TABLE 4 GROUP A INSPECTION SA51M M I C R O T E C H N O L O G Y HTTP://WWW.APEXMICROTECH.COM SG PARAMETER SYMBOL TEMP. POWER (800) 546-APEX (800) 546-2739 TEST CONDITIONS 1 1 1 1 Quiescent Current ON Voltage OFF Leakage Input Voltage Threshold IQ VDS IDSS VINTH 25C 25C 25C 25C +28Vdc +28Vdc +70Vdc +28Vdc PWM Not switching ID = 5A Output off, VDS = 70V Input increased until AOUT and BOUT change state 3 3 3 3 Quiescent Current ON Voltage OFF Leakage Input Voltage Threshold IQ VDS IDSS VINTH -55C -55C -55C -55C +28Vdc +28Vdc +70Vdc +28Vdc PWM Not switching ID = 5A Output off, VDS = 70V Input increased until AOUT and BOUT change state 2 2 2 2 Quiescent Current ON Voltage OFF Leakage Input Voltage Threshold IQ VDS IDSS VINTH 125C 125C 125C 125C +28Vdc +28Vdc +70Vdc +28Vdc PWM Not switching ID = 5A Output OFF, VDS = 70V Input increased until AOUT and BOUT change state 4 Operating Supply Current IS 25C +28Vdc PWM = 500khz TTL 7 Disable Function DIS 25C +28Vdc Disable > 3.6V, PWM input=500KHz, verify no switching MIN MAX UNITS 0.8 18 1.8 25 2.7 mA V A V 0.8 18 1.2 25 2.7 mA V A V 0.8 18 2.4 250 2.7 mA V A V 60 mA Pass/Fail 1/VCC=+12Vdc, RSENSE = Disable = Ground, RL = 1K ohm, AOUT to BOUT BURN IN CIRCUIT R2 -12V +12V 1 +28V 8 7 C2 2 +12V 3 C3 4 DUT 1 DEVICE CELL OUTPUT R1 2 NE555 DEVICE CELL INPUT R3 6 3 5 -12V C4 4 C5 C1 This data sheet has been carefully CORPORATION checked and is believed to be reliable,(520) however, no responsibility assumed888-3329 for possible*inaccuracies or omissions. All specifications subject to change without notice. APEX MICROTECHNOLOGY * TELEPHONE 690-8600 * FAXis(520) ORDERS (520) 690-8601 * EMAILare prodlit@apexmicrotech.com SA51MU REV. A JANUARY 1998 (c) 1998 Apex Microtechnology Corp.