IXYS Reserves the Right to Change Limits, Test Conditions, and Dimensions.
IXYK100N120C3
IXYX100N120C3
IXYS MOSFETs and IGBTs are covered 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585 7,005,734 B2 7,157,338B2
by one or more of the following U.S. patents: 4,860,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405 B2 6,759,692 7,063,975 B2
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463 6,771,478 B2 7,071,537
Notes:
1. Pulse test, t ≤ 300μs, duty cycle, d ≤ 2%.
2. Switching times & energy losses may increase for higher VCE(clamp), TJ or RG.
Symbol Test Conditions Characteristic Values
(TJ = 25°C Unless Otherwise Specified) Min. Typ. Max.
gfs IC = 60A, VCE = 10V, Note 1 30 52 S
Cies 6000 pF
Coes VCE = 25V, VGE = 0V, f = 1MHz 353 pF
Cres 130 pF
Qg(on) 270 nC
Qge IC = IC110, VGE = 15V, VCE = 0.5 • VCES 50 nC
Qgc 93 nC
td(on) 32 ns
tri 90 ns
Eon 6.50 mJ
td(off) 123 ns
tfi 110 ns
Eoff 2.90 5.00 mJ
td(on) 32 ns
tri 90 ns
Eon 10.10 mJ
td(off) 140 ns
tfi 125 ns
Eoff 3.55 mJ
RthJC 0.13 °C/W
RthCS 0.15 °C/W
Inductive load, TJ = 25°C
IC = IC110, VGE = 15V
VCE = 0.5 • VCES, RG = 1Ω
Note 2
Inductive load, TJ = 125°C
IC = IC110, VGE = 15V
VCE = 0.5 • VCES, RG = 1Ω
Note 2
TO-264 Outline
Terminals: 1 = Gate
2,4 = Collector
3 = Emitter
Terminals: 1 - Gate
2 - Collector
3 - Emitter
PLUS247TM Outline
Dim. Millimeter Inches
Min. Max. Min. Max.
A 4.83 5.21 .190 .205
A12.29 2.54 .090 .100
A21.91 2.16 .075 .085
b 1.14 1.40 .045 .055
b11.91 2.13 .075 .084
b22.92 3.12 .115 .123
C 0.61 0.80 .024 .031
D 20.80 21.34 .819 .840
E 15.75 16.13 .620 .635
e 5.45 BSC .215 BSC
L 19.81 20.32 .780 .800
L1 3.81 4.32 .150 .170
Q 5.59 6.20 .220 0.244
R 4.32 4.83 .170 .190
PRELIMANARY TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are derived
from a subjective evaluation of the design, based upon prior knowledge and experience, and constitute a
"considered reflection" of the anticipated result. IXYS reserves the right to change limits, test
conditions, and dimensions without notice.