MCM6205D
2MOTOROLA FAST SRAM
TRUTH TABLE (X = Don’t Care)
E1 E2 G W Mode VCC Current Output Cycle
H X X X Not Selected ISB1, ISB2 High–Z —
X L X X Not Selected ISB1, ISB2 High–Z —
L H H H Output Disabled ICCA High–Z —
L H L H Read ICCA Dout Read Cycle
L H X L Write ICCA High–Z Write Cycle
ABSOLUTE MAXIMUM RATINGS
Rating Symbol Value Unit
Power Supply Voltage VCC – 0.5 to + 7.0 V
Voltage Relative to VSS For Any Pin
Except VCC Vin, Vout – 0.5 to VCC + 0.5 V
Output Current Iout ±20 mA
Power Dissipation PD1.0 W
Temperature Under Bias Tbias – 10 to + 85 °C
Operating Temperature TA0 to + 70 °C
Storage Temperature — Plastic Tstg – 55 to + 125 °C
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED OPER-
ATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
DC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ±10%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter Symbol Min Typ Max Unit
Supply Voltage (Operating Voltage Range) VCC 4.5 5.0 5.5 V
Input High Voltage VIH 2.2 — VCC + 0.3** V
Input Low Voltage VIL – 0.5*— 0.8 V
*VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width ≤ 20 ns)
**VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width ≤ 20 ns)
DC CHARACTERISTICS
Parameter Symbol Min Max Unit
Input Leakage Current (All Inputs, Vin = 0 to VCC) Ilkg(I) —±1µA
Output Leakage Current (E1 = VIH or G = VIH or E2 = VIL, Vout = 0 to VCC) Ilkg(O) —±1µA
Output High Voltage (IOH = – 4.0 mA) VOH 2.4 — V
Output Low Voltage (IOL = 8.0 mA) VOL — 0.4 V
POWER SUPPLY CURRENTS
Parameter Symbol – 15 – 20 – 25 Unit
AC Active Supply Current (Iout = 0 mA, VCC = Max, f = fmax) ICCA 140 135 130 mA
AC Standby Current (E1 = VIH, or E2 = VIL, VCC = Max, f = fmax) ISB1 40 40 35 mA
CMOS Standby Current (VCC = Max, f = 0 MHz, E1 ≥ VCC – 0.2 V or
E2 ≤ VSS + 0.2 V, Vin ≤ VSS + 0.2 V, or ≥ VCC – 0.2 V) ISB2 20 20 20 mA
This device contains circuitry to protect the
inputs against damage due to high static volt-
ages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maxi-
mum rated voltages to this high–impedance
circuit.
This CMOS memory circuit has been de-
signed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established. The circuit is in a test
socket or mounted on a printed circuit board
and transverse air flow of at least 500 linear
feet per minute is maintained.