Preliminary W24B02
- 2 -
TRUTH TABLE
#CS #OE #WE MODE I/O1
−
I/O8 VDD CURRENT
H X X Not Selected High Z ISB, ISB1
L H H Output Disable High Z IDD
L L H 2 Bytes Read DOUT IDD
L L H Lower Byte Read DOUT IDD
L L H Upper Byte Read High Z IDD
L X L 2 Bytes Write DIN IDD
L X L Lower Byte Write DIN IDD
L X L Upper Byte Write High Z IDD
X X X Not Selected High Z ISB, ISB1
DC CHARACTERISTICS
Absolute Maximum Ratings
PARAMETER RATING UNIT
Supply Voltage to VSS Potential -0.5 to +4.6 V
Input/Output to VSS Potential -0.5 to VDD +0.5 V
Allowable Power Dissipation 1.0 W
Storage Temperature -65 to +150 °C
LE -20 to 85 °C
Operating Temperature LI -40 to 85 °C
Note: Exposure to conditions beyond those listed under Absolute Maximum Ratings may adversely affect the life and reliability
of the device.
Operating Characteristics
(VSS = 0V; TA (°C) = -20 to 85 for LE, -40 to 85 for LI)
W24B02
PARAMETER SYM. TEST
CONDITIONS MIN. MAX. UNIT
Operating Power Voltage VDD - 2.7 3.6 V
Input Low Voltage VIL - -0.2 +0.4 V
Input High Voltage VIH - +2.2 VDD +0.3 V
Input Leakage Current ILI VIN = VSS to VDD -1 +1 µA
Output Leakage Current ILO VI/O = VSS to VDD; #CS = VIH
(min.) or #OE = VIH (min.)
or #WE = VIL (max.) -1 +1 µA
Output Low Voltage VOL IOL = +0.1 mA - 0.4 V