1. Product profile
1.1 General description
Unidirectional double ElectroStatic Discharge (ESD) protection diodes in a common
cathode configuration, encapsulated in a SOT23 (TO-236AB) small Surface-Mounted
Device (SMD) plastic package. The devices are designed for ESD and transient
overvoltage protection of up to two signal lines.
[1] All types available as /DG halogen-free version.
1.2 Features
1.3 Applications
MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage
suppression
Rev. 01 — 3 September 2008 Product data sheet
Table 1. Product overview
Type number[1] Package Configuration
NXP JEDEC
MMBZ12VDL SOT23 TO-236AB dual common cathode
MMBZ15VDL
MMBZ18VCL
MMBZ20VCL
MMBZ27VCL
MMBZ33VCL
nUnidirectional ESD protection of
two lines
nESD protection up to 30 kV (contact
discharge)
nBidirectional ESD protection of one line nIEC 61000-4-2; level 4 (ESD)
nLow diode capacitance: Cd140 pF nIEC 61643-321
nRated peak pulse power: PPPM 40 W nAEC-Q101 qualified
nUltra low leakage current: IRM 5nA
nComputers and peripherals nAutomotive electronic control units
nAudio and video equipment nPortable electronics
nCellular handsets and accessories
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 2 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
1.4 Quick reference data
2. Pinning information
Table 2. Quick reference data
T
amb
=25
°
C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
Per diode
VRWM reverse standoff voltage
MMBZ12VDL
MMBZ12VDL/DG - - 8.5 V
MMBZ15VDL
MMBZ15VDL/DG - - 12.8 V
MMBZ18VCL
MMBZ18VCL/DG - - 14.5 V
MMBZ20VCL
MMBZ20VCL/DG --17V
MMBZ27VCL
MMBZ27VCL/DG --22V
MMBZ33VCL
MMBZ33VCL/DG --26V
Cddiode capacitance f = 1 MHz; VR=0V
MMBZ12VDL
MMBZ12VDL/DG - 110 140 pF
MMBZ15VDL
MMBZ15VDL/DG - 85 105 pF
MMBZ18VCL
MMBZ18VCL/DG - 7090pF
MMBZ20VCL
MMBZ20VCL/DG - 6580pF
MMBZ27VCL
MMBZ27VCL/DG - 4860pF
MMBZ33VCL
MMBZ33VCL/DG - 4555pF
Table 3. Pinning
Pin Description Simplified outline Graphic symbol
1 anode (diode 1)
2 anode (diode 2)
3 common cathode
12
3
006aaa150
12
3
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 3 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
3. Ordering information
4. Marking
[1] * = -: made in Hong Kong
* = p: made in Hong Kong
* = t: made in Malaysia
* = W: made in China
Table 4. Ordering information
Type number Package
Name Description Version
MMBZ12VDL - plastic surface-mounted package; 3 leads SOT23
MMBZ15VDL
MMBZ18VCL
MMBZ20VCL
MMBZ27VCL
MMBZ33VCL
MMBZ12VDL/DG - plastic surface-mounted package; 3 leads SOT23
MMBZ15VDL/DG
MMBZ18VCL/DG
MMBZ20VCL/DG
MMBZ27VCL/DG
MMBZ33VCL/DG
Table 5. Marking codes
Type number Marking code[1] Type number Marking code[1]
MMBZ12VDL *MA MMBZ12VDL/DG TJ*
MMBZ15VDL *MB MMBZ15VDL/DG TL*
MMBZ18VCL *MC MMBZ18VCL/DG TN*
MMBZ20VCL *MD MMBZ20VCL/DG TQ*
MMBZ27VCL *ME MMBZ27VCL/DG TS*
MMBZ33VCL *MF MMBZ33VCL/DG TU*
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 4 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
5. Limiting values
[1] In accordance with IEC 61643-321 (10/1000 µs current waveform).
[2] Measured from pin 1 or 2 to pin 3.
[3] Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated and standard
footprint.
[4] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for cathode 1 cm2.
[1] Device stressed with ten non-repetitive ESD pulses.
[2] Measured from pin 1 or 2 to pin 3.
Table 6. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
Per diode
PPPM rated peak pulse power tp= 10/1000 µs[1][2] -40W
IPPM rated peak pulse current tp= 10/1000 µs[1][2]
MMBZ12VDL
MMBZ12VDL/DG - 2.35 A
MMBZ15VDL
MMBZ15VDL/DG - 1.9 A
MMBZ18VCL
MMBZ18VCL/DG - 1.6 A
MMBZ20VCL
MMBZ20VCL/DG - 1.4 A
MMBZ27VCL
MMBZ27VCL/DG -1A
MMBZ33VCL
MMBZ33VCL/DG - 0.87 A
Per device
Ptot total power dissipation Tamb 25 °C[3] - 350 mW
[4] - 440 mW
Tjjunction temperature - 150 °C
Tamb ambient temperature 55 +150 °C
Tstg storage temperature 65 +150 °C
Table 7. ESD maximum ratings
T
amb
=25
°
C unless otherwise specified.
Symbol Parameter Conditions Min Max Unit
Per diode
VESD electrostatic discharge voltage [1][2]
IEC 61000-4-2
(contact discharge) -30kV
machine model - 2 kV
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 5 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
6. Thermal characteristics
[1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
[2] Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for cathode 1 cm2.
[3] Soldering point at pin 3.
Table 8. ESD standards compliance
Standard Conditions
Per diode
IEC 61000-4-2; level 4 (ESD) > 15 kV (air); > 8 kV (contact)
MIL-STD-883; class 3 (human body model) > 8 kV
Fig 1. 10/1000 µs pulse waveform according to
IEC 61643-321 Fig 2. ESD pulse waveform according to
IEC 61000-4-2
tp (ms)
0 4.03.01.0 2.0
006aab319
50
100
150
IPP
(%)
0
50 % IPP; 1000 µs
100 % IPP; 10 µs
001aaa631
IPP
100 %
90 %
t
30 ns 60 ns
10 %
tr = 0.7 ns to 1 ns
Table 9. Thermal characteristics
Symbol Parameter Conditions Min Typ Max Unit
Per device
Rth(j-a) thermal resistance from junction
to ambient in free air [1] - - 350 K/W
[2] - - 280 K/W
Rth(j-sp) thermal resistance from junction
to solder point [3] --60K/W
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 6 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
7. Characteristics
Table 10. Characteristics
T
amb
=25
°
C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
Per diode
VFforward voltage
MMBZ12VDL
MMBZ12VDL/DG IF= 10 mA - - 0.9 V
MMBZ15VDL
MMBZ15VDL/DG IF= 10 mA - - 0.9 V
MMBZ18VCL
MMBZ18VCL/DG IF= 10 mA - - 0.9 V
MMBZ20VCL
MMBZ20VCL/DG IF= 10 mA - - 0.9 V
MMBZ27VCL
MMBZ27VCL/DG IF= 200 mA - - 1.1 V
MMBZ33VCL
MMBZ33VCL/DG IF= 10 mA - - 0.9 V
VRWM reverse standoff
voltage
MMBZ12VDL
MMBZ12VDL/DG - - 8.5 V
MMBZ15VDL
MMBZ15VDL/DG - - 12.8 V
MMBZ18VCL
MMBZ18VCL/DG - - 14.5 V
MMBZ20VCL
MMBZ20VCL/DG --17V
MMBZ27VCL
MMBZ27VCL/DG --22V
MMBZ33VCL
MMBZ33VCL/DG --26V
IRM reverse leakage current
MMBZ12VDL
MMBZ12VDL/DG VRWM = 8.5 V - 0.1 5 nA
MMBZ15VDL
MMBZ15VDL/DG VRWM = 12.8 V - 0.1 5 nA
MMBZ18VCL
MMBZ18VCL/DG VRWM = 14.5 V - 0.1 5 nA
MMBZ20VCL
MMBZ20VCL/DG VRWM =17V - 0.1 5 nA
MMBZ27VCL
MMBZ27VCL/DG VRWM =22V - 0.1 5 nA
MMBZ33VCL
MMBZ33VCL/DG VRWM =26V - 0.1 5 nA
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 7 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
VBR breakdown voltage IR=1mA
MMBZ12VDL
MMBZ12VDL/DG 11.4 12 12.6 V
MMBZ15VDL
MMBZ15VDL/DG 14.3 15 15.8 V
MMBZ18VCL
MMBZ18VCL/DG 17.1 18 18.9 V
MMBZ20VCL
MMBZ20VCL/DG 19 20 21 V
MMBZ27VCL
MMBZ27VCL/DG 25.65 27 28.35 V
MMBZ33VCL
MMBZ33VCL/DG 31.35 33 34.65 V
Cddiode capacitance f = 1 MHz; VR=0V
MMBZ12VDL
MMBZ12VDL/DG - 110 140 pF
MMBZ15VDL
MMBZ15VDL/DG - 85 105 pF
MMBZ18VCL
MMBZ18VCL/DG - 7090pF
MMBZ20VCL
MMBZ20VCL/DG - 6580pF
MMBZ27VCL
MMBZ27VCL/DG - 4860pF
MMBZ33VCL
MMBZ33VCL/DG - 4555pF
VCL clamping voltage [1][2]
MMBZ12VDL
MMBZ12VDL/DG IPPM = 2.35 A - - 17 V
MMBZ15VDL
MMBZ15VDL/DG IPPM = 1.9 A - - 21.2 V
MMBZ18VCL
MMBZ18VCL/DG IPPM = 1.6 A - - 25 V
MMBZ20VCL
MMBZ20VCL/DG IPPM = 1.4 A - - 28 V
MMBZ27VCL
MMBZ27VCL/DG IPPM =1A --38V
MMBZ33VCL
MMBZ33VCL/DG IPPM = 0.87 A - - 46 V
Table 10. Characteristics
…continued
T
amb
=25
°
C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 8 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
[1] In accordance with IEC 61643-321 (10/1000 µs current waveform).
[2] Measured from pin 1 or 2 to pin 3.
SZtemperature coefficient IZ=1mA
MMBZ12VDL
MMBZ12VDL/DG - 8.1 - mV/K
MMBZ15VDL
MMBZ15VDL/DG - 11 - mV/K
MMBZ18VCL
MMBZ18VCL/DG - 14 - mV/K
MMBZ20VCL
MMBZ20VCL/DG - 15.8 - mV/K
MMBZ27VCL
MMBZ27VCL/DG - 23 - mV/K
MMBZ33VCL
MMBZ33VCL/DG - 29.4 - mV/K
Table 10. Characteristics
…continued
T
amb
=25
°
C unless otherwise specified.
Symbol Parameter Conditions Min Typ Max Unit
MMBZ27VCL: unidirectional and bidirectional
Tamb =25°C
Fig 3. Rated peak pulse power as a function of
exponential pulse duration (rectangular
waveform); typical values
Fig 4. Relative variation of rated peak pulse power as
a function of junction temperature; typical
values
006aab327
102
10
103
PPPM
(W)
1
tp (ms)
102103
102
101101 Tj (°C)
0 20015050 100
006aab321
0.4
0.8
1.2
PPPM
0
PPPM(25°C)
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 9 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
f = 1 MHz; Tamb =25°C
(1) MMBZ15VDL: unidirectional
(2) MMBZ15VDL: bidirectional
(3) MMBZ27VCL: unidirectional
(4) MMBZ27VCL: bidirectional
MMBZ27VCL: VRWM =22V
Fig 5. Diode capacitance as a function of reverse
voltage; typical values Fig 6. Reverse leakage current as a function of
junction temperature; typical values
Fig 7. V-I characteristics for a unidirectional
ESD protection diode Fig 8. V-I characteristics for a bidirectional
ESD protection diode
VR (V)
0252010 155
006aab328
40
60
20
80
100
Cd
(pF)
0
(1)
(2) (3)
(4)
006aab329
101
102
10
1
102
IRM
(nA)
103
Tamb (°C)
75 17512525 7525
006aab324
VCL VBR VRWM IRM
IR
IPP
V
I
P-N
+
IPPM
006aab325
VCL VBR VRWM VCL
VBR
VRWM
IRM
IRM
IR
IR
IPP
IPP
+
IPPM
IPPM
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 10 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
8. Application information
The MMBZxVCL series and the MMBZxVDL series are designed for the protection of up
to two unidirectional data or signal lines from the damage caused by ESD and surge
pulses. The devices may be used on lines where the signal polarities are either positive or
negative with respect to ground. The devices provide a surge capability of 40 W per line
for a 10/1000 µs waveform.
Circuit board layout and protection device placement
Circuit board layout is critical for the suppression of ESD, Electrical Fast Transient (EFT)
and surge transients. The following guidelines are recommended:
1. Place the devices as close to the input terminal or connector as possible.
2. The path length between the device and the protected line should be minimized.
3. Keep parallel signal paths to a minimum.
4. Avoid running protected conductors in parallel with unprotected conductors.
5. Minimize all Printed-Circuit Board (PCB) conductive loops including power and
ground loops.
6. Minimize the length of the transient return path to ground.
7. Avoid using shared transient return paths to a common ground point.
8. Ground planes should be used whenever possible. For multilayer PCBs, use ground
vias.
9. Test information
9.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard
Q101 - Stress test qualification for discrete semiconductors
, and is
suitable for use in automotive applications.
Fig 9. Typical application: ESD and transient voltage protection of data lines
006aab330
MMBZxVCL/VDL
line 1 to be protected
unidirectional protection
of two lines bidirectional protection
of one line
line 2 to be protected
GND
MMBZxVCL/VDL
line 1 to be protected
GND
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 11 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
10. Package outline
11. Packing information
[1] For further information and the availability of packing methods, see Section 15.
Fig 10. Package outline SOT23 (TO-236AB)
04-11-04Dimensions in mm
0.45
0.15
1.9
1.1
0.9
3.0
2.8
2.5
2.1 1.4
1.2
0.48
0.38 0.15
0.09
12
3
Table 11. Packing methods
The indicated -xxx are the last three digits of the 12NC ordering code.
[1]
Type number Package Description Packing quantity
3000 10000
MMBZ12VDL SOT23 4 mm pitch, 8 mm tape and reel -215 -235
MMBZ15VDL
MMBZ18VCL
MMBZ20VCL
MMBZ27VCL
MMBZ33VCL
MMBZ12VDL/DG SOT23 4 mm pitch, 8 mm tape and reel -215 -235
MMBZ15VDL/DG
MMBZ18VCL/DG
MMBZ20VCL/DG
MMBZ27VCL/DG
MMBZ33VCL/DG
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 12 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
12. Soldering
Fig 11. Reflow soldering footprint SOT23 (TO-236AB)
Fig 12. Wave soldering footprint SOT23 (TO-236AB)
solder lands
solder resist
occupied area
solder paste
sot023_fr
0.5
(3×)
0.6
(3×)
0.6
(3×)
0.7
(3×)
3
1
3.3
2.9
1.7
1.9
2
Dimensions in mm
solder lands
solder resist
occupied area
preferred transport direction during soldering
sot023_fw
2.8
4.5
1.4
4.6
1.4
(2×)
1.2
(2×)
2.2
2.6
Dimensions in mm
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 13 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
13. Revision history
Table 12. Revision history
Document ID Release date Data sheet status Change notice Supersedes
MMBZXVCL_MMBZXVDL_SER_1 20080903 Product data sheet - -
MMBZXVCL_MMBZXVDL_SER_1 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 01 — 3 September 2008 14 of 15
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
14. Legal information
14.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
14.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
14.3 Disclaimers
General — Information in this document is believed to be accurate and
reliable. However, NXP Semiconductors does not give any representations or
warranties, expressed or implied, as to the accuracy or completeness of such
information and shall have no liability for the consequences of use of such
information.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in medical, military, aircraft,
space or life support equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liability for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) may cause permanent
damage to the device. Limiting values are stress ratings only and operation of
the device at these or any other conditions above those given in the
Characteristics sections of this document is not implied. Exposure to limiting
values for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold
subject to the general terms and conditions of commercial sale, as published
at http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of
any inconsistency or conflict between information in this document and such
terms and conditions, the latter will prevail.
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or the
grant, conveyance or implication of any license under any copyrights, patents
or other industrial or intellectual property rights.
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
ESD protection devices — These products are only intended for protection
against ElectroStatic Discharge (ESD) pulses and are not intended for any
other usage including, without limitation, voltage regulation applications. NXP
Semiconductors accepts no liability for use in such applications and therefore
such use is at the customer’s own risk.
14.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
15. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contains data from the objective specification for product development.
Preliminary [short] data sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document contains the product specification.
NXP Semiconductors MMBZxVCL; MMBZxVDL series
Double ESD protection diodes for transient overvoltage suppression
© NXP B.V. 2008. All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 3 September 2008
Document identifier: MMBZXVCL_MMBZXVDL_SER_1
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
16. Contents
1 Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.1 General description. . . . . . . . . . . . . . . . . . . . . . 1
1.2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.3 Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
1.4 Quick reference data. . . . . . . . . . . . . . . . . . . . . 2
2 Pinning information. . . . . . . . . . . . . . . . . . . . . . 2
3 Ordering information. . . . . . . . . . . . . . . . . . . . . 3
4 Marking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
5 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4
6 Thermal characteristics. . . . . . . . . . . . . . . . . . . 5
7 Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 6
8 Application information. . . . . . . . . . . . . . . . . . 10
9 Test information. . . . . . . . . . . . . . . . . . . . . . . . 10
9.1 Quality information . . . . . . . . . . . . . . . . . . . . . 10
10 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 11
11 Packing information. . . . . . . . . . . . . . . . . . . . . 11
12 Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
13 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 13
14 Legal information. . . . . . . . . . . . . . . . . . . . . . . 14
14.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 14
14.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
14.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 14
14.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 14
15 Contact information. . . . . . . . . . . . . . . . . . . . . 14
16 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15