Functional Description
The ADC122S625 is a dual 12-bit, simultaneous sampling
Analog-to-Digital (A/D) converter. The converter is based on
a successive-approximation register (SAR) architecture
where the differential nature of the analog inputs is main-
tained from the internal track-and-hold circuits throughout the
A/D converter. The analog inputs on both channels are sam-
pled simultaneously to preserve their relative phase informa-
tion to each other. The architecture and process allow the
ADC122S625 to acquire and convert dual analog signals at
sample rates up to 200 kSPS while consuming very little pow-
er.
The ADC122S625 requires an external reference, external
clock, and an analog power supply. The analog supply (VA)
can range from 4.5V to 5.5V and the external reference can
be any voltage between 1V and VA. The value of the reference
voltage determines the range of the analog input, while the
reference input current depends upon the conversion rate.
Analog inputs are presented at the inputs of Channel A and
Channel B. Upon initiation of a conversion, the differential in-
put at these pins is sampled on the internal capacitor array.
The analog input signals are disconnected from the external
circuitry while a conversion is in progress.
The external clock can take on values as indicated in the
Electrical Characteristics Table. The duty cycle of the clock is
essentially unimportant, provided the minimum clock high and
low times are met. The minimum clock frequency is set by
internal capacitor leakage. Each conversion requires thiry-
two clock cycles to complete.
The ADC122S625 offers a high-speed serial data output that
is binary 2's complement and compatible with several stan-
dards, such as SPI™, QSPI™, MICROWIRE™, and many
common DSP serial interfaces. The digital conversion result
of Channel A and Channel B is clocked out on the falling
edges of the SCLK input and is provided serially at DOUT, most
significant bit first. The result of Channel A is output before
the result of Channel B, with four zeros in between the two
results. The digital data provided on DOUT is that of the con-
version currently in progress. With CS held low after the result
of Channel B is output, the ADC122S625 will continuously
convert the analog inputs until CS is de-asserted (brought
high). Having a single, serial DOUT makes the ADC122S625
an excellent replacement for two independent ADCs that are
part of a daisy chain configuration and allows a system de-
signer to save valuable board space and power.
1.0 REFERENCE INPUT
The externally supplied reference voltage sets the analog in-
put range. The ADC122S625 will operate with a reference
voltage in the range of 1V to VA.
Operation with a reference voltage below 1V is also possible
with slightly diminished performance. As the reference volt-
age (VREF) is reduced, the range of acceptable analog input
voltages is reduced. Assuming a proper common-mode input
voltage, the differential peak-to-peak input range is limited to
twice VREF. See Section 2.3 for more details. Reducing the
value of VREF also reduces the size of the least significant bit
(LSB). The size of one LSB is equal to twice the reference
voltage divided by 4096. When the LSB size goes below the
noise floor of the ADC122S625, the noise will span an in-
creasing number of codes and overall performance will suffer.
For example, dynamic signals will have their SNR degrade,
while D.C. measurements will have their code uncertainty in-
crease. Since the noise is Gaussian in nature, the effects of
this noise can be reduced by averaging the results of a num-
ber of consecutive conversions.
Additionally, since offset and gain errors are specified in LSB,
any offset and/or gain errors inherent in the A/D converter will
increase in terms of LSB size as the reference voltage is re-
duced.
The reference input and the analog inputs are connected to
the capacitor array through a switch matrix when the input is
sampled. Hence, the current requirements at the reference
and at the analog inputs are a series of transient spikes that
occur at a frequency dependent on the operating sample rate
of the ADC122S625.
The reference current changes only slightly with temperature.
See the curves, “Reference Current vs. SCLK Frequency”
and “Reference Current vs. Temperature” in the Typical Per-
formance Curves section for additional details.
2.0 ANALOG SIGNAL INPUTS
The ADC122S625 has dual differential inputs where the ef-
fective input voltage that is digitized is CHA+ minus CHA−
(DIFFINA) and CHB+ minus CHB− (DIFFINB). As is the case
with all differential input A/D converters, operation with a fully
differential input signal or voltage will provide better perfor-
mance than with a single-ended input. However, the
ADC122S625 can be presented with a single-ended input as
shown in Section 2.2 and the Application Circuits.
The current required to recharge the input sampling capacitor
will cause voltage spikes at the + and − inputs. Do not try to
filter out these noise spikes. Rather, ensure that the noise
spikes settle out during the acquisition period (three SCLK
cycles after the fall of CS). This is true for both Channel A and
Channel B since both channels are converted simultaneously
on the fourth falling edge of SCLK after CS is asserted.
2.1 Differential Input Operation
With a fully differential input voltage or signal, a positive full
scale output code (0111 1111 1111b or 7FFh) will be obtained
when DIFFINA or DIFFINB is greater than or equal to VREF −
1.5 LSB. A negative full scale code (1000 0000 0000b or
800h) will be obtained when DIFFINA or DIFFINB is greater
than or equal to −VREF + 0.5 LSB. This ignores gain, offset
and linearity errors, which will affect the exact differential input
voltage that will determine any given output code. Figure 7
shows the ADC122S625 being driven by a full-scale differen-
tial source.
30055380
FIGURE 7. Differential Input
www.national.com 14
ADC122S625