APTGT200A120D3G
APTGT200A120D3G – Rev 1 September, 2008
www.microsemi.com 1-5
Absolute maximum ratings
Symbol Parameter Max ratings Unit
VCES Collector - Emitter Breakdown Voltage 1200 V
TC = 25°C 300
IC Continuous Collector Current TC = 80°C 200
ICM Pulsed Collector Current TC = 25°C 400
A
VGE Gate – Emitter Voltage ±20 V
PD Maximum Power Dissipation TC = 25°C 1050 W
RBSOA Reverse Bias Safe Operating Area Tj = 125°C 400A @ 1100V
These Devices are sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.
See application note APT0502 on www.microsemi.com
2
1
3
5
Q2
7
6
Q1
4
VCES = 1200V
IC = 200A @ Tc = 80°C
Application
Welding converters
Switched Mode Power Supplies
Uninterruptible Power Supplies
Motor control
Features
Trench + Field Stop IGBT Technology
- Low voltage drop
- Low tail current
- Switching frequency up to 20 kHz
- Soft recovery parallel diodes
- Low diode VF
- Low leakage current
- RBSOA and SCSOA rated
Kelvin emitter for easy drive
High level of integration
M6 power connectors
Benefits
Stable temperature behavior
Very rugged
Direct mounting to heatsink (isolated package)
Low junction to case thermal resistance
Easy paralleling due to positive TC of VCEsat
RoHS Compliant
Phase leg
Trench + Field Stop IGBT
Power Module
APTGT200A120D3G
APTGT200A120D3G – Rev 1 September, 2008
www.microsemi.com 2-5
All ratings @ Tj = 25°C unless otherwise specified
Electrical Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
ICES Zero Gate Voltage Collector Current VGE = 0V, VCE = 1200V 500 µA
Tj = 25°C 1.4 1.7 2.1
VCE(sat) Collector Emitter saturation Voltage VGE = 15V
IC = 200A Tj = 125°C 2.0 V
VGE(th) Gate Threshold Voltage VGE = VCE , IC = 8mA 5.0 5.8 6.5 V
IGES Gate – Emitter Leakage Current VGE = 20V, VCE = 0V 400 nA
Dynamic Characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
Cies Input Capacitance 14
Crss Reverse Transfer Capacitance
VGE = 0V,VCE = 25V
f = 1MHz 0.6 nF
QG Gate charge VGE=±15V, IC=200A
VCE=600V 1.9 µC
Td(on) Turn-on Delay Time 250
Tr Rise Time 90
Td(off) Turn-off Delay Time 550
Tf Fall Time
Inductive Switching (25°C)
VGE = ±15V
VBus = 600V
IC = 200A
RG = 3.6Ω 130
ns
Td(on) Turn-on Delay Time 300
Tr Rise Time 100
Td(off) Turn-off Delay Time 650
Tf Fall Time
Inductive Switching (125°C)
VGE = ±15V
VBus = 600V
IC = 200A
RG = 3.6Ω 180
ns
Eon Turn on Energy Tj = 125°C 15
Eoff Turn off Energy
VGE = ±15V
VBus = 600V
IC = 200A
RG = 3.6Ω Tj = 125°C 35
mJ
Isc Short Circuit data VGE 15V ; VBus = 900V
tp 10µs ; Tj = 125°C 800 A
Reverse diode ratings and characteristics
Symbol Characteristic Test Conditions Min Typ Max Unit
VRRM Maximum Peak Repetitive Reverse Voltage 1200 V
Tj = 25°C 750
IRRM Maximum Reverse Leakage Current VR=1200V Tj = 125°C 1000 µA
IF DC Forward Current Tc = 80°C 200 A
Tj = 25°C 1.6 2.1
VF Diode Forward Voltage IF = 200A
VGE = 0V Tj = 125°C 1.6 V
Tj = 25°C 170
trr Reverse Recovery Time
Tj = 125°C 280
ns
Tj = 25°C 22
Qrr Reverse Recovery Charge
Tj = 125°C 40
µC
Tj = 25°C 9
Err Reverse Recovery Energy
IF = 200A
VR = 600V
di/dt =3500A/µs
Tj = 125°C 16 mJ
APTGT200A120D3G
APTGT200A120D3G – Rev 1 September, 2008
www.microsemi.com 3-5
Thermal and package characteristics
Symbol Characteristic Min Typ Max Unit
IGBT 0.12
RthJC Junction to Case Thermal Resistance Diode 0.20 °C/W
VISOL RMS Isolation Voltage, any terminal to case t =1 min, I isol<1mA, 50/60Hz 2500 V
TJ Operating junction temperature range -40 150
TSTG Storage Temperature Range -40 125
TC Operating Case Temperature -40 125
°C
For terminals M6 3 5
Torque Mounting torque To Heatsink M6 3 5 N.m
Wt Package Weight 350 g
D3 Package outline (dimensions in mm)
A
TAIL A
APTGT200A120D3G
APTGT200A120D3G – Rev 1 September, 2008
www.microsemi.com 4-5
Typical Performance Curve
Output Character istics (V
GE
=15V)
T
J
=25°C
T
J
=125°C
0
100
200
300
400
00.511.522.533.5
V
CE
(V)
I
C
(A)
Output Characteristics
V
GE
=15V
V
GE
=13V
V
GE
=17V
V
GE
=9V
0
100
200
300
400
00.511.522.533.54
V
CE
(V)
I
C
(A)
T
J
= 125°C
Transfert Characteristics
T
J
=25°C
T
J
=125°C
0
100
200
300
400
5 6 7 8 9 10 11 12
V
GE
(V)
I
C
(A)
Energy losses vs Co l lector Cur re n t
Eon
Eoff
Err
0
15
30
45
60
75
0 100 200 300 400
I
C
(A)
E (mJ)
V
CE
= 600V
V
GE
= 15V
R
G
= 3.6
T
J
= 125°C
Eon
Eoff
Err
0
10
20
30
40
50
60
70
0 4 8 12162024
Gate Resistance (ohms)
E (mJ)
V
CE
= 600V
V
GE
=15V
I
C
= 200A
T
J
= 125°C
Switching Energy Losses vs Gate Resistance Reverse Bias Safe Operating Area
0
100
200
300
400
500
0 300 600 900 1200 1500
V
CE
(V)
I
C
(A)
V
GE
=15V
T
J
=125°C
R
G
=3.6
maximum Effectiv e Transient Thermal Impedance, Junction to Case vs Pulse Duration
0.9
0.7
0.5
0.3
0.1
0.05 Single Pulse
0
0.02
0.04
0.06
0.08
0.1
0.12
0.14
0.00001 0.0001 0.001 0.01 0.1 1 10
rectangular Pulse Duration (Seconds)
Thermal Impedance (°C/W)
IGBT
APTGT200A120D3G
APTGT200A120D3G – Rev 1 September, 2008
www.microsemi.com 5-5
Forward Characteristic of di od e
T
J
=25°C
T
J
=125°C
0
100
200
300
400
00.40.81.21.622.4
V
F
(V)
I
F
(A)
Hard
Switching
ZCS
ZVS
0
10
20
30
40
50
0 40 80 120 160 200 240 280
I
C
(A)
Fmax, O pe rating Freque nc y (kHz )
V
CE
=600V
D=50%
R
G
=3.6
T
J
=125°C
T
C
=75°C
Operating Frequency vs Collector Current
maxim u m E ffec tiv e Trans i en t Thermal Imp eda nce, Junction to Case vs Pu l s e Duration
0.9
0.7
0.5
0.3
0.1
0.05 Single Pulse
0
0.05
0.1
0.15
0.2
0.25
0.00001 0.0001 0.001 0.01 0.1 1 10
rectangular Pulse Duration (Seconds)
Thermal Impedance (°C/W)
Diode
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