Product 1 08-1 622 ANP Specification o2Jan96 Rev O Connector, Z-PACK*, 8 Row, 2mm HM 1. SCOPE 1.1. Content This specification covers performance, tests and quality requirements for the Z7-PACK* 8 row, 2mm HM connector system. These connectors are two-piece devices to interconnect 2 printed circuit boards. Receptacle and pin connectors are through hole devices with ACTION PIN* contacts. Connectors are in 8 row configurations and can be upgraded to 10 row configuration. 1.2. Qualification When tests are performed on subject product line, procedures specified in IEC 512 (see Figure 8) shall be used. All inspections shal! be performed using applicable inspection plan and product drawing. 2. APPLICABLE DOCUMENTS The following documents form a part of this specification to the extent specified herein. Unless otherwise specified, latest edition of the document applies. In the event of conflict between requirements of this specification and product drawing, product drawing shall take precedence. In the event of conflict between requirements of this specification and referenced documents, this specification shall take precedence. 2.1. AMP Documents A. 109-1: General Requirements for Test Specifications B. 109 Series: Test Specifications as indicated in Figure 1. (Comply with MIL-STD-202, MIL- STD-1344 and EIA RS-364) Cc. Corporate Bulletin 401-76: Cross-reference between AMP Test Specifications and Military ort Commercial Documents D. 501-326: Test Report 2.2. Commercial Standards IEC 512: Test Specification 3. REQUIREMENTS 3.1. Design and Construction Product shall be of design, construction and physical dimensions specified on applicable product drawing. 3.2. Materials A. Coding devices: Polyamide 35% GF, UL94HB B. Contact: Phosphor bronze, gold over nickel plating in contact area C. Housing: Thermoplastic polyester, 20% GF, UL94V-0 AMP Incorporated, Harrisburg, PA AMP FAXTPRODUCT INFO 1-800-522-6752 This specification is a controlled document. For 4 of 9 latest revision call the AMP FAX number. Copyright 1995 by AMP Incorporated. All rights reserved Trademark LOC B | indicates change Form 404-38 23NOVO4ANP 3.3, Ratings A. Voltage: 750 vrms contact to contact B. Current: C. Temperature: -55 to 125C D. Air/creepage distance: 0.8mm minimum 3.4, Performance and Test Description 108-1622 Signal application only, 1.5 amperes per contact at 70C (fully loaded) Product is designed to meet electrical, mechanical and environmental performance requirements specified in Figure 1. Unless otherwise specified, all tests shall be performed at ambient environmental conditions per IEC 512-1. 3.5, Test Requirements and Procedures Summary Test Description Requirement Procedure Examination of product. Meets requirements of product drawing. IEC 512-2-1a. Visual, dimensional and functional per applicable quality inspection plan. ELECTRICAL Termination resistance. 50 millichms maximum initial. AR 5 milliohms maximum. IEC 512-2-2a. Subject mated contacts assembled in housing to 20 mv maximum open circuit at 100 ma maximum. See Figure 3. Dielectric withstanding voltage. 750 vac at sea level. IEC 512-2-4a, Method B. Test between 2 groups of alternate contacts of mated samples. Test between first group and second group connected to the housing or mounting plate. Then test between second group and first group connected to the housing or mounting plate. See Figure 4. insulation resistance. 10000 megohms minimum initial. 1000 megohms minimum final. IEC 12-2-3a, Method A. Test between each termination being tested and all others connected together, and between each termination being tested and the housing or mounting plate of mated samples. MECHANICAL Vibration, sinusoidal. No discontinuities of 1 microsecond or ionger duration. See Note (a). IEC 512-4-6d. Subject mated samples to 10-500- 10 Hz traversed in 6.27 minutes. 5.66 hours in each of 3 mutually perpendicular planes. See Figure 5. Figure 7 (cont) Rev O 209 Form 404-34 23Novo4ANP 108-1622 Test Description Requirement Procedure Physical shock. No discontinuities of 1 microsecond or longer duration. See Note (a). IEC 512-4-6c. Subject mated samples to 50 G's half-sine shock pulses of 11 milliseconds duration. 5 shocks in each direction applied along 3 mutually perpendicular planes, 30 total shocks. see Figure 5. Polarization force. 100 Newtons (22.48 pounds) minimum. See Note (a). IEC 512-7-13e. Attempt to mate samples oriented 180 out of phase at maximum rate of 12.7mm (.5 inch) per minute. Mating force. .75 Newton (2.7 ounces) maximum per contact. See Note (a). IEC 512-7-13e. Measure force necessary to mate samples at maximum rate of 12.7mm (.5 inch) per minute. Unmating force. .15 Newton (.5 ounce) minimum per contact. See Note (a). IEC 512-7-13e. Measure force necessary to unmate samples at maximum rate of 12.7mm (.5 inch) per minute. Contact retention force. 5 Newtons (1.1 pounds) minimum in mating direction. 10 Newtons (2.2 pounds) minimum in unmating direction. See Note (a). IEC 512-8-15a. Subject 20% of contacts to axial load in both directions at maximum rate of 10 Newtons per second until specified load is reached and hoid for 10 seconds. Module retention force. 74 Newtons (16.62 pounds) minimum. See Note (a). IEC 512-5-8a. Measure force required to separate module from housing. See Figure 6. ACTION PIN contact retention force. 20 Newtons (4.49 pounds) minimum. See Note (a). IEC 512-8-15a. Measure force required to separate ACTION PIN from the printed circuit board. Gage retention force. 15 grams (.53 ounce) minimum. See Note (a). {EC 512-8-16e, Method A. Insert and remove a .381mm (.015 inch) gage 3 times. Then insert a .355mm (.014 inch) gage and measure force required to remove. See Figure 7. Durability. See Note (a). IEC 512-5-9a. Mate and unmate samples for 250 cycles at maximum rate of 600 cycles per hour. Figure 1 (cont) Rev 0 3 o9 Form 404-34 23Nov94AN > 108-1622 Test Description Requirement Procedure ENVIRONMENTAL Thermal shock. See Note (a). JEC 512-6-1 1d. Subject mated samples to 5 cycles between -55 and 125C. Humidity-temperature cycling. See Note (a). IEC 12-6-11c, 11j, and 11m. Subject mated samples to 6, 24 hour cycles between 25 and 40C at 95% RH with -55C cold shock. Humidity, steady state. See Note (a). IEC 12-6-11c. Subject mated samples to steady state humidity of 93% and 40C for 21 days. Corrosion atmosphere. See Note (a). IEC 68-2-60. Subject mated and unmated samples to corrosion atmosphere for 4 days. Temperature life and electrical ioad. See Note (a). IEC 512-6-1 1i. Subject mated samples to temperature life at 87.5C for 1000 hours while energized with 1.25 amperes dc. Note: (a) Shall meet visual requirements, show no physical damage and shall meet requirements. of additional tests as specified in Test Sequence in Figure 2. Figure 1 (end) Rev O 49 Form 404-44 23Nov94AMF 108-1622 3.6, Product Qualification and Requalification Test Sequence Test Group (a) Test or Examination 1 2 3 4 5 6 Test Sequence (b) Examination of product 1,19 1,14 1,11 1,10 1,3 1,5 Termination resistance 2,16 | 2,8,10 2,8 2,7 . Dielectric withstanding voltage 4,12,15| 4,12 47 49 insulation resistance 3,11,14| 3,11 3,6 3.8 Vibration 8 Physical shock 9 Polarization force 2 Mating force 5,17 Unmating force 6,18 410 Contact retention force Module retention force ACTION PIN contact retention force 2 Gage retention force 7 5,13 Durability 6,9 5 Thermal shock 40 Humidity-temperature cycling 13 Humidity, steady state 5 Corrosion atmosphere 7 Temperature life & electrical load 6 Note: (a) See Para 4.1.A. {b) Numbers indicate sequence in which tests are performed. Figure 2 4. QUALITY ASSURANCE PROVISIONS 4.1. Qualification Testing A. Sample Selection Samples shall be prepared in accordance with applicable Instruction Sheets and shall be selected at random from current production. Test groups 1, 2, 3, 4, and 5 shall each consist of 3, 200 position male assemblies and 4, 200 position female assemblies. Test group 6 shall consist of 4, 176 position male assemblies and 4, 176 position female assemblies. B. Test Sequence Qualification inspection shall be verified by testing samples as specified in Figure 2. Rev 0 549 Form 404-34 Z3Nov34ANP 108-1622 4.2. Requalification Testing \f changes significantly affecting form, fit or function are made to product or manufacturing process, product assurance shall coordinate requalification testing, consisting of all or part of original testing sequence as determined by development/product, quality and reliability engineering. 43. Acceptance Acceptance is based on verification that product meets requirements of Figure 4. Failures attributed to equipment, test setup or operator deficiencies shall not disqualify product. When product failure occurs, corrective action shall be taken and samples resubmitted for qualification. Testing to confirm corrective action is required before resubmittal. 44. Quality Conformance Inspection Applicable AMP quality inspection plan will specify sampling acceptable quality level to be used. Dimensional and functional requirements shall be in accordance with applicable product drawing and this specification. Male Module Female Module Printed circuit hoard sufface Connection point Connection point Figure 3 Termination Resistance Measurement Points Rev O 6 9 Form 404-34 23Nav94AMP oD c s o T+ & -~@vdenan q , o = e @ 4 = = sf 7 w oe 1 oS t ~ = e = 4 oa qn @ 4 4 wwe i D = = 2 = a pa SE mee" \ \\ =A \ WN d bi E wy a 3 w 7/7: EN Female connecter Male connector108-1622 AMP { F3 at FY F2 | Le F3 Figure 6 Module Retention Force 0.15 595 | wT , 0.25 566 - al S [\ Roz I t | a | TK 8 | 0-5 05 a | LJ a : Application A Dimension | Mass (grams) Sizing 0.04 to 0.39 - Retention Force | 0.36 to 0.35 16 to 15 Figure 7 Gage Retention Force Rev 0 Bot 9 Form 404-34 23Nova4AMP 108-1622 Test AMP Test Specification {EC Specification Examination of product 512-2-1a Termination resistance 109-6-6, Condition F 512-2-2a Dielectric withstanding voltage 109-29-1 512-2-4a, Method B Insulation resistance 409-28-3, Condition C 512-2-3a, Method A Vibration 109-21-2, Condition B 512-4-6d Physical Shock 109-26-1 512-4-6 Polarization force 409-42, Condition A 512-7-13 Mating force 409-42, Condition A 512-7-13a Unmating force 109-42, Condition A 512-7-13a Contact retention force 109-30 512-8-15a Module retention force 109-30 512-5-8a ACTION PIN contact retention force 109-30 512-8-15a Gage retention force 109-30 512-8-16e, Method A Durability 109-27 512-5-9a Thermal shock 109-22 512-6-11d Humidity-temperature cycling 109-23-3 512-6-11, 11), 11m Humidity, steady state 109-23-2 512-6-11 Corrosion atmosphere 409-85 68-2-60 Temperature life & electrical load 109-43 512-6-1 11 Figure 8 Qualification Test Cross Reference Rev 0 909 Form 404-34 23Nov94