array

IOE

Altera Corporation 9

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Embedded Array Block

The EAB is a flexible block of RAM, with registers on the input and output

ports, that is used to implement common gate array megafunctions.

Because it is large and flexible, the EAB is suitable for functions such as

multipliers, vector scalars, and error correction circuits. These functions

can be combined in applications such as digital filters and

microcontrollers.

Logic functions are implemented by programming the EAB with a read-

only pattern during configuration, thereby creating a large LUT. With

LUTs, combinatorial functions are implemented by looking up the results

rather than by computing them. This implementation of combinatorial

functions can be faster than using algorithms implemented in general

logic, a performance advantage that is further enhanced by the fast access

times of EABs. The large capacity of EABs enables designers to implement

complex functions in a single logic level without the routing delays

associated with linked LEs or field-programmable gate array (FPGA)

RAM blocks. For example, a single EAB can implement any function with

8 inputs and 16 outputs. Parameterized functions, such as LPM functions,

can take advantage of the EAB automatically.

The ACEX 1K enhanced EAB supports dual-port RAM. The dual-port

structure is ideal for FIFO buffers with one or two clocks. The ACEX 1K

EAB can also support up to 16-bit-wide RAM blocks. The ACEX 1K EAB

can act in dual-port or single-port mode. When in dual-port mode,

separate clocks may be used for EAB read and write sections, allowing the

EAB to be written and read at different rates. It also has separate

synchronous clock enable signals for the EAB read and write sections,

which allow independent control of these sections.

The EAB can also be used for bidirectional, dual-port memory

applications where two ports read or write simultaneously. To implement

this type of dual-port memory, two EABs are used to support two

simultaneous reads or writes.

Alternatively, one clock and clock enable can be used to control the input

registers of the EAB, while a different clock and clock enable control the

output registers (see Figure 2).

10 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 2. ACEX 1K Device in Dual-Port RAM Mode

Note (1)

Notes:

(1) All registers can be asynchronously cleared by EAB local interconnect signals, global signals, or the chip-wide reset.

(2) EP1K10, EP1K30, and EP1K50 devices have 88 EAB local interconnect channels; EP1K100 devices have 104 EAB

local interconnect channels.

The EAB can use Altera megafunctions to implement dual-port RAM

applications where both ports can read or write, as shown in Figure 3. The

ACEX 1K EAB can also be used in a single-port mode (see Figure 4).

Column Interconnect

EAB Local

Interconnect (2)

Dedicated Clocks

ENA Q

ENA

ENA Q

ENA

data[ ]

rdaddress[ ]

wraddress[ ]

RAM/ROM

256 × 16

512 × 8

1,024 × 4

2,048 × 2

Data In

Read Address

Write Address

Read Enable

Write Enable

Data Out

4, 8, 16, 32

outclocken

inclocken

inclock

outclock

ENA Q

Write

Pulse

Generator

rden

wren

Multiplexers allow read

address and read

enable registers to be

clocked by inclock or

outclock signals.

Row Interconnect

4, 8

Dedicated Inputs &

Global Signals

Altera Corporation 11

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Figure 3. ACEX 1K EAB in Dual-Port RAM Mode

Figure 4. ACEX 1K Device in Single-Port RAM Mode

Note:

(1) EP1K10, EP1K30, and EP1K50 devices have 88 EAB local interconnect channels; EP1K100 devices have 104 EAB

local interconnect channels.

Port A Port B

address_a[] address_b[]

data_a[] data_b[]

we_a we_b

clkena_a clkena_b

Clock A Clock B

Column Interconnect

EAB Local

Interconnect (1)

Dedicated Inputs

& Global Signals

RAM/ROM

256 × 16

512 × 8

1,024 × 4

2,048 × 2

Data In

Address

Write Enable

Data Out

4, 8, 16, 32

8, 4, 2, 1

8, 9, 10, 11

Row Interconnect

Dedicated

Clocks

4, 8

Chip-Wide

Reset

12 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

EABs can be used to implement synchronous RAM, which is easier to use

than asynchronous RAM. A circuit using asynchronous RAM must

generate the RAM write enable signal, while ensuring that its data and

address signals meet setup and hold time specifications relative to the

write enable signal. In contrast, the EAB’s synchronous RAM generates its

own write enable signal and is self-timed with respect to the input or write

clock. A circuit using the EAB’s self-timed RAM must only meet the setup

and hold time specifications of the global clock.

When used as RAM, each EAB can be configured in any of the following

sizes: 256

16; 512

8; 1,024

4; or 2,048

2. Figure 5 shows the ACEX 1K

EAB memory configurations.

Figure 5. ACEX 1K EAB Memory Conﬁgurations

Larger blocks of RAM are created by combining multiple EABs. For

example, two 256

16 RAM blocks can be combined to form a 256

block, and two 512

8 RAM blocks can be combined to form a

512

16 block. Figure 6 shows examples of multiple EAB combination.

Figure 6. Examples of Combining ACEX 1K EABs

256 × 16 512 × 8 1,024 × 4 2,048 × 2

512 × 8

256 × 16

256 × 32 512 × 16

Altera Corporation 13

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

If necessary, all EABs in a device can be cascaded to form a single RAM

block. EABs can be cascaded to form RAM blocks of up to 2,048 words

without impacting timing. Altera software automatically combines EABs

to meet a designer’s RAM specifications.

EABs provide flexible options for driving and controlling clock signals.

Different clocks and clock enables can be used for reading and writing to

the EAB. Registers can be independently inserted on the data input, EAB

output, write address, write enable signals, read address, and read enable

signals. The global signals and the EAB local interconnect can drive

write-enable, read-enable, and clock-enable signals. The global signals,

dedicated clock pins, and EAB local interconnect can drive the EAB clock

signals. Because the LEs drive the EAB local interconnect, the LEs can

control write-enable, read-enable, clear, clock, and clock-enable signals.

An EAB is fed by a row interconnect and can drive out to row and column

interconnects. Each EAB output can drive up to two row channels and up

to two column channels; the unused row channel can be driven by other

LEs. This feature increases the routing resources available for EAB

outputs (see Figures 2 and 4). The column interconnect, which is adjacent

to the EAB, has twice as many channels as other columns in the device.

Logic Array Block

An LAB consists of eight LEs, their associated carry and cascade chains,

LAB control signals, and the LAB local interconnect. The LAB provides

the coarse-grained structure to the ACEX 1K architecture, facilitating

efficient routing with optimum device utilization and high performance.

Figure 7 shows the ACEX 1K LAB.

14 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 7. ACEX 1K LAB

Notes:

(1) EP1K10, EP1K30, and EP1K50 devices have 22 inputs to the LAB local interconnect channel from the row; EP1K100

devices have 26.

(2) EP1K10, EP1K30, and EP1K50 devices have 30 LAB local interconnect channels; EP1K100 devices have 34.

Carry-In &

Cascade-In

LE1

LE8

LE2

LE3

LE4

LE5

LE6

LE7

Column

Interconnect

Row Interconnect

(1)

LAB Local

Interconnect (2)

Column-to-Row

Interconnect

Carry-Out &

Cascade-Out

LAB Control

Signals

See Figure 13

for details.

Dedicated Inputs &

Global Signals

428

Altera Corporation 15

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Each LAB provides four control signals with programmable inversion

that can be used in all eight LEs. Two of these signals can be used as

clocks, the other two can be used for clear/preset control. The LAB clocks

can be driven by the dedicated clock input pins, global signals, I/O

signals, or internal signals via the LAB local interconnect. The LAB preset

and clear control signals can be driven by the global signals, I/O signals,

or internal signals via the LAB local interconnect. The global control

signals are typically used for global clock, clear, or preset signals because

they provide asynchronous control with very low skew across the device.

If logic is required on a control signal, it can be generated in one or more

LEs in any LAB and driven into the local interconnect of the target LAB.

In addition, the global control signals can be generated from LE outputs.

Logic Element

The LE, the smallest unit of logic in the ACEX 1K architecture, has a

compact size that provides efficient logic utilization. Each LE contains a

4-input LUT, which is a function generator that can quickly compute any

function of four variables. In addition, each LE contains a programmable

flipflop with a synchronous clock enable, a carry chain, and a cascade

chain. Each LE drives both the local and the FastTrack Interconnect

routing structure. Figure 8 shows the ACEX 1K LE.

16 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 8. ACEX 1K Logic Element

The programmable flipflop in the LE can be configured for D, T, JK, or SR

operation. The clock, clear, and preset control signals on the flipflop can

be driven by global signals, general-purpose I/O pins, or any internal

logic. For combinatorial functions, the flipflop is bypassed and the LUT’s

output drives the LE’s output.

The LE has two outputs that drive the interconnect: one drives the local

interconnect, and the other drives either the row or column FastTrack

Interconnect routing structure. The two outputs can be controlled

independently. For example, the LUT can drive one output while the

improve LE utilization because the register and the LUT can be used for

unrelated functions.

The ACEX 1K architecture provides two types of dedicated high-speed

data paths that connect adjacent LEs without using local interconnect

paths: carry chains and cascade chains. The carry chain supports high-

speed counters and adders, and the cascade chain implements wide-input

functions with minimum delay. Carry and cascade chains connect all LEs

in a LAB and all LABs in the same row. Intensive use of carry and cascade

chains can reduce routing flexibility. Therefore, the use of these chains

should be limited to speed-critical portions of a design.

To LAB Local

Interconnect

Carry-In

Clock

Select

Carry-Out

Look-Up

Table

(LUT)

Clear/

Preset

Logic

Carry

Chain Cascade

Chain

Cascade-In

Cascade-Out

To FastTrack

Interconnect

Programmable

PRN

CLRN

ENA

data1

data2

data3

data4

labctrl1

labctrl2

labctrl4

labctrl3

Chip-Wide

Reset

Altera Corporation 17

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Carry Chain

The carry chain provides a very fast (as low as 0.2 ns) carry-forward

function between LEs. The carry-in signal from a lower-order bit drives

forward into the higher-order bit via the carry chain, and feeds into both

the LUT and the next portion of the carry chain. This feature allows the

ACEX 1K architecture to efficiently implement high-speed counters,

adders, and comparators of arbitrary width. Carry chain logic can be

created automatically by the compiler during design processing, or

manually by the designer during design entry. Parameterized functions,

such as LPM and DesignWare functions, automatically take advantage of

carry chains.

Carry chains longer than eight LEs are automatically implemented by

linking LABs together. For enhanced fitting, a long carry chain skips

alternate LABs in a row. A carry chain longer than one LAB skips either

from even-numbered LAB to even-numbered LAB, or from odd-

numbered LAB to odd-numbered LAB. For example, the last LE of the

first LAB in a row carries to the first LE of the third LAB in the row. The

carry chain does not cross the EAB at the middle of the row. For instance,

in the EP1K50 device, the carry chain stops at the eighteenth LAB, and a

new carry chain begins at the nineteenth LAB.

Figure 9 shows how an n-bit full adder can be implemented in n + 1 LEs

with the carry chain. One portion of the LUT generates the sum of two bits

using the input signals and the carry-in signal; the sum is routed to the

output of the LE. The register can be bypassed for simple adders or used

for an accumulator function. Another portion of the LUT and the carry

chain logic generates the carry-out signal, which is routed directly to the

carry-in signal of the next-higher-order bit. The final carry-out signal is

routed to an LE, where it can be used as a general-purpose signal.

18 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 9. ACEX 1K Carry Chain Operation (n-Bit Full Adder)

LUT

Carry Chain

LE1

Carry Chain

LE2

Carry Chain

Carry-Out

+ 1

Carry-In

LUT

Altera Corporation 19

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Cascade Chain

With the cascade chain, the ACEX 1K architecture can implement

functions that have a very wide fan-in. Adjacent LUTs can be used to

compute portions of the function in parallel; the cascade chain serially

connects the intermediate values. The cascade chain can use a logical AND

or logical OR (via De Morgan’s inversion) to connect the outputs of

adjacent LEs. With a delay as low as 0.6 ns per LE, each additional LE

provides four more inputs to the effective width of a function. Cascade

chain logic can be created automatically by the compiler during design

processing, or manually by the designer during design entry.

Cascade chains longer than eight bits are implemented automatically by

linking several LABs together. For easier routing, a long cascade chain

skips every other LAB in a row. A cascade chain longer than one LAB

skips either from even-numbered LAB to even-numbered LAB, or from

odd-numbered LAB to odd-numbered LAB (e.g., the last LE of the first

LAB in a row cascades to the first LE of the third LAB). The cascade chain

does not cross the center of the row (e.g., in the EP1K50 device, the cascade

chain stops at the eighteenth LAB, and a new one begins at the nineteenth

LAB). This break is due to the EAB’s placement in the middle of the row.

Figure 10 shows how the cascade function can connect adjacent LEs to

form functions with a wide fan-in. These examples show functions of 4n

variables implemented with n LEs. The LE delay is 1.3 ns; the cascade

chain delay is 0.6 ns. With the cascade chain, decoding a 16-bit address

requires 3.1 ns.

Figure 10. ACEX 1K Cascade Chain Operation

LE1

LUT

LE2

LUT

d[3..0]

d[7..4]

d[(4

n –

1)..(4

n –

4)]

d[3..0]

d[7..4]

LE1

LE2

LUT

AND Cascade Chain OR Cascade Chain

d[(4

n –

1)..(4

n –

4)]

20 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

LE Operating Modes

The ACEX 1K LE can operate in the following four modes:

■Normal mode

■Arithmetic mode

■Up/down counter mode

■Clearable counter mode

Each of these modes uses LE resources differently. In each mode, seven

available inputs to the LE—the four data inputs from the LAB local

interconnect, the feedback from the programmable register, and the

carry-in and cascade-in from the previous LE—are directed to different

destinations to implement the desired logic function. Three inputs to the

LE provide clock, clear, and preset control for the register. The Altera

software, in conjunction with parameterized functions such as LPM and

DesignWare functions, automatically chooses the appropriate mode for

common functions such as counters, adders, and multipliers. If required,

the designer can also create special-purpose functions that use a specific

LE operating mode for optimal performance.

The architecture provides a synchronous clock enable to the register in all

four modes. The Altera software can set DATA1 to enable the register

synchronously, providing easy implementation of fully synchronous

designs.

Figure 11 shows the ACEX 1K LE operating modes.

Altera Corporation 21

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Figure 11. ACEX 1K LE Operating Modes

ENA

PRN

CLRN

4-Input

LUT

Carry-In

Cascade-Out

Cascade-In

LE-Out to F astTr ack

Interconnect

LE-Out to Local

Interconnect

ENA

Normal Mode

PRN

CLRN

Cascade-Out

LE-Out

Cascade-In

3-Input

LUT

Carry-In

3-Input

LUT

Carry-Out

Arithmetic Mode

Up/Down Counter Mode

PRN

CLRN

3-Input

LUT

Carry-In Cascade-In

LE-Out

3-Input

LUT

Carry-Out

Cascade-Out

Clearable Counter Mode

PRN

CLRN

3-Input

LUT

Carry-In

LE-Out

3-Input

LUT

Carry-Out

Cascade-Out

ENA

data1

data4

data3

data2

data1

data2

data1 (ena)

data2 (u/d)

data4 (nload)

data3 (data)

data1 (ena)

data2 (nclr)

data4 (nload)

data3 (data)

22 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Normal Mode

The normal mode is suitable for general logic applications and wide

decoding functions that can take advantage of a cascade chain. In normal

mode, four data inputs from the LAB local interconnect and the carry-in

are inputs to a 4-input LUT. The compiler automatically selects the carry-

in or the DATA3 signal as one of the inputs to the LUT. The LUT output can

be combined with the cascade-in signal to form a cascade chain through

the cascade-out signal. Either the register or the LUT can be used to drive

both the local interconnect and the FastTrack Interconnect routing

structure at the same time.

The LUT and the register in the LE can be used independently (register

packing). To support register packing, the LE has two outputs; one drives

the local interconnect, and the other drives the FastTrack Interconnect

routing structure. The DATA4 signal can drive the register directly,

allowing the LUT to compute a function that is independent of the

registered signal; a 3-input function can be computed in the LUT, and a

fourth independent signal can be registered. Alternatively, a 4-input

function can be generated, and one of the inputs to this function can be

used to drive the register. The register in a packed LE can still use the clock

enable, clear, and preset signals in the LE. In a packed LE, the register can

drive the FastTrack Interconnect routing structure while the LUT drives

the local interconnect, or vice versa.

Arithmetic Mode

The arithmetic mode offers two 3-input LUTs that are ideal for

implementing adders, accumulators, and comparators. One LUT

computes a 3-input function; the other generates a carry output. As shown

in Figure 11, the first LUT uses the carry-in signal and two data inputs

from the LAB local interconnect to generate a combinatorial or registered

output. For example, in an adder, this output is the sum of three signals:

a, b, and carry-in. The second LUT uses the same three signals to generate

a carry-out signal, thereby creating a carry chain. The arithmetic mode

also supports simultaneous use of the cascade chain.

Up/Down Counter Mode

The up/down counter mode offers counter enable, clock enable,

synchronous up/down control, and data loading options. These control

signals are generated by the data inputs from the LAB local interconnect,

the carry-in signal, and output feedback from the programmable register.

Two 3-input LUTs are used; one generates the counter data, and the other

generates the fast carry bit. A 2-to-1 multiplexer provides synchronous

loading. Data can also be loaded asynchronously with the clear and preset

Altera Corporation 23

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Clearable Counter Mode

The clearable counter mode is similar to the up/down counter mode, but

it supports a synchronous clear instead of the up/down control. The clear

function is substituted for the cascade-in signal in the up/down counter

mode. Two 3-input LUTs are used; one generates the counter data, and

the other generates the fast carry bit. Synchronous loading is provided by

a 2-to-1 multiplexer. The output of this multiplexer is AND ed with a

synchronous clear signal.

Internal Tri-State Emulation

Internal tri-state emulation provides internal tri-states without the

limitations of a physical tri-state bus. In a physical tri-state bus, the

tri-state buffers’ output enable (OE) signals select which signal drives the

bus. However, if multiple OE signals are active, contending signals can be

driven onto the bus. Conversely, if no OE signals are active, the bus will

float. Internal tri-state emulation resolves contending tri-state buffers to a

low value and floating buses to a high value, thereby eliminating these

problems. The Altera software automatically implements tri-state bus

functionality with a multiplexer.

Clear & Preset Logic Control

Logic for the programmable register’s clear and preset functions is

controlled by the DATA3, LABCTRL1, and LABCTRL2 inputs to the LE. The

clear and preset control structure of the LE asynchronously loads signals

into a register. Either LABCTRL1 or LABCTRL2 can control the

asynchronous clear. Alternatively, the register can be set up so that

LABCTRL1 implements an asynchronous load. The data to be loaded is

driven to DATA3; when LABCTRL1 is asserted, DATA3 is loaded into the

During compilation, the compiler automatically selects the best control

signal implementation. Because the clear and preset functions are active-

low, the Compiler automatically assigns a logic high to an unused clear or

preset.

The clear and preset logic is implemented in one of the following six

modes chosen during design entry:

■Asynchronous clear

■Asynchronous preset

■Asynchronous clear and preset

■Asynchronous load with clear

■Asynchronous load with preset

■Asynchronous load without clear or preset

24 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

In addition to the six clear and preset modes, ACEX 1K devices provide a

chip-wide reset pin that can reset all registers in the device. Use of this

feature is set during design entry. In any of the clear and preset modes, the

chip-wide reset overrides all other signals. Registers with asynchronous

presets may be preset when the chip-wide reset is asserted. Inversion can

be used to implement the asynchronous preset. Figure 12 shows examples

of how to setup the preset and clear inputs for the desired functionality.

Figure 12. ACEX 1K LE Clear & Preset Modes

Asynchronous Clear Asynchronous Preset Asynchronous Preset & Clear

Asynchronous Load without Clear or Preset

labctrl1

(Asynchronous

Load) PRN

CLRN

NOT

labctrl1

(Asynchronous

Load)

Asynchronous Load with Clear

labctrl2

(Clear)

PRN

CLRN

NOT

(Asynchronous

Load)

Asynchronous Load with Preset

NOT

PRN

CLRN

labctrl1 or

labctrl2

PRN

CLRN

VCC

Chip-Wide Reset

PRN

CLRN

PRN

CLRN

VCC

Chip-Wide Reset

data3

(Data)

labctrl1

labctrl2

(Preset)

data3

(Data)

data3

(Data)

labctrl1 or

labctrl2

labctrl1

labctrl2

Altera Corporation 25

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Asynchronous Clear

The flipflop can be cleared by either LABCTRL1 or LABCTRL2. In this mode,

the preset signal is tied to VCC to deactivate it.

Asynchronous Preset

An asynchronous preset is implemented as an asynchronous load, or with

an asynchronous clear. If DATA3 is tied to VCC, asserting LABCTRL1

asynchronously loads a one into the register. Alternatively, the Altera

software can provide preset control by using the clear and inverting the

both LEs and IOEs. Therefore, if a register is preset by only one of the two

LABCTRL signals, the DATA3 input is not needed and can be used for one of

the LE operating modes.

Asynchronous Preset & Clear

When implementing asynchronous clear and preset, LABCTRL1 controls

the preset, and LABCTRL2 controls the clear. DATA3 is tied to VCC, so that

asserting LABCTRL1 asynchronously loads a one into the register,

effectively presetting the register. Asserting LABCTRL2 clears the register.

Asynchronous Load with Clear

When implementing an asynchronous load in conjunction with the clear,

LABCTRL1 implements the asynchronous load of DATA3 by controlling the

the register clear; LABCTRL2 does not have to feed the preset circuits.

Asynchronous Load with Preset

When implementing an asynchronous load in conjunction with preset, the

Altera software provides preset control by using the clear and inverting

the input and output of the register. Asserting LABCTRL2 presets the

inverts the signal that drives DATA3 to account for the inversion of the

Asynchronous Load without Preset or Clear

When implementing an asynchronous load without preset or clear,

LABCTRL1 implements the asynchronous load of DATA3 by controlling the

26 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

FastTrack Interconnect Routing Structure

In the ACEX 1K architecture, connections between LEs, EABs, and device

I/O pins are provided by the FastTrack Interconnect routing structure,

which is a series of continuous horizontal and vertical routing channels

that traverse the device. This global routing structure provides

predictable performance, even in complex designs. In contrast, the

segmented routing in FPGAs requires switch matrices to connect a

variable number of routing paths, increasing the delays between logic

resources and reducing performance.

The FastTrack Interconnect routing structure consists of row and column

interconnect channels that span the entire device. Each row of LABs is

served by a dedicated row interconnect. The row interconnect can drive

I/O pins and feed other LABs in the row. The column interconnect routes

signals between rows and can drive I/O pins.

Row channels drive into the LAB or EAB local interconnect. The row

signal is buffered at every LAB or EAB to reduce the effect of fan-out on

delay. A row channel can be driven by an LE or by one of three column

channels. These four signals feed dual 4-to-1 multiplexers that connect to

two specific row channels. These multiplexers, which are connected to

each LE, allow column channels to drive row channels even when all eight

LEs in a LAB drive the row interconnect.

Each column of LABs or EABs is served by a dedicated column

interconnect. The column interconnect that serves the EABs has twice as

many channels as other column interconnects. The column interconnect

can then drive I/O pins or another row’s interconnect to route the signals

to other LABs or EABs in the device. A signal from the column

interconnect, which can be either the output of a LE or an input from an

I/O pin, must be routed to the row interconnect before it can enter a LAB

or EAB. Each row channel that is driven by an IOE or EAB can drive one

specific column channel.

Access to row and column channels can be switched between LEs in

adjacent pairs of LABs. For example, a LE in one LAB can drive the row

and column channels normally driven by a particular LE in the adjacent

LAB in the same row, and vice versa. This flexibility enables routing

resources to be used more efficiently. Figure 13 shows the ACEX 1K LAB.

Altera Corporation 27

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Figure 13. ACEX 1K LAB Connections to Row & Column Interconnect

From Adjacent LAB

Row Channels

Column

Channels

Each LE can drive two

row channels.

LE 2

LE 8

LE 1 To Adjacent LAB

Each LE can switch

interconnect access

with an LE in the

adjacent LAB.

At each intersection,

six row channels can

drive column channels.

To Other Rows

To LAB Local

Interconnect

To Other

Columns

28 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

For improved routing, the row interconnect consists of a combination of

full-length and half-length channels. The full-length channels connect to

all LABs in a row; the half-length channels connect to the LABs in half of

the row. The EAB can be driven by the half-length channels in the left half

of the row and by the full-length channels. The EAB drives out to the full-

length channels. In addition to providing a predictable, row-wide

interconnect, this architecture provides increased routing resources. Two

neighboring LABs can be connected using a half-row channel, thereby

saving the other half of the channel for the other half of the row.

Table 6 summarizes the FastTrack Interconnect routing structure

resources available in each ACEX 1K device.

In addition to general-purpose I/O pins, ACEX 1K devices have six

dedicated input pins that provide low-skew signal distribution across the

device. These six inputs can be used for global clock, clear, preset, and

peripheral output-enable and clock-enable control signals. These signals

are available as control signals for all LABs and IOEs in the device. The

dedicated inputs can also be used as general-purpose data inputs because

they can feed the local interconnect of each LAB in the device.

Figure 14 shows the interconnection of adjacent LABs and EABs, with

row, column, and local interconnects, as well as the associated cascade

and carry chains. Each LAB is labeled according to its location: a letter

represents the row and a number represents the column. For example,

LAB B3 is in row B, column 3.

Table 6. ACEX 1K FastTrack Interconnect Resources

Device Rows Channels per

Row Columns Channels per

Column

EP1K10 3 144 24 24

EP1K30 6 216 36 24

EP1K50 10 216 36 24

EP1K100 12 312 52 24

Altera Corporation 29

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Figure 14. ACEX 1K Interconnect Resources

I/O Element

An IOE contains a bidirectional I/O buffer and a register that can be used

either as an input register for external data that requires a fast setup time

or as an output register for data that requires fast clock-to-output

performance. In some cases, using an LE register for an input register will

result in a faster setup time than using an IOE register. IOEs can be used

as input, output, or bidirectional pins. The compiler uses the

programmable inversion option to invert signals from the row and

column interconnect automatically where appropriate. For bidirectional

registered I/O implementation, the output register should be in the IOE

and the data input and output enable registers should be LE registers

placed adjacent to the bidirectional pin. Figure 15 shows the bidirectional

I/O registers.

I/O Element (IOE)

Row

Interconnect

IOE

Column

Interconnect

LAB

See Figure 17

for details.

See Figure 16

for details.

LAB

A1 LAB

LAB

IOE

Cascade &

To LAB B4

To LAB A4

To LAB B5

To LAB A5

IOE IOEIOE IOE

IOE IOE

IOEIOE IOEIOE IOEIOE

IOE

Carry Chains

30 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 15. ACEX 1K Bidirectional I/O Registers

VCC

OE[7..0]

CLK[1..0]

ENA[5..0]

CLRN[1..0]

Peripheral

Control Bus

CLRN

ENA

VCC

2 Dedicated

Clock Inputs

Slew-Rate

Control

Open-Drain

Output

Chip-Wide

Output Enable

CLK[3..2]

212

VCC

Chip-Wide

Reset

Programmable Delay

4 Dedicated

Inputs

Row and Column

Interconnect

VCC

CLRN

ENA

Chip-Wide

Reset

CLRN

ENA

Chip-Wide

Reset

VCC

Input Register

Output Register

OE Register

Altera Corporation 31

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

On all ACEX 1K devices, the input path from the I/O pad to the FastTrack

Interconnect has a programmable delay element that can be used to

guarantee a zero hold time. Depending on the placement of the IOE

relative to what it is driving, the designer may choose to turn on the

programmable delay to ensure a zero hold time or turn it off to minimize

setup time. This feature is used to reduce setup time for complex pin-to-

Each IOE selects the clock, clear, clock enable, and output enable controls

from a network of I/O control signals called the peripheral control bus.

The peripheral control bus uses high-speed drivers to minimize signal

skew across devices and provides up to 12 peripheral control signals that

can be allocated as follows:

■Up to eight output enable signals

■Up to six clock enable signals

■Up to two clock signals

■Up to two clear signals

If more than six clock-enable or eight output-enable signals are required,

each IOE on the device can be controlled by clock enable and output

enable signals driven by specific LEs. In addition to the two clock signals

available on the peripheral control bus, each IOE can use one of two

dedicated clock pins. Each peripheral control signal can be driven by any

of the dedicated input pins or the first LE of each LAB in a particular row.

In addition, a LE in a different row can drive a column interconnect, which

causes a row interconnect to drive the peripheral control signal. The chip-

wide reset signal resets all IOE registers, overriding any other control

signals.

When a dedicated clock pin drives IOE registers, it can be inverted for all

IOEs in the device. All IOEs must use the same sense of the clock. For

example, if any IOE uses the inverted clock, all IOEs must use the inverted

clock, and no IOE can use the non-inverted clock. However, LEs can still

use the true or complement of the clock on an LAB-by-LAB basis.

The incoming signal may be inverted at the dedicated clock pin and will

drive all IOEs. For the true and complement of a clock to be used to drive

IOEs, drive it into both global clock pins. One global clock pin will supply

the true, and the other will supply the complement.

When the true and complement of a dedicated input drives IOE clocks,

two signals on the peripheral control bus are consumed, one for each

sense of the clock.

32 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

When dedicated inputs drive non-inverted and inverted peripheral clears,

clock enables, and output enables, two signals on the peripheral control

bus will be used.

Table 7 lists the sources for each peripheral control signal and shows how

the output enable, clock enable, clock, and clear signals share

12 peripheral control signals. Table 7 also shows the rows that can drive

global signals.

Signals on the peripheral control bus can also drive the four global signals,

referred to as GLOBAL0 through GLOBAL3. An internally generated signal

can drive a global signal, providing the same low-skew, low-delay

characteristics as a signal driven by an input pin. An LE drives the global

signal by driving a row line that drives the peripheral bus which then

drives the global signal. This feature is ideal for internally generated clear

or clock signals with high fan-out. However, internally driven global

signals offer no advantage over the general-purpose interconnect for

routing data signals.

The chip-wide output enable pin is an active-high pin that can be used to

tri-state all pins on the device. This option can be set in the Altera

software. The built-in I/O pin pull-up resistors (which are active during

configuration) are active when the chip-wide output enable pin is

asserted. The registers in the IOE can also be reset by the chip-wide reset

pin.

Table 7. Peripheral Bus Sources for ACEX Devices

Peripheral Control Signal EP1K10 EP1K30 EP1K50 EP1K100

OE0 Row A Row A Row A Row A

OE1 Row A Row B Row B Row C

OE2 Row B Row C Row D Row E

OE3 Row B Row D Row F Row L

OE4 Row C Row E Row H Row I

OE5 Row C Row F Row J Row K

CLKENA0/CLK0/GLOBAL0 Row A Row A Row A Row F

CLKENA1/OE6/GLOBAL1 Row A Row B Row C Row D

CLKENA2/CLR0 Row B Row C Row E Row B

CLKENA3/OE7/GLOBAL2 Row B Row D Row G Row H

CLKENA4/CLR1 Row C Row E Row I Row J

CLKENA5/CLK1/GLOBAL3 Row C Row F Row J Row G

Altera Corporation 33

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Row-to-IOE Connections

When an IOE is used as an input signal, it can drive two separate row

channels. The signal is accessible by all LEs within that row. When an IOE

is used as an output, the signal is driven by a multiplexer that selects a

signal from the row channels. Up to eight IOEs connect to each side of

each row channel (see Figure 16).

Figure 16. ACEX 1K Row-to-IOE Connections Note (1)

Note:

(1) The values for m and n are shown in Table 8.

Table 8 lists the ACEX 1K row-to-IOE interconnect resources.

Each IOE is driven by an

m-to-1 multiplexer.

Each IOE can drive two

row channels.

IOE8

IOE1

Row FastTrack

Interconnect

Table 8. ACEX 1K Row-to-IOE Interconnect Resources

Device Channels per Row (n) Row Channels per Pin (m)

EP1K10 144 18

EP1K30 216 27

EP1K50 216 27

EP1K100 312 39

34 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Column-to-IOE Connections

When an IOE is used as an input, it can drive up to two separate column

channels. When an IOE is used as an output, the signal is driven by a

multiplexer that selects a signal from the column channels. Two IOEs

connect to each side of the column channels. Each IOE can be driven by

column channels via a multiplexer. The set of column channels is different

for each IOE (see Figure 17).

Figure 17. ACEX 1K Column-to-IOE Connections Note (1)

Note:

(1) The values for m and n are shown in Table 9.

Table 9 lists the ACEX 1K column-to-IOE interconnect resources.

Table 9. ACEX 1K Column-to-IOE Interconnect Resources

Device Channels per Column (n) Column Channels per Pin (m)

EP1K10 24 16

EP1K30 24 16

EP1K50 24 16

EP1K100 24 16

Each IOE is driven by

a m-to-1 multiplexer

Each IOE can drive two

column channels.

Column

Interconnect

IOE1

Altera Corporation 35

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

SameFrame

Pin-Outs

ACEX 1K devices support the SameFrame pin-out feature for

FineLine BGA packages. The SameFrame pin-out feature is the

arrangement of balls on FineLine BGA packages such that the lower-ball-

count packages form a subset of the higher-ball-count packages.

SameFrame pin-outs provide the flexibility to migrate not only from

device to device within the same package, but also from one package to

another. A given printed circuit board (PCB) layout can support multiple

device density/package combinations. For example, a single board layout

can support a range of devices from an EP1K10 device in a 256-pin

FineLine BGA package to an EP1K100 device in a 484-pin FineLine BGA

package.

The Altera software provides support to design PCBs with SameFrame

pin-out devices. Devices can be defined for present and future use. The

Altera software generates pin-outs describing how to lay out a board that

takes advantage of this migration. Figure 18 shows an example of

SameFrame pin-out.

Figure 18. SameFrame Pin-Out Example

Table 10 shows the ACEX 1K device/package combinations that support

SameFrame pin-outs for ACEX 1K devices. All FineLine BGA packages

support SameFrame pin-outs, providing the flexibility to migrate not only

from device to device within the same package, but also from one package

to another. The I/O count will vary from device to device.

Designed for 484-Pin FineLine BGA Package

Printed Circuit Board

256-Pin FineLine BGA Package

(Reduced I/O Count or

Logic Requirements)

484-Pin FineLine BGA Package

(Increased I/O Count or

Logic Requirements)

256-Pin

FineLine

BGA

484-Pin

FineLine

BGA

36 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

fFor more information, search for “SameFrame” in MAX+PLUS II Help.

Note:

(1) This option is supported with a 256-pin FineLine BGA package and SameFrame

migration.

ClockLock &

ClockBoost

Features

To support high-speed designs, -1 and -2 speed grade ACEX 1K devices

offer ClockLock and ClockBoost circuitry containing a phase-locked loop

(PLL) that is used to increase design speed and reduce resource usage.

The ClockLock circuitry uses a synchronizing PLL that reduces the clock

delay and skew within a device. This reduction minimizes clock-to-

output and setup times while maintaining zero hold times. The

ClockBoost circuitry, which provides a clock multiplier, allows the

designer to enhance device area efficiency by sharing resources within the

device. The ClockBoost feature allows the designer to distribute a low-

speed clock and multiply that clock on-device. Combined, the ClockLock

and ClockBoost features provide significant improvements in system

performance and bandwidth.

The ClockLock and ClockBoost features in ACEX 1K devices are enabled

through the Altera software. External devices are not required to use these

features. The output of the ClockLock and ClockBoost circuits is not

available at any of the device pins.

The ClockLock and ClockBoost circuitry lock onto the rising edge of the

incoming clock. The circuit output can drive the clock inputs of registers

only; the generated clock cannot be gated or inverted.

The dedicated clock pin (GCLK1) supplies the clock to the ClockLock and

ClockBoost circuitry. When the dedicated clock pin is driving the

ClockLock or ClockBoost circuitry, it cannot drive elsewhere in the

device.

Table 10. ACEX 1K SameFrame Pin-Out Support

Device 256-Pin

FineLine

BGA

484-Pin

FineLine

BGA

EP1K10 v(1)

EP1K30 v(1)

EP1K50 vv

EP1K100 vv

Altera Corporation 37

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

For designs that require both a multiplied and non-multiplied clock, the

clock trace on the board can be connected to the GCLK1 pin. In the Altera

software, the GCLK1 pin can feed both the ClockLock and ClockBoost

circuitry in the ACEX 1K device. However, when both circuits are used,

the other clock pin cannot be used.

ClockLock & ClockBoost Timing Parameters

For the ClockLock and ClockBoost circuitry to function properly, the

incoming clock must meet certain requirements. If these specifications are

not met, the circuitry may not lock onto the incoming clock, which

generates an erroneous clock within the device. The clock generated by

the ClockLock and ClockBoost circuitry must also meet certain

specifications. If the incoming clock meets these requirements during

configuration, the ClockLock and ClockBoost circuitry will lock onto the

clock during configuration. The circuit will be ready for use immediately

after configuration. Figure 19 shows the incoming and generated clock

specifications.

Figure 19. Speciﬁcations for the Incoming & Generated Clocks Note (1)

Note:

(1) The tI parameter refers to the nominal input clock period; the tO parameter refers to the nominal output clock

period.

Input

Clock

ClockLock

Generated

Clock

tCLK1 tINDUTY tI+tCLKDEV

tRtFtOtI+tINCLKSTB

tOtOtJITTER

tO+tJITTER

tOUTDUTY

38 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Tables 11 and 12 summarize the ClockLock and ClockBoost parameters

for -1 and -2 speed-grade devices, respectively.

Table 11. ClockLock & ClockBoost Parameters for -1 Speed-Grade Devices

Symbol Parameter Condition Min Typ Max Unit

tRInput rise time 5 ns

tFInput fall time 5ns

tINDUTY Input duty cycle 40 60 %

fCLK1 Input clock frequency (ClockBoost clock

multiplication factor equals 1) 25 180 MHz

fCLK2 Input clock frequency (ClockBoost clock

multiplication factor equals 2) 16 90 MHz

fCLKDEV Input deviation from user specification in the

Altera software (1) 25,000

(2) PPM

tINCLKSTB Input clock stability (measured between

adjacent clocks) 100 ps

tLOCK Time required for ClockLock or ClockBoost

to acquire lock (3) 10 µs

tJITTER Jitter on ClockLock or ClockBoost-

generated clock (4) tINCLKSTB <100 250 (4) ps

tINCLKSTB < 50 200 (4) ps

tOUTDUTY Duty cycle for ClockLock or ClockBoost-

generated clock 40 50 60 %

Altera Corporation 39

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Notes to tables:

(1) To implement the ClockLock and ClockBoost circuitry with the Altera software, designers must specify the input

frequency. The Altera software tunes the PLL in the ClockLock and ClockBoost circuitry to this frequency. The

fCLKDEV parameter specifies how much the incoming clock can differ from the specified frequency during device

operation. Simulation does not reflect this parameter.

(2) Twenty-five thousand parts per million (PPM) equates to 2.5% of input clock period.

(3) During device configuration, the ClockLock and ClockBoost circuitry is configured before the rest of the device. If

the incoming clock is supplied during configuration, the ClockLock and ClockBoost circuitry locks during

configuration because the tLOCK value is less than the time required for configuration.

(4) The tJITTER specification is measured under long-term observation. The maximum value for tJITTER is 200 ps if

tINCLKSTB is lower than 50 ps.

I/O

Conﬁguration

This section discusses the PCI pull-up clamping diode option, slew-rate

control, open-drain output option, and MultiVolt I/O interface for

ACEX 1K devices. The PCI pull-up clamping diode, slew-rate control, and

open-drain output options are controlled pin-by-pin via Altera software

logic options. The MultiVolt I/O interface is controlled by connecting

VCCIO to a different voltage than VCCINT. Its effect can be simulated in the

Altera software via the Global Project Device Options dialog box (Assign

menu).

Table 12. ClockLock & ClockBoost Parameters for -2 Speed-Grade Devices

Symbol Parameter Condition Min Typ Max Unit

tRInput rise time 5 ns

tFInput fall time 5ns

tINDUTY Input duty cycle 40 60 %

fCLK1 Input clock frequency (ClockBoost clock

multiplication factor equals 1) 25 80 MHz

fCLK2 Input clock frequency (ClockBoost clock

multiplication factor equals 2) 16 40 MHz

fCLKDEV Input deviation from user specification in

the software (1) 25,000 PPM

tINCLKSTB Input clock stability (measured between

adjacent clocks) 100 ps

tLOCK Time required for ClockLock or ClockBoost

to acquire lock (3) 10 µs

tJITTER Jitter on ClockLock or ClockBoost-

generated clock (4) tINCLKSTB < 100 250 (4) ps

tINCLKSTB < 50 200 (4) ps

tOUTDUTY Duty cycle for ClockLock or ClockBoost-

generated clock 40 50 60 %

40 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

PCI Pull-Up Clamping Diode Option

ACEX 1K devices have a pull-up clamping diode on every I/O, dedicated

input, and dedicated clock pin. PCI clamping diodes clamp the signal to

the VCCIO value and are required for 3.3-V PCI compliance. Clamping

diodes can also be used to limit overshoot in other systems.

Clamping diodes are controlled on a pin-by-pin basis. When VCCIO is

3.3 V, a pin that has the clamping diode option turned on can be driven by

a 2.5-V or 3.3-V signal, but not a 5.0-V signal. When VCCIO is 2.5 V, a pin

that has the clamping diode option turned on can be driven by a 2.5-V

signal, but not a 3.3-V or 5.0-V signal. Additionally, a clamping diode can

be activated for a subset of pins, which allows a device to bridge between

a 3.3-V PCI bus and a 5.0-V device.

Slew-Rate Control

The output buffer in each IOE has an adjustable output slew rate that can

be configured for low-noise or high-speed performance. A slower slew

rate reduces system noise and adds a maximum delay of 4.3 ns. The fast

slew rate should be used for speed-critical outputs in systems that are

adequately protected against noise. Designers can specify the slew rate

pin-by-pin or assign a default slew rate to all pins on a device-wide basis.

The slow slew rate setting affects only the falling edge of the output.

Open-Drain Output Option

ACEX 1K devices provide an optional open-drain output (electrically

equivalent to open-collector output) for each I/O pin. This open-drain

output enables the device to provide system-level control signals (e.g.,

interrupt and write enable signals) that can be asserted by any of several

devices. It can also provide an additional wired-OR plane.

MultiVolt I/O Interface

The ACEX 1K device architecture supports the MultiVolt I/O interface

feature, which allows ACEX 1K devices in all packages to interface with

systems of differing supply voltages. These devices have one set of VCC

pins for internal operation and input buffers (VCCINT), and another set for

I/O output drivers (VCCIO).

Altera Corporation 41

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

The VCCINT pins must always be connected to a 2.5-V power supply. With

a 2.5-V VCCINT level, input voltages are compatible with 2.5-V, 3.3-V, and

5.0-V inputs. The VCCIO pins can be connected to either a 2.5-V or 3.3-V

power supply, depending on the output requirements. When the VCCIO

pins are connected to a 2.5-V power supply, the output levels are

compatible with 2.5-V systems. When the VCCIO pins are connected to a

3.3-V power supply, the output high is at 3.3 V and is therefore compatible

with 3.3-V or 5.0-V systems. Devices operating with VCCIO levels higher

than 3.0 V achieve a faster timing delay of tOD2 instead of tOD1.

Table 13 summarizes ACEX 1K MultiVolt I/O support.

Notes:

(1) The PCI clamping diode must be disabled on an input which is driven with a

voltage higher than VCCIO.

(2) When VCCIO = 3.3 V, an ACEX 1K device can drive a 2.5-V device that has 3.3-V

tolerant inputs.

Open-drain output pins on ACEX 1K devices (with a pull-up resistor to

the 5.0-V supply) can drive 5.0-V CMOS input pins that require a higher

VIH than LVTTL. When the open-drain pin is active, it will drive low.

When the pin is inactive, the resistor will pull up the trace to 5.0 V, thereby

meeting the CMOS VOH requirement. The open-drain pin will only drive

low or tri-state; it will never drive high. The rise time is dependent on the

value of the pull-up resistor and load impedance. The IOL current

specification should be considered when selecting a pull-up resistor.

Power

Sequencing &

Hot-Socketing

Because ACEX 1K devices can be used in a mixed-voltage environment,

they have been designed specifically to tolerate any possible power-up

sequence. The VCCIO and VCCINT power planes can be powered in any

order.

Signals can be driven into ACEX 1K devices before and during power up

without damaging the device. Additionally, ACEX 1K devices do not

drive out during power up. Once operating conditions are reached,

ACEX 1K devices operate as specified by the user.

Table 13. ACEX 1K MultiVolt I/O Support

VCCIO (V) Input Signal (V) Output Signal (V)

2.5 3.3 5.0 2.5 3.3 5.0

2.5 vv (1) v (1) v

3.3 vvv (1) v (2) vv

42 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

IEEE Std.

1149.1 (JTAG)

Boundary-Scan

Support

All ACEX 1K devices provide JTAG BST circuitry that complies with the

IEEE Std. 1149.1-1990 specification. ACEX 1K devices can also be

configured using the JTAG pins through the ByteBlasterMV or BitBlaster

download cable, or via hardware that uses the JamTM Standard Test and

Programming Language (STAPL), JEDEC standard JESD-71. JTAG

boundary-scan testing can be performed before or after configuration, but

not during configuration. ACEX 1K devices support the JTAG

instructions shown in Table 14.

The instruction register length of ACEX 1K devices is 10 bits. The

USERCODE register length in ACEX 1K devices is 32 bits; 7 bits are

determined by the user, and 25 bits are pre-determined. Tables 15 and 16

show the boundary-scan register length and device IDCODE information

for ACEX 1K devices.

Table 14. ACEX 1K JTAG Instructions

JTAG Instruction Description

SAMPLE/PRELOAD Allows a snapshot of signals at the device pins to be captured and examined during

normal device operation and permits an initial data pattern to be output at the device

pins.

EXTEST Allows the external circuitry and board-level interconnections to be tested by forcing a

test pattern at the output pins and capturing test results at the input pins.

BYPASS Places the 1-bit bypass register between the TDI and TDO pins, allowing the BST data

to pass synchronously through a selected device to adjacent devices during normal

operation.

USERCODE Selects the user electronic signature (USERCODE) register and places it between the

TDI and TDO pins, allowing the USERCODE to be serially shifted out of TDO.

IDCODE Selects the IDCODE register and places it between TDI and TDO, allowing the IDCODE

to be serially shifted out of TDO.

ICR Instructions These instructions are used when configuring an ACEX 1K device via JTAG ports using

a MasterBlaster, ByteBlasterMV, or BitBlaster download cable, or a Jam File (.jam) or

Jam Byte-Code File (.jbc) via an embedded processor.

Table 15. ACEX 1K Boundary-Scan Register Length

Device Boundary-Scan Register Length

EP1K10 438

EP1K30 690

EP1K50 798

EP1K100 1,050

Altera Corporation 43

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Notes to tables:

(1) The most significant bit (MSB) is on the left.

(2) The least significant bit (LSB) for all JTAG IDCODEs is 1.

ACEX 1K devices include weak pull-up resistors on the JTAG pins.

fFor more information, see the following documents:

■Application Note 39 (IEEE Std. 1149.1 (JTAG) Boundary-Scan Testing in

Altera Devices)

■ByteBlasterMV Parallel Port Download Cable Data Sheet

■BitBlaster Serial Download Cable Data Sheet

■Jam Programming & Test Language Specification

Figure 20 shows the timing requirements for the JTAG signals.

Table 16. 32-Bit IDCODE for ACEX 1K Devices Note (1)

Device IDCODE (32 Bits)

Version

(4 Bits) Part Number (16 Bits) Manufacturer’s

Identity (11 Bits) 1 (1 Bit) (2)

EP1K10 0001 0001 0000 0001 0000 00001101110 1

EP1K30 0001 0001 0000 0011 0000 00001101110 1

EP1K50 0001 0001 0000 0101 0000 00001101110 1

EP1K100 0010 0000 0001 0000 0000 00001101110 1

44 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 20. ACEX 1K JTAG Waveforms

Table 17 shows the timing parameters and values for ACEX 1K devices.

TDO

TCK

tJPZX tJPCO

tJPH

tJPXZ

tJCP tJPSU

tJCL

tJCH

TDI

TMS

Signal

to Be

Captured

Signal

to Be

Driven

tJSZX

tJSSU tJSH

tJSCO tJSXZ

Table 17. ACEX 1K JTAG Timing Parameters & Values

Symbol Parameter Min Max Unit

tJCP TCK clock period 100 ns

tJCH TCK clock high time 50 ns

tJCL TCK clock low time 50 ns

tJPSU JTAG port setup time 20 ns

tJPH JTAG port hold time 45 ns

tJPCO JTAG port clock to output 25 ns

tJPZX JTAG port high impedance to valid output 25 ns

tJPXZ JTAG port valid output to high impedance 25 ns

tJSSU Capture register setup time 20 ns

tJSH Capture register hold time 45 ns

tJSCO Update register clock to output 35 ns

tJSZX Update register high impedance to valid output 35 ns

tJSXZ Update register valid output to high impedance 35 ns

Altera Corporation 45

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Generic Testing Each ACEX 1K device is functionally tested. Complete testing of each

configurable static random access memory (SRAM) bit and all logic

functionality ensures 100% yield. AC test measurements for ACEX 1K

devices are made under conditions equivalent to those shown in

Figure 21. Multiple test patterns can be used to configure devices during

all stages of the production flow.

Figure 21. ACEX 1K AC Test Conditions

Operating

Conditions

Tables 18 through 21 provide information on absolute maximum ratings,

recommended operating conditions, DC operating conditions, and

capacitance for 2.5-V ACEX 1K devices.

To T est

System

C1 (includes

JIG capacitance)

Device input

rise and fall

times < 3 ns

Device

Output

703 Ω

8.06 k Ω

[481 ]

Ω

[481 ]

Ω

VCCIO

Power supply transients can affect AC

measurements. Simultaneous transitions of

multiple outputs should be avoided for

accurate measurement. Threshold tests

must not be performed under AC

conditions. Large-amplitude, fast-ground-

current transients normally occur as the

device outputs discharge the load

capacitances. When these transients ﬂow

through the parasitic inductance between

the device ground pin and the test system

ground, signiﬁcant reductions in

observable noise immunity can result.

Numbers in brackets are for 2.5-V devices

or outputs. Numbers without brackets are

for 3.3-V devices or outputs.

Table 18. ACEX 1K Device Absolute Maximum Ratings Note (1)

Symbol Parameter Conditions Min Max Unit

VCCINT Supply voltage With respect to ground (2) –0.5 3.6 V

VCCIO –0.5 4.6 V

VIDC input voltage –2.0 5.75 V

IOUT DC output current, per pin –25 25 mA

TSTG Storage temperature No bias –65 150 ° C

TAMB Ambient temperature Under bias –65 135 ° C

TJJunction temperature PQFP, TQFP, and BGA packages, under

bias 135 ° C

46 Altera Corporation
ACEX 1K Programmable Logic Device Family Data Sheet
Table 19.  ACEX 1K Device Recommended Operating Conditions
Symbol Parameter Conditions Min Max Unit
VCCINT Supply voltage for internal logic 
and input buffers (3), (4) 2.375 
(2.375) 2.625 
(2.625) V
VCCIO Supply voltage for output buffers, 
3.3-V operation (3), (4) 3.00 (3.00) 3.60 (3.60) V
Supply voltage for output buffers, 
2.5-V operation (3), (4) 2.375 
(2.375) 2.625 
(2.625) V
VIInput voltage (2), (5) –0.5 5.75 V
VOOutput voltage 0 VCCIO V
TAAmbient temperature For commercial use 0 70 ° C
For industrial use –40 85 ° C
TJOperating temperature For commercial use 0 85 ° C
For industrial use –40 100 ° C
tRInput rise time 40 ns
tFInput fall time 40 ns
Table 20. ACEX 1K Device DC Operating Conditions  (Part 1 of 2)       Notes (6), (7)
Symbol Parameter Conditions Min Typ Max Unit
VIH High-level input voltage 1.7,
0.5 × VCCIO (8) 5.75 V
VIL Low-level input voltage –0.5 0.8, 
0.3 × VCCIO (8) V
VOH 3.3-V high-level TTL output 
voltage IOH = –8 mA DC, 
VCCIO = 3.00 V (9) 2.4 V
3.3-V high-level CMOS output 
voltage IOH = –0.1 mA DC, 
VCCIO = 3.00 V (9) VCCIO – 0.2 V
3.3-V high-level PCI output 
voltage IOH = –0.5 mA DC, 
VCCIO = 3.00 to 3.60 V 
(9)
0.9 ×†VCCIO V
2.5-V high-level output voltage IOH = –0.1 mA DC, 
VCCIO = 2.375 V (9) 2.1 V
IOH = –1 mA DC, 
VCCIO = 2.375 V (9) 2.0 V
IOH = –2 mA DC, 
VCCIO = 2.375 V (9) 1.7 V

Altera Corporation  47
ACEX 1K Programmable Logic Device Family Data Sheet
Development
13
Tools
VOL 3.3-V low-level TTL output 
voltage IOL = 12 mA DC, 
VCCIO = 3.00 V (10) 0.45 V
3.3-V low-level CMOS output 
voltage IOL = 0.1 mA DC, 
VCCIO = 3.00 V (10) 0.2 V
3.3-V low-level PCI output 
voltage IOL = 1.5 mA DC, 
VCCIO = 3.00 to 3.60 V 
(10)
0.1 × VCCIO V
2.5-V low-level output voltage IOL = 0.1 mA DC, 
VCCIO = 2.375 V (10) 0.2 V
IOL = 1 mA DC, 
VCCIO = 2.375 V (10) 0.4 V
IOL = 2 mA DC, 
VCCIO = 2.375 V (10) 0.7 V
IIInput pin leakage current VI = 5.3 to –0.3 V (11) –10 10 µA
IOZ Tri-stated I/O pin leakage 
current VO = 5.3 to –0.3 V (11) –10 10 µA
ICC0 VCC supply current (standby) VI = ground, no load, 
no toggling inputs 5mA
VI = ground, no load, 
no toggling inputs (12) 10 mA
RCONF Value of I/O pin pull-up 
resistor before and during 
configuration
VCCIO = 3.0 V (13) 20 50 kΩ
VCCIO = 2.375 V (13) 30 80 kΩ
Table 20. ACEX 1K Device DC Operating Conditions  (Part 2 of 2)       Notes (6), (7)
Symbol Parameter Conditions Min Typ Max Unit

48 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Notes to tables:

(1) See the Operating Requirements for Altera Devices Data Sheet.

(2) Minimum DC input voltage is –0.5 V. During transitions, the inputs may undershoot to –2.0 V for input currents

less than 100 mA and periods shorter than 20 ns.

(3) Numbers in parentheses are for industrial-temperature-range devices.

(4) Maximum VCC rise time is 100 ms, and VCC must rise monotonically.

(5) All pins, including dedicated inputs, clock, I/O, and JTAG pins, may be driven before VCCINT and VCCIO are

powered.

(6) Typical values are for TA = 25° C, VCCINT = 2.5 V, and VCCIO = 2.5 V or 3.3 V.

(7) These values are specified under the ACEX 1K Recommended Operating Conditions shown in Table 19 on page 46.

(8) The ACEX 1K input buffers are compatible with 2.5-V, 3.3-V (LVTTL and LVCMOS), and 5.0-V TTL and CMOS

signals. Additionally, the input buffers are 3.3-V PCI compliant when VCCIO and VCCINT meet the relationship

shown in Figure 22.

(9) The IOH parameter refers to high-level TTL, PCI, or CMOS output current.

(10) The IOL parameter refers to low-level TTL, PCI, or CMOS output current. This parameter applies to open-drain pins

as well as output pins.

(11) This value is specified for normal device operation. The value may vary during power-up.

(12) This parameter applies to -1 speed grade commercial temperature devices and -2 speed grade industrial

temperature devices.

(13) Pin pull-up resistance values will be lower if the pin is driven higher than VCCIO by an external source.

(14) Capacitance is sample-tested only.

Table 21. ACEX 1K Device Capacitance Note (14)

Symbol Parameter Conditions Min Max Unit

CIN Input capacitance VIN = 0 V, f = 1.0 MHz 10 pF

CINCLK Input capacitance on

dedicated clock pin VIN = 0 V, f = 1.0 MHz 12 pF

COUT Output capacitance VOUT = 0 V, f = 1.0 MHz 10 pF

Altera Corporation 49

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Figure 22 shows the required relationship between VCCIO and VCCINT to

satisfy 3.3-V PCI compliance.

Figure 22. Relationship between VCCIO & VCCINT for 3.3-V PCI Compliance

Figure 23 shows the typical output drive characteristics of ACEX 1K

devices with 3.3-V and 2.5-V VCCIO. The output driver is compliant to the

3.3-V PCI Local Bus Specification, Revision 2.2 (when VCCIO pins are

connected to 3.3 V). ACEX 1K devices with a -1 speed grade also comply

with the drive strength requirements of the PCI Local Bus Specification,

Revision 2.2 (when VCCINT pins are powered with a minimum supply of

2.375 V, and VCCIO pins are connected to 3.3 V). Therefore, these devices

can be used in open 5.0-V PCI systems.

3.0 3.1 3.3

VCCIOIO

3.6

2.3

2.5

2.7

VCCINT

II (V)

(V)

PCI-Compliant Region

50 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 23. Output Drive Characteristics of ACEX 1K Devices

Timing Model The continuous, high-performance FastTrack Interconnect routing

resources ensure accurate simulation and timing analysis as well as

predictable performance. This predictable performance contrasts with

that of FPGAs, which use a segmented connection scheme and, therefore,

have an unpredictable performance.

Device performance can be estimated by following the signal path from a

source, through the interconnect, to the destination. For example, the

registered performance between two LEs on the same row can be

calculated by adding the following parameters:

■LE register clock-to-output delay (tCO)

■Interconnect delay (tSAMEROW)

■LE look-up table delay (tLUT)

■LE register setup time (tSU)

The routing delay depends on the placement of the source and destination

LEs. A more complex registered path may involve multiple combinatorial

LEs between the source and destination LEs.

Timing simulation and delay prediction are available with the simulator

and Timing Analyzer, or with industry-standard EDA tools. The

Simulator offers both pre-synthesis functional simulation to evaluate logic

design accuracy and post-synthesis timing simulation with 0.1-ns

resolution. The Timing Analyzer provides point-to-point timing delay

information, setup and hold time analysis, and device-wide performance

analysis.

VO Output Voltage (V)

IOL

IOH IOH

VCCINT = 2.5

VCCIO = 2.5

Room Temperature

VCCINT = 2.5

VCCIO = 3.3

Room Temperature

123

VO Output Voltage (V)

123

90 IOL

Typical I

Output

Current (mA)

Typical I

Output

Current (mA)

Altera Corporation 51

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Figure 24 shows the overall timing model, which maps the possible paths

to and from the various elements of the ACEX 1K device.

Figure 24. ACEX 1K Device Timing Model

Figures 25 through 28 show the delays that correspond to various paths

and functions within the LE, IOE, EAB, and bidirectional timing models.

Figure 25. ACEX 1K Device LE Timing Model

Dedicated

Clock/Input Interconnect I/O Element

Logic

Element Embedded Array

Block

CGENR

COMB

PRE

CLR

Delays

LUT Delay

LUT

RLUT

CLUT

Carry Chain

Delay

Carry-In Cascade-In

Data-Out

CGEN

CICO

Packed Register

Delay

PACKED

Delay

Data-In

Control-In

CASC

Cascade-Out

Carry-Out

LABCARRY

LABCASC

52 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 26. ACEX 1K Device IOE Timing Model

Figure 27. ACEX 1K Device EAB Timing Model

Data-In

I/O Register

Delays

IOCO

IOCOMB

IOSU

IOH

IOCLR

Output Data

Delay

IOD

I/O Element

Contol Delay

IOC

Input Register Delay

INREG

Output

Delays

OD1

OD2

OD3

ZX1

ZX2

ZX3

I/O Register

Feedback Delay

IOFD

Input Delay

INCOMB

Clock Enable

Clear

Data Feedback

into FastTrack

Interconnect

Clock

Output Enable

EAB Data Input

Delays

EABDATA1

EABDATA2

Data-In

Write Enable

Input Delays

EABWE1

EABWE2

EAB Clock

Delay

EABCLK

Input Register

Delays

EABCO

EABBYPASS

EABSU

EABH

EABCH

EABCL

EABRE1

EABRE2

RAM/ROM

Block Delays

RASU

RAH

WDSU

WDH

WASU

WAH

Output Register

Delays

EABCO

EABBYPASS

EABSU

EABH

EABCH

EABCL

EABOUT

Address

Input Register

Clock

Output Register

Clock

Data-Out

EAB Output

Delay

Read Enable

Input Delays

Altera Corporation 53

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

Figure 28. Synchronous Bidirectional Pin External Timing Model

Tables 29 and 30 show the asynchronous and synchronous timing

waveforms, respectively, for the EAB macroparameters in Table 24.

Figure 29. EAB Asynchronous Timing Waveforms

PRN

CLRN

PRN

CLRN

PRN

CLRN

Dedicated

Clock

Bidirectional

Output Register

INSUBIDIR

OUTCOBIDIR

XZBIDIR

ZXBIDIR

INHBIDIR

OE Register

Input Register

EAB Asynchronous Write

EAB Asynchronous Read

d0 d3

EABRCCOMB

a1 a2 a3

EABAA

Address

Data-Out

din1 dout2

EABDD

a1 a2

din1

din0

EABWCCOMB

EABWASU

EABWAH

EABWDH

EABWDSU

EABWP

din0

Data-In

Address

Data-Out

54 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Figure 30. EAB Synchronous Timing Waveforms

Tables 22 through 26 describe the ACEX 1K device internal timing

parameters.

CLK

EAB Synchronous Read

EABDATASU

EABRCREG

EABDATACO

a1 a2 a3

EABDATAH

CLK

dout0 din1 din2 din3 din2

EABWESU

EABWCREG

EABWEH

EABDATACO

a1 a2 a3 a2

din3

din2

din1

EABDATAH

EABDATASU

EAB Synchronous Write (EAB Output Registers Used)

dout1

Address

Data-Out

Address

Data-Out

Data-In

Table 22. LE Timing Microparameters (Part 1 of 2) Note (1)

Symbol Parameter Conditions

tLUT LUT delay for data-in

tCLUT LUT delay for carry-in

tRLUT LUT delay for LE register feedback

tPACKED Data-in to packed register delay

tEN LE register enable delay

tCICO Carry-in to carry-out delay

tCGEN Data-in to carry-out delay

tCGENR LE register feedback to carry-out delay

Altera Corporation 55

ACEX 1K Programmable Logic Device Family Data Sheet

Development

Tools

tCASC Cascade-in to cascade-out delay

tCLE register control signal delay

tCO LE register clock-to-output delay

tCOMB Combinatorial delay

tSU LE register setup time for data and enable signals before clock; LE register

recovery time after asynchronous clear, preset, or load

tHLE register hold time for data and enable signals after clock

tPRE LE register preset delay

tCLR LE register clear delay

tCH Minimum clock high time from clock pin

tCL Minimum clock low time from clock pin

Table 23. IOE Timing Microparameters Note (1)

Symbol Parameter Conditions

tIOD IOE data delay

tIOC IOE register control signal delay

tIOCO IOE register clock-to-output delay

tIOCOMB IOE combinatorial delay

tIOSU IOE register setup time for data and enable signals before clock; IOE register

recovery time after asynchronous clear

tIOH IOE register hold time for data and enable signals after clock

tIOCLR IOE register clear time

tOD1 Output buffer and pad delay, slow slew rate = off, VCCIO = 3.3 V C1 = 35 pF (2)

tOD2 Output buffer and pad delay, slow slew rate = off, VCCIO = 2.5 V C1 = 35 pF (3)

tOD3 Output buffer and pad delay, slow slew rate = on C1 = 35 pF (4)

tXZ IOE output buffer disable delay

tZX1 IOE output buffer enable delay, slow slew rate = off, VCCIO = 3.3 V C1 = 35 pF (2)

tZX2 IOE output buffer enable delay, slow slew rate = off, VCCIO = 2.5 V C1 = 35 pF (3)

tZX3 IOE output buffer enable delay, slow slew rate = on C1 = 35 pF (4)

tINREG IOE input pad and buffer to IOE register delay

tIOFD IOE register feedback delay

tINCOMB IOE input pad and buffer to FastTrack Interconnect delay

Table 22. LE Timing Microparameters (Part 2 of 2) Note (1)

Symbol Parameter Conditions

56 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Table 24. EAB Timing Microparameters Note (1)

Symbol Parameter Conditions

tEABDATA1 Data or address delay to EAB for combinatorial input

tEABDATA2 Data or address delay to EAB for registered input

tEABWE1 Write enable delay to EAB for combinatorial input

tEABWE2 Write enable delay to EAB for registered input

tEABRE1 Read enable delay to EAB for combinatorial input

tEABRE2 Read enable delay to EAB for registered input

tEABCLK EAB register clock delay

tEABCO EAB register clock-to-output delay

tEABBYPASS Bypass register delay

tEABSU EAB register setup time before clock

tEABH EAB register hold time after clock

tEABCLR EAB register asynchronous clear time to output delay

tAA Address access delay (including the read enable to output delay)

tWP Write pulse width

tRP Read pulse width

tWDSU Data setup time before falling edge of write pulse (5)

tWDH Data hold time after falling edge of write pulse (5)

tWASU Address setup time before rising edge of write pulse (5)

tWAH Address hold time after falling edge of write pulse (5)

tRASU Address setup time before rising edge of read pulse

tRAH Address hold time after falling edge of read pulse

tWO Write enable to data output valid delay

tDD Data-in to data-out valid delay

tEABOUT Data-out delay

tEABCH Clock high time

tEABCL Clock low time

Altera Corporation 57

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Table 25. EAB Timing Macroparameters Notes (1), (6)

Symbol Parameter Conditions

tEABAA EAB address access delay

tEABRCCOMB EAB asynchronous read cycle time

tEABRCREG EAB synchronous read cycle time

tEABWP EAB write pulse width

tEABWCCOMB EAB asynchronous write cycle time

tEABWCREG EAB synchronous write cycle time

tEABDD EAB data-in to data-out valid delay

tEABDATACO EAB clock-to-output delay when using output registers

tEABDATASU EAB data/address setup time before clock when using input register

tEABDATAH EAB data/address hold time after clock when using input register

tEABWESU EAB WE setup time before clock when using input register

tEABWEH EAB WE hold time after clock when using input register

tEABWDSU EAB data setup time before falling edge of write pulse when not using input

registers

tEABWDH EAB data hold time after falling edge of write pulse when not using input

registers

tEABWASU EAB address setup time before rising edge of write pulse when not using

input registers

tEABWAH EAB address hold time after falling edge of write pulse when not using input

registers

tEABWO EAB write enable to data output valid delay

58 Altera Corporation
ACEX 1K Programmable Logic Device Family Data Sheet
Notes to tables:
(1) Microparameters are timing delays contributed by individual architectural elements. These parameters cannot be 
measured explicitly.
(2) Operating conditions: VCCIO = 3.3 V ± 10% for commercial or industrial use in ACEX 1K devices
(3) Operating conditions: VCCIO = 2.5 V ± 5% for commercial or industrial use in ACEX 1K devices.
(4) Operating conditions: VCCIO = 2.5 V or 3.3 V.
(5) Because the RAM in the EAB is self-timed, this parameter can be ignored when the WE signal is registered. 
(6) EAB macroparameters are internal parameters that can simplify predicting the behavior of an EAB at its boundary; 
these parameters are calculated by summing selected microparameters. 
(7) These parameters are worst-case values for typical applications. Post-compilation timing simulation and timing 
analysis are required to determine actual worst-case performance.
Table 26. Interconnect Timing Microparameters       Note (1)
Symbol Parameter Conditions
tDIN2IOE Delay from dedicated input pin to IOE control input (7)
tDIN2LE Delay from dedicated input pin to LE or EAB control input (7)
tDIN2DATA Delay from dedicated input or clock to LE or EAB data (7)
tDCLK2IOE Delay from dedicated clock pin to IOE clock (7)
tDCLK2LE Delay from dedicated clock pin to LE or EAB clock  (7)
tSAMELAB Routing delay for an LE driving another LE in the same LAB (7)
tSAMEROW Routing delay for a row IOE, LE, or EAB driving a row IOE, LE, or EAB in the 
same row (7)
tSAMECOLUMN Routing delay for an LE driving an IOE in the same column (7)
tDIFFROW Routing delay for a column IOE, LE, or EAB driving an LE or EAB in a different 
row (7)
tTWOROWS Routing delay for a row IOE or EAB driving an LE or EAB in a different row (7)
tLEPERIPH Routing delay for an LE driving a control signal of an IOE via the peripheral 
control bus (7)
tLABCARRY Routing delay for the carry-out signal of an LE driving the carry-in signal of a 
different LE in a different LAB
tLABCASC Routing delay for the cascade-out signal of an LE driving the cascade-in 
signal of a different LE in a different LAB

Altera Corporation  59
ACEX 1K Programmable Logic Device Family Data Sheet
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Tables 27 through 29 describe the ACEX 1K external timing parameters 
and their symbols.      
Notes to tables:
(1) External reference timing parameters are factory-tested, worst-case values specified by Altera. A representative 
subset of signal paths is tested to approximate typical device applications.
(2) Contact Altera Applications for test circuit specifications and test conditions.
(3) These timing parameters are sample-tested only.
(4) This parameter is measured with the measurement and test conditions, including load, specified in the PCI Local 
Bus Specification, Revision 2.2.
Table 27. External Reference Timing Parameters       Note (1)
Symbol Parameter Conditions
tDRR Register-to-register delay via four LEs, three row interconnects, and four local 
interconnects (2)
Table 28. External Timing Parameters 
Symbol Parameter Conditions
tINSU Setup time with global clock at IOE register (3)
tINH Hold time with global clock at IOE register (3)
tOUTCO Clock-to-output delay with global clock at IOE register (3)
tPCISU Setup time with global clock for registers used in PCI designs (3), (4)
tPCIH Hold time with global clock for registers used in PCI designs (3), (4)
tPCICO Clock-to-output delay with global clock for registers used in PCI designs (3), (4)
Table 29. External Bidirectional Timing Parameters       Note (3)
Symbol Parameter Conditions
tINSUBIDIR Setup time for bidirectional pins with global clock at same-row or same-
column LE register
tINHBIDIR Hold time for bidirectional pins with global clock at same-row or same-column 
LE register
tOUTCOBIDIR Clock-to-output delay for bidirectional pins with global clock at IOE register CI = 35 pF
tXZBIDIR Synchronous IOE output buffer disable delay CI = 35 pF
tZXBIDIR Synchronous IOE output buffer enable delay, slow slew rate = off CI = 35 pF

60 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Tables 30 through 36 show EP1K10 device internal and external timing

parameters.

Table 30. EP1K10 Device LE Timing Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tLUT 0.7 0.8 1.1 ns

tCLUT 0.5 0.6 0.8 ns

tRLUT 0.6 0.7 1.0 ns

tPACKED 0.4 0.4 0.5 ns

tEN 0.9 1.0 1.3 ns

tCICO 0.1 0.1 0.2 ns

tCGEN 0.4 0.5 0.7 ns

tCGENR 0.1 0.1 0.2 ns

tCASC 0.7 0.9 1.1 ns

tC1.1 1.3 1.7 ns

tCO 0.5 0.7 0.9 ns

tCOMB 0.4 0.5 0.7 ns

tSU 0.7 0.8 1.0 ns

tH0.9 1.0 1.1 ns

tPRE 0.8 1.0 1.4 ns

tCLR 0.9 1.0 1.4 ns

tCH 2.0 2.5 2.5 ns

tCL 2.0 2.5 2.5 ns

Altera Corporation 61

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Table 31. EP1K10 Device IOE Timing Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tIOD 2.6 3.1 4.0 ns

tIOC 0.3 0.4 0.5 ns

tIOCO 0.9 1.0 1.4 ns

tIOCOMB 0.0 0.0 0.0 ns

tIOSU 1.3 1.5 2.0 ns

tIOH 0.9 1.0 1.4 ns

tIOCLR 1.1 1.3 1.7 ns

tOD1 3.1 3.7 4.1 ns

tOD2 2.6 3.3 3.9 ns

tOD3 5.8 6.9 8.3 ns

tXZ 3.8 4.5 5.9 ns

tZX1 3.8 4.5 5.9 ns

tZX2 3.3 4.1 5.7 ns

tZX3 6.5 7.7 10.1 ns

tINREG 3.7 4.3 5.7 ns

tIOFD 0.9 1.0 1.4 ns

tINCOMB 1.9 2.3 3.0 ns

62 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Table 32. EP1K10 Device EAB Internal Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tEABDATA1 1.8 1.9 1.9 ns

tEABDATA2 0.6 0.7 0.7 ns

tEABWE1 1.2 1.2 1.2 ns

tEABWE2 0.4 0.4 0.4 ns

tEABRE1 0.9 0.9 0.9 ns

tEABRE2 0.4 0.4 0.4 ns

tEABCLK 0.0 0.0 0.0 ns

tEABCO 0.3 0.3 0.3 ns

tEABBYPASS 0.5 0.6 0.6 ns

tEABSU 1.0 1.0 1.0 ns

tEABH 0.5 0.4 0.4 ns

tEABCLR 0.3 0.3 0.3 ns

tAA 3.4 3.6 3.6 ns

tWP 2.7 2.8 2.8 ns

tRP 1.0 1.0 1.0 ns

tWDSU 1.0 1.0 1.0 ns

tWDH 0.1 0.1 0.1 ns

tWASU 1.8 1.9 1.9 ns

tWAH 1.9 2.0 2.0 ns

tRASU 3.1 3.5 3.5 ns

tRAH 0.2 0.2 0.2 ns

tWO 2.7 2.8 2.8 ns

tDD 2.7 2.8 2.8 ns

tEABOUT 0.5 0.6 0.6 ns

tEABCH 1.5 2.0 2.0 ns

tEABCL 2.7 2.8 2.8 ns

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Table 33. EP1K10 Device EAB Internal Timing Macroparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tEABAA 6.7 7.3 7.3 ns

tEABRCCOMB 6.7 7.3 7.3 ns

tEABRCREG 4.7 4.9 4.9 ns

tEABWP 2.7 2.8 2.8 ns

tEABWCCOMB 6.4 6.7 6.7 ns

tEABWCREG 7.4 7.6 7.6 ns

tEABDD 6.0 6.5 6.5 ns

tEABDATACO 0.8 0.9 0.9 ns

tEABDATASU 1.6 1.7 1.7 ns

tEABDATAH 0.0 0.0 0.0 ns

tEABWESU 1.4 1.4 1.4 ns

tEABWEH 0.1 0.0 0.0 ns

tEABWDSU 1.6 1.7 1.7 ns

tEABWDH 0.0 0.0 0.0 ns

tEABWASU 3.1 3.4 3.4 ns

tEABWAH 0.6 0.5 0.5 ns

tEABWO 5.4 5.8 5.8 ns

64 Altera Corporation
ACEX 1K Programmable Logic Device Family Data Sheet
Table 34. EP1K10 Device Interconnect Timing Microparameters       Note (1)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tDIN2IOE 2.3 2.7 3.6 ns
tDIN2LE 0.8 1.1 1.4 ns
tDIN2DATA 1.1 1.4 1.8 ns
tDCLK2IOE 2.3 2.7 3.6 ns
tDCLK2LE 0.8 1.1 1.4 ns
tSAMELAB 0.1 0.1 0.2 ns
tSAMEROW 1.8 2.1 2.9 ns
tSAMECOLUMN 0.3 0.4 0.7 ns
tDIFFROW 2.1 2.5 3.6 ns
tTWOROWS 3.9 4.6 6.5 ns
tLEPERIPH 3.3 3.7 4.8 ns
tLABCARRY 0.3 0.4 0.5 ns
tLABCASC 0.9 1.0 1.4 ns
Table 35. EP1K10 External Timing Parameters       Note (1)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tDRR 7.5 9.5 12.5 ns
tINSU (2), (3) 2.4 2.7 3.6 ns
tINH (2), (3) 0.0 0.0 0.0 ns
tOUTCO (2), (3) 2.0 6.6 2.0 7.8 2.0 9.6 ns
tINSU (4), (3) 1.4 1.7 –ns
tINH (4), (3) 0.5 5.1 0.5 6.4 –– ns
tOUTCO (4), (3) 0.0 0.0 –ns
tPCISU (3) 3.0 4.2 6.4 ns
tPCIH (3) 0.0 0.0 –ns
tPCICO (3) 2.0 6.0 2.0 7.5 2.0 10.2 ns

Altera Corporation  65
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Notes to tables:
(1) All timing parameters are described in Tables 22 through 29 in this data sheet.
(2) This parameter is measured without the use of the ClockLock or ClockBoost circuits.
(3) These parameters are specified by characterization.
(4) This parameter is measured with the use of the ClockLock or ClockBoost circuits.
Tables 37 through 43 show EP1K30 device internal and external timing 
parameters.                   
Table 36. EP1K10 External Bidirectional Timing Parameters       Notes (1), (3)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tINSUBIDIR (2) 2.2 2.3 3.2 ns
tINHBIDIR (2) 0.0 0.0 0.0 ns
tOUTCOBIDIR (2) 2.0 6.6 2.0 7.8 2.0 9.6 ns
tXZBIDIR (2) 8.8 11.2 14.0 ns
tZXBIDIR (2) 8.8 11.2 14.0 ns
tINSUBIDIR (4) 3.1 3.3 ––
tINHBIDIR (4) 0.0 0.0 –
tOUTCOBIDIR (4) 0.5 5.1 0.5 6.4 –– ns
tXZBIDIR(4) 7.3 9.2 –ns
tZXBIDIR (4) 7.3 9.2 –ns
Table 37. EP1K30 Device LE Timing Microparameters  (Part 1 of 2)       Note (1)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tLUT 0.7 0.8 1.1 ns
tCLUT 0.5 0.6 0.8 ns
tRLUT 0.6 0.7 1.0 ns
tPACKED 0.3 0.4 0.5 ns
tEN 0.6 0.8 1.0 ns
tCICO 0.1 0.1 0.2 ns
tCGEN 0.4 0.5 0.7 ns
tCGENR 0.1 0.1 0.2 ns
tCASC 0.6 0.8 1.0 ns
tC0.0 0.0 0.0 ns
tCO 0.3 0.4 0.5 ns

66 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

tCOMB 0.4 0.4 0.6 ns

tSU 0.4 0.6 0.6 ns

tH0.7 1.0 1.3 ns

tPRE 0.8 0.9 1.2 ns

tCLR 0.8 0.9 1.2 ns

tCH 2.0 2.5 2.5 ns

tCL 2.0 2.5 2.5 ns

Table 38. EP1K30 Device IOE Timing Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tIOD 2.4 2.8 3.8 ns

tIOC 0.3 0.4 0.5 ns

tIOCO 1.0 1.1 1.6 ns

tIOCOMB 0.0 0.0 0.0 ns

tIOSU 1.2 1.4 1.9 ns

tIOH 0.3 0.4 0.5 ns

tIOCLR 1.0 1.1 1.6 ns

tOD1 1.9 2.3 3.0 ns

tOD2 1.4 1.8 2.5 ns

tOD3 4.4 5.2 7.0 ns

tXZ 2.7 3.1 4.3 ns

tZX1 2.7 3.1 4.3 ns

tZX2 2.2 2.6 3.8 ns

tZX3 5.2 6.0 8.3 ns

tINREG 3.4 4.1 5.5 ns

tIOFD 0.8 1.3 2.4 ns

tINCOMB 0.8 1.3 2.4 ns

Table 37. EP1K30 Device LE Timing Microparameters (Part 2 of 2) Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

Altera Corporation 67

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Table 39. EP1K30 Device EAB Internal Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tEABDATA1 1.7 2.0 2.3 ns

tEABDATA1 0.6 0.7 0.8 ns

tEABWE1 1.1 1.3 1.4 ns

tEABWE2 0.4 0.4 0.5 ns

tEABRE1 0.8 0.9 1.0 ns

tEABRE2 0.4 0.4 0.5 ns

tEABCLK 0.0 0.0 0.0 ns

tEABCO 0.3 0.3 0.4 ns

tEABBYPASS 0.5 0.6 0.7 ns

tEABSU 0.9 1.0 1.2 ns

tEABH 0.4 0.4 0.5 ns

tEABCLR 0.3 0.3 0.3 ns

tAA 3.2 3.8 4.4 ns

tWP 2.5 2.9 3.3 ns

tRP 0.9 1.1 1.2 ns

tWDSU 0.9 1.0 1.1 ns

tWDH 0.1 0.1 0.1 ns

tWASU 1.7 2.0 2.3 ns

tWAH 1.8 2.1 2.4 ns

tRASU 3.1 3.7 4.2 ns

tRAH 0.2 0.2 0.2 ns

tWO 2.5 2.9 3.3 ns

tDD 2.5 2.9 3.3 ns

tEABOUT 0.5 0.6 0.7 ns

tEABCH 1.5 2.0 2.3 ns

tEABCL 2.5 2.9 3.3 ns

68 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Table 40. EP1K30 Device EAB Internal Timing Macroparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tEABAA 6.4 7.6 8.8 ns

tEABRCOMB 6.4 7.6 8.8 ns

tEABRCREG 4.4 5.1 6.0 ns

tEABWP 2.5 2.9 3.3 ns

tEABWCOMB 6.0 7.0 8.0 ns

tEABWCREG 6.8 7.8 9.0 ns

tEABDD 5.7 6.7 7.7 ns

tEABDATACO 0.8 0.9 1.1 ns

tEABDATASU 1.5 1.7 2.0 ns

tEABDATAH 0.0 0.0 0.0 ns

tEABWESU 1.3 1.4 1.7 ns

tEABWEH 0.0 0.0 0.0 ns

tEABWDSU 1.5 1.7 2.0 ns

tEABWDH 0.0 0.0 0.0 ns

tEABWASU 3.0 3.6 4.3 ns

tEABWAH 0.5 0.5 0.4 ns

tEABWO 5.1 6.0 6.8 ns

Altera Corporation  69
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Table 41. EP1K30 Device Interconnect Timing Microparameters      Note (1)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tDIN2IOE 1.8 2.4 2.9 ns
tDIN2LE 1.5 1.8 2.4 ns
tDIN2DATA 1.5 1.8 2.2 ns
tDCLK2IOE 2.2 2.6 3.0 ns
tDCLK2LE 1.5 1.8 2.4 ns
tSAMELAB 0.1 0.2 0.3 ns
tSAMEROW 2.0 2.4 2.7 ns
tSAMECOLUMN 0.7 1.0 0.8 ns
tDIFFROW 2.7 3.4 3.5 ns
tTWOROWS 4.7 5.8 6.2 ns
tLEPERIPH 2.7 3.4 3.8 ns
tLABCARRY 0.3 0.4 0.5 ns
tLABCASC 0.8 0.8 1.1 ns
Table 42. EP1K30 External Timing Parameters      Notes (1), (2)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tDRR 8.0 9.5 12.5 ns
tINSU (3) 2.1 2.5 3.9 ns
tINH (3) 0.0 0.0 0.0 ns
tOUTCO (3) 2.0  4.9 2.0 5.9 2.0 7.6 ns
tINSU (4) 1.1 1.5 –ns
tINH (4) 0.0 0.0 –ns
tOUTCO (4) 0.5 3.9 0.5 4.9 –– ns
tPCISU 3.0 4.2 –ns
tPCIH 0.0 0.0 –ns
tPCICO 2.0 6.0 2.0 7.5 –– ns

70 Altera Corporation
ACEX 1K Programmable Logic Device Family Data Sheet
Notes to tables:
(1) All timing parameters are described in Tables 22 through 29 in this data sheet.
(2) These parameters are specified by characterization.
(3) This parameter is measured without the use of the ClockLock or ClockBoost circuits.
(4) This parameter is measured with the use of the ClockLock or ClockBoost circuits.
Tables 44 through 50 show EP1K50 device external timing parameters. 
                  
Table 43. EP1K30 External Bidirectional Timing Parameters      Notes (1), (2)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tINSUBIDIR (3) 2.8 3.9 5.2 ns
tINHBIDIR (3) 0.0 0.0 0.0 ns
tINSUBIDIR (4) 3.8 4.9 –ns
tINHBIDIR (4) 0.0 0.0 –ns
tOUTCOBIDIR (3) 2.0 4.9 2.0 5.9 2.0 7.6 ns
tXZBIDIR (3) 6.1 7.5 9.7 ns
tZXBIDIR (3) 6.1 7.5 9.7 ns
tOUTCOBIDIR (4)  0.5 3.9 0.5 4.9 –– ns
tXZBIDIR (4) 5.1  6.5 –ns
tZXBIDIR (4) 5.1  6.5 –ns
Table 44. EP1K50 Device LE Timing Microparameters  (Part 1 of 2)       Note (1)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tLUT 0.6 0.8 1.1 ns
tCLUT 0.5 0.6 0.8 ns
tRLUT 0.6 0.7 0.9 ns
tPACKED 0.2 0.3 0.4 ns
tEN 0.6 0.7 0.9 ns
tCICO 0.1 0.1 0.1 ns
tCGEN 0.4 0.5 0.6 ns
tCGENR 0.1 0.1 0.1 ns
tCASC 0.5 0.8 1.0 ns
tC0.5 0.6 0.8 ns

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tCO 0.6 0.6 0.7 ns

tCOMB 0.3 0.4 0.5 ns

tSU 0.5 0.6 0.7 ns

tH0.5 0.6 0.8 ns

tPRE 0.4 0.5 0.7 ns

tCLR 0.8 1.0 1.2 ns

tCH 2.0 2.5 3.0 ns

tCL 2.0 2.5 3.0 ns

Table 45. EP1K50 Device IOE Timing Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tIOD 1.3 1.3 1.9 ns

tIOC 0.3 0.4 0.4 ns

tIOCO 1.7 2.1 2.6 ns

tIOCOMB 0.5 0.6 0.8 ns

tIOSU 0.8 1.0 1.3 ns

tIOH 0.4 0.5 0.6 ns

tIOCLR 0.2 0.2 0.4 ns

tOD1 1.2 1.2 1.9 ns

tOD2 0.7 0.8 1.7 ns

tOD3 2.7 3.0 4.3 ns

tXZ 4.7 5.7 7.5 ns

tZX1 4.7 5.7 7.5 ns

tZX2 4.2 5.3 7.3 ns

tZX3 6.2 7.5 9.9 ns

tINREG 3.5 4.2 5.6 ns

tIOFD 1.1 1.3 1.8 ns

tINCOMB 1.1 1.3 1.8 ns

Table 44. EP1K50 Device LE Timing Microparameters (Part 2 of 2) Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

72 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Table 46. EP1K50 Device EAB Internal Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tEABDATA1 1.7 2.4 3.2 ns

tEABDATA2 0.4 0.6 0.8 ns

tEABWE1 1.0 1.4 1.9 ns

tEABWE2 0.0 0.0 0.0 ns

tEABRE1 0.0 0.0 0.0

tEABRE2 0.4 0.6 0.8

tEABCLK 0.0 0.0 0.0 ns

tEABCO 0.8 1.1 1.5 ns

tEABBYPASS 0.0 0.0 0.0 ns

tEABSU 0.7 1.0 1.3 ns

tEABH 0.4 0.6 0.8 ns

tEABCLR 0.8 1.1 1.5

tAA 2.0 2.8 3.8 ns

tWP 2.0 2.8 3.8 ns

tRP 1.0 1.4 1.9

tWDSU 0.5 0.7 0.9 ns

tWDH 0.1 0.1 0.2 ns

tWASU 1.0 1.4 1.9 ns

tWAH 1.5 2.1 2.9 ns

tRASU 1.5 2.1 2.8

tRAH 0.1 0.1 0.2

tWO 2.1 2.9 4.0 ns

tDD 2.1 2.9 4.0 ns

tEABOUT 0.0 0.0 0.0 ns

tEABCH 1.5 2.0 2.5 ns

tEABCL 1.5 2.0 2.5 ns

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Table 47. EP1K50 Device EAB Internal Timing Macroparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tEABAA 3.7 5.2 7.0 ns

tEABRCCOMB 3.7 5.2 7.0 ns

tEABRCREG 3.5 4.9 6.6 ns

tEABWP 2.0 2.8 3.8 ns

tEABWCCOMB 4.5 6.3 8.6 ns

tEABWCREG 5.6 7.8 10.6 ns

tEABDD 3.8 5.3 7.2 ns

tEABDATACO 0.8 1.1 1.5 ns

tEABDATASU 1.1 1.6 2.1 ns

tEABDATAH 0.0 0.0 0.0 ns

tEABWESU 0.7 1.0 1.3 ns

tEABWEH 0.4 0.6 0.8 ns

tEABWDSU 1.2 1.7 2.2 ns

tEABWDH 0.0 0.0 0.0 ns

tEABWASU 1.6 2.3 3.0 ns

tEABWAH 0.9 1.2 1.8 ns

tEABWO 3.1 4.3 5.9 ns

74 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Table 48. EP1K50 Device Interconnect Timing Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tDIN2IOE 3.1 3.7 4.6 ns

tDIN2LE 1.7 2.1 2.7 ns

tDIN2DATA 2.7 3.1 5.1 ns

tDCLK2IOE 1.6 1.9 2.6 ns

tDCLK2LE 1.7 2.1 2.7 ns

tSAMELAB 0.1 0.1 0.2 ns

tSAMEROW 1.5 1.7 2.4 ns

tSAMECOLUMN 1.0 1.3 2.1 ns

tDIFFROW 2.5 3.0 4.5 ns

tTWOROWS 4.0 4.7 6.9 ns

tLEPERIPH 2.6 2.9 3.4 ns

tLABCARRY 0.1 0.2 0.2 ns

tLABCASC 0.8 1.0 1.3 ns

Table 49. EP1K50 External Timing Parameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tDRR 8.0 9.5 12.5 ns

tINSU (2) 2.4 2.9 3.9 ns

tINH (2) 0.0 0.0 0.0 ns

tOUTCO (2) 2.0 4.3 2.0 5.2 2.0 7.3 ns

tINSU (3) 2.4 2.9 –ns

tINH (3) 0.0 0.0 –ns

tOUTCO (3) 0.5 3.3 0.5 4.1 –– ns

tPCISU 2.4 2.9 –ns

tPCIH 0.0 0.0 –ns

tPCICO 2.0 6.0 2.0 7.7 –– ns

Altera Corporation  75
ACEX 1K Programmable Logic Device Family Data Sheet
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Notes to tables:
(1) All timing parameters are described in Tables 22 through 29.
(2) This parameter is measured without use of the ClockLock or ClockBoost circuits.
(3) This parameter is measured with use of the ClockLock or ClockBoost circuits 
Table 50. EP1K50 External Bidirectional Timing Parameters       Note (1)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tINSUBIDIR (2) 2.7 3.2 4.3 ns
tINHBIDIR (2) 0.0 0.0 0.0 ns
tINSUBIDIR (3) 3.7 4.2 –ns
tINHBIDIR (3) 0.0 0.0 –ns
tOUTCOBIDIR (2) 2.0 4.5 2.0 5.2 2.0 7.3 ns
tXZBIDIR (2) 6.8 7.8 10.1 ns
tZXBIDIR (2) 6.8 7.8 10.1 ns
tOUTCOBIDIR (3) 0.5 3.5 0.5 4.2 ––
tXZBIDIR (3) 6.8 8.4 –ns
tZXBIDIR (3) 6.8 8.4 –ns

76 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Tables 51 through 57 show EP1K100 device internal and external timing

parameters.

Table 51. EP1K100 Device LE Timing Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tLUT 0.7 1.0 1.5 ns

tCLUT 0.5 0.7 0.9 ns

tRLUT 0.6 0.8 1.1 ns

tPACKED 0.3 0.4 0.5 ns

tEN 0.2 0.3 0.3 ns

tCICO 0.1 0.1 0.2 ns

tCGEN 0.4 0.5 0.7 ns

tCGENR 0.1 0.1 0.2 ns

tCASC 0.6 0.9 1.2 ns

tC0.8 1.0 1.4 ns

tCO 0.6 0.8 1.1 ns

tCOMB 0.4 0.5 0.7 ns

tSU 0.4 0.6 0.7 ns

tH0.5 0.7 0.9 ns

tPRE 0.8 1.0 1.4 ns

tCLR 0.8 1.0 1.4 ns

tCH 1.5 2.0 2.5 ns

tCL 1.5 2.0 2.5 ns

Altera Corporation 77

ACEX 1K Programmable Logic Device Family Data Sheet

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Table 52. EP1K100 Device IOE Timing Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tIOD 1.7 2.0 2.6 ns

tIOC 0.0 0.0 0.0 ns

tIOCO 1.4 1.6 2.1 ns

tIOCOMB 0.5 0.7 0.9 ns

tIOSU 0.8 1.0 1.3 ns

tIOH 0.7 0.9 1.2 ns

tIOCLR 0.5 0.7 0.9 ns

tOD1 3.0 4.2 5.6 ns

tOD2 3.0 4.2 5.6 ns

tOD3 4.0 5.5 7.3 ns

tXZ 3.5 4.6 6.1 ns

tZX1 3.5 4.6 6.1 ns

tZX2 3.5 4.6 6.1 ns

tZX3 4.5 5.9 7.8 ns

tINREG 2.0 2.6 3.5 ns

tIOFD 0.5 0.8 1.2 ns

tINCOMB 0.5 0.8 1.2 ns

78 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

Table 53. EP1K100 Device EAB Internal Microparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tEABDATA1 1.5 2.0 2.6 ns

tEABDATA1 0.0 0.0 0.0 ns

tEABWE1 1.5 2.0 2.6 ns

tEABWE2 0.3 0.4 0.5 ns

tEABRE1 0.3 0.4 0.5 ns

tEABRE2 0.0 0.0 0.0 ns

tEABCLK 0.0 0.0 0.0 ns

tEABCO 0.3 0.4 0.5 ns

tEABBYPASS 0.1 0.1 0.2 ns

tEABSU 0.8 1.0 1.4 ns

tEABH 0.1 0.1 0.2 ns

tEABCLR 0.3 0.4 0.5 ns

tAA 4.0 5.1 6.6 ns

tWP 2.7 3.5 4.7 ns

tRP 1.0 1.3 1.7 ns

tWDSU 1.0 1.3 1.7 ns

tWDH 0.2 0.2 0.3 ns

tWASU 1.6 2.1 2.8 ns

tWAH 1.6 2.1 2.8 ns

tRASU 3.0 3.9 5.2 ns

tRAH 0.1 0.1 0.2 ns

tWO 1.5 2.0 2.6 ns

tDD 1.5 2.0 2.6 ns

tEABOUT 0.2 0.3 0.3 ns

tEABCH 1.5 2.0 2.5 ns

tEABCL 2.7 3.5 4.7 ns

Altera Corporation 79

ACEX 1K Programmable Logic Device Family Data Sheet

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Table 54. EP1K100 Device EAB Internal Timing Macroparameters Note (1)

Symbol Speed Grade Unit

-1 -2 -3

Min Max Min Max Min Max

tEABAA 5.9 7.6 9.9 ns

tEABRCOMB 5.9 7.6 9.9 ns

tEABRCREG 5.1 6.5 8.5 ns

tEABWP 2.7 3.5 4.7 ns

tEABWCOMB 5.9 7.7 10.3 ns

tEABWCREG 5.4 7.0 9.4 ns

tEABDD 3.4 4.5 5.9 ns

tEABDATACO 0.5 0.7 0.8 ns

tEABDATASU 0.8 1.0 1.4 ns

tEABDATAH 0.1 0.1 0.2 ns

tEABWESU 1.1 1.4 1.9 ns

tEABWEH 0.0 0.0 0.0 ns

tEABWDSU 1.0 1.3 1.7 ns

tEABWDH 0.2 0.2 0.3 ns

tEABWASU 4.1 5.2 6.8 ns

tEABWAH 0.0 0.0 0.0 ns

tEABWO 3.4 4.5 5.9 ns

80 Altera Corporation
ACEX 1K Programmable Logic Device Family Data Sheet
Table 55. EP1K100 Device Interconnect Timing Microparameters       Note (1)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tDIN2IOE 3.1 3.6 4.4 ns
tDIN2LE 0.3 0.4 0.5 ns
tDIN2DATA 1.6 1.8 2.0 ns
tDCLK2IOE 0.8 1.1 1.4 ns
tDCLK2LE 0.3 0.4 0.5 ns
tSAMELAB 0.1 0.1 0.2 ns
tSAMEROW 1.5 2.5 3.4 ns
tSAMECOLUMN 0.4 1.0 1.6 ns
tDIFFROW 1.9 3.5 5.0 ns
tTWOROWS 3.4 6.0 8.4 ns
tLEPERIPH 4.3 5.4 6.5 ns
tLABCARRY 0.5 0.7 0.9 ns
tLABCASC 0.8 1.0 1.4 ns
Table 56. EP1K100 External Timing Parameters       Notes (1), (2)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tDRR 9.0 12.0 16.0 ns
tINSU (3) 2.0 2.5 3.3 ns
tINH (3) 0.0 0.0 0.0 ns
tOUTCO (3) 2.0 5.2 2.0 6.9 2.0 9.1 ns
tINSU (4) 2.0 2.2 –ns
tINH (4) 0.0 0.0 –ns
tOUTCO (4) 0.5 3.0 0.5 4.6 –– ns
tPCISU 3.0 6.2 –ns
tPCIH 0.0 0.0 –ns
tPCICO 2.0 6.0 2.0 6.9 –– ns

Altera Corporation  81
ACEX 1K Programmable Logic Device Family Data Sheet
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Notes to tables:
(1) All timing parameters are described in Tables 22 through 29 in this data sheet.
(2) These parameters are specified by characterization.
(3) This parameter is measured without the use of the ClockLock or ClockBoost circuits.
(4) This parameter is measured with the use of the ClockLock or ClockBoost circuits.
Power 
Consumption
The supply power (P) for ACEX 1K devices can be calculated with the 
following equation:
P = PINT + PIO = (ICCSTANDBY + ICCACTIVE) × VCC + PIO
The ICCACTIVE value depends on the switching frequency and the 
application logic. This value is calculated based on the amount of current 
that each LE typically consumes. The PIO value, which depends on the 
device output load characteristics and switching frequency, can be 
calculated using the guidelines given in Application Note 74 (Evaluating 
Power for Altera Devices).
1Compared to the rest of the device, the embedded array 
consumes a negligible amount of power. Therefore, the 
embedded array can be ignored when calculating supply 
current.
Table 57. EP1K100 External Bidirectional Timing Parameters       Notes (1), (2)
Symbol Speed Grade Unit
-1 -2 -3
Min Max Min Max Min Max
tINSUBIDIR (3) 1.7 2.5 3.3 ns
tINHBIDIR (3) 0.0 0.0 0.0 ns
tINSUBIDIR (4) 2.0 2.8 –ns
tINHBIDIR (4) 0.0 0.0 –ns
tOUTCOBIDIR (3) 2.0 5.2 2.0 6.9 2.0 9.1 ns
tXZBIDIR (3) 5.6 7.5 10.1 ns
tZXBIDIR (3) 5.6 7.5  10.1 ns
tOUTCOBIDIR (4) 0.5 3.0 0.5 4.6 –– ns
tXZBIDIR (4) 4.6 6.5 –ns
tZXBIDIR (4) 4.6  6.5 –ns

82 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

The ICCACTIVE value can be calculated with the following equation:

ICCACTIVE = K × fMAX × N × togLC (µA)

Where:

fMAX = Maximum operating frequency in MHz

N = Total number of LEs used in the device

togLC = Average percent of LEs toggling at each clock

(typically 12.5%)

K = Constant

Table 58 provides the constant (K) values for ACEX 1K devices.

This supply power calculation provides an ICC estimate based on typical

conditions with no output load. The actual ICC should be verified during

operation because this measurement is sensitive to the actual pattern in

the device and the environmental operating conditions.

To better reflect actual designs, the power model (and the constant K in

the power calculation equations) for continuous interconnect ACEX 1K

devices assumes that LEs drive FastTrack Interconnect channels. In

contrast, the power model of segmented FPGAs assumes that all LEs

drive only one short interconnect segment. This assumption may lead to

inaccurate results when compared to measured power consumption for

actual designs in segmented FPGAs.

Figure 31 shows the relationship between the current and operating

frequency of ACEX 1K devices. For information on other ACEX 1K

devices, contact Altera Applications at (800) 800-EPLD.

Table 58. ACEX 1K Constant Values

Device K Value

EP1K10 4.5

EP1K30 4.5

EP1K50 4.5

EP1K100 4.5

Altera Corporation 83

ACEX 1K Programmable Logic Device Family Data Sheet

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Figure 31. ACEX 1K ICCACTIVE vs. Operating Frequency

Conﬁguration &

Operation

The ACEX 1K architecture supports several configuration schemes. This

section summarizes the device operating modes and available device

configuration schemes.

Operating Modes

The ACEX 1K architecture uses SRAM configuration elements that

require configuration data to be loaded every time the circuit powers up.

The process of physically loading the SRAM data into the device is called

configuration. Before configuration, as VCC rises, the device initiates a

Power-On Reset (POR). This POR event clears the device and prepares it

for configuration. The ACEX 1K POR time does not exceed 50 µs.

1When configuring with a configuration device, refer to the

relevant configuration device data sheet for POR timing

information.

0Frequency (MHz)

300

200

100

50 100

EP1K100

ICC Supply

Current (mA)

0Frequency (MHz)

ICC Supply

Current (mA)

100

50 100

EP1K30

0Frequency (MHz)

ICC Supply

Current (mA)

200

150

100

50 100

EP1K50

84 Altera Corporation

ACEX 1K Programmable Logic Device Family Data Sheet

During initialization, which occurs immediately after configuration, the

device resets registers, enables I/O pins, and begins to operate as a logic

device. Before and during configuration, all I/O pins (except dedicated

inputs, clock, or configuration pins) are pulled high by a weak pull-up

resistor. Together, the configuration and initialization processes are called

command mode; normal device operation is called user mode.

SRAM configuration elements allow ACEX 1K devices to be reconfigured

in-circuit by loading new configuration data into the device. Real-time

reconfiguration is performed by forcing the device into command mode

with a device pin, loading different configuration data, re-initializing the

device, and resuming user-mode operation. The entire reconfiguration

process requires less than 40 ms and can be used to reconfigure an entire

system dynamically. In-field upgrades can be performed by distributing

new configuration files.

Conﬁguration Schemes

The configuration data for an ACEX 1K device can be loaded with one of

five configuration schemes (see Table 59), chosen on the basis of the target

application. An EPC16, EPC2, EPC1, or EPC1441 configuration device,

intelligent controller, or the JTAG port can be used to control the

configuration of a ACEX 1K device, allowing automatic configuration on

system power-up.

Multiple ACEX 1K devices can be configured in any of the five

configuration schemes by connecting the configuration enable (nCE) and

configuration enable output (nCEO) pins on each device. Additional

APEX 20K, APEX 20KE, FLEX 10K, FLEX 10KA, FLEX 10KE, ACEX 1K,

and FLEX 6000 devices can be configured in the same serial chain.

Device Pin-

Outs

See the Altera web site (http://www.altera.com) or the Altera Digital

Library for pin-out information.

Table 59. Data Sources for ACEX 1K Configuration

Configuration Scheme Data Source

Configuration device EPC16, EPC2, EPC1, or EPC1441 configuration device

Passive serial (PS) BitBlaster or ByteBlasterMV download cables, or serial data

source

Passive parallel asynchronous (PPA) Parallel data source

Passive parallel synchronous (PPS) Parallel data source

JTAG BitBlaster or ByteBlasterMV download cables, or

microprocessor with a Jam STAPL File or JBC File

Altera Corporation 85

ACEX 1K Programmable Logic Device Family Data Sheet

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Revision

History

The information contained in the ACEX 1K Programmable Logic Device

Family Data Sheet version 3.3 supersedes information published in

previous versions.

The following changes were made to the ACEX 1K Programmable Logic

Device Family Data Sheet version 3.3: changed active-low to active-high in

the last paragraph on page 32.

Altera, ACEX, ACEX 1K, APEX, APEX 20K, APEX 20KE, BitBlaster, ByteBlaster, ByteBlasterMV, ClockBoost,

ClockLock, EP1K10, EP1K30, EP1K50, EP1K100, FineLine BGA, FLEX, FLEX 10K, FLEX 10KA, FLEX 10KE,

Jam, MasterBlaster, MAX, MAX+PLUS, MAX+PLUS II, MegaCore, MultiVolt, and SameFrame are trademarks

and/or service marks of Altera Corporation in the United States and other countries. Altera acknowledges the

trademarks of other organizations for their respective products or services mentioned in this document. Altera

products are protected under numerous U.S. and foreign patents and pending applications, maskwork rights,

and copyrights. Altera warrants performance of its semiconductor products to current specifications in

accordance with Altera’s standard warranty, but reserves the right to make changes to any products and

services at any time without notice. Altera assumes no responsibility or liability arising out of the application

or use of any information, product, or service described herein except as expressly agreed

to in writing by Altera Corporation. Altera customers are advised to obtain the latest

version of device specifications before relying on any published information and before

placing orders for products or services.

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