1
P/N:PM0439 REV. 0.9, AUG. 01, 1998
MX29F400T/B
4M-BIT [512Kx8/156Kx16] CMOS FLASH MEMORY
ADVANCED INFORMATION
Status Reply
- Data polling & Toggle bit for detection of program and
erase cycle completion.
Ready/Busy pin (RY/BY)
- Provides a hardware method of detecting program or
erase cycle completion.
- Sector protect/unprotect for 5V only system or 5V/12V
system.
Sector protection
- Hardware method to disable any combination of
sectors from program or erase operations
100,000 minimum erase/program cycles
Latch-up protected to 100mA from -1V to VCC+1V
Boot Code Sector Architecture
- T = Top Boot Sector
- B = Bottom Boot Sector
Low VCC write inhibit- 3.2V
Package type:
- 44-pin SOP
- 48-pin TSOP
Compatibility with JEDEC standard
- Pinout and software compatible with single-power
supply Flash
FEATURES
524,288 x 8/262,144 x 16 switchable
Single power supply operation
- 5.0V only operation for read, erase and program
operation
Fast access time: 70/90/120ns
Low power consumption
- 30mA maximum active current
- 1uA typical standby current
Command register architecture
- Byte/word Programming (7us/14us typical)
- Block Erase (Block structure 16K-Bytex1,
- 8K-Bytex2, 32K-Bytex1, and 64K-Byte x7)
Auto Erase (chip & block) and Auto Program
- Automatically erase any combination of sectors with
Erase Suspend capability.
- Automatically program and verify data at specified
address
Erase suspend/Erase Resume
- Suspends an erase operation to read data from, or
program data to, another sector that is not being erased,
then resumes the erase.
GENERAL DESCRIPTION
The MX29F400T/B is a 4-mega bit Flash memory orga-
nized as 512K bytes of 8 bits or 256K words of 16 bits.
MXIC's Flash memories offer the most cost-effective and
reliable read/write non-volatile random access memory.
The MX29F400T/B is packaged in 44-pin SOP, 48-pin
TSOP. It is designed to be reprogrammed and erased in-
system or in-standard EPROM prog rammers .
The standard MX29F400T/B off ers access times as f ast
as 70ns, allo wing oper ation of high-speed microproces-
sors without wait states. To eliminate bus contention, the
MX29F400T/B has separate chip enable (CE) and out-
put enab le (OE) controls.
MXIC's Flash memories augment EPROM functionality
with in-circuit electrical erasure and programming. The
MX29F400T/B uses a command register to manage this
functionality. The command register allows for 100% TTL
le v el control inputs and fix ed power supply le v els during
erase and programming, while maintaining maximum
EPROM compatibility.
MXIC Flash technology reliably stores memory contents
even after 100,000 erase and program cycles. The MXIC
cell is designed to optimize the er ase and programming
mechanisms. In addition, the combination of advanced
tunnel oxide processing and low internal electric fields
for erase and programming operations produces reliable
cycling. The MX29F400T/B uses a 5.0V±10% VCC sup-
ply to perform the High Reliability Erase and auto Pro-
gram/Erase algorithms.
The highest degree of latch-up protection is achieved with
MXIC's proprietary non-epi process. Latch-up protec-
tion is proved for stresses up to 100 milliamps on ad-
dress and data pin from -1V to VCC + 1V.
INDEX
2
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
PIN CONFIGURATIONS
44 SOP(500 mil)
PIN DESCRIPTION
SYMBOL PIN NAME
A0~A17 Address Input
Q0~Q14 Data Input/Output
Q15/A-1 Q15(Word mode)/LSB addr(Byte mode)
CE Chip Enable Input
WE Write Enable Input
BYTE Word/Byte Selction input
RESET Hardware Reset Pin/Sector Protect Unlock
OE Output Enable Input
RY/BY Ready/Busy Output
VCC Power Supply Pin (+5V)
GND Ground Pin
48 TSOP (Standard Type) (12mm x 20mm) 48 TSOP (Reverse Type) (12mm x 20mm)
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
NC
RY/BY
A17
A7
A6
A5
A4
A3
A2
A1
A0
CE
GND
OE
Q0
Q8
Q1
Q9
Q2
Q10
Q3
Q11
RESET
WE
A8
A9
A10
A11
A12
A13
A14
A15
A16
BYTE
GND
Q15/A-1
Q7
Q14
Q6
Q13
Q5
Q12
Q4
VCC
MX29F400T/B
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE
RESET
NC
NC
RY/BY
NC
A17
A7
A6
A5
A4
A3
A2
A1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
A16
BYTE
GND
Q15/A-1
Q7
Q14
Q6
Q13
Q5
Q12
Q4
VCC
Q11
Q3
Q10
Q2
Q9
Q1
Q8
Q0
OE
GND
CE
A0
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
MX29F400T/B
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE
RESET
NC
NC
RY/BY
NC
A17
A7
A6
A5
A4
A3
A2
A1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
A16
BYTE
GND
Q15/A-1
Q7
Q14
Q6
Q13
Q5
Q12
Q4
VCC
Q11
Q3
Q10
Q2
Q9
Q1
Q8
Q0
OE
GND
CE
A0
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
MX29F400T/B
INDEX
3
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
Sector Size Address Range (in hexadecimal)
(Kbytes/ (x8) (x16)
Sector A17 A16 A15 A1 4 A 13 A12 Kwords) Address Range Address Range
SA0 0 0 0 X X X 64/32 00000h-0FFFFh 00000h-07FFFh
SA1 0 0 1 X X X 64/32 10000h-1FFFFh 08000h-0FFFFh
SA2 0 1 0 X X X 64/32 20000h-2FFFFh 10000h-17FFFh
SA3 0 1 1 X X X 64/32 30000h-3FFFFh 18000h-1FFFFh
SA4 1 0 0 X X X 64/32 40000h-4FFFFh 20000h-27FFFh
SA5 1 0 1 X X X 64/32 50000h-5FFFFh 28000h-2FFFFh
SA6 1 1 0 X X X 64/32 60000h-6FFFFh 30000h-37FFFh
SA7 1 1 1 0 X X 32/16 70000h-77FFFh 38000h-3BFFFh
SA81111008/4 78000h-79FFFh 3C000h-3CFFFh
SA91111018/4 7A000h-7BFFFh 3D000h-3DFFFh
SA10 1 1111X16/8 7C000h-7FFFFh 3E000h-3FFFFh
Sector Size Address Range (in hexadecimal)
(Kbytes/ (x8) (x16)
Sector A17 A16 A15 A1 4 A 13 A12 Kwords) Address Range Address Range
SA000000X16/8 00000h-03FFFh 00000h-01FFFh
SA10000108/4 04000h-05FFFh 02000h-02FFFh
SA20000118/4 06000h-07FFFh 03000h-03FFFh
SA3 0 0 0 1 X X 32/16 08000h-0FFFFh 04000h-07FFFh
SA4 0 0 1 X X X 64/32 10000h-1FFFFh 08000h-0FFFFh
SA5 0 1 0 X X X 64/32 20000h-2FFFFh 10000h-17FFFh
SA6 0 1 1 X X X 64/32 30000h-3FFFFh 18000h-1FFFFh
SA7 1 0 0 X X X 64/32 40000h-4FFFFh 20000h-27FFFh
SA8 1 0 1 X X X 64/32 50000h-5FFFFh 28000h-2FFFFh
SA9 1 1 0 X X X 64/32 60000h-6FFFFh 30000h-37FFFh
SA10 1 1 1 X X X 64/32 70000h-7FFFFh 38000h-3FFFFh
Note: Address range is A17~A-1 in b yte mode and A17~A0 in word mode.
BLOCK STRUCTURE
MX29F400T TOP BOOT SECTOR ADDRESS TABLE
MX29F400B BOTTOM BOOT SECTOR ADDRESS TABLE
INDEX
4
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
BLOCK DIAGRAM
CONTROL
INPUT
LOGIC
PROGRAM/ERASE
HIGH V OLTAGE
WRITE
STATE
MACHINE
(WSM)
STATE
REGISTER
MX29F400T/B
FLASH
ARRAY
X-DECODER
ADDRESS
LATCH
AND
BUFFER
Y-PASS GATE
Y-DECODER
ARRAY
SOURCE
HV
COMMAND
DATA
DECODER
COMMAND
DATA LATCH
I/O BUFFER
PGM
DATA
HV
PROGRAM
DATA LATCH
SENSE
AMPLIFIER
Q0-Q15/A-1
A0-A17
CE
OE
WE
INDEX
5
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
AUTOMATIC PROGRAMMING
The MX29F400T/B is byte programmable using the Au-
tomatic Programming algorithm. The Automatic Program-
ming algorithm makes the external system do not need
to have time out sequence or to verify the data pro-
gr ammed. The typical room temperature chip program-
ming time of the MX29F400T/B is less than 4 seconds.
AUT OMATIC CHIP ERASE
The entire chip is bu lk erased using 10 ms erase pulses
according to MXIC's Automatic Chip Erase algorithm.
Typical erasure at room temperature is accomplished in
less than 4 second. The Automatic Erase algorithm au-
tomatically programs the entire array prior to electrical
erase. The timing and verification of electrical erase are
controlled internally within the device.
AUT OMATIC BLOCK ERASE
The MX29F400T/B is block(s) erasable using MXIC's Auto
Block Er ase algorithm. Block erase modes allow b loc ks
of the array to be erased in one erase cycle. The Auto-
matic Block Er ase algorithm automatically programs the
specified block(s) prior to electrical erase. The timing
and verification of electrical erase are controlled inter-
nally within the device .
AUTOMATIC PROGRAMMING ALGORITHM
MXIC's Automatic Programming algorithm requires the
user to only write program set-up commands (include 2
unlock write cycle and A0H) and a program command
(program data and address). The device automatically
times the programming pulse width, provides the program
verification, and counts the number of sequences. A sta-
tus bit similar to DATA polling and a status bit toggling
between consecutive read cycles, provides feedback to
the user as to the status of the prog ramming operation.
AUTOMATIC ERASE ALGORITHM
MXIC's Automatic Erase algorithm requires the user to
write commands to the command register using stan-
dard microprocessor write timings. The device will auto-
matically pre-program and verify the entire array. Then
the device automatically times the erase pulse width, pro-
vides the erase verification, and counts the number of
sequences. A status bit toggling between consecutive
read cycles, provides f eedbac k to the user as to the sta-
tus of the programming oper ation.
Register contents serve as inputs to an internal state-
machine which controls the erase and programming cir-
cuitry. During write cycles, the command register inter-
nally latches address and data needed f or the program-
ming and erase operations. During a system write cycle,
addresses are latched on the f alling edge, and data are
latched on the rising edge of WE .
MXIC's Flash technology combines years of EPROM
experience to produce the highest levels of quality, reli-
ability, and cost effectiveness. The MX29F400T/B elec-
trically erases all bits simultaneously using Fowler-
Nordheim tunneling. The b ytes are programmed b y us-
ing the EPROM programming mechanism of hot elec-
tron injection.
During a program cycle, the state-machine will control
the program sequences and command register will not
respond to any command set. During a Sector Erase
cycle, the command register will only respond to Er ase
Suspend command. After Erase Suspend is completed,
the device stays in read mode. After the state machine
has completed its task, it will allow the command register
to respond to its full command set.
INDEX
6
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
First Bus Second Bus Third Bus Fourth Bus Fifth Bus Sixth Bus
Command Bus Cycle Cycle Cycle Cycle Cycle Cycle
Cycle Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data
Reset 1 XXXH F0H
Read 1 RA RD
Read Silicon ID Word 4 555H AAH 2AAH 55H 555H 90H ADI DDI
Byte 4 AAAH AAH 555H 55H AAAH 90H ADI DDI
Porgram Word 4 555H AAH 2AAH 55H 555H A0H PA PD
Byte 4 AAAH AAH 555H 55H AAAH A0H PA PD
Chip Erase Word 6 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H 555H 10H
Byte 6 AAAH AAH 555H 55H AAAH 80H AAAH AAH 555H 55H AAAH 10H
Sector Erase Word 6 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H SA 30H
Byte 6 AAAH AAH 555H 55H AAAH 80H AAAH AAH 555H 55H SA 30H
Sector Erase Suspend 1 XXXH B0H
Sector Erase Resume 1 XXXH 30H
Unlock for sector 6 555H AAH 2AAH 55H 555H 80H 555H AAH 2AAH 55H 555H 20H
protect/unprotect
TABLE1. SOFTWARE COMMAND DEFINITIONS
Note that the Erase Suspend (B0H) and Erase Resume
(30H) commands are valid only while the Sector Er ase
operation is in progress. Either of the two reset com-
mand sequences will reset the device(when applicable).
COMMAND DEFINITIONS
Device operations are selected by writing specific address
and data sequences into the command register. Wr iting
incorrect address and data values or writing them in the
improper sequence will reset the device to the read mode.
Table 1 defines the valid register command sequences.
Note:
1. ADI = Address of Device identifier; A1=0, A0 = 0 for manufacture code,A1=0, A0 = 1 for device code.
(Refer to table 3)
DDI = Data of Device identifier : C2H for manufacture code, 23H/ABH for device code.
X = X can be VIL or VIH
RA=Address of memory location to be read.
RD=Data to be read at location RA.
2.PA = Address of memory location to be programmed.
PD = Data to be programmed at location PA.
SA = Address to the sector to be erased.
3.The system should generate the f ollowing address patterns: 555H or 2AAH to Address A10~A0 in word mode/AAAH or 555H
to Address A10~A-1 in byte mode.
Address bit A11~A17=X=Don't care for all address commands except for Program Address (PA) and Sector
Address (SA). Write Sequence may be initiated with A11~A17 in either state.
INDEX
7
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
Pins CE OE WE A0 A1 A6 A9 Q0 ~ Q7
Mode
Read Silicon ID L L H L L X VID(2) C2H
Manfacturer Code(1)
Read Silicon ID L L H H L X VID(2) 23H/ABH
De vice Code(1)
Read L L H A0 A1 A6 A9 DOUT
Standby H X X X X X X HIGH Z
Output Disable L H H X X X X HIGH Z
Write LHLA0A1A6A9 D
IN(3)
Sector Protect with 12V L VID(2) L X X L VID(2) X
system(6)
Chip Unprotect with 12V L VID(2) L X X H VID(2) X
system(6)
Verify Sector Protect L L H X H X VID(2) Code(5)
with 12V system
Sector Protect without 12V L H L X X L H X
system (6)
Chip Unprotect without 12V L H L X X H H X
system (6)
Verify Sector Protect/Unprotect L L H X H X H Code(5)
without 12V system (7)
Reset X X X X X X X HIGH Z
TABLE 2. MX29F400T/B BUS OPERATION
NOTES:
1. Manufacturer and device codes may also be accessed via a command register write sequence. Refer to Table 1.
2. VID is the Silicon-ID-Read high voltage, 11.5V to 13V.
3. Refer to Table 1 for valid Data-In during a write operation.
4. X can be VIL or VIH.
5. Code=00H means unprotected.
Code=01H means protected.
A17~A12=Sector address for sector protect.
6. Refer to sector protect/unprotect algorithm and waveform.
Must issue "unlock for sector protect/unprotect" command before "sector protect/unprotect without 12V system" command.
7. The "verify sector protect/unprotect without 12V sysytem" is only following "Sector protect/unprotect without 12V system"
command.
INDEX
8
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
READ/RESET COMMAND
The read or reset operation is initiated by writing the read/
reset command sequence into the command register.
Microprocessor read cycles retriev e arr ay data. The de-
vice remains enabled f or reads until the command regis-
ter contents are altered.
If program-fail or erase-fail happen, the write of F0H will
reset the device to abort the operation. A valid command
must then be written to place the device in the desired
state.
SILICON-ID-READ COMMAND
Flash memories are intended for use in applications where
the local CPU alters memory contents. As such, manu-
facturer and device codes must be accessible while the
device resides in the target system. PROM program-
mers typically access signature codes by raising A9 to a
high voltage. However, multiplexing high voltage onto ad-
dress lines is not generally desired system design prac-
tice.
The MX29F400T/B contains a Silicon-ID-Read operation
to supplement traditional PROM programming method-
ology. The operation is initiated by wr iting the read sili-
con ID command sequence into the command register.
Following the command write, a read cycle with
A1=VIL,A0=VIL retrieves the manufacturer code of C2H.
A read cycle with A1=VIL, A0=VIH returns the device code
of 23H for MX29F400T, ABH for MX29F400B .
SET-UP AUTOMATIC CHIP/BLOCK ERASE
Pins A0 A1 Q7 Q6 Q5 Q4 Q3 Q2 Q1 Q0 Code(Hex)
Manufacture code VIL VIL 1 1 0 0 0 0 1 0 C2H
De vice code VIH VIL 0 0 1 0 0 0 1 1 23H
for MX29F400T
De vice code VIH VIL 1 0 1 0 1 0 1 1 ABH
for MX29F400B
Protected Sector X VIH 0 0 0 0 0 0 0 1 01H
Unprotected Sector X VIH 0 0 0 0 0 0 0 0 00H
TABLE 3. EXPANDED SILICON ID CODE
COMMANDS
Chip erase is a six-bus cycle operation. There are two
"unlock" write cycles. These are followed by writing the
"set-up" command 80H. Two more "unlock" write cycles
are then f ollo wed b y the chip er ase command 10H.
The Automatic Chip Erase does not require the device to
be entirely pre-programmed prior to e x ecuting the Auto-
matic Chip Erase. Upon executing the Automatic Chip
Erase, the device automatically will program and verify
the entire memory for an all-zero data pattern. When the
device is automatically verified to contain an all-zero pat-
tern, a self-timed chip erase and verify begin. The erase
and verify operations are completed when the data on
Q7 is "1" at which time the device returns to the Read
mode. The system is not required to pro vide any control
or timing during these operations.
When using the Automatic Chip Erase algorithm, note
that the erase automatically terminates when adequate
erase margin has been achieved for the memory array(no
erase v erification command is required).
If the Erase operation w as unsuccessful, the data on Q5
is "1"(see Table 4), indicating an Erase Failure.
The automatic erase begins on the rising edge of the last
WE pulse in the command sequence and terminates
when the data on Q7 is "1" and the data on Q6 stops
toggling for two consecutive read cycles, at which time
the de vice returns to the Read mode.
INDEX
9
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
erase margin has been achieved for the memor y array
(no erase verification command is required). Sector erase
is a six-bus cycle operation. There are two "unlock" write
cycles. These are followed by writing the set-up com-
mand 80H. Two more "unloc k" write cycles are then f ol-
lowed by the sector erase command 30H. The sector
address is latched on the falling edge of WE, while the
command(data) is latched on the rising edge of WE. Block
addresses selected are loaded into internal register on
the sixth falling edge of WE. Each successive block load
cycle started by the falling edge of WE must begin within
80ms from the rising edge of the preceding WE. Other-
wise, the loading period ends and internal auto block erase
cycle starts. (Monitor Q3 to determine if the sector erase
timer window is still open, see section Q3, Sector Erase
Timer.) Any command other than Block Erase(30H) or
Erase Suspend(B0H) during the time-out period resets
the de vice to read mode .
ERASE COMMANDS
The Automatic Block Erase does not require the device
to be entirely pre-progr ammed prior to executing the A u-
tomatic Set-up Block Erase command and Automatic
Block Erase command. Upon executing the Automatic
Block Erase command, the device automatically will pro-
gr am and verify the bloc k(s) memory for an all-z ero data
pattern. The system is not required to provide any con-
trols or timing during these operations.
When the bloc k(s) is automatically v erified to contain an
all-zero pattern, a self-timed block erase and verify be-
gin. The erase and verify operations are complete when
the data on Q7 is "1" and the data on Q6 stops toggling
for two consecutive read cycles, at which time the device
returns to the Read mode. The system is not required to
provide an y control or timing during these operations.
When using the Automatic Block Erase algorithm, note
that the erase automatically terminates when adequate
Status Q7 Q6 Q5 Q3 Q2 RY/BY
Byte Program in Auto Program Algorithm Q7 Toggle 0 0 1 0
Auto Erase Algorithm 0 Toggle 0 1 Toggle 0
Erase Suspend Read 1 1 0 0 Toggle 1
In Progress (Erase Suspended Sector) (Note1)
Erase Suspended Mode Erase Suspend Read Data Data Data Data Data 1
(Non-Erase Suspended Sector)
Erase Suspend Program Q7 Toggle 0 0 1 0
(Non-Erase Suspended Sector) (Note2) (Note3)
Byte Program in Auto Program Algorithm Q7 Toggle 1 0 1 0
Exceeded Program/Erase in Auto Erase Algorithm 0 Toggle 1 1 N/A 0
Time Limits Erase Suspended Mode Erase Suspend Program Q7 Toggle 1 1 N/A 0
(Non-Erase Suspended Sector)
Table 4. Write Operation Status
Notes:
1.Performing successive read operations from the erase-suspended sector will cause Q2 to toggle.
2.Performing successive read operations from any address will cause Q6 to toggle.
3.Reading the byte address being programmed while in the erase-suspend program mode will indicate logic "1" at the Q2 bit.
However, successive reads from the erase-suspended sector will cause Q2 to toggle.
INDEX
10
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
ERASE SUSPEND
This command only has meaning while the state machine
is executing Automatic Block Erase operation, and there-
fore will only be responded during Automatic Block Erase
operation. However, When the Erase Suspend command
is written during the sector erase time-out, the device
immediately terminates the time-out period and suspends
the erase operation. After this command has been ex-
ecuted, the command register will initiate erase suspend
mode. The state machine will return to read mode auto-
matically after suspend is ready. At this time, state ma-
chine only allows the command register to respond to
the Read Memory Array, Erase Resume and program
commands.
The system can determine the status of the program
operation using the Q7 or Q6 status bits, just as in the
standard program operation. After an erase-suspend pro-
gram operation is complete, the system can once again
read arra y data within non-suspended bloc ks .
ERASE RESUME
This command will cause the command register to clear
the suspend state and return back to Sector Erase mode
but only if an Erase Suspend command was previously
issued. Erase Resume will not have any effect in all other
conditions.Another Erase Suspend command can be
written after the chip has resumed erasing.
SET-UP AUTOMATIC PROGRAM COMMANDS
To initiate Automatic Progr am mode, A three-cycle com-
mand sequence is required. There are two "unlock" write
cycles. These are f ollowed by writing the A utomatic Pro-
gram command A0H.
Once the Automatic Program command is initiated, the
ne xt WE pulse causes a tr ansition to an activ e program-
ming operation. Addresses are latched on the falling edge,
and data are internally latched on the rising edge of the
WE pulse. The r ising edge of WE also begins the pro-
gramming oper ation. The system is not required to pro-
vide further controls or timings. The device will automati-
cally provide an adequate internally generated program
pulse and verify margin.
If the program opetation was unsuccessful, the data on
Q5 is "1"(see Table 4), indicating a program failure. The
automatic programming operation is completed when the
data read on Q6 stops toggling f or two consecutiv e read
cycles and the data on Q7 and Q6 are equivalent to data
written to these two bits, at which time the device returns
to the Read mode(no program verify command is re-
quired).
DATA POLLING-Q7
The MX29F400T/B also features Data Polling as a
method to indicate to the host system that the Automatic
Program or Erase algorithms are either in progress or
completed.
While the Automatic Programming algorithm is in opera-
tion, an attempt to read the device will produce the
complement data of the data last written to Q7. Upon
completion of the Automatic Program Algorithm an at-
tempt to read the device will produce the true data last
written to Q7. The Data Polling feature is valid after the
rising edge of the fourth WE pulse of the f our write pulse
sequences f or automatic program.
While the A utomatic Erase algorithm is in operation, Q7
will read "0" until the erase operation is competed. Upon
completion of the erase operation, the data on Q7 will
read "1". The Data P olling feature is valid after the rising
edge of the sixth WE pulse of six write pulse sequences
f or automatic chip/sector erase .
The Data Polling feature is activ e during Automatic Pro-
gram/Erase algorithm or sector erase time-out.(see sec-
tion Q3 Sector Erase Timer)
RY/BY:Ready/Busy
The R Y/By is a dedicated, open-dr ain output pin that in-
dicates whether an A utomatic Erase/Progr am algorithm
is in progress or complete. The RY/BY status is valid af-
ter the rising edge of the final WE pulse in the command
sequence. Since R Y/BY is an open-drain output, se veral
R Y/BY pins can be tied together in parallel with a pull-up
resistor to Vcc.
If the output is low (Busy), the device is activ ely erasing
or programming. (This includes programming in the Erase
Suspend mode.)If the output is high (Ready), the de vice
is ready to read array data (including during the Erase
Suspend mode), or is in the standby mode .
Table 4 shows the outputs f or RY/BY.
INDEX
11
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
Q2:Toggle Bit II
The "Toggle Bit II" on Q2, when used with Q6, indicates
whether a par ticular sector is actively eraseing (that is,
the Automatic Erase alorithm is in process), or whether
that sector is erase-suspended. Toggle Bit I is valid after
the rising edge of the final WE pulse in the command
sequence.
Q2 toggles when the system reads at addresses within
those sectors that hav e been selected for erasure . (The
system may use either OE or CE to control the read
cycles.) But Q2 cannot distinguish whether the sector is
actively erasing or is erase-suspended. Q6, by compari-
son, indicates whether the device is actively erasing, or
is in Erase Suspend, but cannot distinguish which sec-
tors are selected f or erasure. Thus , both status bits are
required for sectors and mode information. Refer to Table
4 to compare outputs f or Q2 and Q6.
Reading Toggle Bits Q6/ Q2
Whenever the system initially begins reading toggle bit
status, it must read Q7-Q0 at least twice in a row to de-
termine whether a toggle bit is toggling. Typically, the
system would note and store the value of the toggle bit
after the first read. After the second read, the system
would compare the new value of the toggle bit with the
first. If the toggle bit is not toggling, the de vice has com-
pleted the program or er ase operation. The system can
read arra y data on Q7-Q0 on the following read cycle.
However, if after the initial two read cycles, the system
determines that the toggle bit is still toggling, the system
also should note whether the value of Q5 is high (see
the section on Q5). If it is, the system should then deter-
mine again whether the toggle bit is toggling, since the
toggle bit may have stopped toggling just as Q5 went
high. If the toggle bit is no longer toggling, the device
has successfuly completed the program or erase opera-
tion. If it is still toggling, the device did not complete the
operation successfully, and the system must write the
reset command to return to reading array data.
The remaining scenario is that system initially determines
that the toggle bit is toggling and Q5 has not gone high.
The system may continue to monitor the toggle bit and
Q5 through successive read cycles, determining the sta-
tus as described in the previous paragraph. Alternatively,
it may choose to perform other system tasks. In this
case, the system m ust start at the beginning of the algo-
rithm when it retur ns to deter mine the status of the op-
eration.
Q6:Toggle BIT I
Toggle Bit I on Q6 indicates whether an Automatic Pro-
gram or Erase algorithm is in progress or complete, or
whether the device has entered the Erase Suspend mode.
Toggle Bit I may be read at any address, and is valid after
the rising edge of the final WE pulse in the command
sequence(prior to the program or erase operation), and
during the sector time-out.
During an Automatic Prog ram or Erase algorithm opera-
tion, successive read cycles to an y address cause Q6 to
toggle. The system may use either OE or CE to control
the read cycles. When the operation is complete, Q6 stops
toggling.
After an erase command sequence is written, if all sec-
tors selected for erasing are protected, Q6 toggles and
returns to reading array data. If not all selected sectors
are protected, the A utomatic Erase algorithm erases the
unprotected sectors, and ignores the selected sectors
that are protected.
The system can use Q6 and Q2 together to determine
whether a sector is actively erasing or is erase sus-
pended. When the de vice is activ ely er asing (that is, the
Automatic Erase algorithm is in progress), Q6 toggling.
When the device enters the Erase Suspend mode, Q6
stops toggling. However , the system must also use Q2 to
determine which sectors are erasing or erase-suspended.
Alternatively, the system can use Q7.
If a program address falls within a protected sector, Q6
toggles for approximately 2 us after the program com-
mand sequence is written, then returns to reading arra y
data.
Q6 also toggles during the erase-suspend-program mode,
and stops toggling once the Automatic Program algorithm
is complete.
Table 4 shows the outputs f or Toggle Bit I on Q6.
INDEX
12
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
Q5 Q3
Exceeded Timing Limits
Q5 will indicate if the program or erase time has exceeded
the specified limits(internal pulse count). Under these
conditions Q5 will produce a "1". This time-out condition
indicates that the program or erase cycle was not suc-
cessfully completed. Data P olling and Toggle Bit are the
only operating functions of the device under this condi-
tion.
If this time-out condition occurs during sector erase op-
eration, it specifies that a particular sector is bad and it
may not be reused. Howe ver , other sectors are still func-
tional and may be used for the program or erase opera-
tion. The device must be reset to use other sectors. Write
the Reset command sequence to the device, and then
e x ecute program or er ase command sequence. This al-
lows the system to contin ue to use the other active sec-
tors in the de vice .
If this time-out condition occurs during the chip erase op-
eration, it specifies that the entire chip is bad or combina-
tion of sectors are bad.
If this time-out condition occurs during the byte program-
ming operation, it specifies that the entire sector contain-
ing that byte is bad and this sector maynot be reused,
(other sectors are still functional and can be reused).
The time-out condition ma y also appear if a user tries to
program a non blank location without erasing. In this case
the de vice locks out and ne v er completes the A utomatic
Algorithm operation. Hence, the system never reads a
v alid data on Q7 bit and Q6 nev er stops toggling. Once
the Device has exceeded timing limits, the Q5 bit will
indicate a "1". Please note that this is not a device f ailure
condition since the de vice w as incorrectly used.
DATA PROTECTION
The MX29F400T/B is designed to offer protection against
accidental erasure or programming caused by spurious
system level signals that may exist during power transi-
tion. During power up the device automatically resets
the state machine in the Read mode. In addition, with its
control register architecture, alteration of the memory
contents only occurs after successful completion of spe-
cific command sequences. The device also incorporates
several features to prevent inadver tent write cycles re-
sulting from VCC power-up and power-down transition or
system noise.
Sector Erase Timer
After the completion of the initial sector erase command
sequence, the sector erase time-out will begin. Q3 will
remain low until the time-out is complete. Data Polling
and Toggle Bit are valid after the initial sector erase com-
mand sequence.
If Data P olling or the Toggle Bit indicates the device has
been written with a valid erase command, Q3 may be
used to determine if the sector erase timer window is still
open. If Q3 is high ("1") the inter nally controlled erase
cycle has begun; attempts to write subsequent com-
mands to the device will be ignored until the erase op-
eration is completed as indicated by Data Polling or Toggle
Bit. If Q3 is low ("0"), the device will accept additional
sector erase commands. To insure the command has
been accepted, the system software should check the
status of Q3 prior to and follo wing each subsequent sec-
tor erase command. If Q3 were high on the second sta-
tus check, the command may not ha v e been accepted.
WRITE PULSE "GLITCH" PROTECTION
Noise pulses of less than 5ns(typical) on CE or WE will
not initiate a write cycle.
LOGICAL INHIBIT
Writing is inhibited by holding any one of OE = VIL, CE =
VIH or WE = VIH. To initiate a write cycle CE and WE
must be a logical z ero while OE is a logical one.
POWER SUPPLY DECOUPLING
In order to reduce power switching effect, each device
should have a 0.1uF ceramic capacitor connected be-
tween its VCC and GND.
INDEX
13
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
SECTOR PROTECTION WITH 12V SYSTEM
The MX29F400T/B features hardware sector protection.
This feature will disable both program and erase opera-
tions f or these sectors protected. To activate this mode ,
the programming equipment m ust force VID on address
pin A9 and control pin OE, (suggest VID = 12V) A6 = VIL
and CE = VIL.(see Table 2) Programming of the protec-
tion circuitry begins on the falling edge of the WE pulse
and is terminated on the rising edge. Please refer to
sector protect algorithm and wa vef orm.
To verify programming of the protection circuitry , the pro-
gramming equipment must force VID on address pin A9 (
with CE and OE at VIL and WE at VIH). When A1=1, it
will produce a logical "1" code at device output Q0 for a
protected sector . Otherwise the device will produce 00H
for the unprotected sector. In this mode, the
addresses,except for A1, are don't care. Address loca-
tions with A1 = VIL are reserved to read manufacturer
and device codes .(Read Silicon ID)
It is also possible to determine if the sector is protected
in the system by writing a Read Silicon ID command.
P erforming a read operation with A1=VIH, it will produce
a logical "1" at Q0 f or the protected sector.
CHIP UNPROTECT WITH 12V SYSTEM
The MX29F400T/B also features the chip unprotect mode,
so that all sectors are unprotected after chip unprotect is
completed to incorporate any changes in the code. It is
recommended to protect all sectors before activating chip
unprotect mode.
To activate this mode, the programming equipment must
force VID on control pin OE and address pin A9. The CE
pins must be set at VIL. Pins A6 must be set to VIH.(see
Table 2) Refer to chip unprotect algorithm and waveform
for the chip unprotect algorithm. The unprotection
mechanism begins on the falling edge of the WE pulse
and is terminated on the rising edge.
It is also possible to determine if the chip is unprotected in
the system by writing the Read Silicon ID command.
Performing a read operation with A1=VIH, it will produce
00H at data outputs(Q0-Q7) for an unprotected sector. It
is noted that all sectors are unprotected after the chip
unprotect algorithm is completed.
PO WER-UP SEQ UENCE
The MX29F400T/B powers up in the Read only mode. In
addition, the memory contents ma y only be altered after
successful completion of the predefined command se-
quences.
SECTOR PROTECTION WITHOUT 12V
SYSTEM
The MX29F400T/B also feature a hardware sector
protection method in a system without 12V power suppply.
The programming equipment do not need to supply 12
volts to protect sectors. The details are shown in sector
protect algorithm and waveform.
CHIP UNPROTECT WITHOUT 12V SYSTEM
The MX29F400T/B also feature a hardware chip
unprotection method in a system without 12V power
supply. The programming equipment do not need to
supply 12 volts to unprotect all sectors. The details are
shown in chip unprotect algorithm and waveform.
ABSOLUTE MAXIMUM RATINGS
RATING VALUE
Ambient Operating Temperature 0oC to 70oC
Storage Temperature -65oC to 125oC
Applied Input Voltage -0.5V to 7.0V
Applied Output Voltage -0.5V to 7.0V
VCC to Ground P otential -0.5V to 7.0V
A9 & OE -0.5V to 13.5V
NOTICE:
Stresses greater than those listed under ABSOLUTE MAXI-
MUM RATINGS ma y cause permanent damage to the device.
This is a stress rating only and functional oper ational sections
of this specification is not implied. Exposure to absolute maxi-
mum rating conditions for extended period may affect reliabil-
ity.
NOTICE:
Specifications contained within the following tables are sub-
ject to change.
INDEX
14
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
CAPACITANCE TA = 25oC, f = 1.0 MHz
SYMBOL PARAMETER MIN. TYP MAX. UNIT CONDITIONS
CIN Input Capacitance 8 pF VIN = 0V
COUT Output Capacitance 12 pF VOUT = 0V
READ OPERATION
DC CHARACTERISTICS TA = 0oC T O 70oC, VCC = 5V±±
±±
±10%
SYMBOL PARAMETER MIN. TYP MAX. UNIT CONDITIONS
ILI Input Leakage Current 1 uA VIN = GND to VCC
ILO Output Leakage Current 10 uA VOUT = GND to VCC
ISB1 Standby VCC current 1 mA CE = VIH
ISB2 1 5 uA CE = VCC + 0.3V
ICC1 Operating VCC current 30 mA IOUT = 0mA, f=1MHz
ICC2 50 mA IOUT= 0mA, f=10MHz
VIL Input Low Voltage -0.3(NOTE 1) 0.8 V
VIH Input High Voltage 2.0 VCC + 0.3 V
VOL Output Low Voltage 0.45 V IOL = 2.1mA
VOH Output High Voltage 2. 4 V IOH = -400uA
NOTES:
1.VIL min. = -1.0V for pulse width50 ns.
VIL min. = -2.0V for pulse width 20 ns.
2.VIH max. = VCC + 1.5V for pulse width 20 ns
If VIH is over the specified maximum value, read operation
cannot be guaranteed.
AC CHARACTERISTICS TA = 0oC to 70oC, VCC = 5V ± ±
± ±
± 10%
29F400T/B-70 29F400T/B-90 29F400T/B-12
SYMBOL PARAMETER MIN. MAX. MIN. MAX. MIN. MAX. UNIT CONDITIONS
tACC Address to Output Delay 70 90 120 n s CE=OE=VIL
tCE CE to Output Delay 70 90 120 n s OE=VIL
tOE OE to Output Delay 40 40 50 ns CE=VIL
tDF OE High to Output Float (Note1) 0 20 0 30 0 30 ns CE=VIL
tOH Address to Output hold 0 0 0 ns CE=OE=VIL
NOTE:
1. tDF is defined as the time at which the output achieves the
open circuit condition and data is no longer driven.
TEST CONDITIONS:
Input pulse levels: 0.45V/2.4V
Input rise and fall times: 10ns
Output load: 1 TTL gate + 100pF (Including scope and
jig)
Reference levels for measuring timing: 0.8V, 2.0V
INDEX
15
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
READ TIMING WA VEFORMS
Addresses
CE
OE
tACC
WE
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VOH
VOL
HIGH Z HIGH Z
D ATA V alid
tOE tDF
tCE
Outputs
tOH
ADD V alid
COMMAND PROGRAMMING/DATA PROGRAMMING/ERASE OPERATION
NOTES:
1. VIL min. = -0.6V for pulse width 20ns.
2. If VIH is over the specified maximum value, programming
operation cannot be guranteed.
3. ICCES is specified with the device de-selected. If the de-
vice is read during erase suspend mode, current dra w is the
sum of ICCES and ICC1 or ICC2.
4. All current are in RMS unless otherwise noted.
DC CHARA CTERISTICS TA = 0oC to 70oC , VCC = 5V ± 10%
SYMBOL PARAMETER MIN. TYP MAX. UNIT CONDITIONS
ICC1 (Read) Operating VCC Current 30 mA IOUT=0mA, f=1MHz
ICC2 50 mA IOUT=0mA, F=10MHz
ICC3 (Program) 50 mA In Programming
ICC4 (Erase) 50 mA In Erase
ICCES VCC Erase Suspend Current 2 mA CE=VIH, Erase Suspended
INDEX
16
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
AC CHARACTERISTICS TA = 0oC to 70oC, VCC = 5V ±±
±±
± 10%
29F400T/B-70 29F400T/B-90 29F400T/B-12
SYMBOL PARAMETER MIN. MAX. MIN. MAX. MIN. MAX. UNIT CONDITIONS
tOES OE setup time 50 50 50 n s
tCWC Command programming cycle 70 90 120 ns
tCEP WE programming pulse width 35 45 50 ns
tCEPH1 WE programming pluse width High 20 20 20 n s
tCEPH2 WE programming pluse width High 20 20 20 n s
tAS Address setup time 0 0 0 ns
tAH Address hold time 45 45 50 ns
tDS Data setup time 30 45 50 ns
tDH Data hold time 0 0 0 ns
tCES CE setup time 0 0 0 ns
tCESC CE setup time before command write 0 0 0 ns
tDF Output disable time (Note 1) 30 40 40 ns
tVA Verify access time 70 90 120 ns
tAETC Total erase time in auto chip erase 4(TYP.) 4(TYP.) 4(TYP.) s
tAETB Total erase time in auto block erase 1(TYP.) 1(TYP.) 1(TYP.) s
tAVT Total programming time in auto verify 7/14 7/14 7/14 us
(byte/ word program time)
tET Standby time in erase 10 10 10 ms
tBALC Block address load cycle 0.3 30 0.3 30 0.3 30 us
tBAL Block address load time 80 80 80 us
tCH CE Hold Time 0 0 0 ns
tCS CE setup to WE going low 0 0 0 ns
tVLHT Voltge Transition Time 4 4 4 us
tOESP OE Setup Time to WE Active 4 4 4 us
tWPP1 Write pulse width for sector protect 10 10 10 us
tWPP2 Write pulse width for sector unprotect 12 12 12 ms
NOTES:
1. tDF defined as the time at which the output achieves the
open circuit condition and data is no longer driven.
INDEX
17
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
SWITCHING TEST CIRCUITS
SWITCHING TEST WAVEFORMS
DEVICE UNDER
TEST
DIODES=IN3064
OR EQUIVALENT
CL 6.2K ohm
1.8K ohm +5V
CL=100pF Including jig capacitance
2.0V 2.0V
0.8V
0.8V
TEST POINTS
2.4V
0.45V
AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".
Input pulse rise and fall times are <20ns.
OUTPUT
INPUT
COMMAND WRITE TIMING W A VEFORM
Addresses
CE
OE
WE
DIN
tDS
tAH
Data
tDH
tCS tCH
tCWC
tCEPH1
tCEP
tOES
tAS
VCC
5V
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
ADD V alid
INDEX
18
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
AUTOMATIC PROGRAMMING TIMING
AUTOMATIC PROGRAMMING TIMING WAVEFORM (WORD MODE)
WAVEFORM
One byte data is programmed. Verify in fast algorithm
and additional programming by exter nal control are not
required because these operations are executed auto-
matically by internal control circuit. Programming comple-
tion can be verified by D ATA polling and toggle bit check-
ing after automatic verification starts. Device outputs
D ATA during programming and DATA after programming
on Q7.(Q6 is for toggle bit; see toggle bit, DATA polling,
timing wa vef orm)
tCWC
tAS
tCEP
tDS tDH tDF
Vcc 5V
CE
OE
Q0,Q1,
Q4(Note 1)
WE
A11~A17
tCEPH1
tAH
ADD V alid
tCESC
Q7
Command In
ADD V alid
A0~A10
Command InCommand In Data In DATA
Command In Command InCommand In Data In DATADATA
tAVT
tOE
DATA polling
2AAH
555H 555H
(Q0~Q7)
Command #55H Command #A0H
Notes:
(1). Q6:Toggle bit, Q5:Timing-limit bit, Q3: Time-out bit, Q2: Toggle bit
Command #AAH
INDEX
19
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
AUTOMATIC PROGRAMMING ALGORITHM FLOWCHART (WORD MODE)
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Program Data/Address
Write Data A0H Address 555H
YES
NO
Toggle Bit Checking
Q6 not Toggled
Verify Byte Ok
YES
Q5 = 1
Reset
Auto Program Completed
Auto Program Exceed
Timing Limit
NO
Invalid
Command
YES
NO
INDEX
20
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
AUTOMATIC CHIP ERASE TIMING WAVEFORM
All data in chip are erased. External er ase verification is
not required because data is erased automatically by
internal control circuit. Erasure completion can be veri-
fied by DATA polling and toggle bit checking after auto-
matic erase starts. De vice outputs 0 during erasure and
1 after erasure on Q7.(Q6 is f or toggle bit; see toggle bit,
D ATA polling, timing wa vef orm)
AUTOMATIC CHIP ERASE TIMING WAVEFORM (WORD MODE)
tCWC
tAS
tCEP
tDS tDH tDF
Vcc 5V
CE
OE
Q0,Q1,
Q4(Note 1)
WE
A11~A17
tCEPH1
tAH
tCESC
Q7
Command In
A0~A10
Command InCommand In
Command In Command InCommand In
tAETC
tDPA
DATA polling
2AAH
555H 555H
Command #AAH Command #55H Command #80H
(Q0~Q7)
Notes:
(1). Q6:Toggle bit, Q5:Timing-limit bit, Q3: Time-out bit, Q2: Toggle bit
555H 2AAH 555H
Command In
Command In
Command #AAH
Command In
Command In
Command #55H
Command In
Command In
Command #10H
INDEX
21
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
AUTOMATIC CHIP ERASE ALGORITHM FLOWCHART (WORD MODE)
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data AAH Address 555H
Write Data 80H Address 555H
YES
NO
Toggle Bit Checking
Q6 not Toggled
Write Data 10H Address 555H
Write Data 55H Address 2AAH
Reset
Auto Chip Erase Exceed
Timing Limit
DATA Polling
Q7 = 1 YES
Q5 = 1
Auto Chip Erase Completed
NO
NO
Invalid
Command
INDEX
22
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
AUTOMATIC BLOCK ERASE TIMING
AUTOMATIC BLOCK ERASE TIMING WAVEFORM (WORD MODE)
WAVEFORM
Block data indicated b y A12 to A17 are erased. External
erase v erify is not required because data are erased au-
tomatically by internal control circuit. Erasure comple-
tion can be verified by DAT A polling and toggle bit chec k-
ing after automatic erase starts. Device outputs 0 during
erasure and 1 after erasure on Q7.(Q6 is for toggle bit;
see toggle bit, D ATA polling, timing wa v ef orm)
tCWC
tAS
tCEP
tDS tDH tDF
Vcc 5V
CE
OE
Q0,Q1,
Q4(Note 1)
WE
A12~A17
tCEPH1
tAH
tCESC
Q7
Command In
A0~A10
Command InCommand In
Command In Command InCommand In
tAETB
tDPA
DATA polling
2AAH
555H 555H
Command #AAH Command #55H Command #80H
(Q0~Q7)
Notes:
(1). Q6:Toggle bit, Q5:Timing-limit bit, Q3: Time-out bit, Q2: Toggle bit
555H 2AAH
Command In
Command In
Command #AAH
Command In
Command In
Command #55H
Command In
Command In
Command #30H
Block
Address 0 Block
Address 1
tBAL
tCEPH2
Block
Address N
Command In Command In
Command In
Command #30H
Command In
Command #30H
INDEX
23
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
AUTOMATIC BLOCK ERASE ALGORITHM FLOWCHART (WORD MODE)
START
Write Data AAH Address 555H
Write Data 55H Address 2AAH
Write Data AAH Address 555H
Write Data 80H Address 555H
YES
NO
Toggle Bit Checking
Q6 not Toggled
Write Data 30H Sector Address
Write Data 55H Address 2AAH
Reset
Auto Block Erase Exceed
Timing Limit
DATA Polling
Q7 = 1
Q5 = 1
Auto Block Erase Completed
Load Other Sector Addrss If Necessary
(Load Other Sector Address)
YES
NO
Last Block
to Erase
Time-out Bit
Checking Q3=1 ?
Toggle Bit Checking
Q6 Toggled ? Invalid Command
NO
YES
YES
NO
INDEX
24
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
ERASE SUSPEND/ERASE RESUME FLOWCHART
START
Write Data B0H
Toggle Bit checking Q6
not toggled
YES
NO
Write Data 30H
Continue Erase
Reading or
Programming End
Read Array or
Program
Another
Erase Suspend ? NO
YES
YES
NO
INDEX
25
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
TIMING WAVEFORM FOR CHIP UNPROTECTION FOR SYSTEM WITH 12V
TIMING WAVEFORM FOR SECTOR PROTECTION FOR SYSTEM WITH 12V
tOE
Data
OE
WE
12V
5V
12V
5V
CE
A9
A1
A6
tOESP
tWPP 1
tVLHT
tVLHT
tVLHT
Verify
01H
A17-A12 Sector Address
tOE
Data
OE
WE
12V
5V
12V
5V
CE
A9
A1
tOESP
tWPP 2
tVLHT
tVLHT
tVLHT
Verify
00H
A6
Sector Address
A17-A12
INDEX
26
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
SECTOR PROTECTION ALGORITHM FOR SYSTEM WITH 12V
START
Set Up Sector Addr
(A17,A16,A15,A14,A13,A12)
PLSCNT=1
Sector Protection
Complete
Data=01H?
Yes
OE=VID,A9=VID,CE=VIL
A6=VIL
Activate WE Pulse
Time Out 10us
Set WE=VIH, CE=OE=VIL
A9 should remain VID
Read from Sector
Addr=SA, A1=1
Protect Another
Sector?
Remove VID from A9
Write Reset Command
Device Failed
PLSCENT=32?
Yes
No
No
INDEX
27
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
CHIP UNPROTECTION ALGORITHM FOR SYSTEM WITH 12V
START
Protect All Sectors
PLSCNT=1
Chip Unprotect
Complete
Data=00H?
Yes
Set OE=A9=VID
CE=VIL,A6=1
Activate WE Pulse
Time Out 12ms
Set OE=CE=VIL
A9=VID,A1=1
Set Up First Sector Addr
All sectors have
been verified?
Remove VID from A9
Write Reset Command
Device Failed
PLSCENT=1000?
No
Increment
PLSCENT
No
Read Data from Device
Yes
Yes
No
Increment
Sector Addr
* It is recommended before unprotect whole chip, all sectors should be protected in advance.
INDEX
28
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
TIMING WAVEFORM FOR SECTOR PROTECTION FOR SYSTEM WITHOUT 12V
TIMING WAVEFORM FOR CHIP UNPROTECTION FOR SYSTEM WITHOUT 12V
tOE
Data
WE
5V
CE
A9
A1
Verify
00H
A6
Note: Must issue "unlock for sector protect/unprotect" command
before sector unprotection for a system without 12V provided.
Sector
Addresss
A15-A12
OE
tCEP
5V
Toggle bit polling
Don't care
* See the following Note!
tOE
Data
OE
WE
5V
CE
A9
A1
A6
* See the following Note!
Verify
01H
A15-A12 Sector Address
5V
Note: Must issue "unlock for sector protect/unprotect" command
before sector protection for a system without 12V provided.
Toggle bit polling
Don't care
tCEP
INDEX
29
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
SECTOR PROTECTION ALGORITHM FOR SYSTEM WITHOUT 12V
START
Set Up Sector Addr
(A17,A16,A15,A14,A13,A12)
PLSCNT=1
Sector Protection
Complete
Data=01H?
Yes
OE=VIH,A9=VIH
CE=VIL,A6=VIL
Activate WE Pulse to start
Data don't care
Set CE=OE=VIL
A9=VIH
Read from Sector
Addr=SA, A1=1
Protect Another
Sector?
Write Reset Command
Device Failed
PLSCENT=32?
Yes
No
Increment PLSCNT
No
Write "unlock for sector protect/unprotect"
Command(Table1)
Toggle bit checking
Q6 not Toggled No
Yes
INDEX
30
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
CHIP UNPROTECTION ALGORITHM FOR SYSTEM WITHOUT 12V
START
Protect All Sectors
PLSCNT=1
Chip Unprotect
Complete
Data=00H?
Yes
Set OE=A9=VIH
CE=VIL,A6=1
Activate WE Pulse to start
Data don't care
Set OE=CE=VIL
A9=VIH,A1=1
Set Up First Sector Addr
All sectors have
been verified?
Write Reset Command
Device Failed
PLSCENT=1000?
No
Increment
PLSCENT
No
Read Data from Device
Yes
Yes
No
Increment
Sector Addr
* It is recommended before unprotect whole chip, all sectors should be protected in advance.
Write "unlock for sector protect/unprotect"
Command (Table 1)
Toggle bit checking
Q6 not Toggled
Yes
No
INDEX
31
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
ID CODE READ TIMING WAVEFORM
tACC
tCE
tACC
tOE
tOH tOH
tDF
DATA OUT
C2H 58H/59H
VID
VIH
VIL
ADD
A9
ADD
A1-A8
A10-A16
CE
OE
WE
ADD
A0
DATA OUT
DATA
Q0-Q7
VCC 5V
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
VIH
VIL
INDEX
32
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
ORDERING INFORMATION
PLASTIC PACKAGE (Top Boot Sector as an sample. For Bottom Boot Sector ones,MX29F400Txx will
change to MX29F400Bxx)
PAR T NO. A CCESS TIME OPERATING CURRENT STANDBY CURRENT PA C KA GE
(ns) MAX.(mA) MAX.(uA)
MX29F400TMC-70 70 50 100 44 Pin SOP
MX29F400TMC-90 90 50 100 44 Pin SOP
MX29F400TMC-12 120 50 100 44 Pin SOP
MX29F400TTC-70 70 50 100 48 Pin TSOP
(Normal T ype)
MX29F400TTC-90 90 50 100 48 Pin TSOP
(Normal T ype)
MX29F400TTC-12 120 50 100 48 Pin TSOP
(Normal T ype)
MX29F400TRC-70 7 0 50 10 0 48 Pin TSOP
(Reverse Type)
MX29F400TRC-90 9 0 50 10 0 48 Pin TSOP
(Reverse Type)
MX29F400TRC-12 1 20 50 10 0 48 Pin TSOP
(Reverse Type)
INDEX
33
P/N:PM0439
MX29F400T/B
REV. 0.9, AUG. 01, 1998
ITEM MILLIMETERS INCHES
A 20.0 ± .20 .787 ± .008
B 18.40 ± .10 .724 ± .004
C 12.20 max. .480 max.
D 0.15 [Typ.] .006 [Typ.]
E .80 [Typ.] .031 [Typ.]
F .20 ± .10 .008 ±.004
G .30 ± .10 .012 ± .004
H .50 [Typ.] .020 [Typ.]
I .45 max. .018 max.
J 0 ~ .20 0 ~ .008
K 1.00 ± .10 .039 ± .004
L 1.27 max. .050 max.
M .50 .020
N 0 ~ 5 ° .500
NOTE: Each lead centerline is located within
.25 mm[.01 inch] of its true position
[TP] at maximum material condition.
48-PIN PLASTIC TSOP
44-PIN PLASTIC SOP
ITEM MILLIMETERS INCHES
A 28.70 max. 1.130 max.
B 1.10 [REF] .043 [REF]
C 1.27 [TP] .050 [TP]
D .40 ± .10 [Typ.] .016 ± .004 [Typ.]
E .010 min. .004 min.
F 3.00 max. .118 max.
G 2.80 ± .13 .110 ± .005
H 16.04 ± .30 .631 ± .012
I 12.60 .496
J 1.72 .068
K .15 ± .10 [Typ.] .006 ± .004 [Typ.]
L .80 ± .20 .031 ± .008
NOTE: Each lead centerline is located
within .25 mm[.01 inch] of its true
position [TP] at maximum material
condition.
122
2344
A
DC B
E
GF
H
IJ
K
L
A
B
C
D
EFGHIJ
KL
M
N
INDEX
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34
MX29F400T/B
INDEX