SiSH402DN
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S18-0697-Rev.B, 09-Jul-2018 2Document Number: 75897
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Notes
a. Pulse test: pulse width 300 μs, duty cycle 2 %
b. Guaranteed by design, not subject to production testing
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-source breakdown voltage VDS VGS = 0 V, ID = 250 μA 30 - - V
VDS temperature coefficient VDS/TJID = 250 μA -24-
mV/°C
VGS(th) temperature coefficient VGS(th)/TJ--6-
Gate-source threshold voltage VGS(th) VDS = VGS , ID = 250 μA 1.15 - 2.2 V
Gate-source leakage IGSS VDS = 0 V, VGS = ± 20 V - - ± 100 nA
Zero gate voltage drain current IDSS
VDS = 30 V, VGS = 0 V - - 1 μA
VDS = 30 V, VGS = 0 V, TJ = 55 °C - - 5
On-state drain current aID(on) VDS 5 V, VGS = 10 V 50 - - A
Drain-source on-state resistance aRDS(on)
VGS = 10 V, ID = 19 A - 0.0048 0.0060
VGS = 4.5 V, ID = 16.6 A - 0.0064 0.0080
Forward transconductance agfs VDS = 15 V, ID = 19 A - 82 - S
Dynamic b
Input capacitance Ciss
VDS = 15 V, VGS = 0 V, f = 1 MHz
- 1700 -
pFOutput capacitance Coss - 350 -
Reverse transfer capacitance Crss - 140 -
Total gate charge Qg
VDS = 15 V, VGS = 10 V, ID = 19 A - 28 42
nC
VDS = 15 V, VGS = 4.5 V, ID = 19 A
-1221
Gate-source charge Qgs -5.4-
Gate-drain charge Qgd -4.6-
Gate resistance Rgf = 1 MHz - 1.2 2.4
Turn-on delay time td(on)
VDD = 15 V, RL = 1.5
ID 10 A, VGEN = 4.5 V, Rg = 1
-2540
ns
Rise time tr-2030
Turn-off delay time td(off) -2540
Fall time tf-1525
Turn-on delay time td(on)
VDD = 15 V, RL = 1.5
ID 10 A, VGEN = 10 V, Rg = 1
-1220
Rise time tr-1015
Turn-off delay time td(off) -2540
Fall time tf-1015
Drain-Source Body Diode Characteristics
Continuous source-drain diode current ISTC = 25 °C --30
A
Pulse diode forward current ISM --70
Body diode voltage VSD IS = 10 A, VGS = 0 V -0.81.2V
Body diode reverse recovery time trr
IF = 10 A, di/dt = 100 A/μs,
TJ = 25 °C
-2550ns
Body diode reverse recovery charge Qrr -1735nC
Reverse recovery fall time ta-13-ns
Reverse recovery rise time tb-12-