MC100EP220
TIMING SOLUTIONS 3 MOTOROLA
Table 1: PIN CONFIGURATION
Pin I/O Type Function
CLKA, CLKA Input ECL/LVPECL Differential reference clock signal input for fanout buffer A
CLKB, CLKB Input ECL/LVPECL Differential reference clock signal input for fanout buffer B
Q[0-19], Q[0-19] Output LVPECL Differential clock outputs
VEEaSupply Negative power supply
VCC, VCCO Supply Positive power supply. All VCC and VCCO pins must be connected to
the positive power supply for correct DC and AC operation
VBB Output DC bias output for single ended input operation
a. In ECL mode (negative power supply mode), VEE is either -3.3V or -2.5V and VCC is connected to GND (0V).
In PECL mode (positive power supply mode), VEE is connected to GND (0V) and VCC is either +3.3V or +2.5V.
In both modes, the input and output levels are referrenced to the most positive supply (VCC).
Table 2: ABSOLUTE MAXIMUM RATINGSa
Symbol Characteristics Min Max Unit Condition
VCC Supply Voltage -0.3 4.6 V
VIN DC Input Voltage -0.3 VCC+0.3 V
VOUT DC Output Voltage -0.3 VCC+0.3 V
IIN DC Input Current ±20 mA
IOUT DC Output Current ±50 mA
TSStorage temperature -65 125 °C
a. Absolute maximum continuos ratings are those maximum values beyond which damage to the device may occur. Exposure to these conditions
or conditions beyond those indicated may adversely affect device reliability. Functional operation at absolute-maximum-rated conditions is not
implied.
Table 3: GENERAL SPECIFICATIONS
Symbol Characteristics Min Typ Max Unit Condition
VTT Output termination voltage VCC - 2aV
MM ESD Protection (Machine model) 75 V
HBM ESD Protection (Human body model) 1500 V
CDM ESD Protection (Charged device model) 500 V
LU Latch-up immunity 200 mA
CIN 4.0 pF Inputs
θJA Thermal resistance junction to ambient See application informationb
θJC Thermal resistance junction to case See application information
a. Output termination voltage VTT = 0V for VCC=2.5V operation is supported but the power consumption of the device will increase.
b. Proper thermal management is critical for reliable system operation. This especially true for high-fanout and high drive capability
products. Thermal package information and exposed pad land pattern design recommendations are available in the applications section
of this datasheet. In addition, the means of calculating die power consumption, the corresponding die temperature and the relationship to
long-term reliability is addressed in the Motorola application note AN1545. Thermal modeling is recommended for the MC100EP220.
Freescale Semiconductor, I
Freescale Semiconductor, Inc.
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