MCM6205D
1
MOTOROLA FAST SRAM
32K x 9 Bit Fast Static RAM
The MCM6205D is fabricated using Motorola’s high–performance silicon–gate
CMOS technology. Static design eliminates the need for external clocks or timing
strobes, while CMOS circuitry reduces power consumption and provides for
greater reliability.
This device meets JEDEC standards for functionality and pinout, and is avail-
able in a plastic small–outline J–leaded package.
Single 5 V ± 10% Power Supply
Fully Static No Clock or Timing Strobes Necessary
Fast Access Times: 15, 20, and 25 ns
Equal Address and Chip Enable Access Times
Output Enable (G) Feature for Increased System Flexibility and to
Eliminate Bus Contention Problems
Low Power Operation: 130 – 140 mA Maximum AC
Fully TTL Compatible Three State Output
BLOCK DIAGRAM
A0 A2 A5 A8 A12 A13 A14
A1
A3
A4
A6
A7
A9
A10
A11
MEMORY MATRIX
256 ROWS x
128 x 9 COLUMNS
ROW
DECODER
INPUT
DATA
CONTROL
COLUMN I/O
COLUMN DECODER
DQ0
DQ8
E2
E1
W
G
VCC
VSS
Order this document
by MCM6205D/D
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
PIN ASSIGNMENT
MCM6205D
J PACKAGE
300 MIL SOJ
CASE 857–02
SS
NC
A8
A7
A6
A5
A4
A3
A2
A1
V
V
A14
E2
A13
CC
A9
A10
A0
NC
A11
A12
DQ7
DQ8
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
DQ0
DQ1
DQ2
DQ3
DQ6
DQ4
DQ5
W
G
E1
PIN NAMES
A0 – A14 Address Input. . . . . . . . . . . . .
DQ0 – DQ8 Data Input/Data Output. . .
W Write Enable. . . . . . . . . . . . . . . . . . . .
GOutput Enable. . . . . . . . . . . . . . . . . . .
E1, E2 Chip Enable. . . . . . . . . . . . . . . . .
NC No Connection. . . . . . . . . . . . . . . . .
VCC Power Supply (+ 5 V). . . . . . . . . . .
VSS Ground. . . . . . . . . . . . . . . . . . . . . . .
REV 1
5/95
Motorola, Inc. 1994
MCM6205D
2MOTOROLA FAST SRAM
TRUTH TABLE (X = Don’t Care)
E1 E2 G W Mode VCC Current Output Cycle
H X X X Not Selected ISB1, ISB2 High–Z
X L X X Not Selected ISB1, ISB2 High–Z
L H H H Output Disabled ICCA High–Z
L H L H Read ICCA Dout Read Cycle
L H X L Write ICCA High–Z Write Cycle
ABSOLUTE MAXIMUM RATINGS
Rating Symbol Value Unit
Power Supply Voltage VCC 0.5 to + 7.0 V
Voltage Relative to VSS For Any Pin
Except VCC Vin, Vout 0.5 to VCC + 0.5 V
Output Current Iout ±20 mA
Power Dissipation PD1.0 W
Temperature Under Bias Tbias 10 to + 85 °C
Operating Temperature TA0 to + 70 °C
Storage Temperature — Plastic Tstg 55 to + 125 °C
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED OPER-
ATING CONDITIONS. Exposure to higher than recommended voltages for
extended periods of time could affect device reliability.
DC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ±10%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter Symbol Min Typ Max Unit
Supply Voltage (Operating Voltage Range) VCC 4.5 5.0 5.5 V
Input High Voltage VIH 2.2 VCC + 0.3** V
Input Low Voltage VIL 0.5* 0.8 V
*VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width 20 ns)
**VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width 20 ns)
DC CHARACTERISTICS
Parameter Symbol Min Max Unit
Input Leakage Current (All Inputs, Vin = 0 to VCC) Ilkg(I) ±1µA
Output Leakage Current (E1 = VIH or G = VIH or E2 = VIL, Vout = 0 to VCC) Ilkg(O) ±1µA
Output High Voltage (IOH = – 4.0 mA) VOH 2.4 V
Output Low Voltage (IOL = 8.0 mA) VOL 0.4 V
POWER SUPPLY CURRENTS
Parameter Symbol 15 20 25 Unit
AC Active Supply Current (Iout = 0 mA, VCC = Max, f = fmax) ICCA 140 135 130 mA
AC Standby Current (E1 = VIH, or E2 = VIL, VCC = Max, f = fmax) ISB1 40 40 35 mA
CMOS Standby Current (VCC = Max, f = 0 MHz, E1 VCC – 0.2 V or
E2 VSS + 0.2 V, Vin VSS + 0.2 V, or VCC – 0.2 V) ISB2 20 20 20 mA
This device contains circuitry to protect the
inputs against damage due to high static volt-
ages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maxi-
mum rated voltages to this high–impedance
circuit.
This CMOS memory circuit has been de-
signed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established. The circuit is in a test
socket or mounted on a printed circuit board
and transverse air flow of at least 500 linear
feet per minute is maintained.
MCM6205D
3
MOTOROLA FAST SRAM
CAPACITANCE (f = 1 MHz, dV = 3 V, TA = 25°C, Periodically sampled rather than 100% tested)
Characteristic Symbol Max Unit
Address Input Capacitance Cin 6 pF
Control Pin Input Capacitance (E1, E2, G, W) Cin 8 pF
I/O Capacitance CI/O 8 pF
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ±10%, TA = 0 to + 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . . . .
Input Pulse Levels 0 to 3.0 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time 5 ns. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output Timing Measurement Reference Level 1.5 V. . . . . . . . . . . . .
Output Load Figure 1A Unless Otherwise Noted. . . . . . . . . . . . . . . .
READ CYCLE (See Notes 1 and 2)
MCM6205D–15 MCM6205D–20 MCM6205D–25
Parameter Symbol Min Max Min Max Min Max Unit Notes
Read Cycle Time tAVAV 15 20 25 ns 3
Address Access Time tAVQV 15 20 25 ns
Enable Access Time tELQV 15 20 25 ns 4
Output Enable Access Time tGLQV 8 10 12 ns
Output Hold from Address Change tAXQX 4 4 4 ns
Enable Low to Output Active tELQX 4 4 4 ns 5, 6, 7
Enable High to Output High–Z tEHQZ 0 8 0 9 0 10 ns 5, 6, 7
Output Enable Low to Output Active tGLQX 0 0 0 ns 5, 6, 7
Output Enable High to Output High–Z tGHQZ 0 7 0 8 0 10 ns 5, 6, 7
Power Up Time tELICCH 0 0 0 ns
Power Down Time tEHICCL 15 20 25 ns
NOTES:
1. W is high for read cycle.
2. E1 and E2 are represented by E in this data sheet. E2 is of opposite polarity to E.
3. All timings are referenced from the last valid address to the first transitioning address.
4. Addresses valid prior to or coincident with E going low.
5. At any given voltage and temperature, tEHQZ (max) is less than tELQX (min), and tGHQZ (max) is less than tGLQX (min), both for a
given device and from device to device.
6. Transition is measured ±500 mV from steady–state voltage with load of Figure 1B.
7. This parameter is sampled and not 100% tested.
8. Device is continuously selected (E1 = VIL, E2 = VIH, G = VIL).
AC TEST LOADS
OUTPUT Z0 = 50
50
VL = 1.5 V
Figure 1A Figure 1B
The table of timing values shows either a
minimum or a maximum limit for each param-
eter. Input requirements are specified from
the external system point of view. Thus, ad-
dress setup time is shown as a minimum
since the system must supply at least that
much time (even though most devices do not
require it). On the other hand, responses from
the memory are specified from the device
point of view . Thus, the access time is shown
as a maximum since the device never pro-
vides data later than that time.
TIMING LIMITS
5 pF
+ 5 V
OUTPUT
255
480
MCM6205D
4MOTOROLA FAST SRAM
READ CYCLE 1 (See Note 8)
Q (DATA OUT)
A (ADDRESS)
DATA VALIDPREVIOUS DATA VALID
tAVAV
tAXQX
tAVQV
READ CYCLE 2 (See Note 4)
ISB
ICC
tEHQZ
tEHICCL
DATA VALID
tGHQZ
tAVAV
tELQX
tELQV
E (CHIP ENABLE)
Q (DATA OUT)
A (ADDRESS)
tELICCH
tAVQV
tGLQX
tGLQV
VCC
SUPPLY
CURRENT
HIGH–Z HIGH Z
G (OUTPUT ENABLE)
MCM6205D
5
MOTOROLA FAST SRAM
WRITE CYCLE 1 (W Controlled, See Notes 1, 2, and 3)
MCM6205D–15 MCM6205D–20 MCM6205D–25
Parameter Symbol Min Max Min Max Min Max Units Notes
Write Cycle Time tAVAV 15 20 25 ns 4
Address Setup Time tAVWL 0 0 0 ns
Address Valid to End of Write tAVWH 12 15 20 ns
Write Pulse Width tWLWH,
tWLEH 12 15 20 ns
Write Pulse Width, G High tWLWH,
tWLEH 10 12 15 ns 5
Data Valid to End of Write tDVWH 7 8 10 ns
Data Hold Time tWHDX 0 0 0 ns
Write Low to Output High–Z tWLQZ 0 7 0 8 0 10 ns 6, 7, 8
Write High to Output Active tWHQX 4 4 4 ns 6, 7, 8
Write Recovery Time tWHAX 0 0 0 ns
NOTES:
1. A write occurs during the overlap of E low and W low.
2. E1 and E2 are represented by E in this data sheet. E2 is of opposite polarity to E.
3. If G goes low coincident with or after W goes low, the output will remain in a high impedance state.
4. All timings are referenced from the last valid address to the first transitioning address.
5. If G VIH, the output will remain in a high impedance state.
6. At any given voltage and temperature, tWLQZ (max) is less than tWHQX (min), both for a given device and from device to device.
7. Transition is measured ±500 mV from steady–state voltage with load of Figure 1B.
8. This parameter is sampled and not 100% tested.
WRITE CYCLE 1 (W Controlled, See Notes 1, 2, and 3)
DATA VALID
tDVWH
tAVWL
tAVWH
tAVAV
tWHAX
tWLWH
tWHDX
tWLQZ tWHQX
HIGH–Z HIGH–Z
A (ADDRESS)
W (WRITE ENABLE)
E (CHIP ENABLE)
Q (DATA OUT)
D (DATA IN)
tWLEH
MCM6205D
6MOTOROLA FAST SRAM
WRITE CYCLE 2 (E Controlled, See Notes 1 and 2)
MCM6205D–15 MCM6205D–20 MCM6205D–25
Parameter Symbol Min Max Min Max Min Max Unit Notes
Write Cycle Time tAVAV 15 20 25 ns 3
Address Setup Time tAVEL 0 0 0 ns
Address Valid to End of Write tAVEH 12 15 20 ns
Enable to End of Write tELEH,
tELWH 10 12 15 ns 4, 5
Data Valid to End of Write tDVEH 7 8 10 ns
Data Hold Time tEHDX 0 0 0 ns
Write Recovery Time tEHAX 0 0 0 ns
NOTES:
1. A write occurs during the overlap of E low and W low.
2. E1 and E2 are represented by E in this data sheet. E2 is of opposite polarity to E.
3. All timings are referenced from the last valid address to the first transitioning address.
4. If E goes low coincident with or after W goes low, the output will remain in a high impedance state.
5. If E goes high coincident with or before W goes high, the output will remain in a high impedance state.
WRITE CYCLE 2 (E Controlled, See Notes 1 and 2)
tWLEH
tEHDX
tDVEH
tEHAX
tELWH
tELEH
tAVEL
tAVEH
DATA VALID
tAVAV
HIGH–Z
A (ADDRESS)
W (WRITE ENABLE)
E (CHIP ENABLE)
Q (DATA OUT)
D (DATA IN)
ORDERING INFORMATION
(Order by Full Part Number)
Motorola Memory Prefix
Part Number
Package (J = 300 mil SOJ)
Full Part Numbers — MCM6205DJ15 MCM6205DJ15R2
MCM6205DJ20 MCM6205DJ20R2
MCM6205DJ25 MCM6205DJ25R2
Shipping Method (R2 = Tape and Reel, Blank = Rails)
Speed (15 = 15 ns, 20 = 20 ns, 25 = 25 ns)
MCM 6205D X XX XX
MCM6205D
7
MOTOROLA FAST SRAM
CASE 857–02
32 LEAD
300 MIL SOJ
SS B0.25 (0.010)
SS A0.17 (0.007)
G
L
K
-A-
-X-
116
1732 M
F
D
P
-B-
EC
R S
NOTE 3
NOTE 4
NOTE 5
NOTE 5
RADIUS
32 PL
32 PL
DETAIL Z 0.10 (0.004)
SEATING
PLANE
-T-
MIN MINMAX MAX
MILLIMETERS INCHES
DIM
A
B
C
D
E
F
G
K
L
N
P
R
S
20.83
7.50
3.26
0.41
2.24
0.67
0.89
0.76
8.38
6.60
0.77
21.08
7.74
3.75
0.50
2.48
0.81
1.14
1.14
8.64
6.86
1.01
0.820
0.295
0.128
0.016
0.088
0.026
0.035
0.030
0.330
0.260
0.030
0.830
0.305
0.148
0.020
0.098
0.032
0.045
0.045
0.340
0.270
0.040
1.27 BSC
0.64 BSC
0.050 BSC
0.025 BSC
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. DATUM PLANE -X- LOCATED AT TOP OF MOLD
PARTING LINE AND COINCIDENT WITH TOP OF
LEAD, WHERE LEAD EXITS BODY.
4. TO BE DETERMINED AT PLANE -X-.
5. TO BE DETERMINED AT PLANE -T-.
6. DIMENSION A & B DO NOT INCLUDE MOLD
PROTRUSION. MOLD PROTRUSION SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
7. 857-01 IS OBSOLETE, NEW STANDARD 857-02.
SS A0.17 (0.007)
SS B0.17 (0.007)
PACKAGE DIMENSIONS
Motorola reserves the right to make changes without further notice to any products herein. Motorola makes no warranty , representation or guarantee regarding
the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit,
and specifically disclaims any and all liability , including without limitation consequential or incidental damages. “Typical” parameters can and do vary in different
applications. All operating parameters, including “T ypicals” must be validated for each customer application by customers technical experts. Motorola does
not convey any license under its patent rights nor the rights of others. Motorola products are not designed, intended, or authorized for use as components in
systems intended for surgical implant into the body , or other applications intended to support or sustain life, or for any other application in which the failure of
the Motorola product could create a situation where personal injury or death may occur. Should Buyer purchase or use Motorola products for any such
unintended or unauthorized application, Buyer shall indemnify and hold Motorola and its officers, employees, subsidiaries, affiliates, and distributors harmless
against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death
associated with such unintended or unauthorized use, even if such claim alleges that Motorola was negligent regarding the design or manufacture of the part.
Motorola and are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal Opportunity/Affirmative Action Employer .
MCM6205D
8MOTOROLA FAST SRAM
Literature Distribution Centers:
USA/EUROPE: Motorola Literature Distribution; P.O. Box 20912; Phoenix, Arizona 85036.
JAPAN: Nippon Motorola Ltd.; 4-32–1, Nishi–Gotanda, Shinagawa–ku, Tokyo 141, Japan.
ASIA PACIFIC: Motorola Semiconductors H.K. Ltd.; Silicon Harbour Center, No. 2 Dai King Street, Tai Po Industrial Estate, Tai Po, N.T., Hong Kong.
MCM6205D/D
*MCM6205D/D*
CODELINE TO BE PLACED HERE