A2T07H310--24SR6
3
RF Device Data
Freescale Semiconductor, Inc.
Table 4. Electrical Characteristics (TA=25°C unless otherwise noted) (continued)
Characteristic Symbol Min Typ Max Unit
Functional Tests (1,2) (In Freescale Doherty Test Fixture, 50 ohm system) VDD =28Vdc,I
DQA = 700 mA, VGSB =0.7Vdc,P
out =47WAvg.,
f = 880 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. ACPR measured in
3.84 MHz Channel Bandwidth @ ±5MHzOffset.
Power Gain Gps 17.7 18.6 20.7 dB
Drain Efficiency ηD48.0 51.3 — %
Output Peak--to--Average Ratio @ 0.01% Probability on CCDF PAR 7.2 7.7 —dB
Adjacent Channel Power Ratio ACPR —–30.9 –26.9 dBc
Load Mismatch (2) (In Freescale Doherty Test Fixture, 50 ohm system) IDQA = 700 mA, VGSB =0.7Vdc,f=865MHz
VSWR 10:1 at 32 Vdc, 316 W CW (4) Output Power
(3 dB Input Overdrive from 126 W CW Rated Power)
No Device Degradation
Typical Performance (2) (In Freescale Doherty Test Fixture, 50 ohm system) VDD =28Vdc,I
DQA = 700 mA, VGSB =0.7Vdc,
851–880 MHz Bandwidth
Pout @ 1 dB Compression Point, CW P1dB —126 — W
Pout @ 3 dB Compression Point (3) P3dB —330 — W
AM/PM
(Maximum value measured at the P3dB compression point across
the 851–880 MHz frequency range)
Φ—–21 —°
VBW Resonance Point
(IMD Third Order Intermodulation Inflection Point)
VBWres —180 —MHz
Gain Flatness in 29 MHz Bandwidth @ Pout =47WAvg. GF—0.4 —dB
Gain Variation over Temperature
(–30°Cto+85°C)
∆G — 0.01 —dB/°C
Output Power Variation over Temperature
(–30°Cto+85°C) (4)
∆P1dB —0.2 —dB/°C
1. Part internally matched both on input and output.
2. Measurement made with device in an asymmetrical Doherty configuration.
3. P3dB = Pavg + 7.0 dB where Pavg is the average output power measured using an unclipped W--CDMA single--carrier input signal where
output PAR is compressed to 7.0 dB @ 0.01% probability on CCDF.
4. Exceeds recommended operating conditions. See CW operation data in Maximum Ratings table.