512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet SST's serial flash family features a four-wire, SPI-compatible interface that allows for a low pin-count package occupying less board space and ultimately lowering total system costs. SST25VF512A SPI serial flash memory is manufactured with SST's proprietary, high-performance CMOS SuperFlash technology. The splitgate cell design and thick-oxide tunneling injector attain better reliability and manufacturability compared with alternate approaches. Features * Single 2.7-3.6V Read and Write Operations * End-of-Write Detection - Software Status * Serial Interface Architecture * Hold Pin (HOLD#) - SPI Compatible: Mode 0 and Mode 3 - Suspends a serial sequence to the memory without deselecting the device * 33 MHz Max Clock Frequency * Superior Reliability * Write Protection (WP#) - Endurance: 100,000 Cycles (typical) - Greater than 100 years Data Retention - Enables/Disables the Lock-Down function of the status register * Low Power Consumption: * Software Write Protection - Active Read Current: 7 mA (typical) - Standby Current: 8 A (typical) - Write protection through Block-Protection bits in status register * Flexible Erase Capability * Temperature Range - Uniform 4 KByte sectors - Uniform 32 KByte overlay blocks - Commercial: 0C to +70C - Industrial: -40C to +85C - Extended: -20C to +85C * Fast Erase and Byte-Program: * Packages Available - Chip-Erase Time: 70 ms (typical) - Sector- or Block-Erase Time: 18 ms (typical) - Byte-Program Time: 14 s (typical) - 8-lead SOIC 150 mil body width - 8-contact WSON (5mm x 6mm) * Auto Address Increment (AAI) Programming * All non-Pb (lead-free) devices are RoHS compliant - Decrease total chip programming time over Byte-Program operations (c)2011 Silicon Storage Technology, Inc. www.microchip.com DS25090A 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Product Description SST's serial flash family features a four-wire, SPI-compatible interface that allows for a low pin-count package occupying less board space and ultimately lowering total system costs. SST25VF512A SPI serial flash memory is manufactured with SST's proprietary, high-performance CMOS SuperFlash technology. The split-gate cell design and thick-oxide tunneling injector attain better reliability and manufacturability compared with alternate approaches. The SST25VF512A device significantly improves performance, while lowering power consumption. The total energy consumed is a function of the applied voltage, current, and time of application. Since for any given voltage range, the SuperFlash technology uses less current to program and has a shorter erase time, the total energy consumed during any Erase or Program operation is less than alternative flash memory technologies. The SST25VF512A device operates with a single 2.7-3.6V power supply. The SST25VF512A device is offered in both 8-lead SOIC and 8-contact WSON packages. See Figure 2 for the pin assignments. (c)2011 Silicon Storage Technology, Inc. DS25090A 2 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Block Diagram SuperFlash Memory X - Decoder Address Buffers and Latches Y - Decoder I/O Buffers and Data Latches Control Logic Serial Interface 1264 B1.0 CE# SCK SI SO WP# HOLD# Figure 1: Function Block Diagram (c)2011 Silicon Storage Technology, Inc. DS25090A 3 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Pin Description CE# 1 SO 2 8 VDD 7 HOLD# CE# 1 SO 2 8 VDD 7 HOLD# Top View Top View WP# 3 6 SCK WP# 3 6 SCK VSS 4 5 SI VSS 4 5 SI 1264 08-soic P1.0 1264 08-wson P2.0 8-lead SOIC 8-contact WSON Figure 2: Pin Assignments Table 1: Pin Description Symbol Pin Name Functions SCK Serial Clock To provide the timing of the serial interface. Commands, addresses, or input data are latched on the rising edge of the clock input, while output data is shifted out on the falling edge of the clock input. SI Serial Data Input To transfer commands, addresses, or data serially into the device. Inputs are latched on the rising edge of the serial clock. SO Serial Data Output To transfer data serially out of the device. Data is shifted out on the falling edge of the serial clock. CE# Chip Enable The device is enabled by a high to low transition on CE#. CE# must remain low for the duration of any command sequence. WP# Write Protect The Write Protect (WP#) pin is used to enable/disable BPL bit in the status register. HOLD# Hold To temporarily stop serial communication with SPI flash memory without resetting the device. VDD Power Supply To provide power supply (2.7-3.6V). VSS Ground T1.0 25090 (c)2011 Silicon Storage Technology, Inc. DS25090A 4 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Product Identification Table 2: Product Identification Manufacturer's ID Address Data 00000H BFH 00001H 48H Device ID SST25VF512A T2.0 25090 Memory Organization The SST25VF512A SuperFlash memory array is organized in 4 KByte sectors with 32 KByte overlay blocks. Device Operation The SST25VF512A is accessed through the SPI (Serial Peripheral Interface) bus compatible protocol. The SPI bus consist of four control lines; Chip Enable (CE#) is used to select the device, and data is accessed through the Serial Data Input (SI), Serial Data Output (SO), and Serial Clock (SCK). The SST25VF512A supports both Mode 0 (0,0) and Mode 3 (1,1) of SPI bus operations. The difference between the two modes, as shown in Figure 3, is the state of the SCK signal when the bus master is in Stand-by mode and no data is being transferred. The SCK signal is low for Mode 0 and SCK signal is high for Mode 3. For both modes, the Serial Data In (SI) is sampled at the rising edge of the SCK clock signal and the Serial Data Output (SO) is driven after the falling edge of the SCK clock signal. CE# SCK SI MODE 3 MODE 3 MODE 0 MODE 0 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 MSB HIGH IMPEDANCE DON T CARE Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 SO MSB 1264 F02.0 Figure 3: SPI Protocol (c)2011 Silicon Storage Technology, Inc. DS25090A 5 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Hold Operation HOLD# pin is used to pause a serial sequence underway with the SPI flash memory without resetting the clocking sequence. To activate the HOLD# mode, CE# must be in active low state. The HOLD# mode begins when the SCK active low state coincides with the falling edge of the HOLD# signal. The HOLD mode ends when the HOLD# signal's rising edge coincides with the SCK active low state. If the falling edge of the HOLD# signal does not coincide with the SCK active low state, then the device enters Hold mode when the SCK next reaches the active low state. Similarly, if the rising edge of the HOLD# signal does not coincide with the SCK active low state, then the device exits in Hold mode when the SCK next reaches the active low state. See Figure 4 for Hold Condition waveform. Once the device enters Hold mode, SO will be in high-impedance state while SI and SCK can be VIL or VIH. If CE# is driven active high during a Hold condition, it resets the internal logic of the device. As long as HOLD# signal is low, the memory remains in the Hold condition. To resume communication with the device, HOLD# must be driven active high, and CE# must be driven active low. See Figure 19 for Hold timing. SCK HOLD# Active Hold Active Hold Active 1264 F03.0 Figure 4: Hold Condition Waveform Write Protection The SST25VF512A provides software Write protection. The Write Protect pin (WP#) enables or disables the lock-down function of the status register. The Block-Protection bits (BP1, BP0, and BPL) in the status register provide Write protection to the memory array and the status register. See Table 5 for Block-Protection description. Write Protect Pin (WP#) The Write Protect (WP#) pin enables the lock-down function of the BPL bit (bit 7) in the status register. When WP# is driven low, the execution of the Write-Status-Register (WRSR) instruction is determined by the value of the BPL bit (see Table 3). When WP# is high, the lock-down function of the BPL bit is disabled. Table 3: Conditions to execute Write-Status-Register (WRSR) Instruction WP# BPL Execute WRSR Instruction L 1 Not Allowed L 0 Allowed H X Allowed T3.0 25090 (c)2011 Silicon Storage Technology, Inc. DS25090A 6 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Status Register The software status register provides status on whether the flash memory array is available for any Read or Write operation, whether the device is Write enabled, and the state of the memory Write protection. During an internal Erase or Program operation, the status register may be read only to determine the completion of an operation in progress. Table 4 describes the function of each bit in the software status register. Table 4: Software Status Register Default at Power-up Read/Write 1 = Internal Write operation is in progress 0 = No internal Write operation is in progress 0 R WEL 1 = Device is memory Write enabled 0 = Device is not memory Write enabled 0 R 2 BP0 Indicate current level of block write protection (See Table 5) 1 R/W 3 BP1 Indicate current level of block write protection (See Table 5) 1 R/W 4:5 RES Reserved for future use 0 N/A 6 AAI Auto Address Increment Programming status 1 = AAI programming mode 0 = Byte-Program mode 0 R 7 BPL 1 = BP1, BP0 are read-only bits 0 = BP1, BP0 are read/writable 0 R/W Bit Name Function 0 BUSY 1 T4.0 25090 Busy The Busy bit determines whether there is an internal Erase or Program operation in progress. A "1" for the Busy bit indicates the device is busy with an operation in progress. A "0" indicates the device is ready for the next valid operation. Write Enable Latch (WEL) The Write-Enable-Latch bit indicates the status of the internal memory Write Enable Latch. If the Write-Enable-Latch bit is set to "1", it indicates the device is Write enabled. If the bit is set to "0" (reset), it indicates the device is not Write enabled and does not accept any memory Write (Program/Erase) commands. The Write-Enable-Latch bit is automatically reset under the following conditions: * * * * * * * Power-up Write-Disable (WRDI) instruction completion Byte-Program instruction completion Auto Address Increment (AAI) programming reached its highest memory address Sector-Erase instruction completion Block-Erase instruction completion Chip-Erase instruction completion (c)2011 Silicon Storage Technology, Inc. DS25090A 7 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Block Protection (BP1, BP0) The Block-Protection (BP1, BP0) bits define the size of the memory area, as defined in Table 5, to be software protected against any memory Write (Program or Erase) operations. The Write-Status-Register (WRSR) instruction is used to program the BP1 and BP0 bits as long as WP# is high or the BlockProtect-Lock (BPL) bit is 0. Chip-Erase can only be executed if Block-Protection bits are both 0. After power-up, BP1 and BP0 are set to 1. Block Protection Lock-Down (BPL) WP# pin driven low (VIL), enables the Block-Protection-Lock-Down (BPL) bit. When BPL is set to 1, it prevents any further alteration of the BPL, BP1, and BP0 bits. When the WP# pin is driven high (VIH), the BPL bit has no effect and its value is "Don't Care". After power-up, the BPL bit is reset to 0. Table 5: Software Status Register Block Protection1 Status Register Bit Protection Level BP1 BP0 Protected Memory Area 0 0 0 None 1 (1/4 Memory Array) 0 1 0C000H-0FFFFH 2 (1/2 Memory Array) 1 0 08000H-0FFFFH 3 (Full Memory Array) 1 1 00000H-0FFFFH T5.0 25090 1. Default at power-up for BP1 and BP0 is `11'. Auto Address Increment (AAI) The Auto Address Increment Programming-Status bit provides status on whether the device is in AAI programming mode or Byte-Program mode. The default at power up is Byte-Program mode. (c)2011 Silicon Storage Technology, Inc. DS25090A 8 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Instructions Instructions are used to Read, Write (Erase and Program), and configure the SST25VF512A. The instruction bus cycles are 8 bits each for commands (Op Code), data, and addresses. Prior to executing any Byte-Program, Auto Address Increment (AAI) programming, Sector-Erase, Block-Erase, or Chip-Erase instructions, the Write-Enable (WREN) instruction must be executed first. The complete list of the instructions is provided in Table 6. All instructions are synchronized off a high to low transition of CE#. Inputs will be accepted on the rising edge of SCK starting with the most significant bit. CE# must be driven low before an instruction is entered and must be driven high after the last bit of the instruction has been shifted in (except for Read, Read-ID and Read-Status-Register instructions). Any low to high transition on CE#, before receiving the last bit of an instruction bus cycle, will terminate the instruction in progress and return the device to the standby mode. Instruction commands (Op Code), addresses, and data are all input from the most significant bit (MSB) first. Table 6: Device Operation Instructions1 Bus Cycle2 Cycle Type/ Operation3,4 1 2 3 4 5 6 SI SIN SOUT SIN SOUT SIN SOUT SIN SOUT N SOUT Read (20 MHz) 03H Hi-Z A23-A16 Hi-Z A15-A8 Hi-Z A7-A0 Hi-Z X DOUT High-Speed-Read (33 MHz) 0BH Hi-Z A23-A16 Hi-Z A15-A8 Hi-Z A7-A0 Hi-Z X X SIN SOUT X DOUT Sector-Erase5,6 20H Hi-Z A23-A16 Hi-Z A15-A8 Hi-Z A7-A0 Hi-Z - - Block-Erase5,7 52H or D8H Hi-Z A23-A16 Hi-Z A15-A8 Hi-Z A7-A0 Hi-Z - - Chip-Erase6 60H or C7H Hi-Z - - - - - - - - Byte-Program6 02H Hi-Z A23-A16 Hi-Z A15-A8 Hi-Z A7-A0 Hi-Z DIN Hi-Z DIN Hi-Z Auto Address Increment (AAI) Program6,8 AFH Hi-Z A23-A16 Hi-Z A15-A8 Hi-Z A7-A0 Hi-Z DIN Hi-Z DIN Hi-Z Read-Status-Register (RDSR) 05H Hi-Z X DOUT - Note9 - Note9 - Note9 Enable-Write-Status-Register (EWSR)10 50H Hi-Z - - - - - - - - Write-Status-Register (WRSR)10 01H Hi-Z Data Hi-Z - - -. - - - Write-Enable (WREN) 06H Hi-Z - - - - - - - - 04H Hi-Z - - - - - - - - 90H or ABH Hi-Z 00H Hi-Z 00H Hi-Z ID Addr11 Hi-Z X DOUT Write-Disable (WRDI) Read-ID Note9 X 12 DOUT1 2 T6.0 25090 1. AMS = Most Significant Address AMS = A15 for SST25VF512A Address bits above the most significant bit of each density can be VIL or VIH 2. One bus cycle is eight clock periods. 3. Operation: SIN = Serial In, SOUT = Serial Out 4. X = Dummy Input Cycles (VIL or VIH); - = Non-Applicable Cycles (Cycles are not necessary) 5. Sector addresses: use AMS-A12, remaining addresses can be VIL or VIH 6. Prior to any Byte-Program, AAI-Program, Sector-Erase, Block-Erase, or Chip-Erase operation, the Write-Enable (WREN) instruction must be executed. 7. Block addresses for: use AMS-A15, remaining addresses can be VIL or VIH 8. To continue programming to the next sequential address location, enter the 8-bit command, AFH, followed by the data to be programmed. 9. The Read-Status-Register is continuous with ongoing clock cycles until terminated by a low to high transition on CE#. (c)2011 Silicon Storage Technology, Inc. DS25090A 9 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet 10. The Enable-Write-Status-Register (EWSR) instruction and the Write-Status-Register (WRSR) instruction must work in conjunction of each other. The WRSR instruction must be executed immediately (very next bus cycle) after the EWSR instruction to make both instructions effective. 11. Manufacturer's ID is read with A0=0, and Device ID is read with A0=1. All other address bits are 00H. The Manufacturer's and Device ID output stream is continuous until terminated by a low to high transition on CE# 12. Device ID = 48H for SST25VF512A Read (20 MHz) The Read instruction outputs the data starting from the specified address location. The data output stream is continuous through all addresses until terminated by a low to high transition on CE#. The internal address pointer will automatically increment until the highest memory address is reached. Once the highest memory address is reached, the address pointer will automatically increment to the beginning (wrap-around) of the address space, i.e. for 4 Mbit density, once the data from address location 7FFFFH had been read, the next output will be from address location 00000H. The Read instruction is initiated by executing an 8-bit command, 03H, followed by address bits [A23A0]. CE# must remain active low for the duration of the Read cycle. See Figure 5 for the Read sequence. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 ADD. ADD. 03 SI MSB MSB SO 15 16 23 24 31 32 39 40 47 48 55 56 63 64 70 MODE 0 HIGH IMPEDANCE ADD. N DOUT N+1 DOUT N+2 DOUT N+3 DOUT N+4 DOUT MSB 1264 F04.0 Figure 5: Read Sequence (c)2011 Silicon Storage Technology, Inc. DS25090A 10 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet High-Speed-Read (33 MHz) The High-Speed-Read instruction supporting up to 33 MHz is initiated by executing an 8-bit command, 0BH, followed by address bits [A23-A0] and a dummy byte. CE# must remain active low for the duration of the High-Speed-Read cycle. See Figure 6 for the High-Speed-Read sequence. Following a dummy byte (8 clocks input dummy cycle), the High-Speed-Read instruction outputs the data starting from the specified address location. The data output stream is continuous through all addresses until terminated by a low to high transition on CE#. The internal address pointer will automatically increment until the highest memory address is reached. Once the highest memory address is reached, the address pointer will automatically increment to the beginning (wrap-around) of the address space, i.e. for 4 Mbit density, once the data from address location 07FFFFH has been read, the next output will be from address location 000000H. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 0B SI MSB SO 15 16 23 24 31 32 39 40 47 48 55 56 63 64 71 72 80 MODE 0 ADD. MSB ADD. ADD. HIGH IMPEDANCE X N DOUT N+1 DOUT N+2 DOUT N+3 DOUT N+4 DOUT MSB 1264 F05.0 Note: X = Dummy Byte: 8 Clocks Input Dummy Cycle (VIL or VIH) Figure 6: High-Speed-Read Sequence (c)2011 Silicon Storage Technology, Inc. DS25090A 11 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Byte-Program The Byte-Program instruction programs the bits in the selected byte to the desired data. The selected byte must be in the erased state (FFH) when initiating a Program operation. A Byte-Program instruction applied to a protected memory area will be ignored. Prior to any Write operation, the Write-Enable (WREN) instruction must be executed. CE# must remain active low for the duration of the Byte-Program instruction. The Byte-Program instruction is initiated by executing an 8-bit command, 02H, followed by address bits [A23-A0]. Following the address, the data is input in order from MSB (bit 7) to LSB (bit 0). CE# must be driven high before the instruction is executed. The user may poll the Busy bit in the software status register or wait TBP for the completion of the internal self-timed Byte-Program operation. See Figure 7 for the Byte-Program sequence. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 15 16 23 24 31 32 39 MODE 0 02 SI ADD. ADD. MSB MSB ADD. DIN MSB LSB HIGH IMPEDANCE SO 1264 F06.0 Figure 7: Byte-Program Sequence (c)2011 Silicon Storage Technology, Inc. DS25090A 12 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Auto Address Increment (AAI) Program The AAI program instruction allows multiple bytes of data to be programmed without re-issuing the next sequential address location. This feature decreases total programming time when the entire memory array is to be programmed. An AAI program instruction pointing to a protected memory area will be ignored. The selected address range must be in the erased state (FFH) when initiating an AAI program instruction. Prior to any write operation, the Write-Enable (WREN) instruction must be executed. The AAI program instruction is initiated by executing an 8-bit command, AFH, followed by address bits [A23-A0]. Following the addresses, the data is input sequentially from MSB (bit 7) to LSB (bit 0). CE# must be driven high before the AAI program instruction is executed. The user must poll the BUSY bit in the software status register or wait TBP for the completion of each internal self-timed Byte-Program cycle. Once the device completes programming byte, the next sequential address may be program, enter the 8-bit command, AFH, followed by the data to be programmed. When the last desired byte had been programmed, execute the Write-Disable (WRDI) instruction, 04H, to terminate AAI. After execution of the WRDI command, the user must poll the Status register to ensure the device completes programming. See Figure 8 for AAI programming sequence. There is no wrap mode during AAI programming; once the highest unprotected memory address is reached, the device will exit AAI operation and reset the Write-Enable-Latch bit (WEL = 0). TBP TBP CE# MODE 3 SCK SI 0 1 2 3 4 5 6 7 8 15 16 23 24 31 32 33 34 35 36 37 38 39 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 0 1 MODE 0 AF A[23:16] A[15:8] Data Byte 1 A[7:0] Data Byte 2 AF TBP CE# 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 SCK SI AF Last Data Byte 04 Write Disable (WRDI) Instruction to terminate AAI Operation 05 Read Status Register (RDSR) Instruction to verify end of AAI Operation DOUT SO 1264 F07.0 Figure 8: Auto Address Increment (AAI) Program Sequence (c)2011 Silicon Storage Technology, Inc. DS25090A 13 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Sector-Erase The Sector-Erase instruction clears all bits in the selected 4 KByte sector to FFH. A Sector-Erase instruction applied to a protected memory area will be ignored. Prior to any Write operation, the WriteEnable (WREN) instruction must be executed. CE# must remain active low for the duration of the any command sequence. The Sector-Erase instruction is initiated by executing an 8-bit command, 20H, followed by address bits [A23-A0]. Address bits [AMS-A12] (AMS = Most Significant address) are used to determine the sector address (SAX), remaining address bits can be VIL or VIH. CE# must be driven high before the instruction is executed. The user may poll the Busy bit in the software status register or wait TSE for the completion of the internal self-timed Sector-Erase cycle. See Figure 9 for the Sector-Erase sequence. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 23 24 15 16 31 MODE 0 ADD. ADD. 20 SI MSB ADD. MSB HIGH IMPEDANCE SO 1264 F08.0 Figure 9: Sector-Erase Sequence Block-Erase The Block-Erase instruction clears all bits in the selected 32 KByte block to FFH. A Block-Erase instruction applied to a protected memory area will be ignored. Prior to any Write operation, the WriteEnable (WREN) instruction must be executed. CE# must remain active low for the duration of any command sequence. The Block-Erase instruction is initiated by executing an 8-bit command, 52H or D8H, followed by address bits [A23-A0]. Address bits [AMS-A15] (AMS = Most significant address) are used to determine block address (BAX), remaining address bits can be VIL or VIH. CE# must be driven high before the instruction is executed. The user may poll the Busy bit in the software status register or wait TBE for the completion of the internal self-timed Block-Erase cycle. See Figure 10 for the Block-Erase sequence. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 15 16 23 24 31 MODE 0 52 or D8 SI MSB ADD. ADD. ADD. MSB HIGH IMPEDANCE SO 1264 F09.0 Figure 10:Block-Erase Sequence (c)2011 Silicon Storage Technology, Inc. DS25090A 14 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Chip-Erase The Chip-Erase instruction clears all bits in the device to FFH. A Chip-Erase instruction will be ignored if any of the memory area is protected. Prior to any Write operation, the Write-Enable (WREN) instruction must be executed. CE# must remain active low for the duration of the Chip-Erase instruction sequence. The Chip-Erase instruction is initiated by executing an 8-bit command, 60H or C7H. CE# must be driven high before the instruction is executed. The user may poll the Busy bit in the software status register or wait TCE for the completion of the internal self-timed Chip-Erase cycle. See Figure 11 for the Chip-Erase sequence. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 60 or C7 SI MSB HIGH IMPEDANCE SO 1264 F10.0 Figure 11:Chip-Erase Sequence Read-Status-Register (RDSR) The Read-Status-Register (RDSR) instruction allows reading of the status register. The status register may be read at any time even during a Write (Program/Erase) operation. When a Write operation is in progress, the Busy bit may be checked before sending any new commands to assure that the new commands are properly received by the device. CE# must be driven low before the RDSR instruction is entered and remain low until the status data is read. Read-Status-Register is continuous with ongoing clock cycles until it is terminated by a low to high transition of the CE#. See Figure 12 for the RDSR instruction sequence. CE# MODE 3 SCK SI 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 MODE 0 05 MSB HIGH IMPEDANCE SO Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 MSB Status Register Out 1264 F11.0 Figure 12:Read-Status-Register (RDSR) Sequence (c)2011 Silicon Storage Technology, Inc. DS25090A 15 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Write-Enable (WREN) The Write-Enable (WREN) instruction sets the Write-Enable-Latch bit to 1 allowing Write operations to occur. The WREN instruction must be executed prior to any Write (Program/Erase) operation. CE# must be driven high before the WREN instruction is executed. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 06 SI MSB HIGH IMPEDANCE SO 1264 F12.0 Figure 13:Write Enable (WREN) Sequence Write-Disable (WRDI) The Write-Disable (WRDI) instruction resets the Write-Enable-Latch bit and AAI bit to 0 disabling any new Write operations from occurring. CE# must be driven high before the WRDI instruction is executed. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 0 04 SI MSB HIGH IMPEDANCE SO 1264 F13.0 Figure 14:Write Disable (WRDI) Sequence Enable-Write-Status-Register (EWSR) The Enable-Write-Status-Register (EWSR) instruction arms the Write-Status-Register (WRSR) instruction and opens the status register for alteration. The Enable-Write-Status-Register instruction does not have any effect and will be wasted, if it is not followed immediately by the Write-Status-Register (WRSR) instruction. CE# must be driven low before the EWSR instruction is entered and must be driven high before the EWSR instruction is executed. (c)2011 Silicon Storage Technology, Inc. DS25090A 16 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Write-Status-Register (WRSR) The Write-Status-Register instruction works in conjunction with the Enable-Write-Status-Register (EWSR) instruction to write new values to the BP1, BP0, and BPL bits of the status register. The WriteStatus-Register instruction must be executed immediately after the execution of the Enable-Write-Status-Register instruction (very next instruction bus cycle). This two-step instruction sequence of the EWSR instruction followed by the WRSR instruction works like SDP (software data protection) command structure which prevents any accidental alteration of the status register values. The Write-Status-Register instruction will be ignored when WP# is low and BPL bit is set to "1". When the WP# is low, the BPL bit can only be set from "0" to "1" to lock-down the status register, but cannot be reset from "1" to "0". When WP# is high, the lock-down function of the BPL bit is disabled and the BPL, BP0, and BP1 bits in the status register can all be changed. As long as BPL bit is set to 0 or WP# pin is driven high (VIH) prior to the low-to-high transition of the CE# pin at the end of the WRSR instruction, the BP0, BP1, and BPL bit in the status register can all be altered by the WRSR instruction. In this case, a single WRSR instruction can set the BPL bit to "1" to lock down the status register as well as altering the BP0 and BP1 bit at the same time. See Table 3 for a summary description of WP# and BPL functions. CE# must be driven low before the command sequence of the WRSR instruction is entered and driven high before the WRSR instruction is executed. See Figure 15 for EWSR and WRSR instruction sequences. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 MODE 3 MODE 0 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 MODE 0 01 50 SI MSB MSB STATUS REGISTER IN 7 6 5 4 3 2 1 0 MSB HIGH IMPEDANCE SO 1264 F14.0 Figure 15:Enable-Write-Status-Register (EWSR) and Write-Status-Register (WRSR) Sequence (c)2011 Silicon Storage Technology, Inc. DS25090A 17 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Read-ID The Read-ID instruction identifies the device as SST25VF512A and manufacturer as SST. The device information can be read from executing an 8-bit command, 90H or ABH, followed by address bits [A23A0]. Following the Read-ID instruction, the manufacturer's ID is located in address 00000H and the device ID is located in address 00001H. Once the device is in Read-ID mode, the manufacturer's and device ID output data toggles between address 00000H and 00001H until terminated by a low to high transition on CE#. CE# MODE 3 SCK 0 1 2 3 4 5 6 7 8 90 or AB SI 00 00 MSB SO 23 24 15 16 31 32 39 40 47 48 55 56 63 MODE 0 ADD1 MSB HIGH IMPEDANCE BF Device ID BF Device ID HIGH IMPEDANCE MSB Note: The manufacturer s and device ID output stream is continuous until terminated by a low to high transition on CE#. 1. 00H will output the manfacturer s ID first and 01H will output device ID first before toggling between the two. 1264 F15.0 Figure 16:Read-ID Sequence (c)2011 Silicon Storage Technology, Inc. DS25090A 18 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Electrical Specifications Absolute Maximum Stress Ratings (Applied conditions greater than those listed under "Absolute Maximum Stress Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these conditions or conditions greater than those defined in the operational sections of this data sheet is not implied. Exposure to absolute maximum stress rating conditions may affect device reliability.) Temperature Under Bias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55C to +125C Storage Temperature. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -65C to +150C D. C. Voltage on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to VDD+0.5V Transient Voltage (<20 ns) on Any Pin to Ground Potential . . . . . . . . . . . . . . . . . . -2.0V to VDD+2.0V Package Power Dissipation Capability (TA = 25C). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.0W Surface Mount Solder Reflow Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . 260C for 10 seconds Output Short Circuit Current1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA 1. Output shorted for no more than one second. No more than one output shorted at a time. Table 7: Operating Range Range Ambient Temp VDD Commercial 0C to +70C 2.7-3.6V Industrial -40C to +85C 2.7-3.6V Extended -20C to +85C 2.7-3.6V T7.1 25090 Table 8: AC Conditions of Test1 Input Rise/Fall Time Output Load 5ns CL = 30 pF T8.1 25090 1. See Figures 21 and 22 Table 9: DC Operating Characteristics VDD = 2.7-3.6V Limits Symbol Parameter Min Max Units Test Conditions IDDR Read Current 10 mA CE#=0.1 VDD/0.9 VDD@20 MHz, SO=open IDDW Program and Erase Current 30 mA CE#=VDD ISB Standby Current 15 A CE#=VDD, VIN=VDD or VSS ILI Input Leakage Current 1 A VIN=GND to VDD, VDD=VDD Max 1 A VOUT=GND to VDD, VDD=VDD Max 0.8 V VDD=VDD Min V VDD=VDD Max V IOL=100 A, VDD=VDD Min V IOH=-100 A, VDD=VDD Min ILO Output Leakage Current VIL Input Low Voltage VIH Input High Voltage VOL Output Low Voltage VOH Output High Voltage 0.7 VDD 0.2 VDD-0.2 T9.9 25090 (c)2011 Silicon Storage Technology, Inc. DS25090A 19 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Table 10:Recommended System Power-up Timings Symbol Parameter Minimum Units TPU-READ1 VDD Min to Read Operation 10 s VDD Min to Write Operation 10 TPU-WRITE 1 s T10.0 25090 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. Table 11:Capacitance (TA = 25C, f=1 Mhz, other pins open) Parameter COUT 1 CIN1 Description Output Pin Capacitance Input Capacitance Test Condition Maximum VOUT = 0V 12 pF VIN = 0V 6 pF T11.0 25090 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. Table 12:Reliability Characteristics Symbol Parameter Minimum Specification Units Test Method NEND1 Endurance 10,000 Cycles JEDEC Standard A117 TDR1 ILTH1 Data Retention 100 Years 100 + IDD mA Latch Up JEDEC Standard A103 JEDEC Standard 78 T12.0 25090 1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. (c)2011 Silicon Storage Technology, Inc. DS25090A 20 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Table 13:AC Operating Characteristics VDD = 2.7-3.6V Limits 20 MHz Symbol Parameter Min 33 MHz Max Min Units 33 MHz FCLK Serial Clock Frequency TSCKH Serial Clock High Time TSCKL Serial Clock Low Time 20 13 ns TSCKR1 Serial Clock Rise Time (slew rate) 0.1 0.1 V/ns TSCKF1 Serial Clock Fall Time (slew rate) 0.1 0.1 V/ns TCES2 CE# Active Setup Time 20 12 ns 2 20 Max 20 13 ns CE# Active Hold Time 20 12 ns TCHS2 CE# Not Active Setup Time 10 10 ns TCHH2 CE# Not Active Hold Time 10 10 ns TCPH CE# High Time 100 100 ns TCHZ CE# High to High-Z Output TCLZ SCK Low to Low-Z Output 0 0 ns TDS Data In Setup Time 5 3 ns TDH Data In Hold Time 5 3 ns TCEH 20 14 ns THLS HOLD# Low Setup Time 10 10 ns THHS HOLD# High Setup Time 10 10 ns THLH HOLD# Low Hold Time 15 10 ns THHH HOLD# High Hold Time 10 10 ns THZ HOLD# Low to High-Z Output 20 14 ns TLZ HOLD# High to Low-Z Output 20 14 ns TOH Output Hold from SCK Change TV Output Valid from SCK 0 20 0 12 ns ns TSE Sector-Erase 25 25 ms TBE Block-Erase 25 25 ms TSCE Chip-Erase 100 100 ms TBP Byte-Program 20 20 s T13.0 25090 1. Maximum Serial Clock Rise and Fall times may be limited by TSCKH and TSCKL requirements. 2. Relative to SCK. (c)2011 Silicon Storage Technology, Inc. DS25090A 21 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet TCPH CE# TCHH TSCKF TCES TCEH TCHS SCK TDS SI SO TDH TSCKR MSB LSB HIGH-Z HIGH-Z 1264 F16.0 Figure 17:Serial Input Timing Diagram CE# TSCKH TSCKL SCK TOH TCHZ TCLZ SO MSB LSB TV SI 1264 F17.0 Figure 18:Serial Output Timing Diagram (c)2011 Silicon Storage Technology, Inc. DS25090A 22 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet CE# THHH THHS THLS SCK THLH THZ TLZ SO SI HOLD# 1264 F18.0 Figure 19:Hold Timing Diagram VDD VDD Max Chip selection is not allowed. All commands are rejected by the device. VDD Min TPU-READ TPU-WRITE Device fully accessible Time 1264 F19.0 Figure 20:Power-up Timing Diagram (c)2011 Silicon Storage Technology, Inc. DS25090A 23 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet VIHT VHT VHT INPUT REFERENCE POINTS OUTPUT VLT VLT VILT 1264 F20.0 AC test inputs are driven at VIHT (0.9VDD) for a logic "1" and VILT (0.1VDD) for a logic "0". Measurement reference points for inputs and outputs are VHT (0.7VDD) and VLT (0.3VDD). Input rise and fall times (10% 90%) are <5 ns. Note: VHT - VHIGH Test VLT - VLOW Test VIHT - VINPUT HIGH Test VILT - VINPUT LOW Test Figure 21:AC Input/Output Reference Waveforms TO TESTER TO DUT CL 1264 F21.0 Figure 22:A Test Load Example (c)2011 Silicon Storage Technology, Inc. DS25090A 24 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Product Ordering Information SST 25 VF XX XX 512A XXXX - 33 XX - 4I XX - QAE XXX Environmental Attribute E1 = non-Pb Package Modifier A = 8 leads or contacts Package Type S = SOIC Q = WSON Temperature Range C = Commercial = 0C to +70C I = Industrial = -40C to +85C E = Extended = -20C to +85C Minimum Endurance 4 = 10,000 cycles Operating Frequency 33 = 33 MHz Device Density 512 = 512 Kbit Voltage V = 2.7-3.6V Product Series 25 = Serial Peripheral Interface flash memory 1. Environmental suffix "E" denotes non-Pb solder. SST non-Pb solder devices are "RoHS Compliant". Valid combinations for SST25VF512A SST25VF512A-33-4C-SAE SST25VF512A-33-4I-SAE SST25VF512A-33-4E-SAE SST25VF512A-33-4C-QAE SST25VF512A-33-4I-QAE SST25VF512A-33-4E-QAE Note:Valid combinations are those products in mass production or will be in mass production. Consult your SST sales representative to confirm availability of valid combinations and to determine availability of new combinations. (c)2011 Silicon Storage Technology, Inc. DS25090A 25 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Packaging Diagrams Pin #1 Identifier SIDE VIEW TOP VIEW 7 4 places 0.51 0.33 5.0 4.8 1.27 BSC END VIEW 45 0.25 0.10 4.00 3.80 1.75 1.35 6.20 5.80 7 4 places 0.25 0.19 Note: 1. Complies with JEDEC publication 95 MS-012 AA dimensions, although some dimensions may be more stringent. 2. All linear dimensions are in millimeters (max/min). 3. Coplanarity: 0.1 mm 4. Maximum allowable mold flash is 0.15 mm at the package ends and 0.25 mm between leads. 0 8 08-soic-5x6-SA-8 1.27 0.40 1mm Figure 23: 8-lead Small Outline Integrated Circuit (SOIC) 150 mil body width (4.9mm x 6mm) SST Package Code: SA (c)2011 Silicon Storage Technology, Inc. DS25090A 26 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet TOP VIEW SIDE VIEW BOTTOM VIEW Pin #1 0.2 Pin #1 Corner 1.27 BSC 5.00 0.10 0.076 4.0 0.48 0.35 3.4 0.70 0.50 0.05 Max 6.00 0.10 0.80 0.70 Note: 1. All linear dimensions are in millimeters (max/min). 2. Untoleranced dimensions (shown with box surround) are nominal target dimensions. 3. The external paddle is electrically connected to the die back-side and possibly to certain VSS leads. This paddle can be soldered to the PC board; it is suggested to connect this paddle to the VSS of the unit. Connection of this paddle to any other voltage potential can result in shorts and/or electrical malfunction of the device. CROSS SECTION 0.80 0.70 1mm 8-wson-5x6-QA-9.0 Figure 24:8-contact Very-very-thin Small Outline No-lead (WSON) SST Package Code: QA (c)2011 Silicon Storage Technology, Inc. DS25090A 27 10/11 512 Kbit SPI Serial Flash SST25VF512A A Microchip Technology Company Data Sheet Table 14:Revision History Revision 00 01 Description * * * * 02 A * * * * * * * Date Initial release Added RoHS compliance information on page 1 and in the "Product Ordering Information" on page 25 Updated the surface mount lead temperature from 240C to 260C and the time from 3 seconds to 10 seconds on page 19. Updated Table 13 on page 20 to include the parameters TSCKR and TSCKF Migrated document to a Data Sheet Updated Surface Mount Solder Reflow Temperature information Removed leaded part numbers Updated QA package drawing to version 9 Applied new document format Released document under letter revision system Updated Spec number from S71264 to DS25090 Jun 2004 Jan 2005 Jan 2006 Oct 2011 ISBN:978-1-61341-716-4 (c) 2011 Silicon Storage Technology, Inc-a Microchip Technology Company. All rights reserved. SST, Silicon Storage Technology, the SST logo, SuperFlash, MTP, and FlashFlex are registered trademarks of Silicon Storage Technology, Inc. MPF, SQI, Serial Quad I/O, and Z-Scale are trademarks of Silicon Storage Technology, Inc. All other trademarks and registered trademarks mentioned herein are the property of their respective owners. Specifications are subject to change without notice. Refer to www.microchip.com for the most recent documentation. For the most current package drawings, please see the Packaging Specification located at http://www.microchip.com/packaging. Memory sizes denote raw storage capacity; actual usable capacity may be less. SST makes no warranty for the use of its products other than those expressly contained in the Standard Terms and Conditions of Sale. For sales office locations and information, please see www.microchip.com. Silicon Storage Technology, Inc. A Microchip Technology Company www.microchip.com (c)2011 Silicon Storage Technology, Inc. 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