APTGT300SK120D3G
APTGT300SK120D3G – Rev 1 September, 2008
www.microsemi.com 2-5
All ratings @ Tj = 25°C unless otherwise specified
Electrical Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
ICES Zero Gate Voltage Collector Current VGE = 0V, VCE = 1200V 500 µA
Tj = 25°C 1.7 2.1
VCE(sat) Collector Emitter saturation Voltage VGE = 15V
IC = 300A Tj = 125°C 2.0 V
VGE(th) Gate Threshold Voltage VGE = VCE , IC = 12mA 5.0 5.8 6.5 V
IGES Gate – Emitter Leakage Current VGE = 20V, VCE = 0V 400 nA
Dynamic Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
Cies Input Capacitance 21
Cres Reverse Transfer Capacitance
VGE = 0V ; VCE = 25V
f = 1MHz 1 nF
QG Gate charge VGE=±15V, IC=300A
VCE=600V 2.8 µC
Td(on) Turn-on Delay Time 250
Tr Rise Time 90
Td(off) Turn-off Delay Time 550
Tf Fall Time
Inductive Switching (25°C)
VGE = ±15V
VBus = 600V
IC = 300A
RG = 2.2Ω 130
ns
Td(on) Turn-on Delay Time 300
Tr Rise Time 100
Td(off) Turn-off Delay Time 650
Tf Fall Time
Inductive Switching (125°C)
VGE = ±15V
VBus = 600V
IC = 300A
RG = 2.2Ω 180
ns
Eon Turn on Energy Tj = 125°C 25
Eoff Turn off Energy
VGE = ±15V
VBus = 600V
IC = 300A
RG = 2.2Ω Tj = 125°C 44
mJ
Isc Short Circuit data VGE ≤15V ; VBus = 900V
tp ≤ 10µs ; Tj = 125°C 1200 A
Reverse diode ratings and characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
VRRM Maximum Peak Repetitive Reverse Voltage 1200 V
Tj = 25°C 750
IRRM Maximum Reverse Leakage Current VR=1200V Tj = 125°C 1000 µA
IF DC Forward Current Tc = 80°C 300 A
Tj = 25°C 1.6 2.1
VF Diode Forward Voltage IF = 300A
VGE = 0V Tj = 125°C 1.6 V
Tj = 25°C 170
trr Reverse Recovery Time Tj = 125°C 280 ns
Tj = 25°C 28
Qrr Reverse Recovery Charge Tj = 125°C 56 µC
Tj = 25°C 12
Err Reverse Recovery Energy
IF = 300A
VR = 600V
di/dt =3500A/µs
Tj = 125°C 22 mJ